Freescale Semiconductor Advance Information Document Number: MC34984 Rev. 1.0, 9/2014 Dual Intelligent High-current Self-protected Silicon High-side Switch (4.0 mOhm 34984 The 34984 is a dual self-protected 4.0 mOhm switch used to replace electromechanical relays, fuses, and discrete devices in power management applications. The 34984 is designed for harsh environments, and it includes self-recovery features. The device is suitable for loads with high inrush current, as well as motors and all types of resistive and inductive loads. Programming, control and diagnostics are implemented via the serial peripheral interface (SPI). A dedicated parallel input is available for alternate and pulsewidth modulation (PWM) control of each output. SPI-programmable fault trip thresholds allow the device to be adjusted for optimal performance in the application. The 34984 is packaged in a power-enhanced 12 x 12 mm nonleaded PQFN package with exposed tabs and powered by SMARTMOS technology. HIGH-SIDE SWITCH BOTTOM VIEW FK SUFFIX 98ARL10521D 16-PIN PQFN Features • • • • Dual 4.0 m max. high-side switch with parallel input or SPI control 6.0 V to 27 V operating voltage with standby currents < 5.0 A Output current monitoring with two SPI-selectable current ratios SPI control of overcurrent limit, overcurrent fault blanking time, output OFF open load detection, output ON/OFF control, watchdog timeout, slew-rates, and fault status reporting • SPI status reporting of overcurrent, open and shorted loads, overtemperature, undervoltage and overvoltage shutdown, fail-safe pin status, and program status • Enhanced -16 V reverse polarity VPWR protection VDD VDD Applications • • • • VDD Low-voltage factory automation DC motor or solenoid Resistive and inductive loads Low-voltage industrial lighting VPWR 34984 VDD I/O FS I/O WAKE SO SI SCLK MCU GND HS1 SCLK CS CS SI SO I/O RST I/O INO I/O IN1 A/D VPWR HS0 LOAD CSNS FSI GND Figure 1. 34984 Simplified Application Diagram * This document contains certain information on a new product. Specifications and information herein are subject to change without notice. © Freescale Semiconductor, Inc., 2014. All rights reserved. LOAD ORDERABLE PARTS ORDERABLE PARTS Table 1. Orderable Part Variations Temperature Range (TA) Part Number MC34984CHFK(1) -40 °C to 125 °C Package 16 PQFN Notes 1. To order parts in Tape & Reel, add the R2 suffix to the part number. 34984 2 Analog Integrated Circuit Device Data Freescale Semiconductor INTERNAL BLOCK DIAGRAM INTERNAL BLOCK DIAGRAM VPWR VDD Internal Regulator IUP VIC Overvoltage Protection CS Programmable Switch Delay 0 –525 ms SO SPI 3.0 MHz Selectable Slew Rate Gate Drive HS0 Selectable Overcurrent High Detection 100A or 75A SI SCLK FS IN[0:1] RST WAKE Logic Selectable Overcurrent Low Detection Blanking Time 0.15–155 ms Selectable Overcurrent Low Detection 7.5 –25 A Open Load Detection IDWN Overtemperature Detection RDWN HS0 HS1 Programmable Watchdog 310–2500 ms HS1 VIC IUP Selectable Output Current Recopy 1/20500 or 1/41000 FSI GND CSNS Figure 2. 34984 Simplified Internal Block Diagram 34984 Analog Integrated Circuit Device Data Freescale Semiconductor 3 PIN CONNECTIONS PIN CONNECTIONS 4 3 2 CSNS RST WAKE 6 5 FS FSI 7 IN0 CS SI SCLK VDD SO IN1 12 11 10 9 8 1 13 GND TRANSPARENT TOP VIEW 14 VPWR 15 HS1 16 HS0 Figure 3. 34984 Pin Connections (Transparent Top View) Functional descriptions of many of these pins can be found in the Functional Pin Description section beginning on page 16. Table 2. Pin Definitions Pin Pin Name Pin Function Formal Name Definition 1 CSNS Output Output Current Monitoring This pin is used to output a current proportional to the designated HS0-1 output. 2 WAKE Input Wake 3 RST Input Reset (Active Low) 4 IN0 Input Direct Input 0 5 FS Output Fault Status (Active Low) This is an open drain configured output requiring an external pull-up resistor to VDD for fault reporting. 6 FSI Input Fail-safe Input The value of the resistance connected between this pin and ground determines the state of the outputs after a watchdog timeout occurs. 7 CS Input Chip Select (Active Low) 8 SCLK Input Serial Clock This input pin is connected to the MCU providing the required bit shift clock for SPI communication. 9 SI Input Serial Input This is a command data input pin connected to the SPI Serial Data Output of the MCU or to the SO pin of the previous device of a daisy chain of devices. 10 VDD Input Digital Drain Voltage (Power) 11 SO Output Serial Output This output pin is connected to the SPI serial data input pin of the MCU or to the SI pin of the next device of a daisy chain of devices. 12 IN1 Input Direct Input 1 This input pin is used to directly control the output HS1. 13 GND Ground Ground 14 VPWR Input Positive Power Supply This pin is used to input a Logic [1] signal so as to enable the watchdog timer function. This input pin is used to initialize the device configuration and fault registers, as well as place the device in a low current Sleep mode. This input pin is used to directly control the output HS0. This input pin is connected to a chip select output of a master microcontroller (MCU). This is an external voltage input pin used to supply power to the SPI circuit. This pin is the ground for the logic and analog circuitry of the device. This pin connects to the positive power supply and is the source input of operational power for the device. 34984 4 Analog Integrated Circuit Device Data Freescale Semiconductor PIN CONNECTIONS Table 2. Pin Definitions (continued) Pin Pin Name Pin Function Formal Name 15 HS1 Output High-side Output 1 Protected 4.0 m high-side power output to the load. 16 HS0 Output High-side Output 0 Protected 4.0 m high-side power output to the load. Definition 34984 Analog Integrated Circuit Device Data Freescale Semiconductor 5 ELECTRICAL CHARACTERISTICS MAXIMUM RATINGS ELECTRICAL CHARACTERISTICS MAXIMUM RATINGS Table 3. Maximum Ratings All voltages are with respect to ground unless otherwise noted. Symbol Rating Value Unit Notes Operating Voltage Range Steady-state -16 to 41 V VDD VDD Supply Voltage -0.3 to 5.5 V VIN[0:1], RST, FSI, CSNS, SI, SCLK, Input/Output Voltage - 0.3 to 7.0 V (2) - 0.3 to VDD + 0.3 V (2) ELECTRICAL RATINGS VPWR CS, FS VSO SO Output Voltage ICL(WAKE) WAKE Input Clamp Current 2.5 mA ICL(CSNS) CSNS Input Clamp Current 10 mA 41 -15 V 30 A (3) 0.75 0.5 J (4) V (5) VHS Output Voltage Positive Negative IHS[0:1] Output Current ECL[0:1] Output Clamp Energy 34984B 34984C VESD1 VESD3 ESD Voltage Human Body Model (HBM) Charge Device Model (CDM) Corner Pins (1, 12, 15, 16) All Other Pins (2, 11, 13, 14) ± 2000 ±750 ±500 Notes 2. Exceeding this voltage limit may cause permanent damage to the device. 3. Continuous high-side output current rating so long as maximum junction temperature is not exceeded. Calculation of maximum output current using package thermal resistance is required. 4. Active clamp energy using single-pulse method (L = 16 mH, RL = 0,VPWR = 12 V, TJ = 150 °C). 5. ESD1 testing is performed in accordance with the Human Body Model (HBM) (CZAP = 100 pF, RZAP = 1500 ESD3 testing is performed in accordance with the Charge Device Model (CDM), Robotic (CZAP = 4.0 pF). 34984 6 Analog Integrated Circuit Device Data Freescale Semiconductor ELECTRICAL CHARACTERISTICS MAXIMUM RATINGS Table 3. Maximum Ratings (continued) All voltages are with respect to ground unless otherwise noted. Symbol Rating Value Unit Notes Operating Temperature Ambient Junction - 40 to 125 - 40 to 150 C TSTG Storage Temperature - 55 to 150 C RJC RJA Thermal Resistance Junction-to-Case Junction-to-Ambient <1.0 30 C/W (7) TPPRT Peak Package Reflow Temperature During Reflow Note 9 °C (8), (9) THERMAL RATINGS TA TJ Notes 6. To achieve high reliability over 10 years of continuous operation, the device's continuous operating junction temperature should not exceed 125 C 7. Device mounted on a 2s2p test board according to JEDEC JESD51-2. 8. Pin soldering temperature limit is for 40 seconds maximum duration. Not designed for immersion soldering. Exceeding these limits may cause malfunction or permanent damage to the device. 9. Freescale’s Package Reflow capability meets Pb-free requirements for JEDEC standard J-STD-020. For Peak Package Reflow Temperature and Moisture Sensitivity Levels (MSL), Go to www.freescale.com, search by part number [e.g. remove prefixes/suffixes and enter the core ID to view all orderable parts. (i.e. MC33xxxD enter 33xxx), and review parametrics. 34984 Analog Integrated Circuit Device Data Freescale Semiconductor 7 ELECTRICAL CHARACTERISTICS STATIC ELECTRICAL CHARACTERISTICS STATIC ELECTRICAL CHARACTERISTICS Table 4. Static Electrical Characteristics Characteristics noted under conditions 4.5 V VDD 5.5 V, 6.0 V VPWR 27 V, -40 C TA 125 C, unless otherwise noted. Typical values noted reflect the approximate parameter mean at TA = 25 C under nominal conditions, unless otherwise noted. Symbol Characteristic Min Typ Max Unit 6.0 – 27 V Notes POWER INPUT VPWR Power Supply Voltage Range Full Operational IPWR(ON) VPWR Operating Supply Current Output ON, IHS0 and IHS1 = 0 A – – 20 mA IPWR(SBY) VPWR Supply Current Output OFF, Open Load Detection Disabled, WAKE > 0.7 x VDD, RST = VLOGIC HIGH – – 5.0 mA – – – – 10 50 4.5 5.0 5.5 V IPWR(SLEEP) Sleep State Supply Current (VPWR < 14 V, RST < 0.5 V, WAKE < 0.5 V) TJ = 25 C TJ = 85 C A VDD(ON) VDD Supply Voltage IDD(ON) VDD Supply Current No SPI Communication 3.0 MHz SPI Communication – – – – 1.0 5.0 mA IDD(SLEEP) VDD Sleep State Current – – 5.0 A VPWR(OV) Overvoltage Shutdown Threshold 28 32 36 V VPWR(OVHYS) Overvoltage Shutdown Hysteresis 0.2 0.8 1.5 V Undervoltage Output Shutdown Threshold 5.0 5.5 6.0 V (10) (11) VPWR(UV) VPWR(UVHYS) Undervoltage Hysteresis – 0.25 – V VPWR(UVPOR) Undervoltage Power-ON Reset – – 5.0 V – – – – – – 6.0 4.0 4.0 m – – – – – – 10.2 7.2 6.8 Output Source-to-Drain ON Resistance IHS[0:1] = 15 A, TJ = 25 C VPWR = -12 V – – 8.0 Output Overcurrent High Detection Levels (9.0 V < VPWR < 16 V) SOCH = 0 SOCH = 1 80 60 100 75 120 90 POWER OUTPUT RDS(on) RDS(on) RDS(on) IOCH0 IOCH1 Output Drain-to-Source ON Resistance (IHS[0:1] = 15 A, TJ = 25 C) VPWR = 6.0 V VPWR = 10 V VPWR = 13 V Output Drain-to-Source ON Resistance (IHS[0:1] = 15 A, TJ = 150 C) VPWR = 6.0 V VPWR = 10 V VPWR = 13 V m m (12) A Notes 10. This applies to all internal device logic supplied by VPWR and assumes the external VDD supply is within specification. 11. 12. This applies when the undervoltage fault is not latched (IN[0 : 1] = 0). Source-Drain ON Resistance (Reverse Drain-to-Source ON Resistance) with negative polarity VPWR. 34984 8 Analog Integrated Circuit Device Data Freescale Semiconductor ELECTRICAL CHARACTERISTICS STATIC ELECTRICAL CHARACTERISTICS Table 4. Static Electrical Characteristics (continued) Characteristics noted under conditions 4.5 V VDD 5.5 V, 6.0 V VPWR 27 V, -40 C TA 125 C, unless otherwise noted. Typical values noted reflect the approximate parameter mean at TA = 25 C under nominal conditions, unless otherwise noted. Symbol Characteristic Min Typ Max Unit Notes 21 18 16 14 12 10 8.0 6.0 25 22.5 20 17.5 15 12.5 10 7.5 29 27 24 21 18 15 12 9.0 – – 1/20500 1/41000 – – CSR0_ACC Current Sense Ratio (CSR0) Accuracy Output Current 5.0 A 10 A 12.5 A 15 A 20 A 25 A - 20 -14 -13 -12 -13 -13 – – – – – – 20 14 13 12 13 13 CSR1_ACC Current Sense Ratio (CSR1) Accuracy Output Current 5.0 A 10 A 12.5 A 15 A 20 A 25 A - 25 -19 -18 -17 -18 -18 – – – – – – 25 19 18 17 18 18 VCL(CSNS) Current Sense Clamp Voltage CSNS Open; IHS[0:1] = 29 A 4.5 6.0 7.0 V IOLDC Open Load Detection Current 30 – 100 A Output Fault Detection Threshold Output Programmed OFF 2.0 3.0 4.0 V VCL Output Negative Clamp Voltage 0.5 A < IHS[0:1] < 2.0 A, Output OFF - 20 – -15 V TSD Overtemperature Shutdown 160 175 190 C (14) Overtemperature Shutdown Hysteresis 5.0 – 20 C (14) POWER OUTPUT (CONTINUED) IOCL0 IOCL1 IOCL2 IOCL3 IOCL4 IOCL5 IOCL6 IOCL7 Overcurrent Low Detection Levels (SOCL[2:0]) 000 001 010 011 100 101 110 111 CSR0 CSR1 Current Sense Ratio (9.0 V < VPWR < 16 V, CSNS < 4.5 V) DICR D2 = 0 DICR D2 = 1 VOLD(THRES) TSD(HYS) A – % % (13) Notes 13. Output OFF open load detection current is the current required to flow through the load for the purpose of detecting the existence of an open load condition when the specific output is commanded OFF. 14. Guaranteed by process monitoring. Not production tested. 34984 Analog Integrated Circuit Device Data Freescale Semiconductor 9 ELECTRICAL CHARACTERISTICS STATIC ELECTRICAL CHARACTERISTICS Table 4. Static Electrical Characteristics (continued) Characteristics noted under conditions 4.5 V VDD 5.5 V, 6.0 V VPWR 27 V, -40 C TA 125 C, unless otherwise noted. Typical values noted reflect the approximate parameter mean at TA = 25 C under nominal conditions, unless otherwise noted. Symbol Characteristic Min Typ Max Unit Notes Control Interface VIH Input Logic High-voltage 0.7 x VDD – – V (15) VIL Input Logic Low-voltage – – 0.2 x VDD V (15) Input Logic Voltage Hysteresis 100 600 1200 mV (16) IDWN Input Logic Pull-down Current (SCLK, IN, SI) 5.0 – 20 A VRST RST Input Voltage Range 4.5 5.0 5.5 V CSO SO, FS Tri-state Capacitance – – 20 pF 100 200 400 k – 4.0 12 pF (17) (18) VIN[0:1] (HYS) RDWN CIN Input Logic Pull-down Resistor (RST) and WAKE Input Capacitance VCL(WAKE) WAKE Input Clamp Voltage ICL(WAKE) < 2.5 mA 7.0 – 14 V VF(WAKE) WAKE Input Forward Voltage ICL(WAKE) = - 2.5 mA - 2.0 – - 0.3 V VSOH SO High-state Output Voltage IOH = 1.0 mA 0.8 x VDD – – V – 0.2 0.4 V SO Tri-state Leakage Current CS > 0.7 VDD - 5.0 0.0 5.0 A Input Logic Pull-up Current CS, VIN[0:1] > 0.7 x VDD 5.0 – 20 A – 6.0 15 40 0.0 6.5 17 Infinite 1.0 7.0 19 – VSOL ISO(LEAK) IUP RFS RFSDIS RFSOFFOFF RFSONOFF RFSONON FS, SO Low-state Output Voltage IOL = -1.6 mA FSI Input Pin External Pull-down Resistance FSI Disabled, HS[0:1] Indeterminate FSI Enabled, HS[0:1] OFF FSI Enabled, HS0 ON, HS1 OFF FSI Enabled, HS[0:1] ON (17) (19) k Notes 15. Upper and lower logic threshold voltage range applies to SI, CS, SCLK, RST, IN[0:1], and WAKE input signals. The WAKE and RST signals may be supplied by a derived voltage reference to VPWR. 16. 17. 18. 19. No hysteresis on FSI and WAKE pins. Parameter is guaranteed by processing monitoring but is not production tested. Input capacitance of SI, CS, SCLK, RST, and WAKE. This parameter is guaranteed by process monitoring but is not production tested. The current must be limited by a series resistance when using voltages > 7.0 V. Pull-up current is with CS Open. CS has an active internal pull-up to VDD. 34984 10 Analog Integrated Circuit Device Data Freescale Semiconductor ELECTRICAL CHARACTERISTICS DYNAMIC ELECTRICAL CHARACTERISTICS DYNAMIC ELECTRICAL CHARACTERISTICS Table 5. Dynamic Electrical Characteristics Characteristics noted under conditions 4.5 V VDD 5.5 V, 6.0 V VPWR 27 V, -40 C TA 125 C, unless otherwise noted. Typical values noted reflect the approximate parameter mean at TA = 25C under nominal conditions, unless otherwise noted. Symbol Characteristic Min Typ Max Unit Notes POWER OUTPUT TIMING SRRA_SLOW Output Rising Slow Slew Rate A (DICR D3 = 0) 9.0 V < VPWR < 16 V 0.15 0.5 1.0 V/s (20) SRRB_SLOW Output Rising Slow Slew Rate B (DICR D3 = 0) 9.0 V < VPWR < 16 V 0.06 0.2 0.6 V/s (21) SRRA_FAST Output Rising Fast Slew Rate A (DICR D3 = 1) 9.0 V < VPWR < 16 V 0.3 0.8 3.2 V/s (20) SRRB_FAST Output Rising Fast Slew Rate B (DICR D3 = 1) 9.0 V < VPWR < 16 V 0.06 0.2 2.4 V/s (21) SRFA_SLOW Output Falling Slow Slew Rate A (DICR D3 = 0) 9.0 V < VPWR < 16 V 0.15 0.5 1.0 V/s (20) SRFB_SLOW Output Falling Slow Slew Rate B (DICR D3 = 0) 9.0 V < VPWR < 16 V 0.06 0.2 0.6 V/s (21) SRFA_FAST Output Falling Fast Slew Rate A (DICR D3 = 1) 9.0 V < VPWR < 16 V 0.6 1.6 3.2 V/s (20) SRFB_FAST Output Falling Fast Slew Rate B (DICR D3 = 1) 9.0 V < VPWR < 16 V 0.2 0.7 2.4 V/s (21) Output Turn-ON Delay Time in Fast/Slow Slew Rate DICR = 0, DICR = 1 0.5 18 100 s (22) t DLY_SLOW(OFF) Output Turn-OFF Delay Time in Slow Slew Rate Mode DICR = 0 10 115 250 s (23) t DLY_FAST(OFF) Output Turn-OFF Delay Time in Fast Slew Rate Mode DICR = 1 1.0 30 100 s (23) – 300 – Hz t DLY(ON) f PWM Direct Input Switching Frequency (DICR D3 = 0) t OCL0 t OCL1 t OCL2 t OCL3 Overcurrent Detection Blanking Time (OCLT [1:0]) 00 01 10 11 108 7.0 0.8 0.08 155 10 1.2 0.15 202 13 1.6 0.25 t OCH Overcurrent High Detection Blanking Time 1.0 10 20 s – – 10 s t CNSVAL CS to CSNS Valid Time ms (24) Notes 20. Rise and Fall Slew Rates A measured across a 5.0 resistive load at high-side output = 0.5 V to VPWR - 3.5 V. These parameters are guaranteed by process monitoring. 21. Rise and Fall Slew Rates B measured across a 5.0 resistive load at high-side output = VPWR - 3.5 V to VPWR - 0.5 V. These parameters are guaranteed by process monitoring. 22. Turn-ON delay time measured from rising edge of IN[0:1] signal that would turn the output ON to VHS[0:1] = 0.5 V with RL = 5.0 resistive load. 23. Turn-OFF delay time measured from falling edge that would turn the output OFF to VHS[0:1] = VPWR - 0.5 V with RL = 5.0 resistive load. 24. Time necessary for the CSNS to be within ±5% of the targeted value. 34984 Analog Integrated Circuit Device Data Freescale Semiconductor 11 ELECTRICAL CHARACTERISTICS DYNAMIC ELECTRICAL CHARACTERISTICS Table 5. Dynamic Electrical Characteristics (continued) Characteristics noted under conditions 4.5 V VDD 5.5 V, 6.0 V VPWR 27 V, -40 C TA 125 C, unless otherwise noted. Typical values noted reflect the approximate parameter mean at TA = 25C under nominal conditions, unless otherwise noted. Symbol Characteristic Min Typ Max Unit Notes POWER OUTPUT TIMING (CONTINUED) t OSD0 t OSD1 t OSD2 t OSD3 t OSD4 t OSD5 t OSD6 t OSD7 HS1 Switching Delay Time (OSD[2:0]) 000 001 010 011 100 101 110 111 – 55 110 165 220 275 330 385 0 75 150 225 300 375 450 525 – 95 190 285 380 475 570 665 t OSD0 t OSD1 t OSD2 t OSD3 t OSD4 t OSD5 t OSD6 t OSD7 HS0 Switching Delay Time (OSD[2:0]) 000 001 010 011 100 101 110 111 – – 110 110 220 220 330 330 0 0 150 150 300 300 450 450 – – 190 190 380 380 570 570 Watchdog Timeout (WD [1:0]) 00 01 10 11 434 207 1750 875 620 310 2500 1250 806 403 3250 1625 Recommended Frequency of SPI Operation – – 3.0 MHz Required Low State Duration for RST – 50 350 ns (26) Rising Edge of CS to Falling Edge of CS (Required Setup Time) – – 300 ns (27) t ENBL Rising Edge of RST to Falling Edge of CS (Required Setup Time) – – 5.0 s (27) t LEAD Falling Edge of CS to Rising Edge of SCLK (Required Setup Time) – 50 167 ns (27) t WSCLKh Required High State Duration of SCLK (Required Setup Time) – – 167 ns (27) t WSCLKl Required Low State Duration of SCLK (Required Setup Time) – – 167 ns (27) Falling Edge of SCLK to Rising Edge of CS (Required Setup Time) – 50 167 ns (27) t SI(SU) SI to Falling Edge of SCLK (Required Setup Time) – 25 83 ns (28) t SI(HOLD) Falling Edge of SCLK to SI (Required Setup Time) – 25 83 ns (28) t RSO SO Rise Time CL = 200 pF – 25 50 t FSO SO Fall Time CL = 200 pF – 25 50 t RSI SI, CS, SCLK, Incoming Signal Rise Time – – 50 ns (28) t RSI SI, CS, SCLK, Incoming Signal Fall Time – – 50 ns (28) t WDTO0 t WDTO1 t WDTO2 t WDTO3 ms ms ms (25) SPI INTERFACE CHARACTERISTICS f SPI t WRST t CS t LAG ns ns Notes 25. Watchdog timeout delay measured from the rising edge of WAKE to RST from a sleep-state condition to output turn-ON with the output driven OFF and FSI floating. The values shown are for WDR setting of [00]. The accuracy of tWDTO is consistent for all configured watchdog timeouts. 26. 27. 28. RST low duration measured with outputs enabled and going to OFF or disabled condition. Maximum setup time required for the 34984 is the minimum guaranteed time needed from the microcontroller. Rise and Fall time of incoming SI, CS, and SCLK signals suggested for design consideration to prevent the occurrence of double pulsing. 34984 12 Analog Integrated Circuit Device Data Freescale Semiconductor ELECTRICAL CHARACTERISTICS TIMING DIAGRAMS Table 5. Dynamic Electrical Characteristics (continued) Characteristics noted under conditions 4.5 V VDD 5.5 V, 6.0 V VPWR 27 V, -40 C TA 125 C, unless otherwise noted. Typical values noted reflect the approximate parameter mean at TA = 25C under nominal conditions, unless otherwise noted. Symbol Characteristic Min Typ Max Unit Notes SPI INTERFACE CHARACTERISTICS (CONTINUED) t SO(EN) Time from Falling Edge of CS to SO Low-impedance – – 145 ns (29) t SO(DIS) Time from Rising Edge of CS to SO High-impedance – 65 145 ns (30) Time from Rising Edge of SCLK to SO Data Valid 0.2 x VDD SO 0.8 x VDD, CL = 200 pF – 65 105 ns (31) t VALID Notes 29. Time required for output status data to be available for use at SO. 1.0 kon pull-up on CS. 30. Time required for output status data to be terminated at SO. 1.0 kon pull-up on CS. 31. Time required to obtain valid data out from SO following the rise of SCLK. TIMING DIAGRAMS CS VPWR VPWR 0.5V V VVPWR PWR --0.5 SRfB SRFB_SLOW & SRFB_FAST SRRB_SLOW & SRRB_FAST SRrB VPWR -3.5 VPWR - 3V V SRfA SRFA_SLOW & SRFA_FAST SRRA_SLOW & SRRA_FAST SRrA HS 0.5V0.5 V t DLY_SLOW(OFF) & tDLY_FAST(OFF) Tdly(off) t DLY(ON) Tdly (on) Figure 4. Output Slew Rate and Time Delays IOCHx Load Current IOCLx t OCH Time t OCLx Figure 5. Overcurrent Shutdown 34984 Analog Integrated Circuit Device Data Freescale Semiconductor 13 ELECTRICAL CHARACTERISTICS TIMING DIAGRAMS IOCH0 IOCH1 IOCL0 IOCL1 Load Current IOCL2 IOCL3 IOCL4 IOCL5 IOCL6 IOCL7 Time t OCHx t OCL3 t OCL2 t OCL1 t OCL0 Figure 6. Overcurrent Low and High Detection Figure 6 illustrates the overcurrent detection level (Ioclx, Iochx) the device can reach for each overcurrent detection blanking time (tochx, toclx): • During tochx, the device can reach up to Ioch0 overcurrent level. • During tocl3 or tocl2 or tocl1 or tocl0, the device can be programmed to detect up to Iocl0. VIH V IH RSTB RST 0.2 x VDD 0.2 VDD VIL VIL TwRSTB t WRST t ENBL tTCSB CS TENBL VIH V 0.7 x VDD 0.7VDD CS CSB IH 0.2 x VDD 0.7VDD t WSCLKh TwSCLKh tTlead LEAD VIL V IL t RSI TrSI t LAG Tlag 0.70.7VDD x VDD SCLK SCLK VIH VIH 0.2 x VDD 0.2VDD VIL V t TSIsu SI(SU) IL t WSCLKl TwSCLKl t SI(HOLD) TSI(hold) SI SI Don’t Care 0.7 VDD 0.7 xVDD 0.2VDD 0.2 x VDD tTfSI FSI VIH V Valid Don’t Care Valid Don’t Care IH VIH VIL Figure 7. Input Timing Switching Characteristics 34984 14 Analog Integrated Circuit Device Data Freescale Semiconductor ELECTRICAL CHARACTERISTICS TIMING DIAGRAMS t FSI t RSI TrSI TfSI VOH VOH 3.5 V 3.5V 50% SCLK SCLK 1.0VV 1.0 VOL VOL t SO(EN) TdlyLH SO SO 0.7 xVDD VDD 0.20.2 VDD x VDD Low-to-High Low to High TrSO t RSO VOH VOH VOL VOL VALID tTVALID SO TfSO t FSO SO VOH VOH 0.7VDD x VDD High to Low 0.7 High-to-Low 0.2VDD 0.2 x VDD TdlyHL VOL VOL t SO(DIS) Figure 8. SCLK Waveform and Valid SO Data Delay Time 34984 Analog Integrated Circuit Device Data Freescale Semiconductor 15 FUNCTIONAL DESCRIPTION FUNCTIONAL PIN DESCRIPTION FUNCTIONAL DESCRIPTION INTRODUCTION The 34984 is a dual self-protected 4.0 m silicon switch used to replace electromechanical relays, fuses, and discrete devices in power management applications. The 34984 is designed for harsh environments, and it includes self-recovery features. The device is suitable for loads with high inrush current, as well as motors and all types of resistive and inductive loads. Programming, control, and diagnostics are implemented via the serial peripheral interface (SPI). A dedicated parallel input is available for alternate and pulse width modulation (PWM) control of each output. SPI-programmable fault trip thresholds allow the device to be adjusted for optimal performance in the application. The 34984 is packaged in a power-enhanced 12 x 12 nonleaded PQFN package with exposed tabs. FUNCTIONAL PIN DESCRIPTION OUTPUT CURRENT MONITORING (CSNS) This pin is used to output a current proportional to the designated HS0-1 output. That current is fed into a ground-referenced resistor and its voltage is monitored by an MCU's A/D. The channel to be monitored is selected via the SPI. This pin can be tri-stated through the SPI. WAKE (WAKE) This pin is used to input a Logic [1] signal so as to enable the watchdog timer function. An internal clamp protects this pin from high damaging voltages when the output is current limited with an external resistor. This input has a passive internal pull-down. RESET (RST) This input pin is used to initialize the device configuration and fault registers, as well as place the device in a low-current Sleep mode. The pin also starts the watchdog timer when transitioning from Logic Low to Logic High. This pin should not be allowed to be Logic High until VDD is in regulation. This pin has a passive internal pull-down. DIRECT IN 0 & 1 (INx) This input pin is used to directly control the output HS0 and 1. This input has an active internal pull-down current source and requires CMOS logic levels. This input may be configured via the SPI. FAULT STATUS (FS) This is an open drain configured output requiring an external pull-up resistor to VDD for fault reporting. When a device fault condition is detected, this pin is active Low. Specific device diagnostic faults are reported via the SPI SO pin. FAIL-SAFE INPUT (FSI) The value of the resistance connected between this pin and ground determines the state of the outputs after a watchdog timeout occurs. Depending on the resistance value, either all outputs are OFF, ON, or the output HS0 only is ON. When the FSI pin is connected to GND, the watchdog circuit and Fail-safe operation are disabled. This pin incorporates an active internal pull-up current source. CHIP SELECT (CS) This input pin is connected to a chip select output of a master microcontroller (MCU). The MCU determines which device is addressed (selected) to receive data by pulling the CS pin of the selected device Logic Low, enabling SPI communication with the device. Other unselected devices on the serial link having their CS pins pulled-up Logic High disregard the SPI communication data sent. This pin incorporates an active internal pull-up current source. SERIAL CLOCK (SCLK) This input pin is connected to the MCU providing the required bit shift clock for SPI communication. It transitions one time per bit transferred at an operating frequency, fSPI, defined by the communication interface. The 50 percent duty cycle CMOS-level serial clock signal is idle between command transfers. The signal is used to shift data into and out of the device. This input has an active internal pull-down current source. SERIAL INPUT (SI) This is a command data input pin connected to the SPI Serial Data Output of the MCU or to the SO pin of the previous device of a daisy chain of devices. The input requires CMOS logic-level signals and incorporates an active internal pull-down current source. Device control is facilitated by the input's receiving the MSB first of a serial 8-bit control command. The MCU ensures data is available upon the falling edge of SCLK. The logic state of SI present upon the rising edge of SCLK loads that bit command into the internal command shift register. 34984 16 Analog Integrated Circuit Device Data Freescale Semiconductor FUNCTIONAL DESCRIPTION FUNCTIONAL PIN DESCRIPTION DIGITAL DRAIN VOLTAGE (VDD) This is an external voltage input pin used to supply power to the SPI circuit. In the event VDD is lost, an internal supply provides power to a portion of the logic, ensuring limited functionality of the device. All device configuration registers are reset. SERIAL OUTPUT (SO) This output pin is connected to the SPI Serial Data Input pin of the MCU or to the SI pin of the next device of a daisy chain of devices. This output will remain tri-stated (high-impedance OFF condition) so long as the CS pin of the device is Logic High. SO is only active when the CS pin of the device is asserted Logic Low. The generated SO output signals are CMOS logic levels. SO output data is available on the falling edge of SCLK and transitions immediately on the rising edge of SCLK. POSITIVE POWER SUPPLY (VPWR) This pin connects to the positive power supply and is the source input of operational power for the device. The VPWR pin is a backside surface mount tab of the package. HIGH-SIDE OUTPUT 0 & 1 (HSx) This pin protects 4.0 m high-side power output to the load. 34984 Analog Integrated Circuit Device Data Freescale Semiconductor 17 FUNCTIONAL DESCRIPTION FUNCTIONAL INTERNAL BLOCK DESCRIPTION FUNCTIONAL INTERNAL BLOCK DESCRIPTION POWER SUPPLY SELF-PROTECTED High-side Switch MCU INTERFACE AND OUTPUT CONTROL HS [0:1] SPI INTERFACE MCU INTERFACE PARALLEL CONTROL INPUTS POWER SUPPLY The 34984 is designed to operate from 4.0 V to 28 V on the VPWR pin. Characteristics are provided from 6.0 V to 20 V for the device. The VPWR pin supplies power to internal regulator, analog, and logic circuit blocks. The VDD supply is used for serial peripheral interface (SPI) communication in order to configure and diagnose the device. This IC architecture provides a low quiescent current sleep mode. Applying VPWR and VDD to the device will place the device in the Normal mode. The device will transit to Fail-safe mode in case of failures on the SPI (watchdog timeout). HIGH-SIDE SWITCH: HS[0:1] Those pins are the high-side outputs controlling multiple loads with high inrush current, as well as motors and all types of resistive and inductive loads. This N-channel MOSFET with 4.0 m RDS(on), is self-protected and each N-channel presents extended diagnostics in order to detect load disconnections and short-circuit fault conditions. The HS[0:1] outputs are actively clamped during a turn-off of inductive loads. MCU INTERFACE AND OUTPUT CONTROL In Normal mode, the loads are controlled directly from the MCU through the SPI. With a dedicated SPI command, it is possible to independently turn on and off several loads that are PWMed at the same frequency, and duty cycles with only one PWM signal. An analog feedback output provides a current proportional to each load current. The SPI is used to configure and to read the diagnostic status (faults) of the high-side output. The reported fault conditions are: open load, short-circuit to ground (OCLO-resistive and OCHI-severe shortcircuit), thermal shutdown, and under/overvoltage. In Fail-safe mode, the loads are controlled with dedicated parallel input pins. The device is configured in default mode. 34984 18 Analog Integrated Circuit Device Data Freescale Semiconductor FUNCTIONAL DEVICE OPERATION OPERATIONAL MODES FUNCTIONAL DEVICE OPERATION OPERATIONAL MODES The 34984 has four operating modes: Sleep, Normal, Fault, and Fail-safe. Table 6 summarizes details contained in succeeding paragraphs. Table 6. Fail-safe Operation and Transitions to Other 34984 Modes Mode FS WAK E RST WDT O Sleep x 0 0 x Device is in Sleep mode. All outputs are OFF. Normal 1 x 1 No Normal mode. Watchdog is active if enabled. 0 1 x 0 x 1 No The device is currently in Fault mode. The faulted output(s) is (are) OFF. 1 0 1 1 1 1 Yes 1 1 0 Watchdog has timed out and the device is in Fail-safe mode. The outputs are as configured with the RFS resistor connected to FSI. RST and WAKE must be transitioned to Logic [0] simultaneously to bring the device out of the Fail-safe mode or momentarily tied the FSI pin to ground. Fault Failsafe Comments x = Don’t care. SLEEP MODE The default mode of the 34984 is the Sleep mode. This is the state of the device after first applying power voltage (VPWR), prior to any I/ O transitions. This is also the state of the device when the WAKE and RST are both Logic [0]. In the Sleep mode, the output and all unused internal circuitry, such as the internal 5.0 V regulator, are off to minimize current draw. In addition, all SPI-configurable features of the device are as if set to Logic [0]. The device will transition to the Normal or Fail-safe operating modes based on the WAKE and RST inputs as defined in Table 6. NORMAL MODE The 34984 is in Normal mode when: • VPWR is within the normal voltage range. • RST pin is Logic [1]. • No fault has occurred. FAIL-SAFE AND WATCHDOG If the FSI input is not grounded, the watchdog timeout detection is active when either the WAKE or RST input pin transitions from Logic [0] to Logic [1]. The WAKE input is capable of being pulled up to VPWR with a series of limiting resistance that limits the internal clamp current according to the specification. The watchdog timeout is a multiple of an internal oscillator and is specified in Table 15. As long as the WD bit (D7) of an incoming SPI message is toggled within the minimum watchdog timeout period (WDTO), based on the programmed value of the WDR the device will operate normally. If an internal watchdog timeout occurs before the WD bit, the device will revert to a Fail-safe mode until the device is reinitialized. During the Fail-safe mode, the outputs will be ON or OFF depending upon the resistor RFS connected to the FSI pin, regardless of the state of the various direct inputs and modes (Table 7). In this mode, the SPI register content is retained except for overcurrent high and low detection levels and timing, which are reset to their default value (SOCL, SOCH, and OCLT). Then the watchdog, overvoltage, overtemperature, and overcurrent circuitry (with default value) are fully operational. Table 7. Output State During Fail-safe Mode RFS (k) High-side State 0 Fail-safe mode Disabled 6.0 Both HS0 and HS1 OFF 15 HS0 ON, HS1 OFF 30 Both HS0 and HS1 ON 34984 Analog Integrated Circuit Device Data Freescale Semiconductor 19 FUNCTIONAL DEVICE OPERATION PROTECTION AND DIAGNOSIS FEATURES The Fail-safe mode can be detected by monitoring the WDTO bit D2 of the WD register. This bit is Logic [1] when the device is in Fail-safe mode. The device can be brought out of the Fail-safe mode by transitioning the WAKE and RST pins from Logic [1] to Logic [0] or forcing the FSI pin to Logic [0]. Table 6 summarizes the various methods for resetting the device from the latched Fail-safe mode. If the FSI pin is tied to GND, the watchdog Fail-safe operation is disabled. LOSS OF VDD If the external 5.0 V supply is not within specification, or even disconnected, all register content is reset. The two outputs can still be driven by the direct inputs IN 1:IN0. The 34984 uses the supply input to power the output MOSFET related current sense circuitry and any other internal logic providing Fail-safe device operation with no VDD supplied. In this state, the watchdog, overvoltage, overtemperature, and overcurrent circuitry are fully operational with default values. FAULT MODE The 34984 indicates the following faults as they occur by driving the FS pin to Logic [0]: • Overtemperature fault • Open load fault • Overcurrent fault (high and low) • Overvoltage and undervoltage fault The FS pin will automatically return to Logic [1] when the fault condition is removed, except for overcurrent and in some cases undervoltage. Fault information is retained in the fault register and is available (and reset) via the SO pin during the first valid SPI communication (refer to Table 17). PROTECTION AND DIAGNOSIS FEATURES OVERTEMPERATURE FAULT (NON-LATCHING) The 34984 incorporates overtemperature detection and shutdown circuitry in each output structure. Overtemperature detection is enabled when an output is in the ON state. For the output, an overtemperature fault (OTF) condition results in the faulted output turning OFF until the temperature falls below the TSD(HYS). This cycle will continue indefinitely until action is taken by the MCU to shut OFF the output, or until the offending load is removed. When experiencing this fault, the OTF fault bit will be set in the status register and cleared after either a valid SPI read or a power reset of the device. OVERVOLTAGE FAULT (NON-LATCHING) The 34984 shuts down the output during an overvoltage fault (OVF) condition on the VPWR pin. The output remains in the OFF state until the overvoltage condition is removed. When experiencing this fault, the OVF fault bit is set in the bit OD1 and cleared after either a valid SPI read or a power reset of the device. The overvoltage protection and diagnostic can be disabled trough the SPI (bit OV_dis). UNDERVOLTAGE SHUTDOWN (LATCHING OR NON-LATCHING) The output(s) will latch off at some supply voltage below 6.0 V. As long as the VDD level stays within the normal specified range, the internal logic states within the device will be sustained. In the case where supply voltage drops below the undervoltage threshold (VPWRUV) output will turn off, FS will go to Logic [0], and the fault register UVF bit will be set to 1. Two cases need to be considered when the supply level recovers: • If output(s) command is (are) low, FS will go to Logic [1] but the UVF bit will remain set to 1 until the next read operation. • If the output command is ON, then FS will remain at Logic [0]. The output must be turned OFF and ON again to re-enable the state of output and release FS. The UVF bit will remain set to 1 until the next read operation. The undervoltage protection can be disabled through the SPI (bit UV_dis = 1). In this case, the FS and UVF bits do not report any undervoltage fault condition and the output state will not be changed as long as supply voltage does not drop any lower than 2.5 V. OPEN LOAD FAULT (NON-LATCHING) The 34984 incorporates open load detection circuitry on each output. Output open load fault (OLF) is detected and reported as a fault condition when that output is disabled (OFF). The open load fault is detected and latched into the status register after the internal gate voltage is pulled low enough to turn OFF the output. The OLF fault bit is set in the status register. If the open load fault is removed, the status register will be cleared after reading the register. The open load protection can be disabled trough SPI (bit OL_dis). It is recommended to disable the open load detection circuitry (OL_dis bit sets to logic [1]) in case of permanent open load fault condition. 34984 20 Analog Integrated Circuit Device Data Freescale Semiconductor FUNCTIONAL DEVICE OPERATION PROTECTION AND DIAGNOSIS FEATURES OVERCURRENT FAULT (LATCHING) The device has eight programmable overcurrent low detection levels (IOCL) and two programmable overcurrent high detection levels (IOCH) for maximum device protection. The two selectable, simultaneously active overcurrent detection levels, defined by IOCH and IOCL, are illustrated in Figure 6. The eight different overcurrent low detect levels (IOCL0 : IOCL7) are likewise illustrated in Figure 6. If the load current level ever reaches the selected overcurrent low detect level and the overcurrent condition exceeds the programmed overcurrent time period (tOCx), the device will latch the effected output OFF. If at any time the current reaches the selected IOCH level, then the device will immediately latch the fault and turn OFF the output, regardless of the selected tOCL driver. For both cases, the device output will stay off indefinitely until the device is commanded OFF and then ON again. REVERSE VOLTAGE The output survives the application of reverse voltage as low as -16 V. Under these conditions, the output’s gates are enhanced to keep the junction temperature less than 150 °C. The ON resistance of the output is fairly similar to that in the Normal mode. No additional passive components are required. If one or more of the outputs is driving a DC motor with an external freewheeling diode in parallel to the load, a direct current passes through this diode and the internal high-side switch, in cases of reverse voltage. As Figure 9 shows, it is essential to protect this power line. The proposed solution is an external N-channel low-side with its gate tied to supply voltage through a resistor. 34984 Figure 9. Reverse Voltage Protection GROUND DISCONNECT PROTECTION In the event the 34984 ground is disconnected from load ground, the device protects itself and safely turns OFF the output regardless the state of the output at the time of disconnection. A 10 k resistor needs to be added between the wake pin and the rest of the circuitry in order to ensure that the device turns off in case of ground disconnect, and to prevent this pin from exceeding its maximum ratings Table 8. Device Behavior in Case of Undervoltage High-side Switch (VPWR Voltage) UV Enable IN = 0 (Falling VPWR) UV Enable IN = 0 (Rising VPWR) UV Enable IN = 1 (Falling VPWR) UV Enable IN = 1 (Rising VPWR) UV Disable IN = 0 (Falling or Rising VPWR) UV Disable IN = 1 (Falling or Rising VPWR) OFF OFF ON OFF OFF ON FS State 1 1 1 0 1 1 SPI Fault Register UVF Bit 0 1 until next read 0 1 0 0 OFF OFF OFF OFF OFF ON FS State 0 0 0 0 1 1 SPI Fault Register UVF Bit 1 1 1 1 0 0 State Output State VPWR > VPWRUV Output State VPWRUV > VPWR > UVPOR 34984 Analog Integrated Circuit Device Data Freescale Semiconductor 21 FUNCTIONAL DEVICE OPERATION LOGIC COMMANDS AND REGISTERS Table 8. Device Behavior in Case of Undervoltage High-side Switch (VPWR Voltage) State UV Enable IN = 0 (Falling VPWR) UV Enable IN = 0 (Rising VPWR) UV Enable IN = 1 (Falling VPWR) UV Enable IN = 1 (Rising VPWR) UV Disable IN = 0 (Falling or Rising VPWR) UV Disable IN = 1 (Falling or Rising VPWR) OFF OFF OFF OFF OFF ON 1 1 1 1 1 1 1 1 until next read 1 until next read 0 0 OFF OFF OFF OFF OFF OFF 1 1 1 1 1 1 1 until next read 1 until next read 1 until next read 0 0 Output State UVPOR > VPWR > 2.5 V FS State SPI Fault 1 until next read Register UVF Bit Output State 2.5 V > VPWR > 0V FS State SPI Fault 1 until next read Register UVF Bit Comments UV fault is not latched UV fault is not latched UV fault is latched Typical value; not guaranteed While VDD remains within specified range. = IN is equivalent to IN direct input or IN_spi SPI input. LOGIC COMMANDS AND REGISTERS SPI PROTOCOL DESCRIPTION The SPI interface has a full duplex, three-wire synchronous data transfer with four I/O lines associated with it: Serial Clock (SCLK), Serial Input (SI), Serial Output (SO), and Chip Select (CS). The SI / SO pins of the 34984 follow a first-in first-out (D7/ D0) protocol with both input and output words transferring the most significant bit (MSB) first. All inputs are compatible with 5.0 V CMOS logic levels. The SPI lines perform the following functions: SERIAL CLOCK (SCLK) Serial clocks (SCLK) the internal shift registers of the 34984 device. The serial input (SI) pin accepts data into the input shift register on the falling edge of the SCLK signal while the serial output (SO) pin shifts data information out of the SO line driver on the rising edge of the SCLK signal. It is important that the SCLK pin be in a logic low state whenever CS makes any transition. For this reason, it is recommended that the SCLK pin be in a Logic [0] state whenever the device is not accessed (CS Logic [1] state). SCLK has an active internal pull-down, IDWN. When CS is Logic [1], signals at the SCLK and SI pins are ignored and SO is tri-stated (high-impedance). See Figure 10 and Figure 11. SERIAL INPUT (SI) This is a serial interface (SI) command data input pin. SI instruction is read on the falling edge of SCLK. An 8-bit stream of serial data is required on the SI pin, starting with D7 to D0. The internal registers of the 34984 are configured and controlled using a 4-bit addressing scheme, as shown in Table 9. Register addressing and configuration are described in Table 10. The SI input has an active internal pulldown, IDWN. SERIAL OUTPUT (SO) The SO data pin is a tri-stateable output from the shift register. The SO pin remains in a high-impedance state until the CS pin is put into a Logic [0] state. The SO data is capable of reporting the status of the output, the device configuration, and the state of the key inputs. The SO pin changes states on the rising edge of SCLK and reads out on the falling edge of SCLK. Fault and Input Status descriptions are provided in Table 6. CHIP SELECT (CS) The CS pin enables communication with the master microcontroller (MCU). When this pin is in a Logic [0] state, the device is capable of transferring information to, and receiving information from, the MCU. The 34984 device latches in data from the Input shift registers to the addressed registers on the rising edge of CS. The device transfers status information from the power output to the shift register on the falling edge of CS. The SO output driver is enabled when CS is Logic [0]. CS should transition from a Logic [1] to a Logic [0] state only when SCLK is a Logic [0]. CS has an active internal pull-up, IUP. 34984 22 Analog Integrated Circuit Device Data Freescale Semiconductor FUNCTIONAL DEVICE OPERATION LOGIC COMMANDS AND REGISTERS CSB CS SCLK SI SO SO NOTES: 1. D7 OD7 D6 OD6 D5 D4 OD5 D3 OD4 D2 OD3 D1 OD2 OD1 D0 OD0 RSTB RST is in a logic 1 state during the above operation. Logic [1] relate state to during therecent above operation. Notes 2. 1. D0,RST D1, is D2,a ..., and D7 the most ordered entry of data into the SPSS D7:D0 to and the OD7 mostrelate recent ordered entry of datafault intoand thestatus device. 3. 2. OD0, OD1,relate OD2, ..., to the first 8 bits of ordered data out of OD7:OD0 the device. relate to the first 8 bits of ordered fault and status data out of the device. 3. Figure 10. Single 8-Bit Word SPI Communication C S B CS SSCLK C L K SI S I SSO O D 7 O D 7 D 6 O D 6 D 5 O D 5 D 2 O D 2 D 1 O D 1 D 0 O D 0 D 7 * D 7 D 6 * D 6 D 5 * D 5 D 2 * D 2 D 1 * D 1 D 0 * D 0 . ST T B i s i n a l o g i c 1 s t a t e d u r i n g t h e a b o v e o p e r a t i o n . RRSis Notes 1.12 RST a Logic [1] state during the above operation. . D 0 , D 1 , D 2 , ..., a n d D 7 r e la te to th e m o s t r e c e n t o r d e r e d e n tr y o f d a t a in to th e S P S S . O D 0 , O D 1 , O D 2 , . . ., a n d O D 7 r e la t e t o t h e f ir s t 8 b its o f o r d e r e d f a u lt a n d s t a t u s d a t a o u t o f t h e d e v ic e . 2.34 D7:D0 relate to the most recent ordered entry of data into the device. . O D 0 , O D 1 , O D 2 , ..., a n d O D 7 r e p r e s e n t th e fir s t 8 b its o f o r d e r e d fa u lt a n d s ta tu s d a ta o u t o f t h e S P S S 3. D7*:D0* relate to the previous 8 bits (last command word) of data that was previously shifted into the device. 4. OD7:OD0 relate to the Ffirst 8 bits of ordered fault and status data out of the device. IG U R E 4 b . M U L T IP L E 8 b it W O R D S P I C O M M U N IC A T IO N N O T E S : Figure 11. Multiple 8-Bit Word SPI Communication SERIAL INPUT COMMUNICATION SPI communication is accomplished using 8-bit messages. A message is transmitted by the MCU starting with the MSB, D7, and ending with the LSB, D0 (Table 9). Each incoming command message on the SI pin can be interpreted using the following bit assignments: the MSB (D7) is the watchdog bit and in some cases a register address bit common to both outputs or specific to an output; the next three bits, D6 : D4, are used to select the command register; and the remaining four bits, D3 : D0, are used to configure and control the outputs and their protection features. Multiple messages can be transmitted in succession to accommodate those applications where daisy chaining is desirable, or to confirm transmitted data, as long as the messages are all multiples of eight bits. Any attempt made to latch in a message that is not eight bits will be ignored. The 34984 has defined registers, which are used to configure the device and to control the state of the output. Table 10, summarizes the SI registers. The registers are addressed via D6 : D4 of the incoming SPI word (Table 9). 34984 Analog Integrated Circuit Device Data Freescale Semiconductor 23 FUNCTIONAL DEVICE OPERATION LOGIC COMMANDS AND REGISTERS Table 9. SI Message Bit Assignment Bit Sig SI Msg Bit Message Bit Description MSB D7 Register address bit for output selection. Also used for watchdog: toggled to satisfy watchdog requirements. LSB D6 : D4 Register address bits. D3 : D1 Used to configure the inputs, outputs, and the device protection features and SO status content. D0 Used to configure the inputs, outputs, and the device protection features and SO status content. Table 10. Serial Input Address and Configuration Bit Map SI Register Serial Input Data D7 D6 D5 D4 D3 D2 D1 D0 STATR s 0 0 0 0 SOA2 SOA1 SOA0 OCR x 0 0 1 CSNS1 EN IN1_SPI CSNS0 EN IN0_SPI SOCHLR s 0 1 0 SOCHs SOCL2s SOCL1s SOCL0s CDTOLR s 0 1 1 OL_DIS s CD_DIS s OCLT1s OCLT0 s DICR s 1 0 0 IN DIS s A/Os OSDR 0 1 0 1 0 OSD2 OSD1 OSD0 WDR 1 1 0 1 0 0 WD1 WD0 NAR 0 1 1 0 0 0 0 0 UOVR 1 1 1 0 0 0 UV_dis OV_dis TEST x 1 1 1 FAST SR s CSNS high s Freescale Internal Use (Test) x = Don’t care. s (SOA3 bit) = Selection of output: Logic [0] = HS0, Logic [1] = HS1. DEVICE REGISTER ADDRESSING The following section describes the possible register addresses and their impact on device operation. Address x000 — Status Register (STATR) The STATR register is used to read the device status and the various configuration register contents without disrupting the device operation or the register contents. The register bits D2:D0, determine the content of the first eight bits of SO data. When register content is specific to one of the two outputs, bit D7 is used to select the desired output (SOA3). In addition to the device status, this feature provides the ability to read the content of the OCR, SOCHLR, CDTOLR, DICR, OSDR, WDR, NAR, and UOVR registers. (Refer to the section entitled Serial Output Communication (Device Status Return Data).) Address x001 — Output Control Register (OCR) The OCR register allows the MCU to control the outputs through the SPI. Incoming message bit D0 reflects the desired states of the highside output HS0 (IN0_SPI): a Logic [1] enables the output switch and a Logic [0] turns it OFF. A Logic [1] on message bit D1 enables the Current Sense (CSNS) pin. Similarly, incoming message bit D2 reflects the desired states of the high-side output HS1 (IN1_SPI): Logic [1] enables the output switch and a Logic [0] turns it OFF. A Logic [1] on message bit D3 enables the CSNS pin. In the event that the current sense is enabled for both outputs, the current will be summed. Bit D7 is used to feed the watchdog if enabled. Address x010— Select Overcurrent High and Low Register (SOCHLR) The SOCHLR register allows the MCU to configure the output overcurrent low and high detection levels, respectively. Each output is independently selected for configuration based on the state of the D7 bit; a write to this register when D7 is Logic [0] will configure the current detection levels for the HS0. Similarly, if D7 is Logic [1] when this register is written, HS1 is configured. Each output can be configured to different levels. In addition to protecting the device, this slow blow fuse emulation feature can be used to optimize the load requirements matching system characteristics. Bits D2 : D0 set the overcurrent low detection level to one of eight possible levels, as shown in Table 11. Bit D3 sets the overcurrent high detection level to one of two levels, which is described inTable 12. 34984 24 Analog Integrated Circuit Device Data Freescale Semiconductor FUNCTIONAL DEVICE OPERATION LOGIC COMMANDS AND REGISTERS Table 11. Overcurrent Low Detection Levels SOCL2 (D2) SOCL1 (D1) SOCL0 (D0) Overcurrent Low Detection (Amperes) 0 0 0 25 0 0 1 22.5 0 1 0 20 0 1 1 17.5 1 0 0 15 1 0 1 12.5 1 1 0 10 1 1 1 7.5 Table 12. Overcurrent High Detection Levels SOCH (D3) Overcurrent High Detection (Amperes) 0 100 1 75 Address x011 — Current Detection Time and Open Load Register (CDTOLR) The CDTOLR register is used by the MCU to determine the amount of time the device will allow an overcurrent low condition before output latches OFF occurs. Each output is independently selected for configuration based on the state of the D7 bit. A write to this register when bit 7 is Logic [0] will configure the timeout for the HS0. Similarly, if D7 is Logic [1] when this register is written, then HS1 is configured. Bits D1: D0 allow the MCU to select one of four fault blanking times defined in Table 13. Note that these timeouts apply only to the overcurrent low detection levels. If the selected overcurrent high level is reached, the device will latch off within 20 s. Table 13. Overcurrent Low Detection Blanking Time OCLT [1:0] Timing 00 155 ms 01 10 ms 10 1.2 ms 11 150 s A Logic [1] on bit D2 disables the overcurrent low (CD_dis) detection timeout feature. A Logic [1] on bit D3 disables the open load (OL) detection feature. Address x100 — Direct Input Control Register (DICR) The DICR register is used by the MCU to enable, disable, or configure the direct IN pin control of each output. Each output is independently selected for configuration based on the state of bit D7. A write to this register when bit D7 is Logic [0] will configure the direct input control for the HS0. Similarly, if D7 is Logic [1] when this register is written, then HS1 is configured. A Logic [0] on bit D1 will enable the output for direct control by the IN pin. A Logic [1] on bit D1 will disable the output from direct control. While addressing this register, if the input was enabled for direct control, a Logic [1] for the D0 bit will result in a Boolean AND of the IN pin with its corresponding D0 message bit when addressing the OCR register. Similarly, a Logic [0] on the D0 pin results in a Boolean OR of the IN pin with the corresponding message bits when addressing the OCR register. The DICR register is useful if there is a need to independently turn on and off several loads that are PWM’d at the same frequency and duty cycle with only one PWM signal. This type of operation can be accomplished by connecting the pertinent direct IN pins of several devices to a PWM output port from the MCU and configuring each of the outputs to be controlled via their respective direct IN pin. The DICR is then used to Boolean AND the direct IN(s) of each of the outputs with the dedicated SPI bit that also controls the output. Each configured SPI bit can now be used to enable and disable the common PWM signal from controlling its assigned output. A Logic [1] on bit D2 is used to select the high ratio (CSR1, 1/41000) on the CSNS pin for the selected output. The default value [0] is used to select the low ratio (CSR0, 1/20500). A Logic [1] on bit D3 is used to select the high speed slew rate for the selected output. The default value [0] corresponds to the low speed slew rate. 34984 Analog Integrated Circuit Device Data Freescale Semiconductor 25 FUNCTIONAL DEVICE OPERATION LOGIC COMMANDS AND REGISTERS Address 0101 — Output Switching Delay Register (OSDR) The OSDR register configures the device with a programmable time delay that is active during Output ON transitions initiated via the SPI (not via direct input). A write to this register configures both outputs for different delay. Whenever the input is commanded to transition from Logic [0] to Logic [1], both outputs will be held OFF for the time delay configured in the OSDR. The programming of the contents of this register have no effect on device Fail-safe mode operation. The default value of the OSDR register is 000, equating to no delay. This feature allows the user a way to minimize inrush currents, or surges, thereby allowing loads to be switched ON with a single command. There are eight selectable output switching delay times that range from 0 ms to 525 ms. Refer to Table 14. Table 14. Switching Delay OSD [2:0] (D2 : D0) Turn ON Delay (ms) HS0 Turn ON Delay (ms) HS1 000 0 0 001 0 75 010 150 150 011 150 225 100 300 300 101 300 375 110 450 450 111 450 525 Address 1101 — Watchdog Register (WDR) The WDR register is used by the MCU to configure the watchdog timeout. Watchdog timeout is configured using bits D1:D0. When D1:D0 bits are programmed for the desired watchdog timeout period, the WD bit (D7) should be toggled as well, ensuring the new timeout period is programmed at the beginning of a new count sequence. Refer to Table 15. Table 15. Watchdog Timeout WD [1:0] (D1: D0) Timing (ms) 00 620 01 310 10 2500 11 1250 Address 0110 — No Action Register (NAR) The NAR register can be used to no-operation fill SPI data packets in a daisy chain SPI configuration. This allows devices to not be affected by commands being clocked over a daisy-chained SPI configuration, and by toggling the WD bit (D7), the watchdog circuitry will continue to be reset while no programming or data readback functions are being requested from the device. Address 1110 — Undervoltage/Overvoltage Register (UOVR) The UOVR register can be used to disable or enable overvoltage and/or undervoltage protection. By default (Logic [0]), both protections are active. When disabled, an undervoltage or overvoltage condition fault will not be reported in the output fault register. Address x111 — TEST The TEST register is reserved for test and is not accessible with SPI during normal operation. SERIAL OUTPUT COMMUNICATION (DEVICE STATUS RETURN DATA) When the CS pin is pulled low, the output status register is loaded. Meanwhile, the data is clocked out MSB- (OD7-) first as the new message data is clocked into the SI pin. The first eight bits of data clocking out of the SO, and following a CS transition, are dependant upon the previously written SPI word. Any bits clocked out of the SO pin after the first eight will be representative of the initial message bits clocked into the SI pin since the CS pin first transitioned to a Logic [0]. This feature is useful for daisy chaining devices as well as message verification. A valid message length is determined following a CS transition of Logic [0] to Logic [1]. If there is a valid message length, the data is latched into the appropriate registers. A valid message length is a multiple of eight bits. At this time, the SO pin is tri-stated and the fault status register is now able to accept new fault status information. 34984 26 Analog Integrated Circuit Device Data Freescale Semiconductor FUNCTIONAL DEVICE OPERATION LOGIC COMMANDS AND REGISTERS The output status register correctly reflects the status of the STATR-selected register data at the time that the CS is pulled to a Logic [0] during SPI communication and / or for the period of time since the last valid SPI communication, with the following exceptions: • The previous SPI communication was determined to be invalid. In this case, the status will be reported as though the invalid SPI communication never occurred. • Supply transients below 6.0 V resulting in an undervoltage shutdown of the outputs may result in incorrect data loaded into the status register. The SO data transmitted to the MCU during the first SPI communication following an undervoltage VPWR condition should be ignored. • The RST pin transition from a Logic [0] to Logic [1] while the WAKE pin is at Logic [0] may result in incorrect data loaded into the status register. The SO data transmitted to the MCU during the first SPI communication following this condition should be ignored. SERIAL OUTPUT BIT ASSIGNMENT The 8 bits of serial output data depend on the previous serial input message, as explained in the following paragraphs. Table 16 summarizes the SO register content. Bit OD7 reflects the state of the watchdog bit (D7) addressed during the prior communication. The value of the previous D7 will determine which output the status information applies to for the Fault (FLTR), SOCHLR, CDTOLR, and DICR registers. SO data will represent information ranging from fault status to register contents, user selected by writing to the STATR bits D2:D0. Note that the SO data will continue to reflect the information for each output (depending on the previous D7 state) that was selected during the most recent STATR write until changed with an updated STATR write. Previous Address SOA[2:0] = 000 If the previous three MSBs are 000, bits OD6 : OD0 will reflect the current state of the Fault register (FLTR) corresponding to the output previously selected with the bit OD7 (Table 17). Previous Address SOA[2:0] = 001 Data in bits OD1:OD0 contain CSNS0 EN and IN0_SPI programmed bits, respectively. Data in bits OD3:OD2 contain CSNS0 EN and IN0_SPI programmed bits, respectively. Previous Address SOA[2:0] = 010 The data in bit OD3 contain the programmed overcurrent high detection level (refer to Table 12), and the data in bits OD2:OD0 contain the programmed overcurrent low detection levels (refer to Table 13). Table 16. Serial Output Bit Map Description Previous STATR D7, D2, D1, D0 Serial Output Returned Data SOA3 SOA2 SOA1 SOA0 OD7 OD6 OD5 OD4 OD3 OD2 OD1 OD0 s 0 0 0 s OTFs OCHFs OCLFs OLFs UVF OVF FAULT x 0 0 1 x 0 0 1 CSNS1 EN IN1_SPI CSNS0 EN IN0_SPI s 0 1 0 s 0 1 0 SOCHs SOCL2s SOCL1s SOCL0s s 0 1 1 s 0 1 1 OL_DIS s CD_DIS s OCLT1s OCLT0s s 1 0 0 s 1 0 0 FAST SR s CSNS high s IN DIS s A/O s 0 1 0 1 0 1 0 1 FSM_HS0 OSD2 OSD1 OSD0 1 1 0 1 1 1 0 1 FSM_HS1 WDTO WD1 WD0 0 1 1 0 0 1 1 0 IN1 Pin IN0 Pin FSI Pin WAKE Pin 1 1 1 0 1 1 1 0 – – UV_dis OV_dis x 1 1 1 – – – – See Table 2 – – – s = Selection of output: Logic [0] = HS0, Logic [1] = HS1. x = Don’t care. 34984 Analog Integrated Circuit Device Data Freescale Semiconductor 27 FUNCTIONAL DEVICE OPERATION LOGIC COMMANDS AND REGISTERS Table 17. Fault Register OD7 OD6 OD5 OD4 OD3 OD2 OD1 OD0 s OTF OCHFs OCLFs OLFs UVF OVF FAULT OD7 (s) = Selection of output: Logic [0] = HS0, Logic [1] = HS1. OD6 (OTF) = Overtemperature Flag. OD5 (OCHFs) = Overcurrent High Flag. (This fault is latched.) OD4 (OCLFs) = Overcurrent Low Flag. (This fault is latched.) OD3 (OLFs) = Open load Flag. OD2 (UVF) = Undervoltage Flag. (This fault is latched or not latched.) OD1 (OVF) = Overvoltage Flag. OD0 (FAULT) = This flag reports a fault and is reset by a read operation. FAULT report of any fault on HS0 or HS1 Note The FS pin reports a fault. For latched faults, this pin is reset by a new Switch ON command (via SPI or direct input IN). Previous Address SOA[2:0] = 011 Data returned in bits OD1 and OD0 are current values for the overcurrent fault blanking time, illustrated in Table 13. Bit OD2 reports if the overcurrent detection timeout feature is active. OD3 reports if the open load circuitry is active. Previous Address SOA[2:0] =100 The returned data contain the programmed values in the DICR. Previous Address SOA[2:0] = 101 • SOA3 = 0. The returned data contain the programmed values in the OSDR. Bit OD3 (FSM_HS0) reflects the state of the output HS0 in the Fail-safe mode after a watchdog timeout occurs. • SOA3 = 1. The returned data contain the programmed values in the WDR. Bit OD2 (WDTO) reflects the status of the watchdog circuitry. If WDTO bit is Logic [1], the watchdog has timed out and the device is in Fail-safe mode. If WDTO is Logic [0], the device is in Normal mode (assuming the device is powered and not in Sleep mode), with the watchdog either enabled or disabled. Bit OD3 (FSM_HS1) reflects the state of the output HS1 in the Fail-safe mode after a watchdog timeout occurs. Previous Address SOA[2:0] = 110 • SOA3 = 0. OD3:OD0 return the state of the IN1, IN0, FSI, and WAKE pins, respectively (Table 18). Table 18. Pin Register OD3 OD2 OD1 OD0 IN1 Pin IN0 Pin FSI Pin WAKE Pin • SOA3 = 1. The returned data contain the programmed values in the UOVR. Bit OD1 reflects the state of the undervoltage protection and bit OD0 reflects the state of the overvoltage protection. Refer to Table 16). Previous Address SOA[2:0] =111 Null Data. No previous register Read Back command received, so bits OD2:OD0 are null, or 000. 34984 28 Analog Integrated Circuit Device Data Freescale Semiconductor TYPICAL APPLICATIONS TYPICAL APPLICATIONS VPWR VDD Voltage Regulator VDD VDD NC VPWR 2.2 k VDD VPWR 10 k MCU 10 100 nF 10 µF 2 I/O I/O SCLK CS I/O SI SO I/O A/D 10 k 4 10 k 12 10 k 10 k 8 10 k 7 3 11 10 k 9 5 1 6 1k VDD WAKE IN0 IN1 SCLK CS RST SO SI FS CSNS FSI VPWR 14 HS1 15 2.5 µF 10 nF 34984 HS0 16 LOAD GND LOAD 13 RFSI Figure 12. Typical Applications The loads must be chosen in order to guarantee the device normal operating conditions for junction temperatures from -40 °C to 150 °C. In case of permanent short-circuit conditions, the duration and number of activation cycles must be limited with a dedicated MCU fault management, using the fault reporting through the SPI. When driving DC motor or solenoid loads demanding multiple switching, an external recirculation device must be used to maintain the device in its safe operating area. In this case, an additional protection will be necessary to sustain reverse supply (Figure 9). Two application notes are available: • AN3274, which proposes safe configurations of the eXtreme switch devices in case of application faults, and to protect all circuitry with minimum external components. • AN2469, which provides guidelines for printed circuit board (PCB) design and assembly. Development effort will be required by the end users to optimize the board design and PCB layout, in order to reach electromagnetic compatibility standards (emission and immunity). OUTPUT CURRENT MONITORING This section relates to the output current monitoring for 34984, dual 4.0 m high-side switch. This device is a self-protected silicon switch used to replace electromechanical relays, fuses, and discrete circuits in power management applications. The MC34984 features a current recopy which is proportional to the load current. It can be configured between 2 ratios via the SPI (CSR0 and CSR1). This section presents the current recopy tolerance of the device and the improvement of this feature with the calibration practice. CURRENT RECOPY TOLERANCE The current sense ratio accuracies described in Current Sense Ratio (CSR0) Accuracy (CSR0_ACC and CSR1_ACC) take into account: • part to part deviation due to manufacturing, • ambient temperature derating (from -40 °C to 125 °C), • battery voltage range (from 9 V to 16 V). With statistical data analysis performed on 3 production lots (initial testing only), the effect of each contributor has been demonstrated. 34984 Analog Integrated Circuit Device Data Freescale Semiconductor 29 TYPICAL APPLICATIONS OUTPUT CURRENT MONITORING Figure 13 shows the CSR0 tolerance in function to 3 previous listed contributors in comparison to the minimum and maximum specified values. Current Recopy at Vbat=9V/16V from -40°C to 125°C 24000 Spec_max CSNS ratio (CSR0) 23000 Max(Data_9V) at 6 sigmas 22000 Max(Data_16V) at 6 sigmas 10% 21000 Average (Data) 20000 Min(Data_16V) at 6 sigmas 19000 Min(Data_9V) at 6 sigmas 18000 Spec_min 17000 16000 10 15 20 Output current (A) 25 Figure 13. CSR0 Ratio Deviation in Function All Contributors Lower VPWR Voltage causes more error. 9.0 V corresponding to the worst case. Figure 14 shows the CSR0 tolerance without battery variation effect. Current Recopy at Vbat=9V from -40°C to 125°C 24000 CSNS ratio (CSR0) 23000 22000 21000 20000 19000 18000 17000 16000 10 15 20 Output current (A) 25 Figure 14. CSR0 Ratio Deviation in Function Manufacturing and Temperature The main contributor is the manufacturing deviation, as described in Figure 15. At 15 A of output current, the tolerance will be about 8.5% versus 10% when all contributors are considered. 34984 30 Analog Integrated Circuit Device Data Freescale Semiconductor TYPICAL APPLICATIONS OUTPUT CURRENT MONITORING Current Recopy at Vbat=9V at 25°C 24000 Spec_max 23000 CSNS ratio (CSR0) Max(Data) at 6 sigmas 22000 8.5% 21000 Average (Data) 20000 19000 Min(Data) at 6 sigmas 18000 Spec_min 17000 16000 10 15 20 25 Output current (A) Figure 15. CSR0 Ratio Deviation in Function Manufacturing PART CALIBRATION With a calibration strategy, the part to part contribution can be removed. An experiment was done on low output current values (below 5.0 A). The relative CSR0 deviation based on only one calibration point per output (5.0 A, VPWR = 16 V at 25 °C) has been performed on three production lots. Those parts have tested at initial and after high temperature operating life, to take into account the ageing of devices. Table 19 summaries test results covering 99.74% of parts. Table 19. CSR0 Precision for Several Output Current Values with One Calibration Point at 5.0 A CSR0 ratio Min Max 0.5 A -25% 25% 1.0 A -12% 12% 2.5 A -8.0% 8.0% 5.0 A -5.0% 5.0% 34984 Analog Integrated Circuit Device Data Freescale Semiconductor 31 PACKAGING SOLDERING INFORMATION PACKAGING SOLDERING INFORMATION SOLDERING INFORMATION The 34984 is packaged in a surface mount power package (PQFN), intended to be soldered directly on the printed circuit board. The AN2467 provides guidelines for Printed Circuit Board design and assembly. PACKAGE DIMENSIONS For the most current revision of the package, visit www.freescale.com and perform a keyword search on 98ARL10521D. Dimensions shown are provided for reference ONLY. 34984 32 Analog Integrated Circuit Device Data Freescale Semiconductor PACKAGING PACKAGE DIMENSIONS 34984 Analog Integrated Circuit Device Data Freescale Semiconductor 33 PACKAGING PACKAGE DIMENSIONS 34984 34 Analog Integrated Circuit Device Data Freescale Semiconductor REVISION HISTORY REVISION HISTORY REVISION 1.0 DATE 9/2014 DESCRIPTION OF CHANGES • Initial release 34984 Analog Integrated Circuit Device Data Freescale Semiconductor 35 How to Reach Us: Information in this document is provided solely to enable system and software implementers to use Freescale products. Home Page: freescale.com There are no express or implied copyright licenses granted hereunder to design or fabricate any integrated circuits based Web Support: freescale.com/support Freescale reserves the right to make changes without further notice to any products herein. Freescale makes no on the information in this document. warranty, representation, or guarantee regarding the suitability of its products for any particular purpose, nor does Freescale assume any liability arising out of the application or use of any product or circuit, and specifically disclaims any and all liability, including without limitation consequential or incidental damages. “Typical” parameters that may be provided in Freescale data sheets and/or specifications can and do vary in different applications, and actual performance may vary over time. All operating parameters, including “typicals,” must be validated for each customer application by customer’s technical experts. Freescale does not convey any license under its patent rights nor the rights of others. Freescale sells products pursuant to standard terms and conditions of sale, which can be found at the following address: freescale.com/SalesTermsandConditions. Freescale and the Freescale logo are trademarks of Freescale Semiconductor, Inc., Reg. U.S. Pat. & Tm. Off. SMARTMOS is a trademark of Freescale Semiconductor, Inc. All other product or service names are the property of their respective owners. © 2014 Freescale Semiconductor, Inc. Document Number: MC34984 Rev. 1.0 9/2014