DDD RH3080MK H0923840 W3 Neutron Irradiation Test Results of the RH3080MK Adjustable 0.9A Single Resistor Low Dropout Regulator 09 October 2014 Duc Nguyen, Sana Rezgui Acknowledgements The authors would like to thank the S-Power Design and Product Engineering Groups from Linear Technology for the data collection pre- and post-irradiations. Special thanks are also for Thomas Regan from University of Massachusetts, Lowell (UMASS) for the help with the neutrons irradiation tests. P a g e 1 | 41 LINEAR TECHNOLOGY CORPORATION DDD RH3080MK H0923840 W3 Neutron Radiation Testing of the RH3080MK Adjustable 0.9A Single Resistor Low Dropout Regulator Part Type Tested: RH3080MK Adjustable 0.9A Single Resistor Low Dropout Regulator, SPEC NO. 05-08-5246 REV. 0 Traceability Information: Fab Lot# H0923840.4; Wafer # 3; Assembly Lot # 589490.2. See photograph of unit under test in Appendix A. Quantity of Units: 7 units received, 2 units for control, and 5 units for unbiased irradiation. Leads of devices, serial numbers 1 to 5, were shorted together using anti-static foam during irradiation. Serial numbers 11 and 12 were used as control. See Appendix B for the radiation bias connection tables. Radiation Dose: Total fluence of 1E12 neutron/cm2. Radiation Test Standard: MIL-STD-883 TM1017 and Linear Technology RH3080MH SPEC NO. 05-08-5246 REV. C and RH3080MK DICE/DWF Test Hardware and Software: LTX test program EFCR3080R.00. Facility and Radiation Source: University of Massachusetts, Lowell and Reactor Facility-FNI. Irradiation and Test Temperature: Room temperature controlled to 24°C±6°C per MIL-STD883 and MIL-STD-750. SUMMARY ALL FIVE PARTS PASSED THE ELECTRICAL TEST LIMITS AS SPECIFIED IN THE DATASHEET AFTER IRRADIATION TO 1E12 N/cm2. ADDITIONAL INFORMATION CAN BE PROVIDED PER REQUEST. P a g e 2 | 41 LINEAR TECHNOLOGY CORPORATION DDD RH3080MK H0923840 W3 1.0 Overview and Background Neutron particles incident on semiconductor materials lose energy along their paths. The energy loss produces electron-hole pairs (ionization) and displaces atoms in the material lattice (displacement damage defects or DDD). DDD induces a mixture of isolated and clustered defects or broken bonds. Such defects elevate the energy level of the material and consequently change material and electrical properties. The altering energy level creates the combination of any of the following processes, thermal generation of electron-hole pairs, recombination, trapping, compensation, tunneling, affecting hence the devices’ basic features. We run the electrical tests after we had made sure that the parts are not radioactive anymore to be shipped to LTC. Bipolar technology is susceptible to neutron displacement damage around a fluence level of 1E12 neutron/cm2. The neutron radiation test for the RH3080MK determines the change in device performance as a function of neutrons’ fluence. 2.0 Radiation Facility: Five samples were irradiated unbiased at the University of Massachusetts, Lowell, using the Reactor Facility-FNI. The neutron flux was determined by system S/P-32, method ASTM E-265, to be 4.05E9 N/cm2-s (1MeV equivalent) for each irradiation step. Refer to Appendix C for the certificate of dosimetry. 3.0 Test Conditions Five samples and two control units were electrically tested at 25°C prior to irradiation. The testing was performed on the two control units to confirm the operation of the test system prior to the electrical testing of the 7 units (5 irradiated and 2 control). During irradiation, devices leads were shorted together using anti-static foam and devices then were placed into an antistatic bag. Devices were then vertically aligned with the radiation source. The criteria to pass the neutron displacement damage test is that five irradiated samples must pass the datasheet limits. If any of the tested parameters of these five units do not meet the required limits then a failure-analysis of the part should be conducted in accordance with method 5003, MIL-STD-883, and if valid the lot will be scrapped. P a g e 3 | 41 LINEAR TECHNOLOGY CORPORATION DDD RH3080MK H0923840 W3 4.0 Tested Parameters The following parameters were measured pre- and post-irradiations: - SET Pin Current (uA) @ VIN = 1V, VCONTROL = 2V, ILOAD = 1mA Output Offset Voltage (VOUT – VSET) (mV) @ VIN = 1V, VCONTROL = 2V, ILOAD = 1mA Load Regulation, ISET (nA) @ ILOAD = 1mA to 0.9A Load Regulation, VOS (mV) @ ILOAD = 1mA to 0.9A Line Regulation, ISET (nA/V) @ VIN = 1V to 26V, VCONTROL = 2V to 26V, ILOAD = 1mA Line Regulation, VOS (mV/V) @ VIN = 1V to 26V, VCONTROL = 2V to 26V, ILOAD = 1mA Minimum Load Current (mA) @ VIN = 10V, VCONTROL = 10V Minimum Load Current (mA) @ VIN = 26V, VCONTROL = 26V VCONTROL Dropout Voltage (V) @ VIN = 1V, ILOAD = 0.1A VCONTROL Dropout Voltage (V) @ VIN = 1V, ILOAD = 0.9A VIN Dropout Voltage (V) @ VCONTROL = 2V, ILOAD = 0.1A VIN Dropout Voltage (V) @ VCONTROL = 2V, ILOAD = 0.8A VCONTROL Pin Current (mA) @ VIN = 1V, VCONTROL = 2V, ILOAD = 0.1A VCONTROL Pin Current (mA) @ VIN = 1V, VCONTROL = 2V, ILOAD = 0.9A Current Limit (A) @ VIN = 5V, VCONTROL = 5V, VSET = 0V, VOUT = - 0.1V Appendix D details the test conditions, minimum and maximum values at different accumulated doses. P a g e 4 | 41 LINEAR TECHNOLOGY CORPORATION DDD RH3080MK H0923840 W3 5.0 Test Results All five samples passed the post-irradiation electrical tests. All measurements of the fifteen listed parameters in section 4.0 are within the specification limits. The used statistics in this report are based on the tolerance limits, which are bounds to gage the quality of the manufactured products. It assumes that if the quality of the items is normally distributed with known mean and known standard deviation, the two-sided tolerance limits can be calculated by adding to and subtracting from mean the product of standard deviation and the tolerance limit factor KTL where KTL is tabulated from a table of the inverse normal probability distribution. The upper tolerance limit +KTL and the lower tolerance limit -KTL are +KTL = mean + (KTL) (standard deviation) -KTL = mean - (KTL) (standard deviation) However, in most cases, mean and standard deviations are unknown and therefore it is practical to estimate both of them from a sample. Hence the tolerance limit depends greatly on the sample size. The Ps90%/90% KTL factor for a lot quality P of 0.9, confidence C of 0.9 with a sample size of 5, can be found from the tabulated table (MIL-HDBK-814, page 94, table IX-B). The KTL factor in this report is 2.742. In the plots, the dashed lines with X-markers are the measured data points of five postirradiated samples. The solid lines with square symbols are the computed KTL values of five post-irradiated samples with the application of the KTL statistics. The orange solid lines with circle markers are the datasheet specification limits. The post-irradiation test limits are using Linear Technology datasheets 10 Krads(Si) specification limits. P a g e 5 | 41 LINEAR TECHNOLOGY CORPORATION DDD RH3080MK H0923840 W3 10.25 Specification MAX 10.20 10.15 10.10 Ps90%/90% (+KTL) Un-biased ISET (uA) 10.05 10.00 Average Un-biased 9.95 9.90 Ps90%/90% (-KTL) Un-biased 9.85 9.80 Specification MIN 9.75 0 5E+11 1E+12 Total Fluence (neutron/cm2) 1.5E+12 Figure 5.1 Plot of SET Pin Current versus Total Fluence All five samples pass the SET Pin Current parameter. Notice the –KTL point of pre-irradiation is right at the minimum specification limit due to the small 5-piece sample size. P a g e 6 | 41 LINEAR TECHNOLOGY CORPORATION DDD RH3080MK H0923840 W3 Table 5.1: Raw data table for SET Pin Current of pre- and post-irradiation (1E12 N/cm2) ISET Total Fluence (neutron/cm 2) Parameter Units (uA) 0 1.E+12 1 Un-biased Irradiation 9.9432 10.0165 2 Un-biased Irradiation 9.9539 10.0219 3 Un-biased Irradiation 9.9638 10.0333 4 Un-biased Irradiation 9.9718 10.0341 5 Un-biased Irradiation 10.0089 10.0790 11 Control Unit 9.9364 9.9311 12 Control Unit 9.9852 9.9875 Un-biased Irradiation Statistics Average Un-biased 9.9683 10.0370 Std Dev Un-biased 0.0251 0.0247 Ps90%/90% (+KTL) Un-biased 10.0372 10.1046 Ps90%/90% (-KTL) Un-biased 9.8995 9.9693 Specification MIN 9.90 9.80 Status (Measurements) PASS PASS Specification MAX 10.10 10.20 Status (Measurements) PASS PASS Status (-KTL) Un-biased Status (+KTL) Un-biased FAIL PASS PASS PASS P a g e 7 | 41 LINEAR TECHNOLOGY CORPORATION DDD RH3080MK H0923840 W3 10 Specification MAX 8 6 Ps90%/90% (+KTL) Un-biased 4 VOS (mV) 2 Average Un-biased 0 -2 -4 Ps90%/90% (-KTL) Un-biased -6 -8 Specification MIN -10 0 5E+11 1E+12 Total Fluence (neutron/cm2) 1.5E+12 Figure 5.2: Plot of Output Offset Voltage versus Total Fluence All measured data are within the datasheet specification limits. P a g e 8 | 41 LINEAR TECHNOLOGY CORPORATION DDD RH3080MK H0923840 W3 Table 5.2: Raw data table for Output Offset Voltage of pre- and post-irradiation (1E12 N/cm2) VOS Total Fluence (neutron/cm 2) Parameter Units (mV) 0 1.E+12 1 Un-biased Irradiation 0.8622 1.2100 2 Un-biased Irradiation 1.7056 2.3800 3 Un-biased Irradiation 1.1254 1.5000 4 Un-biased Irradiation 1.6301 1.5800 5 Un-biased Irradiation -0.3578 -0.2140 11 Control Unit 0.2691 0.3231 12 Control Unit -0.5725 -0.5018 Un-biased Irradiation Statistics Average Un-biased 0.9931 1.2912 Std Dev Un-biased 0.8326 0.9467 Ps90%/90% (+KTL) Un-biased 3.2761 3.8870 Ps90%/90% (-KTL) Un-biased -1.2899 -1.3046 Specification MIN -5 -8 Status (Measurements) PASS PASS Specification MAX 5 8 Status (Measurements) PASS PASS Status (-KTL) Un-biased Status (+KTL) Un-biased PASS PASS PASS PASS P a g e 9 | 41 LINEAR TECHNOLOGY CORPORATION DDD RH3080MK H0923840 W3 20 Load Regulation ISET (nA) 15 Specification MAX 10 Ps90%/90% (+KTL) Un-biased 5 0 Average Un-biased -5 Ps90%/90% (-KTL) Un-biased -10 -15 Specification MIN -20 0 5E+11 1E+12 Total Fluence (neutron/cm2) 1.5E+12 Figure 5.3: Plot of Load Regulation ISET versus Total Fluence All measured data points of Load Regulation ISET parameter are within datasheet specification limits. P a g e 10 | 41 LINEAR TECHNOLOGY CORPORATION DDD RH3080MK H0923840 W3 Table 5.3: Raw data table for Load Regulation ISET of pre- and post-irradiation (1E12 N/cm2) Load Regulation ISET Total Fluence (neutron/cm 2 ) Parameter Units (nA) 0 1.E+12 1 Un-biased Irradiation 4.5820 -2.3800 2 Un-biased Irradiation -1.6225 -2.2900 3 Un-biased Irradiation 0.0000 1.1400 4 Un-biased Irradiation -1.9090 0.7630 5 Un-biased Irradiation 3.7289 0.1910 11 Control Unit 0.3820 6.3965 12 Control Unit 3.8181 -1.4315 Un-biased Irradiation Statistics Average Un-biased 0.9559 -0.5152 Std Dev Un-biased 3.0252 1.6956 Ps90%/90% (+KTL) Un-biased 9.2511 4.1340 Ps90%/90% (-KTL) Un-biased -7.3393 -5.1644 Specification MIN -15 -15 Status (Measurements) PASS PASS Specification MAX 15 15 Status (Measurements) PASS PASS Status (-KTL) Un-biased Status (+KTL) Un-biased PASS PASS PASS PASS P a g e 11 | 41 LINEAR TECHNOLOGY CORPORATION DDD RH3080MK H0923840 W3 1.50 Specification MAX Load Regulation VOS (mV) 1.00 0.50 Ps90%/90% (+KTL) Unbiased 0.00 Average Un-biased -0.50 Ps90%/90% (-KTL) Unbiased -1.00 Specification MIN -1.50 0 5E+11 1E+12 Total Fluence (neutron/cm2) 1.5E+12 Figure 5.4: Plot of Load Regulation VOS versus Total Fluence All post-irradiation measured values of Load Regulation VOS are within datasheet specification limits. P a g e 12 | 41 LINEAR TECHNOLOGY CORPORATION DDD RH3080MK H0923840 W3 Table 5.4: Raw data table for Load Regulation VOS of pre- and post-irradiation (1E12 N/cm2) Load Regulation VOS Total Fluence (neutron/cm 2 ) Parameter Units (mV) 0 1.E+12 1 Un-biased Irradiation -0.3701 -0.4070 2 Un-biased Irradiation -0.3677 -0.4030 3 Un-biased Irradiation -0.3450 -0.4040 4 Un-biased Irradiation -0.3592 -0.4040 5 Un-biased Irradiation -0.3740 -0.3910 11 Control Unit -0.3400 -0.3780 12 Control Unit -0.3391 -0.3618 Un-biased Irradiation Statistics Average Un-biased -0.3632 -0.4018 Std Dev Un-biased 0.0115 0.0062 Ps90%/90% (+KTL) Un-biased -0.3316 -0.3847 Ps90%/90% (-KTL) Un-biased -0.3948 -0.4189 Specification MIN -1.00 -1.25 Status (Measurements) PASS PASS Specification MAX 1.00 1.25 Status (Measurements) PASS PASS Status (-KTL) Un-biased Status (+KTL) Un-biased PASS PASS PASS PASS P a g e 13 | 41 LINEAR TECHNOLOGY CORPORATION DDD RH3080MK H0923840 W3 1.00 Specification MAX Line Regulation ISET (nA/V) 0.80 0.60 0.40 Ps90%/90% (+KTL) Un-biased 0.20 0.00 Average Un-biased -0.20 -0.40 Ps90%/90% (-KTL) Un-biased -0.60 -0.80 Specification MIN -1.00 0 5E+11 1E+12 Total Fluence (neutron/cm2) 1.5E+12 Figure 5.5: Plot of Line Regulation versus Total Fluence All measured post-irradiation data points are within datasheet specification limits. P a g e 14 | 41 LINEAR TECHNOLOGY CORPORATION DDD RH3080MK H0923840 W3 Table 5.5: Raw data table for Line Regulation ISET of pre- and post-irradiation (1E12 N/cm2) Line Regulation ISET Total Fluence (neutron/cm 2) Parameter Units (nA/V) 0 1.E+12 1 Un-biased Irradiation 0.0955 0.0000 2 Un-biased Irradiation -0.1313 -0.0953 3 Un-biased Irradiation -0.0991 0.1230 4 Un-biased Irradiation -0.1154 0.0159 5 Un-biased Irradiation -0.0553 0.0676 11 Control Unit -0.0676 0.3182 12 Control Unit 0.0875 -0.0795 Un-biased Irradiation Statistics Average Un-biased -0.0611 0.0222 Std Dev Un-biased 0.0920 0.0815 Ps90%/90% (+KTL) Un-biased 0.1912 0.2457 Ps90%/90% (-KTL) Un-biased -0.3134 -0.2012 Specification MIN -0.45 -0.80 Status (Measurements) PASS PASS Specification MAX 0.45 0.80 Status (Measurements) PASS PASS Status (-KTL) Un-biased Status (+KTL) Un-biased PASS PASS PASS PASS P a g e 15 | 41 LINEAR TECHNOLOGY CORPORATION DDD RH3080MK H0923840 W3 0.08 Line Regulation VOS (mV/V) 0.06 Specification MAX 0.04 Ps90%/90% (+KTL) Un-biased 0.02 0.00 Average Un-biased -0.02 Ps90%/90% (-KTL) Un-biased -0.04 -0.06 Specification MIN -0.08 0 5E+11 1E+12 Total Fluence (neutron/cm2) 1.5E+12 Figure 5.6: Plot of Line Regulation VOS versus Total Fluence All five samples pass the Line Regulation VOS post-irradiation test. P a g e 16 | 41 LINEAR TECHNOLOGY CORPORATION DDD RH3080MK H0923840 W3 Table 5.6: Raw data table for Line Regulation VOS of pre- and post-irradiation (1E12 N/cm2) Line Regulation VOS Total Fluence (neutron/cm 2) Parameter Units (mV/V) 0 1.E+12 1 Un-biased Irradiation 0.0002 -0.0013 2 Un-biased Irradiation 0.0013 -0.0004 3 Un-biased Irradiation 0.0023 -0.0018 4 Un-biased Irradiation 0.0025 0.0016 5 Un-biased Irradiation -0.0006 -0.0056 11 Control Unit 0.0022 0.0014 12 Control Unit -0.0009 -0.0020 Un-biased Irradiation Statistics Average Un-biased 0.0011 -0.0015 Std Dev Un-biased 0.0013 0.0026 Ps90%/90% (+KTL) Un-biased 0.0048 0.0057 Ps90%/90% (-KTL) Un-biased -0.0025 -0.0087 Specification MIN -0.05 -0.06 Status (Measurements) PASS PASS Specification MAX 0.05 0.06 Status (Measurements) PASS PASS Status (-KTL) Un-biased Status (+KTL) Un-biased PASS PASS PASS PASS P a g e 17 | 41 LINEAR TECHNOLOGY CORPORATION DDD RH3080MK H0923840 W3 0.42 Min. Current Load @ VP=VC=10V (mA) Specification MAX 0.40 0.38 Ps90%/90% (+KTL) Unbiased 0.36 Average Un-biased 0.34 0.32 Ps90%/90% (-KTL) Unbiased 0.30 0 5E+11 1E+12 Total Fluence (neutron/cm2) 1.5E+12 Figure 5.7: Plot of Minimum Load with VIN and VCONTROL = 10V versus Total Fluence All measured data points are well under datasheet upper limits. P a g e 18 | 41 LINEAR TECHNOLOGY CORPORATION DDD RH3080MK H0923840 W3 Table 5.7: Raw data table for Minimum Load Current of pre- and post-irradiation (1E12 N/cm2) Parameter Miin Current Load @VP=VC=10V Units (mA) 1 Un-biased Irradiation 2 Un-biased Irradiation 3 Un-biased Irradiation 4 Un-biased Irradiation 5 Un-biased Irradiation 11 Control Unit 12 Control Unit Un-biased Irradiation Statistics Average Un-biased Std Dev Un-biased Ps90%/90% (+KTL) Un-biased Ps90%/90% (-KTL) Un-biased Specification MIN Status (Measurements) Specification MAX Status (Measurements) Status (-KTL) Un-biased Status (+KTL) Un-biased Total Fluence (neutron/cm 2) 0 1.E+12 0.3176 0.3160 0.3193 0.3200 0.3157 0.3170 0.3137 0.3150 0.3172 0.3170 0.3260 0.3276 0.3182 0.3214 0.3167 0.0021 0.3225 0.3110 0.3170 0.0019 0.3221 0.3119 0.40 PASS PASS 0.40 PASS PASS P a g e 19 | 41 LINEAR TECHNOLOGY CORPORATION DDD RH3080MK H0923840 W3 Min Current Load @ VP=VC=26V 1.0 Specification MAX 0.9 0.8 Ps90%/90% (+KTL) Unbiased 0.7 0.6 Average Un-biased 0.5 Ps90%/90% (-KTL) Unbiased 0.4 0 5E+11 1E+12 Total Fluence (neutron/cm2) 1.5E+12 Figure 5.8: Plot of Minimum Load Current with VIN = VCONTROL = 26V versus Total Fluence P a g e 20 | 41 LINEAR TECHNOLOGY CORPORATION DDD RH3080MK H0923840 W3 Table 5.8: Raw data table for Minimum Load Current of pre- and post-irradiation (1E12 N/cm2) Parameter Min Current Load @VP=VC=26V Units (mA) 1 Un-biased Irradiation 2 Un-biased Irradiation 3 Un-biased Irradiation 4 Un-biased Irradiation 5 Un-biased Irradiation 11 Control Unit 12 Control Unit Un-biased Irradiation Statistics Average Un-biased Std Dev Un-biased Ps90%/90% (+KTL) Un-biased Ps90%/90% (-KTL) Un-biased Specification MIN Status (Measurements) Specification MAX Status (Measurements) Status (-KTL) Un-biased Status (+KTL) Un-biased Total Fluence (neutron/cm 2) 0 1.E+12 0.4372 0.4410 0.4380 0.4430 0.4345 0.4400 0.4323 0.4370 0.4359 0.4420 0.4515 0.4545 0.4359 0.4405 0.4356 0.0023 0.4418 0.4293 0.4406 0.0023 0.4469 0.4343 0.90 PASS PASS 0.90 PASS PASS P a g e 21 | 41 LINEAR TECHNOLOGY CORPORATION DDD RH3080MK H0923840 W3 1.55 Specification MAX VC Dropout Voltage @ IL=0.1A (V) 1.50 1.45 Ps90%/90% (+KTL) Un-biased 1.40 1.35 Average Un-biased 1.30 1.25 Ps90%/90% (-KTL) Un-biased 1.20 0 5E+11 1E+12 1.5E+12 Total Fluence (neutron/cm2) Figure 5.9: Plot of VC Dropout Voltage (@VIN=1V, ILOAD= 0.1A) versus Total Fluence The measured parameters are well under the specification maximum limit. P a g e 22 | 41 LINEAR TECHNOLOGY CORPORATION DDD RH3080MK H0923840 W3 Table 5.9: Raw data table for Dropout Voltage Control of pre- and post-irradiation (1E12 N/cm2) Parameter VC Dropout Voltage @ IL = 0.1A Units (V) 1 Un-biased Irradiation 2 Un-biased Irradiation 3 Un-biased Irradiation 4 Un-biased Irradiation 5 Un-biased Irradiation 11 Control Unit 12 Control Unit Un-biased Irradiation Statistics Average Un-biased Std Dev Un-biased Ps90%/90% (+KTL) Un-biased Ps90%/90% (-KTL) Un-biased Specification MIN Status (Measurements) Specification MAX Status (Measurements) Status (-KTL) Un-biased Status (+KTL) Un-biased Total Fluence (neutron/cm 2) 0 1.E+12 1.2262 1.2558 1.2254 1.2552 1.2233 1.2543 1.2257 1.2560 1.2217 1.2585 1.2541 1.2483 1.2257 1.2088 1.2244 0.0019 1.2297 1.2192 1.2560 0.0016 1.2603 1.2517 1.40 PASS PASS 1.50 PASS PASS P a g e 23 | 41 LINEAR TECHNOLOGY CORPORATION DDD RH3080MK H0923840 W3 1.52 Specification MAX VC Dropout Voltage @ IL=0.9A (V) 1.50 1.48 1.46 Ps90%/90% (+KTL) Unbiased 1.44 1.42 Average Un-biased 1.40 1.38 1.36 Ps90%/90% (-KTL) Un-biased 1.34 1.32 0 5E+11 1E+12 1.5E+12 Total Fluence (neutron/cm2) Figure 5.10: Plot of VC Dropout Voltage (@ VIN = 1V, ILOAD = 0.9A) versus Total Fluence P a g e 24 | 41 LINEAR TECHNOLOGY CORPORATION DDD RH3080MK H0923840 W3 Table 5.10: Raw data table for Dropout Voltage Control of pre- and post-irradiation (1E12 N/cm2) Parameter VC Dropout Volrage @ IL=.9A Units 1 Un-biased Irradiation 2 Un-biased Irradiation 3 Un-biased Irradiation 4 Un-biased Irradiation 5 Un-biased Irradiation 11 Control Unit 12 Control Unit Un-biased Irradiation Statistics Average Un-biased Std Dev Un-biased Ps90%/90% (+KTL) Un-biased Ps90%/90% (-KTL) Un-biased Specification MIN Status (Measurements) Specification MAX Status (Measurements) Status (-KTL) Un-biased Status (+KTL) Un-biased Total Fluence (neutron/cm 2) 0 1.E+12 1.3512 1.3591 1.3504 1.3586 1.3482 1.3550 1.3506 1.3579 1.3559 1.3628 1.3809 1.3741 1.3508 1.3395 1.3513 0.0028 1.3590 1.3435 1.3587 0.0028 1.3664 1.3510 1.50 PASS PASS 1.50 PASS PASS P a g e 25 | 41 LINEAR TECHNOLOGY CORPORATION DDD RH3080MK H0923840 W3 0.21 Specification MAX VIN Dropout Voltage @ IL = .1A (V) 0.19 0.17 Ps90%/90% (+KTL) Un-biased 0.15 0.13 Average Un-biased 0.11 0.09 Ps90%/90% (-KTL) Un-biased 0.07 0 5E+11 1E+12 Total Fluence (neutron/cm2) 1.5E+12 Figure 5.11: Plot of VIN Dropout Voltage (@ VCONTROL = 2V ILOAD = 0.1A) versus Total Fluence P a g e 26 | 41 LINEAR TECHNOLOGY CORPORATION DDD RH3080MK H0923840 W3 Table 5.11: Raw data table for VIN Dropout Voltage of pre- and post-irradiation (1E12 N/cm2) Parameter VIN Dropout Voltage @ IL=.1A Units (V) 1 Un-biased Irradiation 2 Un-biased Irradiation 3 Un-biased Irradiation 4 Un-biased Irradiation 5 Un-biased Irradiation 11 Control Unit 12 Control Unit Un-biased Irradiation Statistics Average Un-biased Std Dev Un-biased Ps90%/90% (+KTL) Un-biased Ps90%/90% (-KTL) Un-biased Specification MIN Status (Measurements) Specification MAX Status (Measurements) Status (-KTL) Un-biased Status (+KTL) Un-biased Total Fluence (neutron/cm 2) 0 1.E+12 0.0807 0.0854 0.0811 0.0855 0.0811 0.0853 0.0818 0.0856 0.0805 0.0844 0.0809 0.0809 0.0807 0.0808 0.0810 0.0005 0.0824 0.0797 0.0852 0.0005 0.0866 0.0839 0.17 PASS PASS 0.20 PASS PASS P a g e 27 | 41 LINEAR TECHNOLOGY CORPORATION DDD RH3080MK H0923840 W3 VIN Dropout Voltage @ IL = .8A (V) 0.55 0.50 Specification MAX 0.45 Ps90%/90% (+KTL) Un-biased 0.40 Average Un-biased 0.35 Ps90%/90% (-KTL) Un-biased 0.30 0 5E+11 1E+12 Total Fluence (neutron/cm2) 1.5E+12 Figure 5.12: Plot of VIN Dropout Voltage (@ VCONTROL = 2V ILOAD = 0.8A) versus Total Fluence P a g e 28 | 41 LINEAR TECHNOLOGY CORPORATION DDD RH3080MK H0923840 W3 Table 5.12: Raw data table for VIN Dropout Voltage of pre- and post-irradiation (1E12 N/cm2) Parameter VIN Dropout Voltage @ IL =.8A Units (V) 1 Un-biased Irradiation 2 Un-biased Irradiation 3 Un-biased Irradiation 4 Un-biased Irradiation 5 Un-biased Irradiation 11 Control Unit 12 Control Unit Un-biased Irradiation Statistics Average Un-biased Std Dev Un-biased Ps90%/90% (+KTL) Un-biased Ps90%/90% (-KTL) Un-biased Specification MIN Status (Measurements) Specification MAX Status (Measurements) Status (-KTL) Un-biased Status (+KTL) Un-biased Total Fluence (neutron/cm 2) 0 1.E+12 0.3586 0.3670 0.3633 0.3710 0.3579 0.3660 0.3637 0.3700 0.3530 0.3600 0.3554 0.3572 0.3583 0.3624 0.3593 0.0044 0.3714 0.3472 0.3668 0.0043 0.3787 0.3549 0.45 PASS PASS 0.50 PASS PASS P a g e 29 | 41 LINEAR TECHNOLOGY CORPORATION DDD RH3080MK H0923840 W3 5.50 CONTROL Pin Current @ IL = 0.1A 5.30 Specification MAX 5.10 4.90 Ps90%/90% (+KTL) Un-biased 4.70 4.50 4.30 Average Un-biased 4.10 3.90 3.70 Ps90%/90% (-KTL) Un-biased 3.50 0 5E+11 1E+12 Total Fluence (neutron/cm2) 1.5E+12 Figure 5.13: Plot of CONTROL Pin Current (@ ILOAD = 0.1A) versus Total Fluence P a g e 30 | 41 LINEAR TECHNOLOGY CORPORATION DDD RH3080MK H0923840 W3 Table 5.13: Raw data table for CONTROL Pin Current of pre- and post-irradiation (1E12 N/cm2) Parameter CONTROL Pin Current @IL=.1A Units (mA) 1 Un-biased Irradiation 2 Un-biased Irradiation 3 Un-biased Irradiation 4 Un-biased Irradiation 5 Un-biased Irradiation 11 Control Unit 12 Control Unit Un-biased Irradiation Statistics Average Un-biased Std Dev Un-biased Ps90%/90% (+KTL) Un-biased Ps90%/90% (-KTL) Un-biased Specification MIN Status (Measurements) Specification MAX Status (Measurements) Status (-KTL) Un-biased Status (+KTL) Un-biased Total Fluence (neutron/cm 2) 0 1.E+12 4.4008 3.6500 4.4095 3.6700 4.3936 3.6800 4.3986 3.7400 4.4111 3.7300 4.3883 4.3763 4.4111 4.3906 4.4027 0.0074 4.4231 4.3824 3.6940 0.0391 3.8013 3.5867 5.30 PASS PASS 5.30 PASS PASS P a g e 31 | 41 LINEAR TECHNOLOGY CORPORATION DDD RH3080MK H0923840 W3 23 CONTROL Pin Current @ IL = .9A 22 Specification MAX 21 20 Ps90%/90% (+KTL) Un-biased 19 18 Average Un-biased 17 16 15 Ps90%/90% (-KTL) Un-biased 14 0 5E+11 1E+12 Total Fluence (neutron/cm2) 1.5E+12 Figure 5.14: Plot of CONTROL Pin Current (@ ILOAD = 0.9A) versus Total Fluence P a g e 32 | 41 LINEAR TECHNOLOGY CORPORATION DDD RH3080MK H0923840 W3 Table 5.14: Raw data table for VCONTROL Pin Current of pre- and post-irradiation (1E12 N/cm2) Parameter CONTROL Pin Current @IL=.9A Units (mA) 1 Un-biased Irradiation 2 Un-biased Irradiation 3 Un-biased Irradiation 4 Un-biased Irradiation 5 Un-biased Irradiation 11 Control Unit 12 Control Unit Un-biased Irradiation Statistics Average Un-biased Std Dev Un-biased Ps90%/90% (+KTL) Un-biased Ps90%/90% (-KTL) Un-biased Specification MIN Status (Measurements) Specification MAX Status (Measurements) Status (-KTL) Un-biased Status (+KTL) Un-biased Total Fluence (neutron/cm 2) 0 1.E+12 16.0540 15.0400 16.1292 15.0900 16.0952 15.0550 16.1126 15.1790 16.1254 15.1795 15.9669 15.7206 16.1560 15.7566 16.1033 0.0306 16.1872 16.0194 15.1087 0.0669 15.2922 14.9252 22 PASS PASS 22 PASS PASS P a g e 33 | 41 LINEAR TECHNOLOGY CORPORATION DDD RH3080MK H0923840 W3 1.30 1.25 Ps90%/90% (+KTL) Un-biased 1.20 Current Limit (A) 1.15 Average Un-biased 1.10 1.05 Ps90%/90% (-KTL) Un-biased 1.00 0.95 Specification MIN 0.90 0.85 0.80 0 5E+11 1E+12 Total Fluence (neutron/cm2) 1.5E+12 Figure 5.15: Plot of Current Limit versus Total Fluence P a g e 34 | 41 LINEAR TECHNOLOGY CORPORATION DDD RH3080MK H0923840 W3 Table 5.15: Raw data table for Current Limit of pre- and post-irradiation (1E12 N/cm2) Current Limit Parameter Total Fluence (neutron/cm 2) Units (A) 0 1.E+12 1 Un-biased Irradiation 1.1250 1.1238 2 Un-biased Irradiation 1.1387 1.1356 3 Un-biased Irradiation 1.1265 1.1246 4 Un-biased Irradiation 1.1299 1.1285 5 Un-biased Irradiation 1.2056 1.2000 11 Control Unit 1.1142 1.1113 12 Control Unit 1.1270 1.1222 Un-biased Irradiation Statistics Average Un-biased 1.1451 1.1425 Std Dev Un-biased 0.0342 0.0325 Ps90%/90% (+KTL) Un-biased 1.2389 1.2316 Ps90%/90% (-KTL) Un-biased 1.0513 1.0534 Specification MIN 0.90 0.90 Status (Measurements) PASS PASS Specification MAX Status (Measurements) Status (-KTL) Un-biased Status (+KTL) Un-biased PASS PASS P a g e 35 | 41 LINEAR TECHNOLOGY CORPORATION DDD RH3080MK H0923840 W3 Appendix A Pictures of one among five samples used in the test. Figure A1: Top View showing date code Figure A2: Bottom View showing serial number P a g e 36 | 41 LINEAR TECHNOLOGY CORPORATION DDD RH3080MK H0923840 W3 Appendix B Radiation Bias Connection Table Table B1: Unbias condition Pin 1 2 3 4 5 Function NC SET VCONTROL IN OUT = CASE Connection / Bias Float Float Float Float Float P a g e 37 | 41 LINEAR TECHNOLOGY CORPORATION DDD RH3080MK H0923840 W3 Figure B1: Pin-Out P a g e 38 | 41 LINEAR TECHNOLOGY CORPORATION DDD RH3080MK H0923840 W3 Appendix C P a g e 39 | 41 LINEAR TECHNOLOGY CORPORATION DDD RH3080MK H0923840 W3 Appendix D Table D1: Electrical Characteristics of Device-Under-Test Pre-Irradiation P a g e 40 | 41 LINEAR TECHNOLOGY CORPORATION DDD RH3080MK H0923840 W3 Table D2: Electrical Characteristics of Device-Under-Test Post-Irradiation P a g e 41 | 41 LINEAR TECHNOLOGY CORPORATION