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FINAL PRODUCT/PROCESS CHANGE NOTIFICATION
Generic Copy
05-OCT-2004
SUBJECT: ON Semiconductor Final Product/Process Change Notification #13698
TITLE: Phase #5 Die Design Change for Bipolar Power Products
EFFECTIVE DATE: 05-Dec-2004
AFFECTED CHANGE CATEGORY: Die Shrink
AFFECTED PRODUCT DIVISION: Discretes Products
ADDITIONAL RELIABILITY DATA: Available
Contact your local ON Semiconductor Sales Office or Laura Rivers <[email protected]>
SAMPLES: Contact your local ON Semiconductor Sales Office
or Mike Schager <[email protected]>
FOR ANY QUESTIONS CONCERNING THIS NOTIFICATION:
Contact Sales Office or Jose Ramirez <[email protected]>
NOTIFICATION TYPE:
Final Product/Process Change Notification (FPCN)
Final change notification sent to customers. FPCNs are issued at least 60 days prior to implementation
of the change.
ON Semiconductor will consider this change approved unless specific conditions of acceptance
are provided in writing within 30 days of receipt of this notice. To do so, contact your local ON
Semiconductor Sales Office.
DESCRIPTION AND PURPOSE:
This is the Final Notification for the 5th Phase of Bipolar Power Product die design changes detailed in
IPCN#12868 available at www.onsemi.com. ON Semiconductor wishes to notify its Customers that
the listed Bipolar Power Transistors have completed a Die size reduction. Electrical characterization
and qualification data have been completed, and device parametric specifications and ratings have not
changed.
Issue Date: 05 Oct, 2004
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Final Product/Process Change Notification #13698
RELIABILITY DATA SUMMARY:
Mask#1
TIP31C
TEST
HTRB
H3TRB
AC
IOL
TC
Qual Lot
0/77
0/77
0/77
0/77
0/77
Control
0/77
0/77
0/77
0/77
0/77
Mask#2
BD440
TEST
HTRB
H3TRB
AC
IOL
TC
Qual Lot
0/77
0/77
0/77
0/77
0/77
Control
0/77
0/77
0/77
0/77
0/77
ELECTRICAL CHARACTERISTIC SUMMARY:
Mask#1
Test
Iebo
Iceo
Ices
BVceo
hFE
hFE
VCE
(sat)
VBE
(on)
Condition
VEB= 5V
VCE= 60V
VCE= 100V
IC=50mA
1A / 4V
3A / 4V
3A/0.375A
Limit
Unit
<1.00E-3 Amp
<3.00E-4 Amp
<2.00E-4 Amp
>100V
Volt
<25
10 to 50
<1.2
Volt
Stat
Avg/Sd
Avg/Sd
Avg/Sd
Avg/Sd
Avg/Sd
Avg/Sd
Avg/Sd
3A / 4V
<1.8V
Avg/Sd
Volt
Mask#2
Test
Iebo
Icbo
BVebo
BVcbo
BVceo
hFE
hFE
VCE
(sat)
VBE
(on)
Condition
Limit
VEB= 5V
<1.00E-3
VCB= 80V <1.00E-4
IE= 100uA >5
IC=100uA >60
IC= 50mA >80
0.5A/1V
40 to 475
2A / 1V
>25
3A/0.3A
<0.8
2A/1V
<1.5
Issue Date: 05 Oct, 2004
25DegC
TIP31C - NPN
QUAL LOT
CONTROL
7.32E-10/8.68E-11 9.11E-11/3.90E-11
1.16E-07/2.51E-08 7.13E-09/2.83E-09
3.03E-09/1.43E-10 2.13E-09/1.33E-10
135.4 / 1.4
136.6 / 2.4
162.6 / 8.2
127.6 / 6.4
16.7 / 1.2
23.3 / 1.3
0.4024 / 0.0235
0.4090/0.0095
1.0132 / 0.0117
1.0824/0.0065
Volt
Stat
Avg/Sd
Avg/Sd
Avg/Sd
Avg/Sd
Avg/Sd
Avg/Sd
Avg/Sd
Avg/Sd
25DegC
BD440 - PNP
QUAL LOT
CONTROL
3.03E-10/2.16E-10 2.87E-10/2.37E-10
2.15E-09/3.44E-10 2.06E-09/2.42E-09
12.08 / 0.18
12.32 / 0.29
100.4 / 8.9
137.8 / 10.9
92.8 / 7.6
109.9 / 4.3
371.1 / 22.7
222.5 / 14.3
84.3 / 6.2
62.2 / 4.2
0.3376 / 0.0077
0.4149 / 0.0080
Volt
Avg/Sd
0.8502 / 0.0040
Unit
Amp
Amp
Volt
Volt
Volt
0.8736 / 0.0045
Page 2 of 3
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Final Product/Process Change Notification #13698
CHANGED PART IDENTIFICATION:
No changes in marking.
Product marked with date code 0449 might have new Die design.
AFFECTED DEVICE LIST (WITHOUT SPECIALS):
PART
2N4921
2N4922
2N4923
2N5194
2N5195
BD179
BD237
BD241C
BD436
BD436T
BD436TG
BD438
BD440
BD442
MJD31C
MJD31C1
MJD31CRL
MJD31CT4
MJD31CT4G
MJD31T4
MJE371
MJF31C
SJD31CT4
SJD4080RL
TIP29
TIP29A
TIP29B
TIP29C
TIP29CG
TIP31
TIP31A
TIP31B
TIP31C
TIP31CG
Issue Date: 05 Oct, 2004
Page 3 of 3