PD - 96106 IRF7307QPbF HEXFET® Power MOSFET l l l l l l l l Advanced Process Technology Ultra Low On-Resistance Dual N and P Channel MOSFET Surface Mount Available in Tape & Reel 150°C Operating Temperature Automotive [Q101] Qualified Lead-Free S1 N-CHANNEL MOSFET 1 8 D1 G1 2 7 D1 S2 3 6 D2 G2 4 5 D2 N-Ch P-Ch 20V -20V VDSS P-CHANNEL MOSFET RDS(on) 0.050Ω 0.090Ω Top View Description Specifically designed for Automotive applications, these HEXFET® Power MOSFET's in a Dual SO-8 package utilize the lastest processing techniques to achieve extremely low on-resistance per silicon area. Additional features of these Automotive qualified HEXFET Power MOSFET's are a 150°C junction operating temperature, fast switching speed and improved repetitive avalanche rating. These benefits combine to make this design an extremely efficient and reliable device for use in Automotive applications and a wide variety of other applications. The efficient SO-8 package provides enhanced thermal characteristics and dual MOSFET die capability making it ideal in a variety of power applications. This dual, surface mount SO-8 can dramatically reduce board space and is also available in Tape & Reel. SO-8 Absolute Maximum Ratings Parameter I D @ TA = 25°C ID @ TA = 25°C I D @ TA = 70°C IDM P D @TA = 25°C VGS dv/dt TJ, TSTG 10 Sec. Pulse Drain Current, VGS @ 4.5V Continuous Drain Current, VGS @ 4.5V Continuous Drain Current, VGS @ 4.5V Pulsed Drain Current Power Dissipation Linear Derating Factor Gate-to-Source Voltage Peak Diode Recovery dv/dt Junction and Storage Temperature Range Max. N-Channel 5.7 5.2 4.1 21 P-Channel -4.7 -4.3 -3.4 -17 2.0 0.016 ± 12 5.0 -5.0 -55 to + 150 Units A W W/°C V V/ns °C Thermal Resistance Ratings Parameter RθJA www.irf.com Maximum Junction-to-Ambient Typ. Max. Units 62.5 °C/W 1 07/23/07 IRF7307QPbF Electrical Characteristics @ TJ = 25°C (unless otherwise specified) Parameter V (BR)DSS Drain-to-Source Breakdown Voltage ∆V(BR)DSS/∆TJ Breakdown Voltage Temp. Coefficient RDS(ON) Static Drain-to-Source On-Resistance V GS(th) Gate Threshold Voltage g fs Forward Transconductance I DSS Drain-to-Source Leakage Current IGSS Gate-to-Source Forward Leakage Qg Total Gate Charge Qgs Gate-to-Source Charge Qgd Gate-to-Drain ("Miller") Charge td(on) Turn-On Delay Time tr Rise Time td(off) Turn-Off Delay Time tf Fall Time LD LS Internal Drain Inductace Internal Source Inductance Ciss Input Capacitance Coss Output Capacitance Crss Reverse Transfer Capacitance N-Ch P-Ch N-Ch P-Ch N-Ch P-Ch N-Ch P-Ch N-Ch P-Ch N-Ch P-Ch N-Ch P-Ch N-P N-Ch P-Ch N-Ch P-Ch N-Ch P-Ch N-Ch P-Ch N-Ch P-Ch N-Ch P-Ch N-Ch P-Ch N-P N-P N-Ch P-Ch N-Ch P-Ch N-Ch P-Ch Min. Typ. Max. 20 -20 0.044 -0.012 0.050 0.070 0.090 0.140 0.70 -0.70 8.30 4.00 1.0 -1.0 25 -25 ±100 20 22 2.2 3.3 8.0 9.0 9.0 8.4 42 26 32 51 51 33 4.0 6.0 660 610 280 310 140 170 Units V V/°C Ω V S µA nC ns nH pF Conditions VGS = 0V, ID = 250µA VGS = 0V, ID = -250µA Reference to 25°C, ID = 1mA Reference to 25°C, ID = -1mA VGS = 4.5V, ID = 2.6A VGS = 2.7V, ID = 2.2A VGS = -4.5V, ID = -2.2A VGS = -2.7V, ID = -1.8A VDS = VGS, I D = 250µA VDS = VGS, I D = -250µA VDS = 15V, I D = 2.6A VDS = -15V, I D = -2.2A VDS = 16V, VGS = 0V VDS = -16V, V GS = 0V, VDS = 16V, VGS = 0V, TJ = 125°C VDS = -16V, V GS = 0V, TJ = 125°C VGS = ± 12V N-Channel I D = 2.6A, VDS = 16V, VGS = 4.5V P-Channel I D = -2.2A, VDS = -16V, VGS = -4.5V N-Channel VDD = 10V, ID = 2.6A, RG = 6.0Ω, RD = 3.8Ω P-Channel VDD = -10V, ID = -2.2A, RG = 6.0Ω, RD = 4.5Ω Between lead tip and center of die contact N-Channel VGS = 0V, VDS = 15V, = 1.0MHz P-Channel VGS = 0V, VDS = -15V, = 1.0MHz Source-Drain Ratings and Characteristics Parameter IS Continuous Source Current (Body Diode) I SM Pulsed Source Current (Body Diode) VSD Diode Forward Voltage trr Reverse Recovery Time Qrr Reverse Recovery Charge ton Forward Turn-On Time N-Ch P-Ch N-Ch P-Ch N-Ch P-Ch N-Ch P-Ch N-Ch P-Ch N-P Min. Typ. Max. Units Conditions 2.5 -2.5 A 21 -17 1.0 TJ = 25°C, IS = 1.8A, VGS = 0V V -1.0 TJ = 25°C, IS = -1.8A, VGS = 0V 29 44 N-Channel ns 56 84 TJ = 25°C, IF = 2.6A, di/dt = 100A/µs 22 33 P-Channel nC TJ = 25°C, IF = -2.2A, di/dt = 100A/µs 71 110 Intrinsic turn-on time is neglegible (turn-on is dominated by LS+LD) Notes: Repetitive rating; pulse width limited by Pulse width ≤ 300µs; duty cycle ≤ 2%. N-Channel ISD ≤ 2.6A, di/dt ≤ 100A/µs, VDD ≤ V(BR)DSS, TJ ≤ 150°C Surface mounted on FR-4 board, t ≤ 10sec. max. junction temperature. ( See fig. 23 ) P-Channel ISD ≤ -2.2A, di/dt ≤ 50A/µs, VDD ≤ V(BR)DSS, TJ ≤ 150°C www.irf.com 2 IRF7307QPbF N-Channel 1000 1000 VGS 7.5V 5.0V 4.0V 3.5V 3.0V 2.5V 2.0V BOTTOM 1.5V I , Drain-to-Source Current (A) D I , Drain-to-Source Current (A) D VGS 7.5V 5.0V 4.0V 3.5V 3.0V 2.5V 2.0V BOTTOM 1.5V TOP TOP 100 10 10 1.5V 20µs PULSE WIDTH TJ = 25°C A 1.5V 1 0.1 100 1 10 100 Fig 1. Typical Output Characteristics 2.0 R DS(on) , Drain-to-Source On Resistance (Normalized) I D , Drain-to-Source Current (A) TJ = 25°C TJ = 150°C 10 VDS = 15V 20µs PULSE WIDTH 2.0 2.5 3.0 3.5 4.0 4.5 1.5 1.0 0.5 0.0 -60 -40 -20 A 5.0 V GS , Gate-to-Source Voltage (V) C, Capacitance (pF) Ciss Coss Crss 300 0 1 10 V DS , Drain-to-Source Voltage (V) Fig 5. Typical Capacitance Vs. Drain-to-Source Voltage www.irf.com 20 40 60 A 80 100 120 140 160 Fig 4. Normalized On-Resistance Vs. Temperature 10 V GS = 0V, f = 1MHz C iss = Cgs + C gd , Cds SHORTED C rss = C gd C oss = C ds + C gd 600 VGS = 4.5V 0 TJ , Junction Temperature (°C) Fig 3. Typical Transfer Characteristics 900 100 ID = 4.3A VGS , Gate-to-Source Voltage (V) 1200 10 Fig 2. Typical Output Characteristics 100 1.5 1 VDS , Drain-to-Source Voltage (V) VDS , Drain-to-Source Voltage (V) 1 20µs PULSE WIDTH TJ = 150°C A 1 0.1 100 A I D = 2.6A VDS = 16V 8 6 4 2 FOR TEST CIRCUIT SEE FIGURE 11 0 0 5 10 15 20 25 A Q G , Total Gate Charge (nC) Fig 6. Typical Gate Charge Vs. Gate-to-Source Voltage 3 IRF7307QPbF N-Channel 100 OPERATION IN THIS AREA LIMITED BY RDS(on) ID , Drain Current (A) ISD , Reverse Drain Current (A) 100 10 TJ = 150°C TJ = 25°C 1 0.0 0.5 1.0 1.5 2.0 10 1ms TA = 25 °C TJ = 150 °C Single Pulse VGS = 0V 0.1 100us 1 0.1 A 2.5 1 RD VDS VGS 5.0 I D , Drain Current (A) 100 Fig 8. Maximum Safe Operating Area 6.0 D.U.T. RG 4.0 3.0 + V - DD 4.5V Pulse Width ≤ 1 µs Duty Factor ≤ 0.1 % 2.0 1.0 0.0 10 VDS , Drain-to-Source Voltage (V) VSD , Source-to-Drain Voltage (V) Fig 7. Typical Source-Drain Diode Forward Voltage 10ms Fig 10a. Switching Time Test Circuit 25 50 75 100 TC , Case Temperature 125 150 ( °C) VDS 90% Fig 9. Maximum Drain Current Vs. Ambient Temperature Current Regulator Same Type as D.U.T. 10% VGS td(on) 50KΩ 12V t d(off) tf Fig 10b. Switching Time Waveforms .2µF .3µF D.U.T. + V - DS QG 4.5V VGS QGS 3mA QGD VG IG ID Current Sampling Resistors Fig 11a. Gate Charge Test Circuit www.irf.com tr Charge Fig 11b. Basic Gate Charge Waveform 4 IRF7307QPbF P-Channel 100 100 VGS - 7.5V - 5.0V - 4.0V - 3.5V - 3.0V - 2.5V - 2.0V BOTTOM - 1.5V VGS - 7.5V - 5.0V - 4.0V - 3.5V - 3.0V - 2.5V - 2.0V BOTTOM - 1.5V TOP -ID , Drain-to-Source Current (A) -ID , Drain-to-Source Current (A) TOP 10 1 -1.5V 20µs PULSE WIDTH TJ = 25°C A 0.1 0.01 0.1 1 10 10 1 -1.5V 20µs PULSE WIDTH TJ = 150°C 0.1 0.01 100 0.1 Fig 12. Typical Output Characteristics R DS(on) , Drain-to-Source On Resistance (Normalized) -ID , Drain-to-Source Current (A) TJ = 150°C 1 VDS = -15V 20µs PULSE WIDTH 0.1 1.5 2.0 2.5 3.0 3.5 4.0 4.5 5.0 A I D = -3.6A 1.5 1.0 0.5 0.0 -60 -VGS , Gate-to-Source Voltage (V) -VGS , Gate-to-Source Voltage (V) C, Capacitance (pF) Ciss 1000 C oss Crss 500 0 10 100 A -VDS , Drain-to-Source Voltage (V) Fig 16. Typical Capacitance Vs. Drain-to-Source Voltage www.irf.com -20 0 20 40 60 80 A 100 120 140 160 Fig 15. Normalized On-Resistance Vs. Temperature 10 V GS = 0V, f = 1MHz C iss = Cgs + C gd , Cds SHORTED C rss = C gd C oss = C ds + C gd 1 VGS = -4.5V -40 TJ , Junction Temperature (°C) Fig 14. Typical Transfer Characteristics 1500 A 100 Fig 13. Typical Output Characteristics 2.0 100 TJ = 25°C 10 -VDS , Drain-to-Source Voltage (V) -VDS , Drain-to-Source Voltage (V) 10 1 I D = -2.2A VDS = -16V 8 6 4 2 FOR TEST CIRCUIT SEE FIGURE 22 0 0 5 10 15 20 25 A Q G , Total Gate Charge (nC) Fig 17. Typical Gate Charge Vs. Gate-to-Source Voltage 5 IRF7307QPbF P-Channel 100 OPERATION IN THIS AREA LIMITED BY RDS(on) 10 -IID , Drain Current (A) -ISD , Reverse Drain Current (A) 100 TJ = 150°C TJ = 25°C 1 VGS = 0V 0.1 0.3 0.6 0.9 1.2 10 1ms 1 A 1.5 TA = 25 °C TJ = 150 °C Single Pulse 1 10 100 -VDS , Drain-to-Source Voltage (V) -VSD , Source-to-Drain Voltage (V) Fig 18. Typical Source-Drain Diode Forward Voltage Fig 19. Maximum Safe Operating Area RD VDS 5.0 VGS 4.0 -ID , Drain Current (A) 10ms D.U.T. RG - + 3.0 VDD -4.5V 2.0 Pulse Width ≤ 1 µs Duty Factor ≤ 0.1 % 1.0 0.0 Fig 21a. Switching Time Test Circuit 25 50 75 100 TC , Case Temperature 125 150 ( °C) VDS 90% Fig 20. Maximum Drain Current Vs. Ambient Temperature Current Regulator Same Type as D.U.T. 10% VGS td(on) 50KΩ 12V t d(off) tf Fig 21b. Switching Time Waveforms .2µF .3µF D.U.T. +VDS QG -4.5V VGS QGS -3mA QGD VG IG ID Current Sampling Resistors Fig 22a. Gate Charge Test Circuit www.irf.com tr Charge Fig 22b. Basic Gate Charge Waveform 6 IRF7307QPbF N & P-Channel Thermal Response (Z thJA ) 100 D = 0.50 0.20 10 0.10 0.05 0.02 1 PDM 0.01 t1 SINGLE PULSE (THERMAL RESPONSE) t2 Notes: 1. Duty factor D = t 1 / t 2 2. Peak T J = P DM x Z thJA + TA 0.1 0.0001 0.001 0.01 0.1 1 10 100 t1, Rectangular Pulse Duration (sec) Fig 23. Maximum Effective Transient Thermal Impedance, Junction-to-Ambient www.irf.com 7 IRF7307QPbF Peak Diode Recovery dv/dt Test Circuit + D.U.T Circuit Layout Considerations • Low Stray Inductance • Ground Plane • Low Leakage Inductance Current Transformer + - - + ** RG • dv/dt controlled by RG • ISD controlled by Duty Factor "D" • D.U.T. - Device Under Test VGS* + - * VDD * Reverse Polarity for P-Channel ** Use P-Channel Driver for P-Channel Measurements Driver Gate Drive P.W. Period D= P.W. Period [VGS=10V ] *** D.U.T. ISD Waveform Reverse Recovery Current Body Diode Forward Current di/dt D.U.T. VDS Waveform Diode Recovery dv/dt Re-Applied Voltage Body Diode [VDD] Forward Drop Inductor Curent Ripple ≤ 5% [ISD ] *** VGS = 5.0V for Logic Level and 3V Drive Devices Fig 24. For N and P Channel HEXFETS www.irf.com 8 IRF7307QPbF SO-8 Package Outline Dimensions are shown in millimeters (inches) ' ',0 % $ $ + >@ ( ;E >@ $ $ 0,//,0(7(56 0,1 0$; $ E F ' ( H %$6,& %$6,& H + %$6,& %$6,& . / \ $ ; H H ,1&+(6 0,1 0$; .[ & \ >@ ;/ ;F & $ % 127(6 ',0(16,21,1*72/(5$1&,1*3(5$60(<0 &21752//,1*',0(16,210,//,0(7(5 ',0(16,216$5(6+2:1,10,//,0(7(56>,1&+(6@ 287/,1(&21)250672-('(&287/,1(06$$ ',0(16,21'2(6127,1&/8'(02/'3527586,216 02/'3527586,21612772(;&(('>@ ',0(16,21'2(6127,1&/8'(02/'3527586,216 02/'3527586,21612772(;&(('>@ ',0(16,21,67+(/(1*7+2)/($')2562/'(5,1*72 $68%675$7( )22735,17 ;>@ >@ ;>@ ;>@ SO-8 Part Marking (;$03/(7+,6,6$1,5)026)(7 ,17(51$7,21$/ 5(&7,),(5 /2*2 ;;;; ) '$7(&2'(<:: 3 '(6,*1$7(6/($')5(( 352'8&7237,21$/ < /$67',*,72)7+(<($5 :: :((. $ $66(0%/<6,7(&2'( /27&2'( 3$57180%(5 Note: For the most current drawing please refer to IR website at http://www.irf.com/package/ www.irf.com 9 IRF7307QPbF SO-8 Tape and Reel Dimensions are shown in millimeters (inches) TERMINAL NUMBER 1 12.3 ( .484 ) 11.7 ( .461 ) 8.1 ( .318 ) 7.9 ( .312 ) FEED DIRECTION NOTES: 1. CONTROLLING DIMENSION : MILLIMETER. 2. ALL DIMENSIONS ARE SHOWN IN MILLIMETERS(INCHES). 3. OUTLINE CONFORMS TO EIA-481 & EIA-541. 330.00 (12.992) MAX. 14.40 ( .566 ) 12.40 ( .488 ) NOTES : 1. CONTROLLING DIMENSION : MILLIMETER. 2. OUTLINE CONFORMS TO EIA-481 & EIA-541. Note: For the most current drawing please refer to IR website at http://www.irf.com/package/ Data and specifications subject to change without notice. This product has been designed and qualified for the Automotive [Q101] market. Qualification Standards can be found on IR’s Web site. IR WORLD HEADQUARTERS: 233 Kansas St., El Segundo, California 90245, USA Tel: (310) 252-7105 TAC Fax: (310) 252-7903 Visit us at www.irf.com for sales contact information.07/2007 www.irf.com 10