INFINEON BFY450_11

BFY450
HiRel NPN Silicon RF Transistor

HiRel Discrete and Microwave Semiconductor

For Medium Power Amplifiers

Hermetically sealed microwave package

Transition Frequency fT = 20 GHz

3
1
2
Compression Point P-1dB =19dBm 1.8 GHz
Max. Available Gain Gma = 16dB at 1.8 GHz


4

SIEGET 25-Line
Infineon Technologies Grounded Emitter Transistor25 GHz fT-Line
Space Qualified
ESA/SCC Detail Spec. No.: 5611/008
Type Variant No. 03
ESD: Electrostatic discharge sensitive device,
observe handling precautions!
Type
Marking
Ordering Code
Pin Configuration
1
BFY450 (ql)
(ql) Quality Level:
-
see below
C
2
E
3
Package
4
B
E
Micro-X
P: Professional Quality
H: High Rel Quality
S: Space Quality
ES: ESA Space Quality
(see order instructions for ordering example)
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BFY450
Maximum Ratings
Parameter
Symbol
Values
Unit
Collector-emitter voltage
VCEO
4.5
V
Collector-base voltage
VCBO
15
V
Emitter-base voltage
VEBO
1.5
V
Collector current
IC
100
mA
Base current
IB
10
mA
Total power dissipation,
1), 2)
TS  110°C
Ptot
450
mW
Junction temperature
Tj
175
C
Operating temperature range
Top
-65...+175
C
Storage temperature range
Tstg
-65...+175
C
Rth JS
< 145
K/W
Thermal Resistance
Junction-soldering point 2)
Notes.:
1) At TS = + 110 °C. For TS > + 110 °C derating is required.
2) TS is measured on the collector lead at the soldering point to the pcb.
Electrical Characteristics
at TA=25°C; unless otherwise specified
Parameter
Symbol
Values
Unit
min.
typ.
max.
ICBO
-
-
100
nA
ICEX
-
-
200
µA
DC Characteristics
Collector-base cutoff current
VCB = 5 V, IE = 0
Collector-emitter cutoff current 1.)
VCE = 4.5 V, IB = 1.0µA
Emitter-base cuttoff current
(t.b.d.)
IEBO
-
-
50
A
hFE
50
90
150
-
VEB = 1.5 V, IC = 0
DC current gain
IC = 20 mA, VCE = 1 V
Notes:
1.) This Test assures V(BR)CE0 > 4.5V
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BFY450
Electrical Characteristics (continued)
Parameter
Symbol
Values
min.
typ.
Unit
max.
AC Characteristics
Transition frequency
fT
GHz
IC = 90mA, VCE = 3 V, f = 1.0 GHz
18
22
-
IC = 90mA, VCE = 3 V, f = 2.0 GHz
-
17
-
CCB
-
0.42
0.9
pF
CCE
-
1.27
2.6
pF
CEB
-
2.0
3
pF
F
-
1.25
2.0
dB
|S21e|2
8.0
12
-
dB
-
16.0
-
dB
-
19
-
dBm
Collector-base capacitance
VCB = 2 V, VBE = vbe = 0, f = 1 MHz
Collector-emitter capacitance
VCE = 2 V, VBE = vbe = 0, f = 1 MHz
Emitter-base capacitance
VEB = 0.5V, VCB = vcb = 0, f = 1 MHz
Noise Figure
IC = 10 mA, VCE = 2 V, f = 1.8 GHz,
ZS = Zsopt
Insertion power gain
IC = 50 mA, VCE = 2 V, f = 1.8 GHz
ZS = ZL = 50 
Power gain
Gma
1.)
IC = 50 mA, VCE = 2 V, f = 1.8 GHz
ZS = ZSopt , ZL = ZLopt
1dB Compression point
P-1dB
IC = 50 mA, VCE = 2 V, f = 1.8 GHz
ZS = ZSopt , ZL = ZLopt
Notes.:
1)
Gma 
S 21
( k  k 2  1) ,
S12
IFAG IMM RPD D HIR
Gms 
S 21
S12
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V2, February 2011
BFY450
Micro-X Package
4
Edition 2011-02
3
Published by
Infineon Technologies AG
1
2
85579 Neubiberg, Germany
© Infineon Technologies AG 2011
All Rights Reserved.
Attention please!
The information given in this document shall in no event be regarded as a guarantee of
conditions or characteristics (“Beschaffenheitsgarantie“). With respect to any examples or
hints given herein, any typical values stated herein and/or any information regarding the
application of the device, Infineon Technologies hereby disclaims any and all warranties and
liabilities of any kind, including without limitation warranties of non-infringement of intellectual
property rights of an third party.
Information
For further information on technology, delivery terms and conditions and prices please
contact your nearest Infineon Technologies Office (www.infineon.com).
Warnings
Due to technical requirements components may contain dangerous substances. For
information on the types in question please contact your nearest Infineon Technologies
Office.
Infineon Technologies Components may only be used in life-support devices or systems with
the express written approval of Infineon Technologies, if a failure of such components can
reasonably be expected to cause the failure of that life-support device or system, or to affect
the safety or effectiveness of that device or system.
Life support devices or systems are intended to be implanted in the human body, or to
support and/or maintain and sustain and/or protect human life. If they fail, it is reasonable to
assume that the health of the user or other persons may be endangered.
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