MITSUBISHI M5M44260CTP-7

MITSUBISHI
LSIs
MITSUBISHI
LSIs
M5M44260CJ,TP-5,-6,-7,
M5M44260CJ,TP-5,-6,-7,-5S,-6S,-7S
-5S,-6S,-7S
FAST
PAGE
MODE
4194304-BIT
(262144-WORD
16-BIT)
DYNAMIC
RAM
FAST
PAGE
MODE
4194304-BIT
(262144-WORD
BY BY
16-BIT)
DYNAMIC
RAM
DESCRIPTION
This is a family of 262144-word by 16-bit dynamic RAMs,
fabricated with the high performance CMOS process, and is ideal
for memory systems where high speed, low power dissipation, and
low costs are essential.
The use of double-layer metalization process technology and a
single-transistor dynamic storage stacked capacitor cell provide
high circuit density at reduced costs. Multiplexed address inputs
permit both a reduction in pins and an increase in system
densities. Self or extended refresh current is small enough for
battery back-up application.
This device has 2CAS and 1W terminals with a refresh cycle of
512 cycles every 8.2ms.
FEATURES
RAS
CAS
access access
time
time
(max.ns) (max.ns)
Type name
M5M44260CXX-5,-5S
M5M44260CXX-6,-6S
M5M44260CXX-7,-7S
50
60
70
Address
OE
access
access
time
time
(max.ns) (max.ns)
13
15
20
25
30
35
13
15
20
Power
Cycle
dissipatime
tion
(min.ns) (typ.mW)
90
110
130
625
550
475
XX=J,TP
Standard 40pin SOJ, 44 pin TSOP (II)
Single 5V±10% supply
Low stand-by power dissipation
CMOS Input level
5.5mW (Max)
CMOS Input level
550µW (Max) *
Operating power dissipation
M5M44260Cxx-5,-5S
688mW (Max)
M5M44260Cxx-6,-6S
605mW (Max)
M5M44260Cxx-7,-7S
523mW (Max)
Self refresh capability *
Self refresh current
150µA (Max)
Extended refresh capability
Extended refresh current
150µA (Max)
Fast-page mode (512-column random access), Read-modify-write,
RAS-only refresh, CAS before RAS refresh, Hidden refresh
capabilities.
Early-write mode, LCAS / UCAS and OE to control output buffer
impedance
512 refresh cycles every 8.2ms (A0~A8)
512 refresh cycles every 128ms (A0~A8) *
Byte or word control for Read/Write operation (2CAS, 1W type)
* : Applicable to self refresh version (M5M44260CJ,TP-5S,-6S,-7S
: option) only
PIN CONFIGURATION (TOP VIEW)
1
40
VSS(0V)
DQ1
2
39
DQ16
DQ2
3
38
DQ15
DQ3
4
37
DQ14
DQ4
5
36
DQ13
(5V)VCC
6
35
VSS(0V)
DQ5
7
34
DQ12
DQ6
8
33
DQ11
DQ7
9
32
DQ10
DQ8 10
31
DQ9
NC 11
30
NC
NC 12
29
LCAS
W 13
28
UCAS
RAS 14
27
OE
NC 15
26
A8
A0 16
25
A7
A1 17
24
A6
A2 18
23
A5
A3 19
22
A4
(5V)VCC 20
21
VSS(0V)
(5V)VCC
Outline 40P0K (400mil SOJ)
(5V)VCC
1
44
VSS(0V)
DQ1
2
43
DQ16
DQ2
3
42
DQ15
DQ3
4
41
DQ14
DQ4
5
40
DQ13
(5V)VCC
6
39
VSS(0V)
DQ5
7
38
DQ12
DQ6
8
37
DQ11
DQ7
9
36
DQ10
DQ8 10
35
DQ9
NC 13
32
NC
NC 14
31
LCAS
15
30
UCAS
RAS 16
29
OE
NC 17
28
A8
A0 18
27
A7
A1 19
26
A6
A2 20
25
A5
A3 21
24
A4
(5V)VCC 22
23
VSS(0V)
APPLICATION
Microcomputer memory, Refresh memory for CRT
PIN DESCRIPTION
W
Pin name
A0~A8
DQ1~DQ16
RAS
LCAS
UCAS
1
Function
Address inputs
Data inputs / outputs
Row address strobe input
Lower byte control
column address strobe input
Upper byte control
column address strobe input
W
Write control input
OE
Output enable input
VCC
VSS
Power supply (+5V)
Ground (0V)
M5M44260CJ,TP-5,-5S : Under development
Outline 44P3W-R (400mil TSOP Nomal Bend)
NC: NO CONNECTION
MITSUBISHI LSIs
M5M44260CJ,TP-5,-6,-7,-5S,-6S,-7S
FAST PAGE MODE 4194304-BIT (262144-WORD BY 16-BIT) DYNAMIC RAM
FUNCTION
In addition to normal read,write and read-modify-write operations
the M5M44260CJ, TP provides a number of other functions, e.g.,
fast page mode, RAS-only refresh and delayed-write. The input
conditions for each are shown in Table 1.
Table 1 Input conditions for each mode
Input/Output
Inputs
Operation
Lower byte read
Upper byte read
Word read
Lower byte write
Upper byte write
Word write
RAS only refresh
Hidden refresh
CAS before RAS (Extended *) refresh
Self refresh *
Stand-by
RAS
LCAS
UCAS
ACT
ACT
ACT
ACT
ACT
ACT
ACT
ACT
ACT
ACT
NAC
ACT
NAC
ACT
ACT
NAC
ACT
NAC
ACT
ACT
ACT
DNC
NAC
ACT
ACT
NAC
ACT
ACT
NAC
ACT
ACT
ACT
DNC
W
NAC
NAC
NAC
ACT
ACT
ACT
DNC
DNC
DNC
DNC
DNC
OE
ACT
ACT
ACT
NAC
NAC
NAC
DNC
ACT
DNC
DNC
DNC
Row
address
Column
address
DQ1~
DQ8
APD
APD
APD
APD
APD
APD
APD
DNC
DNC
DNC
DNC
APD
APD
APD
APD
APD
APD
DNC
DNC
DNC
DNC
DNC
DOUT
OPN
DOUT
DIN
DNC
DIN
OPN
DOUT
OPN
OPN
OPN
Refresh Remark
DQ9~
DQ16
YES
YES
YES
YES
YES
YES
YES
YES
YES
YES
No
OPN
DOUT
DOUT
DNC
DIN
DIN
OPN
DOUT
OPN
OPN
OPN
Fast
page
mode
identical
Note : ACT : active, NAC : nonactive, DNC : don' t care, OPN : open
BLOCK DIAGRAM
VCC (5V)
ROW ADDRESS
STROBE INPUT RAS
LOWER BYTE CONTROL
COLUMN ADDRESS LCAS
STROBE INPUT
CLOCK GENERATOR
CIRCUIT
LOWER
UPPER BYTE CONTROL UCAS
COLUMN ADDRESS
STROBE INPUT
WRITE CONTROL
INPUT
VSS (0V)
(8)LOWER
DATA IN
BUFFER
UPPER
DQ1
DQ2
LOWER DATA
INPUTS /
OUTPUTS
W
DQ8
(8)LOWER
DATA OUT
BUFFER
VCC (5V)
VSS (0V)
A0~A8
COLUMN DECODER
ADDRESS INPUTS
A0
A1
A2
A3
A4
A5
A6
A7
A8
(8)UPPER
DATA IN
BUFFER
SENSE REFRESH
AMPLIFIER & I /O CONTROL
ROW &
COLUMN
ADDRESS
BUFFER
ROW
A 0~
A8 DECODER
MEMORY CELL
(4194304 BITS)
(8)UPPER
DATA OUT
BUFFER
DQ9
DQ10
DQ16
UPPER DATA
INPUTS /
OUTPUTS
VCC (5V)
VSS (0V)
OE
2
M5M44260CJ,TP-5,-5S : Under development
OUTPUT ENABLE
INPUT
MITSUBISHI LSIs
M5M44260CJ,TP-5,-6,-7,-5S,-6S,-7S
FAST PAGE MODE 4194304-BIT (262144-WORD BY 16-BIT) DYNAMIC RAM
ABSOLUTE MAXIMUM RATINGS
Symbol
VCC
VI
VO
IO
Pd
Topr
Tstg
Ratings
-1~7
-1~7
-1~7
50
1000
0~70
-65~150
Conditions
Parameter
Supply voltage
Input voltage
Output voltage
Output current
Power dissipation
Operating temperature
Storage temperature
With respect to VSS
Ta=25˚C
RECOMMENDED OPERATING CONDITIONS (Ta=0~70˚C, unless otherwise noted)
Symbol
VCC
VSS
VIH
VIL
Parameter
Min
4.5
0
2.4
-0.5 * *
Supply voltage
Supply voltage
High-level input voltage, all inputs
Low-level input voltage, all inputs
Limits
Nom
5.0
0
Max
5.5
0
6.0
0.8
Unit
V
V
V
mA
mW
˚C
˚C
(Note 1)
Unit
V
V
V
V
Note 1 : All voltage values are with respect to VSS.
* * : VIL(min) is -2.0V when pulse width is less than 25ns. (Pulse width is with respect to Vss.)
ELECTRICAL CHARACTERISTICS (Ta=0~70˚C , VCC=5V±10%, VSS=0V, unless otherwise noted)
Symbol
Parameter
VOH
VOL
IOZ
II
High-level output voltage
Low-level output voltage
Off-state output current
Input current
ICC1(AV)
Average supply current
from Vcc, operating
Test conditions
IOH=-5mA
IOL=4.2mA
Q floating 0V ≤ VOUT ≤ 5.5V
0V ≤ VIN ≤ +6.0V, Other inputs pins=0V
M5M44260C-5,-5S
M5M44260C-6,-6S
(Note 3,4,5) M5M44260C-7,-7S
(Note 2)
Min
2.4
0
-10
-10
Limits
Typ
RAS, CAS cycling
tRC=tWC=min.
output open
RAS= CAS =VIH, output open
ICC2
ICC3(AV)
ICC4(AV)
ICC6(AV)
ICC8(AV) *
ICC9(AV) *
3
Supply current from VCC, stand-by
(Note 6)
RAS= CAS ≥ VCC -0.5V
output open
Max
VCC
0.4
10
10
Unit
V
V
µA
µA
125
110
mA
95
2
1.0
mA
0.1 *
125
Average supply current M5M44260C-5,-5S
from Vcc, RAS only
M5M44260C-6,-6S
refresh mode
(Note 3,5) M5M44260C-7,-7S
RAS cycling, CAS=VIH
tRC=min.
output open
Average supply current M5M44260C-5,-5S
from Vcc
M5M44260C-6,-6S
Fast page mode
(Note 3,4,5) M5M44260C-7,-7S
RAS=VIL, CAS cycling
tPC=min.
output open
Average supply current M5M44260C-5,-5S
from Vcc
CAS before RAS refresh M5M44260C-6,-6S
(Note 3,5) M5M44260C-7,-7S
mode
CAS before RAS refresh cycling
tRC=min.
output open
100
Average supply current
from VCC
Extended-refresh mode
150
µA
(Note 6)
RAS cycling CAS ≤ 0.2V or CAS
before RAS refresh cycling
RAS ≤ 0.2V or ≥ VCC-0.2V
CAS ≤ 0.2V or ≥ VCC-0.2V
W ≤ 0.2V or ≥ VCC-0.2V
OE ≤ 0.2V or ≥ VCC-0.2V
A0~A8 ≤ 0.2V or ≥ VCC-0.2V,
DQ=open
tRC=250µs, tRAS=tRAS min~1µs
Average supply current from VCC
Self-refresh mode
(Note 6)
RAS=CAS ≤ 0.2V
output open
150
µA
Note 2: Current flowing into an IC is positive, out is negative.
3: ICC1 (AV), ICC3 (AV), ICC4 (AV), and ICC6 (AV) are dependent on cycle rate. Maximum current is measured at the fastest cycle rate.
4: ICC1 (AV) and ICC4 (AV) are dependent on output loading. Specified values are obtained with the output open.
5: Column Address can be changed once or less while RAS=VIL and CAS=VIH.
M5M44260CJ,TP-5,-5S : Under development
110
mA
95
125
110
mA
95
115
mA
85
MITSUBISHI LSIs
M5M44260CJ,TP-5,-6,-7,-5S,-6S,-7S
FAST PAGE MODE 4194304-BIT (262144-WORD BY 16-BIT) DYNAMIC RAM
CAPACITANCE (Ta=0~70˚C , VCC=5V±10%, VSS=0V, unless otherwise noted)
Symbol
CI (A)
CI (CLK)
CI / O
Parameter
Input capacitance, address inputs
Input capacitance, clock inputs
Input/Output capacitance, data ports
Test conditions
Min
Limits
Typ
VI=VSS
f=1MHz
VI=25mVrms
Max
5
7
7
Unit
pF
pF
pF
SWITCHING CHARACTERISTICS (Ta=0~70˚C, VCC=5V±10%, Vss=0V, unless otherwise noted, see notes 6,13,14)
Limits
Symbol
M5M44260C-5,-5S M5M44260C-6,-6S M5M44260C-7,-7S
Parameter
Min
tCAC
tRAC
tAA
tCPA
tOEA
tCLZ
tOFF
tOEZ
Access time from CAS
Access time from RAS
Columu address access time
Access time from CAS precharge
Access time from OE
Output low impedance time from CAS low
Output disable time after CAS high
Output disable time after OE high
(Note 7,8)
(Note 7,9)
(Note 7,10)
(Note 7,11)
(Note 7)
(Note 7)
(Note 12)
(Note 12)
Max
13
50
25
30
13
5
Min
Max
15
60
30
35
15
5
13
13
Min
Max
20
70
35
40
20
5
15
15
20
20
Unit
ns
ns
ns
ns
ns
ns
ns
ns
Note 6: An initial pause of 500 µs is required after power-up followed by a minimum of eight initialization cycles (RAS-only refresh or CAS before RAS refresh
cycles).
Note the RAS may be cycled during the initial pause. And 8 initialization cycles are required after prolonged periods (greater than 8.2ms) of RAS
inactivity before proper device operation is achieved.
7: Measured with a load circuit equivalent to 2TTL loads and 100pF.
8: Assumes that tRCD ≥ tRCD(max) and tASC ≥ tASC(max).
9: Assumes that tRCD ≤ tRCD(max) and tRAD ≤ tRAD(max). If tRCD or tRAD is greater than the maximum recommended value shown in this table, tRAC
will increase by amount that tRCD exceeds the value shown.
10: Assumes that tRAD ≥ tRAD(max) and tASC ≤ tASC(max).
11: Assumes that tCP ≤ tCP(max) and tASC ≥ tASC(max).
12: tOFF(max) and tOEZ (max) defines the time at which the output achieves the high impedance state (IOUT ≤ ±10 µA ) and is not reference to VOH(min)
or VOL(max).
4
M5M44260CJ,TP-5,-5S : Under development
MITSUBISHI LSIs
M5M44260CJ,TP-5,-6,-7,-5S,-6S,-7S
FAST PAGE MODE 4194304-BIT (262144-WORD BY 16-BIT) DYNAMIC RAM
TIMING REQUIREMENTS (For Read, Write, Read-Modify-Write, Refresh and Fast-Page Mode Cycles)
(Ta=0~70˚C, VCC=5V±10%, VSS=0V, unless otherwise noted, see notes 6,13,14)
Limits
Symbol
Parameter
M5M44260C-5,-5S M5M44260C-6,-6S M5M44260C-7,-7S
Min
tREF
tREF
tRP
tRCD
tCRP
tRPC
tCPN
tRAD
tASR
tASC
tRAH
tCAH
tDZC
tDZO
tCDD
tODD
tT
Refresh cycle time
Refresh cycle time *
RAS high pulse width
Delay time, RAS low to CAS low
Delay time, CAS high to RAS low
Delay time, RAS high to CAS low
CAS high pulse width
Column address delay time from RAS low
Row address setup time before RAS low
Column address setup time before CAS low
Row address hold time after RAS low
Column address hold time after CAS low
Delay time, data to CAS low
Delay time, data to OE low
Delay time, CAS high to data
Delay time, OE high to data
Transition time
(Note 15)
(Note 16)
(Note 17)
(Note 18)
(Note 18)
(Note 19)
(Note 19)
(Note 20)
30
18
5
0
10
13
0
0
8
13
0
0
13
13
1
Max
8.2
128
37
25
7
50
Min
Max
8.2
128
40
20
5
0
10
15
0
0
10
15
0
0
15
15
1
45
30
10
50
Min
50
20
5
0
10
15
0
0
10
15
0
0
20
20
1
Max
8.2
128
50
35
10
50
Unit
ms
ms
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
Note 13: The timing requirements are assumed tT =5ns.
14: VIH(min) and VIL(max) are reference levels for measuring timing of input signals.
15: tRCD(max) is specified as a reference point only. If tRCD is less than tRCD(max), access time is tRAC. If tRCD is greater than tRCD(max), access time is
controlled exclusively by tCAC or tAA.
16: tRAD(max) is specified as a reference point only. If tRAD ≥ tRAD(max) and tASC ≤ tASC(max), access time is controlled exclusively by tAA.
17: tASC(max) is specified as a reference point only. If tRCD ≥ tRCD(max) and tASC ≥ tASC(max), access time is controlled exclusively by tCAC.
18: Either tDZC or tDZO must be satisfied.
19: Either tCDD or tODD must be satisfied.
20: tT is measured between VIH(min) and VIL(max).
Read and Refresh Cycles
Limits
Symbol
Read cycle time
RAS low pulse width
CAS low pulse width
CAS hold time after RAS low
RAS hold time after CAS low
Read setup time before CAS low
Read hold time after CAS high
Read hold time after RAS high
Column address to RAS hold time
CAS hold time after OE low
RAS hold time after OE low
Note 21: Either tRCH or tRRH must be satisfied for a read cycle.
tRC
tRAS
tCAS
tCSH
tRSH
tRCS
tRCH
tRRH
tRAL
tOCH
tORH
5
M5M44260C-5,-5S M5M44260C-6,-6S M5M44260C-7,-7S
Parameter
M5M44260CJ,TP-5,-5S : Under development
(Note 21)
(Note 21)
Min
90
50
13
50
13
0
0
0
25
13
13
Max
10000
10000
Min
110
60
15
60
15
0
0
0
30
15
15
Max
10000
10000
Min
130
70
20
70
20
0
0
0
35
20
20
Unit
Max
10000
10000
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
MITSUBISHI LSIs
M5M44260CJ,TP-5,-6,-7,-5S,-6S,-7S
FAST PAGE MODE 4194304-BIT (262144-WORD BY 16-BIT) DYNAMIC RAM
Write Cycle (Early Write and Delayed Write)
Limits
Symbol
tWC
tRAS
tCAS
tCSH
tRSH
tWCS
tWCH
tCWL
tRWL
tWP
tDS
tDH
tOEH
Parameter
Write cycle time
RAS low pulse width
CAS low pulse width
CAS hold time after RAS low
RAS hold time after CAS low
Write setup time before CAS low
Write hold time after CAS low
CAS hold time after W low
RAS hold time after W low
Write pulse width
Data setup time before CAS low or W low
Data hold time after CAS low or W low
OE hold time after W low
M5M44260C-5,-5S M5M44260C-6,-6S M5M44260C-7,-7S
(Note 23)
Min
90
50
13
50
13
0
8
13
13
8
0
8
13
Max
10000
10000
Min
110
60
15
60
15
0
10
15
15
10
0
10
15
Max
10000
10000
Min
130
70
20
70
20
0
15
20
20
15
0
15
20
Unit
Max
10000
10000
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
Read-Write and Read-Modify-Write Cycles
Limits
Symbol
tRWC
tRAS
tCAS
tCSH
tRSH
tRCS
tCWD
tRWD
tAWD
tCWL
tRWL
tWP
tDS
tDH
tOEH
M5M44260C-5,-5S M5M44260C-6,-6S M5M44260C-7,-7S
Parameter
Read write/read modify write cycle time
RAS low pulse width
CAS low pulse width
CAS hold time after RAS low
RAS hold time after CAS low
Read setup time before CAS low
Delay time, CAS low to W low
Delay time, RAS low to W low
Delay time, address to W low
CAS hold time after W low
RAS hold time after W low
Write pulse width
Data setup time before CAS low or W low
Data hold time after CAS low or W low
OE hold time after W low
(Note 22)
(Note 23)
(Note 23)
(Note 23)
Min
126
86
49
86
49
0
31
68
43
13
13
8
0
8
13
Max
10000
10000
Min
150
100
55
100
55
0
35
80
50
15
15
10
0
10
15
Max
10000
10000
Min
180
120
70
120
70
0
45
95
60
20
20
15
0
15
20
Unit
Max
10000
10000
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
Note 22: tRWC is specified as tRWC(min)=tRAC(max)+tODD(min)+tRWL(min)+tRP(min)+4tT.
23: tWCS, tCWD, tRWD and tAWD and tCPWD are specified as reference points only. If tWCS ≥ tWCS(min) the cycle is an early write cycle and the DQ pins
will remain high impedance throughout the entire cycle. If tCWD ≥ tCWD(min), tRWD ≥ tRWD(min), tAWD ≥ tAWD(min) and tCPWD ≥ tCPWD(min)
(for fast page mode cycle only), the cycle is a read-modify-write cycle and the DQ will contain the data read from the selected address.
If neither of the above condition (delayed write) of the DQ (at access time and until CAS or OE goes back to VIH) is indeterminate.
6
M5M44260CJ,TP-5,-5S : Under development
MITSUBISHI LSIs
M5M44260CJ,TP-5,-6,-7,-5S,-6S,-7S
FAST PAGE MODE 4194304-BIT (262144-WORD BY 16-BIT) DYNAMIC RAM
Fast-Page Mode Cycle (Read, Early Write, Read -Write, Read-Modify-Write Cycle)
(Note 24)
Limits
Symbol
tPC
tPRWC
tRAS
tCP
tCPRH
tCPWD
M5M44260C-5,-5S M5M44260C-6,-6S M5M44260C-7,-7S
Parameter
Fast page mode read/write cycle time
Fast page mode read write/read modify write cycle time
RAS low pulse width for read or write cycle
(Note 25)
(Note 26)
CAS high pulse width
RAS hold time after CAS precharge
Delay time, CAS precharge to W low
(Note 23)
Min
35
71
85
8
30
48
Max
100000
12
Min
40
80
100
10
35
55
Max
100000
15
Min
45
95
115
10
40
65
Unit
Max
100000
15
ns
ns
ns
ns
ns
ns
Note 24: All previously specified timing requirements and switching characteristics are applicable to their respective fast page mode cycle.
25: tRAS(min) is specified as two cycles of CAS input are performed.
26: tCP(max) is specified as a reference point only.
CAS before RAS Refresh Cycle, Extended Refresh Cycle *
(Note 27)
Limits
Symbol
tCSR
tCHR
tCAS
Parameter
CAS setup time before RAS low
CAS hold time after RAS low
CAS low pulse width
M5M44260C-5,-5S M5M44260C-6,-6S M5M44260C-7,-7S
Min
5
10
20
Max
Min
5
10
20
Max
Min
5
15
25
Unit
Max
ns
ns
ns
Note 27: Eight or more CAS before RAS cycles instead of eight RAS cycles are necessary for proper operation of CAS before RAS refresh mode.
Self Refresh Cycle *
(Note 28)
Limits
Symbol
tRASS
tRPS
tCHS
Parameter
CBR self refresh RAS low pulse width
CBR self refresh RAS high precharge time
CBR self refresh CAS hold time
7
M5M44260CJ,TP-5,-5S : Under development
M5M44260C-5,-5S M5M44260C-6,-6S M5M44260C-7,-7S
Min
100
90
-50
Max
Min
100
110
-50
Max
Min
100
130
-50
Unit
Max
µs
ns
ns
MITSUBISHI LSIs
M5M44260CJ,TP-5,-6,-7,-5S,-6S,-7S
FAST PAGE MODE 4194304-BIT (262144-WORD BY 16-BIT) DYNAMIC RAM
Timing Diagrams
Read Cycle
(Note 29)
tRC
tRAS
RAS
tRP
VIH
VIL
tCSH
tCRP
tRPC
tRSH
tCAS
tRCD
tCRP
VIH
LCAS/UCAS
VIL
tRAD
tASR
A0~A8
VIH
VIL
tRAL
tRAH
tASC
ROW
ADDRESS
tASR
tCAH
ROW
ADDRESS
COLUMN
ADDRESS
tRRH
tRCH
tRCS
W
VIH
VIL
tCDD
tDZC
DQ1~DQ16
(INPUTS)
VIH
Hi-Z
VIL
tCAC
tAA
tOFF
tCLZ
DQ1~DQ16 VOH
(OUTPUTS) VOL
Hi-Z
Hi-Z
DATA VALID
tRAC
tDZO
tOEZ
tOEA
tODD
tOCH
OE
VIH
VIL
tORH
Note 29
Indicates the don't care input.
VIH(min) ≤ VIN ≤ VIH(max) or VIL(min) ≤ VIN ≤ VIL(max)
Indicates the invalid output.
8
M5M44260CJ,TP-5,-5S : Under development
MITSUBISHI LSIs
M5M44260CJ,TP-5,-6,-7,-5S,-6S,-7S
FAST PAGE MODE 4194304-BIT (262144-WORD BY 16-BIT) DYNAMIC RAM
Byte Read Cycle
tRC
tRAS
RAS
tRP
VIH
VIL
tCSH
tCRP
tRCD
tRSH
tRPC
tCAS
UCAS
(or LCAS)
tCRP
VIH
VIL
tCPN
LCAS
(or UCAS)
VIH
VIL
tRAD
tASR
A0~A8
VIH
VIL
tRAH
tRAL
tASC
ROW
ADDRESS
tASR
tCAH
COLUMN
ADDRESS
ROW
ADDRESS
tRRH
tRCH
tRCS
W
VIH
VIL
DQ1~DQ8
VIH
(or DQ9~DQ16)
VIL
(INPUTS)
DQ1~DQ8
VOH
(or DQ9~DQ16)
(OUTPUTS) VOL
Hi-Z
tCDD
tDZC
DQ9~DQ16 VIH
(or DQ1~DQ8)
VIL
(INPUTS)
Hi-Z
tCAC
tOFF
tAA
tCLZ
DQ9~DQ16 VOH
(or DQ1~DQ8)
(OUTPUTS) VOL
Hi-Z
tRAC
tOEZ
tDZO
tOEA
tODD
tOCH
OE
VIH
VIL
tORH
9
M5M44260CJ,TP-5,-5S : Under development
Hi-Z
DATA VALID
MITSUBISHI LSIs
M5M44260CJ,TP-5,-6,-7,-5S,-6S,-7S
FAST PAGE MODE 4194304-BIT (262144-WORD BY 16-BIT) DYNAMIC RAM
Write Cycle (Early write)
tWC
tRP
tRAS
RAS
VIH
tRPC
VIL
tCSH
tCRP
tRSH
tRCD
tCAS
tCRP
tCPN
VIH
LCAS/UCAS
VIL
tASR
A0~A8
VIH
VIL
W
DQ1~DQ16
(INPUTS)
tRAH
ROW
ADDRESS
tASR
tCAH
COLUMN
ADDRESS
ROW
ADDRESS
tWCS
tWCH
tDS
tDH
VIH
VIL
VIH
VIL
DQ1~DQ16 VOH
(OUTPUTS) VOL
OE
tASC
VIH
VIL
10 M5M44260CJ,TP-5,-5S : Under development
DATA VALID
Hi-Z
MITSUBISHI LSIs
M5M44260CJ,TP-5,-6,-7,-5S,-6S,-7S
FAST PAGE MODE 4194304-BIT (262144-WORD BY 16-BIT) DYNAMIC RAM
Byte Write Cycle (Early write)
tWC
tRP
tRAS
RAS
VIH
VIL
tCSH
tCRP
tRPC
tRSH
tRCD
tCRP
tCAS
UCAS
(or LCAS)
VIH
VIL
tCPN
LCAS
(or UCAS)
VIH
VIL
tASR
A0~A8
VIH
VIL
tRAH
tASC
COLUMN
ADDRESS
ROW
ADDRESS
tWCS
W
tASR
tCAH
tWCH
VIH
VIL
DQ1~DQ8
VIH
(or DQ9~DQ16)
VIL
(INPUTS)
DQ1~DQ8
VOH
(or DQ9~DQ16)
(OUTPUTS) VOL
Hi-Z
tDS
DQ9~DQ16 VIH
(or DQ1~DQ8)
VIL
(INPUTS)
DQ9~DQ16 VOH
(or DQ1~DQ8)
(OUTPUTS) VOL
OE
VIH
VIL
11 M5M44260CJ,TP-5,-5S : Under development
tDH
DATA VALID
Hi-Z
ROW
ADDRESS
MITSUBISHI LSIs
M5M44260CJ,TP-5,-6,-7,-5S,-6S,-7S
FAST PAGE MODE 4194304-BIT (262144-WORD BY 16-BIT) DYNAMIC RAM
Write Cycle (Delayed write)
tWC
tRP
tRAS
RAS
VIH
VIL
tRPC
tCSH
tRSH
tRCD
tCRP
tCPN
tCAS
tCRP
VIH
LCAS/UCAS
VIL
tASR
A0~A8
VIH
VIL
tRAH
tCAH
tASC
tASR
ROW
ADDRESS
COLUMN
ADDRESS
ROW
ADDRESS
tCWL
tRWL
tRCS
W
tWP
VIH
VIL
tWCH
tDS
tDZC
DQ1~DQ16
(INPUTS)
VIH
Hi-Z
tDH
DATA
VALID
VIL
tCLZ
DQ1~DQ16 VOH
(OUTPUTS) VOL
Hi-Z
Hi-Z
tDZO
tOEH
tOEZ
tODD
OE
VIH
VIL
12 M5M44260CJ,TP-5,-5S : Under development
MITSUBISHI LSIs
M5M44260CJ,TP-5,-6,-7,-5S,-6S,-7S
FAST PAGE MODE 4194304-BIT (262144-WORD BY 16-BIT) DYNAMIC RAM
Byte Write Cycle (Delayed write)
tWC
tRAS
RAS
tRP
VIH
VIL
tCSH
tCRP
tRPC
tRCD
tRSH
tCRP
tCAS
UCAS
(or LCAS)
VIH
VIL
tCPN
LCAS
(or UCAS)
VIH
VIL
tASR
A0~A8
VIH
VIL
tRAH
tCAH
tASC
ROW
ADDRESS
tASR
COLUMN
ADDRESS
ROW
ADDRESS
tCWL
tRWL
tWP
tRCS
W
VIH
VIL
DQ1~DQ8
VIH
(or DQ9~DQ16)
VIL
(INPUTS)
DQ1~DQ8
VOH
(or DQ9~DQ16)
(OUTPUTS) VOL
Hi-Z
tWCH
tDZC
tDS
DQ9~DQ16 VIH
(or DQ1~DQ8)
VIL
(INPUTS)
Hi-Z
tDH
DATA
VALID
tCLZ
DQ9~DQ16 VOH
(or DQ1~DQ8)
(OUTPUTS) VOL
Hi-Z
Hi-Z
tDZO
tOEH
tOEZ
tODD
OE
VIH
VIL
13 M5M44260CJ,TP-5,-5S : Under development
MITSUBISHI LSIs
M5M44260CJ,TP-5,-6,-7,-5S,-6S,-7S
FAST PAGE MODE 4194304-BIT (262144-WORD BY 16-BIT) DYNAMIC RAM
Read-Write, Read-Modify-Write Cycle
tRWC
tRAS
RAS
tRP
VIH
VIL
tRPC
tCSH
tCRP
tRSH
tRCD
tCRP
tCAS
VIH
LCAS/UCAS
VIL
tRAD
tASR
A0~A8
VIH
VIL
tRAH
ROW
ADDRESS
ROW
ADDRESS
COLUMN
ADDRESS
tAWD
tCWD
tRWD
tRCS
W
tASR
tCAH
tASC
tCWL
tRWL
tWP
VIH
VIL
tDZC
DQ1~DQ16
(INPUTS)
tDH
tDS
VIH
Hi-Z
VIL
tCAC
DATA VALID
tAA
tCLZ
DQ1~DQ16 VOH
(OUTPUTS) VOL
Hi-Z
tRAC
tDZO
OE
VIH
VIL
14
M5M44260CJ,TP-5,-5S : Under development
Hi-Z
DATA
VALID
tODD
tOEA
tOEZ
tOEH
MITSUBISHI LSIs
M5M44260CJ,TP-5,-6,-7,-5S,-6S,-7S
FAST PAGE MODE 4194304-BIT (262144-WORD BY 16-BIT) DYNAMIC RAM
Byte Read-Write, Read-Modify-Write Cycle
tRWC
tRP
tRAS
RAS
VIH
VIL
tCSH
tRPC
tRSH
tRCD
tCRP
UCAS
(or LCAS)
tCRP
tCAS
VIH
VIL
tCPN
LCAS
(or UCAS)
VIH
VIL
tRAD
tASR
A0~A8
VIH
VIL
tRAH
tCAH
tASC
ROW
ADDRESS
COLUMN
ADDRESS
ROW
ADDRESS
tAWD
tCWD
tRWD
tRCS
W
tASR
tCWL
tRWL
tWP
VIH
VIL
DQ1~DQ8
VIH
(or DQ9~DQ16)
VIL
(INPUTS)
DQ1~DQ8
VOH
(or DQ9~DQ16)
(OUTPUTS) VOL
Hi-Z
tDH
tDS
tDZC
DQ9~DQ16 VIH
(or DQ1~DQ8)
VIL
(INPUTS)
Hi-Z
DATA VALID
tCAC
tAA
tCLZ
DQ9~DQ16 VOH
(or DQ1~DQ8)
(OUTPUTS) VOL
Hi-Z
tRAC
tODD
tDZO
OE
VIH
VIL
15
M5M44260CJ,TP-5,-5S : Under development
Hi-Z
DATA
VALID
tOEA
tOEZ
tOEH
MITSUBISHI LSIs
M5M44260CJ,TP-5,-6,-7,-5S,-6S,-7S
FAST PAGE MODE 4194304-BIT (262144-WORD BY 16-BIT) DYNAMIC RAM
RAS-only Refresh Cycle
tRC
tRAS
RAS
tRP
VIH
VIL
tRPC
tCRP
tCRP
VIH
LCAS/UCAS
VIL
tASR
A0~A8
VIH
VIL
W
DQ1~DQ16
(INPUTS)
VIH
VIL
VIH
VIL
VIH
VIL
16
ROW
ADDRESS
ROW
ADDRESS
DQ1~DQ16 VOH
(OUTPUTS) VOL
OE
tASR
tRAH
M5M44260CJ,TP-5,-5S : Under development
Hi-Z
MITSUBISHI LSIs
M5M44260CJ,TP-5,-6,-7,-5S,-6S,-7S
FAST PAGE MODE 4194304-BIT (262144-WORD BY 16-BIT) DYNAMIC RAM
CAS before RAS Refresh Cycle, Extended Refresh Cycle *
tRC
tRP
RAS
tRC
tRAS
tRAS
tRP
VIH
VIL
tCSR
tRPC
tCHR
tRPC
tCSR
tCHR
tRPC
tCRP
VIH
LCAS/UCAS
VIL
tCPN
tASR
A0~A8
VIH
ROW
ADDRESS
VIL
tRCS
tRCH
W
VIH
VIL
tCDD
DQ1~DQ16
(INPUTS)
VIH
Hi-Z
VIL
tOFF
DQ1~DQ16 VOH
(OUTPUTS) VOL
Hi-Z
tOEZ
tODD
OE
VIH
VIL
17 M5M44260CJ,TP-5,-5S : Under development
COLUMN
ADDRESS
MITSUBISHI LSIs
M5M44260CJ,TP-5,-6,-7,-5S,-6S,-7S
FAST PAGE MODE 4194304-BIT (262144-WORD BY 16-BIT) DYNAMIC RAM
Hidden Refresh Cycle (Read)
(Note 30)
tRC
tRC
tRAS
RAS
tRP
tRAS
tRP
VIH
VIL
tCRP
tRCD
tRSH
tCHR
VIH
LCAS/UCAS
VIL
tRAD
tASR
A0~A8
VIH
VIL
tRAH
tASC
ROW
ADDRESS
tASR
tCAH
COLUMN
ADDRESS
ROW
ADDRESS
tRCS
tRAL
tRRH
VIH
W
VIL
tDZC
DQ1~DQ16
(INPUTS)
tCDD
VIH
Hi-Z
VIL
tCAC
tAA
tOFF
tCLZ
DQ1~DQ16 VOH
(OUTPUTS) VOL
Hi-Z
Hi-Z
DATA VALID
tRAC
tDZO
OE
tOEA
tORH
tOEZ
tODD
VIH
VIL
Note 30: Early write, delayed write, read write or read modify write cycle is applicable instead of read cycle.
Timing requirements and output state are the same as that of each cycle described above.
18 M5M44260CJ,TP-5,-5S : Under development
MITSUBISHI LSIs
M5M44260CJ,TP-5,-6,-7,-5S,-6S,-7S
FAST PAGE MODE 4194304-BIT (262144-WORD BY 16-BIT) DYNAMIC RAM
Fast Page Mode Read Cycle
tRAS
RAS
tRP
VIH
VIL
tPC
tCSH
tCRP
tRCD
tCAS
tRSH
tCAS
tCP
tCP
tCAS
VIH
LCAS/UCAS
VIL
tRAD
tASR
A0~A8
VIH
VIL
tRAH
tCPRH
tASC
ROW
ADDRESS
tASC
tCAH
COLUMN
ADDRESS1
tASC
tCAH
tASR
tCAH
COLUMN
ADDRESS3
COLUMN
ADDRESS2
ROW
ADDRESS
tRAL
tRCS
W
tRCH tRCS
VIL
tDZC
VIH
Hi-Z
VIL
tCLZ
DATA
VALID-1
tRAC
tDZO
Hi-Z
tAA
tOFF
DATA
VALID-2
tCPA
tOEA
tOCH
Hi-Z
tCAC
tCAC
tOFF
Hi-Z
tCDD
tAA
tCLZ
DQ1~DQ16 VOH
(OUTPUTS) VOL
tDZC
Hi-Z
tCAC
tAA
OE
tRCH
tRRH
tRCS
VIH
tDZC
DQ1~DQ16
(INPUTS)
tRCH
tCLZ
Hi-Z
DATA
VALID-3
tCPA
tOEA
tOEZ
tOFF
tOCH
tOEZ
tOEA
tOCH
tOEZ
VIH
VIL
tODD tDZO
19 M5M44260CJ,TP-5,-5S : Under development
tODD tDZO
tORH
tODD
MITSUBISHI LSIs
M5M44260CJ,TP-5,-6,-7,-5S,-6S,-7S
FAST PAGE MODE 4194304-BIT (262144-WORD BY 16-BIT) DYNAMIC RAM
Fast Page Mode Byte Read Cycle
tRP
tRAS
RAS
VIH
VIL
tCSH
tCRP
UCAS
(or LCAS)
LCAS
(or UCAS)
tRCD
tRSH
tPC
tCAS
tCP
tCAS
tCP
VIH
VIL
VIH
VIL
tCPRH
tRAD
tASR
A0~A8
tCAS
VIH
VIL
tASC
tRAH
tASC
tCAH
COLUMN
ADDRESS1
ROW
ADDRESS
tCAH
tASR
tCAH
tASC
COLUMN
ADDRESS3
COLUMN
ADDRESS2
ROW
ADDRESS
tRAL
tRCS
W
tRCH
tRRH
tRCH tRCS
tRCH
tRCS
VIH
VIL
DQ1~DQ8
VIH
(or DQ9~DQ16)
VIL
(INPUTS)
DQ1~DQ8
VOH
(or DQ9~DQ16)
(OUTPUTS) VOL
Hi-Z
tDZC
tDZC
tDZC
DQ9~DQ16 VIH
(or DQ1~DQ8)
VIL
(INPUTS)
Hi-Z
Hi-Z
tOFF
DATA
VALID-1
tRAC
tDZO
tCPA
DATA
VALID-3
tCPA
tOEA
tOEA
tOEZ
tOFF
tCLZ
DATA
VALID-2
tOEA
tOCH
OE
tOFF
tCLZ
tCLZ
Hi-Z
tCAC
tAA
tCAC
tAA
tCAC
tAA
DQ9~DQ16 VOH
(or DQ1~DQ8)
(OUTPUTS) VOL
tCDD
tOCH
tOEZ
tOCH
tOEZ
VIH
VIL
tODD tDZO
20
M5M44260CJ,TP-5,-5S : Under development
tODD tDZO
tORH
tODD
MITSUBISHI LSIs
M5M44260CJ,TP-5,-6,-7,-5S,-6S,-7S
FAST PAGE MODE 4194304-BIT (262144-WORD BY 16-BIT) DYNAMIC RAM
Fast Page Mode Write Cycle (Early Write)
tRAS
RAS
tRP
VIH
VIL
tCSH
tCRP
tPC
tCAS
tRCD
tCP
tRSH
tCAS
tCP
tCAS
VIH
LCAS/UCAS
VIL
tASR
A0~A8
VIH
VIL
W
DQ1~DQ16
(INPUTS)
ROW
ADDRESS
tCAH
tASC
COLUMN
ADDRESS1
tWCS
tWCH
tDS
tDH
tCAH
COLUMN
ADDRESS2
tWCS
tWCH
tDS
tDH
tASC
tCAH
COLUMN
ADDRESS3
tWCS
tWCH
VIL
VIH
VIL
VIH
VIL
21
tASC
VIH
DQ1~DQ16 VOH
(OUTPUTS) VOL
OE
tRAH
M5M44260CJ,TP-5,-5S : Under development
DATA
VALID-2
DATA
VALID-1
Hi-Z
tDS
tDH
DATA
VALID-3
tASR
ROW
ADDRESS
MITSUBISHI LSIs
M5M44260CJ,TP-5,-6,-7,-5S,-6S,-7S
FAST PAGE MODE 4194304-BIT (262144-WORD BY 16-BIT) DYNAMIC RAM
Fast Page Mode Byte Write Cycle (Early Write)
tRAS
RAS
tRP
VIH
VIL
tCSH
tCRP
UCAS
(or LCAS)
VIH
LCAS
(or UCAS)
VIH
tCAS
tCP
tCAS
VIL
VIH
VIL
tRAH
ROW
ADDRESS
tASC
tASC
tCAH
COLUMN
ADDRESS1
tWCS
W
tRSH
tCAS
tCP
VIL
tASR
A0~A8
tPC
tRCD
tWCH
tCAH
COLUMN
ADDRESS2
tWCS
tASC
tCAH
COLUMN
ADDRESS3
tWCH
tWCS
tWCH
tDH
tDS
tDH
VIH
VIL
DQ1~DQ8
VIH
(or DQ9~DQ16)
VIL
(INPUTS)
DQ1~DQ8
VOH
(or DQ9~DQ16)
(OUTPUTS) VOL
Hi-Z
tDS
DQ9~DQ16 VIH
(or DQ1~DQ8)
VIL
(INPUTS)
DQ9~DQ16 VOH
(or DQ1~DQ8)
(OUTPUTS) VOL
OE
VIH
VIL
22 M5M44260CJ,TP-5,-5S : Under development
tDH
tDS
DATA
VALID-2
DATA
VALID-1
Hi-Z
DATA
VALID-3
tASR
ROW
ADDRESS
MITSUBISHI LSIs
M5M44260CJ,TP-5,-6,-7,-5S,-6S,-7S
FAST PAGE MODE 4194304-BIT (262144-WORD BY 16-BIT) DYNAMIC RAM
Fast-Page Mode Write Cycle (Delayed Write)
tRP
tRAS
RAS
VIH
VIL
tRSH
tCSH
tCRP
tRCD
tPC
tCAS
tCAS
tCP
VIH
LCAS/UCAS
VIL
tASR
A0~A8
VIH
VIL
tRAH
tASC
tCAH
tASC
ROW
ADDRESS
COLUMN
ADDRESS1
tRWL
tCWL
tCAH
ROW
ADDRESS
COLUMN
ADDRESS2
tCWL
tRCS
tRCS
tWP
tWP
W
VIH
VIL
tWCH
tWCH
tDZC
DQ1~DQ16
(INPUTS)
VIH
tDS
Hi-Z
tDH
DATA
VALID-1
VIL
DQ1~DQ16 VOH
(OUTPUTS) VOL
tDZO
VIL
23
M5M44260CJ,TP-5,-5S : Under development
tDS
Hi-Z
tDH
DATA
VALID-2
Hi-Z
Hi-Z
VIH
tDZC
tCLZ
tCLZ
OE
tASR
Hi-Z
tOEZ
tOEZ
tODD
tDZO
tODD
tOEH
MITSUBISHI LSIs
M5M44260CJ,TP-5,-6,-7,-5S,-6S,-7S
FAST PAGE MODE 4194304-BIT (262144-WORD BY 16-BIT) DYNAMIC RAM
Fast-Page Mode Byte Write Cycle (Delayed Write)
tRP
tRAS
RAS
VIH
VIL
tCSH
tCRP
tRCD
tRSH
tCAS
tPC
tCP
UCAS
(or LCAS)
LCAS
(or UCAS)
VIH
VIL
VIH
VIL
tRWL
tASR
A0~A8
tCAS
VIH
VIL
tRAH
tASC
ROW
ADDRESS
tASC
tCAH
tCAH
tCWL
ROW
ADDRESS
COLUMN
ADDRESS2
COLUMN
ADDRESS1
tCWL
tRCS
tRCS
tWP
tWP
W
tASR
VIH
VIL
tWCH
tWCH
DQ1~DQ8
VIH
(or DQ9~DQ16)
VIL
(INPUTS)
DQ1~DQ8
VOH
(or DQ9~DQ16)
(OUTPUTS) VOL
Hi-Z
tDZC
DQ9~DQ16 VIH
(or DQ1~DQ8)
(INPUTS)
VIL
tDS
Hi-Z
tDH
DATA
VALID-1
VIL
24 M5M44260CJ,TP-5,-5S : Under development
tDH
DATA
VALID-2
Hi-Z
tOEZ
tOEZ
VIH
Hi-Z
Hi-Z
Hi-Z
tDZO
OE
tDS
tCLZ
tCLZ
DQ9~DQ16 VOH
(or DQ1~DQ8)
(OUTPUTS) VOL
tDZC
tODD
tDZO
tODD
tOEH
MITSUBISHI LSIs
M5M44260CJ,TP-5,-6,-7,-5S,-6S,-7S
FAST PAGE MODE 4194304-BIT (262144-WORD BY 16-BIT) DYNAMIC RAM
Fast Page Mode Read-Write, Read-Modify-Write Cycle
tRAS
RAS
tRP
VIH
VIL
tRWL
tCSH
tCRP
tPRWC
tCAS
tRCD
tCP
tCAS
VIH
LCAS/UCAS
VIL
tRAD
tASR
A0~A8
VIH
VIL
tRAH
tASC
tCAH
tASC
ROW
ADDRESS
tAWD
tCWL
tCWD
ROW
ADDRESS
tAWD
tRCS
tCWD
tWP
W
VIL
tCPWD
tDZC
tDS
Hi-Z
VIH
VIL
tDH
tCAC
DQ1~DQ16
(OUTPUTS) VOL
VIH
VIL
25
M5M44260CJ,TP-5,-5S : Under development
Hi-Z
tCAC
tDH
DATA
VALID-2
tCLZ
Hi-Z
Hi-Z
DATA
VALID-1
tRAC
tDZO
tDS
tAA
tCLZ
VOH
tDZC
DATA
VALID-1
tAA
OE
tWP
VIH
tRWD
DQ1~DQ16
(INPUTS)
tASR
COLUMN
ADDRESS2
COLUMN
ADDRESS1
tRCS
tCWL
tCAH
tCPA
tODD
tOEA
tOEZ
DATA
VALID-2
tDZO
tOEA
Hi-Z
tODD
tOEZ tOEH
MITSUBISHI LSIs
M5M44260CJ,TP-5,-6,-7,-5S,-6S,-7S
FAST PAGE MODE 4194304-BIT (262144-WORD BY 16-BIT) DYNAMIC RAM
Fast Page Mode Byte Read-Write, Read-Modify-Write Cycle
tRP
tRAS
RAS
VIH
VIL
tCSH
tCRP
UCAS
(or LCAS)
LCAS
(or UCAS)
tCP
tRWL
VIL
VIH
VIL
VIH
VIL
tRAD
tRAH
tASC
ROW
ADDRESS
tASC
tCAH
tCAH
tCWL
tASR
COLUMN
ADDRESS2
COLUMN
ADDRESS1
tAWD
tCWD
tRCS
ROW
ADDRESS
tAWD
tCWD
tCWL
tWP
W
tPRWC
tCAS
VIH
tASR
A0~A8
tCAS
tRCD
tRCS
tWP
VIH
VIL
tRWD
tCPWD
DQ1~DQ8
VIH
(or DQ9~DQ16)
VIL
(INPUTS)
DQ1~DQ8
VOH
(or DQ9~DQ16)
(OUTPUTS) VOL
Hi-Z
tDS
tDZC
DQ9~DQ16 VIH
(or DQ1~DQ8)
VIL
(INPUTS)
Hi-Z
tDH
tDZC
Hi-Z
DATA
VALID-1
tCAC
tAA
OE
VIH
VIL
26
M5M44260CJ,TP-5,-5S : Under development
DATA
VALID-2
tCAC
tCLZ
Hi-Z
Hi-Z
DATA
VALID-1
tRAC
tDZO
tDH
tAA
tCLZ
DQ9~DQ16 VOH
(or DQ1~DQ8)
(OUTPUTS) VOL
tDS
tOEA
tCPA
tODD
tOEZ
Hi-Z
DATA
VALID-2
tDZO
tOEA
tODD
tOEZ
tOEH
MITSUBISHI LSIs
M5M44260CJ,TP-5,-6,-7,-5S,-6S,-7S
FAST PAGE MODE 4194304-BIT (262144-WORD BY 16-BIT) DYNAMIC RAM
Self Refresh Cycle *
(Note28)
RAS
tRPS
tRASS
tRP
VIH
VIL
tRPC
tRPC
tCSR
tCHS
tCRP
VIH
LCAS/UCAS
VIL
tCPN
tASR
A0~A8
VIH
ROW
ADDRESS
VIL
tRCS
tRCH
W
VIH
VIL
tCDD
DQ1~DQ16
(INPUTS)
VIH
Hi-Z
VIL
tOFF
DQ1~DQ16 VOH
(OUTPUTS) VOL
Hi-Z
tOEZ
tODD
OE
VIH
VIL
27 M5M44260CJ,TP-5,-5S : Under development
COLUMN
ADDRESS
MITSUBISHI LSIs
M5M44260CJ,TP-5,-6,-7,-5S,-6S,-7S
FAST PAGE MODE 4194304-BIT (262144-WORD BY 16-BIT) DYNAMIC RAM
Note 28 : Self refresh sequence
Two refreshing methods should be used properly depending on
the low pulse width (tRASS) of RAS signal during self refresh
period.
1. Distributed refresh during Read/Write operation
(A) Timing Diagram
Read / Write Cycle
Self Refresh Cycle
tRASS≥100µs
tNSD
Read / Write Cycle
tSND
RAS
last
refresh cycle
first
refresh cycle
Table 2
Read / Write Cycle
Read / Write
Self Refresh
Self Refresh
Read / Write
CBR distributed
refresh
tNSD≤250µs
tSND≤250µs
RAS only
distributed refresh
tNSD≤16µs
tSND≤16µs
(B) Definition of distributed refresh
tREF
tREF / 512
tREF / 512
RAS
refresh
cycle
read/write
cycles
refresh
cycle
Definition of CBR distributed refresh
(Including extended refresh)
The CBR distributed refresh performs more than 512
constant period (250µs max.) CBR cycles within 128 ms.
Definition of RAS only distributed refresh
All combinations of nine row address signals (A0~A8) are
selected during 512 constant period (16µs max.) RAS only
refresh cycles within 8.2 ms.
Note:
Hidden refresh may be used instead of CBR refresh.
RAS/CAS refresh may be used instead of RAS only refresh.
1.1 CBR distributed refresh
Switching from read/write operation to self refresh operation.
The time interval from the falling edge of RAS signal in the last
CBR refresh cycle during read/write operation period to the
falling edge of RAS signal at the start of self refresh operation
should be set within tNSD (shown in table 2).
28
M5M44260CJ,TP-5,-5S : Under development
refresh
cycle
read/write
cycles
Switching from self refresh operation to read/write operation.
The time interval from the rising edge of RAS signal at the
end of self refresh operation to the falling edge of RAS signal
in the first CBR refresh cycle during read/write operation
period should be set within tSND (shown in table 2).
1.2 RAS only distributed refresh
Switching from read/write operation to self refresh operation.
The time interval tNSD from the falling edge of RAS signal in
the last RAS only refresh cycle during read/write operation
period to the falling edge of RAS signal at the start of self
refresh operation should be set within 16µs.
Switching from self refresh operation to read/write operation.
The time interval tSND from the rising edge of RAS signal at
the end of self refresh operation to the falling edge of RAS
signal in the first CBR refresh cycle during read/write
operation period should be set within 16µs.
MITSUBISHI LSIs
M5M44260CJ,TP-5,-6,-7,-5S,-6S,-7S
FAST PAGE MODE 4194304-BIT (262144-WORD BY 16-BIT) DYNAMIC RAM
2. Burst refresh during Read/Write operation
(A) Timing diagram
Read / Write
Read / Write
Self Refresh
tRASS≥100µs
tNSB
tSNB
RAS
first
refresh cycles
refresh cycles
511 cycles
refresh cycles
511 cycles
last
refresh Cycles
Table 3
Read / Write Cycle
CBR burst
refresh
Read / Write
Self Refresh
tNSB≤8.2ms
RAS only
burst refresh
Self Refresh
Read / Write
tSNB≤8.2ms
tNSB+tSNB≤8.2ms
(B) Definition of burst refresh
8.2ms
RAS
refresh cycles
512 cycles
read/write cycles
Definition of CBR burst refresh
The CBR burst refresh performs more than 512 continuous
CBR cycles within 8.2 ms.
Definition of RAS only burst refresh
All combination of nine row address signals (A0~A8) are
selected during 512 continuous RAS only refresh cycles
within 8.2 ms.
2.1 CBR burst refresh
Switching from read/write operation to self refresh operation.
The time interval tNSB from the falling edge of RAS signal in
the first CBR refresh cycle during read/write operation period
to the falling edge of RAS signal at the start of self refresh
operation should be set within 8.2 ms.
Switching from self refresh operation to read/write operation.
The time interval tSNB from the rising edge of RAS signal at
the end of self refresh operation to the falling edge of RAS
signal in the last CBR refresh cycle during read/write operation
period should be set within 8.2 ms.
29
M5M44260CJ,TP-5,-5S : Under development
2.2 RAS only burst refresh
Switching from read/write operation to self refresh operation.
The time interval from the falling edge of RAS signal in the
first RAS only refresh cycle during read/write operation period
to the falling edge of RAS signal at the start of self refresh
operation should be set within tNSB (shown in table 3).
Switching from self refresh operation to read/write operation.
The time interval from the rising edge of RAS signal at the end
of self refresh operation to the falling edge of RAS signal in
the last RAS only refresh cycle during read/write operation
period should be set within tSNB (shown in table 3).