LATTICE ISPLSI5128VE

ispLSI 5128VE
®
In-System Programmable
3.3V SuperWIDE™ High Density PLD
Features
Functional Block Diagram
• Second Generation SuperWIDE HIGH DENSITY
IN-SYSTEM PROGRAMMABLE LOGIC DEVICE
— 3.3V Power Supply
— User Selectable 3.3V/2.5V I/O
— 6000 PLD Gates / 128 Macrocells
— 96 I/O Pins Available
— 128 Registers
— High-Speed Global Interconnect
— SuperWIDE Generic Logic Block (32 Macrocells) for
Optimum Performance
— SuperWIDE Input Gating (68 Inputs) for Fast
Counters, State Machines, Address Decoders, etc.
— Interfaces with Standard 5V TTL Devices
Input Bus
Generic
Logic Block
• HIGH PERFORMANCE E2CMOS® TECHNOLOGY
— fmax = 180 MHz Maximum Operating Frequency
— tpd = 5.0 ns Propagation Delay
— TTL/3.3V/2.5V Compatible Input Thresholds and
Output Levels
— Electrically Erasable and Reprogrammable
— Non-Volatile
— Programmable Speed/Power Logic Path Optimization
Input Bus
Global Routing Pool
(GRP)
Boundary
Scan
Interface
Generic
Logic Block
Input Bus
Generic
Logic Block
Generic
Logic Block
Input Bus
• IN-SYSTEM PROGRAMMABLE
— Increased Manufacturing Yields, Reduced Time-toMarket, and Improved Product Quality
— Reprogram Soldered Devices for Faster Debugging
ispLSI 5000VE Description
• 100% IEEE 1149.1 BOUNDARY SCAN TESTABLE AND
3.3V IN-SYSTEM PROGRAMMABLE
The ispLSI 5000VE Family of In-System Programmable
High Density Logic Devices is based on Generic Logic
Blocks (GLBs) of 32 registered macrocells and a single
Global Routing Pool (GRP) structure interconnecting the
GLBs.
• ARCHITECTURE FEATURES
— Enhanced Pin-Locking Architecture with SingleLevel Global Routing Pool and SuperWIDE GLBs
— Wrap Around Product Term Sharing Array Supports
up to 35 Product Terms Per Macrocell
— Macrocells Support Concurrent Combinatorial and
Registered Functions
— Macrocell Registers Feature Multiple Control
Options Including Set, Reset and Clock Enable
— Four Dedicated Clock Input Pins Plus Macrocell
Product Term Clocks
— Programmable I/O Supports Programmable Bus
Hold, Pull-up, Open Drain and Slew Rate Options
— Four Global Product Term Output Enables, Two
Global OE Pins and One Product Term OE per
Macrocell
Outputs from the GLBs drive the Global Routing Pool
(GRP) between the GLBs. Switching resources are provided to allow signals in the Global Routing Pool to drive
any or all the GLBs in the device. This mechanism allows
fast, efficient connections across the entire device.
Each GLB contains 32 macrocells and a fully populated,
programmable AND-array with 160 logic product terms
and three extra control product terms. The GLB has 68
inputs from the Global Routing Pool which are available
in both true and complement form for every product term.
The 160 product terms are grouped in 32 sets of five and
sent into a Product Term Sharing Array (PTSA) which
allows sharing up to a maximum of 35 product terms for
a single function. Alternatively, the PTSA can be bypassed for functions of five product terms or less. The
three extra product terms are used for shared controls:
reset, clock, clock enable and output enable.
Copyright © 2002 Lattice Semiconductor Corp. All brand or product names are trademarks or registered trademarks of their respective holders. The specifications and information herein are subject
to change without notice.
LATTICE SEMICONDUCTOR CORP., 5555 Northeast Moore Ct., Hillsboro, Oregon 97124, U.S.A.
Tel. (503) 268-8000; 1-800-LATTICE; FAX (503) 268-8556; http://www.latticesemi.com
5128ve_05
1
January 2002
Specifications ispLSI 5128VE
Functional Block Diagram
TMS
TCK
I/O 75
I/O 74
I/O 73
I/O 72
I/O 95
I/O 94
I/O 93
I/O 92
GOE1
GOE0
Figure 1. ispLSI 5128VE Functional Block Diagram (96-I/O)
Input Bus
Generic
Logic Block
VCCIO
TDI
Boundary
Scan
Interface
TDO
I/O 71
I/O 70
I/O 69
I/O 68
1TOE
Generic
Logic Block
Input Bus
Global Routing Pool
(GRP)
Generic
Logic Block
Input Bus
I/O 1
I/O 2
I/O 3
I/O 51
I/O 50
I/O 49
I/O 48
I/O 20
I/O 21
I/O 22
I/O 23
Generic
Logic Block
Input Bus
1. CLK2, CLK3 and TOE signals are shared with I/O signals. Use the table below to determine which I/O is shared.
Package Type
128 TQFP
I/O 59 / CLK2
Multplexed Signals
I/O 65 / CLK3
I/O 0 / TOE
2
1CLK3
1CLK2
CLK0
CLK1
I/O 44
I/O 45
I/O 46
I/O 47
I/O 24
I/O 25
I/O 26
I/O 27
RESET
Specifications ispLSI 5128VE
The ispLSI 5000VE Family features 3.3V, non-volatile insystem programmability for both the logic and the
interconnect structures, providing the means to develop
truly reconfigurable systems. Programming is achieved
through the industry standard IEEE 1149.1-compliant
Boundary Scan interface. Boundary Scan test is also
supported through the same interface.
ispLSI 5000VE Description (Continued)
The 32 registered macrocells in the GLB are driven by the
32 outputs from the PTSA or the PTSA bypass. Each
macrocell contains a programmable XOR gate, a programmable register/latch and the necessary clocks and
control logic to allow combinatorial or registered operation. The macrocells each have two outputs, combinatorial
and registered. This dual output capability from the
macrocell allows efficient use of the hardware resources.
One output can be a registered function for example,
while the other output can be an unrelated combinatorial
function. A direct register input from the I/O pad facilitates efficient use of this feature to construct high-speed
input registers.
An enhanced, multiple cell security scheme is provided
that prevents reading of the JEDEC programming file
when secured. After the device has been secured using
this mechanism, the only way to clear the security is to
execute a bulk-erase instruction.
ispLSI 5000VE Family Members
Macrocell registers can be clocked from one of several
global or product term clocks available on the device. A
global and product term clock enable is also available to
each register, eliminating the need to gate the clock to the
macrocell registers. Reset for the macrocell register is
provided from the global signal, its polarity is userselectable. The macrocell register can be programmed to
operate as a D-type register or a D-type latch.
The ispLSI 5000VE Family ranges from 128 macrocells
to 512 macrocells and operates from a 3.3V power
supply. All family members will be available with multiple
package options. The ispLSI 5000VE Family device
matrix showing the various bondout options is shown in
the table below.
The interconnect structure (GRP) is very similar to Lattice's
existing ispLSI 1000, 2000 and 3000 families, but with an
enhanced interconnect structure for optimal pin locking
and logic routing. This eliminates the need for registered
I/O cells or an Output Routing Pool.
The 32 outputs from the GLB can drive both the Global
Routing Pool and the device I/O cells. The Global Routing
Pool contains one input from each macrocell output and
one input from each I/O pin.
The ispLSI 5000VE encompasses the innovative features of the ispLSI 5000VA family with several
enhancements. The macrocell is optimized and the Ttype flip flop option is removed. To improve the efficiency
of design fits, the Product Term Reset Logic is simplified
and the polarity option as well as the Global Preset
function are removed. The programmable output-delay
feature (skew option) is also removed. As a result, the
ispLSI 5000VE is not JEDEC compatible with the ispLSI
5000VA. ispLSI 5000VA and 5000VE pinouts may differ
in the same package, however all programming and
power/ground pins are located in the same locations.
The input buffer threshold has programmable TTL/3.3V/
2.5V compatible levels. The output driver can source
4mA and sink 8mA in 3.3V mode. The output drivers
have a separate VCCIO reference input which is independent of the main VCC supply for the device. This
feature allows individual output drivers to drive either
3.3V (from the device VCC) or 2.5V (from the VCCIO pin)
output levels while the device logic and the output current
drive are powered from device supply (VCC). The output
drivers also provide individually programmable edge
rates and open drain capability. A programmable pullup
resistor is provided to tie off unused inputs. Additionally,
a programmable bus-hold latch is available to hold tristate
outputs in their last valid state until the bus is driven again
by some device.
Table 1. ispLSI 5000VE Family
Package Type
GLBs
Macrocells
100 TQFP
128 TQFP
256 fpBGA
272 BGA
388 fpBGA
388 BGA
ispLSI 5128VE
Device
4
128
—
96 I/O
—
—
—
—
ispLSI 5256VE
8
256
72 I/O
96 I/O
144 I/O
144 I/O
—
—
ispLSI 5384VE
12
384
—
—
192 I/O
192 I/O
—
—
ispLSI 5512VE
16
512
—
—
192 I/O
192 I/O
256 I/O
256 I/O
3
Specifications ispLSI 5128VE
Figure 2. ispLSI 5128VE Block Diagram (96 I/O)
CLK2
CLK3
24
I/O
24
24
32
32
GLB1
GLB2
32
24
32
Q
32
D
D
160
3
PT
160
24
24
32
32
GLB3
Q
3
24
I/O
IO0/TOE
32
D
D
224
160
3
PT
3
GLB0
32
32
24
68
68
24
32
3
PT
160
PT
160
24
I/O
Q
160
160
PT
3
24
I/O
160
160
68
68
4
32
24
160
160
PT
160
PT
Q
3
PT
3
CLK0
CLK1
GOE0
GOE1
RESET
Specifications ispLSI 5128VE
Figure 3. ispLSI 5000VE Generic Logic Block (GLB)
From GRP
0 1 2
66 67
Global PTOE Bus
PTSA
Macrocell 0
PT 0
PT 1
From PTSA
PT 2
PTSA bypass
PT 3
To I/O Pad
PT 4
PTOE
PT Clock
PT Reset
PT Preset
4
Shared PT Clock
Shared PT Reset
Global PTOE 0 ... 3
To GRP
Macrocell 1
PT 9
PT 8
From PTSA
PT 7
PTSA bypass
PT 6
To I/O Pad
PT 5
PTOE
PT Clock
PT Reset
PT Preset
4
Shared PT Clock
Shared PT Reset
Global PTOE 0 ... 3
PT 79
Macrocell 15
PT 78
From PTSA
PT 77
PTSA bypass
PT 76
To GRP
To I/O Pad
PT 75
PTOE
PT Clock
PT Reset
PT Preset
4
Shared PT Clock
Shared PT Reset
Global PTOE 0 ... 3
PT 159
Macrocell 31
PT 158
From PTSA
PT 157
PTSA bypass
PT 156
To GRP
To I/O Pad
PT 155
PTOE
PT Clock
PT Reset
PT Preset
PT 160
PT 161
4
PT 162
5
Shared PT Clock
Shared PT Reset
Global PTOE 0 ... 3
To GRP
Specifications ispLSI 5128VE
Figure 4. ispLSI 5000VE Macrocell
VCCIO
VCC
VCCIO
Global PTOE 0
Global PTOE 1
Global PTOE 2
Global PTOE 3
PTOE
GOE0
GOE1
TOE
PTSA bypass
I/O Pad
D
Q
PTSA
Slew
rate
Open
drain
Clk En
PT Clock
To GRP
2.5V/3.3V
Output
R/L
Shared PT Clock
CLK0
CLK1
CLK2
CLK3
Input threshold
2.5V/3.3V
Clk
R P
PT Reset
Shared PT Reset
Global Reset
PT Preset
speed/
power
Note: Not all macrocells have I/O pads.
6
To GRP
Specifications ispLSI 5128VE
speed. The clock inversion is available on the remaining
CLK1 - CLK3 signals. By sharing the pins with the I/O
pins, CLK2 and CLK3 can not only be inverted but are
also available for logic implementation through GRP
signal routing. Figure 5 shows these different clock
distribution options.
Global Clock Distribution
The ispLSI 5000VE Family has four dedicated clock input
pins: CLK0 - CLK3. CLK0 input is used as the dedicated
master clock that has the lowest internal clock skew with
no clock inversion to maintain the fastest internal clock
Figure 5. ispLSI 5000VE Global Clock Structure
CLK 0
(dedicated pin)
CLK0
CLK 1
(dedicated pin)
CLK1
IO/CLK 2
(shared pin)
to/from GRP
CLK2
CLK3
IO/CLK 3
(shared pin)
to/from GRP
RESET
(dedicated pin)
Global Reset
IO0/TOE
(shared pin)
to/from GRP
TOE
7
Specifications ispLSI 5128VE
Figure 6. Boundary Scan Register Circuit for I/O Pins
HIGHZ
EXTEST
SCANIN
(from previous
cell)
BSCAN
Registers
1
D
TOE
BSCAN
Latches
Q
D
Normal
Function
OE
Q
0
1
0
EXTEST
PROG_MODE
Normal
Function
1
0
D
Q
D
Q
D
Q
0
I/O Pin
1
1
0
Shift DR
Clock DR
SCANOUT
(to next cell)
Update DR
Reset
Figure 7. Boundary Scan Register Circuit for Input-Only Pins
Input Pin
SCANIN
(from previous
cell)
0
D
1
Shift DR
Clock DR
8
Q
SCANOUT
(to next cell)
Specifications ispLSI 5128VE
Figure 8. Boundary Scan Waveforms and Timing Specifications
TMS
TDI
Tbtsu
Tbtch
Tbth
Tbtcl
Tbtcp
TCK
Tbtvo
Tbtco
TDO
Valid Data
Tbtcpsu
Data to be
captured
Valid Data
Tbtcph
Data Captured
Tbtuov
Tbtuco
Data to be
driven out
SYMBOL
Tbtoz
Valid Data
Tbtuoz
Valid Data
PARAMETER
MIN
MAX UNITS
tbtcp
TCK [BSCAN test] clock pulse width
125
–
ns
tbtch
tbtcl
TCK [BSCAN test] pulse width high
62.5
–
ns
TCK [BSCAN test] pulse width low
62.5
–
ns
tbtsu
TCK [BSCAN test] setup time
25
–
ns
tbth
TCK [BSCAN test] hold time
25
–
ns
trf
TCK [BSCAN test] rise and fall time
50
–
mV/ns
tbtco
TAP controller falling edge of clock to valid output
–
25
ns
tbtoz
TAP controller falling edge of clock to data output disable
–
25
ns
tbtvo
TAP controller falling edge of clock to data output enable
–
25
ns
tbtcpsu
BSCAN test Capture register setup time
25
–
ns
tbtcph
BSCAN test Capture register hold time
25
–
ns
tbtuco
BSCAN test Update reg, falling edge of clock to valid output
–
50
ns
tbtuoz
BSCAN test Update reg, falling edge of clock to output disable
–
50
ns
tbtuov
BSCAN test Update reg, falling edge of clock to output enable
–
50
ns
9
Specifications ispLSI 5128VE
Absolute Maximum Ratings 1, 2
Supply Voltage Vcc .................................. -0.5 to +5.4V
Input Voltage Applied ............................... -0.5 to +5.6V
Tri-Stated Output Voltage Applied ........... -0.5 to +5.6V
Storage Temperature ................................ -65 to 150°C
Case Temp. with Power Applied .............. -55 to 125°C
Max. Junction Temp. (TJ) with Power Applied ... 150°C
1. Stresses above those listed under the “Absolute Maximum Ratings” may cause permanent damage to the device. Functional
operation of the device at these or at any other conditions above those indicated in the operational sections of this specification
is not implied (while programming, follow the programming specifications).
2. Compliance with the Thermal Management section of the Lattice Semiconductor Data Book or CD-ROM is a requirement.
DC Recommended Operating Condition
SYMBOL
MIN.
MAX.
UNITS
Commercial
TA = 0°C to +70°C
3.00
3.60
V
Industrial
TA = -40°C to +85°C
3.00
3.60
V
2.3
3.60
PARAMETER
VCC
Supply Voltage
VCCIO
I/O Reference Voltage
V
Table 2-0005/5KVE
Capacitance (TA=25°C,f=1.0 MHz)
TYPICAL
UNITS
I/O Capacitance
10
pf
VCC = 3.3V, VI/O = 0.0V
Clock Capacitance
10
pf
VCC = 3.3V, VCK = 0.0V
Global Input Capacitance
10
pf
VCC = 3.3V, VG = 0.0V
SYMBOL
C1
C2
C3
PARAMETER
TEST CONDITIONS
Table 2-0006/5KVE
Erase Reprogram Specification
PARAMETER
ispLSI Erase/Reprogram Cycles
MINIMUM
MAXIMUM
UNITS
10000
–
Cycles
Table 2-0008/5KVE
10
Specifications ispLSI 5128VE
Switching Test Conditions
Figure 9. Test Load
Input Pulse Levels
GND to VCCIOmin
Input Rise and Fall Time
VCCIO
≤ 1.5ns 10% to 90%
Input Timing Reference Levels
1.5V
Ouput Timing Reference Levels
1.5V
Output Load
R1
See Figure 9
Device
Output
Table 2-0003/5KVE
3-state levels are measured 0.5V from
steady-state active level.
Test
Point
C L*
R2
Output Load Conditions (See Figure 9)
3.3V
TEST CONDITION
R1
R2
R1
316Ω
348Ω
511Ω
475Ω 35pF
Active High
∞
348Ω
∞
475Ω 35pF
Active Low
316Ω
∞
511Ω
∞
35pF
Active High to Z
at VOH -0.5V
∞
348Ω
∞
475Ω
5pF
Active Low to Z
at VOL+0.5V
316Ω
∞
511Ω
∞
5pF
∞
∞
∞
∞
35pF
A
B
C
D
*CL includes Test Fixture and Probe Capacitance.
2.5V
Slow Slew
R2
0213D
CL
Table 2-0004A/5KVE
DC Electrical Characteristics for 3.3V Range1
Over Recommended Operating Conditions
SYMBOL
VCCIO
VIL
VIH
VOL
VOH
MIN.
TYP.
I/O Reference Voltage
CONDITION
3.0
–
3.6
V
Input Low Voltage
-0.3
–
0.8
V
Input High Voltage
2.0
–
5.25
V
PARAMETER
MAX. UNITS
Output Low Voltage
VCCIO = min, IOL = 8 mA
–
–
0.4
V
Output High Voltage
VCCIO = min, IOH = -4 mA
2.4
–
–
V
Table 2-0007/5KVE
1. I/O voltage configuration must be set to VCC.
11
Specifications ispLSI 5128VE
DC Electrical Characteristics for 2.5V Range1
Over Recommended Operating Conditions
SYMBOL
CONDITION
PARAMETER
MIN.
TYP.
MAX. UNITS
VCCIO
VIL
VIH
I/O Reference Voltage
2.3
–
2.7
V
Input Low Voltage
-0.3
–
0.7
V
Input High Voltage
1.7
–
5.25
V
VOL
Output Low Voltage
–
–
0.2
V
VOH
VCCIO=min, IOL= 100µA
VCCIO=min, IOL= 2mA
Output High Voltage
–
–
0.6
V
VCCIO=min, IOH= -100µA
2.1
–
–
V
VCCIO=min, IOH= -2mA
1.8
–
–
V
2.5V/5128VE
1. I/O voltage configuration must be set to VCCIO.
DC Electrical Characteristics
Over Recommended Operating Conditions
SYMBOL
IIL
IIH
1
IPU
IBHL
IBHH
IBHLO
IBHLH
IBHT
IVCCIO
CONDITION
PARAMETER
MIN.
TYP.
MAX. UNITS
Input or I/O Low Leakage Current
0V ≤ VIN≤ VIL(Max.)
–
–
-10
µA
Input or I/O High Leakage Current
(VCCIO-0.2)V ≤ VIN ≤ VCCIO
–
–
10
µA
VCCIO ≤ VIN ≤ 5.25V
–
–
50
µA
I/O Active Pullup Current
0V ≤ VIN ≤ VIL
–
–
-200
µA
Bus Hold Low Sustaining Current
VIN = VIL(max)
40
–
–
µA
Bus Hold High Sustaining Current
-40
–
–
µA
Bus Hold Low Overdrive Current
VIN = VIH(min)
0V ≤ VIN ≤ VCCIO
–
–
550
µA
Bus Hold High Overdrive Current
0V ≤ VIN ≤ VCCIO
–
–
-550
µA
VIL
–
VIH
V
–
–
30
mA
Bus Hold Trip Points
Current Needed for VCCIO Pin
All I/Os Pulled-up, (Total I/Os * IPUmax)
1. Pullup is capable of pulling to a minimum voltage of VOH under no-load conditions.
12
DC Char_5KVE
Specifications ispLSI 5128VE
External Switching Characteristics
Over Recommended Operating Conditions
PARAM.
tpd16
tpd26
fmax
fmax (Ext.)
fmax (Tog.)
tsu1
tco16
th1
tsu2
th2
tsu3
th3
tr1
trw17
tpten/dis6
tgpten/dis6
tgen/dis6
TEST3
COND.
DESCRIPTION
-180
4,5
-125
MIN. MAX. MIN. MAX.
UNITS
A
Data Prop. Delay, 5PT Bypass
—
5.0
—
7.5
ns
A
Data Propagation Delay
—
7.0
—
9.5
ns
180
—
125
—
MHz
A
1
Clock Frequency with Internal Feedback
—
Clock Freq. with Ext. Feedback,1/(tsu2 + tco1)
133
—
87
—
MHz
—
Clock Frequency, Max Toggle2
227
—
167
—
MHz
—
GLB Reg. Setup Time before Clk, 5PT bypass
3.5
—
5.0
—
ns
A
GLB Reg. Clock to Output Delay
—
3. 0
—
4.5
ns
—
GLB Reg. Hold Time after Clock, 5PT bypass
0.0
—
0.0
—
ns
—
GLB Reg. Setup Time before Clock
4.5
—
7.0
—
ns
—
GLB Reg. Hold Time after Clock
0.0
—
0.0
—
ns
—
GLB Reg. Setup Time before Clock, Input Reg. Path
2.5
—
3.5
—
ns
—
GLB Reg. Hold Time after Clock, Input Reg. Path
0.5
—
0.5
—
ns
A
Ext. Reset Pin to Output Delay
—
6.0
—
10.0
ns
—
Ext. Reset Pulse Duration
3.5
—
5.0
—
ns
B/C
Local Product Term Output Enable/Disable
—
6.0
—
8.5
ns
B/C
Global Product Term Output Enable/Disable
—
7.0
—
14.0
ns
B/C
Global OE Input to Output Enable/Disable
—
3.5
—
5.5
ns
B/C
Test OE Input to Output Enable/Disable
—
5.5
—
10.5
ns
twh
—
Ext. Sync. Clock Pulse Duration, High
2.2
—
3.0
—
ns
twl
—
Ext. Sync. Clock Pulse Duration, Low
2.2
—
3.0
—
ns
tten/dis
6
Timing Ext.5128ve1.eps
1. Standard 16-bit counter using GRP feedback.
2. fmax (Toggle) may be less than 1/(twh + twl). This is to allow for a clock duty cycle of other than 50%.
Timing v.2.0
3. Reference Switching Test Conditions section.
4. Unless noted otherwise, all timing numbers are taken with worst case PTSA fanout, a GRP load of 1 GLB, CLK0, and highspeed AND array.
5. Timing parameters measured using normal active output driver.
6. The delay parameters are measured with Vcc as I/O voltage reference. An additional 0.5ns delay is incurred when Vccio is
used as I/O voltage reference.
7. Pulse widths less than minimum may cause unknown output behavior.
13
Specifications ispLSI 5128VE
External Switching Characteristics
Over Recommended Operating Conditions
PARAM.
tpd16
tpd26
fmax
fmax (Ext.)
fmax (Tog.)
tsu1
tco16
th1
tsu2
th2
tsu3
th3
tr1
trw17
tpten/dis6
tgpten/dis6
tgen/dis6
TEST3
COND.
DESCRIPTION 4,5
-100
-80
MIN. MAX. MIN. MAX.
UNITS
A
Data Prop. Delay, 5PT Bypass
—
10.0
—
12.0
ns
A
Data Propagation Delay
—
12.0
—
15.0
ns
100
—
80
—
MHz
67
—
56
—
MHz
1
A
Clock Frequency with Internal Feedback
—
Clock Freq. with Ext. Feedback,1/(tsu2 + tco1)
2
—
Clock Frequency, Max Toggle
125
—
100
—
MHz
—
GLB Reg. Setup Time before Clk, 5PT bypass
7.0
—
8.0
—
ns
A
GLB Reg. Clock to Output Delay
—
6.0
—
7.0
ns
—
GLB Reg. Hold Time after Clock, 5PT bypass
0.0
—
0.0
—
ns
—
GLB Reg. Setup Time before Clock
9.0
—
11.0
—
ns
—
GLB Reg. Hold Time after Clock
0.0
—
0.0
—
ns
—
GLB Reg. Setup Time before Clock, Input Reg. Path
4.5
—
5.5
—
ns
—
GLB Reg. Hold Time after Clock, Input Reg. Path
1.0
—
1.0
—
ns
A
Ext. Reset Pin to Output Delay
—
11.5
—
13.0
ns
—
Ext. Reset Pulse Duration
6.5
—
8.0
—
ns
B/C
Local Product Term Output Enable/Disable
—
10.0
—
12.0
ns
B/C
Global Product Term Output Enable/Disable
—
15.5
—
17.0
ns
B/C
Global OE Input to Output Enable/Disable
—
7.5
—
9.0
ns
tten/dis
B/C
Test OE Input to Output Enable/Disable
—
11.5
—
12.5
ns
twh
—
Ext. Sync. Clock Pulse Duration, High
4.0
—
5.0
—
ns
twl
—
Ext. Sync. Clock Pulse Duration, Low
4.0
—
5.0
—
ns
6
Timing Ext.5128ve2.eps
1. Standard 16-bit counter using GRP feedback.
2. fmax (Toggle) may be less than 1/(twh + twl). This is to allow for a clock duty cycle of other than 50%.
Timing v.2.0
3. Reference Switching Test Conditions section.
4. Unless noted otherwise, all timing numbers are taken with worst case PTSA fanout, a GRP load of 1 GLB, CLK0, and highspeed AND array.
5. Timing parameters measured using normal active output driver.
6. The delay parameters are measured with Vcc as I/O voltage reference. An additional 0.5ns delay is incurred when Vccio is
used as I/O reference.
7. Pulse widths less than minimum may cause unknown output behavior.
used as I/O voltage reference.
14
Specifications ispLSI 5128VE
Internal Timing Parameters
Over Recommended Operating Conditions
PARAMETER
In/Out Delays
tin
tgclk_in
trst
tgoe
tbuf
ten
tdis
-180
-125
-100
-80
MIN MAX MIN MAX MIN MAX MIN MAX UNIT
DESCRIPTION
Input Buffer Delay
–
0.9
–
1.3
–
2.3
–
2.3
ns
Global Clock Buffer Input Delay (clk0)
–
1.0
–
1.3
–
1.8
–
1.8
ns
Global Reset Pin Delay
–
4.4
–
6.6
–
7.1
–
7.1
ns
ns
Global OE Pin Delay
–
2.5
–
3.9
–
5.9
–
7.4
Output Buffer Delay
–
1.1
–
2.2
–
2.7
–
3.7
ns
Output Enable Delay
–
1.0
–
1.6
–
1.6
–
1.6
ns
Output Disable Delay
–
1.0
–
1.6
–
1.6
–
1.6
ns
–
2.7
–
3.6
–
4.0
–
4.5
ns
Routing/GLB Delays
troute
tpdb
tpdi
tptsa
tfbk
tinreg
GRP and Logic Delay
5-pt Bypass Propagation Delay
–
0.3
–
0.4
–
1.0
–
1.5
ns
Combinatorial Propagation Delay
–
1.0
–
0.0
–
0.0
–
0.0
ns
Product Term Sharing Array
–
1.3
–
2.4
–
3.0
–
4.5
ns
Internal Feedback Delay
–
0.0
–
0.0
–
0.0
–
0.5
ns
Input Buffer to Macrocell Register Delay
–
2.0
–
2.5
–
2.5
–
3.5
ns
Register/Latch Delays
ts
ts_pt
th
tcoi
tsl
thl
tgoi
tpdli
tces
tceh
tsri
tsrr
Register Setup Time
0.6
–
1.0
–
1.5
–
1.5
–
ns
Register Setup Time (Product Term Clock)
0.6
–
1.0
–
1.5
–
1.5
–
ns
Register Hold Time
2.4
–
3.0
–
4.0
–
5.0
–
ns
–
0.9
–
1.0
–
1.5
–
1.5
ns
Latch Setup Time
0.6
–
1.0
–
1.5
–
1.5
–
ns
Latch Hold Time
2.4
–
3.0
–
4.0
–
5.0
–
ns
Register Clock to GLB Output Delay
Latch Gate to GLB Output Delay
–
0.9
–
1.0
–
1.5
–
1.5
ns
GLB Latch propagation Delay
–
1.0
–
1.5
–
2.0
–
2.5
ns
Clock Enable Setup Time
4.1
–
4.3
–
5.3
–
6.3
–
ns
Clock Enable Hold Time
0.3
–
1.7
–
2.7
–
3.7
–
ns
Asynchronous Set/Reset to GLB Output Delay
–
0.5
–
1.2
–
1.7
–
2.2
ns
1.1
–
1.2
–
1.2
–
2.2
–
ns
Macrocell PT Clock Delay
–
0.4
–
0.4
–
0.5
–
0.5
ns
Block PT Clock Delay
–
1.4
–
1.9
–
2.5
–
2.5
ns
Macrocell PT Set/Reset Delay
–
1.8
–
3.7
–
4.8
–
4.8
ns
Block PT Set/Reset Delay
–
2.8
–
5.7
–
6.8
–
6.8
ns
Macrocell PT OE Delay
–
1.4
–
2.0
–
2.1
–
3.6
ns
Global PT OE Delay
–
2.4
–
7.5
–
7.6
–
8.6
Asynchronous Set/Reset Recovery Time
Control Delays
tptclk
tbclk
tptsr
tbsr
tptoe
tgptoe
Note: Internal Timing Parameters are not tested and are for reference only. Refer to Timing Model in this data sheet
for further details.
15
ns
Timing v.2.0
Specifications ispLSI 5128VE
ispLSI 5128VE Timing Parameters (continued)
ADDER
ADDER TYPE
BASE PARAMETER
-180
-125
-100
-80
UNITS
troute
1.0
1.5
1.5
1.5
ns
tgclk_in
tgclk_in
tgclk_in
0.9
1.7
1.7
1.7
ns
1.4
1.7
1.7
1.7
ns
1.4
1.7
1.7
1.7
ns
Routing Adders
tlp
Tioi Input Adders
clk1
clk2
clk3
Tioo Output
Adders1
Slow Slew I/O
LVTTL_out
LVCMOS25_out
LVCMOS33_out
tbuf, ten
tbuf, ten, tdis
tbuf, ten, tdis
tbuf, ten, tdis
4.0
4.0
4.0
4.0
ns
0.0
0.0
0.0
0.0
ns
0.5
0.5
0.5
0.5
ns
0.0
0.0
0.0
0.0
ns
0.1
0.1
0.1
0.1
ns
0.2
0.2
0.2
0.2
ns
0.3
0.3
0.3
0.3
Tbla Additional Block Loading Adders
1
2
3
troute
troute
troute
1Timing for open drain configurations is the same as non-open drain configurations.
Note: Internal Timing Parameters are not tested and are for reference only. Refer to Timing Model in this data sheet for
details.
16
ns
Timing Table/5128VE
Timing v.2.0
Specifications ispLSI 5128VE
ispLSI 5128VE Timing Model
Routing/
GLB Delays
tPDb
From Feedback
Feedback
tPDi
tFBK
tROUTE
IN
tBLA
tIN
tPTSA
DATA
Q
tLP
tINREG
CLK
OUT
In/Out
Delays
tGCLK_IN
tIOI
tBUF
tEN
tDIS
tIOO
tPTCLK
tBCLK
CE
tPTSR
tBSR
S/R
MC Reg
RST
tRST
Register/
Latch Delays
tGPTOE
tPTOE
OE
tGOE
Control
Delays
5000VE Timing Model
In/Out
Delays
Note: Italicized parameters are delay adders above and beyond default conditions (i.e. GRP load of one GLB, CLK0, high-speed AND Array
and VCC I/O option).
17
Specifications ispLSI 5128VE
Power Consumption
Power consumption in the ispLSI 5128VE device depends on two primary factors: the speed at which the
device is operating and the number of product terms
used. The product terms have a fuse-selectable speed/
power tradeoff setting. Each group of five product terms
has a single speed/power tradeoff control fuse that acts
on the complete group of five. The fast “high-speed”
setting operates product terms at their normal full power
consumption. For portions of the logic that can tolerate
longer propagation delays, selecting the slower “lowpower” setting will reduce the power dissipation for these
product terms. Figure 10 shows the relationship between
power and operating frequency.
Figure 10. Typical Device Power Consumption vs fmax
180
ispLSI 5128VE
High Speed Mode
165
ICC (mA)
150
135
ispLSI 5128VE
Low Power Mode
120
105
90
0
25
50
75
100
125
150
175
200
fmax (MHz)
Notes: Configuration of 8 16-bit Counters
Typical Current at 3.3V, 25° C
ICC can be estimated for the ispLSI 5128VE using the following equation:
High Speed Mode: ICC = 12.4 + (# of PTs * 0.408) + (# of nets * Fmax * 0.00169)
Low Power Mode: ICC = 12.4 + (# of PTs * 0.349) + (# of nets * Fmax * 0.00169)
# of PTs = Number of Product Terms used in design
# of nets = Number of Signals used in device
Fmax = Highest Clock Frequency to the device
The ICC estimate is based on typical conditions (VCC = 3.3V, room temperature) and an assumption of one GLB load
on average exists. These values are for estimates only. Since the value of ICC is sensitive to operating conditions
and the program in the device, the actual ICC should be verified.
0127/5128VE
18
Specifications ispLSI 5128VE
Signal Descriptions
Signal Name
TMS
Description
Input - This pin is the Test Mode Select input, which is used to control the JTAG state machine.
TCK
Input - This pin is the Test Clock input pin used to clock through the JTAG state machine.
TDI
Input - This pin is the JTAG Test Data In pin used to load data.
TDO
Output - This pin is the JTAG Test Data Out pin used to shift data out.
TOE / I/O0
Input/Output - This pin functions as either the Test Output Enable pin or an I/O pin based upon
customer's design. TOE tristates all I/O pins when a logic low is driven.
GOE0, GOE1
Input - These two pins are the Global Output Enable input pins.
RESET
Dedicated Reset Input - This pin resets all registers in the device. The global polarity (active
high or low input) for this pin is selectable.
I/O
Input/Output – These are the general purpose I/O used by the logic array.
GND
Ground
VCC
Vcc
CLK0, CLK1
Dedicated clock inputs for all registers. Both clocks are muxed before being used as the clock
input to all registers in the device.
CLK2 / I/O,
CLK3 / I/O
Input/Output - These pins share functionality. They can be used as dedicated clock inputs for
all registers, as well as I/O pins.
VCCIO
Input - This pin is used for optional 2.5V outputs. Every I/O can independently select either 3.3V
or the optional voltage as its output level. If the optional output voltage is not required, this pin
must be connected to the Vcc supply. Programmable pull-up resistors and bus-hold latches
only draw current from this supply.
19
Specifications ispLSI 5128VE
Pin Configuration
128
127
126
125
124
123
122
121
120
119
118
117
116
115
114
113
112
111
110
109
108
107
106
105
104
103
102
101
100
99
98
97
I/O 81
I/O 80
I/O 79
VCC
I/O 78
GND
I/O 77
I/O 76
I/O 75
I/O 74
I/O 73
I/O 72
I/O 71
VCC
CLK1
CLK0
I/O 70
I/O 69
GND
I/O 68
I/O 67
I/O 66
I/O 65/CLK3
I/O 64
I/O 63
I/O 62
I/O 61
I/O 60
GND
I/O 59/CLK2
I/O 58
I/O 57
ispLSI 5128VE 128-Pin TQFP (0.4mm Lead Pitch / 14.0mm x 14.0mm Body Size)
ispLSI 5128VE
Top View
96
95
94
93
92
91
90
89
88
87
86
85
84
83
82
81
80
79
78
77
76
75
74
73
72
71
70
69
68
67
66
65
VCC
I/O 56
I/O 55
I/O 54
I/O 53
I/O 52
I/O 51
I/O 50
I/O 49
I/O 48
VCC
RESET
VCCIO
TDO
GND
I/O 47
I/O 46
I/O 45
I/O 44
I/O 43
I/O 42
VCC
I/O 41
GND
I/O 40
I/O 39
I/O 38
I/O 37
I/O 36
GND
I/O 35
VCC
33
34
35
36
37
38
39
40
41
42
43
44
45
46
47
48
49
50
51
52
53
54
55
56
57
58
59
60
61
62
63
64
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
22
23
24
25
26
27
28
29
30
31
32
I/O 9
I/O 10
I/O 11
I/O 12
GND
I/O 13
I/O 14
VCC
I/O 15
I/O 16
I/O 17
I/O 18
I/O 19
I/O 20
I/O 21
I/O 22
I/O 23
GND
GOE0
GOE1
VCC
I/O 24
I/O 25
I/O 26
I/O 27
I/O 28
I/O 29
I/O 30
I/O 31
I/O 32
I/O 33
I/O 34
I/O 82
I/O 83
I/O 84
I/O 85
I/O 86
I/O 87
GND
I/O 88
VCC
I/O 89
I/O 90
I/O 91
I/O 92
I/O 93
I/O 94
I/O 95
GND
TMS
TCK
TDI
VCC
I/O 0/TOE
I/O 1
I/O 2
I/O 3
I/O 4
GND
I/O 5
VCC
I/O 6
I/O 7
I/O 8
128 TQFP/5128VE
20
Specifications ispLSI 5128VE
Part Number Description
ispLSI 5128VE – XXX X XXXX X
Device Family
Grade
Blank = Commercial
I = Industrial
Device Number
Package
T128 = 128-Pin TQFP
Speed
180 = 180 MHz fmax
125 = 125 MHz fmax
100 = 100 MHz fmax
80 = 80 MHz fmax
Power
L = Low
0212/5128ve
Ordering Information
COMMERCIAL
FAMILY
ispLSI
fmax (MHz)
tpd (ns)
ORDERING NUMBER
PACKAGE
180
5.0
ispLSI 5128VE-180LT128
128-Pin TQFP
125
7.5
ispLSI 5128VE-125LT128
128-Pin TQFP
100
10
ispLSI 5128VE-100LT128
128-Pin TQFP
Table 2-0041A/5128VE
INDUSTRIAL
FAMILY
ispLSI
fmax (MHz)
tpd (ns)
ORDERING NUMBER
PACKAGE
125
7.5
ispLSI 5128VE-125LT128I
128-Pin TQFP
100
10
ispLSI 5128VE-100LT128I
128-Pin TQFP
80
12
ispLSI 5128VE-80LT128I
128-Pin TQFP
The ispLSI 5128VE is dual-marked with both Commercial and Industrial grades. The Commercial speed grade is faster
(i.e. ispLSI 5128VE-180LT128) than the Industrial speed grade (i.e. ispLSI 5128VE-125LT128I).
21
Table 2-0041B/5128VE