View detail for AT27C080 Reliability Qualification Report

PAGE 1 OF 8
ATMEL CORPORATION
Tel:(408)441-0311
Fax:(408)436-4200
AT-27C080 EPROM RELIABILITY DATA
- 125°C OPERATING LIFE TEST
- 200°C RETENTION BAKE
- 125°C OPERATING LIFE TEST (PLASTIC)
- 150°C RETENTION BAKE (PLASTIC)
- 15 PSIG PRESSURE POT
* This report was generated from AT-27C080 reliability testing.
This data is applicable to the following device types due to same
technology grouping as defined in MIL-M-38535 Appendix A:
AT-27C040
AT-27C4096
JANUARY 2005
2325 Orchard Parkway San Jose CA. 95131
PAGE 2 OF 8
AT-27C080
125°C DYNAMIC OPERATING LIFE TEST
LOT
NUMBER
DATE
CODE
SAMPLE
SIZE
TOTAL
CKT-HRS(K)
NUMBER
OF FAILURES
A3B0575-2
3B9336
79
79.0
0
A3B0575-1
3B9337
77
77.0
0
4C0157
4C9437
60
60.0
0
FAILURE RATE
TOTAL DEVICE HOURS
BEST ESTIMATE
216,000 DEVICE HOURS
λ
50°C AMBIENT
λ
CONFIDENCE ESTIMATE
λ
λ
= 0.33% PER 1000 HOURS
EXTRAPOLATION TO 50°C VIA
ARRHENNIUS EQUATION AND
ACTIVATION ENERGY OF O.5eV
= 0.01% PER 1,000 HOURS (105
FITS)
60 = 0.014% PER 1000 HOURS
60% CONFIDENCE (138 FITS)
90 = 0.04% PER 1000 HOURS
90% CONFIDENCE (370 FITS)
PAGE 3 OF 8
AT-27C080
200°C DATA RETENTION BAKE
LOT
NUMBER
DATE
CODE
SAMPLE
SIZE
TOTAL
CKT-HRS(K)
NUMBER
OF FAILURES
A3B0575
3B9337
76
76.0
0
4C0157
4C9437
33
33.0
0
FAILURE RATE
TOTAL DEVICE HOURS
BEST ESTIMATE
76,000 DEVICE HOURS
λ
50°C AMBIENT
λ
CONFIDENCE ESTIMATE
λ
λ
= 0.9% PER 1,000 HOURS
EXTRAPOLATION TO 50°C VIA
ARRHENNIUS EQUATION AND
ACTIVATION ENERGY OF 0.5eV
= 0.003% PER 1,000 HOURS (31
FITS)
60 = 0.004% PER 1,000 HOURS
60% CONFIDENCE (41 FITS)
90 = 0.01% PER 1,000 HOURS
90% CONFIDENCE (102 FITS)
PAGE 4 OF 8
AT-27C080
PLASTIC PACKAGE
125°C DYNAMIC OPERATING LIFE TEST
LOT
NUMBER
NUMBER
FAILURES
DATE
CODE
SAMPLE
PKG
TOTAL
SIZE
CKT-HRS(K)
OF
3B1126
3B9342
40 TSOP
77
77.0
0
3C0893
3C9352
32 SOIC
79
79.0
0
3D04424
3D9404
40 TSOP
80
80.0
0
4C0157
4C9437
32 PDIP
80
80.0
0
6D9728
32 TSOP
299
299.0
0
6D3922
9E1049
9E9928
32 PLCC
250
250.0
0
9G1260-2
9G9933
32 SOIC
100
100.0
0
2G0467
2G0230
32 TSOP
250
250.0
0
FAILURE RATE
TOTAL DEVICE HOURS
BEST ESTIMATE
1,215,000 DEVICE HOURS
λ
50°C AMBIENT
λ
CONFIDENCE ESTIMATE
λ
λ
= 0.06% PER 1,000 HOURS
EXTRAPOLATION TO 50°C VIA
ARRHENNIUS EQUATION AND
ACTIVATION ENERGY OF 0.5eV
= 0.002% PER 1,000 HOURS (19
FITS)
60 = 0.003% PER 1,000 HOURS
60% CONFIDENCE (26 FITS)
90 = 0.006% PER 1,000 HOURS
90% CONFIDENCE (64 FITS)
PAGE 5 OF 8
AT-27C080
PLASTIC PACKAGE
150°C RETENTION BAKE
LOT
NUMBER
FAILURES
3B1126
3C0893
W311032
3D0442-1
3D0442-2
3D1492-2
4C0157-2
6D3922
8J3881
9G1260-2
9E1049
0C3857
2G0467
4G5537
DATE
CODE
3B9342
3C9352
3D9404
3D9404
3D9405
3D9411
4C9438
6D9728
8J9909
9G9933
9E9928
0C0052
2G0230
4G0432
PKG
40 TSOP
32 SOIC
40 TSOP
40 TSOP
40 TSOP
40 TSOP
32 TSOP
32 TSOP
32 PDIP
32 SOIC
32 PLCC
32 PDIP
32 TSOP
32 PLCC
SAMPLE
SIZE
TOTAL
CKT-HRS(K)
77
78
77
100
99
80
77
214
250
100
250
250
498
500
77.0
78.0
77.0
100.0
99.0
80.0
77.0
214.0
250.0
100.0
250.0
250.0
498.0
500.0
NUMBER
OF
0
0
0
0
0
0
0
0
0
0
0
0
0
0
FAILURE RATE
TOTAL DEVICE HOURS
BEST ESTIMATE
2,650,000 DEVICE HOURS
λ
50°C AMBIENT
λ
CONFIDENCE ESTIMATE
λ
λ
=0.03% PER 1000 HOURS
EXTRAPOLATION TO 50°C VIA
ARRHENNIUS EQUATION AND
ACTIVATION ENERGY OF 0.5eV
= 0.0005% PER 1,000 HOURS (5
FITS)
60 = 0.0006% PER 1,000 HOURS
60% CONFIDENCE (6 FITS)
90 = 0.001% PER 1,000 HOURS
90% CONFIDENCE (13 FITS)
PAGE 6 OF 8
AT-27C080
PLASTIC PACKAGE
PRESSURE POT TEST
DATE CODE
PACKAGE TYPE
SAMPLE SIZE
NUMBER OF FAILURE
AT INDICATED HOURS
(24)
(48) (72)
(96)
3D9404
40 TSOP
45
0
0
0
0
4C9438
32 TSOP
450
0
0
0
0
6D9728
32 TSOP
200
0
0
0
0
8E9837
40 TSOP
50
0
0
0
0
8B9843
40 PDIP
100
0
0
0
0
8J9909
32 PDIP
100
0
0
0
0
9E9929
32 SOIC
100
0
0
0
0
9G9933
32 SOIC
50
0
0
0
0
PAGE 7 OF 8
Date:
May 5, 1994
Subject:
AT27C080(18712A Latchup Data)
From:
T. Pearce
To:
Copy:
G. Korsh, E. Hui, C. Lionbarger
M. Wong, H. Nguyen, LY. Lee
Three packaged units of the AT27C080 (18712A Stepping) from lot
4C0157 were tested for latchup. A curve tracer was used to force
current into each pin and observe the latchup trigger current and
voltage. A 9 ohm resistor was connected in parallel across the Vcc
power supply to allow current to be forced out of the Vcc pin
during testing. A separate ammeter was connected in series with
the Vcc power supply to verify when latchup occurred.
The results are show in page 2 an indicate that the new AT27C080
(18712A) is quite immune to latchup under normal operating
conditions (Vcc=4.5v to 5.5v room temperature). Inputs can sustain
-2.8 with respect to ground and no latchup is observed. No latchup
is observed for possitive input voltages up to 18v where
destructive junction breakdown occurs. Outputs can sustain 13.4v
and -2.7v with respect to ground and no latchup is observed.
PAGE 8 OF 8
AT27C080 (18712A) Latchup Trigger Current and Voltages
Pin
Function
-V (v)
-I (mA)
+V (v)
+I (mA)
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
22
23
24
25
26
27
28
29
30
31
32
A19
A16
A15
A12
A7
A6
A5
A4
A3
A2
A1
A0
O0
O1
O2
GND
O3
O4
O5
O6
O7
CE
A10
OE
A11
A9
A8
A13
A14
A17
A18
VCC
6.0
5.8
5.8
5.8
6.0
6.1
5.6
5.4
3.9
4.0
4.0
3.9
2.7
2.7
2.7
>600
>600
>600
>600
>600
>600
>600
>600
>600
>600
>600
>600
>600
>600
>600
>14
>14
>14
>14
11.0
11.2
11.3
11.7
11.6
12.1
>14
>14
13.6
13.4
13.4
>600
>600
>600
2.7
2.7
2.8
2.8
2.7
3.8
3.9
2.8
5.5
5.7
6.0
5.8
5.8
5.8
5.9
>600
>600
>600
>600
>600
>600
>600
>600
>600
>600
>600
>600
>600
>600
>600
13.6
13.6
13.7
13.7
13.8
>14
>14
>14
>14
>14
>14
>14
>14
>14
>14
>600
>600
>600
>600
>600