MITSUBISHI LSIsLSIs MITSUBISHI M5M4V4265CJ,TP-5,-6,-7,-5S,-6S,-7S M5M4V4265CJ,TP-5,-6,-7,-5S,-6S,-7S (HYPER PAGE) MODE 4194304-BIT (262144-WORD BY 16-BIT) DYNAMIC RAM EDOEDO (HYPER PAGE) MODE 4194304-BIT (262144-WORD BY 16-BIT) DYNAMIC RAM DESCRIPTION This is a family of 262144-word by 16-bit dynamic RAMs with EDO mode fuction, fabricated with the high performance CMOS process, and is ideal for the buffer memory systems of personal computer graphics and HDD where high speed, low power dissipation, and low costs are essential. The use of double-layer metalization process technology and a single-transistor dynamic storage stacked capacitor cell provide high circuit density at reduced costs. The lower supply (3.3V) operation, due to the optimization of transistor structure, provides low power dissipation while maintaining high speed operation. Multiplexed address inputs permit both a reduction in pins and an increase in system densities. Self or extended refresh current is low enough for battery back-up application. This device has 2CAS and 1W terminals with a refresh cycle of 512 cycles every 8.2ms. FEATURES RAS CAS Address access access access time time time (max.ns) (max.ns) (max.ns) Type name M5M4V4265CXX-5,-5S M5M4V4265CXX-6,-6S M5M4V4265CXX-7,-7S 50 60 70 13 15 20 Power OE Cycle dissipaaccess time tion time (max.ns) (min.ns) (typ.mW) 25 30 35 13 15 20 90 110 130 408 363 333 XX=TP,J Standard 40 pin SOJ, 44 pin TSOP (II) Single 3.3±0.3V supply Low stand-by power dissipation CMOS Input level 1.8mW (Max) CMOS Input level 360µW (Max) * Operating power dissipation M5M4V4265CXX-5,-5S 486mW (Max) M5M4V4265CXX-6,-6S 432mW (Max) M5M4V4265CXX-7,-7S 396mW (Max) Self refresh capability * Self refresh current 100µA (Max) Extended refresh capability Extended refresh current 100µA (Max) EDO mode (512-column random access), Read-modify-write, RASonly refresh, CAS before RAS refresh, Hidden refresh capabilities. Early-write mode, OE and W to control output buffer impedance 512 refresh cycles every 8.2ms (A0~A8) 512 refresh cycles every 128ms (A0~A8) * Byte or word control for Read/Write operation (2CAS, 1W type) * : Applicable to self refresh version (M5M4V4265CJ,TP-5S,-6S, -7S : option) only PIN CONFIGURATION (TOP VIEW) (3.3V)VCC 1 40 VSS(0V) DQ1 2 39 DQ16 DQ2 3 38 DQ15 DQ3 4 37 DQ14 DQ4 5 36 DQ13 (3.3V)VCC 6 35 VSS(0V) DQ5 7 34 DQ12 DQ6 8 33 DQ11 DQ7 9 32 DQ10 DQ8 10 31 DQ9 NC 11 30 NC NC 12 29 LCAS W 13 28 UCAS RAS 14 27 OE NC 15 26 A8 A0 16 25 A7 A1 17 24 A6 A2 18 23 A5 A3 19 22 A4 (3.3V)VCC 20 21 VSS(0V) Outline 40P0K (400mil SOJ) (3.3V)VCC 1 44 VSS(0V) DQ1 2 43 DQ16 DQ2 3 42 DQ15 DQ3 4 41 DQ14 DQ4 5 40 DQ13 (3.3V)VCC 6 39 VSS(0V) DQ5 7 38 DQ12 DQ6 8 37 DQ11 DQ7 9 36 DQ10 DQ8 10 35 DQ9 NC 13 32 NC NC 14 31 LCAS W 15 30 UCAS 16 29 OE NC 17 28 A8 A0 18 27 A7 A1 19 26 A6 A2 20 25 A5 A3 21 24 A4 (3.3V)VCC 22 23 VSS(0V) APPLICATION Microcomputer memory, Refresh memory for CRT, Frame buffer memory for CRT PIN DESCRIPTION Pin name A0~A8 DQ1~DQ16 RAS LCAS 1 Function Address inputs Data inputs / outputs Row address strobe input Lower byte control column address strobe input UCAS Upper byte control column address strobe input W OE VCC VSS Write control input Output enable input Power supply (+3.3V) Ground (0V) M5M4V4265CJ,TP-5,-5S:under development RAS Outline 44P3W-R (400mil TSOP Nomal Bend) NC : NO CONNECTION MITSUBISHI LSIs M5M4V4265CJ,TP-5,-6,-7,-5S,-6S,-7S EDO (HYPER PAGE) MODE 4194304-BIT (262144-WORD BY 16-BIT) DYNAMIC RAM FUNCTION In addition to EDO Mode, normal read, write and read-modifywrite operations the M5M4V4265CXX provides a number of other functions, e.g., RAS-only refresh, and delayed-write. The input conditions for each are shown in Table 1. Table 1 Input conditions for each mode Inputs Operation Lower byte read Upper byte read Word read Lower byte write Upper byte write Word write RAS only refresh Hidden refresh CAS before RAS (Extended *) refresh Self refresh * Stand-by RAS ACT ACT ACT ACT ACT ACT ACT ACT ACT ACT NAC LCAS ACT NAC ACT ACT NAC ACT NAC ACT ACT ACT DNC UCAS NAC ACT ACT NAC ACT ACT NAC ACT ACT ACT DNC Input/Output W NAC NAC NAC ACT ACT ACT DNC NAC DNC DNC DNC DQ1~DQ8 DOUT OPN DOUT DIN DNC DIN OPN DOUT OPN OPN OPN OE ACT ACT ACT NAC NAC NAC DNC ACT DNC DNC DNC DQ9~DQ16 OPN DOUT DOUT DNC DIN DIN OPN DOUT OPN OPN OPN Note : ACT : active, NAC : nonactive, DNC : don' t care, OPN : open BLOCK DIAGRAM VCC (3.3V) ROW ADDRESS STROBE INPUT RAS LOWER BYTE CONTROL COLUMN ADDRESS LCAS STROBE INPUT CLOCK GENERATOR CIRCUIT LOWER UPPER BYTE CONTROL UCAS COLUMN ADDRESS STROBE INPUT WRITE CONTROL INPUT VSS (0V) (8)LOWER DATA IN BUFFER UPPER DQ1 DQ2 W LOWER DATA INPUTS / OUTPUTS DQ8 (8)LOWER DATA OUT BUFFER VCC (3.3V) VSS (0V) A0~A8 COLUMN DECODER ADDRESS INPUTS A0 A1 A2 A3 A4 A5 A6 A7 A8 (8)UPPER DATA IN BUFFER SENSE REFRESH AMPLIFIER & I /O CONTROL ROW & COLUMN ADDRESS BUFFER ROW A 0~ A8 DECODER MEMORY CELL (4,194,304 BITS) (8)UPPER DATA OUT BUFFER DQ9 DQ10 DQ16 UPPER DATA INPUTS / OUTPUTS VCC (3.3V) VSS (0V) OE 2 M5M4V4265CJ,TP-5,-5S:under development OUTPUT ENABLE INPUT MITSUBISHI LSIs M5M4V4265CJ,TP-5,-6,-7,-5S,-6S,-7S EDO (HYPER PAGE) MODE 4194304-BIT (262144-WORD BY 16-BIT) DYNAMIC RAM ABSOLUTE MAXIMUM RATINGS Symbol VCC VI VO IO Pd Topr Tstg Parameter Supply voltage Input voltage Output voltage Output current Power dissipation Operating temperature Storage temperature Conditions Ratings -0.5~4.6 -0.5~4.6 -0.5~4.6 50 1000 0~70 -65~150 With respect to VSS Ta=25˚C RECOMMENDED OPERATING CONDITIONS (Ta=0~70˚C, unless otherwise noted) Symbol VCC VSS VIH VIL Parameter Min 3.0 0 2.0 -0.3 Supply voltage Supply voltage High-level input voltage, all inputs Low-level input voltage, all inputs Limits Nom 3.3 0 Max 3.6 0 Unit V V V mA mW ˚C ˚C (Note 1) Unit VCC+0.3 0.8 V V V V Note 1 : All voltage values are with respect to VSS. ELECTRICAL CHARACTERISTICS (Ta=0~70˚C, VCC=3.3±0.3V, VSS=0V, unless otherwise noted) (Note 2) Symbol VOH VOL IOZ II ICC1(AV) Parameter Test conditions High-level output voltage Low-level output voltage Off-state output current Input current Average supply current from Vcc, operating (Note 3,4,5) IOH=-2mA IOL=2mA Q floating 0V≤VOUT≤VCC 0V≤VIN≤VCC+0.3V, Other inputs pins=0V M5M4V4265C-5,-5S M5M4V4265C-6,-6S M5M4V4265C-7,-7S Min 2.4 0 -5 -5 Limits Typ RAS, CAS cycling tRC=tWC=min. output open RAS= CAS =VIH, output open ICC2 Supply current from VCC, stand-by (Note 6) RAS= CAS≥VCC -0.2V output open M5M4V4265C-5,-5S ICC3(AV) ICC4(AV) ICC6(AV) ICC8(AV) * ICC9(AV) * Average supply current M5M4V4265C-6,-6S from Vcc, RAS only refresh mode (Note 3,5) M5M4V4265C-7,-7S RAS cycling, CAS=VIH tRC=min. output open M5M4V4265C-5,-5S RAS=VIL, CAS cycling tPC=min. output open Average supply current from Vcc EDO mode (Note 3,4,5) Average supply current from Vcc CAS before RAS refresh mode (Note 3,5) M5M4V4265C-6,-6S M5M4V4265C-7,-7S M5M4V4265C-5,-5S M5M4V4265C-6,-6S M5M4V4265C-7,-7S Average supply current from VCC Extended-refresh mode (Note 6) Average supply current from VCC Self-refresh mode (Note 6) CAS before RAS refresh cycling tRC=min. output open M5M4V4265CJ,TP-5,-5S:under development Unit V V µA µA mA 2 0.5 mA 0.1 * 125 110 95 125 110 95 115 100 85 mA mA mA RAS cycling CAS≤0.2V or CAS before RAS refresh cycling RAS≤0.2V or ≥VCC-0.2V CAS≤0.2V or ≥VCC-0.2V W≤0.2V or≥VCC-0.2V OE≤0.2V or ≥VCC-0.2V A0~A8 ≤ 0.2V or ≥VCC-0.2V, DQ=open tRC=250µs, tRAS=tRAS min~1µs 100 µA RAS=CAS≤0.2V output open 100 µA Note 2 : Current flowing into an IC is positive, out is negative. 3 : ICC1(AV), ICC3(AV), ICC4(AV), and ICC6 (AV) are dependent on cycle rate. Maximum current is measured at the fastest cycle rate. 4 : ICC1(AV) and ICC4(AV) are dependent on output loading. Specified values are obtained with the output open. 5 : Column Address can be changed once or less while RAS=VIL and CAS=VIH. 3 Max VCC 0.4 5 5 135 120 110 MITSUBISHI LSIs M5M4V4265CJ,TP-5,-6,-7,-5S,-6S,-7S EDO (HYPER PAGE) MODE 4194304-BIT (262144-WORD BY 16-BIT) DYNAMIC RAM CAPACITANCE (Ta=0~70˚C, VCC=3.3±0.3V, VSS=0V, unless otherwise noted) Symbol CI (A) CI (CLK) CI / O Parameter Input capacitance, address inputs Input capacitance, clock inputs Input/Output capacitance, data ports Test conditions Min Limits Typ VI=VSS f=1MHz VI=25mVrms Max 5 7 7 Unit pF pF pF SWITCHING CHARACTERISTICS (Ta=0~70˚C, VCC=3.3±0.3V, Vss=0V, unless otherwise noted, see notes 6,14,15) Limits Symbol Parameter M5M4V4265C-5,-5S Min tCAC tRAC tAA tCPA tOEA tOHC tOHR tCLZ tOEZ tWEZ tOFF tREZ Access time from CAS Access time from RAS Columu address access time Access time from CAS precharge Access time from OE Output hold time from CAS Output hold time from RAS Output low impedance time from CAS low Output disable time after OE high Output disable time after WE high Output disable time after CAS high Output disable time after RAS high (Note 7,8) (Note 7,9) (Note 7,10) (Note 7,11) (Note 7) (Note 13) (Note 13) (Note 7) (Note 12) (Note 12) (Note 12,13) (Note 12,13) Max 13 50 25 28 13 5 5 5 M5M4V4265C-6,-6S Min Max 15 60 30 33 15 5 5 5 13 13 13 13 M5M4V4265C-7,-7S Min Max 20 70 35 38 20 5 5 5 15 15 15 15 20 20 20 20 Unit ns ns ns ns ns ns ns ns ns ns ns ns Note 6 : An initial pause of 500µs is required after power-up followed by a minimum of eight initialization cycles (RAS-only refresh or CAS before RAS refresh cycles). Note the RAS may be cycled during the initial pause. And 8 initialization cycles are required after prolonged periods (greater than 8.2ms) of RAS inactivity before proper device operation is achieved. 7 : Measured with a load circuit equivalent to 50pF, VOH (IOH=-2mA) and VOL(IOL=2mA). The reference levels for measuring of output signals are 2.0V(VOH) and 0.8V(VOL). 8 : Assumes that tRCD≥tRCD(max) and tASC≥tASC(max) and tCP≥tCP(max). 9 : Assumes that tRCD≤tRCD(max) and tRAD≤tRAD(max). If tRCD or tRAD is greater than the maximum recommended value shown in this table, tRAC will increase by amount that tRCD exceeds the value shown. 10 : Assumes that tRAD≥tRAD(max) and tASC≤tASC(max). 11 : Assumes that tCP≤tCP(max) and tASC≥tASC(max). 12 : tOEZ (max), tWEZ(max), tOFF(max) and tREZ(max) defines the time at which the output achieves the high impedance state (IOUT≤ ±5µA ) and is not reference to VOH(min) or VOL(max). 13 : Output is disabled after both RAS and CAS go to high. 4 M5M4V4265CJ,TP-5,-5S:under development MITSUBISHI LSIs M5M4V4265CJ,TP-5,-6,-7,-5S,-6S,-7S EDO (HYPER PAGE) MODE 4194304-BIT (262144-WORD BY 16-BIT) DYNAMIC RAM TIMING REQUIREMENTS (For Read, Write, Read-Modify-Write, Refresh and EDO Mode Cycles) (Ta=0~70˚C, VCC=3.3±0.3V, VSS=0V, unless otherwise noted, see notes 14,15) Limits Symbol Parameter M5M4V4265C-5,-5S Min tREF tREF tRP tRCD tCRP tRPC tCPN tRAD tASR tASC tRAH tCAH tDZC tDZO tRDD tCDD tODD tT Refresh cycle time Refresh cycle time * RAS high pulse width Delay time, RAS low to CAS low Delay time, CAS high to RAS low Delay time, RAS high to CAS low CAS high pulse width Column address delay time from RAS low Row address setup time before RAS low Column address setup time before CAS low Row address hold time after RAS low Column address hold time after CAS low Delay time, data to CAS low Delay time, data to OE low Delay time, RAS high to data Delay time, CAS high to data Delay time, OE high to data Transition time Note 14 : The timing requirements are assumed tT=2ns. (Note 16) (Note 17) (Note 18) (Note 19) (Note 19) (Note 20) (Note 20) (Note 20) (Note 21) 30 18 5 0 8 13 0 0 8 8 0 0 13 13 13 1 Max 8.2 128 32 25 10 50 M5M4V4265C-6,-6S Min Max 8.2 128 40 20 5 0 10 15 0 0 10 10 0 0 15 15 15 1 45 30 13 50 M5M4V4265C-7,-7S Min 50 20 5 0 10 15 0 0 10 10 0 0 20 20 20 1 Max 8.2 128 50 35 13 50 Unit ms ms ns ns ns ns ns ns ns ns ns ns ns ns ns ns ns ns Note 15 : VIH(min) and VIL(max) are reference levels for measuring timing of input signals. Note 16 : tRCD(max) is specified as a reference point only. If tRCD is less than tRCD(max), access time is tRAC. If tRCD is greater than tRCD(max), access time is controlled exclusively by tCAC or tAA. Note 17 : tRAD(max) is specified as a reference point only. If tRAD≥tRAD(max) and tASC≤tASC(max), access time is controlled exclusively by tAA. Note 18 : tASC(max) is specified as a reference point only. If tRCD≥tRCD(max) and tASC≥tASC(max), access time is controlled exclusively by tCAC. Note 19 : Either tDZC or tDZO must be satisfied. Note 20 : Either tRDD or tCDD or tODD must be satisfied. Note 21 : tT is measured between VIH(min) and VIL(max). Read and Refresh Cycles Limits Symbol tRC tRAS tCAS tCSH tRSH tRCS tRCH tRRH tRAL tCAL tORH tOCH Parameter M5M4V4265C-5,-5S Read cycle time RAS low pulse width CAS low pulse width CAS hold time after RAS low RAS hold time after CAS low Read setup time before CAS low Read hold time after CAS high Read hold time after RAS high Column address to RAS hold time Column address to CAS hold time RAS hold time after OE low CAS hold time after OE low Note 22 : Either tRCH or tRRH must be satisfied for a read cycle. 5 M5M4V4265CJ,TP-5,-5S:under development (Note 22) (Note 22) Min 90 50 8 40 13 0 0 0 25 13 13 13 Max 10000 10000 M5M4V4265C-6,-6S Min 110 60 10 48 15 0 0 0 30 18 15 15 Max 10000 10000 M5M4V4265C-7,-7S Min 130 70 13 55 20 0 0 0 35 23 20 20 Unit Max 10000 10000 ns ns ns ns ns ns ns ns ns ns ns ns MITSUBISHI LSIs M5M4V4265CJ,TP-5,-6,-7,-5S,-6S,-7S EDO (HYPER PAGE) MODE 4194304-BIT (262144-WORD BY 16-BIT) DYNAMIC RAM Write Cycle (Early Write and Delayed Write) Limits Symbol tWC tRAS tCAS tCSH tRSH tWCS tWCH tCWL tRWL tWP tDS tDH Parameter Write cycle time RAS low pulse width CAS low pulse width CAS hold time after RAS low RAS hold time after CAS low Write setup time before CAS low Write hold time after CAS low CAS hold time after W low RAS hold time after W low Write pulse width Data setup time before CAS low or W low Data hold time after CAS low or W low M5M4V4265C-5,-5S M5M4V4265C-6,-6S (Note 24) Min 90 50 8 40 13 0 8 8 8 8 0 8 Max 10000 10000 Min 110 60 10 48 15 0 10 10 10 10 0 10 Max 10000 10000 M5M4V4265C-7,-7S Min 130 70 10 55 20 0 13 13 13 13 0 13 Unit Max 10000 10000 ns ns ns ns ns ns ns ns ns ns ns ns Read-Write and Read-Modify-Write Cycles Limits Symbol Parameter Min 109 75 38 70 38 0 28 65 40 13 Max M5M4V4265C-6,-6S Min 133 89 44 82 44 0 32 77 47 15 Max M5M4V4265C-7,-7S Min 161 107 57 99 57 0 42 92 57 20 Unit Max ns (Note 23) ns 10000 10000 10000 RAS low pulse width ns tCAS 10000 10000 10000 CAS low pulse width ns tCSH CAS hold time after RAS low tRSH ns RAS hold time after CAS low ns tRCS Read setup time before CAS low ns tCWD (Note 24) Delay time, CAS low to W low tRWD ns (Note 24) Delay time, RAS low to W low tAWD ns (Note 24) Delay time, address to W low tOEH ns OE hold time after W low Note 23 : tRWC is specified as tRWC(min)=tRAC(max)+tODD(min)+tRWL(min)+tRP(min)+4tT. Note 24 : tWCS, tCWD, tRWD and tAWD and tCPWD are specified as reference points only. If tWCS≥tWCS(min) the cycle is an early write cycle and the DQ pins will remain high impedance throughout the entire cycle. If tCWD≥tCWD(min), tRWD≥tRWD(min), tAWD≥tAWD(min) and tCPWD≥tCPWD(min) tRWC tRAS Read write/read modify write cycle time M5M4V4265C-5,-5S (for EDO mode cycle only), the cycle is a read-modify-write cycle and the DQ will contain the data read from the selected address. If neither of the above condition (delayed write) of the DQ (at access time and until CAS or OE goes back to VIH) is indeterminate. 6 M5M4V4265CJ,TP-5,-5S:under development MITSUBISHI LSIs M5M4V4265CJ,TP-5,-6,-7,-5S,-6S,-7S EDO (HYPER PAGE) MODE 4194304-BIT (262144-WORD BY 16-BIT) DYNAMIC RAM EDO Mode Cycle (Read, Early Write, Read-Write, Read-Modify-Write Cycle, Read Write Mix Cycle, Hi-Z control by OE or W) (Note 25) Limits Symbol tHPC tHPRWC tDOH tRAS tCP tCPRH tCPWD tCHOL tOEPE tWPE tHCWD tHAWD tHPWD tHCOD tHAOD tHPOD Parameter (Note 26) Hyper page mode read/write cycle time Hyper page mode read write/read modify write cycle time Output hold time from CAS low (Note 27) RAS low pulse width for read or write cycle (Note 28) CAS high pulse width RAS hold time after CAS precharge (Note 24) Delay time, CAS precharge to W low Hold time to maintain the data Hi-Z until CAS access OE pulse width (Hi-Z control) W pulse width (Hi-Z control) Delay time, CAS low to W low after read Delay time, Address to W low after read Delay time, CAS precharge to W low after read Delay time, CAS low to OE high after read Delay time, Address to OE high after read Delay time, CAS precharge to OE high after read M5M4V4265C-5,-5S Min 20 57 5 65 8 28 43 7 7 7 28 40 43 13 25 28 Max 100000 13 M5M4V4265C-6,-6S Min 25 66 5 77 10 33 50 7 7 7 32 47 50 15 30 33 Max 100000 16 M5M4V4265C-7,-7S Min 30 79 5 92 10 Unit Max 100000 16 38 60 7 7 7 42 57 60 20 35 38 ns ns ns ns ns ns ns ns ns ns ns ns ns ns ns ns Note 25 : All previously specified timing requirements and switching characteristics are applicable to their respective EDO mode cycle. Note 26 : tHPC(min) is specified in the case of read-only and early write-only in EDO mode. Note 27 : tRAS(min) is specified as two cycles of CAS input are performed. Note 28 : tCP(max) is specified as a reference point only. CAS before RAS Refresh Cycle (Note 29) Limits Symbol tCSR tCHR tCAS Parameter CAS setup time before RAS low CAS hold time after RAS low CAS low pulse width M5M4V4265C-5,-5S Min 5 10 17 Max M5M4V4265C-6,-6S Min 5 10 17 Max M5M4V4265C-7,-7S Min 5 15 22 Unit Max ns ns ns Note 29 : Eight or more CAS before RAS cycles instead of eight RAS cycles are necessary for proper operation of CAS before RAS refresh mode. Self Refresh Cycle * (Note 30) Limits Symbol tRASS tRPS tCHS Parameter CBR self refresh RAS low pulse width CBR self refresh RAS high precharge time CBR self refresh CAS hold time 7 M5M4V4265CJ,TP-5,-5S:under development M5M4V4265C-5,-5S Min 100 90 -50 Max M5M4V4265C-6,-6S Min 100 110 -50 Max M5M4V4265C-7,-7S Min 100 130 -50 Unit Max µs ns ns MITSUBISHI LSIs M5M4V4265CJ,TP-5,-6,-7,-5S,-6S,-7S EDO (HYPER PAGE) MODE 4194304-BIT (262144-WORD BY 16-BIT) DYNAMIC RAM Timing Diagrams Read Cycle (Note 31) tRC tRAS RAS tRP VIH VIL tRPC tCSH tCRP tRCD tRSH tCAS tCRP VIH LCAS/UCAS VIL tRAD tASR A0~A8 VIH VIL tRAL tCAL tRAH tASC ROW ADDRESS tASR tCAH COLUMN ADDRESS ROW ADDRESS tRRH tRCS tRCH W VIH VIL tDZC tCDD DQ1~DQ16 (INPUTS) VIH Hi-Z VIL tCAC tREZ tAA tOHR tCLZ VOH DQ1~DQ16 (OUTPUTS) VOL Hi-Z tWEZ tOFF tOHC Hi-Z tOEA DATA VALID tRAC tDZO tOEA tOCH OE VIH VIL tORH Note 31 Indicates the don't care input. VIH(min)≤VIN≤VIH(max) or VIL(min)≤VIN≤VIL(max) Indicates the invalid output. 8 M5M4V4265CJ,TP-5,-5S:under development tOEZ tODD MITSUBISHI LSIs M5M4V4265CJ,TP-5,-6,-7,-5S,-6S,-7S EDO (HYPER PAGE) MODE 4194304-BIT (262144-WORD BY 16-BIT) DYNAMIC RAM Byte Read Cycle tRC tRP tRAS RAS VIH tRPC VIL tCSH tCRP LCAS (or UCAS) tRCD tRSH tCRP VIH VIL tCPN tCAS UCAS (or LCAS) VIH VIL tRAD tASR A0~A8 VIH VIL tRAH tRAL tCAL tASC ROW ADDRESS tASR tCAH ROW ADDRESS COLUMN ADDRESS tRRH tRCS W tRCH VIH VIL DQ1~DQ8 VIH (or DQ9~DQ16) VIL (INPUTS) DQ1~DQ8 VOH (or DQ9~DQ16) (OUTPUTS) VOL Hi-Z tCDD tDZC DQ9~DQ16 VIH (or DQ1~DQ8) VIL (INPUTS) Hi-Z tREZ tCAC DQ9~DQ16 VOH (or DQ1~DQ8) (OUTPUTS) VOL tWEZ tOHR tAA tCLZ tOFF tOHC Hi-Z Hi-Z DATA VALID tRAC tDZO tOEZ tOEA tOCH OE VIH VIL tORH 9 M5M4V4265CJ,TP-5,-5S:under development tODD MITSUBISHI LSIs M5M4V4265CJ,TP-5,-6,-7,-5S,-6S,-7S EDO (HYPER PAGE) MODE 4194304-BIT (262144-WORD BY 16-BIT) DYNAMIC RAM Early Write Cycle tWC tRP tRAS RAS VIH tRPC VIL tCSH tCRP tRCD tRSH tCAS tCRP VIH LCAS/UCAS VIL tASR A0~A8 VIH VIL tRAH tASC ROW ADDRESS COLUMN ADDRESS tWCS W tDH VIH VIL VIH VIL 10 tWCH VIL DQ1~DQ16 VOH (OUTPUTS) VOL OE ROW ADDRESS VIH tDS DQ1~DQ16 (INPUTS) tASR tCAH M5M4V4265CJ,TP-5,-5S:under development DATA VALID Hi-Z MITSUBISHI LSIs M5M4V4265CJ,TP-5,-6,-7,-5S,-6S,-7S EDO (HYPER PAGE) MODE 4194304-BIT (262144-WORD BY 16-BIT) DYNAMIC RAM Byte Early Write Cycle tWC tRP tRAS RAS VIH VIL tCSH tCRP LCAS (or UCAS) tRPC tRCD tRSH tCRP VIH VIL tCAS UCAS (or LCAS) VIH VIL tASR A0~A8 VIH VIL tRAH tASC COLUMN ADDRESS ROW ADDRESS tWCS W tASR tCAH ROW ADDRESS tWCH VIH VIL DQ1~DQ8 VIH (or DQ9~DQ16) VIL (INPUTS) DQ1~DQ8 VOH (or DQ9~DQ16) (OUTPUTS) VOL Hi-Z tDS DQ9~DQ16 VIH (or DQ1~DQ8) VIL (INPUTS) DQ9~DQ16 VOH (or DQ1~DQ8) (OUTPUTS) VOL OE VIH VIL 11 M5M4V4265CJ,TP-5,-5S:under development tDH DATA VALID Hi-Z MITSUBISHI LSIs M5M4V4265CJ,TP-5,-6,-7,-5S,-6S,-7S EDO (HYPER PAGE) MODE 4194304-BIT (262144-WORD BY 16-BIT) DYNAMIC RAM Delayed Write Cycle tWC tRAS RAS tRP VIH VIL tRPC tCSH tRCD tCRP tRSH tCAS tCRP VIH LCAS/UCAS VIL tASR A0~A8 VIH VIL tRAH tCAH tASC tASR ROW ADDRESS COLUMN ADDRESS ROW ADDRESS tCWL tRWL tWP tRCS W VIH VIL tWCH tDZC DQ1~DQ16 (INPUTS) VIH tDS Hi-Z tDH DATA VALID VIL tCLZ DQ1~DQ16 VOH (OUTPUTS) VOL Hi-Z Hi-Z tDZO tOEH tOEZ tODD OE VIH VIL 12 M5M4V4265CJ,TP-5,-5S:under development MITSUBISHI LSIs M5M4V4265CJ,TP-5,-6,-7,-5S,-6S,-7S EDO (HYPER PAGE) MODE 4194304-BIT (262144-WORD BY 16-BIT) DYNAMIC RAM Byte Delayed Write Cycle tWC tRP tRAS RAS VIH VIL tCSH tCRP tRPC tRCD tRSH tCRP LCAS (or UCAS) VIH VIL tCAS UCAS (or LCAS) VIH VIL tASR A0~A8 VIH VIL tRAH tCAH tASC tASR ROW ADDRESS COLUMN ADDRESS ROW ADDRESS tCWL tRWL tWP tRCS W VIH VIL DQ1~DQ8 VIH (or DQ9~DQ16) VIL (INPUTS) DQ1~DQ8 VOH (or DQ9~DQ16) (OUTPUTS) VOL Hi-Z tWCH tDZC DQ9~DQ16 VIH (or DQ1~DQ8) (INPUTS) VIL tDS Hi-Z tDH DATA VALID tCLZ DQ9~DQ16 VOH (or DQ1~DQ8) (OUTPUTS) VOL Hi-Z Hi-Z tDZO tOEH tOEZ tODD OE VIH VIL 13 M5M4V4265CJ,TP-5,-5S:under development MITSUBISHI LSIs M5M4V4265CJ,TP-5,-6,-7,-5S,-6S,-7S EDO (HYPER PAGE) MODE 4194304-BIT (262144-WORD BY 16-BIT) DYNAMIC RAM Read-Write, Read-Modify-Write Cycle tRWC tRP tRAS RAS VIH VIL tCSH tCRP tRPC tRCD tRSH tCRP tCAS VIH LCAS/UCAS VIL tRAD tASR A0~A8 VIH VIL tRAH COLUMN ADDRESS ROW ADDRESS tCWL tRWL tWP VIH VIL tDZC DQ1~DQ16 (INPUTS) ROW ADDRESS tAWD tCWD tRWD tRCS W tASR tCAH tASC tDH tDS VIH Hi-Z DATA VALID VIL tCAC tAA tCLZ DQ1~DQ16 VOH (OUTPUTS) VOL Hi-Z tRAC tDZO OE VIH VIL 14 M5M4V4265CJ,TP-5,-5S:under development Hi-Z DATA VALID tOEA tODD tOEZ tOEH MITSUBISHI LSIs M5M4V4265CJ,TP-5,-6,-7,-5S,-6S,-7S EDO (HYPER PAGE) MODE 4194304-BIT (262144-WORD BY 16-BIT) DYNAMIC RAM Byte Read-Write, Read-Modify-Write Cycle tRWC tRP tRAS RAS VIH VIL tCSH tRPC tRCD tRSH tCRP LCAS (or UCAS) tCRP VIH VIL tCAS UCAS (or LCAS) VIH VIL tRAD tASR A0~A8 VIH VIL tRAH tCAH tASC ROW ADDRESS COLUMN ADDRESS ROW ADDRESS tAWD tCWD tRWD tRCS W tASR tCWL tRWL tWP VIH VIL DQ1~DQ8 VIH (or DQ9~DQ16) VIL (INPUTS) DQ1~DQ8 VOH (or DQ9~DQ16) (OUTPUTS) VOL Hi-Z tDH tDS tDZC DQ9~DQ16 VIH (or DQ1~DQ8) VIL (INPUTS) Hi-Z DATA VALID tCAC tAA tCLZ DQ9~DQ16 VOH (or DQ1~DQ8) (OUTPUTS) VOL Hi-Z tRAC tODD tDZO OE VIH VIL 15 M5M4V4265CJ,TP-5,-5S:under development Hi-Z DATA VALID tOEA tOEZ tOEH MITSUBISHI LSIs M5M4V4265CJ,TP-5,-6,-7,-5S,-6S,-7S EDO (HYPER PAGE) MODE 4194304-BIT (262144-WORD BY 16-BIT) DYNAMIC RAM EDO Mode Read Cycle tRAS RAS tRP VIH VIL tCSH tRCD tCRP tCAS tHPC tCAS tCP tRSH tCAS tCP VIH LCAS/UCAS VIL tRAD tASR A0~A8 VIH VIL tRAH tCPRH tASC ROW ADDRESS tASC tCAH tASC tCAH COLUMN-1 COLUMN-2 tCAL tCAL ROW ADDRESS COLUMN-3 tRCS W tASR tCAH tRAL tCAL tRRH tRCH VIH VIL tWEZ tDZC DQ1~DQ16 (INPUTS) tRDD tCDD Hi-Z VIH tCAC VIL tCAC tAA tCLZ DQ1~DQ16 VOH (OUTPUTS) VOL DATA VALID-1 tDOH DATA VALID-2 tCPA tOEA tOCH OE tAA tDOH Hi-Z tRAC tDZO tCAC tAA tREZ tOHR tOFF tOHC DATA VALID-3 tCPA tOEZ VIH VIL tODD 16 M5M4V4265CJ,TP-5,-5S:under development MITSUBISHI LSIs M5M4V4265CJ,TP-5,-6,-7,-5S,-6S,-7S EDO (HYPER PAGE) MODE 4194304-BIT (262144-WORD BY 16-BIT) DYNAMIC RAM EDO Mode Byte Read Cycle tRP tRAS RAS VIH VIL tHPC tCSH tCRP LCAS (or UCAS) tCP tRCD tCAS tRSH tCP VIH VIL tCAS UCAS (or LCAS) VIH VIL tRAD tASR A0~A8 VIH VIL tRAH tCPRH tCAH tASC ROW ADDRESS tASC tCAH COLUMN-1 COLUMN-2 tCAL tCAL tASC ROW ADDRESS COLUMN-3 tRAL tRRH tCAL tRCH VIH VIL tDZC DQ1~DQ8 VIH (or DQ9~DQ16) VIL (INPUTS) Hi-Z tCAC tREZ tAA DQ1~DQ8 VOH (or DQ9~DQ16) (OUTPUTS) VOL tOHR Hi-Z DATA VALID-2 tCLZ DQ9~DQ16 VIH (or DQ1~DQ8) (INPUTS) VIL tRDD tCPA tDZC tCDD Hi-Z tCAC tAA tCAC tAA tDOH tCLZ DQ9~DQ16 VOH (or DQ1~DQ8) (OUTPUTS) VOL Hi-Z tRAC tDZO tOEA tWEZ tOFF tOHC DATA VALID-3 DATA VALID-1 tOCH OE tASR tCAH tRCS W tCRP tCAS tCPA tOEZ VIH VIL tODD 17 M5M4V4265CJ,TP-5,-5S:under development MITSUBISHI LSIs M5M4V4265CJ,TP-5,-6,-7,-5S,-6S,-7S EDO (HYPER PAGE) MODE 4194304-BIT (262144-WORD BY 16-BIT) DYNAMIC RAM EDO Mode Early Write Cycle tRAS RAS tRP VIH VIL tCSH tRCD tCRP tCAS tHPC tCAS tCP tCP tRSH tCAS tCRP VIH LCAS/UCAS VIL tCAL tASR A0~A8 VIH VIL tRAH ROW ADDRESS tASC COLUMN-1 tWCS W VIH VIL VIH VIL 18 tCAH COLUMN-2 tWCH tWCS tDH tDS tWCH tCAH COLUMN-3 tWCS tWCH VIL DQ1~DQ16 VOH (OUTPUTS) VOL OE tASC VIH tDS DQ1~DQ16 (INPUTS) tCAH tCAL tASC M5M4V4265CJ,TP-5,-5S:under development DATA VALID-1 tDH DATA VALID-2 Hi-Z tDS tDH DATA VALID-3 tASR ROW ADDRESS MITSUBISHI LSIs M5M4V4265CJ,TP-5,-6,-7,-5S,-6S,-7S EDO (HYPER PAGE) MODE 4194304-BIT (262144-WORD BY 16-BIT) DYNAMIC RAM EDO Mode Byte Early Write Cycle tRAS RAS tRP VIH VIL tHPC tCSH tRSH tCRP LCAS (or UCAS) VIH VIL tRCD UCAS (or LCAS) tCAS tCAS tCP tCAS tCP VIH VIL tCAL tASR A0~A8 VIH VIL tRAH ROW ADDRESS tASC tCAH COLUMN-1 tWCS W tWCH tCAH tASC COLUMN-2 tWCS tWCH tCAH tASC COLUMN-3 tWCS tWCH tDS tDH VIL DQ1~DQ8 VIH (or DQ9~DQ16) VIL (INPUTS) tDH DATA VALID-1 DATA VALID-3 DQ1~DQ8 VOH (or DQ9~DQ16) (OUTPUTS) VOL Hi-Z tDS DQ9~DQ16 VIH (or DQ1~DQ8) VIL (INPUTS) DQ9~DQ16 VOH (or DQ1~DQ8) (OUTPUTS) VOL VIH VIL 19 tCAL VIH tDS OE tCRP M5M4V4265CJ,TP-5,-5S:under development tDH DATA VALID-2 Hi-Z tASR ROW ADDRESS MITSUBISHI LSIs M5M4V4265CJ,TP-5,-6,-7,-5S,-6S,-7S EDO (HYPER PAGE) MODE 4194304-BIT (262144-WORD BY 16-BIT) DYNAMIC RAM EDO Mode Read-Write, Read-Modify-Write Cycle tRAS RAS tRP VIH VIL tCSH tCRP tCAS tRCD tHPRWC tCAS tCP tRWL tCRP VIH LCAS/UCAS VIL tRAD tASR A0~A8 VIH VIL tRAH tASC ROW ADDRESS tASC tCAH tAWD tCWD tRCS VIL tCPWD tDS tDZC VIH Hi-Z VIL tCAC tAA tDH Hi-Z DATA VALID-1 VIH VIL 20 M5M4V4265CJ,TP-5,-5S:under development tDH DATA VALID-2 tCAC tAA tCLZ Hi-Z Hi-Z DATA VALID-1 tRAC tDZO tDS tDZC tCLZ DQ1~DQ16 VOH (OUTPUTS) VOL OE tWP VIH tRWD DQ1~DQ16 (INPUTS) tASR ROW ADDRESS tAWD tCWD tCWL tWP W tCWL COLUMN-2 COLUMN-1 tRCS tCAH tOEA tCPA tODD tOEZ Hi-Z DATA VALID-2 tDZO tOEA tODD tOEH tOEZ MITSUBISHI LSIs M5M4V4265CJ,TP-5,-6,-7,-5S,-6S,-7S EDO (HYPER PAGE) MODE 4194304-BIT (262144-WORD BY 16-BIT) DYNAMIC RAM EDO Mode Byte Read-Write, Read-Modify-Write Cycle tRAS RAS tRP VIH VIL tCSH tRWL tCRP LCAS (or UCAS) VIH VIL tCAS tRCD tCP UCAS (or LCAS) VIH VIL tRAD tASR A0~A8 VIH VIL tRAH tASC ROW ADDRESS tASC tCAH tCAH tCWL tASR ROW ADDRESS COLUMN-2 COLUMN-1 tAWD tCWD tRCS tAWD tCWD tCWL tWP W tCRP tHPRWC tCAS tRCS tWP VIH VIL tRWD tCPWD DQ1~DQ8 VIH (or DQ9~DQ16) VIL (INPUTS) DQ1~DQ8 VOH (or DQ9~DQ16) (OUTPUTS) VOL Hi-Z tDS tDZC DQ9~DQ16 VIH (or DQ1~DQ8) VIL (INPUTS) Hi-Z tDH Hi-Z DATA VALID-1 tCAC tAA OE VIH VIL 21 M5M4V4265CJ,TP-5,-5S:under development DATA VALID-2 tCAC tCLZ Hi-Z Hi-Z DATA VALID-1 tRAC tDZO tDH tAA tCLZ DQ9~DQ16 VOH (or DQ1~DQ8) (OUTPUTS) VOL tDS tDZC tOEA tCPA tODD tOEZ Hi-Z DATA VALID-2 tDZO tOEA tODD tOEH tOEZ MITSUBISHI LSIs M5M4V4265CJ,TP-5,-6,-7,-5S,-6S,-7S EDO (HYPER PAGE) MODE 4194304-BIT (262144-WORD BY 16-BIT) DYNAMIC RAM EDO Mode Mix Cycle (1) tRAS tRP tRWL RAS VIH VIL tHPC tCSH tCRP tRCD tCAS tCP tCAS tCAS tCP tCWL VIH LCAS/UCAS tCRP tHPRWC VIL tRAD tASR A0~A8 VIH VIL tRAH ROW ADDRESS tASC tCAH tASC COLUMN-1 tCAH COLUMN-2 tRCS tASR ROW ADDRESS COLUMN-3 tCPWD tAWD tCWD tCAL VIL tDH tDS VIH VIL tDZC DATA VALID-2 tCAC tAA DQ1~DQ16 VOH (OUTPUTS) VOL DATA VALID-3 tCLZ DATA VALID-3 DATA VALID-1 tRAC tDZO tCPA tOEA tDZO tOEA tOEZ tOEZ VIH tOCH VIL tODD 22 M5M4V4265CJ,TP-5,-5S:under development tDH tCAC tWEZ Hi-Z tDS tAA tCLZ OE tWP VIH tDZC DQ1~DQ16 (INPUTS) tCAH tWCH tWCS tCAL W tASC tODD tOEH MITSUBISHI LSIs M5M4V4265CJ,TP-5,-6,-7,-5S,-6S,-7S EDO (HYPER PAGE) MODE 4194304-BIT (262144-WORD BY 16-BIT) DYNAMIC RAM EDO Mode Mix Cycle (2) RAS VIH VIL VIH LCAS/UCAS VIL tCP tASC A0~A8 VIH tCAS tCAS tASC tCAH COLUMN-1 tASC tCAH COLUMN-2 tCAH COLUMN-3 VIL tCAL tRCH tCAL tWCH tWCS W VIH VIL tHCWD tHAWD tDH tHPWD DQ1~DQ16 (INPUTS) VIH Hi-Z VIL tDZC tDS Hi-Z DATA VALID-2 tCAC tCAC tAA tAA tCPA tCPA tWEZ tCLZ DQ1~DQ16 VOH (OUTPUTS) VOL tHCOD tHAOD tHPOD OE VIH VIL 23 M5M4V4265CJ,TP-5,-5S:under development Hi-Z DATA VALID-1 tOEZ DATA VALID-3 tDZC tODD tOEA MITSUBISHI LSIs M5M4V4265CJ,TP-5,-6,-7,-5S,-6S,-7S EDO (HYPER PAGE) MODE 4194304-BIT (262144-WORD BY 16-BIT) DYNAMIC RAM EDO Mode Read Cycle (Hi-Z control by OE) tRP tRAS RAS VIH VIL tHPC tCSH tCRP tRCD tCP tCAS tRSH tCAS tCP tCRP tCAS VIH LCAS/UCAS VIL tRAD tASR A0~A8 VIH VIL tRAH tCPRH tCAH tASC ROW ADDRESS tASC COLUMN-1 tASC tCAH tASR tCAH ROW ADDRESS COLUMN-3 COLUMN-2 tRAL tRCS tRRH tRCH W VIH VIL tWEZ tDZC DQ1~DQ16 (INPUTS) tRDD tCDD VIH Hi-Z VIL tCAC tAA tCLZ DQ1~DQ16 VOH (OUTPUTS) VOL Hi-Z tRAC tDZO OE VIH tCAC tCAC tAA tAA tDOH DATA VALID-1 DATA VALID-1 tOEZ tCPA tOEA tOCH tOEA tCLZ DATA VALID-2 Hi-Z tREZ tOHR tOFF tOHC DATA VALID-3 tCPA tOEZ tCHOL tOEZ VIL tOEPE 24 M5M4V4265CJ,TP-5,-5S:under development tOEPE tODD MITSUBISHI LSIs M5M4V4265CJ,TP-5,-6,-7,-5S,-6S,-7S EDO (HYPER PAGE) MODE 4194304-BIT (262144-WORD BY 16-BIT) DYNAMIC RAM EDO Mode Read Cycle (Hi-Z control by W) tRAS RAS tRP VIH VIL tCSH tCRP tRSH tHPC tRCD tCAS tCP tCAS tCP tCRP tCAS VIH LCAS/UCAS VIL tRAD tASR A0~A8 VIH VIL tRAH tCAH tASC ROW ADDRESS COLUMN-1 tCAH tCPRH tASC tCAH COLUMN-2 COLUMN-3 tASC tRAL tRCS W tRCH tRCS ROW ADDRESS tRRH tRCH VIH VIL VIH tRDD tCDD Hi-Z VIL DQ1~DQ16 VOH (OUTPUTS) VOL tWEZ tWPE tDZC DQ1~DQ16 (INPUTS) tASR tCAC tCAC tAA tAA tCLZ tDOH Hi-Z DATA VALID-1 tRAC tDZO tAA tWEZ DATA VALID-2 tCPA tOEA tCAC tCLZ Hi-Z tREZ tOHR tOFF tOHC DATA VALID-3 tCPA tOEZ tOCH OE VIH VIL tODD 25 M5M4V4265CJ,TP-5,-5S:under development MITSUBISHI LSIs M5M4V4265CJ,TP-5,-6,-7,-5S,-6S,-7S EDO (HYPER PAGE) MODE 4194304-BIT (262144-WORD BY 16-BIT) DYNAMIC RAM RAS-only Refresh Cycle tRC tRAS RAS tRP VIH VIL tRPC tCRP tCRP VIH LCAS/UCAS VIL tASR A0~A8 VIH VIL W DQ1~DQ16 (INPUTS) ROW ADDRESS ROW ADDRESS VIH VIL VIH VIL DQ1~DQ16 VOH (OUTPUTS) VOL OE tASR tRAH VIH VIL 26 M5M4V4265CJ,TP-5,-5S:under development Hi-Z MITSUBISHI LSIs M5M4V4265CJ,TP-5,-6,-7,-5S,-6S,-7S EDO (HYPER PAGE) MODE 4194304-BIT (262144-WORD BY 16-BIT) DYNAMIC RAM CAS before RAS Refresh Cycle, Extended Refresh Cycle * tRC tRP RAS tRC tRAS tRAS tRP VIH VIL tRPC tCSR tCHR tRPC tCSR tCHR tRPC tCRP VIH LCAS/UCAS VIL tCPN tASR A0~A8 VIH ROW ADDRESS VIL tRRH tRCS tRCH W DQ1~DQ16 (INPUTS) VIH VIL VIH VIL tREZ tOHR tOFF tOHC DQ1~DQ16 VOH (OUTPUTS) VOL Hi-Z tOEZ OE VIH VIL 27 M5M4V4265CJ,TP-5,-5S:under development COLUMN ADDRESS MITSUBISHI LSIs M5M4V4265CJ,TP-5,-6,-7,-5S,-6S,-7S EDO (HYPER PAGE) MODE 4194304-BIT (262144-WORD BY 16-BIT) DYNAMIC RAM Hidden Refresh Cycle (Read) (Note 32) tRC tRAS RAS tRC tRP tRAS tRP VIH VIL tCRP tRCD tRSH tCHR VIH LCAS/UCAS VIL tRAD tASR A0~A8 VIH VIL tRAH tASC ROW ADDRESS tASR tCAH COLUMN ADDRESS ROW ADDRESS tRCS tRAL tRRH VIH W VIL tCDD tDZC tRDD DQ1~DQ16 (INPUTS) VIH Hi-Z VIL tCAC tAA tREZ tOHR tOFF tOHC tCLZ DQ1~DQ16 VOH (OUTPUTS) VOL Hi-Z Hi-Z DATA VALID tRAC tDZO OE tOEA tORH tOEZ tODD VIH VIL Note 32 : Early write, delayed write, read write or read modify write cycle is applicable instead of read cycle. Timing requirements and output state are the same as that of each cycle shown above. 28 M5M4V4265CJ,TP-5,-5S:under development MITSUBISHI LSIs M5M4V4265CJ,TP-5,-6,-7,-5S,-6S,-7S EDO (HYPER PAGE) MODE 4194304-BIT (262144-WORD BY 16-BIT) DYNAMIC RAM Self Refresh Cycle * (Note 30) tRASS tRP RAS tRPS VIH VIL tRPC tRPC tCSR tCHS tCRP VIH LCAS/UCAS VIL tCPN tASR A0~A8 VIH ROW ADDRESS VIL tRRH tRCS tRCH W VIH VIL tRDD tCDD DQ1~DQ16 (INPUTS) VIH Hi-Z VIL tREZ tOHR tOFF tOHC DQ1~DQ16 VOH (OUTPUTS) VOL Hi-Z tOEZ tODD OE VIH VIL 29 M5M4V4265CJ,TP-5,-5S:under development MITSUBISHI LSIs M5M4V4265CJ,TP-5,-6,-7,-5S,-6S,-7S EDO (HYPER PAGE) MODE 4194304-BIT (262144-WORD BY 16-BIT) DYNAMIC RAM Note 30 : Self refresh sequence Two refreshing methods should be used properly depending on the low pulse width (tRASS) of RAS signal during self refresh period. 1. Distributed refresh during Read/Write operation (A) Timing Diagram Read / Write Cycle Self Refresh Cycle tRASS≥100µs tNSD Read / Write Cycle tSND RAS last refresh cycle first refresh cycle Table 2 Read / Write Self Refresh Self Refresh Read / Write CBR distributed refresh tNSD≤250µs tSND≤250µs RAS only distributed refresh tNSD≤16µs tSND≤16µs Read / Write Cycle (B) Definition of distributed refresh tREF tREF / 512 tREF / 512 RAS refresh cycle read/write cycles refresh cycle Definition of CBR distributed refresh (Including extended refresh) The CBR distributed refresh performs more than 512 constant period (250µs max.) CBR cycles within 128 ms. Definition of RAS only distributed refresh All combinations of nine row address signals (A0 ~ A 8) are selected during 512 constant period (16µs max.) RAS only refresh cycles within 8.2 ms. Note: Hidden refresh may be used instead of CBR refresh. RAS/CAS refresh may be used instead of RAS only refresh. 1.1 CBR distributed refresh Switching from read/write operation to self refresh operation. The time interval from the falling edge of RAS signal in the last CBR refresh cycle during read/write operation period to the falling edge of RAS signal at the start of self refresh operation should be set within tNSD (shown in table 2). 30 M5M4V4265CJ,TP-5,-5S:under development refresh cycle read/write cycles Switching from self refresh operation to read/write operation. The time interval from the rising edge of RAS signal at the end of self refresh operation to the falling edge of RAS signal in the first CBR refresh cycle during read/write operation period should be set within tSND (shown in table 2). 1.2 RAS only distributed refresh Switching from read/write operation to self refresh operation. The time interval t NSD from the falling edge of RAS signal in the last RAS only refresh cycle during read/write operation period to the falling edge of RAS signal at the start of self refresh operation should be set within 16µs. Switching from self refresh operation to read/write operation. The time interval tSND from the rising edge of RAS signal at the end of self refresh operation to the falling edge of RAS signal in the first CBR refresh cycle during read/write operation period should be set within 16µs. MITSUBISHI LSIs M5M4V4265CJ,TP-5,-6,-7,-5S,-6S,-7S EDO (HYPER PAGE) MODE 4194304-BIT (262144-WORD BY 16-BIT) DYNAMIC RAM 2. Burst refresh during Read/Write operation (A) Timing diagram Read / Write Self Refresh tRASS≥100µs tNSB Read / Write tSNB RAS first refresh cycles refresh cycles 511 cycles refresh cycles 511 cycles last refresh cycles Table 3 Read / Write Cycle CBR burst refresh Read / Write Self Refresh Self Refresh Read / Write tNSB≤8.2ms tSNB≤8.2ms RAS only burst refresh tNSB+tSNB≤8.2ms (B) Definition of burst refresh 8.2ms RAS refresh cycles 512 cycles read/write cycles Definition of CBR burst refresh The CBR burst refresh performs more than 512 continuous CBR cycles within 8.2 ms. Definition of RAS only burst refresh All combination of nine row address signals (A0~A8) are selected during 512 continuous RAS only refresh cycles within 8.2 ms. 2.1 CBR burst refresh Switching from read/write operation to self refresh operation. The time interval tNSB from the falling edge of RAS signal in the first CBR refresh cycle during read/write operation period to the falling edge of RAS signal at the start of self refresh operation should be set within 8.2 ms. Switching from self refresh operation to read/write operation. The time interval tSNB from the rising edge of RAS signal at the end of self refresh operation to the falling edge of RAS signal in the last CBR refresh cycle during read/write operation period should be set within 8.2 ms. 31 M5M4V4265CJ,TP-5,-5S:under development 2.2 RAS only burst refresh Switching from read/write operation to self refresh operation. The time interval from the falling edge of RAS signal in the first RAS only refresh cycle during read/write operation period to the falling edge of RAS signal at the start of self refresh operation should be set within tNSB (shown in table 3). Switching from self refresh operation to read/write operation. The time interval from the rising edge of RAS signal at the end of self refresh operation to the falling edge of RAS signal in the last RAS only refresh cycle during read/write operation period should be set within tSNB (shown in table 3).