FINAL PRODUCT/PROCESS CHANGE NOTIFICATION Generic Copy 30-NOV-2001 SUBJECT: ON Semiconductor Final Product/Process Change Notification #11626 TITLE: Final Notification - Assembly/Test Site Change For SC75 Package EFFECTIVE DATE: 02-Feb-2002 AFFECTED CHANGE CATEGORY: On Semiconductor Assembly Site On Semiconductor Test Site AFFECTED PRODUCT DIVISION: Bipolar Discretes Products Div ADDITIONAL RELIABILITY DATA: Available Contact your local ON Semiconductor Sales Office or Laura Rivers <[email protected]> SAMPLES: Contact your local ON Semiconductor Sales Office or Ts Teo <[email protected]> FOR ANY QUESTIONS CONCERNING THIS NOTIFICATION: Contact Sales Office or Jake Lee <[email protected]> DISCLAIMER: Final Product/Process Change Notification (FPCN) -Final Notification completing the notification process. Distributed at least 60 days from the effective date of the change. ON Semiconductor will consider this change approved unless specific conditions of acceptance are provided in writing within 30 days of receipt of this notice. To do so, contact your local ON Semiconductor Sales Office. DESCRIPTION AND PURPOSE: This is the Final Notification to IPCN#11626 that was released on 08/08/01 regarding assembly and test qualification of SC75 manufacturing to SBN1, ON Semiconductor's factory in Malaysia. This change affects general purpose transistors, Bias Resistor Transistors/Digital transistors, switching diodes and Zener diodes. SBN1 has been both QS9000 certified and Automotive Engineering Council(AEC)qualified. SBN1 has been producing all the technologies listed above in various packages as ON Semiconductor's main facility, serving the customers worldwide for decades. There will be no change to the form, fit, and function of the devices. Device parameters will continue to meet all Data Book specifications, and reliability will continue to meet or exceed ON Semiconductor standards. Issue Date: 30 November, 2001 Page 1 of 3 Final Product/Process Change Notification #11626 QUALIFICATION PLAN: Qual vehicle DAN222 Test Conditions Sample size Temp Cycle Air to Air, Ta=-65 to +150 degC, 231 dwell greater than or equal to 10 mins, 1000 cycles Autoclave Ta=121 degC, RH= 100%, 231 PSIg=15, 192 hrs. H3TRB V=80% of rated or 100V depending 231 on whichever lower, Ta=85 C, RH= 85%, 1000 hrs. IOL Ta=25 C, delta Tj =>100 C, 231 2.0 minutes on/off, 15000 cycles RELIABILITY DATA SUMMARY: Interim Reliability testing(500 hrs) of SC75 technology assembled and tested at SBN1 meets or exceeds the requirements set forth in the ON Semiconductor Product Introduction and Process Change Qualification 12MSB17722C(d). A copy of the full 1000 hour Reliability Report(ref # :JQ014301A, JQ014302) will be available by ww52. Test vehicle: DAN222 Test Condition Interval SS Rejects Autoclave Ta=121 deg C, 96 hrs 231 0 P=15psig RH=100% Temp Cycle Ta=-65/150 deg C 500 cycles 231 0 air to air, 1000 cycles 231 0 dwell>10 mins Solder Heat Ta=260 deg C 1X 135 0 Solderability, Steam age=8hrs, 1X 30 0 Ta=245 deg C HAST Ta=130 deg C, 96 hrs 231 0 RH=85% HTRB Ta=150 degC 500 hrs 231 0 IOL Ton=2min, 500 hrs 231 0 Toff=2min Ta=25 degC ELECTRICAL CHARACTERISTIC SUMMARY: Electrical characterization indicates parametric distribution remains unchanged with respect to electrical limit. CHANGED PART IDENTIFICATION: For site identification purpose, the date code character will be placed upright next to the device marking. Customers may receive these products manufactured starting with date code E (Jan 2002) or later. AFFECTED DEVICE LIST (WITHOUT SPECIALS): PART 2SA1774 2SC4617 BAS16TT1 BAV70TT1 BAW56TT1 BC847BTT1 BC847CTT1 BC857BTT1 Issue Date: 30 November, 2001 Page 2 of 3 Final Product/Process Change Notification #11626 BC857CTT1 DA121TT1 DAN222 DAP222 DTA114EET1 DTA114TET1 DTA114YE DTA114YET1 DTA115EET1 DTA123EET1 DTA123JET1 DTA124EET1 DTA124XET1 DTA143EE DTA143EET1 DTA143TET1 DTA143ZET1 DTA144EET1 DTA144WET1 DTC114EET1 DTC114TE DTC114TET1 DTC114YE DTC114YET1 DTC115EET1 DTC123EET1 DTC123JET1 DTC124EET1 DTC124XET1 DTC143EET1 DTC143TET1 DTC143ZET1 DTC144EET1 DTC144WET1 MMBT2222ATT1 MMBT3904TT1 MMBT3906TT1 NSL05TT1 NSL12TT1 NSL35TT1 NZF220TT1 Issue Date: 30 November, 2001 Page 3 of 3