View detail for AT27C1024 Reliability Qualification Report

PAGE 1 OF 12
ATMEL CORPORATION
Tel:(408)441-0311
Fax:(408)436-4200
AT-27C1024 CMOS EPROM RELIABILITY DATA
-125°C OPERATING LIFE TEST
-200°C DATA RETENTION BAKE
-PROGRAM AND ERASE
-125°C OPERATING LIFE TEST (PLASTIC)
-150°C RETENTION BAKE (PLASTIC)
-15 PSIG PRESSURE POT
-85°C/85% RELATIVE HUMIDITY OPERATING LIFE TEST
* This report was generated from AT-27C1024 reliability testing.
This data is applicable to the following device types due to same
technology grouping as defined in MIL-M-38535 Appendix A:
AT-27C010
JANUARY 2005
2325 Orchard Parkway San Jose CA. 95131
PAGE 2 OF 12
AT-27C1024
125°C DYNAMIC OPERATING LIFE TEST
LOT
NUMBER
81380
83649
83650
00273
00274
133147-18
232699-2
232447
234055
3B0202
3B0974C
3B0905
3B0201A
4B1821
4C2399
4D2847
6E1324
0A2578
DATE
CODE
SAMPLE
SIZE
8C8840
8C8847
8C8848
0B9029
0B9029
1D9147
2C9239
2C9237
2D9307
3B9323
3B9332
3B9331
3B9339
4B9433
4C9447
4D9509
6E9616
0A0015
77
76
100
77
77
74
78
76
62
80
80
78
53
96
92
54
81
100
TOTAL
CKT-HRS(K)
NUMBER
OF FAILURES
77.0
76.0
100.0
77.0
77.0
222.0
78.0
76.0
62.0
80.0
80.0
78.0
53.0
96.0
92.0
54.0
81.0
100.0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
FAILURE RATE
TOTAL DEVICE HOURS
BEST ESTIMATE
1,638,000 DEVICE HOURS
λ
50°C AMBIENT
λ
CONFIDENCE ESTIMATE
λ
λ
= 0.045% PER 1,000 HOURS
EXTRAPOLATION TO 50°C VIA
ARRHENNIUS EQUATION AND
ACTIVATION ENERGY OF 0.5eV
= 0.0015% PER 1,000 HOURS (15
FITS)
60 = 0.002% PER 1,000 HOURS
60% CONFIDENCE (20 FITS)
90 = 0.0051% PER 1,000 HOURS
90% CONFIDENCE (51 FITS)
PAGE 3 OF 12
AT-27C1024
200°C RETENTION BAKE
LOT
NUMBER
1000
DATE
CODE
SAMPLE
SIZE
00274
OB9029
77
0
0
0
133147-18
1D9147
78
0
0
0
3B0974C
3B9332
79
0
0
0
3B0905
3B9331
77
0
0
0
4B1821
4B9433
80
0
0
0
24
HOURS TO FAILURE
168
500
0
0
0
0
0
FAILURE RATE
TOTAL DEVICE HOURS
BEST ESTIMATE
391,000 DEVICE HOURS
λ
= 0.2% PER 1,000 HOURS
λ
EXTRAPOLATION TO 50°C VIA
ARRHENNIUS EQUATION AND
ACTIVATION ENERGY OF 0.5eV
= 0.001% PER 1,000 HOURS (6 FITS)
50°C AMBIENT
CONFIDENCE ESTIMATE
λ
λ
60 = 0.001% PER 1,000 HOURS
60% CONFIDENCE (8 FITS)
90 = 0.002% PER 1,000 HOURS
90% CONFIDENCE (21 FITS)
PAGE 4 OF 12
AT-27C1024
PROGRAM/ERASE CYCLE
LOT
NUMBER
DATE
CODE
SAMPLE
SIZE
NUMBER OF FAILURES AT CYCLE
10
20
30
40
50
232699-2
2C9239
79
0
0
0
0
0
232447
2C9237
79
0
0
0
0
0
3B0905
3B9331
83
0
0
0
0
0
PAGE 5 OF 12
AT-27C1024
PLASTIC PACKAGE
125°C DYNAMIC OPERATING LIFE TEST
LOT
NUMBER
133147-7
3B0202B3
3B0974C
3C0079C
3D1279
4B1821BA2
4C0164AA1
4C0164A
4C1383
5B2180
5B0583
5B1475
5C2591
5C1162
4D0481
4D0481
4D0481
4D0481
4D0481
5B2180
5B0583
5B1475
5C2591
5C1162
5C2586
5C2831
4D2847
9B1095
0H4002-1
1A0319
1B0498
1B2127-2
2G4787
DATE
CODE
1D9145
3B9321
3B9332
3C9338
3D9404
4B9433
4C9439
4C9440
4C9444
4D9452
4D9511
4D9515
4D9515
4D9515
4D9515
4D9515
4D9515
4D9515
4D9515
5B9534
5B9524
5B9529
5C9547
5C9542
5C9547
5C9549
4D9509
9B9927
0H0052
1A0112
1B0124
1B0124
2G0232
SAMPLE
SIZE
77
78
79
45
77
77
80
77
161
160
159
78
78
78
78
78
78
78
78
78
160
80
50
79
80
160
54
250
250
250
100
100
250
FAILURE RATE
TOTAL DEVICE HOURS
BEST ESTIMATE
NUMBER
OF FAILURES
77.0
78.0
79.0
45.0
77.0
77.0
80.0
77.0
161.0
160.0
159.0
78.0
78.0
78.0
78.0
78.0
78.0
78.0
78.0
78.0
160.0
80.0
50.0
79.0
80.0
160.0
54.0
250.0
250.0
250.0
100.0
100.0
250.0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
3,089,000 DEVICE HOURS
λ
50°C AMBIENT
λ
CONFIDENCE ESTIMATE
TOTAL
CKT-HRS(K)
λ
λ
= 0.02% PER 1,000 HOURS
EXTRAPOLATION TO 50°C VIA
ARRHENNIUS EQUATION AND
ACTIVATION ENERGY OF 0.5eV
= 0.0007% PER 1,000 HOURS (8
FITS)
60 = 0.001% PER 1,000 HOURS
60% CONFIDENCE (10 FITS)
90 = 0.002% PER 1,000 HOURS
90% CONFIDENCE (25 FITS)
PAGE 6 OF 12
AT-27C1024
PLASTIC PACKAGE
150°C RETENTION BAKE
LOT
NUMBER
233684
3B0202B3
3B0974C
3D1279
4A1162
4B0634
4C0164AA
4C0164A
4B2530
4C1383
4D0481
4D0482
4D0481
5B0983
5B2180
5C1162
5C2591
5C2586
5C2831
8B3048-1A
8J2321
9A1263A
9B1095
0A2578
0H4002-1
1A0319
1B0498
1B2127-2
1J0397
3H3902-2
4H1861
DATE
CODE
SAMPLE
SIZE
2D9250
3B9321
3B9332
3D9404
4B9429
4B9429
4C9439
4C9440
4B9441
4C9441
4D9452
4D9503
4D9515
5B9534
5B9534
5C9542
5C9547
5C9547
5C9549
8B9833
8J9909
9A9916
9B9927
0A0015
0H0052
1A0112
1B0124
1B0124
1J0203
3H0345
4H0439
141
80
80
77
77
77
80
77
119
340
154
80
77
158
45
63
55
98
235
50
500
49
250
50
250
252
50
50
250
500
500
168
HOURS TO FAILURE
500
1,000
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
FAILURE RATE
TOTAL DEVICE HOURS
BEST ESTIMATE
4,864,000 DEVICE HOURS
λ
= 0.02% PER 1,000 HOURS
λ
EXTRAPOLATION TO 50°C VIA
ARRHENNIUS EQUATION AND
ACTIVATION ENERGY OF 0.5eV
= 0.002% PER 1,000 HOURS (2 FITS)
50°C AMBIENT
CONFIDENCE ESTIMATE
λ
λ
60 = 0.0003% PER 1,000 HOURS
60% CONFIDENCE (3 FITS)
90 = 0.0007% PER 1,000 HOURS
90% CONFIDENCE (7 FITS)
PAGE 7 OF 12
AT-27C1024
PLASTIC PACKAGE
PRESSURE POT TEST
DATE
CODE
(96)
PACKAGE
TYPE
SAMPLE
SIZE
(24)
NUMBER OF FAILURE
(48)
(72)
2D9246
44 PLCC
43
0
0
0
3B9321
44 PLCC
122
0
0
0
4B9429
40 TSOP
90
0
0
0
4B9433
44 PLCC
45
0
0
0
4C9438
44 PLCC
45
0
0
0
4C9440
40 TSOP
45
0
0
0
4D9452
40 TSOP
231
0
0
0
4D9503
40 VSOP
44
0
0
0
4D9511
44 PLCC
157
0
0
0
4D9515
40 TSOP
45
0
0
0
5C9542
44 PLCC
90
0
0
0
5C9547
44 PLCC
167
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
8B9833
9A9916
9B9927
0A0015
1A0112
1B0124
1B0124
2G0232
3H0345
4H0439
44
44
40
44
40
44
40
40
40
44
PLCC
PLCC
VSOP
PLCC
VSOP
PLCC
PDIP
PDIP
PDIP
PLCC
34
50
100
50
76
50
50
100
100
100
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
PAGE 8 OF 12
AT-27C1024
PLASTIC PACKAGE
85°C/85% RELATIVE HUMIDITY OPERATING LIFE TEST
LOT
FAILURES
NUMBER
HOURS
DATE
CODE
PACKAGE
TYPE
SAMPLE
NUMBER OF
SIZE
AT INDICATED
(168)
(500)
(1000)
3D1279
0
3D9404
40 PDIP
77
0
0
4D0481
0
4D9452
40 PDIP
50
0
0
4D0481-1
0
4D9452
40 TSOP
28
0
0
5C1162
0
5C9542
44 PLCC
45
0
0
5C2586
0
5C9547
40 PDIP
45
0
0
5C2591
0
5C9547
44 PLCC
45
0
0
PAGE 9 OF 12
Date:
Sept. 28, 1994
Subject:
AT27C1024 (18705A Stepping) ESD
From:
C. Lionbarger, G. Korsh
To:
E. Hui, M. Wong, LY. Lee
From
T. Pearce, H. Nguyen
Packaged units of the AT27C1024 (18705A stepping) from lot 4B1821
were tested for Electro-Static Discharge immunity. Testing was
performed on an IMCS ESD discharge tester, which was set up per
Mil-std-883, method 3015 (100pF capacitor discharged through a 1.5K
ohm resistor). Individual pins on units were step-stress tested in
500V increments. Three consecutive high voltage pulses with six
seconds cool down period between pulses were used at each voltage
setting. The leakage current on each pin was measured before and
after each high voltage pulse train. The leakage current noise
level was below 1nA and the failure criteria at 1.5V was 1uA or
0.2uA increase due to a single voltage pulse sequence. This
procedure is implemented with VSS grounded and VCC floating, and
vice versa.
The results are shown in Table 1. They indicate that the AT27C1024
(18705A) has excellent input and output protection structures. The
inputs pass +/- 5000V and the outputs pass +/- 4000V.
PAGE 10 OF 12
Table 1.
AT27C1024 (18705A) ESD Voltage Protection by pin
Pin
1
2
3
4
5
6
7
8
9
10
12
13
14
15
16
17
18
19
20
21
22
23
24
25
26
27
28
29
31
32
33
34
35
36
37
39
Function
VPP
CE
D15
D14
D13
D12
D11
D10
D9
D8
D7
D6
D5
D4
D3
D2
D1
D0
OE
A0
A1
A2
A3
A4
A5
A6
A7
A8
A9
A10
A11
A12
A13
A14
A15
PGM
+V
>6000
>6000
>6000
>6000
>6000
>6000
>6000
>6000
>6000
>6000
>6000
>6000
>6000
>6000
5000
4500
>6000
>6000
>6000
5500
5500
>6000
>6000
>6000
>6000
>6000
5500
>6000
5500
5500
5500
>6000
>6000
>6000
>6000
>6000
-V
>6000
>6000
>6000
>6000
>6000
>6000
>6000
>6000
>6000
>6000
>6000
>6000
>6000
>6000
5000
4500
>6000
>6000
>6000
5500
5500
>6000
>6000
>6000
>6000
>6000
5500
>6000
5500
5500
5500
>6000
>6000
>6000
>6000
>6000
PAGE 11 OF 12
Date:
October 13, 1994
Subject:
AT27C1024 (18705A Stepping) Latchup Characterization
From:
David Nemeth
To:
cc:
L.Y. Lee, M. Lai, M. Wong
G. Korsh, Larry Sun
Packaged units of AT27C1024 (18705A stepping) from lot 4B1821-2
were tested for latchup. A curve tracer was used to force current
into each pin, and the voltage for latchup or I=600mA was observed.
The current into Vcc was monitored by a separate current meter, and
Vcc had a 9 ohm resistor to ground at the power supply to allow the
pin to source current.
The result are given in table 1. No latchup was observed for any
pin at Vcc = 5V for currents up to 600mA. No latchup occurs for
output voltages up 2V., or up to 14V on the output pins.
PAGE 12 OF 12
Table 1. AT27C1024 Latchup Trigger Current and Voltage at 5V
Lot # 4B1821-2 (18705A stepping)
Pin Function
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
22
23
24
25
26
27
28
29
30
31
32
33
34
35
36
37
38
39
Vpp
CE
O15
O14
O13
012
011
010
O9
O8
GND
O7
O6
O5
O4
O3
O2
O1
O0
GND
A0
A1
A2
A3
A4
A5
A6
A7
A8
GND
A9
A10
A11
A12
A13
A14
A15
N.C.
PGM
+I (mA)
+V
(V)
>600
>600
>600
>600
>600
>600
>600
>600
9.4
9.4
9.7
9.65
10
10
10.4
10.4
>600
>600
>600
>600
>600
>600
>600
>600
10.8
10.9
11.1
11.2
11.6
11.7
12
12
-I(mA)
-V (V)
>600
>600
>600
>600
>600
>600
>600
>600
>600
>600
3.35
4.25
3.25
3.45
3.5
3.7
3.8
3.6
3.6
3.6
>600
>600
>600
>600
>600
>600
>600
>600
>600
>600
>600
>600
>600
>600
>600
>600
>600
>600
3.5
3.5
3.45
3.55
3.4
3.2
3.1
2.85
4
4
3.9
3.9
3.8
3.8
3.65
3.6
3.5
3.4
>600
>600
>600
>600
>600
>600
>600
3.4
3.5
3.6
3.8
3.8
3.8
3.8
>600
3.8