TC7MH165FK TOSHIBA CMOS Digital Integrated Circuit Silicon Monolithic TC7MH165FK 8-Bit Shift Register (P-In, S-Out) The TC7MH165FK is an advanced high speed CMOS 8-bit parallel/serial-in, serial-out shift register fabricated with silicon gate C2MOS technology. It achieves the high speed operation similar to equivalent bipolar schottky TTL while maintaining the CMOS low power dissipation. It consists of parallel-in or serial-in, serial-out 8-bit shift register with a gated clock input. When the SHIFT/LOAD input is held high, the serial data input is enabled and the eight flip-flops perform serial shifting with each clock pulse. When the SHIFT/ LOAD input is held low, the parallel data is loaded synchronously into the register at positive going transition Weight: 0.02 g (typ.) of the clock pulse. The CK-INH input should be shifted high only when the CK input is held high. An Input protection circuit ensures that 0 to 5.5 V can be applied to the input pins without regard to the supply voltage. This device can be used to interface 5 V to 3 V systems and on two supply systems such as battery back up. This circuit prevents device destruction due to mismatched supply and input voltages. Features • High speed: fmax = 150 MHz (typ.) (VCC = 5 V) • Low power dissipation: ICC = 4 μA (max) (Ta = 25°C) • High noise immunity: VNIH = VNIL = 28% VCC (min) • Power down protection is provided on all inputs. • Balanced propagation delays: tpLH ≈ tpHL • Wide operating voltage range: VCC (opr) = 2~5.5 V • Pin and function compatible with 74ALS165 1 2007-10-19 TC7MH165FK Pin Assignment (top view) IEC Logic Symbol S/L 1 16 VCC CK 2 15 CK INH E 3 14 D (1) S/L (15) CK INH (2) CK SI F 13 4 C G 5 12 B H 6 11 A A B C D E QH 7 10 SI GND 8 9 QH F G H (10) (11) (12) (13) SRG 8 C1 [LOAD] > =1 C2/→ 2D 1D 1D (14) (3) (4) (5) (6) (9) 1D (7) QH QH Truth Table Inputs Internal Outputs Outputs Serial In Parallel A............H QA QB QH QH X a ............ h a b h h L H X H QAn QGn QGn L L X L QAn QGn QGn Shift/ LOAD CK INH CK L X X H H H L H X H QAn QGn QGn H L L X L QAn QGn QGn H X H X X No change H H X X X No change X: Don’t care a .....h: The level of steady state input voltage at inputs A through H respectively QAn-QGn: The level of QA~QG, respectively, before the most recent positive transition of the CK. 2 2007-10-19 TC7MH165FK Timing Chart CK CK INH Serial Input Shift/ LOAD A H B L C L D H E L F H G L H H Output QH H L H L H L L H Output QH L H L H L H H L Don’t care until S/L goes “L” Parallel Inputs Serial shift Load 3 Inhibit Serial shift 2007-10-19 TC7MH165FK System Diagram A B 11 Serial input 10 Clock 2 D PD C 13 12 Q D PD D Q D E 14 PD Q D F 3 PD Q D G 4 PD Q D PD H 6 5 Q D PD Q D PD 9 Q 7 CK S/L CK S/L CK S/L CK S/L CK S/L CK S/L CK S/L CK S/L QH QH 15 Clock inhibit Flip-flop PD φL 1 Shift/ LOAD Q D φL φ φ φ φ φ φ CK φL φL S/L 4 2007-10-19 TC7MH165FK Absolute Maximum Ratings (Note) Characteristics Supply voltage range Symbol Rating Unit VCC −0.5~7.0 V VIN −0.5~7.0 V VOUT −0.5~VCC + 0.5 V Input diode current IIK −20 mA Output diode current IOK ±20 mA DC output current IOUT ±25 mA DC VCC/ground current ICC ±50 mA Power dissipation PD 180 mW Storage temperature Tstg −65~150 °C DC input voltage DC output voltage Note: Exceeding any of the absolute maximum ratings, even briefly, lead to deterioration in IC performance or even destruction. Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the significant change in temperature, etc.) may cause this product to decrease in the reliability significantly even if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum ratings and the operating ranges. Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook (“Handling Precautions”/“Derating Concept and Methods”) and individual reliability data (i.e. reliability test report and estimated failure rate, etc). Operating Ranges (Note) Characteristics Supply voltage Input voltage Output voltage Operating temperature Symbol Rating Unit VCC 2.0~5.5 V VIN 0~5.5 V VOUT 0~VCC V −40~85 °C Topr Input rise and fall time 0~100 (VCC = 3.3 ± 0.3 V) dt/dv 0~20 (VCC = 5 ± 0.5 V) ns/V Note: The operating ranges must be maintained to ensure the normal operation of the device. Unused inputs must be tied to either VCC or GND. Electrical Characteristics DC Characteristics Characteristics High level Symbol Test Condition VIH ⎯ Ta = 25°C Input voltage Low level High level ⎯ VIL VOH VIN = VIH or VIL Output voltage Low level VOL VIN = VIH or VIL IOH = −50 μA Ta = −40~85°C VCC (V) Min Typ. Max Min Max 2.0 1.50 ⎯ ⎯ 1.50 ⎯ 3.0~5.5 VCC × 0.7 ⎯ ⎯ VCC × 0.7 ⎯ 2.0 ⎯ ⎯ 0.50 ⎯ 0.50 3.0~5.5 ⎯ ⎯ VCC × 0.3 ⎯ VCC × 0.3 2.0 1.9 2.0 ⎯ 1.9 ⎯ 3.0 2.9 3.0 ⎯ 2.9 ⎯ 4.5 4.4 4.5 ⎯ 4.4 ⎯ IOH = −4 mA 3.0 2.58 ⎯ ⎯ 2.48 ⎯ IOH = −8 mA 4.5 3.94 ⎯ ⎯ 3.80 ⎯ 2.0 ⎯ 0 0.1 ⎯ 0.1 3.0 ⎯ 0 0.1 ⎯ 0.1 4.5 ⎯ 0 0.1 ⎯ 0.1 IOL = 4 mA 3.0 ⎯ ⎯ 0.36 ⎯ 0.44 IOL = 8 mA 4.5 ⎯ ⎯ 0.36 ⎯ 0.44 IOL = 50 μA Unit V V Input leakage current IIN VIN = 5.5 V or GND 0~5.5 ⎯ ⎯ ±0.1 ⎯ ±1.0 μA Quiescent supply current ICC VIN = VCC or GND 5.5 ⎯ ⎯ 4.0 ⎯ 40.0 μA 5 2007-10-19 TC7MH165FK Timing Requirements (Input: tr = tf = 3 ns) Characteristics Minimum pulse width (CK, CK INH) Minimum pulse width ( S/L ) Minimum set-up time (A~H- S/L ) Minimum set-up time (SI-CK, CK INH) Minimum set-up time ( S/L -CK, CK INH) Minimum hold time (A~H- S/L ) Minimum hold time (SI-CK, CK INH) Minimum hold time ( S/L -CK, CK INH) Symbol Test Condition tw (L) tw (H) ⎯ tW (L) ⎯ ts ⎯ ts ⎯ ts ⎯ th ⎯ th ⎯ th ⎯ trem ⎯ Minimum removal time (CK INH-CK) Ta = 25°C Ta = −40~85°C VCC (V) Typ. Limit Limit 3.3 ± 0.3 ⎯ 6.0 7.0 5.0 ± 0.5 ⎯ 4.0 4.0 3.3 ± 0.3 ⎯ 7.5 9.0 5.0 ± 0.5 ⎯ 5.0 6.0 3.3 ± 0.3 ⎯ 7.5 8.5 5.0 ± 0.5 ⎯ 5.0 5.0 3.3 ± 0.3 ⎯ 5.0 6.0 5.0 ± 0.5 ⎯ 4.0 4.0 3.3 ± 0.3 ⎯ 5.0 6.0 5.0 ± 0.5 ⎯ 4.0 4.0 3.3 ± 0.3 ⎯ 0.5 0.5 5.0 ± 0.5 ⎯ 1.0 1.0 3.3 ± 0.3 ⎯ 0 0 5.0 ± 0.5 ⎯ 0.5 0.5 3.3 ± 0.3 ⎯ 0 0 5.0 ± 0.5 ⎯ 0.5 0.5 3.3 ± 0.3 ⎯ 5.0 5.0 5.0 ± 0.5 ⎯ 3.5 3.5 Unit ns ns ns ns ns ns ns ns ns (CK-CK INH) 6 2007-10-19 TC7MH165FK AC Characteristics (Input: tr = tf = 3 ns) Characteristics Propagation delay time (CK, CK INH-QH, QH ) Propagation delay time (S/L-QH, QH ) Symbol Ta = 25°C Test Condition VCC (V) CL (pF) 3.3 ± 0.3 tpLH tpHL ⎯ 5.0 ± 0.5 3.3 ± 0.3 tpLH tpHL ⎯ 5.0 ± 0.5 Propagation delay time (H-QH, QH ) 3.3 ± 0.3 tpLH tpHL ⎯ 5.0 ± 0.5 3.3 ± 0.3 Maximum clock frequency fmax ⎯ 5.0 ± 0.5 Input capacitance CIN Power dissipation capacitance CPD Ta = −40~85°C Unit Min Typ. Max Min Max 15 ⎯ 9.9 15.4 1.0 18.0 50 ⎯ 12.4 18.9 1.0 21.5 15 ⎯ 6.6 9.9 1.0 11.5 50 ⎯ 8.1 11.9 1.0 13.5 15 ⎯ 9.9 15.8 1.0 18.5 50 ⎯ 12.4 19.3 1.0 22.0 15 ⎯ 6.7 9.9 1.0 11.5 50 ⎯ 8.2 11.9 1.0 13.5 15 ⎯ 9.2 14.1 1.0 16.5 50 ⎯ 11.7 17.6 1.0 20.0 15 ⎯ 5.9 9.0 1.0 10.5 50 ⎯ 7.4 11.0 1.0 12.5 15 65 85 ⎯ 55 ⎯ 50 60 105 ⎯ 50 ⎯ 15 110 150 ⎯ 90 ⎯ 50 95 130 ⎯ 85 ⎯ ⎯ 4 10 ⎯ 10 pF ⎯ 50 ⎯ ⎯ ⎯ pF ⎯ (Note) ns ns ns MHz Note: CPD is defined as the value of the internal equivalent capacitance which is calculated from the operating current consumption without load. Average operating current can be obtained by the equation: ICC (opr) = CPD･VCC･fIN + ICC Input Equivalent Circuit Input 7 2007-10-19 TC7MH165FK Package Dimensions Weight: 0.02 g (typ.) 8 2007-10-19 TC7MH165FK RESTRICTIONS ON PRODUCT USE 20070701-EN GENERAL • The information contained herein is subject to change without notice. • TOSHIBA is continually working to improve the quality and reliability of its products. Nevertheless, semiconductor devices in general can malfunction or fail due to their inherent electrical sensitivity and vulnerability to physical stress. It is the responsibility of the buyer, when utilizing TOSHIBA products, to comply with the standards of safety in making a safe design for the entire system, and to avoid situations in which a malfunction or failure of such TOSHIBA products could cause loss of human life, bodily injury or damage to property. In developing your designs, please ensure that TOSHIBA products are used within specified operating ranges as set forth in the most recent TOSHIBA products specifications. Also, please keep in mind the precautions and conditions set forth in the “Handling Guide for Semiconductor Devices,” or “TOSHIBA Semiconductor Reliability Handbook” etc. • The TOSHIBA products listed in this document are intended for usage in general electronics applications (computer, personal equipment, office equipment, measuring equipment, industrial robotics, domestic appliances, etc.).These TOSHIBA products are neither intended nor warranted for usage in equipment that requires extraordinarily high quality and/or reliability or a malfunction or failure of which may cause loss of human life or bodily injury (“Unintended Usage”). Unintended Usage include atomic energy control instruments, airplane or spaceship instruments, transportation instruments, traffic signal instruments, combustion control instruments, medical instruments, all types of safety devices, etc.. Unintended Usage of TOSHIBA products listed in his document shall be made at the customer’s own risk. • The products described in this document shall not be used or embedded to any downstream products of which manufacture, use and/or sale are prohibited under any applicable laws and regulations. • The information contained herein is presented only as a guide for the applications of our products. No responsibility is assumed by TOSHIBA for any infringements of patents or other rights of the third parties which may result from its use. No license is granted by implication or otherwise under any patents or other rights of TOSHIBA or the third parties. • Please contact your sales representative for product-by-product details in this document regarding RoHS compatibility. Please use these products in this document in compliance with all applicable laws and regulations that regulate the inclusion or use of controlled substances. Toshiba assumes no liability for damage or losses occurring as a result of noncompliance with applicable laws and regulations. 9 2007-10-19