www.fairchildsemi.com KA75XXX Voltage Detector Features Description • Detecting Against Error Operations At The Power On/off. • Resetting Function For The Low Voltage Microprocessor. • Checking Low Battery The KA75250/KA75270/KA75290/KA75310/KA75330/ KA75360/KA75390/KA75420/KA75450 prevents the error of system from supply voltage below normal voltage level at the time the power on and instantaneous power off in systems. TO-92 1 SOT-89 1 1. Input 2. GND 3. Output Internal Block Diagram INPUT 1 1:TO-92 3:SOT-89 3 OUT 3:TO-92 1:SOT-89 VREF 2 GND 2:TO-92 2:SOT-89 Rev. 1.0.3 ©2002 Fairchild Semiconductor Corporation KA75XXX Absolute Maximum Rating (TA=25°°C) Characteristic Symbol Value Unit Supply Voltage Vcc 0.3 ~ +15.0 V Detecting Voltage VDET 2.5/2.7/2.9/3.1 3.3/3.6/3.9/4.2/4.5 V Hysteresis Voltage VHYS 50 mV Operating Temperature TOPR -25 ~ +85 °C Storage Temperature TSTG -50 ~ +150 °C PD 200 500 mW ∆VDET/∆T RL = 200Ω, +0.01 %/°C Power Dissipation TO-92 SOT-89 Detecting Voltage Temperature Coefficient Electrical Characteristics (TA=25°°C) Characteristic Symbol Test Conditions RL= 200Ω VOL ≤ 0.4V Detecting Voltage Typ Max Unit 2.35 2.55 2.75 2.95 3.15 3.45 3.75 4.05 4.35 2.5 2.7 2.9 3.1 3.3 3.6 3.9 4.2 4.5 2.65 2.85 3.05 3.25 3.45 3.75 4.05 4.35 4.65 V Low Output Voltage VOL RL = 200Ω - - 0.4 V Output Leakage Current ILKG VCC = 15V - - 0.1 uA Hysteresis Voltage VHYS RL = 200Ω 30 50 100 mV ∆VDET/∆T RL = 200Ω - ±0.01 - %/°C Detecting Voltage Temperature Coefficient Circuit Current(At On Time) ICCL VCC = VDET(MIN) -0.05V - 300 500 uA Circuit Current(At Off Time) ICCH VCC = 5.25V - 30 50 uA VTH(OPR) RL = 200Ω, VOL ≤ 0.4V - 0.8 1.0 V " L"± Transmission Delay Time TOL RL = 1.0kΩ, CL= 100pF 0.6 10 - us " H"± Transmission Delay Time TOH RL = 1.0kΩ, CL = 100pF - 15 20 us Output Current (At On Time) IOLI VCC = VDET(MIN) -0.05V, TA = 25°C 10 20 30 mA Output Current (At On Time) IOLII VCC = VDET(MIN) - 0.05V TA = -25 ~ +85°C 8 16 30 mA Threshold Operating Voltage 2 VDET KA75250 KA75270 KA75290 KA75310 KA75330 KA75360 KA75390 KA75420 KA75450 Min KA75XXX Test Circuit 1. A1 A2 INPUT KA75XXX OUTPUT V1 + M GND 10u 10V Test Circuit 2. INPUT RL + KA75XXX INPUT PULSE OUTPUT 0.1u 50V 10u 50V 5V GND Test Circuit 3. INPUT RL LED VCC KA75XXX OUTPUT GND 3 KA75XXX Application Circuit INPUT RL VCC KA75XXX CPU OUTPUT GND 4 Vcc RESET GND KA75XXX Mechanical Dimensions Package Dimensions in millimeters TO-92 +0.25 4.58 ±0.20 4.58 –0.15 14.47 ±0.40 0.46 ±0.10 1.27TYP [1.27 ±0.20] 1.27TYP [1.27 ±0.20] +0.10 0.38 –0.05 (0.25) +0.10 0.38 –0.05 1.02 ±0.10 3.86MAX 3.60 ±0.20 (R2.29) 5 KA75XXX Mechanical Dimensions (Continued) Package Dimensions in millimeters SOT-89 1.50 ±0.20 4.50 ±0.20 (0.40) (1.10) 2.50 ±0.20 C0.2 4.10 ±0.20 (0.50) 1.65 ±0.10 0.50 ±0.10 0.40 ±0.10 0.40 1.50 TYP 1.50 TYP 6 +0.10 –0.05 KA75XXX Ordering Information Product Number Package Operating Temperature KA75250Z KA75270Z KA75290Z KA75310Z KA75330Z TO-92 KA75360Z KA75390Z KA75420Z KA75450Z -25 ~ +85°C KA75250M KA75270M KA75290M KA75310M KA75330M SOT-89 KA75360M KA75390M KA75420M KA75450M 7 KA75XXX DISCLAIMER FAIRCHILD SEMICONDUCTOR RESERVES THE RIGHT TO MAKE CHANGES WITHOUT FURTHER NOTICE TO ANY PRODUCTS HEREIN TO IMPROVE RELIABILITY, FUNCTION OR DESIGN. FAIRCHILD DOES NOT ASSUME ANY LIABILITY ARISING OUT OF THE APPLICATION OR USE OF ANY PRODUCT OR CIRCUIT DESCRIBED HEREIN; NEITHER DOES IT CONVEY ANY LICENSE UNDER ITS PATENT RIGHTS, NOR THE RIGHTS OF OTHERS. LIFE SUPPORT POLICY FAIRCHILD’S PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT DEVICES OR SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROVAL OF THE PRESIDENT OF FAIRCHILD SEMICONDUCTOR CORPORATION. As used herein: 1. Life support devices or systems are devices or systems which, (a) are intended for surgical implant into the body, or (b) support or sustain life, and (c) whose failure to perform when properly used in accordance with instructions for use provided in the labeling, can be reasonably expected to result in a significant injury of the user. 2. A critical component in any component of a life support device or system whose failure to perform can be reasonably expected to cause the failure of the life support device or system, or to affect its safety or effectiveness. www.fairchildsemi.com 9/10/02 0.0m 001 Stock#DSxxxxxxxx 2002 Fairchild Semiconductor Corporation