Detailed Information for Erratum SECF196

Freescale Semiconductor
Engineering Bulletin
Document Number: EB740
Rev. 0, 04/2011
Detailed Information for Erratum
SECF196
This engineering bulletin provides additional detail and
clarification on erratum SECF196 affecting the ColdFire
MCF532x and MCF537x devices. The objective of this
document is to explain the cause and effects of the issue
in greater detail and provide information on how systems
might be impacted.
Contents
1
2
3
1
Description
During a power-on reset (POR), some power ramp and
clock startup sequences can cause some pins to drive
undefined values for a period of time during the reset
sequence. Undefined signal states can be driven on
FlexBus, SDRAMC, and BDM pins if the device exits
POR with no internal clock present.
Initially the pins are tri-stated while IVDD and
EVDD/SDVDD are not fully powered. As the voltage
rails ramp to the operating levels, the processor releases
the pins from tri-state and the pin states are determined
by digital control logic. However, the digital logic needs
© Freescale Semiconductor, Inc., 2011. All rights reserved.
Description. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
1.1 Timing diagram . . . . . . . . . . . . . . . . . . . . . . . . . . . .
1.2 Affected signals . . . . . . . . . . . . . . . . . . . . . . . . . . . .
System impact . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
2.1 FlexBus impact . . . . . . . . . . . . . . . . . . . . . . . . . . . .
2.2 SDRAM impact . . . . . . . . . . . . . . . . . . . . . . . . . . . .
2.3 BDM impact . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Workarounds . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
3.1 Workaround step 1: Generate a qualifier signal . . .
3.2 Workaround step 2: Qualify signals. . . . . . . . . . . . .
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Description
several clock cycles to initialize, so the pins can be driven by uninitialized logic for a period of time while
the digital logic initializes to the reset state.
1.1
Timing diagram
Figure 1 shows an example of power-on reset (POR) timing that causes undefined signal states on
FlexBus, SDRAM, and BDM pins. For clarity the diagram includes POR and pad enable signals. These
are internal signals of the processor, so they are not visible externally.
The undefined pin state
can be driven out starting
when EVDD/SDVDD and
IVDD ramp to the point
where the internal POR is
released.
EVDD/SDVDD
FlexBus, SDRAM, and BDM
reach a known state after several
internal clocks, which ends the
undefined pin state. If the clocks
startup before the POR is
released, then the undefined pin
signal states could be eliminated.
IVDD
POR
Pad Enable
FB_CSn
Undefined
/RSTO
Clock
Figure 1. Power-on reset sequence causing undefined signal states
1.2
Affected signals
Table 1 lists the FlexBus, SDRAMC, and BDM signals and describes how they are impacted.
Detailed Information for Erratum SECF196, Rev. 0
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Freescale Semiconductor
System impact
Table 1. MCF532x and MCF537x signals that can have undefined states during POR
Module
Signals
Undefined?
Description
FlexBus
Yes
A[23:0], D[31:0],
BE/BWE[3:0], OE, R/W, TS,
FB_CS[5:0]
Most FlexBus signals are in an undefined state any time between the
release of the internal POR signal and clock startup.
FlexBus
TA
The TA signal is always an input and it will be configured as an input at
POR; therefore, this signal is in a defined state.
SDRAMC
Yes
SD_A10, SD_CLK,
SD_CS[1:0], SD_DQS[3:2],
SD_SCAS, SD_SRAS,
SD_SDR_DQS, SD_WE
Most SDRAMC signals are in an undefined state any time between the
release of the internal POR signal and clock startup.
SDRAMC
SD_CKE
As part of the fix for an earlier erratum (SECF045) on any 3M29B and
later devices, the SD_CKE signal is forced to drive high when the
internal POR is released.
No
No
Note: On 2M29B and earlier parts the state of SD_CKE can be
undefined.
SDRAMC
SD_CLK
No
As part of the fix for an earlier erratum (SECF045) on any 3M29B and
later devices, the SD_CLK signal is driven with a digital version of the
input clock on EXTAL when the internal POR is released.
BDM/JTAG PSTCLK, DSO, DDATA[3:0], Depends on If JTAG functions are selected (JTAG_EN = 1), then pin states are
PST[3:0], ALLPST
JTAG_EN
defined. If BDM functions are selected (JTAG_EN = 0), the BDM outputs
are undefined until clock start.
BDM/JTAG DSI, BKPT
No
These signals are inputs in both BDM and JTAG mode, and they will
default to inputs when the internal POR is released.
BDM/JTAG JTAG_EN
No
This input signal is used to select between BDM and JTAG functions. It
is configured as an input and sampled when the internal POR is
released.
2
System impact
Depending on how the processor signals are used in the rest of the system, an undefined pin state could
cause unexpected behavior for a device external to the processor. Because the undefined pin states are
temporary (pins will enter a defined state before the processor exits reset), in many cases the undefined pin
states will not cause a functional issue for the system.
2.1
FlexBus impact
The possibility of impact to devices on the FlexBus depends on the types of memory used in the system.
Table 2 lists some common devices that might be used in a system and how they could be impacted by
undefined signal states.
Detailed Information for Erratum SECF196, Rev. 0
Freescale Semiconductor
3
System impact
Table 2. Potential impact of undefined signal states on common FlexBus devices
Device type
Impacted?
Comments
NOR flash
No
Because NOR flash devices require a specific sequence with multiple
steps to erase or write memory, the undefined signal states cannot corrupt
NOR flash contents.
SRAM
No
Because SRAM contents are undefined at power-on reset, any accidental
writes to RAM caused by the undefined signal states should not impact the
system.
Note: If the SRAM has a battery backup or is powered independently of
the processor such that its contents are defined at the time the
processor goes through a power-on reset, then data corruption is
possible.
MRAM/FRAM
Yes
Any nonvolatile memory device with an asynchronous bus interface could
be impacted. Because the memory contents are retained, accidental
writes to the memory caused by the undefined signal states could corrupt
the non-volatile data.
CPLDs, FPGAs, and
external peripherals
Depends
Because the use of these devices can vary and in some cases is
user-defined, we are unable to make an accurate assessment of how
these types of devices could be impacted.
2.2
SDRAM impact
The SDRAMC on the MCF537x/MCF532x family is a special case. To fix an earlier erratum (SECF045),
the SD_CLK signal is driven as soon as clocks are detected and SD_CKE is driven high. Because of this
fix, there will be a short overlap between undefined pin states on the SDRAM control signals and SD_CLK
starting up. This can allow an SDRAM to latch an erroneous SDRAM command.
During initial startup, the SDRAM doesn’t allow any commands except NOP and COMMAND INHIBIT.
Undefined signal states on the SDRAMC signals could potentially be recognized as other commands and
cause undefined operation of the SDRAM. If the undefined operation of the SDRAM causes the SDRAM
to drive the data bus, it could potentially cause interference with chip configuration and code fetches.
2.2.1
Non-split bus configurations
If a non-split bus configuration is used, then the SDRAM shares data lines with the FlexBus. Data line
contention between the SDRAM, FlexBus devices, and/or the MCU is possible. If a 32-bit wide SDRAM
is used, then it could potentially cause interference with latching of chip configuration values on the
FB_D[9:1]/RCON[9:1] signals. Contention while latching chip configuration values and/or boot code
could result in boot failures.
2.2.2
Split bus configuration
If a split bus configuration is used, then the SDRAM bus has a 16-bit wide dedicated data bus. Because
the data lines are not shared with the FlexBus or chip configuration pins in this configuration, no issues
are expected as a result of the undefined signal states on the SDRAMC signals.
Detailed Information for Erratum SECF196, Rev. 0
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Freescale Semiconductor
Workarounds
2.3
BDM impact
If the BDM signals are enabled (JTAG_EN = 0), then BDM outputs could also drive undefined signal
states during reset. Because the BDM signals are not multiplexed with any module pins, in most systems
these signals would route only to a BDM/JTAG header. Therefore, undefined pin states on BDM signals
are not expected to cause functional problems for systems.
3
Workarounds
The undefined pin states occur only during a power-on reset (POR) — the /RESET and/or /RSTOUT
signals can be used to qualify FlexBus and SDRAMC signals. In most cases, the only signals that will need
to be qualified are the FlexBus chip select and SDRAM chip select signals. By using qualified versions of
the chip selects to connect to external devices, you can prevent those external devices from sampling the
undefined pin states on address, data, and other control signals.
3.1
Workaround step 1: Generate a qualifier signal
The first step to the workaround is to generate a signal that can be used to qualify or mask the undefined
signal states on the chip select signals (or other control signals as needed). Determining the qualifier to use
can require some characterization of power and reset signal operation in the system. The idea is to find a
signal or combination of signals that remains high throughout the time when the undefined signal states
can occur.
Theoretically the RSTOUT signal could be used to qualify signals; however, because RSTOUT asserts low
at the same time that the undefined signal states start to drive on other pins, if this signal were used as a
qualifier alone, there could be small glitches while waiting for RSTOUT to propagate through logic. For
this reason Freescale doesn’t recommend using RSTOUT on its own as a qualifier.
If the system keeps the RESET input signal to the processor asserted during system power-up and through
the start of clocks, then the RESET signal could be used to generate the qualifier signal as shown in
Figure 2.
/RESET
Chip Select
Qualifier
Figure 2. Generating a qualifier signal using RESET
If the system is not guaranteed to keep the RESET input signal asserted through the start of clocks, then a
combination of the RESET and RSTOUT signals could be used instead as shown in Figure 3. It is
important that there be a period of time during which RESET and RSTOUT are asserted simultaneously,
to avoid possible glitches.
Detailed Information for Erratum SECF196, Rev. 0
Freescale Semiconductor
5
Workarounds
/RESET
/RSTO UT
Chip Select
Q ualifier
Figure 3. Generating a qualifier signal Using RESET and RSTOUT
3.2
Workaround step 2: Qualify signals
For many systems there might be only a small number of chip selects or other control signals that need to
be qualified to prevent the undefined signal states from reaching external devices. If there are only a small
number of signals that need to be qualified, then adding discrete logic gates might be the best solution.
Figure 4 shows an example of how a chip select signal could be qualified using an OR gate.
Chip Select Qualifier
Chip Select to
External Device
/FB_CSn
Figure 4. Qualifying a chip select using an OR gate
There are up to eight chip select signals available on the MCF532x/7x family devices — six FlexBus chip
selects and two SDRAM chip selects. This means that all of the chip select signals on the processor could
be qualified using a single 8-bit tri-statable buffer as shown in Figure 5.
C h ip S e le c t Q u a lifie r
/O E
/F B _ C S 0
D0
O0
/M E M _ F B _C S0
/F B _ C S 1
D1
O1
/M E M _ F B _C S1
/F B _ C S 2
D2
O2
/M E M _ F B _C S2
/F B _ C S 3
D3
O3
/M E M _ F B _C S3
/F B _ C S 4
D4
O4
/M E M _ F B _C S4
/F B _ C S 5
D5
O5
/M E M _ F B _C S5
/S D _ C S 0
D6
O6
/M E M _ S D _C S0
/S D _ C S 1
D7
O7
/M E M _ S D _C S1
Figure 5. Qualifying all chip selects using a buffer
In Figure 5, “MEM_” is used to differentiate the chip select signals from the processor and the qualified
versions that would be connected to external memories. Each of the “MEM_” signals should include a
pullup resistor to force the signal high while the buffer is disabled.
Detailed Information for Erratum SECF196, Rev. 0
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Detailed Information for Erratum SECF196, Rev. 0
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Document Number: EB740
Rev. 0
04/2011
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