Preliminary Revised September 2002 100ELT23 5V Dual Differential PECL to TTL Translator (Preliminary) General Description Features The 100ELT23 is a dual differential PECL to TTL translator operating from a single +5V supply. ■ Typical propagation delay of 3.5 ns The dual gate design of the 100ELT23 makes it ideal for applications which require the translation of a clock and a data signal. ■ Flow through pinout ■ TTL output drive: IOH = 24 mA; IOL = −3 mA ■ Q Output will default to a LOW with the inputs left Open ■ Internal pull-down resistors on inputs The 100 series is temperature compensated. ■ Fairchild MSOP-8 package is a drop-in replacement to ON TSSOP-8 ■ Typical ICCH of 23 mA, ICCL of 26 mA ■ Meets or exceeds JEDEC specification EIA/JESD78 IC latch-up test ■ Moisture Sensitivity Level TBD ■ ESD Performance: Human Body Model > TBD Machine Model > TBD Ordering Code: Product Order Number Package Code Package Description Number Top Mark 100ELT23M M08A KLT23 8-Lead Small Outline Integrated Circuit (SOIC), JEDEC MS-012, 0.150" Narrow 100ELT23M8 (Preliminary) MA08D KT23 8-Lead Molded Small Outline Package (MSOP), JEDEC MO-187, 3.0mm Wide Devices also available in Tape and Reel. Specify by appending suffix letter “X” to the ordering code. Connection Diagram Logic Diagram Top View Pin Descriptions Pin Name Description D0 , D0 , D1 , D1 PECL Differential Inputs Q0, Q1 TTL Outputs VCC Positive Supply GND Ground © 2002 Fairchild Semiconductor Corporation DS500774 www.fairchildsemi.com 100ELT23 5V Dual Differential PECL to TTL Translator (Preliminary) September 2002 100ELT23 Preliminary Absolute Maximum Ratings(Note 1) PECL Supply Voltage (VCC) 0.0V to +7V Recommended Operating Conditions Input Voltage (VI) VI ≤ VCC 0.0V to + 6V Power Supply Operating −65°C to + 150°C Storage Temperature (TSTG) Junction to Ambient (θJA) SOIC 0LFPM 500LFPM TBD Junction to Case (θJC) std bd TBD Junction to Ambient (θJA) MSOP Junction to Case (θJC) MSOP 0.0V to VCC −40°C to +85°C Free Air Operating Temperature (TA) Thermal Resistance SOIC VCC = 4.75V to 5.25V ECL Input Voltage Note 1: The “Absolute Maximum Ratings” are those values beyond which the safety of the device cannot be guaranteed. The device should not be operated at these limits. The parametric values defined in the Electrical Characteristics tables are not guaranteed at the absolute maximum rating. The “Recommended Operating Conditions” table will define the conditions for actual device operation. TBD 0LFPM TBD 500LFPM TBD std bd TBD PECL DC Electrical Characteristics VCC = 5.0V; GND = 0.0V (Note 2) Symbol Parameter −40°C Min 25°C Typ Max Min 85°C Typ Max Min Typ Max Units VIH Input HIGH Voltage (Single Ended) 3835 4120 3835 4120 3835 4120 mV VIL Input LOW Voltage (Single Ended) 3190 3525 3190 3525 3190 3525 mV VIHCMR Input HIGH Voltage Common 2.2 5.0 2.2 5.0 2.2 5.0 V 150 µA Mode Range (Differential) (Note 3) IIH Input HIGH Current IIL Input LOW Current 150 0.5 150 0.5 µA 0.5 Note 2: VIH and VIL values vary 1 to 1 with VCC. VCC can vary ±0.25V. Note 3: VIHCMR minimum varies 1 to 1 with GND. VIHCMR maximum varies 1 to 1 with VCC. Note: Devices are designed to meet the DC specifications after thermal equilibrium has been established. Circuit is tested with air flow greater than 500LFPM maintained. TTL DC Electrical Characteristics VCC = 5.0V; GND = 0.0V (Note 4) Symbol Parameter VOH Output HIGH Voltage VOL Output LOW Voltage ICCH Power Supply Current (Outputs set to HIGH) ICCL Power Supply Current (Outputs set to LOW) IOS Output Short Circuit Current (Note 5) TA = −40°C to 85°C Min Typ Max 26 −150 Condition V IOH = −3.0 mA 0.5 V IOL = 24 mA 33 mA 36 mA −60 mA 2.4 23 Units Note 4: VCC can vary ±0.25V. Note 5: For IOS, the use of high-speed test apparatus and/or sample-and-hold techniques are preferable in order to minimize internal chip heating and more accurately reflect operational values. Otherwise, prolonged shorting of a HIGH output may raise the chip temperature well above normal and thereby cause invalid readings in other parameter tests. In any sequence of parameter tests, IOS tests should be performed last. Note: Devices are designed to meet the DC specifications after thermal equilibrium has been established. Circuit is tested with air flow greater than 500LFPM maintained. www.fairchildsemi.com 2 Preliminary Symbol Parameter −40°C Min Typ 25°C Max Min 85°C Typ Max Min Typ Max Units Figure Number fMAX Maximum Toggle Frequency TBD TBD TBD tJITTER Cycle-to-Cycle Jitter TBD TBD TBD MHz tPLH, tPHL Propagation Delay to Output 2.0 5.5 2.0 5.5 2.0 5.5 ns Figure 1 VPP Input Swing 200 1000 200 1000 200 1000 mV Figure 1 tr, tf Output Rise Time (10% to 90%) 1.6 Output Fall Time (10% to 90%) 1.1 ns Figure 2 ps Note 6: VCC can vary ±0.25V. Note 7: All Loading with 500Ω to GND, CL = 20 pF. Switching Waveforms Note: VM varies 1:1 with VEE FIGURE 1. Differential PECL to TTL Output Propagation Delay FIGURE 2. TTL Output Edge Rates 3 www.fairchildsemi.com 100ELT23 AC Electrical Characteristics VCC = 5.0V; GND = 0.0V (Note 6)(Note 7) 100ELT23 Preliminary Physical Dimensions inches (millimeters) unless otherwise noted 8-Lead Small Outline Integrated Circuit (SOIC), JEDEC MS-012, 0.150" Narrow Package Number M08A www.fairchildsemi.com 4 Preliminary 100ELT23 5V Dual Differential PECL to TTL Translator (Preliminary) Physical Dimensions inches (millimeters) unless otherwise noted (Continued) 8-Lead Molded Small Outline Package (MSOP), JEDEC MO-187, 3.0mm Wide Package Number MA08D Fairchild does not assume any responsibility for use of any circuitry described, no circuit patent licenses are implied and Fairchild reserves the right at any time without notice to change said circuitry and specifications. LIFE SUPPORT POLICY FAIRCHILD’S PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT DEVICES OR SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROVAL OF THE PRESIDENT OF FAIRCHILD SEMICONDUCTOR CORPORATION. As used herein: 2. A critical component in any component of a life support device or system whose failure to perform can be reasonably expected to cause the failure of the life support device or system, or to affect its safety or effectiveness. 1. Life support devices or systems are devices or systems which, (a) are intended for surgical implant into the body, or (b) support or sustain life, and (c) whose failure to perform when properly used in accordance with instructions for use provided in the labeling, can be reasonably expected to result in a significant injury to the user. www.fairchildsemi.com 5 www.fairchildsemi.com