-1- FINAL PRODUCT/PROCESS CHANGE NOTIFICATION Generic Copy 05-OCT-2004 SUBJECT: ON Semiconductor Final Product/Process Change Notification #13698 TITLE: Phase #5 Die Design Change for Bipolar Power Products EFFECTIVE DATE: 05-Dec-2004 AFFECTED CHANGE CATEGORY: Die Shrink AFFECTED PRODUCT DIVISION: Discretes Products ADDITIONAL RELIABILITY DATA: Available Contact your local ON Semiconductor Sales Office or Laura Rivers <[email protected]> SAMPLES: Contact your local ON Semiconductor Sales Office or Mike Schager <[email protected]> FOR ANY QUESTIONS CONCERNING THIS NOTIFICATION: Contact Sales Office or Jose Ramirez <[email protected]> NOTIFICATION TYPE: Final Product/Process Change Notification (FPCN) Final change notification sent to customers. FPCNs are issued at least 60 days prior to implementation of the change. ON Semiconductor will consider this change approved unless specific conditions of acceptance are provided in writing within 30 days of receipt of this notice. To do so, contact your local ON Semiconductor Sales Office. DESCRIPTION AND PURPOSE: This is the Final Notification for the 5th Phase of Bipolar Power Product die design changes detailed in IPCN#12868 available at www.onsemi.com. ON Semiconductor wishes to notify its Customers that the listed Bipolar Power Transistors have completed a Die size reduction. Electrical characterization and qualification data have been completed, and device parametric specifications and ratings have not changed. Issue Date: 05 Oct, 2004 Page 1 of 3 -2- Final Product/Process Change Notification #13698 RELIABILITY DATA SUMMARY: Mask#1 TIP31C TEST HTRB H3TRB AC IOL TC Qual Lot 0/77 0/77 0/77 0/77 0/77 Control 0/77 0/77 0/77 0/77 0/77 Mask#2 BD440 TEST HTRB H3TRB AC IOL TC Qual Lot 0/77 0/77 0/77 0/77 0/77 Control 0/77 0/77 0/77 0/77 0/77 ELECTRICAL CHARACTERISTIC SUMMARY: Mask#1 Test Iebo Iceo Ices BVceo hFE hFE VCE (sat) VBE (on) Condition VEB= 5V VCE= 60V VCE= 100V IC=50mA 1A / 4V 3A / 4V 3A/0.375A Limit Unit <1.00E-3 Amp <3.00E-4 Amp <2.00E-4 Amp >100V Volt <25 10 to 50 <1.2 Volt Stat Avg/Sd Avg/Sd Avg/Sd Avg/Sd Avg/Sd Avg/Sd Avg/Sd 3A / 4V <1.8V Avg/Sd Volt Mask#2 Test Iebo Icbo BVebo BVcbo BVceo hFE hFE VCE (sat) VBE (on) Condition Limit VEB= 5V <1.00E-3 VCB= 80V <1.00E-4 IE= 100uA >5 IC=100uA >60 IC= 50mA >80 0.5A/1V 40 to 475 2A / 1V >25 3A/0.3A <0.8 2A/1V <1.5 Issue Date: 05 Oct, 2004 25DegC TIP31C - NPN QUAL LOT CONTROL 7.32E-10/8.68E-11 9.11E-11/3.90E-11 1.16E-07/2.51E-08 7.13E-09/2.83E-09 3.03E-09/1.43E-10 2.13E-09/1.33E-10 135.4 / 1.4 136.6 / 2.4 162.6 / 8.2 127.6 / 6.4 16.7 / 1.2 23.3 / 1.3 0.4024 / 0.0235 0.4090/0.0095 1.0132 / 0.0117 1.0824/0.0065 Volt Stat Avg/Sd Avg/Sd Avg/Sd Avg/Sd Avg/Sd Avg/Sd Avg/Sd Avg/Sd 25DegC BD440 - PNP QUAL LOT CONTROL 3.03E-10/2.16E-10 2.87E-10/2.37E-10 2.15E-09/3.44E-10 2.06E-09/2.42E-09 12.08 / 0.18 12.32 / 0.29 100.4 / 8.9 137.8 / 10.9 92.8 / 7.6 109.9 / 4.3 371.1 / 22.7 222.5 / 14.3 84.3 / 6.2 62.2 / 4.2 0.3376 / 0.0077 0.4149 / 0.0080 Volt Avg/Sd 0.8502 / 0.0040 Unit Amp Amp Volt Volt Volt 0.8736 / 0.0045 Page 2 of 3 -3- Final Product/Process Change Notification #13698 CHANGED PART IDENTIFICATION: No changes in marking. Product marked with date code 0449 might have new Die design. AFFECTED DEVICE LIST (WITHOUT SPECIALS): PART 2N4921 2N4922 2N4923 2N5194 2N5195 BD179 BD237 BD241C BD436 BD436T BD436TG BD438 BD440 BD442 MJD31C MJD31C1 MJD31CRL MJD31CT4 MJD31CT4G MJD31T4 MJE371 MJF31C SJD31CT4 SJD4080RL TIP29 TIP29A TIP29B TIP29C TIP29CG TIP31 TIP31A TIP31B TIP31C TIP31CG Issue Date: 05 Oct, 2004 Page 3 of 3