PRODUCT / PROCESS CHANGE NOTIFICATION Generic Copy 24-OCT-2000 SUBJECT: Product/Process Change Notification 10340 TITLE: SEEFULL CHINA FAB/ASSY SITE QUAL FOR GEN. PURPOSE RECTIFIERS EFFECTIVE DATE: 03-Feb-2001 AFFECTED CHANGE CATEGORY(S) SUBCONTRACTOR ASSEMBLY SITE SUBCONTRACTOR FAB SITE AFFECTED PRODUCT DIVISION(S) BIPOLAR DISCRETES PRODUCTS DIVISION ADDITIONAL RELIABILITY DATA: Available Contact (George Dorman, <[email protected]>) SAMPLES: Available Contact (Mike Schager, <[email protected]>) FOR ANY QUESTIONS CONCERNING THIS NOTIFICATION: Contact (Mike Schager, <[email protected]>) DISCLAIMER: ON Semiconductor will consider this change approved unless specific conditions of acceptance are provided in writing within 30 days of receipt of this notice. To do so, contact your local ON Semiconductor sales office. DESCRIPTION AND PURPOSE: ON Semiconductor is pleased to announce that it has qualified our Subcontractor Lite-On's Seefull China facility for the Wafer Fab and Assembly of General Purpose Axial-Lead products; 1N4001-series, 1N4933-series, 1N5400-series, and MR852-series. Lite-On has been a subcontractor to ON Semiconductor for over 10 (ten) years and is certified to QS-9000, ISO-9001, and ISO-14000. There will be no change to the function of the devices. Device parameters will continue to meet all Data Book specifications, and reliability will continue to meet or exceed ON Semiconductor standards. QUALIFICATION PLAN: (PER AEC-Q101 GUIDELINES) TEST* CONDITIONS HTRB Temp Cycle Autoclave Vr=80% rated, Ta=150 degC , 1000 hrs. Air to Air, -65 to +150 degC, 1000 cycles Ta=121 degC, RH= 100%, PSIg=15, 96 hrs. Vr=80% rated, Ta=85 degC, RH= 85%, 1000 hrs. Ta=25 degC, delta Tj =>100 degC, 2 minutes on/off, 15000 cycles 150 degC, 1000 hrs. Post H3TRB and Temp Cycle Per Case Outline Drawing Force reqd to separate solder joints Lead Pull Verify Marking Permanency 270 degC, Td=10s 245 degC Td= 5s Measure Rjc H3TRB IOL High Temp Storage D.P.A. Physical Dimension Terminal Strength Res. to Solvents Res. To Solder Heat Solderability Thermal Resistance EXCEPTIONS QUALIFICATION VEHICLE JUSTIFICATION FAMILY Io Standard Recovery 3A 1A 3A 1A Fast Recovery QUAL. DEVICE 1N5408 1N4007 MR856 1N4937 REASON CHOSEN Largest Largest Largest Largest Die/Highest Die/Highest Die/Highest Die/Highest Voltage Voltage Voltage Voltage RELIABILITY DATA SUMMARY (INTERIM RELIABILITY TESTS) RESULTS: STANDARD RECOVERY PRODUCTS 1N5408 TEST INTERVAL CONTROL TEST LOT DESCRIP. ZP05957832 PK60387832 HTRB 500 hrs 0/77 0/77 Temp Cycle 500 cyc 0/77 0/77 Autoclave 96 hrs 0/77 0/77 H3TRB 500 hrs 0/77 0/77 IOL 7500 cyc 0/77 0/77 High Temp. 500 hrs 0/77 0/77 Storage D.P.A. 1Nov00 1Nov00 Phys. Dimen. Pass Pass Terminal Pass Pass Strength Resist. to Pass Pass Solvents Res. To Pass Pass Solder Heat SolderabilityPass Pass Thermal 1Nov00 1Nov00 Resistance RESULTS: 1N4007 CONTROL TEST LOT TEST LOT ZP05895732 PK51495732 PK60115732 0/77 0/77 0/77 0/77 0/77 0/77 0/77 0/77 0/77 0/77 0/77 0/77 0/77 0/77 0/77 0/77 0/77 0/77 1Nov00 Pass Pass 1Nov00 Pass Pass 1Nov00 Pass Pass Pass Pass Pass Pass Pass Pass Pass 1Nov00 Pass 1Nov00 Pass 1Nov00 FAST RECOVERY PRODUCTS TEST INTERVAL DESCRIP. HTRB 500 hrs Temp Cycle 500 cyc Autoclave 96 hrs H3TRB 500 hrs IOL 7500 cyc High Temp 500 hrs Storage D.P.A. Physical Dimension Terminal Strength Resist. to Solvents Res. to Solder Heat Solderability Thermal Resistance MR856 CONTROL TEST LOT ZP06508632 PK90368632 TEST LOT PK90398632 1N4937 CONTROL TEST LOT ZP06436732 PK60036732 0/77 0/77 0/77 0/77 0/77 0/77 0/77 0/77 0/77 0/77 0/77 0/77 0/77 0/77 0/77 0/77 0/77 0/77 0/77 0/77 0/77 0/77 0/77 0/77 0/77 0/77 0/77 0/77 0/77 0/77 1Nov00 Pass 1Nov00 Pass 1Nov00 Pass 1Nov00 Pass 1Nov00 Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass 1Nov00 Pass 1Nov00 Pass 1Nov00 Pass 1Nov00 Pass 1Nov00 Reliability Testing Conclusions: Interim Reliability Test data is consistent with passing ON Semiconductor / AEC-Q101 requirements. A copy of the full Reliability Report will available in November 2000, upon request. ELECTRICAL CHARACTERIZATION RESULTS: STANDARD RECOVERY PRODUCTS Tj = 25 degC DEVICE NUMBER 1N5408 GROUP CONTROL TEST LOT ZP05957832 PK60387832 LOT NUMBER Vf (mV) Minimum 921 Maximum 941 Average 929 Std. Dev. 4 Cpk 5.9 Ir @ 1000V (uA) Minimum 0.147 Maximum 0.465 Average 0.308 Std. Dev. 0.040 Cpk 80.8 1N4007 CONTROL TEST LOT TEST LOT ZP05895732 PK51495732 PK60115732 882 905 891 4 9.1 899 929 912 6 4.9 897 927 911 6 4.9 903 953 925 10 2.5 0.158 0.448 0.269 0.060 54.1 0.105 0.210 0.138 0.021 77.2 0.103 0.208 0.136 0.021 77.2 0.047 0.343 0.111 0.052 31.3 FAST RECOVERY PRODUCTS Tj = 25 degC DEVICE NUMBER GROUP LOT NUMBER Vf (mV) Minimum Maximum Average Std. Dev. Cpk Ir @ 600V Minimum Maximum Average Std. Dev. Cpk Trr (nS) Minimum Maximum Average Std. Dev. Cpk MR856 CONTROL TEST LOT ZP06508632 PK90368632 TEST LOT 1N4937 CONTROL TEST LOT PK90398632 ZP06436732 PK60036732 958 1102 1016 30 2.6 974 1171 1037 38 1.9 961 1187 1048 45 1.5 972 1176 1054 41 1.2 1005 1156 1052 25 2.0 0.515 1.170 0.763 0.147 20.9 0.110 1.197 0.765 0.240 12.8 0.079 1.282 0.623 0.369 8.5 0.183 0.708 0.315 0.103 15.2 0.172 0.519 0.270 0.063 25.0 82 98 91 4.4 8.3 73 105 84 5.2 7.4 69 97 83 7.1 5.5 73 94 83 4.3 9.2 72 107 84 6.1 6.4 CHANGED PART IDENTIFICATION: Customers may receive these products manufactured at the Seefull, China site starting with Date Code 0105 or later. The marking on these products will include PK. AFFECTED DEVICE LIST: PART Number 1N4001 1N4001FF 1N4001RL 1N4002 1N4002FF 1N4002RL 1N4003 1N4003FF 1N4003RL 1N4004 1N4004FF 1N4004RL 1N4005 1N4005FF 1N4005RL 1N4006 1N4006FF 1N4006RL 1N4007 1N4007FF 1N4007RL 1N4933 1N4933RL 1N4934 1N4934RL 1N4935 1N4935RL 1N4936 1N4936RL 1N4937 1N4937RL 1N5400 1N5400RL 1N5401 1N5401RL 1N5402 1N5402RL 1N5404 1N5404RL 1N5406 1N5406RL 1N5407 1N5407RL 1N5408 1N5408RL MR850 MR851 MR851RL MR852 MR852RL MR854 MR854RL MR856 MR856RL