TK10Q60W MOSFETs Silicon N-Channel MOS (DTMOS) TK10Q60W 1. Applications • Switching Voltage Regulators 2. Features (1) Low drain-source on-resistance: RDS(ON) = 0.327 Ω (typ.) by used to Super Junction Structure : DTMOS (2) Easy to control Gate switching (3) Enhancement mode: Vth = 2.7 to 3.7 V (VDS = 10 V, ID = 0.5 mA) 3. Packaging and Internal Circuit 1: Gate 2: Drain (Heatsink) 3: Source IPAK 1 2012-08-27 Rev.2.0 TK10Q60W unless otherwise specified) 4. Absolute Maximum Ratings (Note) (Ta = 25 25 Characteristics Symbol Rating Unit Drain-source voltage VDSS 600 V Gate-source voltage VGSS ±30 Drain current (DC) (Note 1) ID 9.7 Drain current (pulsed) (Note 1) IDP 38.8 PD 80 W (Note 2) EAS 121 mJ IAR 2.5 A Reverse drain current (DC) (Note 1) IDR 9.7 Reverse drain current (pulsed) (Note 1) Power dissipation (Tc = 25) Single-pulse avalanche energy Avalanche current A IDRP 38.8 Channel temperature Tch 150 Storage temperature Tstg -55 to 150 Note: Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the significant change in temperature, etc.) may cause this product to decrease in the reliability significantly even if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum ratings. Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook ("Handling Precautions"/"Derating Concept and Methods") and individual reliability data (i.e. reliability test report and estimated failure rate, etc). 5. Thermal Characteristics Characteristics Symbol Max Unit Channel-to-case thermal resistance Rth(ch-c) 1.57 /W Channel-to-ambient thermal resistance Rth(ch-a) 125 Note 1: Ensure that the channel temperature does not exceed 150. Note 2: VDD = 90 V, Tch = 25 (initial), L = 33.9 mH, RG = 25 Ω, IAR = 2.5 A Note: This transistor is sensitive to electrostatic discharge and should be handled with care. 2 2012-08-27 Rev.2.0 TK10Q60W 6. Electrical Characteristics unless otherwise specified) 6.1. Static Characteristics (Ta = 25 25 Characteristics Gate leakage current Drain cut-off current Drain-source breakdown voltage Gate threshold voltage Drain-source on-resistance Symbol Test Condition IGSS VGS = ±30 V, VDS = 0 V IDSS VDS = 600 V, VGS = 0 V V(BR)DSS Vth RDS(ON) Min Typ. Max Unit ±1 µA 10 ID = 10 mA, VGS = 0 V 600 VDS = 10 V, ID = 0.5 mA 2.7 3.7 VGS = 10 V, ID = 4.9 A 0.327 0.43 Ω Min Typ. Max Unit 700 pF V unless otherwise specified) 6.2. Dynamic Characteristics (Ta = 25 25 Characteristics Input capacitance Symbol Ciss Test Condition VDS = 300 V, VGS = 0 V, f = 1 MHz Reverse transfer capacitance Crss 2.3 Output capacitance Coss 20 Effective output capacitance Co(er) VDS = 0 to 400 V, VGS = 0 V 35 rg VDS = OPEN, f = 1 MHz 7.5 Ω Switching time (rise time) tr See Figure 6.2.1 22 ns Switching time (turn-on time) ton 45 tf 5.5 toff 75 50 V/ns Min Typ. Max Unit 20 nC Gate resistance Switching time (fall time) Switching time (turn-off time) MOSFET dv/dt ruggedness dv/dt VDD = 0 to 400 V, ID = 4.9 A Fig. 6.2.1 Switching Time Test Circuit unless otherwise specified) 25 6.3. Gate Charge Characteristics (Ta = 25 Characteristics Total gate charge (gate-source plus gate-drain) Symbol Qg Test Condition VDD ≈ 400 V, VGS = 10 V, ID = 9.7 A Gate-source charge 1 Qgs1 4.5 Gate-drain charge Qgd 9.5 6.4. Source-Drain Characteristics (Ta = 25 unless otherwise specified) 25 Characteristics Symbol Test Condition Min Typ. Max Unit Diode forward voltage VDSF IDR = 9.7 A, VGS = 0 V -1.7 V Reverse recovery time trr 250 ns Reverse recovery charge Qrr IDR = 4.9 A, VGS = 0 V -dIDR/dt = 100 A/µs 2.2 µC Peak reverse recovery current Irr 19 A 15 V/ns Diode dv/dt ruggedness dv/dt IDR = 4.9 A, VGS = 0 V, VDD = 400 V 3 2012-08-27 Rev.2.0 TK10Q60W 7. Marking Fig. 7.1 Marking 4 2012-08-27 Rev.2.0 TK10Q60W 8. Characteristics Curves (Note) Fig. 8.1 ID - VDS Fig. 8.2 ID - VDS Fig. 8.3 ID - VGS Fig. 8.4 VDS - VGS Fig. 8.5 VDSS - Ta Fig. 8.6 RDS(ON) - ID 5 2012-08-27 Rev.2.0 TK10Q60W Fig. 8.7 RDS(ON) - Ta Fig. 8.8 IDR - VDS Fig. 8.9 C - VDS Fig. 8.10 EOSS - VDS Fig. 8.11 Vth - Ta Fig. 8.12 Dynamic Input/Output Characteristics 6 2012-08-27 Rev.2.0 TK10Q60W Fig. 8.13 rth - tw (Guaranteed Maximum) Fig. 8.14 EAS - Tch (Guaranteed Maximum) Fig. 8.15 PD - Tc (Guaranteed Maximum) Fig. 8.16 Test Circuit/Waveform 7 2012-08-27 Rev.2.0 TK10Q60W Fig. 8.17 Safe Operating Area (Guaranteed Maximum) Note: The above characteristics curves are presented for reference only and not guaranteed by production test, unless otherwise noted. 8 2012-08-27 Rev.2.0 TK10Q60W Package Dimensions Unit: mm Weight: 0.337 g (typ.) Package Name(s) TOSHIBA: 2-7L1A Nickname: IPAK 9 2012-08-27 Rev.2.0 TK10Q60W RESTRICTIONS ON PRODUCT USE • Toshiba Corporation, and its subsidiaries and affiliates (collectively "TOSHIBA"), reserve the right to make changes to the information in this document, and related hardware, software and systems (collectively "Product") without notice. • This document and any information herein may not be reproduced without prior written permission from TOSHIBA. Even with TOSHIBA's written permission, reproduction is permissible only if reproduction is without alteration/omission. • Though TOSHIBA works continually to improve Product's quality and reliability, Product can malfunction or fail. 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