SCA1020-D06 PRODUCT SPECIFICATION FOR ZY-DUAL AXIS ACCELEROMETER SCA1020 – D06 Murata Electronics Oy www.muratamems.fi Doc. Nr. 8263900 1/19 Rev.B SCA1020-D06 Table of Contents 1 2 General description ...................................................................................................... 3 1.1 Block diagram ...................................................................................................... 3 1.2 SCA1020 family Accelerometer Features ............................................................ 3 Electrical specifications ................................................................................................ 4 2.1 3 4 2.1.1 Recommended connection when SPI interface is used .................................... 5 2.1.2 Recommended connection when analog output is used .................................. 5 2.1.3 Recommended EMC protection circuitry .......................................................... 6 2.2 Absolute maximum ratings .................................................................................. 6 2.3 Electrical Specification of the SCA1020 – D06 .................................................... 7 2.3.1 Analog Output................................................................................................... 7 2.3.2 Digital Output .................................................................................................. 10 SPI Interface ............................................................................................................... 11 3.1 DC characteristics of SPI interface .................................................................... 13 3.2 AC characteristics of SPI interface .................................................................... 14 3.3 SPI Commands ................................................................................................. 15 Mechanical specification (Reference only) ................................................................. 17 4.1 5 Electrical Connection ........................................................................................... 4 Dimensions (Reference only) ............................................................................ 17 Mounting..................................................................................................................... 18 Murata Electronics Oy www.muratamems.fi Doc. Nr. 8263900 2/19 Rev.B SCA1020-D06 1 General description The SCA1020 accelerometer consists of two silicon bulk micro machined sensing element chips and a signal conditioning ASIC. The chips are mounted on a pre-molded package and wire bonded to appropriate contacts. The sensing elements and ASIC are protected with silicone gel and lid. The sensor has 12 SMD legs (Gull-wing type). Block diagram 1.1 ax SC SC sensing element filter1 SC gain SC SC sample and hold SC filter2 pfilter X_Ext_C DAC C/V DAC fail_det SC S/H X_OUT CSB SCK MOSI MISO ST_X/Test_in ST_Y BG interface+control logic+EEPROM ADC agnd por DAC OSC clk gen HV pump VDD VSS ay SC SC sensing element filter1 SC gain SC SC filter2 sample and hold SC pfilter Y_Ext_C C/V DAC DAC fail_det SC S/H Y_OUT Figure 1. Block diagram of the SCA1020 1.2 SCA1020 family Accelerometer Features • • • • • Single +5V supply Two ratiometric analog outputs in relation to supply voltage (Vdd = 4.75....5.25V) • Wide load driving capability Serial Peripheral Interface (SPI) compatible • Provides digital output for both channels • Supports testing and programming Non-volatile programming features • Factory programmable filter settings ( 400Hz, 1 kHz, WB, Ext_C ) • Offset and sensitivity calibration • Linear temperature compensation Enhanced failure detection features • True self test by deflecting the sensing elements’ proof mass by electrostatic force. Deflection voltage is adjustable with two memory bits for both channels. The self-test is channel specific, and separately activated for both channels by digital on-off commands via dedicated pins or via SPI bus. • Continuous sensing element interconnection failure check Murata Electronics Oy www.muratamems.fi Doc. Nr. 8263900 3/19 Rev.B SCA1020-D06 2 Electrical specifications 2.1 Electrical Connection The following is a typical requirement for electrical interface to the SCA1020. If special over voltage or reverse polarity protection is needed, please contact VTI Technologies for application information. If self test (Pins 9 and 10) is not used, it should be left floating / grounded SCK 1 12 VDD Ext_C_1 NC 2 MISO 3 10 ST_1/Test_in MOSI 4 9 ST_2 OUT_2 5 8 Ext_C_2 NC VSS 6 7 CSB No. 1 2 3 4 5 6 7 Node SCK NC MISO MOSI Out_2 VSS CSB I/O Input NC Output Input Output Power Input 8 9 10 11 12 NC ST_2 ST_1 / Test_in Out_1 VDD NC Input Input Output Power Figure 2. Murata Electronics Oy www.muratamems.fi 11 OUT_1 Description Serial clock NC Master in slave out; data output Master out slave in; data input Y axis Output (Ch 2) Negative supply voltage (VSS) Chip select (active low). If only analog outputs are used this should be connected to Vdd or left floating. NC Self test input for Y axis (Ch 2) Self test input for Z axis (Ch 1 ) / Analog test input Z axis output (Ch 1) Positive supply voltage (VDD) Pin layout and description of the SCA1020 Doc. Nr. 8263900 4/19 Rev.B SCA1020-D06 2.1.1 Recommended connection when SPI interface is used Vdd (+5V) SCK Serial Clock 12 VDD 1 Min 100nF NC 2 Data Out MISO Data In MOSI Z 11 OUT_1 3 10 ST_1 4 9 Y OUT_2 5 VSS 6 8 7 ST_2 NC CSB Chip select Recommended SPI-Output connection on PCB 2.1.2 Recommended connection when analog output is used When SCA1020 is used in Analog mode and the PCB is designed correctly the SCA610 / 620 and SCA1020 are interchangeable. If the PCB layout is designed for SCA1020, then SCA610 / 620 can be used for single axis applications. Pins 1, 2, 3, 4 and 8 can be connected to GND (pins 2 and 8 can be connected also to Vdd) but for the best EMC performance these pins should be left floating. CSB pin can be pulled up but it is recommended to left floating. The output of SCA610 / 620 corresponds to the output of channel 1 in the SCA1020 Vdd (+5V) SCK 1 12 VDD Min 100nF NC MISO 2 Z 3 MOSI 4 Out 2 (Y) OUT_2 5 VSS 6 11 OUT_1 Out 1 (Z) 10 ST_1/Test_i n Self-Test 1 9 Y 8 7 ST_2 Self-Test 2 NC CSB Recommended Analog output connection on PCB Murata Electronics Oy www.muratamems.fi Doc. Nr. 8263900 SCA610 or SCA620 connected to the SCA1020 lay-out 5/19 Rev.B SCA1020-D06 2.1.3 Recommended EMC protection circuitry The purpose of the following recommendation is to give generic EMC protection guidelines for the SCA1020. EMC susceptibility is highly dependent on the PCB layout and therefore the component values given here can be different depending on the actual PCB layout. With the following circuitry and properly designed PCB the part will pass 200V/m EMC susceptibility tests. Please note that only channel 1 output protection circuitry is presented. Similar kind of circuit must be also at the channel 2 output. Vdd (+5V) SCK 1 Vdd (+5V) 12 VDD Min 100nF NC 2 11 OUT_1 Z 68pF 10 ohm Out 1 (Z) 68pF MISO 10 ST_1/Test_i n 3 GND MOSI 4 Out 2 (Y) OUT_2 5 Self-Test 1 ST_2 9 Y NC 8 VSS 6 7 Self-Test 2 CSB Recommended EMC protection circuitry 2.2 Absolute maximum ratings Supply voltage (VDD) Voltage at input / output pins ESD HBM (Human Body Model) CDM (Charged Device Model) Storage temperature Operating temperature Mechanical shock Murata Electronics Oy www.muratamems.fi -0.3 V to +5.5V (continuous) -0.3V to 7V (5 seconds during 1 minutes cycle) -0.3V to (VDD + 0.3V) ±2kV ±500V -55°C to +125°C -40°C to +125°C Drop from 1 meter on a concrete surface. Doc. Nr. 8263900 6/19 Rev.B SCA1020-D06 2.3 Electrical Specification of the SCA1020 – D06 2.3.1 Analog Output Vdd = 5.00V and ambient temperature (23°C±5°C) unless otherwise specified. KPC (17 Parameter (1 <CC> Z axis (Out_1) Measuring range (1 Y axis (Out_2) Measuring range Supply voltage Vdd Current consumption Operating temperature <SC> Z axis (Out_1) Offset Error (output at 0g) (6, 13 (3, 13 <CC> <CC> Y axis (Out_2) Offset (output at 0g) (4, 13 Y axis (Out_2) Sensitivity <SC> Y axis (Out_2) Offset Error (output at 0g) <SC> <SC> (5, 13 Z axis (Out_1) Offset Temperature (5, 13,14 Dependency (output at 0g) Z axis (Out_1) Sensitivity error (5, 13 (6, 13 Typical non-linearity Z axis (Out_1) Frequency response -3dB Y axis (Out_2) Frequency response -3dB (9 Ratiometric error (10 Cross-axis sensitivity (11 Output noise Start-up delay Self test input pull down current (15 T1: T st-on T2: Tsat.del. T3: T recov. Murata Electronics Oy www.muratamems.fi (15 (15 Vout to Vdd or Vss Vout to Vdd or Vss 10k from Vout to Vdd 10k from Vout to Vss @ room temperature @ room temperature 0 4.75 RT(23±5°C) -40 -20...+85°C -40…+125°C -75 -20...+85°C -35 -40…+125°C -50 -40...+85°C -40...+125°C -4 Max. Units 5.0 +1.7 +1.7 5.25 5.0 +125 g (2 g V mA -90 -40 -20...+85°C -40…+125°C -35 -40...+125°C Range = -1g...+1g (8 (8 Vdd = 4.75...5.25V @ room temperature From DC...4kHz Reset and parity check Vdd = 5V Self test ON period. Controlled externally by user Saturation delay. Time when element beam remains still out from linear operating range. Recovery time when element is back in linear operating range Doc. Nr. 8263900 Vdd/2 0.24 x Vdd - -75 20 0.25 5.00 +40 mg +75 +90 ±3 Vdd/2 0.24 x Vdd - -90 -50 (2 °C kOhm nF V V V V/g 10 RT(25±5°C) -20...+85°C -40…+125°C -40...+85°C (7 <SC> -1.7 -1.7 4.75 @ room temperature @ room temperature Y axis (Out_2) Offset Temperature (5, 13,14 Dependency (output at 0g) Y axis (Out_2) Sensitivity error Nominal Nominal Typ -40 <CC> <CC> <SC> Min. Vdd = 5 V; No load Resistive output load (Analog Output) Capacitive load (Analog Output) Min. output voltage; Vdd = 5V Max. output voltage; Vdd = 5V (3, 13 Z axis (Out_1) Offset (output at 0g) (4, 13 Z axis (Out_1) Sensitivity <SC> Condition +35 mg +50 % +4 V V/g +40 mg +75 +90 - -4 ±3 - -20 20 20 -2 50 50 - 10 10 21 +35 mg +50 % +4 +20 80 80 2 3.5 5 10 30 100 mg Hz Hz % % mVrms ms 20 ms 50 ms µA ms 7/19 Rev.B SCA1020-D06 T4: T stab. = T2+T3 (15 T5: T r (15 Stabilization time, when self test is released. Rise time during self test, when Vout reach V2 Vout during self test Stabilized output voltage after self-test is released. (15 V2 (15, 16 V3 4.75 0.95*V 1 70 ms 10 ms V V1 1.05 * V1 Note 1. The measuring range is limited only by the sensitivity, offset and supply voltage rails of the device Note 2. 1g = 9.82m/S2 Note 3. Offset specified as Voffset = Vout(0g) [ V ]. See note 13. Note 4. Sensitivity specified as Vsens = {Vout(+1g) - Vout(-1g)}/2 Note 5. Offset error specified as Offset Error = {Vout(0g) - Vdd/2} / Vsens [ g ] Vsens = Nominal sensitivity Vdd/2 = Nominal offset See note 13. Note 6. Sensitivity error specified as Sensitivity Error = { [Vout(+1g) - Vout(-1g)] / 2 - Vsens} / Vsens x 100% [% ] Vsens = Nominal sensitivity See note 13. Note 7. From straight line through -1g and +1g. Note 8. The frequency response is determined by the sensing element’s internal gas damping. The output has true DC (0Hz) response. Note 9. The ratiometric error is specified as. [ V/g ]. See note 13 Vout (@ Vx ) × 5.00V Vx RE = 100% × 1 − Vout (@5V ) Note 10. The cross-axis sensitivity determines how much acceleration, perpendicular to the measuring axis, couples to the output. The total cross-axis sensitivity is the geometric sum of the sensitivities of the two axes that are perpendicular to the measuring axis. Note 11. In addition, supply voltage noise couples to the output due to the ratiometric nature of the accelerometer. Note 12. The self-test will increase the output voltage. The output will go to Vdd rail. The purpose of the self-test is to check out the total functionality of the sensor. It is not meant for calibration or auto zeroing. Murata Electronics Oy www.muratamems.fi Doc. Nr. 8263900 8/19 Rev.B SCA1020-D06 Note 13. Measuring positions Note 14. Offset Temperature Dependency (Offset Tdep) specified as Offset Tdep = {Vout(0g@RT) - Vout(0g@T) } / Vsens [ g ] Vout(0g@RT) = Vout(0g) at room temperature (23±5°C) Vout(0g@T) = Vout(0g) at temperature T Vsens = Nominal sensitivity See note 13. Note 15. Self-test waveforms at 0g position (Z=0g and Y=0g): 5V ST pin voltage 0V 5V Vout V1 V2 T1 0V T5 Time [ ms ] V3 T2 T3 T4 Note 16. V1= V3= Initial output Voltage before self-test activation Output voltage after self-test has been removed and after stabilization time. Please note that the error band specified for V3 is to guarantee that the output is within 5% of the initial value after the specified stabilization time. After longer time V1=V3. Note 17. CC= Critical Characteristics. Must be 100% monitored during production Murata Electronics Oy www.muratamems.fi Doc. Nr. 8263900 9/19 Rev.B SCA1020-D06 SC= Significant Characteristic. The process capability (Cpk) must be better than 1.33, which allows sample based testing. If process is not capable the part will be 100% tested 2.3.2 Digital Output Vdd = 5.00V and ambient temperature unless otherwise specified. Parameter Condition Output load SPI clock frequency Internal A/D conversion time Data transfer time @500kHz Murata Electronics Oy www.muratamems.fi @500kHz Doc. Nr. 8263900 Min. Typ Max. Units 1 500 150 38 nF kHz µs µs 10/19 Rev.B SCA1020-D06 3 SPI Interface Serial peripheral interface (SPI) is a 4-wire synchronous serial interface. Data communication is enabled with low active Slave Select or Chip Select wire (CSB). Data is transmitted with 3wire interface consisting of serial data input (MOSI), serial data output (MISO) and serial clock (SCK). Every SPI system consists of one master and one or more slaves, where the master is defined as the microcomputer that provides the SPI clock, and the slave is any integrated circuit that receives the SPI clock from the master. MASTER MICROCONTROLLER DATA OUT (MOSI) DATA IN (MISO) SERIAL CLOCK (SCK) SS0 SLAVE SI SO SCK CS SS1 SS2 SS3 SI SO SCK CS SI SO SCK CS SI SO SCK CS Figure 4. Typical SPI connection The SPI interface of this ASIC is designed to support almost any micro controller that uses software implemented SPI. However it is not designed to support any particular hardware implemented SPI found in many commercial micro controllers. Serial peripheral interface in this product is used in testing and calibration purposes as well as in the final application. In normal use some testing and calibration commands are disabled and have not been documented here. This ASIC operates always as a slave device in the master-slave operation mode. The data transfer between the master (µP test machine etc.) and ASIC is performed serially with four wire system. MOSI MISO SCK CSB master out slave in master in slave out serial clock chip select (low active) µP → ASIC ASIC → µP µP → ASIC µP → ASIC Each transmission starts with a falling edge on CSB and ends with the rising edge. During the transmission, commands and data are controlled by SCK and CSB according to the following rules: • • • commands and data are shifted MSB first LSB last each output data/status-bits are shifted out on the falling edge of SCK (MISO line) each bit is sampled on the rising edge of SCK (MOSI line) Murata Electronics Oy www.muratamems.fi Doc. Nr. 8263900 11/19 Rev.B SCA1020-D06 • • • • • • • after the device is selected with CSB going low, an 8-bit command is received. The command defines the operations to be performed the rising edge of CSB ends all data transfer and resets internal counter and command register if an invalid command is received, no data will be shifted into chip and the MISO will remain in high impedance state until the falling edge of CSB. This will reinitialize the serial communication. to be able to perform any other command than those listed in Table 1. SPI commands, the lock register content has to be set correctly. If other command is feed without correct lock register content, no data will be shifted into chip and the MISO will remain in high impedance state until the falling edge of CSB. data transfer to MOSI continues right after the command is received in all cases where data is to be written to ASIC’s internal registers data transfer out from MISO starts with a falling edge of SCK right after the last bit of SPI command is sampled in on the rising edge of SCK maximum data transfer speed exceeds 500 kHz clock rate SPI command can be an individual command or a combination of command and data. In the case of combined command and data, the input data follows uninterruptedly the SPI command and the output data is shifted out parallel with the input data. CSB 0 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 2 1 0 2 1 0 SCK D A TA IN COM MAND MOSI 7 6 5 7 6 5 Figure 5. 3 D A TA O U T H IG H IM PED A N C E M ISO 4 4 3 One command and data transmission over the SPI After power up the circuit starts up in measure mode. This is the operation mode that is used in the final application. Murata Electronics Oy www.muratamems.fi Doc. Nr. 8263900 12/19 Rev.B SCA1020-D06 3.1 DC characteristics of SPI interface Supply voltage is 5 V unless otherwise noted. Current flowing into the circuit has positive values. Parameter Conditions Input terminal CSB Pull up current VIN = 0 V Input high voltage Input low voltage Hysteresis Input capacitance Input terminal MOSI, SCK Pull down current VIN = 5 V Input high voltage Input low voltage Hysteresis Input capacitance Output terminal MISO Output high voltage I > -1mA Output low voltage I < 1 mA Tristate leakage 0 < VMISO < Vdd Table 1. Murata Electronics Oy www.muratamems.fi Symbol Min Typ Max IPU VIH VIL VHYST CIN 13 4 -0.3 22 35 Vdd+0.3 1 µA V V V pF IPD VIH VIL VHYST CIN 9 4 -0.3 29 Vdd+0.3 1 µA V V V pF VOH VOL ILEAK 0.23*Vdd 2 17 0.23*Vdd 2 Vdd-0.5 5 0.5 100 Unit V V pA DC characteristics of SPI interface Doc. Nr. 8263900 13/19 Rev.B SCA1020-D06 3.2 AC characteristics of SPI interface Parameter Terminal CSB, SCK Time from CSB (10%) to SCK (90%)1 Time from SCK (10%) to CSB (90%)1 Terminal SCK SCK low time Conditions Terminal MOSI, SCK Time from changing MOSI (10%, 90%) to SCK (90%)1. Data setup time Time from SCK (90%) to changing MOSI (10%,90%)1. Data hold time Terminal MISO, CSB Time from CSB (10%) to stable MISO (10%, 90%)1. Time from CSB (90%) to high impedance state of MISO1. Terminal MISO, SCK Time from SCK (10%) to stable MISO (10%, 90%)1. Terminal CSB Time between SPI cycles, CSB at high level (90%) 1 not production tested TLS1 Min TLS1 120 ns TLS2 120 ns TCL 1 µs TCH 1 µs TSET 30 ns THOL 30 ns Load capacitance at MISO < 15 pF Load capacitance at MISO < 15 pF TVAL1 10 100 ns TLZ 10 100 ns Load capacitance at MISO < 15 pF TVAL2 100 ns Load capacitance at MISO < 2 nF Load capacitance at MISO < 2 nF SCK high time Table 2. Symbol TLH Typ 15 Max Unit µs AC characteristics of SPI interface TCH TCL TLS2 TLH CSB SCK THOL MOSI TSET MSB in DATA in TVAL1 MISO MSB out Figure 6. Murata Electronics Oy www.muratamems.fi LSB in TVAL2 TLZ DATA out LSB out SPI bus timing diagram Doc. Nr. 8263900 14/19 Rev.B SCA1020-D06 3.3 SPI Commands This SPI interface utilizes an 8-bit instruction (or command) register. The list of commands available to end-user is presented in Table 3. Command name MEAS RWTR RDSR RLOAD STX STY RDAX RDAY Table 3. Command format 00000000 00001000 00001010 00001011 00001110 00001111 00010000 00010001 Description: Measure mode (normal operation mode after power on) Read and write temperature data register Read status register Reload NV data to memory output register Activate Self test for Z-channel Activate Self test for Y-channel Read Z-channel acceleration through SPI Read Y-channel acceleration through SPI SPI commands Measure mode (MEAS): Standard operation mode after power-up. During normal operation, MEAS command is exit command from Self-Test. Read and write temperature data register (RWTR): Temperature data register can be read during normal operation without affecting the circuit operation. Temperature data register is loaded in every 150 µs, and the load operation is disabled whenever the CSB signal is low, hence CSB has to stay high at least 150 µs prior the RWTR command in order to guarantee correct data. The data transfer is as presented in Figure 5 and data is transferred MSB first. In normal operation, it doesn’t matter what data is written to temperature data register during RWTR command and hence all zeros is recommended. Read status register (RDSR): Read status register command provides access to the status register. Status register format is shown in Table 4. Bold values in Definition column are the expected values during normal operation. Bit Bit 3 (PERR) Bit 2 (TEST) Bit 1 (LOCK) Bit 0 (PD) Table 4. Definition Bit 3 = 0 Parity check hasn’t detected errors Bit 3 = 1 Parity error detected Bit 2 = 0 Analog test mode isn’t active Bit 2 = 1 Analog test mode is active Bit 1 = 0 Lock register is open Bit 1 = 1 Lock register is locked Bit 0 = 0 circuit is not in power down mode Bit 0 = 1 circuit is in power down mode Status register bit definitions Reload NV data to memory output register (RLOAD): Reads NV data from EEPROM to the memory output register. Self test for Z-channel (STX): STX command activates the circuit’s self test function for the Z-channel. Internal charge pump is activated and high voltage is applied to the Zchannel acceleration sensor element electrode. This causes electrostatic force, which Murata Electronics Oy www.muratamems.fi Doc. Nr. 8263900 15/19 Rev.B SCA1020-D06 deflects the beam of the sensing element and simulates the acceleration to the positive direction. Z-channel self-test is de-activated by giving MEAS command. Self test for Y-channel (STY): STY command activates the circuit’s self test function for the Y-channel. Internal charge pump is activated and high voltage is applied to the Ychannel acceleration sensor element electrode. This causes electrostatic force, which deflects the beam of the sensing element and simulates the acceleration to the positive direction. Y-channel self-test is de-activated by giving MEAS command. Read Z-channel acceleration (RDAX): RDAX command provides access to AD converted Z-channel acceleration signal stored in acceleration data register X. During normal operation acceleration data register X is loaded in every 150 µs, and the load operation is disabled whenever the CSB signal is low, hence CSB has to stay high at least 150 µs prior the RDAX command in order to guarantee correct data. Data output is an 11bit digital word, which is feed out MSB first and LSB last. (See Figure 7). CSB 0 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 5 4 3 16 17 18 1 0 SCK COMM AND M OSI DATA OUT H IG H IM P E D A N C E M IS O Figure 7. 10 9 8 7 6 2 RDAX command and data transmission over the SPI Read Y-channel acceleration (RDAY): RDAY command provides access to AD converted Y-channel acceleration signal which is stored in acceleration data register Y. During normal operation acceleration data register Y is loaded in every 150 µs and the load operation is disabled whenever the CSB signal is low, hence CSB has to stay high at least 150 µs prior the RDAY command in order to guarantee correct data. Data output is an 11-bit digital word, which is feed out MSB first and LSB last Detailed information on all SPI commands is presented in document IC008 Dual Axis Acceleration Sensor ASIC, Digital Specification. Murata Electronics Oy www.muratamems.fi Doc. Nr. 8263900 16/19 Rev.B SCA1020-D06 4 Mechanical specification (Reference only) Lead frame material: Plating: Solderability: <CC> Co-planarity error Copper Nickel followed by Gold JEDEC standard: JESD22-B102-C 0.1mm max. 4.1 Dimensions (Reference only) Figure 8. Murata Electronics Oy www.muratamems.fi Mechanical dimensions of the SCA1020 Doc. Nr. 8263900 17/19 Rev.B SCA1020-D06 5 Mounting The SCA1020 is suitable for Sn-Pb eutectic and Pb- free soldering process and mounting with normal SMD pick-and-place equipment. Recommended SCA1020 body temperature profile during reflow soldering: Profile feature Average ramp-up rate Sn-Pb Eutectic Assembly Pb-free Assembly 3°C/second max. 3°C/second max. (TL to TP) Preheat - Temperature min (Tsmin) 100°C 150°C - Temperature max (Tsmax) 150°C 200°C - Time (min to max) (ts) 60-120 seconds Tsmax to TL - 60-180 seconds 3°C/second max Ramp up rate Time maintained above: - Temperature (TL) - Time (tL) Peak temperature (TP) Time within 5°C of actual Peak Temperature (TP) Ramp-down rate Time 25° to Peak temperature Figure 9. 183°C 217°C 60-150 seconds 60-150 seconds 240 +0/-5°C 250 +0/-5°C 10-30 seconds 20-40 seconds 6°C/second max 6°C/second max 6 minutes max 8 minutes max Recommended SCA1020 body temperature profile during reflow soldering. Ref. IPC/JEDEC J-STD-020B. Note. Murata Electronics Oy www.muratamems.fi Preheating time and temperatures according to solder paste manufacturer. Component body temperature during the soldering should be measured from the body of the component. Doc. Nr. 8263900 18/19 Rev.B SCA1020-D06 The Moisture Sensitivity Level of the part is 3 according to the IPC/JEDEC J-STD-020B. The part should be delivered in a dry pack. The manufacturing floor time (out of bag) in the customer’s end is 168 hours. Maximum soldering temperature is 250°C/40sec. Figure 10. Recommended PCB lay-out Notes: • It is important that the part is parallel to the PCB plane and that there is no angular alignment error from intended measuring direction during assembly process. • 1° mounting alignment error will increase the cross-axis sensitivity by 1.7% • 1° mounting alignment error will change the output by 17mg • To achieve the highest accuracy and to minimize resonance, it is recommended to glue the accelerometer to the PCB before soldering • Wave soldering is not recommended. • A supply voltage by-pass capacitor (>100nF) must be used and located as close as possible to the Vdd and GND pins. • Note: When the accelerometer is oriented in such a way that the arrow points toward the earth, the output will decrease. Please also note that you can rotate the part around the measuring axis for optimum mounting location. Murata Electronics Oy www.muratamems.fi Doc. Nr. 8263900 19/19 Rev.B