PHILIPS NE529

Philips Semiconductors Linear Products
Product specification
Voltage comparator
NE529
DESCRIPTION
PIN CONFIGURATIONS
The NE529 is a high-speed analog voltage comparator which, for
the first time, mates state-of-the-art Schottky diode technology with
the conventional linear process. This allows simultaneous
fabrication of high-speed TTL gates with a precision linear amplifier
on a single monolithic chip.
D, N Packages
V1 +
FEATURES
1
14
V2 +
NC 2
13
STROBE A
INPUT A
3
12
NC
INPUT B
4
11
OUTPUT A
NC 5
10
GND
6
9
OUTPUT B
NC 7
8
STROBE B
• 10ns propagation delay
• Complementary output gates
• TTL or ECL compatible outputs
• Wide common-mode and differential voltage range
• Typical gain 5000
V1 –
TOP VIEW
BLOCK DIAGRAM
APPLICATIONS
• A/D conversion
• ECL-to-TTL interface
• TTL-to-ECL interface
• Memory sensing
• Optical data coupling
V2 +
STROBE A
V1 +
OUTPUT A
INPUT A
INPUT B
OUTPUT B
V1 –
STROBE B
ORDERING INFORMATION
TEMPERATURE RANGE
ORDER CODE
DWG #
14-Pin Plastic Dual In-Line Package (DIP)
DESCRIPTION
0 to +70°C
NE529N
0405B
14-Pin Small Outline (SO) Package
0 to +70°C
NE529D
0175D
R1
V2 +
STROBE A
V1 +
1K
R13
20K
1K
R14
R15
R16
4K
1.5K
R17
55
Q3
D1
Q17
D3
Q18
D10
D2
R2
1.5K
R3
1.5K
Q4
Q5
D4
Q1
R10
20K
Q19
6.13K
R9
R21
4K
55
R23
R22
1.5K
R20
500
Q20
GND
Q24
Q7
Q8
Q9
Q27
D7
R24
4K
Q22
Q21
R5
300
R6
300
R7
100
R8
200
D9
OUTPUT B
Q25
D8
200
250
R19
Q23
Q10 Q11
Q2
Q6
R4
OUTPUT A
Q26
Q15
D6
V1 –
4K
Q13 Q14
Q12
D5
INPUT B
INPUT A
750
R12
750
R11
R18
250
R26
D11
R25
500
Q26
STROBE B
August 31, 1994
320
853-0902 13721
Philips Semiconductors Linear Products
Product specification
Voltage comparator
NE529
ABSOLUTE MAXIMUM RATINGS
RATING
UNIT
V1+
SYMBOL
Positive supply voltage
PARAMETER
+15
V
V1-
Negative supply voltage
-15
V
V2+
Gate supply voltage
+7
V
VOUT
Output voltage
+7
V
VIN
Differential input voltage
±5
V
VCM
Input common mode voltage
±6
V
PD
Maximum power dissipation1 TA=25°C (still-air)
N package
1420
mW
D package
1040
mW
0 to +70
°C
-65 to +150
°C
+300
°C
TA
Operating temperature range
TSTG
Storage temperature range
TSOLD
Lead soldering temperature
(10 sec max)
NOTES:
1. Derate above 25°C at the following rates:
N package at 11.5mW/°C
D package at 8.3mW/°C
August 31, 1994
321
Philips Semiconductors Linear Products
Product specification
Voltage comparator
NE529
DC ELECTRICAL CHARACTERISTICS
V1+=+10V, V2+=+5.0V, V1-=-10V, unless otherwise specified.
SYMBOL
PARAMETER
TEST CONDITIONS
NE529
Min
Typ
Max
UNIT
Input characteristics
VOS
IBIAS
IOS
Input offset voltage @ 25°C
6
Over temperature range
10
Input bias current @ 25°C
5
Over temperature range
VIN=0V
50
Input offset current @ 25°C
2
Over temperature range
VCM
VIN=0V
Common-mode voltage range
20
-5
0
2.7
3.3
mV
µA
5
µA
15
µA
V
Gate characteristics
Output voltage
VOUT
“1” state
V2+=4.75V, ISOURCE=-1mA
“0” state
V2+=4.75V, ISINK=10mA
V
0.5
V
Strobe inputs
ISC
“0” Input current1
V2+=5.25V, VSTROBE=0.5V
-2
mA
“1” Input current @ 25°C1
V2+=5.25V, VSTROBE=2.7V
100
µA
Over temperature range
V2+=5.25V, VSTROBE=2.7V
200
µA
“0” input voltage
V2+=4.75V
0.8
V
“1” input voltage
V2+=4.75V
2.0
V2+=5.25V, VOUT=0V
-18
Short-circuit output current
V
-70
mA
Power supply requirements
Supply voltage
V1+
5
10
V
V1-
-6
-10
V
V2+
4.75
5.25
V
Supply current
5
V1+=10V, V1-=-10V
V2+=5.25V
I1+
Over temp.
5
mA
I1-
Over temp.
10
mA
I2+
Over temp.
20
mA
NOTES:
1. See logic function table.
AC ELECTRICAL CHARACTERISTICS
TA=25°C (See AC test circuit).
SYMBOL
tR
PARAMETER
Transient response
TEST CONDITIONS
LIMITS
Min
Typ
Max
UNIT
VIN=±100mV step
Propagation delay time
tPLH
Low-to-high
12
22
ns
tPHL
High-to-low
10
20
ns
2
5
ns
Delay between output A and B
Strobe delay time
tON
turn-on time
6
ns
tOFF
turn-off time
6
ns
August 31, 1994
322
Philips Semiconductors Linear Products
Product specification
Voltage comparator
NE529
TYPICAL PERFORMANCE CHARACTERISTICS
Input Currents vs Temperature
Power Dissipation
vs Supply Voltage
Supply Currents vs Temperature
160
15
8
BIAS CURRENT
4
2
0
0.6
OFFSET CURRENT
V2 + = 5.0V
13
7
I1 –
6
V1 – = 10V
5
4
I1 +
3
V1 + = 10V
2
0.2
0
–50
–25
0
25
50
–50 –25
75 100 125
TEMPERATURE — oC
5
4
T1 +
2
1
5
6
7
8
75
120
110
100
100
5
9
OUTPUT A
V1 + = 10V, V1 – = — 10V
V2 + = 5.0V
INPUT A
0
–100
OVERDRIVE
0
5
10
SUPPLY VOLTAGE (V1 +, V1 –) — VOLTS
15
20
8
9
4
OUTPUT A
3
25
OVERDRIVE
+50mV
+25mV
2
+10mV
+5mV
+15mV
0
+100
OVERDRIVE
0
INPUT B
–100
0
30
5
10
15
20
TIME — ns
TIME — ns
RESPONSE TIME TEST CIRCUIT
(V1 +)
+10
10µF
+
+
.1
1K
500Ω
(V2 +)
+5
10µF
.1
INPUT PROBE
1
13
OUTPUT
PROBE
14
+5
5K
R1
R2
51Ω
51Ω
RL
11
3
INPUT
CR1
4
+5
9
CL
CR2
R3
6
8
1K
(V1 –)
–10
.1
NOTES:
CR1 — CR4 = IN914
R1 selected for 15.1 divider
R2, 3 selected for 100mV at Pin 4
August 31, 1994
Input
PRR = 1MHz
Pw = 50ns
Tr = Tf = 2ns
Amplitude = 3.00V
+5
Output
RL = 390Ω
CL = 25pF (including
stray capacitance
323
10
V1 + = 10V, V1 – = — 10V
V2 + = 5.0V
5
1
OUTPUT B
0
10
7
Response Time for
Various Input Overdrives
2
+100
6
SUPPLY VOLTAGE (V1 +, V1 –) — VOLTS
3
1
3
0
5
T2 +
4
INPUT
VOLTAGE — mV
SUPPLY CURRENT — mA
OUTPUT
VOLTAGE — V
TA = 25oC
V2 + = 5.0V
T1 –
50
130
Output Propagation Delays
8
6
25
140
TEMPERATURE — oC
Supply Current
vs Supply Voltage
7
0
V2 + = 5.0V
TA = 25oC
150
OUTPUT
VOLTAGE — V
0.4
14
INPUT
VOLTAGE — mV
6
I2 +
POWER DISSIPATION — mW
10
SUPPLY CURRENT — mA
INOUR CURRENT —µ A
12
10
CR3
CR4
25
30
Philips Semiconductors Linear Products
Product specification
Voltage comparator
NE529
range should be limited to values of 2V less than the supply voltages
(V+ and V-) up to a maximum of ±5V as supply voltages are
increased.
APPLICATIONS
One of the main features of the device is that supply voltages (V+,
V-) need not be balanced, as in the following diagrams. For proper
operation, however, negative supply (V-) should always be at least
6V more than the ground terminal (pin 6). Input Common-Mode
It is also important to note that Output A is in phase with Input A and
Output B is in phase with Input B.
LOGIC FUNCTION
VID
(A+, B-)
STROBE A
STROBE B
OUTPUT A
OUTPUT B
VID≤-VOS
H
X
L
H
-VOS<VID<VOS
H
H
Undefined
Undefined
VID≥VOS
X
H
H
L
X
L
L
H
H
TYPICAL APPLICATIONS
+ 5V
+ 5V
λ
R2
R2
1
14
3
1
Q
TTL OUTPUTS
R2
ECL
Q
9
4
9
4
INPUT
10
– 6V
Q
10
6
R1
R1
R1
Q
11
529N
529N
6
14
3
11
R1
– 10V
Photodiode Detector
ECL-to-TTL Interface
+ 5V
VREF
+ 5V
3R1
1
1103
MOS RAM
14
3
TTL INPUT
Q
2K
1
14
3
11
11
529N
529N
Q
100Ω
R1
100Ω
R1
– 10V
– 6V
MOS Memory Sense AMP
August 31, 1994
10
6
10
6
9
4
9
4
– 5.2V
TTL-to-ECL Interface
324
2K