Features • Low-voltage and Standard-voltage Operation • • • • • • • • • • – 2.7 (VCC = 2.7V to 5.5V) – 1.8 (VCC = 1.8V to 5.5V) User Selectable Internal Organization – 16K: 2048 x 8 or 1024 x 16 Three-wire Serial Interface Sequential Read Operation Schmitt Trigger, Filtered Inputs for Noise Suppression 2 MHz Clock Rate (5V) Compatibility Self-timed Write Cycle (10 ms max) High Reliability – Endurance: 1 Million Write Cycles – Data Retention: 100 Years Automotive Devices Available 8-lead JEDEC PDIP, 8-lead JEDEC SOIC, 8-lead Ultra Thin Mini-MAP (MLP 2x3), and 8lead TSSOP Packages Die Sales: Wafer Form, Waffle Pack and Bumped Wafers Description The AT93C86A provides 16384 bits of serial electrically erasable programmable read only memory (EEPROM), organized as 1024 words of 16 bits each when the ORG pin is connected to VCC and 2048 words of eight bits each when it is tied to ground. The device is optimized for use in many industrial and commercial applications where lowpower and low-voltage operations are essential. The AT93C86A is available in space saving 8-lead PDIP, 8-lead JEDEC SOIC, 8-lead Ultra Thin Mini-MAP (MLP 2x3), and 8lead TSSOP packages. Table 1. Pin Configurations Function CS Chip Select SK Serial Data Clock DI Serial Data Input DO Serial Data Output GND Ground VCC Power Supply ORG Internal Organization NC No Connect 8-lead Ultra Thin Mini-MAP (MLP 2x3) CS SK 3 DI 4 DO 8 1 7 2 6 5 16K (2048 x 8 or 1024 x 16) AT93C86A 8-lead PDIP Pin Name VCC NC ORG GND Three-wire Serial EEPROM Bottom View CS SK DI DO 1 2 3 4 8 7 6 5 VCC NC ORG GND 8-lead SOIC CS SK DI DO 1 2 3 4 VCC NC ORG GND 8 7 6 5 8-lead TSSOP CS SK DI DO 1 2 3 4 8 7 6 5 VCC NC ORG GND Rev. 3408H–SEEPR–1/07 1 The AT93C86A is enabled through the Chip Select pin (CS), and accessed via a threewire serial interface consisting of Data Input (DI), Data Output (DO), and Shift Clock (SK). Upon receiving a Read instruction at DI, the address is decoded and the data is clocked out serially on the data output pin DO. The Write cycle is completely self-timed and no separate Erase cycle is required before Write. The Write cycle is only enabled when the part is in the Erase/Write Enable state. When CS is brought “high” following the initiation of a Write cycle, the DO pin outputs the Ready/Busy status of the part. The AT93C86A is available in a 2.7V to 5.5V version. Absolute Maximum Ratings* *NOTICE: Operating Temperature......................................−55°C to +125°C Storage Temperature .........................................−65°C to +150°C Voltage on any Pin with Respect to Ground ........................................ −1.0V to +7.0V Maximum Operating Voltage .......................................... 6.25V DC Output Current........................................................ 5.0 mA Stresses beyond those listed under “Absolute Maximum Ratings” may cause permanent damage to the device. This is a stress rating only and functional operation of the device at these or any other conditions beyond those indicated in the operational sections of this specification is not implied. Exposure to absolute maximum rating conditions for extended periods may affect device reliability Figure 1. Block Diagram Vcc GND MEMORY ARRAY ORG 2048 x 8 OR 1024 x 16 ADDRESS DECODER DATA REGISTER OUTPUT BUFFER DI Note: 2 CS MODE DECODE LOGIC SK CLOCK GENERATOR DO When the ORG pin is connected to Vcc, the x 16 organization is selected. When it is connected to ground, the x 8 organization is selected. If the ORG pin is left unconnected and the application does not load the input beyond the capability of the internal 1 Meg ohm pullup, then the x 16 organization is selected. AT93C86A 3408H–SEEPR–1/07 AT93C86A Table 2. Pin Capacitance(1) Applicable over recommended operating range from TA = 25°C, f = 1.0 MHz, VCC = +5.0V (unless otherwise noted) Symbol Test Conditions COUT CIN Note: Max Units Conditions Output Capacitance (DO) 5 pF VOUT = 0V Input Capacitance (CS, SK, DI) 5 pF VIN = 0V 1. This parameter is characterized and is not 100% tested. Table 3. DC Characteristics Applicable over recommended operating range from: TAI = −40°C to +85°C, VCC = +1.8V to +5.5V, TAE = −40°C to +125°C, VCC = +1.8V to +5.5V (unless otherwise noted) Symbol Parameter VCC1 Supply Voltage VCC2 Test Condition Min Typ Max Unit 1.8 5.5 V Supply Voltage 2.7 5.5 V VCC3 Supply Voltage 4.5 5.5 V ICC Supply Current VCC = 5.0V ISB1 Standby Current VCC = 1.8V ISB2 Standby Current ISB3 READ at 1.0 MHz 0.5 2.0 mA WRITE at 1.0 MHz 0.5 2.0 mA CS = 0V 0 0.1 µA VCC = 2.7V CS = 0V 6.0 10.0 µA Standby Current VCC = 5.0V CS = 0V 17 30 µA IIL Input Leakage VIN = 0V to VCC 0.1 3.0 µA IOL Output Leakage VIN = 0V to VCC 0.1 3.0 µA VIL1(1) VIH1(1) Input Low Voltage Input High Voltage 2.7V ≤ VCC ≤ 5.5V --−0.6 2.0 0.8 VCC + 1 V VIL2(1) VIH2(1) Input Low Voltage Input High Voltage 1.8V ≤ VCC ≤ 2.7V −0.6 VCC x 0.7 VCC x 0.3 VCC + 1 V VOL1 VOH1 Output Low Voltage Output High Voltage 2.7V ≤ VCC ≤ 5.5V 0.4 V VOL2 VOH2 Output Low Voltage Output High Voltage 1.8V ≤ VCC ≤ 2.7V Note: IOL = 2.1 mA IOH = –0.4 mA 2.4 IOL = 0.15 mA IOH = –100 µA V 0.2 VCC – 0.2 V V 1. VIL min and VIH max are reference only and are not tested. 3 3408H–SEEPR–1/07 Table 4. AC Characteristics Applicable over recommended operating range from TAI = −40°C to + 85°C, TAE = −40°C to +125°C, VCC = As Specified, CL = 1 TTL Gate and 100 pF (unless otherwise noted) Symbol Parameter Test Condition fSK SK Clock Frequency 4.5V ≤ VCC ≤ 5.5V 2.7V ≤ VCC ≤ 5.5V 1.8V ≤ VCC ≤ 5.5V 0 0 0 tSKH SK High Time 2.7V ≤ VCC ≤ 5.5V 1.8V ≤ VCC ≤ 5.5V 250 1000 ns tSKL SK Low Time 2.7V ≤ VCC ≤ 5.5V 1.8V ≤ VCC ≤ 5.5V 250 1000 ns tCS Minimum CS Low Time 2.7V ≤ VCC ≤ 5.5V 1.8V ≤ VCC ≤ 5.5V 250 1000 ns tCSS CS Setup Time Relative to SK 2.7V ≤ VCC ≤ 5.5V 1.8V ≤ VCC ≤ 5.5V 50 200 ns tDIS DI Setup Time Relative to SK 2.7V ≤ VCC ≤ 5.5V 1.8V ≤ VCC ≤ 5.5V 100 400 ns tCSH CS Hold Time Relative to SK 0 ns tDIH DI Hold Time Relative to SK 2.7V ≤ VCC ≤ 5.5V 1.8V ≤ VCC ≤ 5.5V 100 400 ns tPD1 Output Delay to “1” AC Test 2.7V ≤ VCC ≤ 5.5V 1.8V ≤ VCC ≤ 5.5V 250 1000 ns tPD0 Output Delay to “0” AC Test 2.7V ≤ VCC ≤ 5.5V 1.8V ≤ VCC ≤ 5.5V 250 1000 ns tSV CS to Status Valid AC Test 2.7V ≤ VCC ≤ 5.5V 1.8V ≤ VCC ≤ 5.5V 250 1000 ns tDF CS to DO in High Impedance AC Test CS = VIL 2.7V ≤ VCC ≤ 5.5V 1.8V ≤ VCC ≤ 5.5V 150 400 ns tWP Write Cycle Time 10 ms Endurance Note: 4 (1) 5.0V, 25°C Min 1.8V ≤ VCC ≤ 5.5V 0.1 Typ 3 Max Units 2 1 0.25 MHz ms 1M Write Cycles 1. This parameter is ensured by characterization. AT93C86A 3408H–SEEPR–1/07 AT93C86A Table 5. Instruction Set for the AT93C86A Address Instruction Data SB Op Code x8 x 16 READ 1 10 A10 – A0 A9 – A0 Reads data stored in memory, at specified address. EWEN 1 00 11XXXXXXXXX 11XXXXXXXX Write enable must precede all programming modes. ERASE 1 11 A10 – A0 A9 – A0 WRITE 1 01 A10 – A0 A9 – A0 ERAL 1 00 10XXXXXXXXX 10XXXXXXXX WRAL 1 00 01XXXXXXXXX 01XXXXXXXX EWDS 1 00 00XXXXXXXXX 00XXXXXXXX Functional Description x8 x 16 Comments Erases memory location An – A0. D7 – D0 D15 – D0 Writes memory location An – A0. Erases all memory locations. Valid only at VCC = 4.5V to 5.5V. D7 – D0 D15 – D0 Writes all memory locations. Valid when VCC = 4.5V to 5.5V and Disable Register cleared. Disables all programming instructions. The AT93C86A is accessed via a simple and versatile three-wire serial communication interface. Device operation is controlled by seven instructions issued by the host processor. A valid instruction starts with a rising edge of CS and consists of a Start Bit (logic “1”) followed by the appropriate Op Code and the desired memory address location. READ (READ): The Read (READ) instruction contains the address code for the memory location to be read. After the instruction and address are decoded, data from the selected memory location is available at the serial output pin DO. Output data changes are synchronized with the rising edges of serial clock SK. It should be noted that a dummy bit (logic “0”) precedes the 8- or 16-bit data output string. The AT93C86A supports sequential read operations. The device will automatically increment the internal address pointer and clock out the next memory location as long as CS is held high. In this case, the dummy bit (logic “0”) will not be clocked out between memory locations, thus allowing for a continuous stream of data to be read. ERASE/WRITE (EWEN): To assure data integrity, the part automatically goes into the Erase/Write Disable (EWDS) state when power is first applied. An Erase/Write Enable (EWEN) instruction must be executed first before any programming instructions can be carried out. Please note that once in the EWEN state, programming remains enabled until an EWDS instruction is executed or VCC power is removed from the part. ERASE (ERASE): The Erase (ERASE) instruction programs all bits in the specified memory location to the logical “1” state. The self-timed erase cycle starts once the ERASE instruction and address are decoded. The DO pin outputs the Ready/Busy status of the part if CS is brought high after being kept low for a minimum of 250 ns (tCS). A logic “1” at pin DO indicates that the selected memory location has been erased, and the part is ready for another instruction. WRITE (WRITE): The Write (WRITE) instruction contains the 8 or 16 bits of data to be written into the specified memory location. The self-timed programming cycle tWP starts after the last bit of data is received at serial data input pin DI. The DO pin outputs the Ready/Busy status of the part if CS is brought high after being kept low for a minimum of 5 3408H–SEEPR–1/07 250 ns (tCS). A logic “0” at DO indicates that programming is still in progress. A logic “1” indicates that the memory location at the specified address has been written with the data pattern contained in the instruction and the part is ready for further instructions. A Ready/Busy status cannot be obtained if the CS is brought high after the end of the selftimed programming cycle tWP. ERASE ALL (ERAL): The Erase All (ERAL) instruction programs every bit in the memory array to the logic “1” state and is primarily used for testing purposes. The DO pin outputs the Ready/Busy status of the part if CS is brought high after being kept low for a minimum of 250 ns (tCS). The ERAL instruction is valid only at VCC = 5.0V ± 10%. WRITE ALL (WRAL): The Write All (WRAL) instruction programs all memory locations with the data patterns specified in the instruction. The DO pin outputs the Ready/Busy status of the part if CS is brought high after being kept low for a minimum of 250 ns (tCS). The WRAL instruction is valid only at VCC = 5.0V ± 10%. ERASE/WRITE DISABLE (EWDS): To protect against accidental data disturbance, the Erase/Write Disable (EWDS) instruction disables all programming modes and should be executed after all programming operations. The operation of the READ instruction is independent of both the EWEN and EWDS instructions and can be executed at any time. 6 AT93C86A 3408H–SEEPR–1/07 AT93C86A Timing Diagrams Figure 2. Synchronous Data Timing Note: 1. This is the minimum SK period. Organization Key for Timing Diagrams AT93C86A (16K) I/O x8 x 16 AN A10 A9 DN D7 D15 Figure 3. READ Timing 7 3408H–SEEPR–1/07 Figure 4. EWEN Timing tCS CS SK DI 1 0 0 1 ... 1 Figure 5. EWDS Timing tCS CS SK DI 1 0 0 0 ... 0 Figure 6. WRITE Timing tCS CS SK DI DO 1 0 1 AN ... A0 DN ... D0 HIGH IMPEDANCE BUSY READY tWP 8 AT93C86A 3408H–SEEPR–1/07 AT93C86A Figure 7. WRAL Timing(1) tCS CS SK DI DO 1 0 0 0 1 ... DN ... D0 BUSY HIGH IMPEDANCE READY tWP Note: 1. Valid only at VCC = 4.5V to 5.5V. Figure 8. ERASE Timing tCS CS STANDBY CHECK STATUS SK DI 1 1 1 AN AN-1 AN-2 ... A0 tDF tSV DO HIGH IMPEDANCE HIGH IMPEDANCE BUSY READY tWP 9 3408H–SEEPR–1/07 Figure 9. ERAL Timing(1) Note: 10 1. Valid only at VCC = 4.5V to 5.5V. AT93C86A 3408H–SEEPR–1/07 AT93C86A AT93C86A Ordering Information(1) Ordering Code Package Operation Range 8P3 8P3 8S1 8S1 8A2 8A2 8Y1 8Y6 Lead-Free/Halogen-Free/ Industrial Temperature (−40°C to 85°C) Die Sale Industrial Temperature (−40°C to 85°C) (2) AT93C86A-10PU-2.7 AT93C86A-10PU-1.8(2) AT93C86A-10SU-2.7(2) AT93C86A-10SU-1.8(2) AT93C86A-10TU-2.7(2) AT93C86A-10TU-1.8(2) AT93C86AY1-10YU-1.8(2)(Not recommended for new design) AT93C86AY6-10YH-1.8(3) AT93C86A-W1.8-11(4) Notes: 1. 2. 3. 4. For 2.7V devices used in a 4.5V to 5.5V range, please refer to performance values in the AC and DC characteristics tables. “U” designates Green package + RoHS compliant. “H” designates Green Package + RoHS compliant, with NiPdAu Lead Finish. Available in Waffle pack and Wafer form; order as SL788 for inkless Wafer form. Bumped die available upon request. Please contact Serial EEPROM marketing. Package Type 8P3 8-lead, 0.300" Wide, Plastic Dual Inline Package (PDIP) 8S1 8-lead, 0.150" Wide, Plastic Gull Wing Small Outline (JEDEC SOIC) 8A2 8-lead, 0.170" Wide, Thin Shrink Small Outline Package (TSSOP) 8Y1 8-lead, 4.90 mm x 3.00 mm Body, Dual Footprint, Non-leaded, Miniature Array Package (MAP) 8Y6 8-lead, 2.00 mm x 3.00 mm Body, 0.50 mm Pitch, Ultra Thin Mini-MAP, Dual No Lead Package (DFN), (MLP 2x3 mm) Options −2.7 Low Voltage (2.7V to 5.5V) −1.8 Low Voltage (1.8V to 5.5V) 11 3408H–SEEPR–1/07 Packaging Information 8P3 – PDIP E 1 E1 N Top View c eA End View COMMON DIMENSIONS (Unit of Measure = inches) D e D1 A2 A MIN NOM A2 0.115 0.130 0.195 b 0.014 0.018 0.022 5 b2 0.045 0.060 0.070 6 b3 0.030 0.039 0.045 6 c 0.008 0.010 0.014 D 0.355 0.365 0.400 D1 0.005 E 0.300 0.310 0.325 4 E1 0.240 0.250 0.280 3 SYMBOL A b2 b3 b 4 PLCS Side View L Notes: NOTE 0.210 0.100 BSC eA 0.300 BSC 0.115 2 3 3 e L MAX 0.130 4 0.150 2 1. This drawing is for general information only; refer to JEDEC Drawing MS-001, Variation BA for additional information. 2. Dimensions A and L are measured with the package seated in JEDEC seating plane Gauge GS-3. 3. D, D1 and E1 dimensions do not include mold Flash or protrusions. Mold Flash or protrusions shall not exceed 0.010 inch. 4. E and eA measured with the leads constrained to be perpendicular to datum. 5. Pointed or rounded lead tips are preferred to ease insertion. 6. b2 and b3 maximum dimensions do not include Dambar protrusions. Dambar protrusions shall not exceed 0.010 (0.25 mm). 01/09/02 R 12 2325 Orchard Parkway San Jose, CA 95131 TITLE 8P3, 8-lead, 0.300" Wide Body, Plastic Dual In-line Package (PDIP) DRAWING NO. REV. 8P3 B AT93C86A 3408H–SEEPR–1/07 AT93C86A 8Y6 - MLP 2x3 mm D2 A b (8X) E E2 Pin 1 Index Area Pin 1 ID L (8X) D A2 e (6X) A1 1.50 REF. A3 COMMON DIMENSIONS (Unit of Measure = mm) SYMBOL MIN 2.00 BSC E 3.00 BSC MAX D2 1.40 1.50 1.60 E2 - - 1.40 A - - 0.60 A1 0.0 0.02 0.05 A2 - - 0.55 A3 L b NOTE 0.20 REF 0.20 e Notes: NOM D 0.30 0.40 0.50 BSC 0.20 0.25 0.30 2 1. This drawing is for general information only. Refer to JEDEC Drawing MO-229, for proper dimensions, tolerances, datums, etc. 2. Dimension b applies to metallized terminal and is measured between 0.15 mm and 0.30 mm from the terminal tip. If the terminal has the optional radius on the other end of the terminal, the dimension should not be measured in that radius area. 8/26/05 R 2325 Orchard Parkway San Jose, CA 95131 DRAWING NO. TITLE 8Y6, 8-lead 2.0 x 3.0 mm Body, 0.50 mm Pitch, Utlra Thin Mini-Map, 8Y6 Dual No Lead Package (DFN) ,(MLP 2x3) REV. C 13 3408H–SEEPR–1/07 8S1 – JEDEC SOIC C 1 E E1 L N ∅ Top View End View e B COMMON DIMENSIONS (Unit of Measure = mm) A SYMBOL A1 D Side View MIN NOM MAX A 1.35 – 1.75 A1 0.10 – 0.25 B 0.31 – 0.51 C 0.17 – 0.25 D 4.80 – 5.00 E1 3.81 – 3.99 E 5.79 – 6.20 e NOTE 1.27 BSC L 0.40 – 1.27 ∅ 0° – 8° Note: These drawings are for general information only. Refer to JEDEC Drawing MS-012, Variation AA for proper dimensions, tolerances, datums, etc. 10/7/03 R 14 1150 E. Cheyenne Mtn. Blvd. Colorado Springs, CO 80906 TITLE 8S1, 8-lead (0.150" Wide Body), Plastic Gull Wing Small Outline (JEDEC SOIC) DRAWING NO. 8S1 REV. B AT93C86A 3408H–SEEPR–1/07 AT93C86A 8A2 – TSSOP 3 2 1 Pin 1 indicator this corner E1 E L1 N L Top View End View COMMON DIMENSIONS (Unit of Measure = mm) SYMBOL A b D MIN NOM MAX NOTE 2.90 3.00 3.10 2, 5 3, 5 E e D A2 6.40 BSC E1 4.30 4.40 4.50 A – – 1.20 A2 0.80 1.00 1.05 b 0.19 – 0.30 e Side View L 0.65 BSC 0.45 L1 Notes: 4 0.60 0.75 1.00 REF 1. This drawing is for general information only. Refer to JEDEC Drawing MO-153, Variation AA, for proper dimensions, tolerances, datums, etc. 2. Dimension D does not include mold Flash, protrusions or gate burrs. Mold Flash, protrusions and gate burrs shall not exceed 0.15 mm (0.006 in) per side. 3. Dimension E1 does not include inter-lead Flash or protrusions. Inter-lead Flash and protrusions shall not exceed 0.25 mm (0.010 in) per side. 4. Dimension b does not include Dambar protrusion. Allowable Dambar protrusion shall be 0.08 mm total in excess of the b dimension at maximum material condition. Dambar cannot be located on the lower radius of the foot. Minimum space between protrusion and adjacent lead is 0.07 mm. 5. Dimension D and E1 to be determined at Datum Plane H. 5/30/02 R 2325 Orchard Parkway San Jose, CA 95131 TITLE 8A2, 8-lead, 4.4 mm Body, Plastic Thin Shrink Small Outline Package (TSSOP) DRAWING NO. 8A2 REV. B 15 3408H–SEEPR–1/07 8Y1 - MAP PIN 1 INDEX AREA A 1 3 2 4 PIN 1 INDEX AREA E1 D1 D L 8 Bottom View COMMON DIMENSIONS (Unit of Measure = mm) A Side View 5 e End View Top View 6 b A1 E 7 SYMBOL MIN NOM MAX A – – 0.90 A1 0.00 – 0.05 D 4.70 4.90 5.10 E 2.80 3.00 3.20 D1 0.85 1.00 1.15 E1 0.85 1.00 1.15 b 0.25 0.30 0.35 e L NOTE 0.65 TYP 0.50 0.60 0.70 2/28/03 R 16 2325 Orchard Parkway San Jose, CA 95131 TITLE 8Y1, 8-lead (4.90 x 3.00 mm Body) MSOP Array Package (MAP) Y1 DRAWING NO. REV. 8Y1 C AT93C86A 3408H–SEEPR–1/07 AT93C86A Revision History Doc. Rev. Date Comments 3408H 1/2007 Add “Bottom View” to pg 1 Ultra Thin MiniMap package drawing pg 4 revise Note 1 added “ensured by characterization” 3408G 7/2006 Revision history implemented. Deleted ‘Preliminary’ status from datasheet; Added ‘Ultra Thin’ description to MLP 2x3 package; Deleted ‘1.8V not available’ on Figure 1 Note; Added 1.8V range on Table 4 under Write Cycle Time. 17 3408H–SEEPR–1/07 Atmel Corporation 2325 Orchard Parkway San Jose, CA 95131, USA Tel: 1(408) 441-0311 Fax: 1(408) 487-2600 Regional Headquarters Europe Atmel Sarl Route des Arsenaux 41 Case Postale 80 CH-1705 Fribourg Switzerland Tel: (41) 26-426-5555 Fax: (41) 26-426-5500 Asia Room 1219 Chinachem Golden Plaza 77 Mody Road Tsimshatsui East Kowloon Hong Kong Tel: (852) 2721-9778 Fax: (852) 2722-1369 Japan 9F, Tonetsu Shinkawa Bldg. 1-24-8 Shinkawa Chuo-ku, Tokyo 104-0033 Japan Tel: (81) 3-3523-3551 Fax: (81) 3-3523-7581 Atmel Operations Memory 2325 Orchard Parkway San Jose, CA 95131, USA Tel: 1(408) 441-0311 Fax: 1(408) 436-4314 Microcontrollers 2325 Orchard Parkway San Jose, CA 95131, USA Tel: 1(408) 441-0311 Fax: 1(408) 436-4314 La Chantrerie BP 70602 44306 Nantes Cedex 3, France Tel: (33) 2-40-18-18-18 Fax: (33) 2-40-18-19-60 ASIC/ASSP/Smart Cards Zone Industrielle 13106 Rousset Cedex, France Tel: (33) 4-42-53-60-00 Fax: (33) 4-42-53-60-01 RF/Automotive Theresienstrasse 2 Postfach 3535 74025 Heilbronn, Germany Tel: (49) 71-31-67-0 Fax: (49) 71-31-67-2340 1150 East Cheyenne Mtn. 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