### FAIRCHILD KA75250

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KA75XXX
Voltage Detector
Features
Description
• Detecting Against Error Operations At The Power On/off.
• Resetting Function For The Low Voltage Microprocessor.
• Checking Low Battery
The KA75250/KA75270/KA75290/KA75310/KA75330/
KA75360/KA75390/KA75420/KA75450 prevents the error
of system from supply voltage below normal voltage level at
the time the power on and instantaneous power off in
systems.
TO-92
1
SOT-89
1
1. Input 2. GND 3. Output
Internal Block Diagram
INPUT 1
1:TO-92
3:SOT-89
3
OUT
3:TO-92
1:SOT-89
VREF
2
GND
2:TO-92
2:SOT-89
Rev. 1.0.3
KA75XXX
Absolute Maximum Rating (TA=25°°C)
Characteristic
Symbol
Value
Unit
Supply Voltage
Vcc
0.3 ~ +15.0
V
Detecting Voltage
VDET
2.5/2.7/2.9/3.1
3.3/3.6/3.9/4.2/4.5
V
Hysteresis Voltage
VHYS
50
mV
Operating Temperature
TOPR
-25 ~ +85
°C
Storage Temperature
TSTG
-50 ~ +150
°C
PD
200
500
mW
∆VDET/∆T
RL = 200Ω, +0.01
%/°C
Power Dissipation
TO-92
SOT-89
Detecting Voltage Temperature Coefficient
Electrical Characteristics (TA=25°°C)
Characteristic
Symbol
Test Conditions
RL= 200Ω
VOL ≤ 0.4V
Detecting Voltage
Typ
Max
Unit
2.35
2.55
2.75
2.95
3.15
3.45
3.75
4.05
4.35
2.5
2.7
2.9
3.1
3.3
3.6
3.9
4.2
4.5
2.65
2.85
3.05
3.25
3.45
3.75
4.05
4.35
4.65
V
Low Output Voltage
VOL
RL = 200Ω
-
-
0.4
V
Output Leakage Current
ILKG
VCC = 15V
-
-
0.1
uA
Hysteresis Voltage
VHYS
RL = 200Ω
30
50
100
mV
∆VDET/∆T
RL = 200Ω
-
±0.01
-
%/°C
Detecting Voltage Temperature
Coefficient
Circuit Current(At On Time)
ICCL
VCC = VDET(MIN) -0.05V
-
300
500
uA
Circuit Current(At Off Time)
ICCH
VCC = 5.25V
-
30
50
uA
VTH(OPR)
RL = 200Ω, VOL ≤ 0.4V
-
0.8
1.0
V
" L"± Transmission Delay Time
TOL
RL = 1.0kΩ, CL= 100pF
0.6
10
-
us
" H"± Transmission Delay Time
TOH
RL = 1.0kΩ, CL = 100pF
-
15
20
us
Output Current (At On Time)
IOLI
VCC = VDET(MIN) -0.05V,
TA = 25°C
10
20
30
mA
Output Current (At On Time)
IOLII
VCC = VDET(MIN) - 0.05V
TA = -25 ~ +85°C
8
16
30
mA
Threshold Operating Voltage
2
VDET
KA75250
KA75270
KA75290
KA75310
KA75330
KA75360
KA75390
KA75420
KA75450
Min
KA75XXX
Test Circuit 1.
A1
A2
INPUT
KA75XXX
OUTPUT
V1
+
M
GND
10u
10V
Test Circuit 2.
INPUT
RL
+
KA75XXX
INPUT PULSE
OUTPUT
0.1u
50V
10u
50V
5V
GND
Test Circuit 3.
INPUT
RL
LED
VCC
KA75XXX
OUTPUT
GND
3
KA75XXX
Application Circuit
INPUT
RL
VCC
KA75XXX
CPU
OUTPUT
GND
4
Vcc
RESET
GND
KA75XXX
Mechanical Dimensions
Package
Dimensions in millimeters
TO-92
+0.25
4.58 ±0.20
4.58 –0.15
14.47 ±0.40
0.46 ±0.10
1.27TYP
[1.27 ±0.20]
1.27TYP
[1.27 ±0.20]
+0.10
0.38 –0.05
(0.25)
+0.10
0.38 –0.05
1.02 ±0.10
3.86MAX
3.60 ±0.20
(R2.29)
5
KA75XXX
Mechanical Dimensions (Continued)
Package
Dimensions in millimeters
SOT-89
1.50 ±0.20
4.50 ±0.20
(0.40)
(1.10)
2.50 ±0.20
C0.2
4.10 ±0.20
(0.50)
1.65 ±0.10
0.50 ±0.10
0.40 ±0.10
0.40
1.50 TYP 1.50 TYP
6
+0.10
–0.05
KA75XXX
Ordering Information
Product Number
Package
Operating Temperature
KA75250Z
KA75270Z
KA75290Z
KA75310Z
KA75330Z
TO-92
KA75360Z
KA75390Z
KA75420Z
KA75450Z
-25 ~ +85°C
KA75250M
KA75270M
KA75290M
KA75310M
KA75330M
SOT-89
KA75360M
KA75390M
KA75420M
KA75450M
7
KA75XXX
DISCLAIMER
FAIRCHILD SEMICONDUCTOR RESERVES THE RIGHT TO MAKE CHANGES WITHOUT FURTHER NOTICE TO ANY
PRODUCTS HEREIN TO IMPROVE RELIABILITY, FUNCTION OR DESIGN. FAIRCHILD DOES NOT ASSUME ANY
LIABILITY ARISING OUT OF THE APPLICATION OR USE OF ANY PRODUCT OR CIRCUIT DESCRIBED HEREIN; NEITHER
DOES IT CONVEY ANY LICENSE UNDER ITS PATENT RIGHTS, NOR THE RIGHTS OF OTHERS.
LIFE SUPPORT POLICY
FAIRCHILD’S PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT DEVICES
OR SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROVAL OF THE PRESIDENT OF FAIRCHILD SEMICONDUCTOR
CORPORATION. As used herein:
1. Life support devices or systems are devices or systems
which, (a) are intended for surgical implant into the body,
or (b) support or sustain life, and (c) whose failure to
perform when properly used in accordance with
instructions for use provided in the labeling, can be
reasonably expected to result in a significant injury of the
user.
2. A critical component in any component of a life support
device or system whose failure to perform can be
reasonably expected to cause the failure of the life support
device or system, or to affect its safety or effectiveness.
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9/10/02 0.0m 001
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 2002 Fairchild Semiconductor Corporation
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