STMICROELECTRONICS 74ACT161M


74ACT161
SYNCHRONOUS PRESETTABLE 4-BIT COUNTER
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HIGH SPEED:
fMAX =125 MHz (TYP.) at VCC = 5V
LOW POWER DISSIPATION:
ICC = 8 µA (MAX.) at TA = 25 oC
COMPATIBLE WITH TTL OUTPUTS
VIH = 2V (MIN), VIL = 0.8V (MAX)
50Ω TRANSMISSION LINE DRIVING
CAPABILITY
SYMMETRICAL OUTPUT IMPEDANCE:
|IOH| = IOL = 24 mA (MIN)
BALANCED PROPAGATION DELAYS:
tPLH ≅ tPHL
OPERATING VOLTAGE RANGE:
VCC (OPR) = 4.5V to 5.5V
PIN AND FUNCTION COMPATIBLE WITH
74 SERIES 161
IMPROVED LATCH-UP IMMUNITY
DESCRIPTION
The ACT161 is a high-speed CMOS
SYNCRONOUS PRESETTABLE COUNTER
fabricated with sub-micron silicon gate and
2
double-layer metal wiring C MOS technology. It is
ideal for low power applications mantaining high
speed operation similar to eqivalent Bipolar
Schottky TTL. It is a 4 bit binary counter with
Asynchronous Clear.
The circuit have four fundamental modes of
operation, in order of preference: synchronous
reset, parallel load, count-up and hold. Four
control inputs, Master Reset (CLEAR), Parallel
B
M
(Plastic Package)
(Micro Package)
ORDER CODES :
74ACT161B
74ACT161M
Enable Input (LOAD), Count Enable Input (PE)
and Count Enable Carry Input (TE), determine
the mode of operation as shown in the Truth
Table. A LOW signal on CLEAR overrides
counting and parallel loading and sets all outputs
on LOW state. A LOW signal on LOAD overrides
counting and allows information on Parallel Data
Qn inputs to be loaded into the flip-flops on the
next rising edge of CLOCK. With LOAD and
CLEAR, PE and TE permit counting when both
are HIGH. Conversely, a LOW signal on either
PE and TE inhibits counting.
The device is designed to interface directly High
Speed CMOS systems with TTL, NMOS and
CMOS output voltage levels.
All inputs and outputs are equipped with
protection circuits against static discharge, giving
them 2KV ESD immunity and transient excess
voltage.
PIN CONNECTION AND IEC LOGIC SYMBOLS
December 1998
1/11
74ACT161
INPUT AND OUTPUT EQUIVALENT CIRCUIT
PIN DESCRIPTION
PIN No
1
SYMBOL
CLEAR
NAME AND FUNCT ION
Master Reset
2
CLOCK
Clock Input (LOW-to-HIGH,
Edge- Triggered)
3, 4, 5, 6
A, B, C, D
Data Inputs
7
PE
Count Enable Input
10
TE
Count Enable Carry Input
9
LOAD
14, 13, 12,
11
15
QA to QD
8
CARRY
OUT
GND
16
VCC
Parallel Enable Input
Flip-Flop Outpus
Terminal Count Output
Ground (0V)
Positive Supply Voltage
TRUTH TABLE
INPUT S
O UT PUT S
CLEAR
LOAD
PE
TE
CL OCK
X
QB
QC
FUNCT ION
QD
L
X
X
X
H
L
X
X
H
H
X
L
NO CHANGE
NO COUNT
H
H
L
X
NO CHANGE
NO COUNT
H
H
H
H
COUNT UP
COUNT
H
X
X
X
NO CHANGE
NO COUNT
NOTE:
X:Don’t Care
A,B, C,D: Logic level of data input
CARRY=TE • QA • QB • QC • QD
LOGIC DIAGRAMS
2/11
QA
L
L
L
L
RESET TO ”0”
A
B
C
D
PRESET DATA
74ACT161
TIMING CHART
3/11
74ACT161
ABSOLUTE MAXIMUM RATINGS
Symbol
VCC
Parameter
Supply Voltage
Value
Unit
-0.5 to +7
V
VI
DC Input Voltage
-0.5 to VCC + 0.5
V
VO
DC Output Voltage
-0.5 to VCC + 0.5
V
IIK
DC Input Diode Current
± 20
mA
IOK
DC Output Diode Current
± 20
mA
IO
DC Output Current
ICC or IGND DC VCC or Ground Current
Tstg
Storage Temperature
TL
Lead Temperature (10 sec)
± 50
mA
± 300
mA
-65 to +150
o
300
o
C
C
Absolute Maximum Ratings are those values beyond which damage to the device may occur. Functional operation under these condition is not implied.
RECOMMENDED OPERATING CONDITIONS
Symbol
Value
Unit
Supply Voltage
4.5 to 5.5
V
VI
Input Voltage
0 to VCC
V
VO
Output Voltage
0 to VCC
VCC
Top
dt/dv
Parameter
Operating Temperature:
V
o
-40 to +85
Input Rise and Fall Time VCC = 4.5 to 5.5V (note 1)
C
8
ns/V
1) VIN from 0.8 V to 2.0 V
DC SPECIFICATIONS
Symb ol
Parameter
Test Co nditions
VIH
High Level Input Voltage
4.5
5.5
VIL
Low Level Input Voltage
4.5
5.5
VOH
High Level Output Voltage
4.5
5.5
4.5
VO = 0.1 V or
VCC - 0.1 V
V I (* ) =
V IH or
V IL
Low Level Output Voltage
4.5
5.5
4.5
5.5
V I (* ) =
V IH or
V IL
Un it
o
-40 to 85 C
Min.
T yp.
2.0
1.5
2.0
2.0
1.5
2.0
VO = 0.1 V or
VCC - 0.1 V
5.5
VOL
Valu e
o
T A = 25 C
V CC
(V)
Max.
Min.
Max.
V
1.5
0.8
0.8
1.5
0.8
0.8
IO=-50 µA
4.4
4.49
4.4
IO=-50 µA
5.4
5.49
5.4
IO=-24 mA
3.86
3.76
IO=-24 mA
4.86
4.76
V
IO=50 µA
0.001
0.1
0.1
IO=50 mA
0.001
0.1
0.1
IO=24 mA
0.36
0.44
IO=24 mA
0.36
0.44
±0.1
V
V
±1
µA
1.5
mA
Input Leakage Current
5.5
VI = VCC or GND
ICCT
Max ICC /Input
5.5
VI = VCC -2.1 V
ICC
Quiescent Supply Current
5.5
VI = VCC or GND
40
µA
IOLD
Dynamic Output Current
(note 1, 2)
5.5
VOLD = 1.65 V max
75
mA
VOHD = 3.85 V min
-75
mA
II
IOHD
1) Maximum test duration 2ms, one output loaded attime
2) Incident wave switching is guaranteed on transmission lines with impedances as low as 50 Ω.
(*) All outputs loaded.
4/11
0.6
4
74ACT161
AC ELECTRICAL CHARACTERISTICS (CL = 50 pF, RL = 500 Ω, Input tr = tf =3 ns)
Symb ol
Parameter
T est Con ditio n
V CC
(V)
tPLH
tPHL
tPLH
tPHL
tPLH
tPHL
tPHL
twL
Propagation Delay Time
CK to Q
5.0(*)
Propagation Delay Time
CK to CARRY OUT
(*)
Propagation Delay Time
TE to CARRY OUT
Propagation Delay Time
CLEAR to CARRY OUT
CLR pulse Width, LOW
5.0
Valu e
T A = 25 oC
-40 to 85 o C
Min. T yp. Max. Min. Max.
1.5
5.5
9.5
10.5
1.5
7.0
11.0
12.0
1.5
5.5
8.5
10.0
1.5
6.0
10.0
11.0
(*)
2.5
3.0
7.5
(*)
(*)
5.0
(*)
5.0
5.0
tw
CK pulse Width (LOAD)
HIGH or LOW
5.0
2.0
3.0
3.5
tw
CK pulse Width (COUNT)
HIGH or LOW
5.0(*)
2.0
3.0
3.5
ts
Setup Time HIGH or LOW
(INPUT to CK)
5.0
(*)
1.5
9.5
11.5
th
Hold Time HIGH or LOW
(INPUT to CK)
5.0
-0.5
0
1.0
2.0
8.5
9.5
-2.0
-0.5
0
1.5
5.5
6.5
-2.0
0
0.5
-0.5
0.5
1.0
ts
th
ts
th
tREM
fMAX
Setup Time HIGH or LOW
(LOAD to CK)
Hold Time HIGH or LOW
(LOAD to CK)
Setup Time HIGH or LOW
(PE or TE to CK)
Hold Time HIGH or LOW
(PE or TE to CK)
Recovery Time CLR to Q
Maximum Clock Frequency
(*)
(*)
5.0
(*)
5.0
(*)
5.0
(*)
5.0
(*)
5.0
(*)
5.0
115
125
100
Un it
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
MHz
(*) Voltage range is 5V ± 0.5V
CAPACITIVE CHARACTERISTICS
Symb ol
Parameter
Test Co nditions
C IN
Input Capacitance
5.0
CPD
Power Dissipation
Capacitance (note 1)
5.0
Valu e
T A = 25 oC
V CC
(V)
Min.
fIN = 10 MHz
T yp.
Max.
Un it
-40 to 85 o C
Min.
Max.
4.5
pF
45
pF
1) CPD isdefined as the value of the IC’sinternal equivalent capacitance which is calculated fromthe operating current consumption without load. (Referto
Test Circuit).Average operting current can be obtained by the following equation. ICC(opr) = CPD • VCC • fIN + ICC/n(per circuit)
5/11
74ACT161
TEST CIRCUIT
CL = 50 pF or equivalent (includes jigand probe capacitance)
RL = R1 = 500Ω orequivalent
RT = ZOUT of pulse generator (typically 50Ω)
WAVEFORM 1: PROPAGATION DELAYS, COUNT MODE (f=1MHz; 50% duty cycle)
6/11
74ACT161
WAVEFORM 2: PROPAGATION DELAYS CLEAR MODE (f=1MHz; 50% duty cycle)
WAVEFORM 3: PROPAGATION DELAYS PRESET MODE (f=1MHz; 50% duty cycle)
7/11
74ACT161
WAVEFORM 4: PROPAGATION DELAYS COUNTEABLE MODE (f=1MHz; 50% duty cycle)
WAVEFORM 5: PROPAGATION DELAYS CASCADE MODE (f=1MHz; 50% duty cycle)
8/11
74ACT161
Plastic DIP-16 (0.25) MECHANICAL DATA
mm
DIM.
MIN.
a1
0.51
B
0.77
TYP.
inch
MAX.
MIN.
TYP.
MAX.
0.020
1.65
0.030
0.065
b
0.5
0.020
b1
0.25
0.010
D
20
0.787
E
8.5
0.335
e
2.54
0.100
e3
17.78
0.700
F
7.1
0.280
I
5.1
0.201
L
Z
3.3
0.130
1.27
0.050
P001C
9/11
74ACT161
SO-16 MECHANICAL DATA
mm
DIM.
MIN.
TYP.
A
a1
inch
MAX.
MIN.
TYP.
1.75
0.1
0.068
0.2
a2
MAX.
0.004
0.007
1.65
0.064
b
0.35
0.46
0.013
0.018
b1
0.19
0.25
0.007
0.010
C
0.5
0.019
c1
45 (typ.)
D
9.8
10
0.385
0.393
E
5.8
6.2
0.228
0.244
e
1.27
e3
0.050
8.89
0.350
F
3.8
4.0
0.149
0.157
G
4.6
5.3
0.181
0.208
L
0.5
1.27
0.019
0.050
M
S
0.62
0.024
8 (max.)
P013H
10/11
74ACT161
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of use of such information nor for any infringement of patents or other rights of third parties which may result from its use. No license is
granted by implication or otherwise under any patent or patent rights of STMicroelectronics. Specification mentioned in this publication are
subject to change without notice. This publication supersedes and replaces all information previously supplied. STMicroelectronics products
are not authorized for use as critical components in life support devices or systems without express written approval of STMicroelectronics.
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11/11