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PRODUCT/PROCESS CHANGE NOTIFICATION
FOR ON Semiconductor
**********************************************************************
NOTIFICATION #: 10046
PAGE: 1
ISSUING DIVISION: PHX-PPD
ACTUAL ISSUE DATE: 29-Sep-1999
ACTUAL EFFECT DATE: 28-Nov-1999
TITLE: QUALIFY ADDITIONAL ASSEMBLY/TEST SITE OF SMA GENERAL
PURPOSE RECTIFIERS
E01 TITLE: SEEFULL CHINA ADDITION
AFFECTED CHANGE CATEGORIES
Subcontractor Assembly Site
Subcontractor Test Site
AFFECTED PRODUCT DIVISIONS
MOS POWER PRODUCTS
ADDITIONAL RELIABILITY DATA: Available
REFERENCE: CAROLYN ANTILLON
PHONE: 602-244-4961
SAMPLES: Contact Below
REFERENCE: MIKE SCHAGER
PHONE: 602-244-5128
NOTIFICATION DATA
REFERENCE:CHRIS HOLLY
PHONE: 602-244-4961
USERID:[email protected]
USERID:RV1140
DISCLAIMER
ON Semiconductor will consider this change approved unless
specific conditions of acceptance are provided in writing within
30 days of receipt of this notice. To do so, contact your local
ON Semiconductor sales office.
DESCRIPTION AND PURPOSE
----------------------ON Semiconductor currently produces SMA General Purpose Rectifiers (primarily
MRA4000-series) at a subcontractor. In order to provide additional capacity, ON
Semiconductor is qualifying our subcontractor's other facility in Seefull,
China, where a similar production line already exists. In order to expedite this
additional capacity to service our customers, we will start shipping product
from the new fab after 60 days from the PCN release date.
QUALIFICATION PLAN
-----------------See Rel Data
RELIABILITY DATA SUMMARY
-----------------------Reliability Data Schedule for Qualification Lots processed at
Seefull China:
500 hours will be available after November 15, 1999.
1000 hours will be available after December 6, 1999.
Samples will be available by request after November 1, 1999.
Preliminary Reliability Results - MRA4007T3
Assembly/Test Site: Seefull (Shanghai) China
TESTS
CONDITIONS
INTERVAL
SIZE
HTRB
150DegC, 800V
168 hours
H3TRB
85DegC, 85% RH
168 hours
IOL
0.8A
168 hours
Autoclave
121DegC, 15psi
96 hours
Temp Cycle -55DegC to +150DegC
30 cycles
Res.to Solder Heat 260DegC plus or minus 15DegC, 10
REJECTS
3 x 22
0
3 x 22
0
3 x 22
0
3 x 22
0
3 x 22
0
sec. 3 x 22 0
ELECTRICAL CHARACTERISTIC SUMMARY
--------------------------------Device - MRA4007T3
Assembly/Test Site: Seefull China
Test Temperature: 25DegC
Forward Voltage (volts)
@ If=0.5A
CONTROL GROUP (TAIWAN)
MAX LIMIT
MIN
0.950
0.892
TEST GROUP
Lot 1
0.950
0.892
MAX
AVERAGE
STD DEV
CPK
0.907
0.899
0.005
3.4
0.912
0.896
0.006
3.0
(SEEFULL)
Lot 2
0.950
0.892
Lot 3
0.950
0.892
0.916
0.899
0.007
2.4
0.919
0.898
0.008
2.2
Forward Voltage (volts)
@ If=1.0A
CONTROL GROUP (TAIWAN)
MAX LIMIT
1.100
TEST GROUP (SEEFULL)
Lot 1
Lot 2
1.100
1.100
MIN
0.946
0.946
0.946
0.941
MAX
AVERAGE
STD DEV
CPK
0.970
0.957
0.008
6.0
0.980
0.953
0.010
4.9
0.980
0.957
0.010
4.8
0.985
0.956
0.012
4.0
Reverse Leakage (nanoamps)
@ Vr=400V
CONTROL GROUP (TAIWAN)
Lot 3
1.100
MAX LIMIT
10000
TEST GROUP (SEEFULL)
Lot 1
Lot 2
10000
10000
MIN
052
71
62
88
MAX
AVERAGE
STD DEV
CPK
231
107
54
61.1
267
156
68
48.3
162
102
23
143.5
399
123
56
58.8
Reverse Leakage (nanoamps)
@ Vr=1000V
CONTROL GROUP (TAIWAN)
Lot 3
10000
MAX LIMIT
10000
TEST GROUP (SEEFULL)
Lot 1
Lot 2
Lot 3
10000
10000
10000
MIN
145
188
148
246
MAX
AVERAGE
STD DEV
CPK
541
290
125
25.9
632
460
160
19.9
541
284
79
41.0
495
338
65
49.6
CHANGED PART IDENTIFICATION
--------------------------Customers may receive SMA product manufactured from either Seefull
or Taiwan starting with Date Code 9949 or later.
AFFECTED DEVICES
---------------MRA4003T3
MRA4004T3
MRA4005T3
MRA4006T3
MRA4007T3
SR4486
SR4488T3