MHL117 / MHL117A / MHL117B / MHL117Q Levels Available MHL117 / MHL117A / MHL117B / MHL117Q SPACE (Formerly SAT117 / SAT117A / SAT117B) DESCRIPTION These devices are space qualified, wide-input range linear regulators designed for military and space flight applications. Hermetically packaged, they provide up to 1.5A of output current. The devices also feature internal thermal shutdown, output currentlimiting circuitry and in one model ±1% initial output accuracy. These are an excellent choice for applications requiring high radiation tolerance, low noise and high power supply rejection ratios. Devices are available in adjustable output voltage configurations. The adjustable version requires only 2 external resistors to program the output from 1.25V to 37V. MHL117 Important: For the latest information, visit our website http://www.microsemi.com. FEATURES • • • • • • Rad-Tolerant to 300K rad TID (Note 1) ELDRS effects free through 50K Rad TID (Note 1) Wide Input Voltage: 40V Space level screening Excellent Temperature Stability 1% Accuracy -55°C to 125°C for MHL117A only APPLICATIONS / BENEFITS • Adjustable over a wide range of output voltages. Table 1 – ABSOLUTE MAXIMUM RATINGS (Tc = +25°C unless otherwise note) (Exceeding maximum ratings may damage the device) Parameters / Test Conditions Symbol Value Unit Vin-Vo 40 V DC Output Voltage Vo 1.2 – 37 V Output Current Io 1.5 A Power Dissipation Tcase = 25°C Pd 50 W Thermal Resistance, Junction to Case R θJC 2.5 °C/W Storage Temperature Tstg -65 to +150 °C Operating Temperature Range Top -55 to +125 °C Maximum Junction Temperature TJ 175 °C Package weight W 5 G Tsolder 300 °C DC Input-Output differential Maximum Soldering Temperature, 10sec MECHANICAL and PACKAGING • Website: www.microsemi.com See page 5 for package information. T4-LDS-0116 Rev. 12 (10/29/13) MSC – Lawrence 6 Lake Street, Lawrence, MA 01841 1-800-446-1158 (978) 620-2600 Fax: (978) 689-0803 ©2013 Microsemi Corporation Page 1 of 5 MHL117 / MHL117A / MHL117B / MHL117Q Table 2 – ELECTRICAL CHARACTERISTICS (Note 9 & 10) (T A = -55°C to +125°C unless otherwise noted) (Nominal reference voltage is 1.25V @ 25°C) PRE-RADIATION Parameters / Test Conditions Symbol MHL117A, MHL117Q Min. Typ Max. Min. Typ Max. MHL117 MHL117B Min. Typ Unit Max. Reference Voltage Accuracy (Note 9) V diff = 3.25V, I L = 10mA (5.25mA for 117) V REF 1.200 1.25 1.300 1.238 1.25 1.262 1.225 1.25 1.275 V Reference Voltage Accuracy V diff = 40V, I L = 10mA (Note 10) (Note 7) V REF 1.200 1.25 1.300 1.225 1.25 1.275 1.200 1.25 1.300 V Line Regulation V out = V ref , I L = 10mA, 3.0 ≤ V diff ≤ 40V (Note 2) (Note 7) Load Regulation V diff = 5.25V, 10mA ≤ I L ≤ 1.5A (Note 2) (Note 8) Adjust-pin Current V diff = 3.3V – 40V, I load = 10mA (Note 7) Adjust-pin Current Change V diff = 5.25V – 40V, I L = 10mA (Note 7) ∆ladj -5 5 -5 5 Adjust-pin Current Change V diff = 5.25V, 10mA ≤ I L ≤ 1.5A (Note 8) ∆ladj -5 5 -5 5 P SRR 65 65 65 dB Short-circuit Current V diff = 10V l os 1.5 1.5 1.5 A Thermal Regulation (Note 4) T A = 25°C V in = 14.6V, II = 1.5A, P d = 20W, t = 20mS V rth -5 Ripple Rejection F = 120Hz, I out = 50mA, V diff = 5.25V, Vr = 2 Vp-p T4-LDS-0116 Rev. 12 (10/29/13) V LINE -10 10 -10 10 -10 10 mV V load -15 15 -15 15 -15 15 mV 100 µA -5 5 µA -5 5 µA 100 I ADJ 5 ©2013 Microsemi Corporation 100 -5 5 -5 5 Page 2 of 5 mV MHL117 / MHL117A / MHL117B / MHL117Q Table 3 – RADIATION RATING Parameters / Test Conditions Symbol Value Unit TID 300 Krads (Si) ELDRS 50 Krads (Si) SET 15 MeV/mg/cm2 SEL / SEB 87.4 MeV/mg/cm Maximum Total Dose (Dose Rate: 50 – 300 rad (Si)/s) ELDRS (Low Dose Rate ≤ 10 mrad (Si)/s) Linear Energy Threshold, Single Event Transient < 100mV Single-Event Latch-up linear Energy threshold (Note 5) Application Circuits 2 Formula for Vout V O = 1.25(1 + Radj / R1) + I ADJ R ADJ T4-LDS-0116 Rev. 12 (10/29/13) ©2013 Microsemi Corporation Page 3 of 5 MHL117 / MHL117A / MHL117B / MHL117Q Table 4 – SCREENING OPTIONS Screening Levels SPACE TESTS MIL-PRF-38534 Certified MIL-STD-883 Method 100 % Non-Destruct Wire-Pull 100% 2023 Pre-Cap Visual 100% 2017 Temperature Cycle 100% 1010 Constant Acceleration 100% 2001 PIND 100% 2020 Pre-Burn-In Electrical (T A = 25°C) Burn-In 100% 100% (320 hours) 1015 Final Electrical 100% Hermeticity (Fine & Gross Leak) 100% 1014 X-Ray (Note 11) 100% 2012 External Visual 100% 2009 NOTES: 1. Certified to Appendix G of MIL-PRF-38534 for Radiation Hardness Assurance (RHA) requirements for Hybrid Microcircuits and Multichip Modules effective June 27, 2013. (See RHA Test Laboratory Suitability) 2. Load & Line regulation is measured at constant (T J ) junction temperature using a low duty cycle pulse. Changes in output voltage due to heating effects must be evaluated separately. 3. TID Radiation Testing is performed per MIL-STD-883, Method 1019. “ELDRS tested per MIL-STD883 method 1019 par. 3.13.11. 4. Not Tested. 5. Latch up immune due to DI process. 6. Internal SOA protection limits output current with high input voltages. 7. Vdiff = 39V @ 125°C 8. At 125°C, 1.5A is achievable at an I/O differential of 6.75V. At the stated 5.25V differential, 1.25A is achievable at 125°C. 9. For MHL117Q, these specifications hold at 25°C only. 10. For MHL117Q, these specifications hold also for the above input conditions at temperature extremes. 11. Performed at a DLA approved facility. T4-LDS-0116 Rev. 12 (10/29/13) ©2013 Microsemi Corporation Page 4 of 5 MHL117 / MHL117A / MHL117B / MHL117Q PACKAGE OUTLINE – TABLESS TO-257 (D2) Pin No 1 2 3 Pin Name ADJ/GND OUT IN Case Pin Description Adjust Pin Output Voltage Input Voltage No Connection- Isolated (SMT lead bend shown) ORDERING INFORMATION PART NUMBER REGULATOR ACCURACY MHL117 40K &# 40V Standard MHL117A 40K &# 40V 1% Accuracy MHL117B 40K &# 40V 2% Accuracy MHL117Q 40K &# 40V 1% Accuracy at 25°C, 2% Accuracy at temperature extremes Replace “&” with the dash and number to indicate lead bend option -1 -2 -3 -4 Straight* SMT Down* Up* * Contact factory for package outline Replace “#” with lead finish option letter C = gold plate A = solder dip over gold plate T4-LDS-0116 Rev. 12 (10/29/13) ©2013 Microsemi Corporation Page 5 of 5