HM62W8511HC Series 4M High Speed SRAM (512-kword × 8-bit) ADE-203-1201 (Z) Preliminary Rev. 0.0 Sep. 20, 2000 Description The HM62W8511HC is a 4-Mbit high speed static RAM organized 512-kword × 8-bit. It has realized high speed access time by employing CMOS process (6-transistor memory cell) and high speed circuit designing technology. It is most appropriate for the application which requires high speed, high density memory and wide bit width configuration, such as cache and buffer memory in system. The HM62W8511HC is packaged in 400-mil 36-pin SOJ for high density surface mounting. Features • Single supply : 3.3 V ± 0.3 V • Access time : 10 ns (max) • Completely static memory No clock or timing strobe required • Equal access and cycle times • Directly TTL compatible All inputs and outputs • Operating current : 115 mA (max) • TTL standby current : 40 mA (max) • CMOS standby current : 5 mA (max) : 1 mA (max) (L-version) • Data retension current : 0.6 mA (max) (L-version) • Data retension voltage : 2 V (min) (L-version) • Center VCC and VSS type pinout Preliminary: The specification of this device are subject to change without notice. Please contact your nearest Hitachi’s Sales Dept. regarding specification. HM62W8511HC Series Ordering Information Type No. Access time Package HM62W8511HCJP-10 10 ns 400-mil 36-pin plastic SOJ (CP-36D) HM62W8511HCLJP-10 10 ns 2 HM62W8511HC Series Pin Arrangement 36-pin SOJ A0 1 36 NC A1 2 35 A18 A2 3 34 A17 A3 4 33 A16 A4 5 32 A15 CS 6 31 OE I/O1 7 30 I/O8 I/O2 8 29 I/O7 VCC 9 28 VSS VSS 10 27 VCC I/O3 11 26 I/O6 I/O4 12 25 I/O5 WE 13 24 A14 A5 14 23 A13 A6 15 22 A12 A7 16 21 A11 A8 17 20 A10 A9 18 19 NC (Top View) Pin Description Pin name Function A0 to A18 Address input I/O1 to I/O8 Data input/output CS Chip select OE Output enable WE Write enable VCC Power supply VSS Ground NC No connection 3 HM62W8511HC Series Block Diagram (LSB) A14 A13 A12 A5 A6 A7 A11 A10 A3 A1 (MSB) VCC Row decoder 1024 rows × 32 columns × 16 blocks × 8 bit (4,194,304 bits) VSS CS Column I/O I/O1 . . . I/O8 Input data control A8 A9 A18 A16 A17 A0 A2 A4 A15 (LSB) (MSB) WE CS OE CS 4 Column decoder CS HM62W8511HC Series Operation Table CS OE WE Mode VCC current I/O Ref. cycle H × × Standby I SB , I SB1 High-Z — L H H Output disable I CC High-Z — L L H Read I CC Dout Read cycle (1) to (3) L H L Write I CC Din Write cycle (1) L L Write I CC Din Write cycle (2) Parameter Symbol Value Supply voltage relative to VSS VCC –0.5 to +4.6 L Note: ×: H or L Absolute Maximum Ratings Unit V 1 2 Voltage on any pin relative to V SS VT –0.5* to V CC+0.5* V Power dissipation PT 1.0 W Operating temperature Topr 0 to +70 °C Storage temperature Tstg –55 to +125 °C Storage temperature under bias Tbias –10 to +85 °C Notes: 1. VT (min) = –2.0 V for pulse width (under shoot) ≤ 6 ns. 2. VT (max) = VCC+2.0 V for pulse width (over shoot) ≤ 6 ns. Recommended DC Operating Conditions (Ta = 0 to +70°C) Parameter Symbol Supply voltage Input voltage Min Typ Max Unit VCC* 3 3.0 3.3 3.6 V VSS * 4 0 0 0 VIH VIL Notes: 1. 2. 3. 4. 2.0 1 –0.5* V 2 — VCC + 0.5* V — 0.8 V VIL (min) = –2.0 V for pulse width (under shoot) ≤ 6 ns. VIH (max) = VCC+2.0 V for pulse width (over shoot) ≤ 6 ns. The supply voltage with all VCC pins must be on the same level. The supply voltage with all VSS pins must be on the same level. 5 HM62W8511HC Series DC Characteristics (Ta = 0 to +70°C, VCC = 3.3 V ± 0.3 V, VSS = 0V) Parameter Symbol Min Typ*1 Max Unit Test conditions Input leakage current IILII — — 2 µA Vin = VSS to V CC Output leakage current IILO I — — 2 µA Vin = VSS to V CC Operation power supply current I CC — — 115 mA Min cycle CS = VIL, lout = 0 mA Other inputs = VIH/VIL Standby power supply current I SB — — 40 mA Min cycle CS = VIH, Other inputs = VIH/VIL I SB1 — TBD 5 mA f = 0 MHz VCC ≥ CS ≥ VCC - 0.2 V, (1) 0 V ≤ Vin ≤ 0.2 V or (2) VCC ≥ Vin ≥ VCC - 0.2 V —* 2 TBD*2 1.0*2 VOL — — 0.4 V I OL = 8 mA VOH 2.4 — — V I OH = –4 mA Output voltage Notes: 1. Typical values are at VCC = 3.3 V, Ta = +25°C and not guaranteed. 2. This characteristics is guaranteed only for L-version. Capacitance (Ta = +25°C, f = 1.0 MHz) Parameter 1 Input capacitance* Input/output capacitance* Note: 6 1 Symbol Min Typ Max Unit Test conditions Cin — — 6 pF Vin = 0 V CI/O — — 8 pF VI/O = 0 V 1. This parameter is sampled and not 100% tested. HM62W8511HC Series AC Characteristics (Ta = 0 to +70°C, VCC = 3.3 V ± 0.3 V, unless otherwise noted.) Test Conditions • • • • Input pulse levels: 3.0 V/0.0 V Input rise and fall time: 3 ns Input and output timing reference levels: 1.5 V Output load: See figures (Including scope and jig) 1.5 V 3.3 V 319Ω Dout Zo=50 Ω RL=50 Ω Dout 30 pF Output load (A) 353Ω 5 pF Output load (B) (for tCLZ, tOLZ, tCHZ, tOHZ, tWHZ, and tOW) Read Cycle HM62W8511HC -10 Parameter Symbol Min Max Unit Notes Read cycle time t RC 10 — ns Address access time t AA — 10 ns Chip select access time t ACS — 10 ns Output enable to outpput valid t OE — 5 ns Output hold from address change t OH 3 — ns Chip select to output in low-Z t CLZ 3 — ns 1 Output enable to output in low-Z t OLZ 0 — ns 1 Chip deselect to output in high-Z t CHZ — 5 ns 1 Output disable to output in high-Z t OHZ — 5 ns 1 7 HM62W8511HC Series Write Cycle HM62W8511HC -10 Parameter Symbol Min Max Unit Write cycle time t WC 10 — ns Address valid to end of write t AW 7 — ns Chip select to end of write t CW 7 — ns 9 Write pulse width t WP 7 — ns 8 Address setup time t AS 0 — ns 6 Write recovery time t WR 0 — ns 7 Data to write time overlap t DW 5 — ns Data hold from write time t DH 0 — ns Write disable to output in low-Z t OW 3 — ns 1 Output disable to output in high-Z t OHZ — 5 ns 1 Write enable to output in high-Z t WHZ — 5 ns 1 Note: 8 Notes 1. Transition is measured ±200 mV from steady voltage with Load (B). This parameter is sampled and not 100% tested. 2. Address should be valid prior to or coincident with CS transition low. 3. WE and/or CS must be high during address transition time. 4. if CS and OE are low during this period, I/O pins are in the output state. Then, the data input signals of opposite phase to the outputs must not be applied to them. 5. If the CS low transition occurs simultaneously with the WE low transition or after the WE transition, output remains a high impedance state. 6. t AS is measured from the latest address transition to the later of CS or WE going low. 7. t WR is measured from the earlier of CS or WE going high to the first address transition. 8. A write occurs during the overlap of a low CS and a low WE. A write begins at the latest transition among CS going low and WE going low. A write ends at the earliest transition among CS going high and WE going high. tWP is measured from the beginnig of write to the end of write. 9. t CW is measured from the later of CS going low to the the end of write. HM62W8511HC Series Timing Waveforms Read Timing Waveform (1) (WE = VIH) tRC Address Valid address tOH tAA tACS tCHZ CS tOE tOHZ OE tOLZ tCLZ Dout High Impedance Valid data Read Timing Waveform (2) (WE = VIH, CS = VIL , OE = VIL ) tRC Address Valid address tAA tOH tOH Dout Valid data 9 HM62W8511HC Series Read Timing Waveform (3) (WE = VIH, CS = VIL , OE = VIL )*2 tRC CS tACS tCHZ tCLZ Dout High Impedance Valid data High Impedance Write Timing Waveform (1) (WE Controlled) tWC Valid address Address tWR tAW OE tCW CS*3 tAS tWP WE*3 tOHZ High impedance*5 Dout tDW Din 10 *4 tDH Valid data *4 HM62W8511HC Series Write Timing Waveform (2) (CS Controlled) tWC Valid address Address tWR tCW CS *3 tAW tWP WE *3 tAS tWHZ tOW High impedance*5 Dout tDW Din *4 tDH Valid data *4 11 HM62W8511HC Series Low VCC Data Retention Characteristics (Ta = 0 to +70°C) This characteristics is guaranteed only for L-version. Parameter Symbol Min Typ*1 Max Unit Test conditions VCC for data retention VDR 2.0 — — V VCC ≥ CS ≥ VCC – 0.2 V (1) 0 V ≤ Vin ≤ 0.2 V or (2) VCC ≥ Vin ≥ VCC – 0.2 V Data retention current I CCDR — TBD 600 µA VCC = 3 V, VCC ≥ CS ≥ VCC – 0.2 V (1) 0 V ≤ Vin ≤ 0.2 V or (2) VCC ≥ Vin ≥ VCC – 0.2 V Chip deselect to data retention time t CDR 0 — — ns See retention waveform Operation recovery time tR 5 — — ms Note: 1. Typical values are at VCC = 3.0 V, Ta = +25˚C, and not guaranteed. Low V CC Data Retention Timing Waveform t CDR Data retention mode V CC 3.0 V V DR 2.0 V CS 0V 12 VCC ≥ CS ≥ VCC – 0.2 V tR HM62W8511HC Series Package Dimensions HM62W8511HCJP/HCLJP Series (CP-36D) Unit: mm 23.25 23.62 Max 10.16 ± 0.13 *0.43 ± 0.10 0.41 ± 0.08 1.27 0.80 +0.25 –0.17 1.30 Max 2.85 ± 0.12 18 0.74 3.50 ± 0.26 1 11.18 ± 0.13 19 36 9.40 ± 0.25 0.10 *Dimension including the plating thickness Base material dimension Hitachi Code JEDEC EIAJ Mass (reference value) CP-36D Conforms Conforms 1.4 g 13 HM62W8511HC Series Cautions 1. Hitachi neither warrants nor grants licenses of any rights of Hitachi’s or any third party’s patent, copyright, trademark, or other intellectual property rights for information contained in this document. Hitachi bears no responsibility for problems that may arise with third party’s rights, including intellectual property rights, in connection with use of the information contained in this document. 2. Products and product specifications may be subject to change without notice. Confirm that you have received the latest product standards or specifications before final design, purchase or use. 3. Hitachi makes every attempt to ensure that its products are of high quality and reliability. However, contact Hitachi’s sales office before using the product in an application that demands especially high quality and reliability or where its failure or malfunction may directly threaten human life or cause risk of bodily injury, such as aerospace, aeronautics, nuclear power, combustion control, transportation, traffic, safety equipment or medical equipment for life support. 4. Design your application so that the product is used within the ranges guaranteed by Hitachi particularly for maximum rating, operating supply voltage range, heat radiation characteristics, installation conditions and other characteristics. Hitachi bears no responsibility for failure or damage when used beyond the guaranteed ranges. Even within the guaranteed ranges, consider normally foreseeable failure rates or failure modes in semiconductor devices and employ systemic measures such as fail-safes, so that the equipment incorporating Hitachi product does not cause bodily injury, fire or other consequential damage due to operation of the Hitachi product. 5. This product is not designed to be radiation resistant. 6. No one is permitted to reproduce or duplicate, in any form, the whole or part of this document without written approval from Hitachi. 7. Contact Hitachi’s sales office for any questions regarding this document or Hitachi semiconductor products. Hitachi, Ltd. Semiconductor & Integrated Circuits. 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