TA78L005,006,007,075,008,009,10,12,132,15,18,20,24AP TOSHIBA Bipolar Linear Integrated Circuit Silicon Monolithic TA78L005AP, TA78L006AP, TA78L007AP, TA78L075AP, TA78L008AP, TA78L009AP, TA78L010AP, TA78L012AP, TA78L132AP, TA78L015AP, TA78L018AP, TA78L020AP, TA78L024AP Three-Terminal Positive Regulators 5 V, 6 V, 7 V, 7.5 V, 8 V, 9 V, 10 V, 12 V, 13.2 V, 15 V, 18 V, 20 V, 24 V Features z Suitable for TTL, C2MOS power supply. z Internal short-circuit current limiting. z Internal thermal overload protection. z Maximum output current of 150 mA (Tj = 25°C). z Available in a plastic TO-92MOD package. Pin Assignment Marking side 2 3 1 OUT GND IN Weight: 0.36 g (Typ.) Marking TA78L Part No. (or abbreviation code) ***AP Lot No. (weekly code) A line indicates lead (Pb)-free package or lead (Pb)-free finish. Equivalent Circuit 1 2006-11-02 TA78L005,006,007,075,008,009,10,12,132,15,18,20,24AP Absolute Maximum Ratings (Ta = 25°C) Characteristics Symbol Rating Unit TA78L005AP TA78L006AP TA78L007AP TA78L075AP TA78L008AP 35 TA78L009AP Input voltage TA78L010AP VIN V TA78L012AP TA78L132AP TA78L015AP TA78L018AP 40 TA78L020AP TA78L024AP Power dissipation PD 800 mW Operating temperature Topr −30~85 °C Storage temperature Tstg −55~150 °C Junction temperature Tj 150 °C Rth (j-a) 156 °C/W Thermal resistance (Ta = 25°C) Note: Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the significant change in temperature, etc.) may cause this product to decrease in the reliability significantly even if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum ratings and the operating ranges. Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook (“Handling Precautions”/Derating Concept and Methods) and individual reliability data (i.e. reliability test report and estimated failure rate, etc). 2 2006-11-02 TA78L005,006,007,075,008,009,10,12,132,15,18,20,24AP TA78L005AP Electrical Characteristics (Unless otherwise specified, VIN = 10 V, IOUT = 40 mA, CIN = 0.33 μF, COUT = 0.1 μF, 0°C ≤ Tj ≤ 125°C) Symbol Test Circuit Output voltage VOUT 1 Tj = 25°C Line regulation Reg·line 1 Tj = 25°C Load regulation Reg·load 1 Tj = 25°C Output voltage VOUT 1 Characteristics Quiescent current Test Condition Min Typ. Max Unit 4.8 5.0 5.2 V 7.0 V ≤ VIN ≤ 20 V ― 55 150 8.0 V ≤ VIN ≤ 20 V ― 45 100 1.0 mA ≤ IOUT ≤ 100 mA ― 11 60 1.0 mA ≤ IOUT ≤ 40 mA ― 5.0 30 7.0 V ≤ VIN ≤ 20 V, Tj = 25°C 1.0 mA ≤ IOUT ≤ 40 mA 4.75 ― 5.25 1.0 mA ≤ IOUT ≤ 70 mA 4.75 ― 5.25 Tj = 25°C ― 3.1 6.0 Tj = 125°C ― ― 5.5 8.0 V ≤ VIN ≤ 20 V ― ― 1.5 1.0 mA ≤ IOUT ≤ 40 mA ― ― 0.1 ― 40 ― μVrms ― 12 ― mV/kh mV mV V mA IB 1 Quiescent current change ΔIB 1 Tj = 25°C Output noise voltage VNO 2 Ta = 25°C, 10 Hz ≤ f ≤ 100 kHz ΔVOUT/Δt 1 Ripple rejection R.R. 3 f = 120 Hz, 8.0 V ≤ VIN ≤ 18 V, Tj = 25°C 41 49 ― dB Dropout voltage VD 1 Tj = 25°C, IOUT = 150 mA ― 1.7 ― V TCVO 1 IOUT = 5 mA ― −0.6 ― mV/°C Long term stability Average temperature coefficient of output voltage ― 3 mA 2006-11-02 TA78L005,006,007,075,008,009,10,12,132,15,18,20,24AP TA78L006AP Electrical Characteristics (Unless otherwise specified, VIN = 11 V, IOUT = 40 mA, CIN = 0.33 μF, COUT = 0.1 μF, 0°C ≤ Tj ≤ 125°C) Symbol Test Circuit Output voltage VOUT 1 Tj = 25°C Line regulation Reg·line 1 Tj = 25°C Load regulation Reg·load 1 Tj = 25°C Output voltage VOUT 1 Characteristics Quiescent current Test Condition Min Typ. Max Unit 5.76 6.0 6.24 V 8.1 V ≤ VIN ≤ 21 V ― 50 150 9.0 V ≤ VIN ≤ 21 V ― 45 110 1.0 mA ≤ IOUT ≤ 100 mA ― 12 70 1.0 mA ≤ IOUT ≤ 40 mA ― 5.5 35 8.1 V ≤ VIN ≤ 21 V, Tj = 25°C 1.0 mA ≤ IOUT ≤ 40 mA 5.7 ― 6.3 1.0 mA ≤ IOUT ≤ 70 mA 5.7 ― 6.3 Tj = 25°C ― 3.1 6.0 Tj = 125°C ― ― 5.5 9.0 V ≤ VIN ≤ 20 V ― ― 1.5 1.0 mA ≤ IOUT ≤ 40 mA ― ― 0.1 ― 40 ― μVrms ― 14 ― mV/kh mV mV V mA IB 1 Quiescent current change ΔIB 1 Tj = 25°C Output noise voltage VNO 2 Ta = 25°C, 10 Hz ≤ f ≤ 100 kHz ΔVOUT/Δt 1 Ripple rejection R.R. 3 f = 120 Hz, 9.0 V ≤ VIN ≤ 19 V, Tj = 25°C 39 47 ― dB Dropout voltage VD 1 Tj = 25°C, IOUT = 150 mA ― 1.7 ― V TCVO 1 IOUT = 5 mA ― −0.7 ― mV/°C Long term stability Average temperature coefficient of output voltage ― 4 mA 2006-11-02 TA78L005,006,007,075,008,009,10,12,132,15,18,20,24AP TA78L007AP Electrical Characteristics (Unless otherwise specified, VIN = 12 V, IOUT = 40 mA, CIN = 0.33 μF, COUT = 0.1 μF, 0°C ≤ Tj ≤ 125°C) Symbol Test Circuit Output voltage VOUT 1 Tj = 25°C Line regulation Reg·line 1 Tj = 25°C Load regulation Reg·load 1 Tj = 25°C Output voltage VOUT 1 Characteristics Quiescent current Test Condition Min Typ. Max Unit 6.72 7.0 7.28 V 9.2 V ≤ VIN ≤ 22 V ― 50 160 10 V ≤ VIN ≤ 22 V ― 45 115 1.0 mA ≤ IOUT ≤ 100 mA ― 13 75 1.0 mA ≤ IOUT ≤ 40 mA ― 6.0 40 9.2 V ≤ VIN ≤ 22 V, Tj = 25°C 1.0 mA ≤ IOUT ≤ 40 mA 6.65 ― 7.35 1.0 mA ≤ IOUT ≤ 70 mA 6.65 ― 7.35 Tj = 25°C ― 3.1 6.5 Tj = 125°C ― ― 6.0 10 V ≤ VIN ≤ 22 V ― ― 1.5 1.0 mA ≤ IOUT ≤ 40 mA ― ― 0.1 ― 50 ― μVrms ― 17 ― mV/kh mV mV V mA IB 1 Quiescent current change ΔIB 1 Tj = 25°C Output noise voltage VNO 2 Ta = 25°C, 10 Hz ≤ f ≤ 100 kHz ΔVOUT/Δt 1 Ripple rejection R.R. 3 f = 120 Hz, 10 V ≤ VIN ≤ 20 V, Tj = 25°C 37 46 ― dB Dropout voltage VD 1 Tj = 25°C, IOUT = 150 mA ― 1.7 ― V TCVO 1 IOUT = 5 mA ― −0.75 ― mV/°C Long term stability Average temperature coefficient of output voltage ― 5 mA 2006-11-02 TA78L005,006,007,075,008,009,10,12,132,15,18,20,24AP TA78L075AP Electrical Characteristics (Unless otherwise specified, VIN = 13 V, IOUT = 40 mA, CIN = 0.33 μF, COUT = 0.1 μF, 0°C ≤ Tj ≤ 125°C) Symbol Test Circuit Output voltage VOUT 1 Tj = 25°C Line regulation Reg·line 1 Tj = 25°C Load regulation Reg·load 1 Tj = 25°C Output voltage VOUT 1 Characteristics Quiescent current Test Condition Min Typ. Max Unit 7.21 7.5 7.79 V 9.8 V ≤ VIN ≤ 23 V ― 40 170 10.5 V ≤ VIN ≤ 23 V ― 40 120 1.0 mA ≤ IOUT ≤ 100 mA ― 14 80 1.0 mA ≤ IOUT ≤ 40 mA ― 6.5 40 9.8 V ≤ VIN ≤ 23 V, Tj = 25°C 1.0 mA ≤ IOUT ≤ 40 mA 7.125 ― 7.875 1.0 mA ≤ IOUT ≤ 70 mA 7.125 ― 7.875 Tj = 25°C ― 3.1 6.5 Tj = 125°C ― ― 6.0 10.5 V ≤ VIN ≤ 23 V ― ― 1.5 1.0 mA ≤ IOUT ≤ 40 mA ― ― 0.1 ― 60 ― μVrms ― 19 ― mV/kh mV mV V mA IB 1 Quiescent current change ΔIB 1 Tj = 25°C Output noise voltage VNO 2 Ta = 25°C, 10 Hz ≤ f ≤ 100 kHz ΔVOUT/Δt 1 Ripple rejection R.R. 3 f = 120 Hz, 11 V ≤ VIN ≤ 21 V, Tj = 25°C 37 45 ― dB Dropout voltage VD 1 Tj = 25°C, IOUT = 150 mA ― 1.7 ― V TCVO 1 IOUT = 5 mA ― −0.75 ― mV/°C Long term stability Average temperature coefficient of output voltage ― 6 mA 2006-11-02 TA78L005,006,007,075,008,009,10,12,132,15,18,20,24AP TA78L008AP Electrical Characteristics (Unless otherwise specified, VIN = 14 V, IOUT = 40 mA, CIN = 0.33 μF, COUT = 0.1 μF, 0°C ≤ Tj ≤ 125°C) Symbol Test Circuit Output voltage VOUT 1 Tj = 25°C Line regulation Reg·line 1 Tj = 25°C Load regulation Reg·load 1 Tj = 25°C Output voltage VOUT 1 Characteristics Quiescent current Test Condition Min Typ. Max Unit 7.7 8.0 8.3 V 10.5 V ≤ VIN ≤ 23 V ― 20 175 11 V ≤ VIN ≤ 23 V ― 12 125 1.0 mA ≤ IOUT ≤ 100 mA ― 15 80 1.0 mA ≤ IOUT ≤ 40 mA ― 7.0 40 10.5 V ≤ VIN ≤ 23 V, Tj = 25°C 1.0 mA ≤ IOUT ≤ 40 mA 7.6 ― 8.4 1.0 mA ≤ IOUT ≤ 70 mA 7.6 ― 8.4 Tj = 25°C ― 3.1 6.5 Tj = 125°C ― ― 6.0 11 V ≤ VIN ≤ 23 V ― ― 1.5 1.0 mA ≤ IOUT ≤ 40 mA ― ― 0.1 ― 60 ― μVrms ― 20 ― mV/kh mV mV V mA IB 1 Quiescent current change ΔIB 1 Tj = 25°C Output noise voltage VNO 2 Ta = 25°C, 10 Hz ≤ f ≤ 100 kHz ΔVOUT/Δt 1 Ripple rejection R.R. 3 f = 120 Hz, 12 V ≤ VIN ≤ 23 V, Tj = 25°C 37 45 ― dB Dropout voltage VD 1 Tj = 25°C, IOUT = 150 mA ― 1.7 ― V TCVO 1 IOUT = 5 mA ― −0.8 ― mV/°C Long term stability Average temperature coefficient of output voltage ― 7 mA 2006-11-02 TA78L005,006,007,075,008,009,10,12,132,15,18,20,24AP TA78L009AP Electrical Characteristics (Unless otherwise specified, VIN = 15 V, IOUT = 40 mA, CIN = 0.33 μF, COUT = 0.1 μF, 0°C ≤ Tj ≤ 125°C) Symbol Test Circuit Output voltage VOUT 1 Tj = 25°C Line regulation Reg·line 1 Tj = 25°C Load regulation Reg·load 1 Tj = 25°C Output voltage VOUT 1 Characteristics Quiescent current Test Condition Min Typ. Max Unit 8.64 9.0 9.36 V 11.4 V ≤ VIN ≤ 24 V ― 80 200 12 V ≤ VIN ≤ 24 V ― 20 160 1.0 mA ≤ IOUT ≤ 100 mA ― 17 90 1.0 mA ≤ IOUT ≤ 40 mA ― 8.0 45 11.4 V ≤ VIN ≤ 24 V, Tj = 25°C 1.0 mA ≤ IOUT ≤ 40 mA 8.55 ― 9.45 1.0 mA ≤ IOUT ≤ 70 mA 8.55 ― 9.45 Tj = 25°C ― 3.2 6.5 Tj = 125°C ― ― 6.0 12 V ≤ VIN ≤ 24 V ― ― 1.5 1.0 mA ≤ IOUT ≤ 40 mA ― ― 0.1 ― 65 ― μVrms ― 21 ― mV/kh mV mV V mA IB 1 Quiescent current change ΔIB 1 Tj = 25°C Output noise voltage VNO 2 Ta = 25°C, 10 Hz ≤ f ≤ 100 kHz ΔVOUT/Δt 1 Ripple rejection R.R. 3 f = 120 Hz, 12 V ≤ VIN ≤ 24 V, Tj = 25°C 36 44 ― dB Dropout voltage VD 1 Tj = 25°C, IOUT = 150 mA ― 1.7 ― V TCVO 1 IOUT = 5 mA ― −0.85 ― mV/°C Long term stability Average temperature coefficient of output voltage ― 8 mA 2006-11-02 TA78L005,006,007,075,008,009,10,12,132,15,18,20,24AP TA78L010AP Electrical Characteristics (Unless otherwise specified, VIN = 16 V, IOUT = 40 mA, CIN = 0.33 μF, COUT = 0.1 μF, 0°C ≤ Tj ≤ 125°C) Symbol Test Circuit Output voltage VOUT 1 Tj = 25°C Line regulation Reg·line 1 Tj = 25°C Load regulation Reg·load 1 Tj = 25°C Output voltage VOUT 1 Characteristics Quiescent current Test Condition Min Typ. Max Unit 9.6 10 10.4 V 12.5 V ≤ VIN ≤ 25 V ― 80 230 13 V ≤ VIN ≤ 25 V ― 30 170 1.0 mA ≤ IOUT ≤ 100 mA ― 18 90 1.0 mA ≤ IOUT ≤ 40 mA ― 8.5 45 12.5 V ≤ VIN ≤ 25 V, Tj = 25°C 1.0 mA ≤ IOUT ≤ 40 mA 9.5 ― 10.5 1.0 mA ≤ IOUT ≤ 70 mA 9.5 ― 10.5 Tj = 25°C ― 3.2 6.5 Tj = 125°C ― ― 6.0 13 V ≤ VIN ≤ 25 V ― ― 1.5 1.0 mA ≤ IOUT ≤ 40 mA ― ― 0.1 ― 70 ― μVrms ― 22 ― mV/kh mV mV V mA IB 1 Quiescent current change ΔIB 1 Tj = 25°C Output noise voltage VNO 2 Ta = 25°C, 10 Hz ≤ f ≤ 100 kHz ΔVOUT/Δt 1 Ripple rejection R.R. 3 f = 120 Hz, 13 V ≤ VIN ≤ 24 V, Tj = 25°C 36 43 ― dB Dropout voltage VD 1 Tj = 25°C, IOUT = 150 mA ― 1.7 ― V TCVO 1 IOUT = 5 mA ― −0.9 ― mV/°C Long term stability Average temperature coefficient of output voltage ― 9 mA 2006-11-02 TA78L005,006,007,075,008,009,10,12,132,15,18,20,24AP TA78L012AP Electrical Characteristics (Unless otherwise specified, VIN = 19 V, IOUT = 40 mA, CIN = 0.33 μF, COUT = 0.1 μF, 0°C ≤ Tj ≤ 125°C) Symbol Test Circuit Output voltage VOUT 1 Tj = 25°C Line regulation Reg·line 1 Tj = 25°C Load regulation Reg·load 1 Tj = 25°C Output voltage VOUT 1 Characteristics Quiescent current Test Condition Min Typ. Max Unit 11.5 12 12.5 V 14.5 V ≤ VIN ≤ 27 V ― 120 250 16 V ≤ VIN ≤ 27 V ― 100 200 1.0 mA ≤ IOUT ≤ 100 mA ― 20 100 1.0 mA ≤ IOUT ≤ 40 mA ― 10 50 14.5 V ≤ VIN ≤ 27 V, Tj = 25°C 1.0 mA ≤ IOUT ≤ 40 mA 11.4 ― 12.6 1.0 mA ≤ IOUT ≤ 70 mA 11.4 ― 12.6 Tj = 25°C ― 3.2 6.5 Tj = 125°C ― ― 6.0 16 V ≤ VIN ≤ 27 V ― ― 1.5 1.0 mA ≤ IOUT ≤ 40 mA ― ― 0.1 ― 80 ― μVrms ― 24 ― mV/kh mV mV V mA IB 1 Quiescent current change ΔIB 1 Tj = 25°C Output noise voltage VNO 2 Ta = 25°C, 10 Hz ≤ f ≤ 100 kHz ΔVOUT/Δt 1 Ripple rejection R.R. 3 f = 120 Hz, 15 V ≤ VIN ≤ 25 V, Tj = 25°C 36 41 ― dB Dropout voltage VD 1 Tj = 25°C, IOUT = 150 mA ― 1.7 ― V TCVO 1 IOUT = 5 mA ― −1.0 ― mV/°C Long term stability Average temperature coefficient of output voltage ― 10 mA 2006-11-02 TA78L005,006,007,075,008,009,10,12,132,15,18,20,24AP TA78L132AP Electrical Characteristics (Unless otherwise specified, VIN = 21 V, IOUT = 40 mA, CIN = 0.33 μF, COUT = 0.1 μF, 0°C ≤ Tj ≤ 125°C) Symbol Test Circuit Output voltage VOUT 1 Tj = 25°C Line regulation Reg·line 1 Tj = 25°C Load regulation Reg·load 1 Tj = 25°C Output voltage VOUT 1 Characteristics Quiescent current Test Condition Min Typ. Max Unit 12.67 13.2 13.73 V 16 V ≤ VIN ≤ 28 V ― 125 270 17 V ≤ VIN ≤ 28 V ― 105 225 1.0 mA ≤ IOUT ≤ 100 mA ― 22 120 1.0 mA ≤ IOUT ≤ 40 mA ― 11 60 16 V ≤ VIN ≤ 28 V, Tj = 25°C 1.0 mA ≤ IOUT ≤ 40 mA 12.54 ― 13.86 1.0 mA ≤ IOUT ≤ 70 mA 12.54 ― 13.86 Tj = 25°C ― 3.2 6.5 Tj = 125°C ― ― 6.0 17 V ≤ VIN ≤ 28 V ― ― 1.5 1.0 mA ≤ IOUT ≤ 40 mA ― ― 0.1 ― 90 ― μVrms ― 28 ― mV/kh mV mV V mA IB 1 Quiescent current change ΔIB 1 Tj = 25°C Output noise voltage VNO 2 Ta = 25°C, 10 Hz ≤ f ≤ 100 kHz ΔVOUT/Δt 1 Ripple rejection R.R. 3 f = 120 Hz, 17 V ≤ VIN ≤ 27 V, Tj = 25°C 34 41 ― dB Dropout voltage VD 1 Tj = 25°C, IOUT = 150 mA ― 1.7 ― V TCVO 1 IOUT = 5 mA ― −1.2 ― mV/°C Long term stability Average temperature coefficient of output voltage ― 11 mA 2006-11-02 TA78L005,006,007,075,008,009,10,12,132,15,18,20,24AP TA78L015AP Electrical Characteristics (Unless otherwise specified, VIN = 23 V, IOUT = 40 mA, CIN = 0.33 μF, COUT = 0.1 μF, 0°C ≤ Tj ≤ 125°C) Symbol Test Circuit Output voltage VOUT 1 Tj = 25°C Line regulation Reg·line 1 Tj = 25°C Load regulation Reg·load 1 Tj = 25°C Output voltage VOUT 1 Characteristics Quiescent current Test Condition Min Typ. Max Unit 14.4 15 15.6 V 17.5 V ≤ VIN ≤ 30 V ― 130 300 20 V ≤ VIN ≤ 30 V ― 110 250 1.0 mA ≤ IOUT ≤ 100 mA ― 25 150 1.0 mA ≤ IOUT ≤ 40 mA ― 12 75 17.5 V ≤ VIN ≤ 30 V, Tj = 25°C 1.0 mA ≤ IOUT ≤ 40 mA 14.25 ― 15.75 1.0 mA ≤ IOUT ≤ 70 mA 14.25 ― 15.75 Tj = 25°C ― 3.3 6.5 Tj = 125°C ― ― 6.0 20 V ≤ VIN ≤ 30 V ― ― 1.5 1.0 mA ≤ IOUT ≤ 40 mA ― ― 0.1 ― 90 ― μVrms ― 30 ― mV/kh mV mV V mA IB 1 Quiescent current change ΔIB 1 Tj = 25°C Output noise voltage VNO 2 Ta = 25°C, 10 Hz ≤ f ≤ 100 kHz ΔVOUT/Δt 1 Ripple rejection R.R. 3 f = 120 Hz, 18.5 V ≤ VIN ≤ 28.5 V, Tj = 25°C 34 40 ― dB Dropout voltage VD 1 Tj = 25°C, IOUT = 150 mA ― 1.7 ― V TCVO 1 IOUT = 5 mA ― −1.3 ― mV/°C Long term stability Average temperature coefficient of output voltage ― 12 mA 2006-11-02 TA78L005,006,007,075,008,009,10,12,132,15,18,20,24AP TA78L018AP Electrical Characteristics (Unless otherwise specified, VIN = 27 V, IOUT = 40 mA, CIN = 0.33 μF, COUT = 0.1 μF, 0°C ≤ Tj ≤ 125°C) Symbol Test Circuit Output voltage VOUT 1 Tj = 25°C Line regulation Reg·line 1 Tj = 25°C Load regulation Reg·load 1 Tj = 25°C Output voltage VOUT 1 Characteristics Quiescent current Test Condition Min Typ. Max Unit 17.3 18 18.7 V 21.4 V ≤ VIN ≤ 33 V ― 32 325 22 V ≤ VIN ≤ 33 V ― 27 275 1.0 mA ≤ IOUT ≤ 100 mA ― 30 170 1.0 mA ≤ IOUT ≤ 40 mA ― 15 75 21.4 V ≤ VIN ≤ 33 V, Tj = 25°C 1.0 mA ≤ IOUT ≤ 40 mA 17.1 ― 18.9 1.0 mA ≤ IOUT ≤ 70 mA 17.1 ― 18.9 Tj = 25°C ― 3.3 6.5 Tj = 125°C ― ― 6.0 22 V ≤ VIN ≤ 33 V ― ― 1.5 1.0 mA ≤ IOUT ≤ 40 mA ― ― 0.1 ― 150 ― μVrms ― 45 ― mV/kh mV mV V mA IB 1 Quiescent current change ΔIB 1 Tj = 25°C Output noise voltage VNO 2 Ta = 25°C, 10 Hz ≤ f ≤ 100 kHz ΔVOUT/Δt 1 Ripple rejection R.R. 3 f = 120 Hz, 23 V ≤ VIN ≤ 33 V, Tj = 25°C 32 38 ― dB Dropout voltage VD 1 Tj = 25°C, IOUT = 150 mA ― 1.7 ― V TCVO 1 IOUT = 5 mA ― −1.5 ― mV/°C Long term stability Average temperature coefficient of output voltage ― 13 mA 2006-11-02 TA78L005,006,007,075,008,009,10,12,132,15,18,20,24AP TA78L020AP Electrical Characteristics (Unless otherwise specified, VIN = 29 V, IOUT = 40 mA, CIN = 0.33 μF, COUT = 0.1 μF, 0°C ≤ Tj ≤ 125°C) Symbol Test Circuit Output voltage VOUT 1 Tj = 25°C Line regulation Reg·line 1 Tj = 25°C Load regulation Reg·load 1 Tj = 25°C Output voltage VOUT 1 Characteristics Quiescent current Test Condition Min Typ. Max Unit 19.2 20 20.8 V 23.5 V ≤ VIN ≤ 35 V ― 33 330 24 V ≤ VIN ≤ 35 V ― 28 285 1.0 mA ≤ IOUT ≤ 100 mA ― 33 180 1.0 mA ≤ IOUT ≤ 40 mA ― 17 90 23.5 V ≤ VIN ≤ 35 V, Tj = 25°C 1.0 mA ≤ IOUT ≤ 40 mA 19.0 ― 21.0 1.0 mA ≤ IOUT ≤ 70 mA 19.0 ― 21.0 Tj = 25°C ― 3.3 6.5 Tj = 125°C ― ― 6.0 24 V ≤ VIN ≤ 35 V ― ― 1.5 1.0 mA ≤ IOUT ≤ 40 mA ― ― 0.1 ― 170 ― μVrms ― 49 ― mV/kh mV mV V mA IB 1 Quiescent current change ΔIB 1 Tj = 25°C Output noise voltage VNO 2 Ta = 25°C, 10 Hz ≤ f ≤ 100 kHz ΔVOUT/Δt 1 Ripple rejection R.R. 3 f = 120 Hz, 25 V ≤ VIN ≤ 35 V, Tj = 25°C 31 37 ― dB Dropout voltage VD 1 Tj = 25°C, IOUT = 150 mA ― 1.7 ― V TCVO 1 IOUT = 5 mA ― −1.7 ― mV/°C Long term stability Average temperature coefficient of output voltage ― 14 mA 2006-11-02 TA78L005,006,007,075,008,009,10,12,132,15,18,20,24AP TA78L024AP Electrical Characteristics (Unless otherwise specified, VIN = 33 V, IOUT = 40 mA, CIN = 0.33 μF, COUT = 0.1 μF, 0°C ≤ Tj ≤ 125°C) Symbol Test Circuit Output voltage VOUT 1 Tj = 25°C Line regulation Reg·line 1 Tj = 25°C Load regulation Reg·load 1 Tj = 25°C Output voltage VOUT 1 Characteristics Quiescent current Test Condition Min Typ. Max Unit 23 24 25 V 27.5 V ≤ VIN ≤ 38 V ― 35 350 28 V ≤ VIN ≤ 38 V ― 30 300 1.0 mA ≤ IOUT ≤ 100 mA ― 40 200 1.0 mA ≤ IOUT ≤ 40 mA ― 20 100 27.5 V ≤ VIN ≤ 38 V, Tj = 25°C 1.0 mA ≤ IOUT ≤ 40 mA 22.8 ― 25.2 1.0 mA ≤ IOUT ≤ 70 mA 22.8 ― 25.2 Tj = 25°C ― 3.5 6.5 Tj = 125°C ― ― 6.0 28 V ≤ VIN ≤ 38 V ― ― 1.5 1.0 mA ≤ IOUT ≤ 40 mA ― ― 0.1 ― 200 ― μVrms ― 56 ― mV/kh mV mV V mA IB 1 Quiescent current change ΔIB 1 Tj = 25°C Output noise voltage VNO 2 Ta = 25°C, 10 Hz ≤ f ≤ 100 kHz ΔVOUT/Δt 1 Ripple rejection R.R. 3 f = 120 Hz, 29 V ≤ VIN ≤ 39 V, Tj = 25°C 31 35 ― dB Dropout voltage VD 1 Tj = 25°C, IOUT = 150 mA ― 1.7 ― V TCVO 1 IOUT = 5 mA ― −2.0 ― mV/°C Long term stability Average temperature coefficient of output voltage ― 15 mA 2006-11-02 TA78L005,006,007,075,008,009,10,12,132,15,18,20,24AP Test Circuit 1/Standard Application Test Circuit 2 VNO Test Circuit 3 R.R. 16 2006-11-02 TA78L005,006,007,075,008,009,10,12,132,15,18,20,24AP 17 2006-11-02 TA78L005,006,007,075,008,009,10,12,132,15,18,20,24AP 18 2006-11-02 TA78L005,006,007,075,008,009,10,12,132,15,18,20,24AP Precautions for Use Destruction of the IC may occur if high voltage in excess of the IC output voltage (typ. value) is applied to the IC output terminal. In this case, connect a Zener diode between the output terminal and GND to prevent any application of excessive voltage. In particular, in a current boosting circuit such as that shown in Application Circuit Example (2), if the input voltage is suddenly applied by stages and furthermore, load is light, excessive voltage may be applied transiently to the output terminal of the IC. In such a case, it may become necessary to increase the capacity of the output capacitor as appropriate, use a smaller R1 (a resistor for bypassing IC bias current) or gradually raise the input voltage in addition to using a Zener diode as mentioned above. Application Circuits (1) Standard Application (2) A. Current Boost Voltage Regulator B. Short-Circuit Protection (3) Current Regulator 19 2006-11-02 TA78L005,006,007,075,008,009,10,12,132,15,18,20,24AP (4) Voltage Boost Regulator (5) Negative Regulator (6) Positive and Negative Regulator 20 2006-11-02 TA78L005,006,007,075,008,009,10,12,132,15,18,20,24AP Package Dimensions 21 2006-11-02 TA78L005,006,007,075,008,009,10,12,132,15,18,20,24AP RESTRICTIONS ON PRODUCT USE 20070701-EN • The information contained herein is subject to change without notice. • TOSHIBA is continually working to improve the quality and reliability of its products. Nevertheless, semiconductor devices in general can malfunction or fail due to their inherent electrical sensitivity and vulnerability to physical stress. It is the responsibility of the buyer, when utilizing TOSHIBA products, to comply with the standards of safety in making a safe design for the entire system, and to avoid situations in which a malfunction or failure of such TOSHIBA products could cause loss of human life, bodily injury or damage to property. In developing your designs, please ensure that TOSHIBA products are used within specified operating ranges as set forth in the most recent TOSHIBA products specifications. Also, please keep in mind the precautions and conditions set forth in the “Handling Guide for Semiconductor Devices,” or “TOSHIBA Semiconductor Reliability Handbook” etc. • The TOSHIBA products listed in this document are intended for usage in general electronics applications (computer, personal equipment, office equipment, measuring equipment, industrial robotics, domestic appliances, etc.).These TOSHIBA products are neither intended nor warranted for usage in equipment that requires extraordinarily high quality and/or reliability or a malfunction or failure of which may cause loss of human life or bodily injury (“Unintended Usage”). Unintended Usage include atomic energy control instruments, airplane or spaceship instruments, transportation instruments, traffic signal instruments, combustion control instruments, medical instruments, all types of safety devices, etc.. Unintended Usage of TOSHIBA products listed in his document shall be made at the customer’s own risk. • The products described in this document shall not be used or embedded to any downstream products of which manufacture, use and/or sale are prohibited under any applicable laws and regulations. • The information contained herein is presented only as a guide for the applications of our products. No responsibility is assumed by TOSHIBA for any infringements of patents or other rights of the third parties which may result from its use. No license is granted by implication or otherwise under any patents or other rights of TOSHIBA or the third parties. • Please contact your sales representative for product-by-product details in this document regarding RoHS compatibility. Please use these products in this document in compliance with all applicable laws and regulations that regulate the inclusion or use of controlled substances. Toshiba assumes no liability for damage or losses occurring as a result of noncompliance with applicable laws and regulations. 22 2006-11-02