ONSEMI NBXDPA017LNHTAG

NBXDPA017
2.5 V / 3.3 V, 156.25 MHz /
312.5MHz LVDS Clock
Oscillator
The NBXDPA017 dual frequency crystal oscillator (XO) is
designed to meet today’s requirements for 2.5 V and 3.3 V LVDS
clock generation applications. The device uses a high Q fundamental
crystal and Phase Lock Loop (PLL) multiplier to provide selectable
156.25 MHz or 312.5 MHz, ultra low jitter and phase noise LVDS
differential output.
This device is a member of ON Semiconductor’s PureEdget clock
family that provides accurate and precision clock solutions.
Available in 5 mm x 7 mm SMD (CLCC) package on 16 mm tape
and reel in quantities of 1000.
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MARKING DIAGRAM
NBXDPA017
156.25/312.5
AWLYYWW
6 PIN CLCC
LN SUFFIX
CASE 848AB
Features
•
•
•
•
•
•
•
•
•
LVDS Differential Output
Uses High Q Fundamental Mode Crystal and PLL Multiplier
Ultra Low Jitter and Phase Noise − 0.5 ps (12 kHz − 20 MHz)
Selectable Output Frequency − 156.25 MHz (default) / 312.5 MHz
Hermetically Sealed Ceramic SMD Package
RoHS Compliant
Operating Range: 2.5 V ±5%
Operating Range: 3.3 V ±10%
Total Frequency Stability − $50 ppm
This is a Pb−Free Device
Applications
• Ethernet, Gigabit Ethernet
• Networking
VDD
6
NBXDPA017
156.25/312.5
A
WL
YY
WW
G or G
= NBXDPA017 (±50 PPM)
= Output Frequency (MHz)
= Assembly Location
= Wafer Lot
= Year
= Work Week
= Pb−Free Package
ORDERING INFORMATION
Device
Package
Shipping†
NBXDPA017LN1TAG
CLCC−6
(Pb−Free)
1000/
Tape & Reel
NBXDPA017LNHTAG
CLCC−6
(Pb−Free)
100/
Tape & Reel
†For information on tape and reel specifications,
including part orientation and tape sizes, please
refer to our Tape and Reel Packaging Specification
Brochure, BRD8011/D.
CLK CLK
5 4
PLL
Clock
Multiplier
Crystal
1
OE
2
FSEL
3
GND
Figure 1. Simplified Logic Diagram
© Semiconductor Components Industries, LLC, 2009
August, 2009 − Rev. 0
1
Publication Order Number:
NBXDPA017/D
NBXDPA017
OE
1
6
VDD
FSEL
2
5
CLK
GND
3
4
CLK
Figure 2. Pin Connections (Top View)
Table 1. PIN DESCRIPTION
ÁÁÁÁÁ
ÁÁÁÁ
ÁÁÁÁÁ
ÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁ
ÁÁÁÁÁ
ÁÁÁÁ
ÁÁÁÁÁ
ÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁ
ÁÁÁÁÁ
ÁÁÁÁ
ÁÁÁÁÁ
ÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁ
ÁÁÁÁÁ
ÁÁÁÁ
ÁÁÁÁÁ
ÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁ
ÁÁÁÁÁ
ÁÁÁÁÁ
ÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁ
ÁÁÁÁÁÁÁÁÁ
ÁÁÁÁ
ÁÁÁÁÁ
ÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁ
ÁÁÁÁÁ
ÁÁÁÁ
ÁÁÁÁÁ
ÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁ
ÁÁÁÁÁ
ÁÁÁÁ
ÁÁÁÁÁ
ÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁ
ÁÁÁÁÁÁÁÁÁ
ÁÁÁÁÁ
ÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁ
Pin No.
Symbol
I/O
Description
1
OE
LVTTL/LVCMOS
Control Input
Output Enable Pin. When left floating pin defaults to logic HIGH and output is active.
See OE pin description Table 2.
2
FSEL
LVTTL/LVCMOS
Control Input
Output Frequency Select Pin. Pin will default to logic HIGH when left open. See Output
Frequency Select pin description Table 3.
3
GND
Power Supply
Ground 0 V
4
CLK
LVDS Output
Non−Inverted Clock Output. Typically loaded with 100 W receiver termination resistor
across differential pair.
5
CLK
LVDS Output
Inverted Clock Output. Typically loaded with 100 W receiver termination resistor across
differential pair.
6
VDD
Power Supply
Positive power supply voltage. Voltage should not exceed 2.5 V ±5% or 3.3 V ±10%.
Table 2. OUTPUT ENABLE TRI−STATE FUNCTION
Table 3. OUTPUT FREQUENCY SELECT
OE Pin
Output Pins
FSEL Pin
Output Frequency (MHz)
Open
Active
Open
(pin will float high)
156.25
HIGH Level
156.25
LOW Level
312.5
HIGH Level
Active
LOW Level
High Z
Table 4. ATTRIBUTES
Characteristic
Value
Input Default State Resistor
ESD Protection
170 kW
Human Body Model
Machine Model
2 kV
200 V
Meets or Exceeds JEDEC Standard EIA/JESD78 IC Latchup Test
1. For additional Moisture Sensitivity information, refer to Application Note AND8003/D.
Table 5. MAXIMUM RATINGS
Symbol
Parameter
Condition 1
Condition 2
Rating
Units
VDD
Positive Power Supply
GND = 0 V
4.6
V
Iout
LVDS Output Current
Continuous
Surge
25
50
mA
TA
Operating Temperature Range
−40 to +85
°C
Tstg
Storage Temperature Range
−55 to +120
°C
Tsol
Wave Solder
260
°C
See Figure 6
Stresses exceeding Maximum Ratings may damage the device. Maximum Ratings are stress ratings only. Functional operation above the
Recommended Operating Conditions is not implied. Extended exposure to stresses above the Recommended Operating Conditions may affect
device reliability.
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2
NBXDPA017
Table 6. DC CHARACTERISTICS (VDD = 2.5 V ± 5% or VDD = 3.3 V ± 10%, GND = 0 V, TA = −40°C to +85°C) (Note 2)
Symbol
Characteristic
Conditions
Min.
Typ.
Max.
Units
85
105
mA
IDD
Power Supply Current
VIH
OE and FSEL Input HIGH Voltage
2000
VDD
mV
VIL
OE and FSEL Input LOW Voltage
GND − 300
800
mV
IIH
Input HIGH Current
OE
FSEL
−100
−100
+100
+100
mA
IIL
Input LOW Current
OE
FSEL
−100
−100
+100
+100
mA
25
mV
1375
mV
1
25
mV
1425
1600
mV
DVOD
Change in Magnitude of VOD for
Complementary Output States
(Note 3)
VOS
Offset Voltage
DVOS
Change in Magnitude of VOS for
Complementary Output States
(Note 3)
0
1
1125
0
VOH
Output HIGH Voltage
VDD = 2.5 V
VDD = 3.3 V
VOL
Output LOW Voltage
VDD = 2.5 V
VDD = 3.3 V
VOD
Differential Output Voltage
900
250
1075
mV
450
mV
NOTE: Device will meet the specifications after thermal equilibrium has been established when mounted in a test socket or printed circuit
board with maintained transverse airflow greater than 500 Ifpm. Electrical parameters are guaranteed only over the declared
operating temperature range. Functional operation of the device exceeding these conditions is not implied. Device specification limit
values are applied individually under normal operating conditions and not valid simultaneously.
2. Measurement taken with outputs terminated with 100 ohm across differential pair. See Figure 5.
3. Parameter guaranteed by design verification not tested in production.
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3
NBXDPA017
Table 7. AC CHARACTERISTICS (VDD = 2.5 V ± 5% or VDD = 3.3 V ± 10%, GND = 0 V, TA = −40°C to +85°C) (Note 4)
Symbol
fCLKOUT
Df
FNOISE
Characteristic
Output Clock Frequency
Frequency Stability − NBXDPA017
Phase−Noise Performance
fCLKout = 156.25 MHz/312.5 MHz
(See Figures 3 and 4)
Conditions
FSEL = LOW
312.5
(Note 5)
Max.
Units
MHz
±50
100 Hz of Carrier
ppm
−107/−102
dBc/Hz
1 kHz of Carrier
−121/−115
dBc/Hz
10 kHz of Carrier
−127/−121
dBc/Hz
100 kHz of Carrier
−128/−122
dBc/Hz
1 MHz of Carrier
−135/−129
dBc/Hz
10 MHz of Carrier
−157/−153
dBc/Hz
12 kHz to 20 MHz
0.5
RMS Phase Jitter
tjitter
Cycle to Cycle, RMS
1000 Cycles
Cycle to Cycle, Peak−to−Peak
1000 Cycles
Period, RMS
10,000 Cycles
Period, Peak−to−Peak
10,000 Cycles
tDUTY_CYCLE
Typ.
156.25
tjit(F)
tOE/OD
Min.
FSEL = HIGH
0.75
ps
4
8
ps
17
35
ps
2
4
ps
7
20
ps
200
ns
50
52
%
Output Enable/Disable Time
Output Clock Duty Cycle
(Measured at Cross Point)
48
tR
Output Rise Time (20% and 80%)
115
400
ps
tF
Output Fall Time (80% and 20%)
115
400
ps
1
5
ms
3
ppm
1
ppm
tstart
Start−up Time
Aging
1st
Year
Every Year After 1st
NOTE: Device will meet the specifications after thermal equilibrium has been established when mounted in a test socket or printed circuit
board with maintained transverse airflow greater than 500 Ifpm. Electrical parameters are guaranteed only over the declared
operating temperature range. Functional operation of the device exceeding these conditions is not implied. Device specification limit
values are applied individually under normal operating conditions and not valid simultaneously.
4. Measurement taken with outputs terminated with 100 ohm across differential pair. See Figure 5.
5. Parameter guarantees 10 years of aging. Includes initial stability at 25°C, shock, vibration and first year aging.
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4
NBXDPA017
Figure 3. Typical Phase Noise Plot at 156.25 MHz
Figure 4. Typical Phase Noise Plot at 312.5 MHz
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5
NBXDPA017
Table 8. RELIABILITY COMPLIANCE
ÁÁÁÁÁÁÁÁÁÁÁ
ÁÁÁÁÁÁÁÁÁÁ
ÁÁÁÁÁÁÁÁÁÁÁÁÁÁ
ÁÁÁÁÁÁÁÁÁÁÁ
ÁÁÁÁÁÁÁÁÁÁ
ÁÁÁÁÁÁÁÁÁÁÁÁÁÁ
ÁÁÁÁÁÁÁÁÁÁÁ
ÁÁÁÁÁÁÁÁÁÁ
ÁÁÁÁÁÁÁÁÁÁÁÁÁÁ
ÁÁÁÁÁÁÁÁÁÁÁ
ÁÁÁÁÁÁÁÁÁÁ
ÁÁÁÁÁÁÁÁÁÁÁÁÁÁ
ÁÁÁÁÁÁÁÁÁÁÁ
ÁÁÁÁÁÁÁÁÁÁ
ÁÁÁÁÁÁÁÁÁÁÁÁÁÁ
ÁÁÁÁÁÁÁÁÁÁÁ
ÁÁÁÁÁÁÁÁÁÁ
ÁÁÁÁÁÁÁÁÁÁÁÁÁÁ
ÁÁÁÁÁÁÁÁÁÁÁ
ÁÁÁÁÁÁÁÁÁÁ
ÁÁÁÁÁÁÁÁÁÁÁÁÁÁ
ÁÁÁÁÁÁÁÁÁÁÁ
ÁÁÁÁÁÁÁÁÁÁ
ÁÁÁÁÁÁÁÁÁÁÁÁÁÁ
Parameter
Standard
Method
Shock
Mechanical
MIL−STD−833, Method 2002, Condition B
Solderability
Mechanical
MIL−STD−833, Method 2003
Vibration
Mechanical
MIL−STD−833, Method 2007, Condition A
Solvent Resistance
Mechanical
MIL−STD−202, Method 215
Resistance to Soldering Heat
Mechanical
MIL−STD−203, Method 210, Condition I or J
Thermal Shock
Environment
MIL−STD−833, Method 1001, Condition A
Moisture Resistance
Environment
MIL−STD−833, Method 1004
NBXDPA017
Zo = 50 W
CLK
D
Driver
Device
Receiver
Device
100 W
CLK
D
Zo = 50 W
Figure 5. Typical Termination for Output Driver and Device Evaluation
temp. 260°C
20 − 40 sec. max.
peak
Temperature (°C)
260
6°C/sec. max.
3°C/sec. max.
217
ramp−up
175
150
cooling
pre−heat
reflow
60180 sec.
Time
60150 sec.
Figure 6. Recommended Reflow Soldering Profile
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6
NBXDPA017
PACKAGE DIMENSIONS
6 PIN CLCC, 7x5, 2.54P
CASE 848AB−01
ISSUE C
A
D
4X
0.15 C
E2
TERMINAL 1
INDICATOR
NOTES:
1. DIMENSIONING AND TOLERANCING PER
ASME Y14.5M, 1994.
2. CONTROLLING DIMENSION: MILLIMETERS.
B
D1
H E1
DIM
A
A1
A2
A3
b
D
D1
D2
D3
E
E1
E2
E3
e
H
L
R
E
D2
TOP VIEW
A3
A2
0.10 C
A
SIDE VIEW
A1
C
6.17
6.66
4.37
4.65
1.17
SOLDERING FOOTPRINT*
2
3
e
6X
R
1.50
E3
0.10 C A B
0.05 C
0.08
1.30
MILLIMETERS
NOM
MAX
1.80
1.90
0.70 REF
0.36 REF
0.10
0.12
1.40
1.50
7.00 BSC
6.20
6.23
6.81
6.96
5.08 BSC
5.00 BSC
4.40
4.43
4.80
4.95
3.49 BSC
2.54 BSC
1.80 REF
1.27
1.37
0.70 REF
SEATING
PLANE
D3
1
MIN
1.70
6X
b
6
5
4
6X
5.06
L
BOTTOM VIEW
2.54
PITCH
6X
1.50
DIMENSION: MILLIMETERS
*For additional information on our Pb−Free strategy and soldering
details, please download the ON Semiconductor Soldering and
Mounting Techniques Reference Manual, SOLDERRM/D.
PureEdge is a trademark of Semiconductor Components Industries, LLC (SCILLC).
ON Semiconductor and
are registered trademarks of Semiconductor Components Industries, LLC (SCILLC). SCILLC reserves the right to make changes without further notice
to any products herein. SCILLC makes no warranty, representation or guarantee regarding the suitability of its products for any particular purpose, nor does SCILLC assume any liability
arising out of the application or use of any product or circuit, and specifically disclaims any and all liability, including without limitation special, consequential or incidental damages.
“Typical” parameters which may be provided in SCILLC data sheets and/or specifications can and do vary in different applications and actual performance may vary over time. All
operating parameters, including “Typicals” must be validated for each customer application by customer’s technical experts. SCILLC does not convey any license under its patent rights
nor the rights of others. SCILLC products are not designed, intended, or authorized for use as components in systems intended for surgical implant into the body, or other applications
intended to support or sustain life, or for any other application in which the failure of the SCILLC product could create a situation where personal injury or death may occur. Should
Buyer purchase or use SCILLC products for any such unintended or unauthorized application, Buyer shall indemnify and hold SCILLC and its officers, employees, subsidiaries, affiliates,
and distributors harmless against all claims, costs, damages, and expenses, and reasonable attorney fees arising out of, directly or indirectly, any claim of personal injury or death
associated with such unintended or unauthorized use, even if such claim alleges that SCILLC was negligent regarding the design or manufacture of the part. SCILLC is an Equal
Opportunity/Affirmative Action Employer. This literature is subject to all applicable copyright laws and is not for resale in any manner.
PUBLICATION ORDERING INFORMATION
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For additional information, please contact your local
Sales Representative
NBXDPA017/D