TOSHIBA JDV2S07FS

JDV2S07FS
TOSHIBA DIODE Silicon Epitaxial Planar Type
JDV2S07FS
VCO for UHF Band Radio
Unit: mm
•
High Capacitance Ratio : C1V/C4V = 2.3 (typ.)
•
Low Series Resistance : rs = 0.42 Ω (typ.)
•
This device is suitable for use in a small-size tuner.
0.6±0.05
0.1
Rating
Unit
0.07
Reverse voltage
VR
10
V
Junction temperature
Tj
150
°C
Tstg
−55~150
°C
Storage temperature range
A
M
0.1±0.05
0.48 +0.02
-0.03
JEDEC
―
JEITA
―
TOSHIBA
1-1L1A
Weight: 0.0006 g (typ.)
Electrical Characteristics (Ta = 25°C)
Characteristics
1.0±0.05
0.2
±0.05
0.1
Symbol
0.8±0.05
カソードマーク
Maximum Ratings (Ta = 25°C)
Characteristics
A
Symbol
Test Condition
Min
Typ.
Max
Unit
Reverse voltage
VR
IR = 1 µA
10
⎯
⎯
V
Reverse current
IR
VR = 10 V
⎯
⎯
3
nA
C1V
VR = 1 V, f = 1 MHz
4.0
4.5
4.9
C4V
VR = 4 V, f = 1 MHz
1.85
2.0
2.35
2.0
2.3
⎯
⎯
⎯
0.42
0.55
Ω
Capacitance
Capacitance ratio
C1V/C4V
Series resistance
rs
⎯
VR = 1 V, f = 470 MHz
pF
Note: Signal level when capacitance is measured: Vsig = 500 mVrms
Marking
D
1
2004-02-09
JDV2S07FS
CV – VR
IR – VR
10
Ta = 25°C
IR (pA)
7
5
Reverse current
Capacitance
CV
(pF)
100
f = 1 MHz
3
2
1
0
2
1
3
4
5
6
Reverse voltage
7
VR
8
9
10
Ta = 80°C
60
1
25
0.1
0.01
0
10
4
8
Reverse voltage
(V)
0.2
0.1
2
3
Reverse voltage
VR
5
(%)
0.3
δC
Series resistance
0.4
3
2
Capacitance change Ratio
0.5
rs
(Ω)
f = 1 MHz
Ta = 25°C
1
(V)
4
f = 470 MHz
0.6
0.5
VR
16
δC – Ta
rs – VR
0.7
0
0.3
12
1
(V)
2
6V
−1
−2
−3
−20
0
20
Ambient temperature
2
4
0
−4
−40
10
VR = 1 V
40
Ta
60
80
(°C)
2004-02-09
JDV2S07FS
RESTRICTIONS ON PRODUCT USE
030619EAA
• The information contained herein is subject to change without notice.
• The information contained herein is presented only as a guide for the applications of our products. No
responsibility is assumed by TOSHIBA for any infringements of patents or other rights of the third parties which
may result from its use. No license is granted by implication or otherwise under any patent or patent rights of
TOSHIBA or others.
• TOSHIBA is continually working to improve the quality and reliability of its products. Nevertheless, semiconductor
devices in general can malfunction or fail due to their inherent electrical sensitivity and vulnerability to physical
stress. It is the responsibility of the buyer, when utilizing TOSHIBA products, to comply with the standards of
safety in making a safe design for the entire system, and to avoid situations in which a malfunction or failure of
such TOSHIBA products could cause loss of human life, bodily injury or damage to property.
In developing your designs, please ensure that TOSHIBA products are used within specified operating ranges as
set forth in the most recent TOSHIBA products specifications. Also, please keep in mind the precautions and
conditions set forth in the “Handling Guide for Semiconductor Devices,” or “TOSHIBA Semiconductor Reliability
Handbook” etc..
• The TOSHIBA products listed in this document are intended for usage in general electronics applications
(computer, personal equipment, office equipment, measuring equipment, industrial robotics, domestic appliances,
etc.). These TOSHIBA products are neither intended nor warranted for usage in equipment that requires
extraordinarily high quality and/or reliability or a malfunction or failure of which may cause loss of human life or
bodily injury (“Unintended Usage”). Unintended Usage include atomic energy control instruments, airplane or
spaceship instruments, transportation instruments, traffic signal instruments, combustion control instruments,
medical instruments, all types of safety devices, etc.. Unintended Usage of TOSHIBA products listed in this
document shall be made at the customer’s own risk.
• TOSHIBA products should not be embedded to the downstream products which are prohibited to be produced
and sold, under any law and regulations.
3
2004-02-09