INCH-POUND MIL-M-38510/118B 04 AUGUST 2005 SUPERSEDING MIL-M-38510/118A 05 November 2003 MILITARY SPECIFICATION MICROCIRCUITS, LINEAR, ADJUSTABLE, NEGATIVE, VOLTAGE REGULATORS, MONOLITHIC SILICON This specification is approved for use by all Departments and Agencies of the Department of Defense. Reactivated for new design as of 05 November 2003. May be used for either new or existing design acquisition. The requirement for acquiring the product herein shall consist of this specification sheet and MIL-PRF-38535. 1. SCOPE 1.1 Scope. This specification covers the detail requirements for three and four terminal monolithic silicon, adjustable, negative, voltage regulators. Two product assurance classes and a choice of case outlines and lead finish are provided for each type and are reflected in the complete part number. For this product, the requirements of MIL-M-38510 have been superseded by MIL-PRF-38535, (see 6.4). 1.2 Part or Identifying Number (PIN). The PIN is in accordance with MIL-PRF-38535, and as specified herein. 1.2.1 Device types. The device types are as shown in the following: Device type 01 Circuit Case outline letter 4-terminal voltage regulator, X -30 volts ≤ VO ≤ -5 volts at 0.5 A 02 4-terminal voltage regulator, 03 3-terminal voltage regulator, 04 3-terminal voltage regulator, Y -30 volts ≤ VO ≤ -5 volts at 1.0 A X -37 volts ≤ VO ≤ -1.25 volts at 0.5 A Y -37 volts ≤ VO ≤ -1.25 volts at 1.5 A 1.2.2 Device class. The device class is the product assurance level as defined in MIL-PRF-38535. 1.2.3 Case outlines. The case outlines are designated in MIL-STD-1835 and as follows: Outline letter X Y X Y Descriptive designator See figure 1 See figure 2 See figure 3 See figure 4 Terminals Device type Package style 4 4 3 2 01 02 03 04 Can Flange mount Can Flange mount Comments, suggestions, or questions on this document should be addressed to: Commander, Defense Supply Center Columbus, ATTN: DSCC-VAS, 3990 East Broad St., Columbus, OH 43218-3990, or emailed to [email protected]. Since contact information can change, you may want to verify the currency of this address information using the ASSIST Online database at http://assist.daps.dla.mil. AMSC N/A FSC 5962 MIL-M-38510/118B 1.3 Absolute maximum ratings. Input voltage (device types 01 and 02) ........................................................... Input-output differential voltage (device types 03 and 04) ............................... Lead temperature (soldering, 60 seconds) ..................................................... Junction temperature (TJ) ............................................................................... Storage temperature range ............................................................................ -40 V -40 V +300°C +150°C 1/ -65°C to +150°C 1.4 Recommended operating conditions. Input voltage range: Device types 01 and 02 .............................................................................. -8 V dc to -38 V dc Device types 03 and 04 .............................................................................. -4.25 V dc to –41.25 V dc Ambient operating temperature range (TA) .................................................... -55°C to +125°C 1.5 Power and thermal characteristics. TA = TS Case Max θJA 125°C 3/ X Y X Y X Y 140°C/W 35°C/W 140°C/W 35°C/W 140°C/W 35°C/W 25°C -55°C Maximum PD with heat sink 0.18 W 0.71 W 0.89 W 3.60 W 1.50 W 5.80 W Max θJC 40°C/W 4°C/W 40°C/W 4°C/W 40°C/W 4°C/W Maximum PD with heat sink 0.5 W 5.6 W 2.50 W 28.00 W 4.00 W 45.00 W Max θC-S 2/ 10°C/W 0.5°C/W 10°C/W 0.5°C/W 10°C/W 0.5°C/W ______ 1/ The device is protected by a thermal shutdown circuit which is designed to turn off the output transistor whenever the device junction temperature is in excess of 150°C. 2/ This value represents the maximum allowable thermal impedance of a heat sink to remain within the thermal ratings. 3/ Based on TJ = 150°C and specified values of θJA and θJC. 2 MIL-M-38510/118B 2. APPLICABLE DOCUMENTS 2.1 General. The documents listed in this section are specified in sections 3, 4, or 5 of this specification. This section does not include documents cited in other sections of this specification or recommended for additional information or as examples. While every effort has been made to ensure the completeness of this list, document users are cautioned that they must meet all specified requirements of documents cited in sections 3, 4, or 5 of this specification, whether or not they are listed. 2.2 Government documents. 2.2.1 Specifications, standards, and handbooks. The following specifications and standards form a part of this specification to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the solicitation or contract. DEPARTMENT OF DEFENSE SPECIFICATIONS MIL-PRF-38535 - Integrated Circuits (Microcircuits) Manufacturing, General Specification for. DEPARTMENT OF DEFENSE STANDARDS MIL-STD-883 MIL-STD-1835 - Test Method Standard for Microelectronics. - Interface Standard Electronic Component Case Outlines. (Copies of these documents are available online at http://assist.daps.dla.mil/quicksearch/ or http://assist.daps.dla.mil or from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.) 2.3 Order of precedence. In the event of a conflict between the text of this specification and the references cited herein, the text of this document takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a specific exemption has been obtained. 3. REQUIREMENTS 3.1 Qualification. Microcircuits furnished under this specification shall be products that are manufactured by a manufacturer authorized by the qualifying activity for listing on the applicable qualified manufacturers list before contract award (see 4.3 and 6.3). 3.2 Item requirements. The individual item requirements shall be in accordance with MIL-PRF-38535 and as specified herein or as modified in the device manufacturer's Quality Management (QM) plan. The modification in the QM plan shall not affect the form, fit, or function as described herein. 3.3 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified in MIL-PRF-38535 and herein. 3.3.1 Block diagram and terminal connections. The block diagrams and terminal connections shall be as specified on figures 5 through 8. 3.3.2 Schematic circuits. The schematic circuits shall be maintained by the manufacturer and made available to the qualifying activity and the preparing activity (DSCC-VA) upon request. 3.3.3 Case outlines. The case outlines shall be as specified in 1.2.3 and on figures 1, 2, 3, and 4. 3 MIL-M-38510/118B 3.4 Lead material and finish. Lead material and finish shall be in accordance with MIL-PRF-38535 (see 6.6). 3.4.1 Lead material. The lead material shall be in accordance with MIL-PRF-38535, or as follows: Type X Nickel .............................................................................. 50-53 percent Manganese ..................................................................... 0.60 percent, maximum Silicon ............................................................................. 0.30 percent, maximum Carbon ............................................................................ 0.10 percent, maximum Chromium ....................................................................... 0.25 percent, maximum Cobalt ............................................................................. 0.50 percent, maximum Phosphorous ................................................................... 0.025 percent, maximum Sulfur ............................................................................. 0.025 percent, maximum Aluminum ........................................................................ 0.10 percent maximum Iron .............................................................................. Remainder Type Y Copper core ....................................................................24.75 percent, maximum Clad with Alloy 52 ...........................................................75.25 percent maximum 3.5 Electrical performance characteristics. Unless otherwise specified, the electrical performance characteristics are as specified in table I and apply over the full operating ambient temperature range of –55°C to +125°C. 3.5.1 Stability. If the device is located an appreciable distance from the power supply filter, a solid tantalum bypass capacitor should be connected as close to the device VCC input as possible to suppress oscillation. A solid tantalum bypass capacitor is recommended on the device output. Output current oscillations may occur in the current limit operating mode. Since load currents of less than 5 milliamperes may result in a loss of voltage regulation, regulators should be preloaded with 5 milliamperes of load current in lightly loaded applications. 3.5.2 Test limit. The test limits specified in tables I and III apply only for the stated test conditions (example, 2 percent duty cycle), which essentially keep the junction temperature constant. In most applications the junction temperature will greatly exceed the 25°C ambient or sink temperature; thus devices may not perform within the 25°C specified limits. 3.6 Electrical test requirements. Electrical test requirements for each device class shall be the subgroups specified in table II. The electrical tests for each subgroup are described in table III. 3.7 Marking. Marking shall be in accordance with MIL-PRF-38535. At the option of the manufacturer, marking of the country of origin may be omitted from the body of the microcircuit, but shall be retained on the initial container. 3.8 Microcircuit group assignment. The devices covered by this specification shall be in microcircuit group number 52 (see MIL-PRF-38535, appendix A). 4 MIL-M-38510/118B TABLE I. Electrical performance characteristics. Test Conditions 1/ 2/ -55°C ≤ TA ≤ +125°C Symbol Device type see figure 9 and 3.5 unless otherwise specified Input voltage Output voltage VOUT Limits Unit Min Max -5.25 -4.75 Load current 01 VIN = -8 V IL = 5 mA, 500 mA VIN = -30 V IL = 5 mA, 50 mA -5.25 -4.75 VIN = -38 V IL = 500 mA -31.5 -28.5 VIN = -10 V, IL = 5 mA -5.25 -4.75 -150 150 -50 50 -100 100 -150 150 V TA = 150°C Line regulation Load regulation Thermal regulation VRLINE VRLOAD VRTH -30 V ≤ VIN ≤ -8 V IL = 50 mA -25 V ≤ VIN ≤ -8 V IL = 350 mA 01 01 mV mV VIN = -10 V 5 mA ≤ IL ≤ 500 mA VIN = -30 V 5 mA ≤ IL ≤ 50 mA VIN = -15 V, IL = 500 mA 01 -50 50 mV VIN = -10 V IL = 5 mA 01 0.1 3.0 mA VIN = -30 V IL = 5 mA 0.1 4.0 -30 V ≤ VIN ≤ -8 V IL = 5 mA 01 -1.0 1.0 mA VIN = -10 V 5 mA ≤ IL ≤ 500 mA 01 -0.5 0.5 mA VIN = -10 V, IL = 350 mA 01 0.001 2.00 µA 0.001 3.00 TA = 25°C Standby current drain ISCD Standby current drain change versus line voltage ∆ISCD Standby current drain change versus load current ∆ISCD Control pin current ICTL (LINE) (LOAD) TA = 25°C IL = 350 mA VIN = -10 V, -55°C ≤ TA ≤ 125°C See footnotes at end of table. 5 MIL-M-38510/118B TABLE I. Electrical performance characteristics – Continued. Test Conditions 1/ 2/ -55°C ≤ TA ≤ +125°C Symbol Device type see figure 9 and 3.5 unless otherwise specified Input voltage Output short circuit current Output voltage recovery after output short IOS1 VIN = -10 V IOS2 VIN = -30 V VOUT VIN = -10 V, (RECOV) after IOS1 circuit current Unit Min Max 0.002 2.0 0.002 1.0 -5.25 -4.75 -5.25 -4.75 01 -5.25 -4.75 01 45 Load current 01 3/ Limits RL = 10 Ω, 01 A V CL = 20 µF VIN = -30 V, 3/ RL = 5 kΩ after IOS2 Voltage start-up VSTART RL = 10 Ω, VIN = -20 V V CL = 20 µF Ripple rejection ∆VIN / VIN = -10 V, ∆VOUT ei = 1 Vrms, 4/ Line transient response see figure 10 VIN = -10 V, 4/ IL = 50 mA, see figure 11 TA = 25°C ∆VOUT / VIN = -10 V, 5/ IL = 5 mA, ∆VIN Vpulse = -3.0 V, TA = 25°C VNO dB TA = 25°C, at f = 2400 Hz Output noise voltage IL = 125 mA, 01 250 µVrms 01 30 mV/V 01 2.5 mV/mA see figure 12 Load transient response ∆VOUT / VIN = -10 V, 5/ ∆IL see figure 13 IL = 50 mA, ∆IL = 200 mA TA = 25°C See footnotes at end of table. 6 MIL-M-38510/118B TABLE I. Electrical performance characteristics – Continued. Test Conditions 1/ 2/ -55°C ≤ TA ≤ +125°C Symbol Device type see figure 9 and 3.5 unless otherwise specified Input voltage Output voltage VOUT Limits Unit Min Max -5.25 -4.75 Load current 02 VIN = -8 V IL = 5 mA, 1 A VIN = -30 V IL = 5 mA, 100 mA -5.25 -4.75 VIN = -38 V IL = 1 A -31.5 -28.5 VIN = -10 V, IL = 5 mA -5.25 -4.75 -150 150 -75 75 -100 100 -150 150 V TA = 150°C Line regulation Load regulation Thermal regulation VRLINE VRLOAD VRTH -30 V ≤ VIN ≤ -8 V IL = 100 mA -25 V ≤ VIN ≤ -8 V IL = 500 mA 02 02 mV mV VIN = -10 V 5 mA ≤ IL ≤ 1 A VIN = -30 V 5 mA ≤ IL ≤ 100 mA VIN = -15 V, IL = 1 A 02 -50 50 mV VIN = -10 V IL = 5 mA 02 0.1 3.0 mA VIN = -30 V IL = 5 mA 0.1 4.0 -30 V ≤ VIN ≤ -8 V IL = 5 mA 02 -1.0 1.0 mA VIN = -10 V 5 mA ≤ IL ≤ 1 A 02 -0.5 0.5 mA VIN = -10 V, IL = 500 mA 02 0.01 2.00 µA 0.001 3.00 TA = 25°C Standby current drain ISCD Standby current drain change versus line voltage ∆ISCD Standby current drain change versus load current ∆ISCD Control pin current ICTL (LINE) (LOAD) TA = 25°C IL = 500 mA VIN = -10 V, -55°C ≤ TA ≤ 125°C See footnotes at end of table. 7 MIL-M-38510/118B TABLE I. Electrical performance characteristics – Continued. Test Conditions 1/ 2/ -55°C ≤ TA ≤ +125°C Symbol Device type see figure 9 and 3.5 unless otherwise specified Input voltage Output short circuit current Output voltage recovery after output short IOS1 VIN = -10 V IOS2 VIN = -30 V VOUT VIN = -10 V, (RECOV) after IOS1 circuit current Unit Min Max 0.002 4.5 0.002 2.0 -5.25 -4.75 -5.25 -4.75 02 -5.25 -4.75 02 45 Load current 02 3/ Limits RL = 5 Ω, 02 A V CL = 20 µF VIN = -30 V, 3/ RL = 5 kΩ after IOS2 Voltage start-up VSTART RL = 5 Ω, VIN = -20 V V CL = 20 µF Ripple rejection Output noise voltage Line transient response ∆VIN / VIN = -10 V, ∆VOUT ei = 1 Vrms, VNO 4/ IL = 350 mA, dB TA = 25°C, at f = 2400 Hz see figure 10 VIN = -10 V, 4/ IL = 100 mA, see figure 11 TA = 25°C ∆VOUT / VIN = -10 V, 5/ IL = 5 mA, ∆VIN Vpulse = -3.0 V, TA = 25°C 02 250 µVrms 02 30 mV/V 02 2.5 mV/mA see figure 12 Load transient response ∆VOUT / VIN = -10 V, 5/ IL = 100 mA, ∆IL see figure 13 ∆IL = 400 mA TA = 25°C See footnotes at end of table. 8 MIL-M-38510/118B TABLE I. Electrical performance characteristics – Continued. Test Conditions 1/ 2/ -55°C ≤ TA ≤ +125°C Symbol Device type see figure 9 and 3.5 unless otherwise specified Input voltage Output voltage VOUT Limits Unit Min Max -1.275 -1.225 IL = 5 mA, 500 mA -1.30 -1.20 IL = 5 mA, 50 mA -1.275 -1.225 IL = 5 mA, 50 mA -1.30 -1.20 IL = 5 mA -1.30 -1.20 -9 9 -23 23 -6 6 5 mA ≤ IL ≤ 200 mA -12 12 5 mA ≤ IL ≤ 500 mA -12 12 5 mA ≤ IL ≤ 500 mA -24 24 5 mA ≤ IL ≤ 50 mA -6 6 5 mA ≤ IL ≤ 50 mA -12 12 Load current IL = 5 mA, 500 mA VIN = -4.25 V, 03 V TA = 25°C VIN = -4.25 V, -55°C ≤ TA ≤ 125°C VIN = -41.25 V, TA = 25°C VIN = -41.25 V, -55°C ≤ TA ≤ 125°C VIN = -6.25 V, TA = 150°C Line regulation VRLINE -41.25 V ≤ VIN ≤ -4.25 V, IL = 5 mA 03 mV TA = 25°C -41.25 V ≤ VIN ≤ -4.25 V, IL = 5 mA -55°C ≤ TA ≤ 125°C Load regulation VRLOAD 5 mA ≤ IL ≤ 200 mA VIN = -6.25 V, 03 TA = 25°C VIN = -6.25 V, -55°C ≤ TA ≤ 125°C VIN = -6.25 V, TA = 25°C VIN = -6.25 V, -55°C ≤ TA ≤ 125°C VIN = -41.25 V, TA = 25°C VIN = -41.25 V, -55°C ≤ TA ≤ 125°C See footnotes at end of table. 9 mV MIL-M-38510/118B TABLE I. Electrical performance characteristics – Continued. Test Conditions 1/ 2/ -55°C ≤ TA ≤ +125°C Symbol Device type see figure 9 and 3.5 unless otherwise specified Input voltage Limits Unit Min Max Load current IL = 500 mA 03 -5 5 mV VIN = -4.25 V IL = 5 mA 03 25 100 µA VIN = -41.25 V IL = 5 mA 25 100 ∆IADJ VIN = -41.25 V IL = 5 mA 25 100 (LINE) -41.25 V ≤ VIN ≤ -4.25 V IL = 5 mA -5 5 Adjust pin current change versus load current ∆IADJ VIN = -6.25 V 03 -5 5 µA Minimum load current IQ 03 0.20 3.00 mA 1.00 5.00 0.5 1.8 0.05 0.5 -1.30 -1.20 -1.30 -1.20 03 -1.30 -1.20 03 48 Thermal regulation VRTH VIN = -14.6 V, TA = 25°C Adjust pin current Adjust pin current change versus line voltage IADJ 5 mA ≤ IL ≤ 500 mA 03 µA (LOAD) -14.25 V ≤ VIN ≤ -4.25 V, forced VOUT = -1.4 V VIN = -41.25 V forced VOUT = -1.4 V Output short circuit current Output voltage recovery after IOS1 VIN = -4.25 V IOS2 VIN = -40 V VOUT VIN = -4.25 V, (RECOV) after IOS1 output short circuit current Voltage start-up VIN = -40 V, 03 RL = 2.5 Ω, 3/ 03 A V CL = 10 µF RL = 250 Ω 3/ after IOS2 VSTART RL = 2.5 Ω, VIN = -4.25 V V CL = 10 µF Ripple rejection ∆VIN / VIN = -6.25 V, ∆VOUT ei = 1 Vrms, IL = 125 mA, 6/ TA = 25°C, at fo = 2400 Hz see figure 10 See footnotes at end of table. 10 dB MIL-M-38510/118B TABLE I. Electrical performance characteristics – Continued. Test Conditions 1/ 2/ -55°C ≤ TA ≤ +125°C Symbol Device type see figure 9 and 3.5 unless otherwise specified Input voltage Output noise voltage Line transient response Min Unit Max Load current VIN = -6.25 V, 4/ IL = 50 mA, see figure 11 TA = 25°C ∆VOUT / VIN = -6.25 V, 5/ IL = 50 mA, ∆VIN ∆VIN = -1.0 V, TA = 25°C VNO Limits 03 120 µVrms 03 80 mV/V 03 0.30 see figure 12 Load transient response ∆VOUT / VIN = -6.25 V, 5/ ∆IL see figure 13 IL = 50 mA, mV/mA ∆IL = 200 mA TA = 25°C Output voltage VOUT -1.275 -1.225 IL = 5 mA, 1.5 A -1.30 -1.20 IL = 5 mA, 200 mA -1.275 -1.225 IL = 5 mA, 200 mA -1.30 -1.20 IL = 5 mA -1.30 -1.20 -9 9 -23 23 IL = 5 mA, 1.5 A VIN = -4.25 V, 04 V TA = 25°C VIN = -4.25 V, -55°C ≤ TA ≤ 125°C VIN = -41.25 V, TA = 25°C VIN = -41.25 V, -55°C ≤ TA ≤ 125°C VIN = -6.25 V, TA = 150°C Line regulation VRLINE -41.25 V ≤ VIN ≤ -4.25 V, IL = 5 mA 04 TA = 25°C -41.25 V ≤ VIN ≤ -4.25 V, -55°C ≤ TA ≤ 125°C See footnotes at end of table. 11 IL = 5 mA mV MIL-M-38510/118B TABLE I. Electrical performance characteristics – Continued. Test Conditions 1/ 2/ -55°C ≤ TA ≤ +125°C Symbol Device type see figure 9 and 3.5 unless otherwise specified Input voltage Load regulation VRLOAD Limits Unit Min Max -6 6 5 mA ≤ IL ≤ 1.5 A -12 12 5 mA ≤ IL ≤ 150 mA -6 6 5 mA ≤ IL ≤ 150 mA -12 12 Load current 5 mA ≤ IL ≤ 1.5 A VIN = -6.25 V, 04 mV TA = 25°C VIN = -6.25 V, -55°C ≤ TA ≤ 125°C VIN = -41.25 V, TA = 25°C VIN = -41.25 V, -55°C ≤ TA ≤ 125°C Thermal regulation VRTH IL = 1.5 A 04 -5 5 mV VIN = -4.25 V IL = 5 mA 04 25 100 µA VIN = -41.25 V IL = 5 mA 25 100 -41.25 V ≤ VIN ≤ -4.25 V IL = 5 mA 04 -5 5 µA 5 mA ≤ IL ≤ 1.5 A 04 -5 5 µA 04 0.20 3.00 mA 1.00 5.00 1.5 3.5 0.2 1.0 VIN = -14.6 V, TA = 25°C Adjust pin current IADJ Adjust pin current change versus line voltage ∆IADJ Adjust pin current change versus load current ∆IADJ Minimum load current IQ (LINE) VIN = -6.25 V (LOAD) -14.25 V ≤ VIN ≤ -4.25 V, forced VOUT = -1.4 V VIN = -41.25 V forced VOUT = -1.4 V Output short circuit current IOS1 VIN = -4.25 V IOS2 VIN = -40 V 04 See footnotes at end of table. 12 A MIL-M-38510/118B TABLE I. Electrical performance characteristics – Continued. Test Conditions 1/ 2/ -55°C ≤ TA ≤ +125°C Symbol Device type see figure 9 and 3.5 unless otherwise specified Input voltage Output voltage recovery after output short VOUT VIN = -4.25 V, (RECOV) after IOS1 circuit current Limits Unit Min Max -1.30 -1.20 -1.30 -1.20 04 -1.30 -1.20 04 50 Load current 3/ RL = 0.833 Ω, 04 V CL = 10 µF VIN = -40 V, RL = 250 Ω 3/ after IOS2 Voltage start-up VSTART RL = 0.833 Ω, VIN = -4.25 V V CL = 10 µF Ripple rejection Output noise voltage ∆VIN / VIN = -6.25 V, ∆VOUT ei = 1 Vrms, VNO 6/ dB TA = 25°C, at fo = 2400 Hz see figure 10 VIN = -6.25 V, 4/ IL = 100 mA, see figure 11 Line transient response IL = 500 mA, ∆VOUT / VIN = -6.25 V, 5/ ∆VIN ∆VIN = -1.0 V, 04 120 µVrms 04 80 mV/V 04 0.15 TA = 25°C IL = 100 mA, TA = 25°C see figure 12 Load transient response ∆VOUT / VIN = -6.25 V, 5/ IL = 100 mA, ∆IL see figure 13 ∆IL = 400 mA mV/mA TA = 25°C 1/ All tests performed at TA = 125°C may at the manufacturer’s option, be performed at TA = 150°C. Specifications for TA = 125°C shall then apply at TA = 150°C. 2/ Static tests with load currents greater than 5 mA are performed under pulsed conditions defined on figure 9. 3/ Output voltage recovery test shall be performed, with the designated load conditions, immediately after removal of each IOS test forced output voltage condition. 4/ The meter for ei and eo shall have a minimum bandwidth from 10 Hz to 10 kHz and shall measure true rms voltages. 5/ The oscilloscope shall have a bandwidth between 5 and 15 MHz. 6/ The meter for ei and eo shall have a minimum bandwidth from 300 Hz to 10 kHz and shall measure true rms voltage. 13 MIL-M-38510/118B 4. VERIFICATION. 4.1 Sampling and inspection. Sampling and inspection procedures should be in accordance with MIL-PRF-38535 or as modified in the device manufacturer’s Quality Management (QM) plan. The modification in the QM plan shall not affect the form, fit, or function as described herein. 4.2 Screening. Screening shall be in accordance with MIL-PRF-38535, and shall be conducted on all devices prior to qualification and quality conformance inspection. The following additional criteria shall apply: a. For class S and B devices, an additional burn-in screen shall be performed to test the operation of the thermal shutdown circuit. This screen shall be performed after serialization (3.1.8 of method 5004 of MIL-STD-883) and before interim electrical parameters (pre burn-in, 3.1.9 of method 5004 of MIL-STD-883). The requirements of 3.2.3 of method 1015 of MIL-STD-883 shall apply to this screen except the devices need not be tested in an oven. b. The burn-in test duration, test condition, and test temperature, or approved alternatives shall be as specified in the device manufacturer's QM plan in accordance with MIL-PRF-38535. The burn-in test circuit shall be maintained under document control by the device manufacturer's Technology Review Board (TRB) in accordance with MIL-PRF-38535 and shall be made available to the acquiring or preparing activity upon request. The test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in test method 1015 of MIL-STD-883. c. Interim and final electrical test parameters shall be as specified in table II, except interim electrical parameters test prior to burn-in is optional at the discretion of the manufacturer. d. Additional screening for space level product shall be as specified in MIL-PRF-38535. e. Constant acceleration (method 2001 of MIL-STD-883); test condition B shall be used for case Y. 4.3 Qualification inspection. Qualification inspection shall be in accordance with MIL-PRF-38535. 4.4 Technology Conformance inspection (TCI). Technology conformance inspection shall be in accordance with MILPRF-38535 and herein for groups A, B, C, and D inspections (see 4.4.1 through 4.4.4). 4.4.1 Group A inspection. Group A inspection shall be in accordance with table III of MIL-PRF-38535 and as follows: a. Tests shall be as specified in table II herein. b. Subgroups 5, 6, 8, 9, 10, and 11 shall be omitted. 4.4.2 Group B inspection. Group B inspection shall be in accordance with table II of MIL-PRF-38535 and as follows: a. End point electrical parameters shall be as specified in table II herein. b. When using the method 5005 option, constant acceleration for class S (method 2001 of MIL-STD-883); test condition B shall be used for case Y. 4.4.3 Group C inspection. Group C inspection shall be in accordance with table IV of MIL-PRF-38535 and as follows: a. End point electrical parameters shall be as specified in table IV herein. Delta limits shall apply to subgroup 1 of group C inspection for class B devices. b. The steady-state life test duration, test condition, and test temperature, or approved alternatives shall be as specified in the device manufacturer's QM plan in accordance with MIL-PRF-38535. The burn-in test circuit shall be maintained under document control by the device manufacturer's Technology Review Board (TRB) in accordance with MIL-PRF-38535 and shall be made available to the acquiring or preparing activity upon request. The test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in test method 1005 of MIL-STD-883. 14 MIL-M-38510/118B TABLE II. Electrical test requirements. MIL-PRF-38535 test requirements Subgroups (see table III) Class S devices Class B devices Interim electrical parameters 1 1 Final electrical test parameters 1/ 1,2,3,4 1,2,3,4 Group A test requirements 1,2,3,4,7 1,2,3,4,7 Group B electrical test parameters when using the method 5005 QCI option Group C electrical parameters 1,2,3, and table IV delta limits 1,2,3, and table IV delta limits Not applicable N/A 1 and table IV delta limits None 1,2,3 1 Additional electrical subgroups for group C periodic inspections Group D end point electrical parameters 1/ PDA applies to subgroup 1. 4.4.4 Group D inspection. Group D inspection shall be in accordance with table V of MIL-PRF-38535 and as follows: a. End point electrical parameters shall be as specified in table II herein. b. Constant acceleration (method 2001 of MIL-STD-883); test condition B shall be used for case Y. 4.5 Methods of inspection. Methods of inspection shall be as specified and as follows. 4.5.1 Voltage and current. All voltage values given are referenced to the designated return sense line. Currents given are conventional current and positive when flowing into the referenced terminal. 4.5.2 Life test and burn-in cool down procedure. When devices are measured at +25°C following application of the operating life or burn-in condition, they shall be cooled to room temperature prior to removal of the bias. 4.5.3 Inspection of packaging. The sampling and inspection of the preservation – packaging, packing, and container marking shall be in accordance with the requirements of MIL-PRF-38535. 5. PACKAGING 5.1 Packaging requirements. For acquisition purposes, the packaging requirements shall be as specified in the contract or order (see 6.2). When packaging of materiel is to be performed by DoD or in-house contractor personnel, these personnel need to contact the responsible packaging activity to ascertain packaging requirements. Packaging requirements are maintained by the Inventory Control Point's packaging activity within the Military Service or Defense Agency, or within the military’s service system command. Packaging data retrieval is available from the managing Military Department's or Defense Agency's automated packaging files, CD-ROM products, or by contacting the responsible packaging activity. 15 MIL-M-38510/118B Symbol A φb φb1 φD φD1 e e1 F k k1 k2 L L1 L2 α Dimensions Inches Millimeters Min Max Min Max .240 .260 6.10 6.60 .016 .019 .41 .48 .016 .021 .41 .53 Notes 3 3 .335 .305 .370 .335 8.51 7.79 9.40 8.51 .200 .100 T.P. T.P. 5.08 2.54 T.P T.P 5 5 --.028 .029 .050 .034 .045 --.71 .74 1.27 .86 1.14 4 .009 .041 .23 1.04 .500 --- --.050 12.70 --- --1.27 .250 --- 6.35 --- 45° T.P 45° T.P 5 NOTES: 1. Dimensions are in inches. 2. Metric equivalents are given for general information only and are based upon 1.00 inch = 25.4 mm. 3. (Four leads) φb applies between L1 and L2. φb1 applies between L2 and .500 (12.70 mm) from the reference 4. 5. 6. 7. plane. Diameter is uncontrolled in L1 and beyond .500 (12.70 mm) from the reference plane. Four leads. Measured from the maximum diameter of the product. Leads having a maximum diameter .019 (.48 mm) measured in gaging plane .054 (1.37 mm) + .001 (.03 mm) .000 (.00 mm) below the base plane of the product shall be within .007 (.18 mm) of their true position relative to a maximum width tab. The product may be measured by direct methods or by gage. FIGURE 1. Case outline X (device type 01). 16 MIL-M-38510/118B Symbol A A1 Dimensions Inches Millimeters Min Max Min Max .250 .450 6.35 11.43 1.177 1.197 29.90 30.40 1.480 1.500 37.59 38.10 .038 --.655 .420 .043 .875 .675 .440 .97 --16.64 10.67 1.09 22.22 17.14 11.18 .205 .225 5.21 5.72 .060 .151 .312 --- .135 .161 .500 .050 1.52 3.84 7.92 --- 3.43 4.09 12.70 1.27 R1 .495 .131 .525 .188 12.57 3.33 13.34 4.78 R2 .470 T.P. 11.94 T.P. θ1 54° T.P. 54° T.P. θ2 18° T.P. 18° T.P. A2 φb φD e e1 e2 F φH L L1 R FIGURE 2. Case outline Y (device type 02). 17 Notes 3,7 5,6 4 3,4 MIL-M-38510/118B NOTES: 1. Dimensions are in inches. 2. Metric equivalents are given for general information only and are based upon 1.00 inch = 25.4 mm. 3. (Four leads) φb applies between L1 and .500 (12.70 mm) from the seating plane. 4. 5. 6. 7. 8. Diameter is uncontrolled in L1 and beyond .500 (12.70 mm) from the seating plane. Four leads. Two holes. Two holes located at true position within diameter .010 (.25 mm). Leads having a maximum diameter .043 (1.09 mm) measured in gaging plane .054 (1.37 mm) + .001 (.03 mm) .000 (.00 mm) below the seating plane shall be located at true position within diameter .014 (.36mm). The mounting surface of the header shall be flat to convex within .003 (.08 mm) inside a .930 (23.62 mm) diameter circle on the center of the header and flat to convex within .006 (.15 mm) overall. FIGURE 2. Case outline Y (device type 02) – Continued. 18 MIL-M-38510/118B Symbol A φb φb1 φD φD1 e e1 F k k1 k2 L L1 L2 α Dimensions Inches Millimeters Min Max Min Max .165 .185 4.19 4.70 .016 .019 .41 .48 .016 .021 .41 .53 Notes 3 3 .335 .305 .370 .335 8.51 7.75 9.40 8.51 .200 .100 T.P. T.P. 5.08 2.54 T.P T.P 5 5 --.028 .029 .050 .034 .045 --.71 .74 1.27 .86 1.14 4 .009 .041 .23 1.04 .500 --- --.050 12.70 --- --1.27 .250 --- 6.35 --- 45° T.P 45° T.P 5 NOTES: 1. Dimensions are in inches. 2. Metric equivalents are given for general information only and are based upon 1.00 inch = 25.4 mm. 3. (Three leads) φb applies between L1 and L2. φb1 applies between L2 and .500 (12.70 mm) from the reference plane. Diameter is uncontrolled in L1 and beyond .500 (12.70 mm) from the reference plane. 4. Three leads. 5. Measured from the maximum diameter of the product. 6. Leads having a maximum diameter .019 (.48 mm) measured in gaging plane .054 (1.37 mm) + .001 (.03 mm) .000 (.00 mm) below the base plane of the product shall be within .007 (.18 mm) of their true position relative to a maximum width tab. 7. The product may be measured by direct methods or by gage. FIGURE 3. Case outline X (device type 03). 19 MIL-M-38510/118B Symbol A A1 φb φD e e1 e2 F φH L L1 R R1 Dimensions Inches Millimeters Min Max Min Max .250 .352 6.35 8.94 1.177 1.197 29.90 30.40 .038 --.655 .420 .043 .875 .675 .440 .97 --16.64 10.67 1.09 22.22 17.14 11.18 .205 .225 5.21 5.72 .060 .151 .312 --- .135 .161 .500 .050 1.52 3.84 7.92 --- 3.43 4.09 12.70 1.27 .495 .131 .525 .188 12.57 3.33 13.34 4.78 Notes 3,7 5,6 4 3,4 NOTES: 1. Dimensions are in inches. 2. Metric equivalents are given for general information only and are based upon 1.00 inch = 25.4 mm. 3. (Two leads) φb applies between L1 and .500 (12.70 mm) from the seating plane. 4. 5. 6. 7. 8. Diameter is uncontrolled in L1 and beyond .500 (12.70 mm) from the seating plane. Two leads. Two holes. Two holes located at true position within diameter .010 (.25 mm). Leads having a maximum diameter .043 (1.09 mm) measured in gaging plane .054 (1.37 mm) + .001 (.03 mm) .000 (.00 mm) below the seating plane shall be located at true position within diameter .014 (.36 mm). The mounting surface of the header shall be flat to convex within .003 (.08 mm) inside a .930 (23.62 mm) diameter circle on the center of the header and flat to convex within .006 (.15 mm) overall. FIGURE 4. Case outline Y (device type 04). 20 MIL-M-38510/118B NOTE: Case is connected to input. FIGURE 5. Terminal connections for device types 01 and 02. NOTES: 1. VOUT = [((R1 + R2) / R2) x (VCONTROL) + |ICONTROL| x R2] volts. 2. VCONTROL = -2.23 V (nominal). 3. R2 = 446 Ω provides a minimum of |5 mA| load to the regulator at any VOUT. FIGURE 6. Block diagram for device types 01 and 02. 21 MIL-M-38510/118B NOTE: Case is connected to input. FIGURE 7. Terminal connections for 03 and 04. NOTES: 1. VOUT = [((R1 + R2) / R1) x (-1.25) + |IADJ| x R2] volts. 2. R1 = 250 Ω. FIGURE 8. Block diagram for device types 03 and 04. 22 MIL-M-38510/118B Device type R1 R2 RL Ci, CL 01 549 Ω Device table 02 549 Ω 03 249 Ω 04 249 Ω 442 Ω 442 Ω 0Ω 0Ω 10 Ω 5Ω 2.5 Ω 0.833 Ω 2.0 µF 2.0 µF 10.0 µF 10.0 µF FIGURE 9. Test circuit for static tests. 23 MIL-M-38510/118B FIGURE 9. Test circuit for static tests – Continued. 24 MIL-M-38510/118B WAVEFORMS FOR VOLTAGE START –UP, OUTPUT SHORT CIRCUIT CURRENT, AND OUTPUT VOLTAGE RECOVERY FIGURE 9. Test circuit for static tests – Continued. 25 MIL-M-38510/118B NOTES: 1. Heavy current paths (I ≥ 1.0 A) are indicated by bold lines. 2. Kelvin connections must be used for all output current and voltage measurements. For device types 03 and 04, output voltage measurements shall be made 1/8 inch below the case. 3. The output offset voltage shall be adjusted to zero with the device under test (DUT) removed. The operational amplifier stabilization networks may vary with test adapter construction. Alternate drive circuits for the 2N6296 may be used to develop the proper load current and input voltage pulses. These circuits shall require the approval of the qualifying activity. 4. Relay switch positions are defined in table III. 5. Load currents of 5 mA may be established via the load resistors R1 and R2. All other load currents 6. 7. 8. shall be established via the pulse load circuit. Resistors R1 and R2 shall have a tolerance ≤ 0.1 % for device types 01 and 02. The pulse generator for the pulse load circuit shall have the following characteristics: a. Pulse amplitude = -10 ( |IL| - VO / ( R1 + R2 )) volts. b. Pulse width = 1.0 ms (unless otherwise stated). c. Duty cycle = 2% (maximum). Load currents shall be determined by the voltage measured across the 1 Ω resistor. Measurements shall be made 0.5 ms after the start of the pulse. |VIN| (LOW) and |VIN| (HIGH) per table III herein. 9. VRLINE = VB – VA. 10. The output voltage is sampled at specified intervals. Strobe pulse width is 100 µs maximum. 11. IL (minimum) and IL (maximum) per table III herein. 12. VRLOAD = VD – VC. 13. VRTH = VD – VE. 14. IOS = (IL) amps. FIGURE 9. Test circuit for static tests – Continued. 26 MIL-M-38510/118B Device type VIN RL Ci, CL 01 -10 V Device table 02 -10 V 03 -6.25 V 04 -6.25 V 40.2 Ω 14.3 Ω 10 Ω 2.5 Ω 2.0 µF 2.0 µF 1.0 µF 1.0 µF NOTES: 1. ei = 1 Vrms at f = 2400 Hz (measured at the input terminals of the DUT). 2. 3. 4. Ripple rejection = 20 log (eirms / eorms). The control pin connection is required for device types 01 and 02 only. The input 50 Ω resistor and RL shall be type RER 70 or equivalent. The meter for ei and eo shall have a minimum bandwidth from 10 Hz to 10 kHz and shall measure true rms voltages. FIGURE 10. Ripple rejection test circuit. 27 MIL-M-38510/118B Device type VIN RL Ci, CL 01 10 V Device table 02 10 V 03 6.25 V 04 6.25 V 100 Ω 50 Ω 25 Ω 12.5 Ω 2.0 µF 2.0 µF 1.0 µF 1.0 µF NOTES: 1. The meter for measuring eorms and shall have a minimum bandwidth from 10 Hz to 10 kHz and shall measure true rms voltages. 2. NO = eorms 3. The control pin connection is required for device types 01 and 02 only. 4. RL shall be type RER 70 or equivalent. FIGURE 11. Noise test circuit. 28 MIL-M-38510/118B VIN 01 -10 V Device table 02 -10 V 03 -6.25 V 04 -6.25 V Notes 1 ∆VIN -3.0 V -3.0 V -1.0 V -1.0 V 1 1.25 kΩ 1.25 kΩ 25 Ω 12 Ω tTHL = tTLH 5.0 µs 5.0 µs 5.0 µs 5.0 µs Ci, CL 2.0 µF 2.0 µF 1.0 µF 1.0 µF Device type RL NOTES: 1. Measured at device input. 2. Pulse width tp1 = 25 µs; duty cycle = 3% (maximum). 3. Oscilloscope bandwidth = 5 MHz to 15 MHz. 4. The control pin connection is required for device types 01 and 02 only.. FIGURE 12. Line transient test circuit. 29 1 MIL-M-38510/118B Device type R1 01 0 Device table 02 0 03 249 Ω 04 249 Ω R2 5.0 kΩ 5.0 kΩ 0 0 IL 50 mA 100 mA 50 mA 100 mA ∆IL 200 mA 400 mA 200 mA 400 mA VI 0.49 V 0.99 V 0.45 V 0.95 V ∆VI 2.0 V 4.0 V 2.0 V 4.0 V 2.0 µF 2.0 µF 1.0 µF 1.0 µF Ci, CL FIGURE 13. Load transient response test circuit. 30 MIL-M-38510/118B NOTES: 1. Heavy current paths (I ≥ 1.0 A) are indicated by bold lines. 2. Kelvin connections must be used for all output current and voltage measurements. 3. The operational amplifier stabilization networks may vary with test adapter construction. Alternate drive circuits for the 2N6296 may be used to develop the proper load current and input voltage pulses. These circuits shall require the approval of the qualifying activity. 4. The pulse generator for the pulse load circuit shall have the following characteristics. (See device table.) a. Voltage level (VI) = 10 ( |IL| - (VOUT / (R1 + R2)) volts. 5. b. c. d. Pulse width (tp2) = 25 µs. Duty cycle = 3% (maximum). tTHL = tTLH = 1.0 µs for device types 01 and 02. e. tTHL = tTLH = 5.0 µs for device types 03 and 04. f. Difference voltage level (∆VI) = 10 (IL) volts. a. ∆VOUT = 500 mV maximum for device type 01. b. ∆VOUT = 1,000 mV maximum for device type 02. ∆VOUT = 60 mV maximum for device types 03 and 04. (These values guarantee the specified limits for load transient response.) The oscilloscope shall have a bandwidth between 5 and 15 MHz. c. 6. FIGURE 13. Load transient response test circuit – Continued. 31 TABLE III. Group A inspection for all device type 01. Subgroup 1 TA = +25°C TA = +125°C Test no. Test conditions VOUT1 VOUT2 VOUT3 VOUT4 1 2 3 4 VIN (volts) -8 -8 -30 -30 VRLINE1 VRLINE2 VRLINE2 5 6 7 -8 -8 -25 VRLOAD1 VRLOAD1 VRLOAD2 8 9 10 VRTH IL (mA) 5 500 5 50 See figure 9 Applied test voltages (volts) (Hi – Lo pin potential) 1-2 4-5 6-11 7-2 8-2 Relays energized Measurement sense lines Pins Value Equation Notes Units Limits Min -8 -8 -30 -30 --4.95 --0.45 --------- --------- --------- None “ “ “ 9-11 “ “ “ E1 E2 E3 E4 V “ “ “ VOUT1 = E1 VOUT2 = E2 VOUT3 = E3 VOUT4 = E4 50 350 350 -8 -8 -25 0.45 3.45 3.45 ------- ------- ------- “ “ “ “ “ “ E5 E6 E7 “ “ “ VRLINE1 = E5 – E4 --- -10 -10 --- 5 500 --- -10 -10 --- --4.95 --- ------- ------- ------- “ “ “ “ “ --- E8 E9 --- “ “ “ VRLOAD1 = E8 – E9 VRLOAD2 = E3 – E4 11 -15 500 -15 4.95 --- --- --- “ 9-11 E10 “ VRTH = E10 ISCD1 ISCD2 12 13 -10 -30 5 5 -10 -30 ----- ----- ----- ----- “ “ 12-13 “ E11 E12 “ “ ∆ISCD (LINE) ∆ISCD (LOAD) IOS1 VOUT5 (RECOV) IOS2 VOUT6 (RECOV) ICTL 14 -8 5 -8 --- --- --- --- “ “ E13 “ 15 -10 500 -10 4.95 --- --- --- “ “ E14 “ 16 17 -10 -10 ----- -15 -15 ----- ----- -1.0 -1.0 0 0 K4,K5 K4,K5 10-5 9-11 E15 E16 18 19 -30 -30 ----- -40 -40 ----- ----- -3.5 -3.5 0 0 K5 K5 10-5 9-11 Unit Max -5.25 -4.75 “ “ “ “ “ “ V “ “ “ See figure 9 waveforms -150 ---50 150 --50 mV “ “ See figure 9 waveforms ---100 -150 --100 150 “ “ “ See figure 9 waveforms -50 50 “ ISCD1 = E11 / 2000 ISCD2 = E12 / 2000 0.1 0.1 3.0 4.0 mA “ -1.0 1.0 “ -0.5 0.5 “ “ “ ∆ISCD = E13 – E12 / 2000 (LINE) ∆ISCD = E11 – E14 / 2000 (LOAD) IOS1 = E15 VOUT5 = E16 E17 E18 “ “ IOS2 = E17 VOUT6 = E18 VRLINE2 = E6 – E7 --- 20 -10 350 -10 3.45 --- --- --- K1,K2 12-13 E19 “ ICTL = E19 / 33200 VSTART 21 -8 500 -15 --- --- -0.8 --- K4 9-11 E20 “ VOUT = E20 VOUT7 22 -38 500 -38 4.95 --- --- --- None “ E21 “ VOUT = E21 VOUT1 VOUT2 VOUT3 VOUT4 23 24 25 26 -8 -8 -30 -30 5 500 5 50 -8 -8 -30 -30 --4.95 --0.45 --------- --------- --------- None “ “ “ 9-11 “ “ “ E22 E23 E24 E25 V “ “ “ VOUT1 = E22 VOUT2 = E23 VOUT3 = E24 VOUT4 = E25 VRLINE1 VRLINE2 VRLINE2 27 28 29 -8 -8 -25 50 350 350 -8 -8 -25 0.45 3.45 3.45 ------- ------- ------- “ “ “ “ “ “ E26 E27 E28 “ “ “ VRLINE1 = E26 – E25 --- VRLOAD1 VRLOAD1 VRLOAD2 30 31 32 -10 -10 --- 5 500 --- -10 -10 --- --4.95 --- ------- ------- ------- “ “ “ “ “ --- E29 E30 --- “ “ “ VRLOAD1 = E29 – E30 VRLOAD2 = E24 – E25 ISCD1 ISCD2 33 34 -10 -30 5 5 -10 -30 ----- ----- ----- ----- “ “ 12-13 “ E31 E32 “ “ ISCD1 = E31 / 2000 ISCD2 = E32 / 2000 VRLINE2 = E27 – E28 --- See figure 9 waveforms 0.002 2.0 -5.25 -4.75 A V 0.002 1.0 -5.25 -4.75 A V 0.001 µA V 2 See figure 9 -5.25 -4.75 waveforms R1 = 5.49 kΩ -31.5 -28.5 ±0.1% -5.25 -4.75 “ “ “ “ “ “ V V “ “ “ See figure 9 waveforms -150 ---50 150 --50 mV “ “ See figure 9 waveforms ---100 -150 --100 150 “ “ “ 0.1 0.1 3.0 4.0 mA “ MIL-M-38510/118B 32 2 Symbol TABLE III. Group A inspection for all device type 01 – Continued. Subgroup 2 TA = +125°C TA = +150°C 3 TA = -55°C Symbol Test no. Test conditions ∆ISCD (LINE) ∆ISCD (LOAD) 35 VIN (volts) -8 36 -10 IOS1 VOUT5 (RECOV) IOS2 VOUT6 (RECOV) ICTL 37 38 VSTART VOUT7 IL (mA) 5 See figure 9 Applied test voltages (volts) (Hi – Lo pin potential) 1-2 4-5 6-11 7-2 8-2 Relays energized Measurement sense lines Equation Pins Value Units Notes ∆ISCD = E33 – E32 / 2000 (LINE) ∆ISCD = E31 – E34 / 2000 (LOAD) Unit Limits Min Max -1.0 1.0 mA -0.5 0.5 “ 0.002 -5.25 2.0 -4.75 A V 0.002 -5.25 1.0 -4.75 A V 0.001 3 -5.25 -4.75 µA V -31.5 -28.5 V --- --- --- --- None 12-13 E33 V 500 -10 4.95 --- --- --- “ “ E34 “ -10 -10 ----- -15 -15 ----- ----- -1.0 -1.0 0 0 K4,K5 K4,K5 10-5 9-11 E35 E36 “ “ IOS1 = E35 VOUT5 = E36 39 40 -30 -30 ----- -40 -40 ----- ----- -3.5 -3.5 0 0 K5 K5 10-5 9-11 E37 E38 “ “ IOS2 = E37 VOUT6 = E38 41 -10 350 -10 3.45 --- --- --- K1,K2 12-13 E39 “ ICTL = E39 / 33200 42 -8 500 -15 --- --- -0.8 --- K4 9-11 E40 “ VOUT = E40 43 -38 500 -38 4.95 --- --- --- None “ E41 “ VOUT7 = E41 VOUT8 44 -10 5 -10 --- --- --- --- “ “ E42 “ VOUT8 = E42 -5.30 -4.70 “ VOUT1 VOUT2 VOUT3 VOUT4 45 46 47 48 -8 -8 -30 -30 5 500 5 50 -8 -8 -30 -30 --4.95 --0.45 --------- --------- --------- None “ “ “ 9-11 “ “ “ E43 E44 E45 E46 V “ “ “ VOUT1 = E43 VOUT2 = E44 VOUT3 = E45 VOUT4 = E46 -5.25 “ “ “ -4.75 “ “ “ V “ “ “ VRLINE1 VRLINE2 VRLINE2 49 50 51 -8 -8 -25 50 350 350 -8 -8 -25 0.45 3.45 3.45 ------- ------- ------- “ “ “ “ “ “ E47 E48 E49 “ “ “ VRLINE1 = E47 – E46 --- See figure 9 waveforms -150 ---50 150 --50 mV “ “ VRLOAD1 VRLOAD1 VRLOAD2 52 53 54 -10 -10 --- 5 500 --- -10 -10 --- --4.95 --- ------- ------- ------- “ “ “ “ “ --- E50 E51 --- “ “ “ VRLOAD1 = E50 – E51 VRLOAD2 = E45 – E46 See figure 9 waveforms ---100 -150 --100 150 “ “ “ ISCD1 ISCD2 55 56 -10 -30 5 5 -10 -30 ----- ----- ----- ----- “ “ 12-13 “ E52 E53 “ “ ISCD1 = E52 / 2000 ISCD2 = E53 / 2000 0.1 0.1 3.0 4.0 mA “ ∆ISCD (LINE) ∆ISCD (LOAD) IOS1 VOUT5 (RECOV) IOS2 VOUT6 (RECOV) ICTL 57 -8 5 -8 --- --- --- --- None 12-13 E54 V -1.0 1.0 mA 58 -10 500 -10 4.95 --- --- --- “ “ E55 “ -0.5 0.5 “ 59 60 -10 -10 ----- -15 -15 ----- ----- -1.0 -1.0 0 0 K4,K5 K4,K5 10-5 9-11 E56 E57 “ “ ∆ISCD = E54 – E53 / 2000 (LINE) ∆ISCD = E52 – E55 / 2000 (LOAD) IOS1 = E56 VOUT5 = E57 0.002 -5.25 2.0 -4.75 A V 61 62 -30 -30 ----- -40 -40 ----- ----- -3.5 -3.5 0 0 K5 K5 10-5 9-11 E58 E59 “ “ IOS2 = E58 VOUT6 = E59 0.002 -5.25 1.0 -4.75 A V 0.001 3 -5.25 -4.75 µA V -31.5 -28.5 V VRLINE2 = E48 – E49 --- 63 -10 350 -10 3.45 --- --- --- K1,K2 12-13 E60 “ ICTL = E60 / 33200 VSTART 64 -8 500 -15 --- --- -0.8 --- K4 9-11 E61 “ VOUT = E61 VOUT7 65 -38 500 -38 4.95 --- --- --- None “ E62 “ VOUT = E62 See figure 9 waveforms See figure 9 waveforms R1 = 5.49 kΩ ±0.1% See figure 9 waveforms See figure 9 waveforms R1 = 5.49 kΩ ±0.1% MIL-M-38510/118B 33 -8 TABLE III. Group A inspection for all device type 01 – Continued. Subgroup Symbol Test no. Test conditions Input voltage VIN = -10 V Measurement sense lines Equation Symbol Value Units Load current IL = 125 mA eorms E63 Vrms ∆VIN / ∆VOUT = -20 log E63 VNO = E64 4 ∆VIN / TA = +25°C 7 ∆VOUT VNO 67 VIN = -10 V IL = 50 mA eorms E64 Vrms TA = ∆VOUT / 68 VIN = -10 V IL = 5 mA VOUT E65 V ∆VOUT / ∆VIN = E65 / 3 +25°C ∆VIN IL = 50 mA VOUT E66 V ∆VOUT / ∆IL = E66 / 200 ∆VOUT / ∆IL 66 Notes Unit Limits Min Max See figure 10 45 --- dB See figure 11 See figure 12 --- 250 µVrms --- 30 mV/V --- 2.5 mV/mA ei = 1.0 Vrms at 2400 Hz Vpulse = -3.0 V 69 VIN = -10 V See figure 13 ∆IL = 200 mA MIL-M-38510/118B 34 TABLE III. Group A inspection for all device type 02. Subgroup 1 TA = +25°C TA = +125°C Test no. Test conditions VOUT1 VOUT2 VOUT3 VOUT4 1 2 3 4 VIN (volts) -8 -8 -30 -30 VRLINE1 VRLINE2 VRLINE2 5 6 7 -8 -8 -25 VRLOAD1 VRLOAD1 VRLOAD2 8 9 10 VRTH IL (mA) 5 1000 5 100 See figure 9 Applied test voltages (volts) (Hi – Lo pin potential) 1-2 4-5 6-11 7-2 8-2 Relays energized Measurement sense lines Pins Value Equation Notes Units Min -8 -8 -30 -30 --9.95 --0.95 --------- --------- --------- None “ “ “ 9-11 “ “ “ E1 E2 E3 E4 V 100 500 500 -8 -8 -25 0.95 4.95 4.95 ------- ------- ------- “ “ “ “ “ “ E5 E6 E7 “ “ “ -10 -10 --- 5 1000 --- -10 -10 --- --9.95 --- ------- ------- ------- “ “ “ “ “ --- E8 E9 --- “ “ “ VRLOAD1 = E8 – E9 VRLOAD2 = E3 – E4 11 -15 1000 -15 9.95 --- --- --- “ 9-11 E10 “ VRTH = E10 ISCD1 ISCD2 12 13 -10 -30 5 5 -10 -30 ----- ----- ----- ----- “ “ 12-13 “ E11 E12 “ “ ∆ISCD (LINE) ∆ISCD (LOAD) IOS1 VOUT5 (RECOV) IOS2 VOUT6 (RECOV) ICTL 14 -8 5 -8 --- --- --- --- “ “ E13 “ 15 -10 1000 -10 9.95 --- --- --- “ “ E14 “ 16 17 -10 -10 ----- -15 -15 ----- ----- -1.0 -1.0 0 0 K4,K5 K4,K5 10-5 9-11 E15 E16 18 19 -30 -30 ----- -40 -40 ----- ----- -3.5 -3.5 0 0 K5 K5 10-5 9-11 “ “ “ Limits Max -5.25 -4.75 “ “ “ “ “ “ VOUT1 = E1 VOUT2 = E2 VOUT3 = E3 VOUT4 = E4 Unit V “ “ “ See figure 9 waveforms -150 ---50 150 --50 mV “ “ See figure 9 waveforms ---100 -150 --100 150 “ “ “ See figure 9 waveforms -50 50 “ ISCD1 = E11 / 2000 ISCD2 = E12 / 2000 0.1 0.1 3.0 4.0 mA “ -1.0 1.0 “ -0.5 0.5 “ “ “ ∆ISCD = E13 – E12 / 2000 (LINE) ∆ISCD = E11 – E14 / 2000 (LOAD) IOS1 = E15 VOUT5 = E16 E17 E18 “ “ IOS2 = E17 VOUT6 = E18 E19 “ ICTL = E19 / 33200 VRLINE1 = E5 – E4 --VRLINE2 = E6 – E7 --- 20 -10 500 -10 4.95 --- --- --- K1,K2 12-13 VSTART 21 -8 1000 -15 --- --- -0.8 --- K4 9-11 E20 “ VOUT = E20 VOUT7 22 -38 1000 -38 --- --- --- --- None “ E21 “ VOUT7 = E21 VOUT1 VOUT2 VOUT3 VOUT4 23 24 25 26 -8 -8 -30 -30 5 1000 5 100 -8 -8 -30 -30 --9.95 --0.95 --------- --------- --------- None “ “ “ 9-11 “ “ “ E22 E23 E24 E25 V “ “ “ VOUT1 = E22 VOUT2 = E23 VOUT3 = E24 VOUT4 = E25 VRLINE1 VRLINE2 VRLINE2 27 28 29 -8 -8 -25 100 500 500 -8 -8 -25 0.95 4.95 4.95 ------- ------- ------- “ “ “ “ “ “ E26 E27 E28 “ “ “ VRLINE1 = E26 – E25 --- VRLOAD1 VRLOAD1 VRLOAD2 30 31 32 -10 -10 --- 5 1000 --- -10 -10 --- --9.95 --- ------- ------- ------- “ “ “ “ “ --- E29 E30 --- “ “ “ VRLOAD1 = E29 – E30 VRLOAD2 = E24 – E25 ISCD1 ISCD2 33 34 -10 -30 5 5 -10 -30 ----- ----- ----- ----- “ “ 12-13 “ E31 E32 “ “ ISCD1 = E31 / 2000 ISCD2 = E32 / 2000 VRLINE2 = E27 – E28 --- See figure 9 waveforms 0.002 4.5 -5.25 -4.75 A V 0.002 2.0 -5.25 -4.75 A V 0.01 µA V 2 See figure 9 -5.25 -4.75 waveforms R1 = 5.49 kΩ -31.5 -28.5 ±0.1% -5.25 -4.75 “ “ “ “ “ “ V V “ “ “ See figure 9 waveforms -150 ---50 150 --50 mV “ “ See figure 9 waveforms ---100 -150 --100 150 “ “ “ 0.1 0.1 3.0 4.0 mA “ MIL-M-38510/118B 35 2 Symbol TABLE III. Group A inspection for all device type 02 – Continued. Subgroup 2 TA = +125°C TA = +150°C 3 TA = -55°C Symbol Test no. Test conditions ∆ISCD (LINE) ∆ISCD (LOAD) 35 VIN (volts) -8 36 -10 IOS1 VOUT5 (RECOV) IOS2 VOUT6 (RECOV) ICTL 37 38 VSTART VOUT7 IL (mA) 5 See figure 9 Applied test voltages (volts) (Hi - Lo pin potential) 1-2 4-5 6-11 7-2 8-2 Relays energized Measurement sense lines Equation Pins Value Units Notes ∆ISCD = E33 – E32 / 2000 (LINE) ∆ISCD = E31 – E34 / 2000 (LOAD) Limits Unit Min Max -1.0 1.0 mA -0.5 0.5 “ 0.002 -5.25 4.5 -4.75 A V 0.002 -5.25 2.0 -4.75 A V 0.001 3 -5.25 -4.75 µA V -31.5 -28.5 V --- --- --- --- None 12-13 E33 V 1000 -10 9.95 --- --- --- “ “ E34 “ -10 -10 ----- -15 -15 ----- ----- -1.0 -1.0 0 0 K4,K5 K4,K5 10-5 9-11 E35 E36 “ “ IOS1 = E35 VOUT5 = E36 39 40 -30 -30 ----- -40 -40 ----- ----- -3.5 -3.5 0 0 K5 K5 10-5 9-11 E37 E38 “ “ IOS2 = E37 VOUT6 = E38 41 -10 500 -10 4.95 --- --- --- K1,K2 12-13 E39 “ ICTL = E39 / 33200 42 -8 1000 -15 --- --- -0.8 --- K4 9-11 E40 “ VOUT = E40 43 -38 1000 -38 --- --- --- --- None “ E41 “ VOUT7 = E41 VOUT8 44 -10 5 -10 --- --- --- --- “ “ E42 “ VOUT8 = E42 -5.30 -4.70 “ VOUT1 VOUT2 VOUT3 VOUT4 45 46 47 48 -8 -8 -30 -30 5 1000 5 100 -8 -8 -30 -30 --9.95 --0.95 --------- --------- --------- None “ “ “ 9-11 “ “ “ E43 E44 E45 E46 V “ “ “ VOUT1 = E43 VOUT2 = E44 VOUT3 = E45 VOUT4 = E46 -5.25 “ “ “ -4.75 “ “ “ V “ “ “ VRLINE1 VRLINE2 VRLINE2 49 50 51 -8 -8 -25 100 500 500 -8 -8 -25 0.95 4.95 4.95 ------- ------- ------- “ “ “ “ “ “ E47 E48 E49 “ “ “ VRLINE1 = E47 – E46 --- See figure 9 waveforms -150 ---50 150 --50 mV “ “ VRLOAD1 VRLOAD1 VRLOAD2 52 53 54 -10 -10 --- 5 1000 --- -10 -10 --- --9.95 --- ------- ------- ------- “ “ “ “ “ --- E50 E51 --- “ “ “ VRLOAD1 = E50 – E51 VRLOAD2 = E45 – E46 See figure 9 waveforms ---100 -150 --100 150 “ “ “ ISCD1 ISCD2 55 56 -10 -30 5 5 -10 -30 ----- ----- ----- ----- “ “ 12-13 “ E52 E53 “ “ ISCD1 = E52 / 2000 ISCD2 = E53 / 2000 0.1 0.1 3.0 4.0 mA “ ∆ISCD (LINE) ∆ISCD (LOAD) IOS1 VOUT5 (RECOV) IOS2 VOUT6 (RECOV) ICTL 57 -8 5 -8 --- --- --- --- None 12-13 E54 V -1.0 1.0 mA 58 -10 1000 -10 9.95 --- --- --- “ “ E55 “ -0.5 0.5 “ 59 60 -10 -10 ----- -15 -15 ----- ----- -1.0 -1.0 0 0 K4,K5 K4,K5 10-5 9-11 E56 E57 “ “ ∆ISCD = E54 – E53 / 2000 (LINE) ∆ISCD = E52 – E55 / 2000 (LOAD) IOS1 = E56 VOUT5 = E57 0.002 -5.25 4.5 -4.75 A V 61 62 -30 -30 ----- -40 -40 ----- ----- -3.5 -3.5 0 0 K5 K5 10-5 9-11 E58 E59 “ “ IOS2 = E58 VOUT6 = E59 0.002 -5.25 2.0 -4.75 A V 0.001 3 -5.25 -4.75 µA V -31.5 -28.5 V VRLINE2 = E48 – E49 --- 63 -10 500 -10 4.95 --- --- --- K1,K2 12-13 E60 “ ICTL = E60 / 33200 VSTART 64 -8 1000 -15 --- --- -0.8 --- K4 9-11 E61 “ VOUT = E61 VOUT7 65 -38 1000 -38 --- --- --- --- None “ E62 “ VOUT7 = E62 See figure 9 waveforms See figure 9 waveforms R1 = 5.49 kΩ ±0.1% See figure 9 waveforms See figure 9 waveforms R1 = 5.49 kΩ ±0.1% MIL-M-38510/118B 36 -8 TABLE III. Group A inspection for all device type 02 – Continued. Subgroup Symbol Test no. Test conditions Input voltage VIN = -10 V Measurement sense lines Equation Symbol Value Units Load current IL = 350 mA eorms E63 Vrms ∆VIN / ∆VOUT = -20 log E63 VNO = E64 4 ∆VIN / TA = +25°C 7 ∆VOUT VNO 67 VIN = -10 V IL = 100 mA eorms E64 Vrms TA = ∆VOUT / 68 VIN = -10 V IL = 5 mA VOUT E65 V ∆VOUT / ∆VIN = E65 / 3 IL = 100 mA VOUT E66 V ∆VOUT / ∆IL = E66 / 400 +25°C 66 Unit Min Max See figure 10 45 --- dB See figure 11 See figure 12 --- 250 µVrms --- 30 mV/V --- 2.5 mV/mA Vpulse = -3.0 V 69 VIN = -10 V ∆IL = 400 mA See figure 13 37 MIL-M-38510/118 ∆IL Limits ei = 1.0 Vrms at 2400 Hz ∆VIN ∆VOUT / Notes TABLE III. Group A inspection for all device type 03. Subgroup 1 TA = +25°C TA = +125°C Test no. Test conditions See figure 9 Applied test voltages (volts) (Hi – Lo pin potential) 1-2 4-5 6-11 7-2 8-2 Relays energized Measurement sense lines Equation Pins Value Units None “ “ “ 9-11 “ “ “ E1 E2 E3 E4 --- V “ “ “ VOUT1 = E1 VOUT2 = E2 VOUT3 = E3 VOUT4 = E4 “ VRLINE = E1 – E3 VRLOAD1 = E5 – E6 VRLOAD2 = E3 – E4 VRLOAD3 = E5 – E7 Notes Lines Unit Min Max -1.275 “ “ “ -1.225 “ “ “ V “ “ “ -9 9 mV ---12 -6 -6 --12 6 6 “ “ “ “ -5 5 “ VOUT1 VOUT2 VOUT3 VOUT4 1 2 3 4 VIN (volts) -4.25 -4.25 -41.25 -41.25 VRLINE1 5 --- --- --- --- --- --- --- “ “ VRLOAD1 VRLOAD1 VRLOAD2 VRLOAD3 6 7 8 9 -6.25 -6.25 ---6.25 5 500 --200 -6.25 -6.25 ---6.25 0 4.95 --1.95 --------- --------- --------- “ “ “ “ “ “ “ “ E5 E6 E7 “ “ “ “ VRTH 10 -14.6 500 -14.6 7.45 --- --- --- “ “ E8 “ VRTH = E8 IADJ IADJ 11 12 -4.25 -41.25 5 5 -4.25 -41.25 0 0 ----- ----- ----- K2 “ 12-13 “ mV “ IADJ = E9 / 2000 IADJ = E10 / 2000 25 25 100 100 µA “ ∆IADJ (LINE) ∆IADJ (LOAD) 13 --- --- --- --- --- --- --- “ “ E9 E10 --- “ ∆IADJ = (E9 – E10) / 2000 (LINE) -5 5 “ 14 -6.25 5 -6.25 0 --- --- --- “ “ E11 “ 5 “ 15 -6.25 500 -6.25 4.95 --- --- --- “ “ E12 “ ∆IADJ = (E11 – E12) / 2000 (LINE) -5 ∆IADJ (LOAD) IOS1 VOUT5 (RECOV) IOS2 VOUT6 (RECOV) IQ1 16 17 -4.25 -4.25 ----- -10 -10 ----- ----- -0.425 -0.425 0 0 K4,K5 K4,K5 10-5 9-11 E13 E14 V “ 0.05 -1.275 1.8 -1.225 A V 18 19 -40 -40 ----- -40 -40 ----- ----- ----- 0 0 K5 K5 10-5 9-11 E15 E16 “ “ 0.05 -1.275 0.5 -1.225 A V IL (mA) 5 500 5 50 -4.25 -4.25 -41.25 -41.25 --4.95 --0.45 --------- --------- --------- --- See figure 9 waveforms See figure 9 waveforms See figure 9 waveforms See figure 9 waveforms 20 -4.25 --- -4.25 0 -1.4 --- --- K3 12-13 E17 “ IOS1 = E13 VOUT5 = E14 (RECOV) IOS2 = E15 VOUT6 = E16 (RECOV) IQ1 = E17 / 2000 0.2 3.0 mA IQ2 21 -14.25 --- -14.25 0 -1.4 --- --- K3 12-13 E18 “ IQ2 = E18 / 2000 0.2 3.0 “ IQ3 22 -41.25 --- -41.25 0 -1.4 --- --- K3 12-13 E19 “ IQ3 = E19 / 2000 1.0 5.0 “ VSTART 23 -4.25 500 -10 0 --- -0.425 --- K4 9-11 E20 “ VSTART = E20 -1.275 -1.225 V VOUT1 VOUT2 VOUT3 VOUT4 24 25 26 27 -4.25 -4.25 -41.25 -41.25 5 500 5 50 -4.25 -4.25 -41.25 -41.25 --4.95 --0.45 --------- --------- --------- None “ “ “ 9-11 “ “ “ V “ “ “ VOUT1 = E21 VOUT2 = E22 VOUT3 = E23 VOUT4 = E24 -1.30 “ “ “ -1.20 “ “ “ V “ “ “ VRLINE1 28 --- --- --- --- --- --- --- “ “ E21 E22 E23 E24 --- “ VRLINE = E21 – E23 -23 23 mV VRLOAD1 VRLOAD1 VRLOAD2 VRLOAD3 29 30 31 32 -6.25 -6.25 ---6.25 5 500 --200 -6.25 -6.25 ---6.25 0 4.95 --1.95 --------- --------- --------- “ “ “ “ “ “ “ “ E25 E26 --- “ “ “ “ VRLOAD1 = E25 – E26 VRLOAD2 = E23 – E24 VRLOAD3 = E25 – E27 ---24 -12 -12 --24 12 12 “ “ “ “ E27 --- See figure 9 waveforms See figure 9 waveforms See figure 9 waveforms MIL-M-38510/118B 38 2 Symbol TABLE III. Group A inspection for all device type 03 – Continued. Subgroup Symbol Test no. Test conditions See figure 9 Applied test voltages (volts) (Hi – Lo pin potential) 1-2 4-5 6-11 7-2 8-2 Relays energized Measurement sense lines Equation Pins Value Units K2 “ 12-13 “ mV “ “ IADJ IADJ 33 34 TA = +125°C ∆IADJ (LINE) 35 --- --- --- --- --- --- --- “ “ E28 E29 --- ∆IADJ (LOAD) 36 -6.25 5 -6.25 0 --- --- --- “ “ E30 “ ∆IADJ (LOAD) IOS1 VOUT5 (RECOV) IOS2 VOUT6 (RECOV) IQ1 IQ2 IQ3 37 -6.25 500 -6.25 4.95 --- --- --- “ “ E31 “ 38 39 -4.25 -4.25 ----- -10 -10 ----- ----- -0.425 -0.425 0 0 K4,K5 K4,K5 10-5 9-11 E32 E33 V “ 40 41 -40 -40 ----- -40 -40 ----- ----- ----- 0 0 K5 K5 10-5 9-11 E34 E35 “ “ 42 43 44 -4.25 -14.25 -41.25 ------- -4.25 -14.25 -41.25 0 0 0 -1.4 -1.4 -1.4 ------- ------- K3 K3 K3 12-13 12-13 12-13 E36 E37 E38 VSTART 45 -4.25 500 -10 0 --- -0.425 --- K4 9-11 VOUT7 46 -6.25 5 -6.25 0 --- --- --- None VOUT1 VOUT2 VOUT3 VOUT4 47 48 49 50 -4.25 -4.25 -41.25 -41.25 5 500 5 50 -4.25 -4.25 -41.25 -41.25 0 4.95 0 0.45 --------- --------- --------- VRLINE1 51 --- --- --- --- --- --- VRLOAD1 VRLOAD1 VRLOAD2 VRLOAD3 52 53 54 55 -6.25 -6.25 ---6.25 5 500 --200 -6.25 -6.25 ---6.25 0 4.95 --1.95 --------- IADJ IADJ 56 57 -4.25 -41.25 5 5 -4.25 -41.25 0 0 ∆IADJ (LINE) ∆IADJ (LOAD) 58 --- --- --- 59 -6.25 5 ∆IADJ (LOAD) 60 -6.25 500 TA = +150°C 3 TA = -55°C IL (mA) 5 5 -4.25 -41.25 0 0 ----- ----- ----- Limits Unit Min Max IADJ = E28 / 2000 IADJ = E29 / 2000 25 25 100 100 µA “ ∆IADJ = (E28 – E29) / 2000 (LINE) -5 5 “ ∆IADJ = (E30 – E31) / 2000 (LINE) -5 5 “ 0.5 -1.30 1.8 -1.20 A V 0.05 -1.30 0.5 -1.20 A V 0.2 0.2 1.0 3.0 3.0 5.0 mA “ “ -1.30 -1.20 V See figure 9 waveforms “ “ “ IOS1 = E32 VOUT5 = E33 (RECOV) IOS2 = E34 VOUT6 = E35 (RECOV) IQ1 = E36 / 2000 IQ2 = E37 / 2000 IQ3 = E38 / 2000 E39 “ VSTART = E39 See figure 9 waveforms “ E40 “ VOUT7 = E40 -1.30 -1.20 V None “ “ “ 9-11 “ “ “ V “ “ “ VOUT1 = E41 VOUT2 = E42 VOUT3 = E43 VOUT4 = E44 -1.30 “ “ “ -1.20 “ “ “ V “ “ “ --- “ “ E41 E42 E43 E44 --- “ VRLINE = E41 – E43 -23 23 mV --------- --------- “ “ “ “ “ “ “ “ E45 E46 E47 E48 “ “ “ “ VRLOAD1 = E45 – E46 VRLOAD2 = E43 – E44 VRLOAD3 = E45 – E48 ---24 -12 -12 --24 12 12 “ “ “ “ ----- ----- ----- K2 “ 12-13 “ mV “ IADJ = E49 / 2000 IADJ = E50 / 2000 25 25 100 100 µA “ --- --- --- --- “ “ E49 E50 --- “ ∆IADJ = (E49 – E50) / 2000 (LINE) -5 5 “ -6.25 0 --- --- --- “ “ E51 “ 5 “ 4.95 --- --- --- “ “ E52 “ ∆IADJ = (E51 – E52) / 2000 (LINE) -5 -6.25 --- See figure 9 waveforms See figure 9 waveforms MIL-M-38510/118B 39 2 VIN (volts) -4.25 -41.25 Notes TABLE III. Group A inspection for all device type 03 – Continued. Subgroup 3 TA = -55°C Test no. Test conditions See figure 9 Applied test voltages (volts) (Hi – Lo pin potential) 1-2 4-5 6-11 7-2 8-2 Relays energized Measurement sense lines Equation Pins Value Units K4,K5 10-5 E53 V IOS1 = E53 IOS1 61 VIN (volts) -4.25 VOUT5 (RECOV) 62 -4.25 --- -10 --- --- -0.425 0 K4,K5 9-11 E54 “ VOUT5 = E54 (RECOV) IOS2 VOUT6 (RECOV) IQ1 IQ2 IQ3 63 64 -40 -40 ----- -40 -40 ----- ----- ----- 0 0 K5 K5 10-5 9-11 E55 E56 “ “ 65 66 67 -4.25 -14.25 -41.25 ------- -4.25 -14.25 -41.25 0 0 0 -1.4 -1.4 -1.4 ------- ------- K3 K3 K3 12-13 12-13 12-13 E57 E58 E59 “ “ “ IOS2 = E55 VOUT6 = E56 (RECOV) IQ1 = E57 / 2000 IQ2 = E58 / 2000 IQ3 = E59 / 2000 VSTART 68 -4.25 500 -10 0 --- -0.425 --- K4 9-11 E60 “ VSTART = E60 See figure 9 waveforms Symbol Test no. Equation Notes IL (mA) --- -10 --- --- -0.425 0 Test conditions Measurement sense lines Symbol Value Input voltage VIN = -6.25 V eorms E61 Vrms ∆VIN / ∆VOUT = -20 log E61 VNO = E62 40 ∆VIN / TA = +25°C 7 ∆VOUT VNO 70 VIN = -6.25 V IL = 50 mA eorms E62 Vrms TA = ∆VOUT / 71 VIN = -6.25 V IL = 50 mA VOUT E63 V ∆VOUT / ∆VIN = E59 / 1 IL = 50 mA VOUT E64 V ∆VOUT / ∆IL = E64 / 200 69 ∆IL Limits Unit Min Max 0.5 1.8 A -1.30 -1.20 V 0.05 -1.30 0.5 -1.20 A V 0.2 0.2 1.0 3.0 3.0 5.0 mA “ “ -1.30 -1.20 V Unit Limits Min Max See figure 10 48 --- dB See figure 11 See figure 12 --- 120 µVrms --- 80 mV/V See figure 13 --- 0.30 mV/mA ei = 1.0 Vrms at 2400 Hz ∆VIN ∆VOUT / See figure 9 waveforms Units Load current IL = 125 mA 4 +25°C Notes Vpulse = -1.0 V 72 VIN = -6.25 V ∆IL = 200 mA MIL-M-38510/118B Subgroup Symbol TABLE III. Group A inspection for all device type 04. Subgroup 1 TA = +25°C TA = +125°C Test no. Test conditions See figure 9 Applied test voltages (volts) (Hi – LO pin potential) 1-2 4-5 6-11 7-2 8-2 VOUT1 VOUT2 VOUT3 VOUT4 1 2 3 4 VIN (volts) -4.25 -4.25 -41.25 -41.25 VRLINE1 5 --- --- --- VRLOAD1 VRLOAD1 VRLOAD2 6 7 8 -6.25 -6.25 --- 5 1500 --- VRTH 9 -14.6 1500 IADJ 10 -4.25 IADJ 11 -41.25 ∆IADJ (LINE) ∆IADJ (LOAD) 12 ∆IADJ (LOAD) IOS1 VOUT5 (RECOV) IOS2 VOUT6 (RECOV) IQ1 IQ2 IQ3 IL (mA) 5 1500 5 200 -4.25 ---4.25 14.95 -41.25 ---41.25 1.95 Relays energized Measurement sense lines Equation Pins Value Units V “ “ “ VOUT1 = E1 VOUT2 = E2 VOUT3 = E3 VOUT4 = E4 “ VRLINE = E1 – E3 Notes Limits Unit Min Max -1.275 “ “ “ -1.225 “ “ “ V “ “ “ -9 9 mV ---6 -6 --6 6 “ “ “ -5 5 “ --------- --------- --------- None “ “ “ 9-11 “ “ “ --- --- --- --- “ “ E1 E2 E3 E4 --- -6.25 -6.25 --- 0 14.95 --- ------- ------- ------- “ “ “ “ “ “ E5 E6 --- “ “ “ VRLOAD1 = E5 – E6 VRLOAD2 = E3 – E4 -14.6 14.95 --- --- --- “ “ E7 “ VRTH = E7 5 -4.25 0 --- --- --- K2 12-13 E8 mV IADJ = E8 / 2000 25 100 5 -41.25 0 --- --- --- “ “ “ IADJ = E9 / 2000 25 100 µA “ --- --- --- --- --- --- --- “ “ E9 --- “ ∆IADJ = (E8 – E9) / 2000 (LINE) -5 5 “ 13 -6.25 5 -6.25 0 --- --- --- “ “ E10 “ 5 “ -6.25 1500 -6.25 14.95 --- --- --- “ “ E11 “ ∆IADJ = (E10 – E11) / 2000 (LINE) -5 14 15 16 -4.25 -4.25 ----- -10 -10 ----- ----- -0.425 -0.425 0 0 K4,K5 K4,K5 10-5 9-11 E12 E13 V “ 1.5 -1.275 3.5 -1.225 A V 17 18 -40 -40 ----- -40 -40 ----- ----- ----- 0 0 K5 K5 10-5 9-11 E14 E15 “ “ 0.2 -1.275 1.0 -1.225 A V 19 20 21 -4.25 -14.25 -41.25 ------- -4.25 -14.25 -41.25 0 0 0 -1.4 -1.4 -1.4 ------- ------- K3 K3 K3 12-13 12-13 12-13 E16 E17 E18 0.2 0.2 1.0 3.0 3.0 5.0 mA “ “ VSTART 22 -4.25 1500 -10 0 --- -0.425 --- K4 9-11 -1.275 -1.225 V VOUT1 VOUT2 VOUT3 VOUT4 23 24 25 26 -4.25 -4.25 -41.25 -41.25 5 1500 5 200 --------- --------- --------- None “ “ “ 9-11 “ “ “ -1.30 “ “ “ -1.20 “ “ “ V “ “ “ VRLINE1 27 --- --- --- --- --- --- --- “ “ -23 23 mV VRLOAD1 VRLOAD1 VRLOAD2 28 29 30 -6.25 -6.25 --- 5 1500 --- -6.25 -6.25 --- 0 14.95 --- ------- ------- ------- “ “ “ “ “ “ ---12 -12 --12 12 “ “ “ -4.25 0 -4.25 14.95 -41.25 0 -41.25 1.95 --- See figure 9 waveforms See figure 9 waveforms See figure 9 waveforms See figure 9 waveforms “ “ “ IOS1 = E12 VOUT5 = E13 (RECOV) IOS2 = E14 VOUT6 = E15 (RECOV) IQ1 = E16 / 2000 IQ2 = E17 / 2000 IQ3 = E18 / 2000 E19 “ VSTART = E19 See figure 9 waveforms E20 E21 E22 E23 --- V “ “ “ VOUT1 = E20 VOUT2 = E21 VOUT3 = E22 VOUT4 = E23 “ VRLINE = E20 – E22 E24 E25 “ “ “ VRLOAD1 = E24 – E25 VRLOAD2 = E22 – E23 --- See figure 9 waveforms See figure 9 waveforms MIL-M-38510/118B 41 2 Symbol TABLE III. Group A inspection for all device type 04 – Continued. Subgroup Symbol Test no. Test conditions See figure 9 Applied test voltages (volts) (Hi – Lo pin potential) 1-2 4-5 6-11 7-2 8-2 Relays energized Measurement sense lines Equation Pins Value Units K2 “ 12-13 “ mV “ “ IADJ IADJ 31 32 TA = +125°C ∆IADJ (LINE) 33 --- --- --- --- --- --- --- “ “ E26 E27 --- ∆IADJ (LOAD) 34 -6.25 5 -6.25 0 --- --- --- “ “ E28 “ ∆IADJ (LOAD) IOS1 VOUT5 (RECOV) IOS2 VOUT6 (RECOV) IQ1 IQ2 IQ3 35 -6.25 1500 -6.25 14.95 --- --- --- “ “ E29 “ 36 37 -4.25 -4.25 ----- -10 -10 ----- ----- -0.425 -0.425 0 0 K4,K5 K4,K5 10-5 9-11 E30 E31 V “ 38 39 -40 -40 ----- -40 -40 ----- ----- ----- 0 0 K5 K5 10-5 9-11 E32 E33 “ “ 40 41 42 -4.25 -14.25 -41.25 ------- -4.25 -14.25 -41.25 0 0 0 -1.4 -1.4 -1.4 ------- ------- K3 K3 K3 12-13 12-13 12-13 E34 E35 E36 VSTART 43 -4.25 1500 -10 0 --- -0.425 --- K4 9-11 VOUT7 44 -6.25 5 -6.25 0 --- --- --- None VOUT1 VOUT2 VOUT3 VOUT4 45 46 47 48 -4.25 -4.25 -41.25 -41.25 5 1500 5 200 --------- --------- --------- VRLINE1 49 --- --- --- --- --- --- VRLOAD1 VRLOAD1 VRLOAD2 50 51 52 -6.25 -6.25 --- 5 1500 --- -6.25 -6.25 --- 0 14.95 --- ------- IADJ 53 -4.25 5 -4.25 0 IADJ 54 -41.25 5 -41.25 0 ∆IADJ (LINE) ∆IADJ (LOAD) 55 --- --- --- 56 -6.25 5 ∆IADJ (LOAD) 57 -6.25 1500 TA = +150°C 3 42 TA = -55°C IL (mA) 5 5 -4.25 -41.25 0 0 ----- ----- ----- Limits Unit Min Max IADJ = E26 / 2000 IADJ = E27 / 2000 25 25 100 100 µA “ ∆IADJ = (E26 – E27) / 2000 (LINE) -5 5 “ ∆IADJ = (E28 – E29) / 2000 (LINE) -5 5 “ 1.5 -1.30 3.5 -1.20 A V 0.2 -1.30 1.0 -1.20 A V 0.2 0.2 1.0 3.0 3.0 5.0 mA “ “ -1.30 -1.20 V See figure 9 waveforms “ “ “ IOS1 = E30 VOUT5 = E31 (RECOV) IOS2 = E32 VOUT6 = E33 (RECOV) IQ1 = E34 / 2000 IQ2 = E35 / 2000 IQ3 = E36 / 2000 E37 “ VSTART = E37 See figure 9 waveforms “ E38 “ VOUT7 = E38 -1.30 -1.20 V None “ “ “ 9-11 “ “ “ V “ “ “ VOUT1 = E39 VOUT2 = E40 VOUT3 = E41 VOUT4 = E42 -1.30 “ “ “ -1.20 “ “ “ V “ “ “ --- “ “ E39 E40 E41 E42 --- “ VRLINE = E39 – E41 -23 23 mV ------- ------- “ “ “ “ “ “ E43 E44 --- “ “ “ VRLOAD1 = E43 – E44 VRLOAD2 = E41 – E42 ---12 -12 --12 12 “ “ “ --- --- --- K2 12-13 E45 mV IADJ = E45 / 2000 25 100 --- --- --- “ “ “ IADJ = E46 / 2000 25 100 µA “ --- --- --- --- “ “ E46 --- “ ∆IADJ = (E45 – E46) / 2000 (LINE) -5 5 “ -6.25 0 --- --- --- “ “ E47 “ 5 14.95 --- --- --- “ “ E48 “ ∆IADJ = (E47 – E48) / 2000 (LOAD) -5 -6.25 “ “ -4.25 0 -4.25 14.95 -41.25 0 -41.25 1.95 --- See figure 9 waveforms See figure 9 waveforms MIL-M-38510/118B 2 VIN (volts) -4.25 -41.25 Notes TABLE III. Group A inspection for all device type 04 – Continued. Subgroup 3 TA = -55°C Test no. Test conditions See figure 9 Applied test voltages (volts) (Hi – Lo pin potential) 1-2 4-5 6-11 7-2 8-2 IL (mA) ----- -10 -10 ----- ----- -0.425 -0.425 0 0 Relays energized Measurement sense lines Pins Value Units K4,K5 K4,K5 10-5 9-11 E49 E50 V “ IOS1 = E49 VOUT5 = E50 (RECOV) IOS1 VOUT5 (RECOV) 58 59 IOS2 VOUT6 (RECOV) IQ1 IQ2 IQ3 60 61 -40 -40 ----- -40 -40 ----- ----- ----- 0 0 K5 K5 10-5 9-11 E51 E52 “ “ 62 63 64 -4.25 -14.25 -41.25 ------- -4.25 -14.25 -41.25 0 0 0 -1.4 -1.4 -1.4 ------- ------- K3 K3 K3 12-13 12-13 12-13 E53 E54 E55 “ “ “ IOS2 = E51 VOUT6 = E52 (RECOV) IQ1 = E53 / 2000 IQ2 = E54 / 2000 IQ3 = E55 / 2000 VSTART 65 -4.25 1500 -10 0 --- -0.425 --- K4 9-11 E56 “ VSTART = E56 See figure 9 waveforms Equation Notes Symbol 43 4 TA = +25°C Notes VIN (volts) -4.25 -4.25 Test conditions Test no. Measurement sense lines Symbol Value TA = +25°C 7 Equation ∆VIN / ∆VOUT 66 Input voltage VIN = -6.25 V ei = 1.0 Vrms at 2400 Hz Load current IL = 500 mA See figure 9 waveforms Units eorms E57 Vrms Limits Unit Min Max 1.5 -1.30 3.5 -1.20 A V 0.2 -1.30 1.0 -1.20 A V 0.2 0.2 1.0 3.0 3.0 5.0 mA “ “ -1.30 -1.20 V Limits Unit Min Max ∆VIN / ∆VOUT = -20 log E57 See figure 10 50 --- dB VNO 67 VIN = -6.25 V IL = 100 mA eorms E58 Vrms See figure 11 --- 120 ∆VOUT / ∆VIN 68 VIN = -6.25 V Vpulse = -1.0 V IL = 100 mA VOUT E59 V ∆VOUT / ∆VIN = E59 / 1 See figure 12 --- 80 µVrms mV/V ∆VOUT / ∆IL 69 VIN = -6.25 V IL = 100 mA ∆IL = 400 mA VOUT E60 V ∆VOUT / ∆IL = E60 / 200 See figure 13 --- 0.15 mV/mA VNO = E58 MIL-M-38510/118B Subgroup Symbol MIL-M-38510/118B TABLE IV. Group C end point electrical parameters. (TA = +25°C) Device type 01, 02 03, 04 Characteristic Symbol Limits Delta limits 1/ Units Min Max -5.25 -4.75 0.5 4.0 Output voltage VOUT ±50 mV Standby current drain ISCD ±20 % Output voltage VOUT ±10 mV -1.275 -1.225 V Adjust pin current IADJ ±10 µA 25 100 µA Line regulation VRLINE ±4 mV -9 9 mV V mA Delta limits apply to the measured value (see delta limit definition in MIL-PRF-38535). 1/ 6. NOTES (This section contains information of a general or explanatory nature that may be helpful, but it is not mandatory.) 6.1 Intended use. Microcircuits conforming to this specification are intended for original equipment design applications and logistic support of existing equipment. 6.2 Acquisition requirements. Acquisition documents should specify the following: a. Title, number, and date of the specification. b. Pin and compliance identifier, if applicable (see 1.2). c. Requirements for delivery of one copy of the quality conformance inspection data pertinent to the device inspection lot to be supplied with each shipment by the device manufacturer, if applicable. d. Requirements for certificate of compliance, if applicable. e. Requirements for notification of change of product or process to contracting activity in addition to notification to the qualifying activity, if applicable. f. Requirements for failure analysis (including required test condition of method 5003 of MIL-STD-883), corrective action, and reporting of results, if applicable. g. Requirements for product assurance options. h. Requirements for special carriers, lead lengths, or lead forming, if applicable. These requirements should not affect the part number. Unless otherwise specified, these requirements will not apply to direct purchase by or direct shipment to the Government. i. Requirements for "JAN" marking. j. Packaging requirements (see 5.1). 44 MIL-M-38510/118B 6.3 Qualification. With respect to products requiring qualification, awards will be made only for products which are, at the time of award of contract, qualified for inclusion in Qualified Manufacturers List QML-38535 whether or not such products have actually been so listed by that date. The attention of the contractors is called to these requirements, and manufacturers are urged to arrange to have the products that they propose to offer to the Federal Government tested for qualification in order that they may be eligible to be awarded contracts or purchase orders for the products covered by this specification. Information pertaining to qualification of products may be obtained from DSCC-VQ, 3990 E. Broad Street, Columbus, Ohio 43128-3990. 6.4 Superseding information. The requirements of MIL-M-38510 have been superseded to take advantage of the available Qualified Manufacturer Listing (QML) system provided by MIL-PRF-38535. Previous references to MIL-M-38510 in this document have been replaced by appropriate references to MIL-PRF-38535. All technical requirements now consist of this specification and MIL-PRF-38535. The MIL-M-38510 specification sheet number and PIN have been retained to avoid adversely impacting existing government logistics systems and contractor’s parts lists. 6.5 Abbreviations, symbols, and definitions. The abbreviations, symbols, and definitions used herein are defined in MIL-PRF-38535, MIL-HDBK-1331, and as follows: 6.5.1 Line regulation. The change in output voltage for a specified change in input voltage (VRLINE). 6.5.2 Load regulation. The change in output voltage for a specified change in load current (VRLOAD). 6.5.3 Ripple rejection. The ratio of the peak to peak input ripple voltage to the peak to peak output ripple voltage (∆VOUT / ∆VIN). 6.5.4 Output noise voltage. The rms output noise voltage with constant load and no input ripple (VNO). 6.5.5 Standby current drain. The supply current drawn by the regulator with no output load or with a 1 kilohm output load. 6.5.6 Minimum load current. The minimum load current is that current required to maintain regulation. 6.5.7 Input voltage range. The range of supply voltage over which the regulator will operate. 6.5.8 Output voltage range. The range of output voltage over which the regulator will operate. 6.5.9 Transient response. The closed-loop step function response of the regulator under small-signal conditions. 6.6 Logistic support. Lead materials and finishes (see 3.3) are interchangeable. Unless otherwise specified, microcircuits acquired for Government logistic support will be acquired to device class B (see 1.2.2), lead material and finish A (see 3.4). Longer length leads and lead forming should not affect the part number. 45 MIL-M-38510/118B 6.7 Substitutability. The cross-reference information below is presented for the convenience of users. Microcircuits covered by this specification will functionally replace the listed generic-industry type. Generic-industry microcircuit types may not have equivalent operational performance characteristics across military temperature ranges or reliability factors equivalent to MIL-M38510 device types and may have slight physical variations in relation to case size. The presence of this information should not be deemed as permitting substitution of generic-industry types for MIL-M-38510 types or as a waiver of any of the provisions of MIL-PRF-38535. Military device type 01 02 03 04 Generic-industry type 79MG 79G LM137H LM137K 6.8 Changes from previous issue. Marginal notations are not used in this revision to identify changes with respect to the previous issue, due to the extensiveness of the changes. Custodians: Army - CR Navy - EC Air Force - 11 NASA - NA DLA - CC Preparing activity: DLA - CC Project 5962-2005-016 Review activities: Army – MI, SM Navy – AS, CG, MC, SH, TD Air Force – 03, 19, 99 NOTE: The activities listed above were interested in this document as of the date of this document. Since organizations and responsibilities can change, you should verify the currency of the information above using the ASSIST Online database at http://assist.daps.dla.mil. 46