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PRODUCT / PROCESS CHANGE NOTIFICATION
Generic Copy
24-OCT-2000
SUBJECT: Product/Process Change Notification 10340
TITLE: SEEFULL CHINA FAB/ASSY SITE QUAL FOR GEN. PURPOSE RECTIFIERS
EFFECTIVE DATE: 03-Feb-2001
AFFECTED CHANGE CATEGORY(S)
SUBCONTRACTOR ASSEMBLY SITE
SUBCONTRACTOR FAB SITE
AFFECTED PRODUCT DIVISION(S)
BIPOLAR DISCRETES PRODUCTS DIVISION
ADDITIONAL RELIABILITY DATA: Available
Contact (George Dorman, <[email protected]>)
SAMPLES: Available
Contact (Mike Schager, <[email protected]>)
FOR ANY QUESTIONS CONCERNING THIS NOTIFICATION:
Contact (Mike Schager, <[email protected]>)
DISCLAIMER:
ON Semiconductor will consider this change approved unless
specific conditions of acceptance are provided in writing within
30 days of receipt of this notice. To do so, contact your local
ON Semiconductor sales office.
DESCRIPTION AND PURPOSE:
ON Semiconductor is pleased to announce that it has qualified our
Subcontractor Lite-On's Seefull China facility for the Wafer Fab and
Assembly of General Purpose Axial-Lead products; 1N4001-series,
1N4933-series, 1N5400-series, and MR852-series.
Lite-On has been a subcontractor to ON Semiconductor for over 10
(ten) years and is certified to QS-9000, ISO-9001, and ISO-14000.
There will be no change to the function of the devices. Device
parameters will continue to meet all Data Book specifications, and
reliability will continue to meet or exceed ON Semiconductor
standards.
QUALIFICATION PLAN:
(PER AEC-Q101 GUIDELINES)
TEST*
CONDITIONS
HTRB
Temp Cycle
Autoclave
Vr=80% rated, Ta=150 degC , 1000 hrs.
Air to Air, -65 to +150 degC, 1000 cycles
Ta=121 degC, RH= 100%,
PSIg=15, 96 hrs.
Vr=80% rated, Ta=85 degC, RH= 85%,
1000 hrs.
Ta=25 degC, delta Tj =>100 degC,
2 minutes on/off, 15000 cycles
150 degC, 1000 hrs.
Post H3TRB and Temp Cycle
Per Case Outline Drawing
Force reqd to separate solder joints
Lead Pull
Verify Marking Permanency
270 degC, Td=10s
245 degC Td= 5s
Measure Rjc
H3TRB
IOL
High Temp Storage
D.P.A.
Physical Dimension
Terminal Strength
Res. to Solvents
Res. To Solder Heat
Solderability
Thermal Resistance
EXCEPTIONS
QUALIFICATION VEHICLE JUSTIFICATION
FAMILY
Io
Standard Recovery
3A
1A
3A
1A
Fast Recovery
QUAL. DEVICE
1N5408
1N4007
MR856
1N4937
REASON CHOSEN
Largest
Largest
Largest
Largest
Die/Highest
Die/Highest
Die/Highest
Die/Highest
Voltage
Voltage
Voltage
Voltage
RELIABILITY DATA SUMMARY
(INTERIM RELIABILITY TESTS)
RESULTS:
STANDARD RECOVERY PRODUCTS
1N5408
TEST
INTERVAL CONTROL TEST LOT
DESCRIP.
ZP05957832 PK60387832
HTRB
500 hrs
0/77
0/77
Temp Cycle 500 cyc
0/77
0/77
Autoclave
96 hrs
0/77
0/77
H3TRB
500 hrs
0/77
0/77
IOL
7500 cyc
0/77
0/77
High Temp. 500 hrs
0/77
0/77
Storage
D.P.A.
1Nov00
1Nov00
Phys. Dimen. Pass
Pass
Terminal
Pass
Pass
Strength
Resist. to
Pass
Pass
Solvents
Res. To
Pass
Pass
Solder Heat
SolderabilityPass
Pass
Thermal
1Nov00
1Nov00
Resistance
RESULTS:
1N4007
CONTROL
TEST LOT
TEST LOT
ZP05895732
PK51495732
PK60115732
0/77
0/77
0/77
0/77
0/77
0/77
0/77
0/77
0/77
0/77
0/77
0/77
0/77
0/77
0/77
0/77
0/77
0/77
1Nov00
Pass
Pass
1Nov00
Pass
Pass
1Nov00
Pass
Pass
Pass
Pass
Pass
Pass
Pass
Pass
Pass
1Nov00
Pass
1Nov00
Pass
1Nov00
FAST RECOVERY PRODUCTS
TEST
INTERVAL
DESCRIP.
HTRB
500 hrs
Temp Cycle 500 cyc
Autoclave
96 hrs
H3TRB
500 hrs
IOL
7500 cyc
High Temp 500 hrs
Storage
D.P.A.
Physical
Dimension
Terminal
Strength
Resist. to
Solvents
Res. to
Solder Heat
Solderability Thermal
Resistance
MR856
CONTROL TEST LOT
ZP06508632
PK90368632
TEST LOT
PK90398632
1N4937
CONTROL
TEST LOT
ZP06436732
PK60036732
0/77
0/77
0/77
0/77
0/77
0/77
0/77
0/77
0/77
0/77
0/77
0/77
0/77
0/77
0/77
0/77
0/77
0/77
0/77
0/77
0/77
0/77
0/77
0/77
0/77
0/77
0/77
0/77
0/77
0/77
1Nov00
Pass
1Nov00
Pass
1Nov00
Pass
1Nov00
Pass
1Nov00
Pass
Pass
Pass
Pass
Pass
Pass
Pass
Pass
Pass
Pass
Pass
Pass
Pass
Pass
Pass
Pass
Pass
1Nov00
Pass
1Nov00
Pass
1Nov00
Pass
1Nov00
Pass
1Nov00
Reliability Testing Conclusions:
Interim Reliability Test data is consistent with passing
ON Semiconductor / AEC-Q101 requirements. A copy of the full
Reliability Report will available in November 2000, upon request.
ELECTRICAL CHARACTERIZATION RESULTS:
STANDARD RECOVERY PRODUCTS Tj = 25 degC
DEVICE NUMBER
1N5408
GROUP
CONTROL
TEST LOT
ZP05957832
PK60387832
LOT NUMBER
Vf (mV)
Minimum
921
Maximum
941
Average
929
Std. Dev.
4
Cpk
5.9
Ir @ 1000V (uA)
Minimum
0.147
Maximum
0.465
Average
0.308
Std. Dev.
0.040
Cpk
80.8
1N4007
CONTROL
TEST LOT
TEST LOT
ZP05895732
PK51495732
PK60115732
882
905
891
4
9.1
899
929
912
6
4.9
897
927
911
6
4.9
903
953
925
10
2.5
0.158
0.448
0.269
0.060
54.1
0.105
0.210
0.138
0.021
77.2
0.103
0.208
0.136
0.021
77.2
0.047
0.343
0.111
0.052
31.3
FAST RECOVERY PRODUCTS Tj = 25 degC
DEVICE NUMBER
GROUP
LOT NUMBER
Vf (mV)
Minimum
Maximum
Average
Std. Dev.
Cpk
Ir @ 600V
Minimum
Maximum
Average
Std. Dev.
Cpk
Trr (nS)
Minimum
Maximum
Average
Std. Dev.
Cpk
MR856
CONTROL
TEST LOT
ZP06508632
PK90368632
TEST LOT
1N4937
CONTROL TEST LOT
PK90398632
ZP06436732
PK60036732
958
1102
1016
30
2.6
974
1171
1037
38
1.9
961
1187
1048
45
1.5
972
1176
1054
41
1.2
1005
1156
1052
25
2.0
0.515
1.170
0.763
0.147
20.9
0.110
1.197
0.765
0.240
12.8
0.079
1.282
0.623
0.369
8.5
0.183
0.708
0.315
0.103
15.2
0.172
0.519
0.270
0.063
25.0
82
98
91
4.4
8.3
73
105
84
5.2
7.4
69
97
83
7.1
5.5
73
94
83
4.3
9.2
72
107
84
6.1
6.4
CHANGED PART IDENTIFICATION:
Customers may receive these products manufactured at the Seefull,
China site starting with Date Code 0105 or later. The marking on
these products will include PK.
AFFECTED DEVICE LIST:
PART Number
1N4001
1N4001FF
1N4001RL
1N4002
1N4002FF
1N4002RL
1N4003
1N4003FF
1N4003RL
1N4004
1N4004FF
1N4004RL
1N4005
1N4005FF
1N4005RL
1N4006
1N4006FF
1N4006RL
1N4007
1N4007FF
1N4007RL
1N4933
1N4933RL
1N4934
1N4934RL
1N4935
1N4935RL
1N4936
1N4936RL
1N4937
1N4937RL
1N5400
1N5400RL
1N5401
1N5401RL
1N5402
1N5402RL
1N5404
1N5404RL
1N5406
1N5406RL
1N5407
1N5407RL
1N5408
1N5408RL
MR850
MR851
MR851RL
MR852
MR852RL
MR854
MR854RL
MR856
MR856RL