PAGE 1 OF 12 ATMEL CORPORATION Tel:(408)441-0311 Fax:(408)436-4200 AT-27C1024 CMOS EPROM RELIABILITY DATA -125°C OPERATING LIFE TEST -200°C DATA RETENTION BAKE -PROGRAM AND ERASE -125°C OPERATING LIFE TEST (PLASTIC) -150°C RETENTION BAKE (PLASTIC) -15 PSIG PRESSURE POT -85°C/85% RELATIVE HUMIDITY OPERATING LIFE TEST * This report was generated from AT-27C1024 reliability testing. This data is applicable to the following device types due to same technology grouping as defined in MIL-M-38535 Appendix A: AT-27C010 JANUARY 2005 2325 Orchard Parkway San Jose CA. 95131 PAGE 2 OF 12 AT-27C1024 125°C DYNAMIC OPERATING LIFE TEST LOT NUMBER 81380 83649 83650 00273 00274 133147-18 232699-2 232447 234055 3B0202 3B0974C 3B0905 3B0201A 4B1821 4C2399 4D2847 6E1324 0A2578 DATE CODE SAMPLE SIZE 8C8840 8C8847 8C8848 0B9029 0B9029 1D9147 2C9239 2C9237 2D9307 3B9323 3B9332 3B9331 3B9339 4B9433 4C9447 4D9509 6E9616 0A0015 77 76 100 77 77 74 78 76 62 80 80 78 53 96 92 54 81 100 TOTAL CKT-HRS(K) NUMBER OF FAILURES 77.0 76.0 100.0 77.0 77.0 222.0 78.0 76.0 62.0 80.0 80.0 78.0 53.0 96.0 92.0 54.0 81.0 100.0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 FAILURE RATE TOTAL DEVICE HOURS BEST ESTIMATE 1,638,000 DEVICE HOURS λ 50°C AMBIENT λ CONFIDENCE ESTIMATE λ λ = 0.045% PER 1,000 HOURS EXTRAPOLATION TO 50°C VIA ARRHENNIUS EQUATION AND ACTIVATION ENERGY OF 0.5eV = 0.0015% PER 1,000 HOURS (15 FITS) 60 = 0.002% PER 1,000 HOURS 60% CONFIDENCE (20 FITS) 90 = 0.0051% PER 1,000 HOURS 90% CONFIDENCE (51 FITS) PAGE 3 OF 12 AT-27C1024 200°C RETENTION BAKE LOT NUMBER 1000 DATE CODE SAMPLE SIZE 00274 OB9029 77 0 0 0 133147-18 1D9147 78 0 0 0 3B0974C 3B9332 79 0 0 0 3B0905 3B9331 77 0 0 0 4B1821 4B9433 80 0 0 0 24 HOURS TO FAILURE 168 500 0 0 0 0 0 FAILURE RATE TOTAL DEVICE HOURS BEST ESTIMATE 391,000 DEVICE HOURS λ = 0.2% PER 1,000 HOURS λ EXTRAPOLATION TO 50°C VIA ARRHENNIUS EQUATION AND ACTIVATION ENERGY OF 0.5eV = 0.001% PER 1,000 HOURS (6 FITS) 50°C AMBIENT CONFIDENCE ESTIMATE λ λ 60 = 0.001% PER 1,000 HOURS 60% CONFIDENCE (8 FITS) 90 = 0.002% PER 1,000 HOURS 90% CONFIDENCE (21 FITS) PAGE 4 OF 12 AT-27C1024 PROGRAM/ERASE CYCLE LOT NUMBER DATE CODE SAMPLE SIZE NUMBER OF FAILURES AT CYCLE 10 20 30 40 50 232699-2 2C9239 79 0 0 0 0 0 232447 2C9237 79 0 0 0 0 0 3B0905 3B9331 83 0 0 0 0 0 PAGE 5 OF 12 AT-27C1024 PLASTIC PACKAGE 125°C DYNAMIC OPERATING LIFE TEST LOT NUMBER 133147-7 3B0202B3 3B0974C 3C0079C 3D1279 4B1821BA2 4C0164AA1 4C0164A 4C1383 5B2180 5B0583 5B1475 5C2591 5C1162 4D0481 4D0481 4D0481 4D0481 4D0481 5B2180 5B0583 5B1475 5C2591 5C1162 5C2586 5C2831 4D2847 9B1095 0H4002-1 1A0319 1B0498 1B2127-2 2G4787 DATE CODE 1D9145 3B9321 3B9332 3C9338 3D9404 4B9433 4C9439 4C9440 4C9444 4D9452 4D9511 4D9515 4D9515 4D9515 4D9515 4D9515 4D9515 4D9515 4D9515 5B9534 5B9524 5B9529 5C9547 5C9542 5C9547 5C9549 4D9509 9B9927 0H0052 1A0112 1B0124 1B0124 2G0232 SAMPLE SIZE 77 78 79 45 77 77 80 77 161 160 159 78 78 78 78 78 78 78 78 78 160 80 50 79 80 160 54 250 250 250 100 100 250 FAILURE RATE TOTAL DEVICE HOURS BEST ESTIMATE NUMBER OF FAILURES 77.0 78.0 79.0 45.0 77.0 77.0 80.0 77.0 161.0 160.0 159.0 78.0 78.0 78.0 78.0 78.0 78.0 78.0 78.0 78.0 160.0 80.0 50.0 79.0 80.0 160.0 54.0 250.0 250.0 250.0 100.0 100.0 250.0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 3,089,000 DEVICE HOURS λ 50°C AMBIENT λ CONFIDENCE ESTIMATE TOTAL CKT-HRS(K) λ λ = 0.02% PER 1,000 HOURS EXTRAPOLATION TO 50°C VIA ARRHENNIUS EQUATION AND ACTIVATION ENERGY OF 0.5eV = 0.0007% PER 1,000 HOURS (8 FITS) 60 = 0.001% PER 1,000 HOURS 60% CONFIDENCE (10 FITS) 90 = 0.002% PER 1,000 HOURS 90% CONFIDENCE (25 FITS) PAGE 6 OF 12 AT-27C1024 PLASTIC PACKAGE 150°C RETENTION BAKE LOT NUMBER 233684 3B0202B3 3B0974C 3D1279 4A1162 4B0634 4C0164AA 4C0164A 4B2530 4C1383 4D0481 4D0482 4D0481 5B0983 5B2180 5C1162 5C2591 5C2586 5C2831 8B3048-1A 8J2321 9A1263A 9B1095 0A2578 0H4002-1 1A0319 1B0498 1B2127-2 1J0397 3H3902-2 4H1861 DATE CODE SAMPLE SIZE 2D9250 3B9321 3B9332 3D9404 4B9429 4B9429 4C9439 4C9440 4B9441 4C9441 4D9452 4D9503 4D9515 5B9534 5B9534 5C9542 5C9547 5C9547 5C9549 8B9833 8J9909 9A9916 9B9927 0A0015 0H0052 1A0112 1B0124 1B0124 1J0203 3H0345 4H0439 141 80 80 77 77 77 80 77 119 340 154 80 77 158 45 63 55 98 235 50 500 49 250 50 250 252 50 50 250 500 500 168 HOURS TO FAILURE 500 1,000 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 FAILURE RATE TOTAL DEVICE HOURS BEST ESTIMATE 4,864,000 DEVICE HOURS λ = 0.02% PER 1,000 HOURS λ EXTRAPOLATION TO 50°C VIA ARRHENNIUS EQUATION AND ACTIVATION ENERGY OF 0.5eV = 0.002% PER 1,000 HOURS (2 FITS) 50°C AMBIENT CONFIDENCE ESTIMATE λ λ 60 = 0.0003% PER 1,000 HOURS 60% CONFIDENCE (3 FITS) 90 = 0.0007% PER 1,000 HOURS 90% CONFIDENCE (7 FITS) PAGE 7 OF 12 AT-27C1024 PLASTIC PACKAGE PRESSURE POT TEST DATE CODE (96) PACKAGE TYPE SAMPLE SIZE (24) NUMBER OF FAILURE (48) (72) 2D9246 44 PLCC 43 0 0 0 3B9321 44 PLCC 122 0 0 0 4B9429 40 TSOP 90 0 0 0 4B9433 44 PLCC 45 0 0 0 4C9438 44 PLCC 45 0 0 0 4C9440 40 TSOP 45 0 0 0 4D9452 40 TSOP 231 0 0 0 4D9503 40 VSOP 44 0 0 0 4D9511 44 PLCC 157 0 0 0 4D9515 40 TSOP 45 0 0 0 5C9542 44 PLCC 90 0 0 0 5C9547 44 PLCC 167 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 8B9833 9A9916 9B9927 0A0015 1A0112 1B0124 1B0124 2G0232 3H0345 4H0439 44 44 40 44 40 44 40 40 40 44 PLCC PLCC VSOP PLCC VSOP PLCC PDIP PDIP PDIP PLCC 34 50 100 50 76 50 50 100 100 100 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 PAGE 8 OF 12 AT-27C1024 PLASTIC PACKAGE 85°C/85% RELATIVE HUMIDITY OPERATING LIFE TEST LOT FAILURES NUMBER HOURS DATE CODE PACKAGE TYPE SAMPLE NUMBER OF SIZE AT INDICATED (168) (500) (1000) 3D1279 0 3D9404 40 PDIP 77 0 0 4D0481 0 4D9452 40 PDIP 50 0 0 4D0481-1 0 4D9452 40 TSOP 28 0 0 5C1162 0 5C9542 44 PLCC 45 0 0 5C2586 0 5C9547 40 PDIP 45 0 0 5C2591 0 5C9547 44 PLCC 45 0 0 PAGE 9 OF 12 Date: Sept. 28, 1994 Subject: AT27C1024 (18705A Stepping) ESD From: C. Lionbarger, G. Korsh To: E. Hui, M. Wong, LY. Lee From T. Pearce, H. Nguyen Packaged units of the AT27C1024 (18705A stepping) from lot 4B1821 were tested for Electro-Static Discharge immunity. Testing was performed on an IMCS ESD discharge tester, which was set up per Mil-std-883, method 3015 (100pF capacitor discharged through a 1.5K ohm resistor). Individual pins on units were step-stress tested in 500V increments. Three consecutive high voltage pulses with six seconds cool down period between pulses were used at each voltage setting. The leakage current on each pin was measured before and after each high voltage pulse train. The leakage current noise level was below 1nA and the failure criteria at 1.5V was 1uA or 0.2uA increase due to a single voltage pulse sequence. This procedure is implemented with VSS grounded and VCC floating, and vice versa. The results are shown in Table 1. They indicate that the AT27C1024 (18705A) has excellent input and output protection structures. The inputs pass +/- 5000V and the outputs pass +/- 4000V. PAGE 10 OF 12 Table 1. AT27C1024 (18705A) ESD Voltage Protection by pin Pin 1 2 3 4 5 6 7 8 9 10 12 13 14 15 16 17 18 19 20 21 22 23 24 25 26 27 28 29 31 32 33 34 35 36 37 39 Function VPP CE D15 D14 D13 D12 D11 D10 D9 D8 D7 D6 D5 D4 D3 D2 D1 D0 OE A0 A1 A2 A3 A4 A5 A6 A7 A8 A9 A10 A11 A12 A13 A14 A15 PGM +V >6000 >6000 >6000 >6000 >6000 >6000 >6000 >6000 >6000 >6000 >6000 >6000 >6000 >6000 5000 4500 >6000 >6000 >6000 5500 5500 >6000 >6000 >6000 >6000 >6000 5500 >6000 5500 5500 5500 >6000 >6000 >6000 >6000 >6000 -V >6000 >6000 >6000 >6000 >6000 >6000 >6000 >6000 >6000 >6000 >6000 >6000 >6000 >6000 5000 4500 >6000 >6000 >6000 5500 5500 >6000 >6000 >6000 >6000 >6000 5500 >6000 5500 5500 5500 >6000 >6000 >6000 >6000 >6000 PAGE 11 OF 12 Date: October 13, 1994 Subject: AT27C1024 (18705A Stepping) Latchup Characterization From: David Nemeth To: cc: L.Y. Lee, M. Lai, M. Wong G. Korsh, Larry Sun Packaged units of AT27C1024 (18705A stepping) from lot 4B1821-2 were tested for latchup. A curve tracer was used to force current into each pin, and the voltage for latchup or I=600mA was observed. The current into Vcc was monitored by a separate current meter, and Vcc had a 9 ohm resistor to ground at the power supply to allow the pin to source current. The result are given in table 1. No latchup was observed for any pin at Vcc = 5V for currents up to 600mA. No latchup occurs for output voltages up 2V., or up to 14V on the output pins. PAGE 12 OF 12 Table 1. AT27C1024 Latchup Trigger Current and Voltage at 5V Lot # 4B1821-2 (18705A stepping) Pin Function 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25 26 27 28 29 30 31 32 33 34 35 36 37 38 39 Vpp CE O15 O14 O13 012 011 010 O9 O8 GND O7 O6 O5 O4 O3 O2 O1 O0 GND A0 A1 A2 A3 A4 A5 A6 A7 A8 GND A9 A10 A11 A12 A13 A14 A15 N.C. PGM +I (mA) +V (V) >600 >600 >600 >600 >600 >600 >600 >600 9.4 9.4 9.7 9.65 10 10 10.4 10.4 >600 >600 >600 >600 >600 >600 >600 >600 10.8 10.9 11.1 11.2 11.6 11.7 12 12 -I(mA) -V (V) >600 >600 >600 >600 >600 >600 >600 >600 >600 >600 3.35 4.25 3.25 3.45 3.5 3.7 3.8 3.6 3.6 3.6 >600 >600 >600 >600 >600 >600 >600 >600 >600 >600 >600 >600 >600 >600 >600 >600 >600 >600 3.5 3.5 3.45 3.55 3.4 3.2 3.1 2.85 4 4 3.9 3.9 3.8 3.8 3.65 3.6 3.5 3.4 >600 >600 >600 >600 >600 >600 >600 3.4 3.5 3.6 3.8 3.8 3.8 3.8 >600 3.8