Revised May 2000 SCAN18373T Transparent Latch with 3-STATE Outputs General Description Features The SCAN18373T is a high speed, low-power transparent latch featuring separate data inputs organized into dual 9bit bytes with byte-oriented latch enable and output enable control signals. This device is compliant with IEEE 1149.1 Standard Test Access Port and Boundary Scan Architecture with the incorporation of the defined boundary-scan test logic and test access port consisting of Test Data Input (TDI), Test Data Out (TDO), Test Mode Select (TMS), and Test Clock (TCK). ■ IEEE 1149.1 (JTAG) Compliant ■ Buffered active-low latch enable ■ 3-STATE outputs for bus-oriented applications ■ 9-bit data busses for parity applications ■ Reduced-swing outputs source 32 mA/sink 64 mA ■ Guaranteed to drive 50Ω transmission line to TTL input levels of 0.8V and 2.0V ■ TTL compatible inputs ■ 25 mil pitch SSOP (Shrink Small Outline Package) ■ Includes CLAMP and HIGHZ instructions ■ Member of Fairchild’s SCAN Products Ordering Code: Order Number Package Number SCAN1837TSSC MS56A Package Description 56-Lead Shrink Small Outline Package (SSOP), JEDEC MO-118, 0.300 Wide Device also available in Tape and Reel. Specify by appending the suffix letter “X” to the ordering code. Connection Diagram Pin Descriptions Pin Names Description AI(0–8), BI(0–8) Data Inputs ALE, BLE Latch Enable Inputs AOE1, BOE1 3-STATE Output Enable Inputs AO(0–8), BO(0–8) 3-STATE Latch Outputs Truth Tables Inputs ALE AOE1 AI(0–8) AO(0–8) X H X H L L Z L H L H H L L X AO 0 BLE BOE1 BI(0–8) Inputs BO(0–8) X H X H L L Z L H L H H L L X BO 0 H = HIGH Voltage Level L = LOW Voltage Level X = Immaterial Z = High Impedance AO0 = Previous AO before H-to-L transition of ALE BO0 = Previous BO before H-to-L transition of BLE © 2000 Fairchild Semiconductor Corporation DS010962 www.fairchildsemi.com SCAN18373T Transparent Latch with 3-STATE Outputs October 1991 SCAN18373T Functional Description the inputs a set-up time preceding the HIGH-to-LOW transition of the Latch Enable. The 3-STATE standard outputs are controlled by the Output Enable (AOE1 or BOE1) input. When Output Enable is LOW, the standard outputs are in the 2-state mode. When Output Enable is HIGH, the standard outputs are in the high impedance mode, but this does not interfere with entering new data into the latches. The SCAN18373T consists of two sets of nine D-type latches with 3-STATE standard outputs. When the Latch Enable (ALE or BLE) input is HIGH, data on the inputs (AI(0–8) or BI(0–8)) enters the latches. In this condition the latches are transparent, i.e., a latch output will change state each time its input changes. When Latch Enable is LOW, the latches store the information that was present on Logic Diagram Please note that this diagram is provided only for the understanding of logic operations and should not be used to estimate propagation delays. Block Diagrams Byte-A www.fairchildsemi.com 2 SCAN18373T Block Diagrams (Continued) Tap Controller Byte-B Note: BSR stands for Boundary Scan Register. 3 www.fairchildsemi.com SCAN18373T Description of Boundary-Scan Circuitry to the SCAN18373T device. SCAN CMOS Test Access Logic devices do not include the IEEE 1149.1 optional identification register. Therefore, this unique captured value can be used as a “pseudo ID” code to confirm that the correct device is placed in the appropriate location in the boundary scan chain. The scan cells used in the BOUNDARY-SCAN register are one of the following two types depending upon their location. Scan cell TYPE1 is intended to solely observe system data, while TYPE2 has the additional ability to control system data. Scan cell TYPE1 is located on each system input pin while scan cell TYPE2 is located at each system output pin as well as at each of the two internal active-high output enable signals. AOE controls the activity of the A-outputs while BOE controls the activity of the B-outputs. Each will activate their respective outputs by loading a logic high. Instruction Register Scan Chain Definition The BYPASS register is a single bit shift register stage identical to scan cell TYPE1. It captures a fixed logic low. MSB → LSB Bypass Register Scan Chain Definition Logic 0 Instruction Code The INSTRUCTION register is an eight-bit register which captures the value 00111101. The two least significant bits of this captured value (01) are required by IEEE Std 1149.1. The upper six bits are unique EXTEST 10000001 SAMPLE/PRELOAD 10000010 CLAMP 00000011 HIGHZ All Others BYPASS Scan Cell TYPE1 Scan Cell TYPE2 www.fairchildsemi.com 4 Instruction 00000000 SCAN18373T Description of Boundary-Scan Circuitry (Continued) Boundary-Scan Register Scan Chain Definition (42 Bits in Length) 5 www.fairchildsemi.com SCAN18373T Description of Boundary-Scan Circuitry (Continued) Boundary-Scan Register Definition Index Bit No. Pin No. Pin Type 41 AOE1 Pin Name 3 Input 40 ACP 54 39 AOE 38 BOE1 26 37 BCP 31 36 BOE Scan Cell Type TYPE1 Input TYPE1 Internal TYPE2 Input TYPE1 Input TYPE1 Internal TYPE2 35 AI0 55 Input TYPE1 34 AI1 53 Input TYPE1 33 AI2 52 Input TYPE1 32 AI3 50 Input TYPE1 31 AI4 49 Input TYPE1 30 AI5 47 Input TYPE1 29 AI6 46 Input TYPE1 28 AI7 44 Input TYPE1 27 AI8 43 Input TYPE1 26 BI0 42 Input TYPE1 25 BI1 41 Input TYPE1 24 BI2 39 Input TYPE1 23 BI3 38 Input TYPE1 22 BI4 36 Input TYPE1 21 BI5 35 Input TYPE1 20 BI6 33 Input TYPE1 19 BI7 32 Input TYPE1 18 BI8 30 Input TYPE1 17 AO0 2 Output TYPE2 16 AO1 4 Output TYPE2 15 AO2 5 Output TYPE2 14 AO3 7 Output TYPE2 13 AO4 8 Output TYPE2 12 AO5 10 Output TYPE2 11 AO6 11 Output TYPE2 10 AO7 13 Output TYPE2 9 AO8 14 Output TYPE2 8 BO0 15 Output TYPE2 7 BO1 16 Output TYPE2 6 BO2 18 Output TYPE2 5 BO3 19 Output TYPE2 4 BO4 21 Output TYPE2 3 BO5 22 Output TYPE2 2 BO6 24 Output TYPE2 1 BO7 25 Output TYPE2 0 BO8 27 Output TYPE2 www.fairchildsemi.com 6 Control Signals A–in B–in A–out B–out Supply Voltage (VCC) Recommended Operating Conditions −0.5V to +7.0V DC Input Diode Current (IIK) VI = −0.5V −20 mA VI = VCC + 0.5V +20 mA Supply Voltage (VCC) SCAN Products DC Output Diode Current (IOK) VO = −0.5V VO = VCC +0.5V +20 mA Minimum Input Edge Rate ∆V/∆t ±70 mA VCC @ 4.5V, 5.5V Note 1: Absolute maximum ratings are those values beyond which damage to the device may occur. The databook specifications should be met, without exception, to ensure that the system design is reliable over its power supply, temperature, and output/input loading variables. Fairchild does not recommend operation of SCAN circuits outside databook specifications. ±70 mA Junction Temperature +140°C SSOP Storage Temperature 125 mV/ns VIN from 0.8V to 2.0V DC VCC or Ground Current Per Output Pin 0V to VCC −40°C to +85°C Operating Temperature (TA) −0.5V to VCC + 0.5V DC Output Source/Sink Current (IO) 0V to VCC Output Voltage (VO) −20 mA DC Output Voltage (VO) 4.5V to 5.5V Input Voltage (VI) −65°C to +150°C ESD (Min) 2000V DC Electrical Characteristics Symbol VIH VIL VOH VOL IIN Parameter VCC (V) Minimum HIGH 4.5 1.5 2.0 2.0 5.5 1.5 2.0 2.0 Maximum LOW 4.5 1.5 0.8 0.8 Input Voltage 5.5 1.5 0.8 0.8 Minimum HIGH 4.5 3.15 3.15 Output Voltage 5.5 4.15 4.15 (Note 2) 4.5 2.4 2.4 5.5 2.4 2.4 4.5 2.4 Maximum LOW 5.5 2.4 4.5 0.1 0.1 5.5 0.1 0.1 (Note 2) 4.5 0.55 0.55 5.5 0.55 0.55 Maximum Input Maximum Input TDI, TMS Leakage 4.5 0.55 5.5 0.55 5.5 ±0.1 5.5 Minimum Input Leakage 5.5 IOLD Minimum Dynamic 5.5 IOHD Output Current (Note 3) IOZ Maximum Output Leakage Current Output Short Circuit Current Maximum Quiescent Units V V V V V Output Voltage Leakage Current ICC TA = −40°C to +85°C Guaranteed Limits Input Voltage IIN IOS TA = +25°C Typ V V V Conditions VOUT = 0.1V or VCC − 0.1V VOUT = 0.1V or VCC − 0.1V IOUT = −50 µA VIN = VIL or VIH IOH = −32 mA VIN = VIL or VIH IOH = −24 mA IOUT = 50 µA VIN = VIL or VIH IOL = 64 mA VIN = VIL or VIH IOL = 48 mA ±1.0 µA VI = VCC, GND VI = VCC 2.8 3.6 µA −385 −385 µA VI = GND −160 −160 µA VI = GND 94 94 mA VOLD = 0.8V Max −40 −40 mA VOHD = 2.0V Min 5.5 ±0.5 ±5.0 µA VI (OE) = VIL, VIH 5.5 −100 −100 5.5 16.0 88 µA 5.5 750 820 µA mA Min VO = 0V VO = Open TDI, TMS = VCC Supply Current VO = Open TDI, TMS = GND 7 www.fairchildsemi.com SCAN18373T Absolute Maximum Ratings(Note 1) SCAN18373T DC Electrical Characteristics Symbol Parameter (Continued) TA = +25°C VCC (V) ICCt Maximum ICC per Input TA = −40°C to +85°C Typ Units Conditions Guaranteed Limits 5.5 2.0 2.0 mA 5.5 2.15 2.15 mA VI = VCC − 2.1V VI = VCC − 2.1V TDI/TMS Pin, Test One with the Other Floating Note 2: All outputs loaded; thresholds associated with output under test. Note 3: Maximum test duration 2.0 ms, one output loaded at a time. Noise Specifications Symbol VOLP Maximum HIGH Output Noise (Note 4)(Note 5) VOLV Minimum LOW Output Noise (Note 4)(Note 5) VOHP Maximum Overshoot (Note 5)(Note 6) VOHV Minimum VCC Droop (Note 5)(Note 6) VIHD Minimum HIGH Dynamic Input Voltage Level (Note 6)(Note 7) VILD TA = +25°C VCC Parameter Maximum LOW Dynamic Input Voltage Level (Note 6)(Note 7) TA = −40°C to +85°C Guaranteed Limits Units (V) Typ 5.0 1.0 1.5 V 5.0 −0.6 −1.2 V 5.0 VOH + 1.0 VOH + 1.5 V 5.0 VOH − 1.0 VOH − 1.8 V 5.5 1.6 2.0 2.0 V 5.5 1.4 0.8 0.8 V Note 4: Maximum number of outputs that can switch simultaneously is n. (n−1) outputs are switched LOW and one output held LOW. Note 5: Maximum number of outputs that can switch simultaneously is n. (n−1) outputs are switched HIGH and one output held HIGH. Note 6: Worst case package. Note 7: Maximum number of data inputs (n) switching. (n−1) input switching 0V to 3V. Input under test switching 3V to threshold (VILD). AC Electrical Characteristics Normal Operation Symbol Parameter tPLH, Propagation tPHL Delay, D to Q tPLH, Propagation tPHL Delay, LE to Q tPLZ, Disable Time VCC TA= +25°C (V) CL = 50 pF (Note 8) Min 5.0 5.0 5.0 tPHZ tPZL, Enable Time tPZH 5.0 CL = 50 pF Max Min 2.5 9.0 2.5 9.8 2.5 9.0 2.5 9.8 2.5 10.0 2.5 10.5 2.5 10.5 2.5 11.3 1.5 9.0 1.5 9.5 9.5 1.5 10.0 2.0 10.9 2.0 11.9 2.0 9.0 2.0 9.7 8 Units Max 1.5 Note 8: Voltage Range 5.0 is 5.0V ± 0.5V. www.fairchildsemi.com Typ TA= −40°C to +85°C ns ns ns ns Normal Operation Symbol Parameter VCC TA = +25°C TA = −40°C to +85°C (V) CL = 50 pF CL = 50 pF (Note 9) Setup Time, H or L tS Data to LE tH Hold Time, H or L LE to Data tW LE Pulse Width Units Guaranteed Minimum 5.0 3.0 3.0 ns 5.0 1.5 1.5 ns 5.0 5.0 5.0 ns Note 9: Voltage Range 5.0 is 5.0V ± 0.5V. AC Electrical Characteristics Scan Test Operation Symbol Parameter tPLH, Propagation Delay tPHL TCK to TDO tPLZ, Disable Time tPHZ TCK to TDO tPZL, Enable Time tPZH TCK to TDO tPLH, Propagation Delay tPHL TCK to Data Out VCC TA= +25°C (V) CL = 50 pF (Note 10) Min 5.0 5.0 5.0 Typ TA = −40°C to +85°C CL = 50 pF Max Min 3.5 13.2 3.5 14.5 3.5 13.2 3.5 14.5 2.5 11.5 2.5 11.9 2.5 11.5 2.5 11.9 3.0 14.5 3.0 15.8 3.0 14.5 3.0 15.8 Units Max 5.0 18.0 5.0 19.8 5.0 5.0 18.0 5.0 19.8 5.0 18.6 5.0 20.2 5.0 5.0 18.6 5.0 20.2 5.5 19.9 5.5 21.5 5.5 19.9 5.5 21.5 ns ns ns ns during Update-DR State tPLH, Propagation Delay tPHL TCK to Data Out ns during Update-IR State tPLH, Propagation Delay tPHL TCK to Data Out during Test Logic 5.0 ns Reset State tPLZ, Propagation Delay tPHZ TCK to Data Out 5.0 4.0 16.4 4.0 18.2 4.0 16.4 4.0 18.2 5.0 19.5 5.0 20.8 5.0 19.5 5.0 20.8 5.0 19.9 5.0 21.5 5.0 19.9 5.0 21.5 5.0 18.9 5.0 20.9 5.0 18.9 5.0 20.9 6.5 22.4 6.5 24.2 6.5 22.4 6.5 24.2 7.0 23.8 7.0 25.7 7.0 23.8 7.0 25.7 ns during Update-DR State tPLZ, Propagation Delay tPHZ TCK to Data Out 5.0 ns during Update-IR State tPLZ, Propagation Delay tPHZ TCK to Data Out 5.0 during Test Logic ns Reset State tPZL, Propagation Delay tPZH TCK to Data Out 5.0 ns during Update-DR State tPZL, Propagation Delay tPZH TCK to Data Out 5.0 ns during Update-IR State tPZL, Propagation Delay tPZH TCK to Data Out during Test Logic 5.0 ns Reset State Note 10: Voltage Range 5.0 is 5.0V ± 0.5V. Note: All propagation delays involving TCK are measured from the falling edge of TCK. 9 www.fairchildsemi.com SCAN18373T AC Operating Requirements SCAN18373T AC Operating Requirements Scan Test Operation Symbol Parameter VCC TA = +25°C TA = −40°C to +85°C (V) CL = 50 pF CL = 50 pF (Note 11) tS Setup Time, 5.0 3.0 3.0 ns 5.0 4.5 4.5 ns 5.0 3.0 3.0 ns 5.0 4.5 4.5 ns 5.0 3.0 3.0 ns 5.0 3.0 3.0 ns 5.0 3.0 3.0 ns 5.0 3.5 3.5 ns 5.0 8.0 8.0 ns 5.0 2.0 2.0 ns 5.0 4.0 4.0 ns 5.0 4.5 4.5 ns H 15.0 15.0 ns L 5.0 5.0 25 25 Data to TCK (Note 12) tH Hold Time, TCK to Data (Note 12) tS Setup Time, H or L AOE1, BOE1 to TCK (Note 13) tH Hold Time, H or L TCK to AOE1, BOE1 (Note 13) tS Units Guaranteed Minimum Setup Time, H or L Internal AOE, BOE, to TCK (Note 14) tH Hold Time, H or L TCK to Internal AOE, BOE (Note 14) tS Setup Time ALE, BLE (Note 15) to TCK tH Hold Time TCK to ALE, BLE (Note 15) tS Setup Time, H or L TMS to TCK tH Hold Time, H or L TCK to TMS tS Setup Time, H or L TDI to TCK tH Hold Time, H or L TCK to TDI tW fMAX Pulse Width TCK 5.0 Maximum TCK 5.0 Clock Frequency MHz Tpu Wait Time, Power Up to TCK 5.0 100 100 ns Tdn Power Down Delay 0.0 100 100 ms Note 11: Voltage Range 5.0 is 5.0V ± 0.5V. Note 12: This delay represents the timing relationship between the data input and TCK at the associated scan cells numbered 0-8, 9-17, 18-26 and 27-35. Note 13: Timing pertains to BSR 38 and 41 only. Note 14: This delay represents the timing relationship between AOE/BOE and TCK for scan cells 36 and 39 only. Note 15: Timing pertains to BSR 37 and 40 only. Note: All Input Timing Delays involving TCK are measured from the rising edge of TCK. www.fairchildsemi.com 10 TA = 25°C VCC = 5.0V Symbol Parameter CL = 50 pF TA = −40°C to +85°C 18 Outputs VCC = 5.0V ± 0.5V Switching CL = 250 pF (Note 16) Min Typ (Note 17) Max Min Max tPLH Propagation Delay 3.0 12.0 4.0 13.5 tPHL Latch Enable to Output 3.0 12.8 4.0 16.0 tPLH Propagation Delay 3.0 11.5 4.0 13.0 tPHL Data to Output 3.0 11.5 4.0 14.5 tPZH Output Enable Time 2.5 10.5 2.5 12.5 2.0 10.5 2.0 10.5 tPZL tPHZ Output Disable Time tPLZ tOSHL Pin to Pin Skew (Note 20) HL Data to Output tOSLH Pin to Pin Skew (Note 20) LH Data to Output Units ns ns (Note 18) ns (Note 19) ns 0.5 1.0 1.0 ns 0.5 1.0 1.0 ns Note 16: This specification is guaranteed but not tested. The limits apply to propagation delays for all paths described switching in phase (i.e., all LOW-toHIGH, HIGH-to-LOW, etc.). Note 17: This specification is guaranteed but not tested. The limits represent propagation delays with 250 pF load capacitors in place of the 50 pF load capacitors in the standard AC load. This specification pertains to single output switching only. Note 18: 3-STATE delays are load dominated and have been excluded from the datasheet. Note 19: The Output Disable Time is dominated by the RC network (500Ω, 250 pF) on the output and has been excluded from the datasheet. Note 20: Skew is defined as the absolute value of the difference between the actual propagation delays for any two separate outputs of the same device. The specification applies to any outputs switching HIGH-to-LOW (tOSHL), LOW-to-HIGH (tOSLH), or any combination switching LOW-to-HIGH. Capacitance Typ Units Conditions CIN Symbol Input Pin Capacitance Parameter 4.0 pF VCC = 5.0V COUT Output Pin Capacitance 13.0 pF VCC = 5.0V CPD Power Dissipation Capacitance 34.0 pF VCC = 5.0V 11 www.fairchildsemi.com SCAN18373T Extended AC Electrical Characteristics SCAN18373T Transparent Latch with 3-STATE Outputs Physical Dimensions inches (millimeters) unless otherwise noted 56-Lead Shrink Small Outline Package (SSOP), JEDEC MO-118, 0.300 Wide Package Number MS56A Fairchild does not assume any responsibility for use of any circuitry described, no circuit patent licenses are implied and Fairchild reserves the right at any time without notice to change said circuitry and specifications. LIFE SUPPORT POLICY FAIRCHILD’S PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT DEVICES OR SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROVAL OF THE PRESIDENT OF FAIRCHILD SEMICONDUCTOR CORPORATION. As used herein: 2. A critical component in any component of a life support device or system whose failure to perform can be reasonably expected to cause the failure of the life support device or system, or to affect its safety or effectiveness. 1. Life support devices or systems are devices or systems which, (a) are intended for surgical implant into the body, or (b) support or sustain life, and (c) whose failure to perform when properly used in accordance with instructions for use provided in the labeling, can be reasonably expected to result in a significant injury to the user. www.fairchildsemi.com www.fairchildsemi.com 12