Subject: ON Semiconductor PRODUCT/PROCESS CHANGE NOTIFICATION 10060 TITLE: MC33072 DIE FABRICATION AT ALLEGRO MICROSYSTEMS EFFECTIVE DATE: 05-FEB-00 AFFECTED CHANGE CATEGORIES Subcontractor Fab Site AFFECTED PRODUCT DIVISIONS ANALOG DIV ADDITIONAL RELIABILITY DATA: Available Contact your local ON Semiconductor Sales Office. Ref: RJJ930 SAMPLES: Contact Below Ref: [email protected] Contact your local ON Semiconductor Sales Office. For any questions concerning this notification: REFERENCE:KIMBERLY WHITE PHONE: 480-413-4431 DISCLAIMER: ON SEMICONDUCTOR WILL CONSIDER THIS CHANGE APPROVED UNLESS SPECIFIC CONDITIONS OF ACCEPTANCE ARE PROVIDED IN WRITING WITHIN 30 DAYS OF RECEIPT OF THIS NOTICE. TO DO SO, CONTACT YOUR LOCAL ON SEMICONDUCTOR SALES OFFICE. GPCN FORMAT: CUSTOMER DO NOT REPLY TO THIS MESSAGE. ON Semiconductor Semiconductor Technology Group Page:2 ISSUE DATE: 28-Oct-1999 EFFECTIVE DATE: 05-Feb- 2000 NOTIFICATION #:10060 ISSUING DIVISION:PHX-GPPD DESCRIPTION AND PURPOSE ----------------------To meet our growing business needs and additional capacity requirements, the MC33072 device series is being qualified for processing at Allegro Microsystems. The Allegro wafer processing fab located at Willow Grove, PA. has been approved and previously qualified for the MC1413 and the MC34063 product families. The purpose is to provide an additional wafer capacity to supplement other existing ON Semiconductor approved manufacturing sites. The exact same masking layers are being used at the Allegro fab as is presently being used at other ON Semiconductor wafer fabs. The wafer process being used is standard linear, EPI 78 flow. QUALIFICATION PLAN -----------------Same as Reliability Data RELIABILITY DATA SUMMARY -----------------------BMC to Allegro Fab Transfer MC33072AP Reliability Qual Summary Rel ID 0082 TEST TEST CONDITIONS HTOL TA=125DegC HTB 175DegC SS x Lots TEST POINTS 77 x 3 lots 77 x 0 lots 168 Hrs 504 Hrs 1008 Hrs HAST 77 x 3 lots 48 Hrs 96 Hrs Temp Cyc Solder Heat Lot B 0/77 0/77 0/77 0/77 0/77 0/77 Lot C 0/77 0/77 0/77 500 Hrs Generic Generic Generic 77 x 3 lots Autoclave 121DegC/100 % RH/15 PSIG Lot A 168 Hrs 504 Hrs 1008 Hrs H3TRB TA=+85DegC, RH=85 % TA=130DegC, RH=85% 18.8 PSIG TEST RESULTS 77 x 3 lots 0/77 0/77 0/77 96 Hrs 144 Hrs 0/77 0/77 0/77 0/77 0/77 0/77 0/77 0/77 0/77 0/77 0/77 0/77 0/77 0/76 0/77 0/76 0/77 0/76 -65DegC to +150DegC; 77 x 3 lots 100 cyc 0/77 0/77 0/77 500 cyc 1000 cyc 0/77 0/77 0/77 0/77 0/77 0/77 0/22 0/22 0/22 260DegC for 10 sec 77 x 3 lots Endpoint ELECTRICAL CHARACTERISTIC SUMMARY --------------------------------Available upon request. CHANGED PART IDENTIFICATION --------------------------Customers may see product starting with Date Code 0006. ON Semiconductor Page:3 Semiconductor Technology Grp ********************************************************************** PRODUCT/PROCESS CHANGE NOTIFICATION ********************************************************************** ISSUE DATE: 28-Oct-1999 NOTIFICATION #:10060 EFFECTIVE DATE: 05-Feb- 2000 ISSUING DIVISION:PHX-GPPD FILE FORMAT: ASCII TEXT FONT - Courier SIZE - 12 Point LINE - 70 characters/line PAGE - 55 lines/page PAGEBREAK CHARACTER - ^L (Control L) AFFECTED DEVICE LIST (WITHOUT SPECIALS) --------------------------------------FMC33072AD , FMC33072ADR2 , FMC33072D FMC34072D , FMC34072DR2 , MC33072AD MC33072AP , MC33072D , MC33072DR2 MC34072AD , MC34072ADR2 , MC34072AP MC34072DR2 , MC34072P , MC34072VD MC34072VP , SC111954DR2 , , , , , FMC33072DR2 MC33072ADR2 MC33072P MC34072D MC34072VDR2