PAGE 1 OF 8 ATMEL CORPORATION Tel:(408)441-0311 Fax:(408)436-4200 AT-27C080 EPROM RELIABILITY DATA - 125°C OPERATING LIFE TEST - 200°C RETENTION BAKE - 125°C OPERATING LIFE TEST (PLASTIC) - 150°C RETENTION BAKE (PLASTIC) - 15 PSIG PRESSURE POT * This report was generated from AT-27C080 reliability testing. This data is applicable to the following device types due to same technology grouping as defined in MIL-M-38535 Appendix A: AT-27C040 AT-27C4096 JANUARY 2005 2325 Orchard Parkway San Jose CA. 95131 PAGE 2 OF 8 AT-27C080 125°C DYNAMIC OPERATING LIFE TEST LOT NUMBER DATE CODE SAMPLE SIZE TOTAL CKT-HRS(K) NUMBER OF FAILURES A3B0575-2 3B9336 79 79.0 0 A3B0575-1 3B9337 77 77.0 0 4C0157 4C9437 60 60.0 0 FAILURE RATE TOTAL DEVICE HOURS BEST ESTIMATE 216,000 DEVICE HOURS λ 50°C AMBIENT λ CONFIDENCE ESTIMATE λ λ = 0.33% PER 1000 HOURS EXTRAPOLATION TO 50°C VIA ARRHENNIUS EQUATION AND ACTIVATION ENERGY OF O.5eV = 0.01% PER 1,000 HOURS (105 FITS) 60 = 0.014% PER 1000 HOURS 60% CONFIDENCE (138 FITS) 90 = 0.04% PER 1000 HOURS 90% CONFIDENCE (370 FITS) PAGE 3 OF 8 AT-27C080 200°C DATA RETENTION BAKE LOT NUMBER DATE CODE SAMPLE SIZE TOTAL CKT-HRS(K) NUMBER OF FAILURES A3B0575 3B9337 76 76.0 0 4C0157 4C9437 33 33.0 0 FAILURE RATE TOTAL DEVICE HOURS BEST ESTIMATE 76,000 DEVICE HOURS λ 50°C AMBIENT λ CONFIDENCE ESTIMATE λ λ = 0.9% PER 1,000 HOURS EXTRAPOLATION TO 50°C VIA ARRHENNIUS EQUATION AND ACTIVATION ENERGY OF 0.5eV = 0.003% PER 1,000 HOURS (31 FITS) 60 = 0.004% PER 1,000 HOURS 60% CONFIDENCE (41 FITS) 90 = 0.01% PER 1,000 HOURS 90% CONFIDENCE (102 FITS) PAGE 4 OF 8 AT-27C080 PLASTIC PACKAGE 125°C DYNAMIC OPERATING LIFE TEST LOT NUMBER NUMBER FAILURES DATE CODE SAMPLE PKG TOTAL SIZE CKT-HRS(K) OF 3B1126 3B9342 40 TSOP 77 77.0 0 3C0893 3C9352 32 SOIC 79 79.0 0 3D04424 3D9404 40 TSOP 80 80.0 0 4C0157 4C9437 32 PDIP 80 80.0 0 6D9728 32 TSOP 299 299.0 0 6D3922 9E1049 9E9928 32 PLCC 250 250.0 0 9G1260-2 9G9933 32 SOIC 100 100.0 0 2G0467 2G0230 32 TSOP 250 250.0 0 FAILURE RATE TOTAL DEVICE HOURS BEST ESTIMATE 1,215,000 DEVICE HOURS λ 50°C AMBIENT λ CONFIDENCE ESTIMATE λ λ = 0.06% PER 1,000 HOURS EXTRAPOLATION TO 50°C VIA ARRHENNIUS EQUATION AND ACTIVATION ENERGY OF 0.5eV = 0.002% PER 1,000 HOURS (19 FITS) 60 = 0.003% PER 1,000 HOURS 60% CONFIDENCE (26 FITS) 90 = 0.006% PER 1,000 HOURS 90% CONFIDENCE (64 FITS) PAGE 5 OF 8 AT-27C080 PLASTIC PACKAGE 150°C RETENTION BAKE LOT NUMBER FAILURES 3B1126 3C0893 W311032 3D0442-1 3D0442-2 3D1492-2 4C0157-2 6D3922 8J3881 9G1260-2 9E1049 0C3857 2G0467 4G5537 DATE CODE 3B9342 3C9352 3D9404 3D9404 3D9405 3D9411 4C9438 6D9728 8J9909 9G9933 9E9928 0C0052 2G0230 4G0432 PKG 40 TSOP 32 SOIC 40 TSOP 40 TSOP 40 TSOP 40 TSOP 32 TSOP 32 TSOP 32 PDIP 32 SOIC 32 PLCC 32 PDIP 32 TSOP 32 PLCC SAMPLE SIZE TOTAL CKT-HRS(K) 77 78 77 100 99 80 77 214 250 100 250 250 498 500 77.0 78.0 77.0 100.0 99.0 80.0 77.0 214.0 250.0 100.0 250.0 250.0 498.0 500.0 NUMBER OF 0 0 0 0 0 0 0 0 0 0 0 0 0 0 FAILURE RATE TOTAL DEVICE HOURS BEST ESTIMATE 2,650,000 DEVICE HOURS λ 50°C AMBIENT λ CONFIDENCE ESTIMATE λ λ =0.03% PER 1000 HOURS EXTRAPOLATION TO 50°C VIA ARRHENNIUS EQUATION AND ACTIVATION ENERGY OF 0.5eV = 0.0005% PER 1,000 HOURS (5 FITS) 60 = 0.0006% PER 1,000 HOURS 60% CONFIDENCE (6 FITS) 90 = 0.001% PER 1,000 HOURS 90% CONFIDENCE (13 FITS) PAGE 6 OF 8 AT-27C080 PLASTIC PACKAGE PRESSURE POT TEST DATE CODE PACKAGE TYPE SAMPLE SIZE NUMBER OF FAILURE AT INDICATED HOURS (24) (48) (72) (96) 3D9404 40 TSOP 45 0 0 0 0 4C9438 32 TSOP 450 0 0 0 0 6D9728 32 TSOP 200 0 0 0 0 8E9837 40 TSOP 50 0 0 0 0 8B9843 40 PDIP 100 0 0 0 0 8J9909 32 PDIP 100 0 0 0 0 9E9929 32 SOIC 100 0 0 0 0 9G9933 32 SOIC 50 0 0 0 0 PAGE 7 OF 8 Date: May 5, 1994 Subject: AT27C080(18712A Latchup Data) From: T. Pearce To: Copy: G. Korsh, E. Hui, C. Lionbarger M. Wong, H. Nguyen, LY. Lee Three packaged units of the AT27C080 (18712A Stepping) from lot 4C0157 were tested for latchup. A curve tracer was used to force current into each pin and observe the latchup trigger current and voltage. A 9 ohm resistor was connected in parallel across the Vcc power supply to allow current to be forced out of the Vcc pin during testing. A separate ammeter was connected in series with the Vcc power supply to verify when latchup occurred. The results are show in page 2 an indicate that the new AT27C080 (18712A) is quite immune to latchup under normal operating conditions (Vcc=4.5v to 5.5v room temperature). Inputs can sustain -2.8 with respect to ground and no latchup is observed. No latchup is observed for possitive input voltages up to 18v where destructive junction breakdown occurs. Outputs can sustain 13.4v and -2.7v with respect to ground and no latchup is observed. PAGE 8 OF 8 AT27C080 (18712A) Latchup Trigger Current and Voltages Pin Function -V (v) -I (mA) +V (v) +I (mA) 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25 26 27 28 29 30 31 32 A19 A16 A15 A12 A7 A6 A5 A4 A3 A2 A1 A0 O0 O1 O2 GND O3 O4 O5 O6 O7 CE A10 OE A11 A9 A8 A13 A14 A17 A18 VCC 6.0 5.8 5.8 5.8 6.0 6.1 5.6 5.4 3.9 4.0 4.0 3.9 2.7 2.7 2.7 >600 >600 >600 >600 >600 >600 >600 >600 >600 >600 >600 >600 >600 >600 >600 >14 >14 >14 >14 11.0 11.2 11.3 11.7 11.6 12.1 >14 >14 13.6 13.4 13.4 >600 >600 >600 2.7 2.7 2.8 2.8 2.7 3.8 3.9 2.8 5.5 5.7 6.0 5.8 5.8 5.8 5.9 >600 >600 >600 >600 >600 >600 >600 >600 >600 >600 >600 >600 >600 >600 >600 13.6 13.6 13.7 13.7 13.8 >14 >14 >14 >14 >14 >14 >14 >14 >14 >14 >600 >600 >600 >600 >600