********************************************************************** PRODUCT/PROCESS CHANGE NOTIFICATION FOR ON Semiconductor ********************************************************************** NOTIFICATION #: 10046 PAGE: 1 ISSUING DIVISION: PHX-PPD ACTUAL ISSUE DATE: 29-Sep-1999 ACTUAL EFFECT DATE: 28-Nov-1999 TITLE: QUALIFY ADDITIONAL ASSEMBLY/TEST SITE OF SMA GENERAL PURPOSE RECTIFIERS E01 TITLE: SEEFULL CHINA ADDITION AFFECTED CHANGE CATEGORIES Subcontractor Assembly Site Subcontractor Test Site AFFECTED PRODUCT DIVISIONS MOS POWER PRODUCTS ADDITIONAL RELIABILITY DATA: Available REFERENCE: CAROLYN ANTILLON PHONE: 602-244-4961 SAMPLES: Contact Below REFERENCE: MIKE SCHAGER PHONE: 602-244-5128 NOTIFICATION DATA REFERENCE:CHRIS HOLLY PHONE: 602-244-4961 USERID:[email protected] USERID:RV1140 DISCLAIMER ON Semiconductor will consider this change approved unless specific conditions of acceptance are provided in writing within 30 days of receipt of this notice. To do so, contact your local ON Semiconductor sales office. DESCRIPTION AND PURPOSE ----------------------ON Semiconductor currently produces SMA General Purpose Rectifiers (primarily MRA4000-series) at a subcontractor. In order to provide additional capacity, ON Semiconductor is qualifying our subcontractor's other facility in Seefull, China, where a similar production line already exists. In order to expedite this additional capacity to service our customers, we will start shipping product from the new fab after 60 days from the PCN release date. QUALIFICATION PLAN -----------------See Rel Data RELIABILITY DATA SUMMARY -----------------------Reliability Data Schedule for Qualification Lots processed at Seefull China: 500 hours will be available after November 15, 1999. 1000 hours will be available after December 6, 1999. Samples will be available by request after November 1, 1999. Preliminary Reliability Results - MRA4007T3 Assembly/Test Site: Seefull (Shanghai) China TESTS CONDITIONS INTERVAL SIZE HTRB 150DegC, 800V 168 hours H3TRB 85DegC, 85% RH 168 hours IOL 0.8A 168 hours Autoclave 121DegC, 15psi 96 hours Temp Cycle -55DegC to +150DegC 30 cycles Res.to Solder Heat 260DegC plus or minus 15DegC, 10 REJECTS 3 x 22 0 3 x 22 0 3 x 22 0 3 x 22 0 3 x 22 0 sec. 3 x 22 0 ELECTRICAL CHARACTERISTIC SUMMARY --------------------------------Device - MRA4007T3 Assembly/Test Site: Seefull China Test Temperature: 25DegC Forward Voltage (volts) @ If=0.5A CONTROL GROUP (TAIWAN) MAX LIMIT MIN 0.950 0.892 TEST GROUP Lot 1 0.950 0.892 MAX AVERAGE STD DEV CPK 0.907 0.899 0.005 3.4 0.912 0.896 0.006 3.0 (SEEFULL) Lot 2 0.950 0.892 Lot 3 0.950 0.892 0.916 0.899 0.007 2.4 0.919 0.898 0.008 2.2 Forward Voltage (volts) @ If=1.0A CONTROL GROUP (TAIWAN) MAX LIMIT 1.100 TEST GROUP (SEEFULL) Lot 1 Lot 2 1.100 1.100 MIN 0.946 0.946 0.946 0.941 MAX AVERAGE STD DEV CPK 0.970 0.957 0.008 6.0 0.980 0.953 0.010 4.9 0.980 0.957 0.010 4.8 0.985 0.956 0.012 4.0 Reverse Leakage (nanoamps) @ Vr=400V CONTROL GROUP (TAIWAN) Lot 3 1.100 MAX LIMIT 10000 TEST GROUP (SEEFULL) Lot 1 Lot 2 10000 10000 MIN 052 71 62 88 MAX AVERAGE STD DEV CPK 231 107 54 61.1 267 156 68 48.3 162 102 23 143.5 399 123 56 58.8 Reverse Leakage (nanoamps) @ Vr=1000V CONTROL GROUP (TAIWAN) Lot 3 10000 MAX LIMIT 10000 TEST GROUP (SEEFULL) Lot 1 Lot 2 Lot 3 10000 10000 10000 MIN 145 188 148 246 MAX AVERAGE STD DEV CPK 541 290 125 25.9 632 460 160 19.9 541 284 79 41.0 495 338 65 49.6 CHANGED PART IDENTIFICATION --------------------------Customers may receive SMA product manufactured from either Seefull or Taiwan starting with Date Code 9949 or later. AFFECTED DEVICES ---------------MRA4003T3 MRA4004T3 MRA4005T3 MRA4006T3 MRA4007T3 SR4486 SR4488T3