FREESCALE MPXV5010G

Pressure
Freescale Semiconductor
MPX5010
Rev 12, 09/2009
Integrated Silicon Pressure Sensor
On-Chip Signal Conditioned,
Temperature Compensated and
Calibrated
The MPxx5010 series piezoresistive transducers are state-of-the-art
monolithic silicon pressure sensors designed for a wide range of applications,
but particularly those employing a microcontroller or microprocessor with A/D
inputs. This transducer combines advanced micromachining techniques,
thin-film metallization, and bipolar processing to provide an accurate, high
level analog output signal that is proportional to the applied pressure. The
axial port has been modified to accommodate industrial grade tubing.
Features
•
•
•
•
•
•
•
5.0% Maximum Error over 0° to 85°C
Ideally Suited for Microprocessor or Microcontroller-Based Systems
Durable Epoxy Unibody and Thermoplastic (PPS) Surface Mount Package
Temperature Compensated over -40° to +125°C
Patented Silicon Shear Stress Strain Gauge
Available in Differential and Gauge Configurations
Available in Surface Mount (SMT) or Through-hole (DIP) Configurations
MPX5010
MPXV5010
MPVZ5010
Series
0 to 10 kPa (0 to 1.45 psi)
(0 to 1019.78 mm H2O)
0.2 to 4.7 V Output
Application Examples
•
•
•
•
•
Hospital Beds
HVAC
Respiratory Systems
Process Control
Washing Machine Water Level
Measurement (Reference AN1950)
• Ideally Suited for Microprocessor or
Microcontroller-Based Systems
• Appliance Liquid Level and Pressure
Measurement
ORDERING INFORMATION
Device Name
Case No.
None
# of Ports
Single
Dual
Gauge
Pressure Type
Differential
Absolute
Device
Marking
Unibody Package (MPX5010 Series)
MPX5010DP
867C
MPX5010GP
867B
MPX5010GS
867E
MPX5010GSX
867F
Small Outline Package (MPXV5010 Series)
•
•
•
•
•
MPX5010DP
MPX5010GP
MPX5010D
MPX5010D
•
•
•
•
MPXV5010DP
1351
•
MPXV5010G6U
482
•
MPXV5010GC6T1
482A
•
MPXV5010GC6U
482A
•
MPXV5010GC7U
482C
•
MPXV5010GP
1369
•
Small Outline Package (Media Resistant Gel) (MPVZ5010 Series)
•
•
•
•
•
MPXV5010DP
MPXV5010G
MPXV5010G
MPXV5010G
MPXV5010G
MPXV5010GP
MPVZ5010G6U
MPVZ5010G6T1
MPVZ5010G7U
MPVZ5010GW6U
MPVZ5010GW7U
•
•
•
•
•
MPVZ5010G
MPVZ5010G
MPVZ5010G
MZ5010GW
MZ5010GW
482
482
482B
1735
1560
•
•
•
•
•
© Freescale Semiconductor, Inc., 2007-2009. All rights reserved.
Pressure
SMALL OUTLINE PACKAGES SURFACE MOUNT
MPXV5010GC6U/C6T1
CASE 482A-01
MPXV5010G6U,
MPVZ5010G6U/T1
CASE 482-01
MPXV5010DP
CASE 1351-01
MPVZ5010GW6U
CASE 1735-01
MPXV5010GP
CASE 1369-01
SMALL OUTLINE PACKAGES THROUGH-HOLE
J
MPVZ5010G7U
CASE 482B-03
MPXV5010GC7U
CASE 482C-03
MPVZ5010GW7U
CASE 1560-02
UNIBODY PACKAGES
MPX5010GP
CASE 867B-04
MPX5010DP
CASE 867C-05
MPX5010GS
CASE 867E-03
MPX5010GSX
CASE 867F-03
MPX5010
2
Sensors
Freescale Semiconductor
Pressure
Operating Characteristics
Table 1. Operating Characteristics (VS = 5.0 Vdc, TA = 25°C unless otherwise noted, P1 > P2. Decoupling circuit shown in
Figure 3 required to meet specification.)
Characteristic
Symbol
Min
Typ
Max
Unit
Pressure Range
POP
0
—
10
1019.78
kPa
mm H2O
Supply Voltage(1)
VS
4.75
5.0
5.25
Vdc
Supply Current
Io
—
5.0
10
mAdc
Minimum Pressure Offset(2)
@ VS = 5.0 Volts
(0 to 85°C)
Voff
0
0.2
0.425
Vdc
Full Scale Output(3)
@ VS = 5.0 Volts
(0 to 85°C)
VFSO
4.475
4.7
4.925
Vdc
Full Scale Span(4)
@ VS = 5.0 Volts
(0 to 85°C)
VFSS
4.275
4.5
4.725
Vdc
Accuracy(5)
(0 to 85°C)
—
—
—
±5.0
%VFSS
V/P
—
450
4.413
—
mV/mm
mV/mm H2O
Response Time(6)
tR
—
1.0
—
ms
Output Source Current at Full Scale Output
IO+
—
0.1
—
mAdc
Warm-Up Time(7)
—
—
20
—
ms
Offset Stability(8)
—
—
±0.5
—
%VFSS
Sensitivity
1. Device is ratiometric within this specified excitation range.
2. Offset (Voff) is defined as the output voltage at the minimum rated pressure.
3. Full Scale Output (VFSO) is defined as the output voltage at the maximum or full rated pressure.
4. Full Scale Span (VFSS) is defined as the algebraic difference between the output voltage at full rated pressure and the output voltage at the
minimum rated pressure.
5. Accuracy (error budget) consists of the following:
Linearity: Output deviation from a straight line relationship with pressure over the specified pressure range.
Temperature Hysteresis:Output deviation at any temperature within the operating temperature range, after the temperature is cycled to and
from the minimum or maximum operating temperature points, with zero differential pressure applied.
Pressure Hysteresis:Output deviation at any pressure within the specified range, when this pressure is cycled to and from the minimum or
maximum rated pressure, at 25°C.
TcSpan: Output deviation over the temperature range of 0° to 85°C, relative to 25°C.
TcOffset:Output deviation with minimum rated pressure applied, over the temperature range of 0° to 85°C, relative to 25°C.
Variation from Nominal:The variation from nominal values, for Offset or Full Scale Span, as a percent of VFSS, at 25°C.
6. Response Time is defined as the time for the incremental change in the output to go from 10% to 90% of its final value when subjected to a
specified step change in pressure.
7. Warm-up Time is defined as the time required for the product to meet the specified output voltage after the Pressure has been stabilized.
8. Offset Stability is the product's output deviation when subjected to 1000 hours of Pulsed Pressure, Temperature Cycling with Bias Test.
MPX5010
Sensors
Freescale Semiconductor
3
Pressure
Maximum Ratings
Table 2. Maximum Ratings(1)
Rating
Symbol
Value
Unit
Maximum Pressure (P1 > P2)
Pmax
40
kPa
Storage Temperature
Tstg
–40 to +125
°C
Operating Temperature
TA
–40 to +125
°C
1. Exposure beyond the specified limits may cause permanent damage or degradation to the device.
Figure 1 shows a block diagram of the internal circuitry integrated on a pressure sensor chip.
VS
2 (SOP)
3 (Unibody)
Thin Film
Temperature
Compensation
and
Gain Stage #1
Sensing
Element
2 (Unibody)
3 (SOP)
GND
Gain Stage #2
and
Ground
Reference
Shift Circuitry
Vout
1 (Unibody)
4 (SOP)
Pins 1 and 5 through 8 are NO CONNECTS
for small outline package.
Pins 4, 5, and 6 are NO CONNECTS for
unibody package.
Figure 1. Fully Integrated Pressure Sensor Schematic
MPX5010
4
Sensors
Freescale Semiconductor
Pressure
ON-CHIP TEMPERATURE COMPENSATION AND CALIBRATION
The performance over temperature is achieved by
integrating the shear-stress strain gauge, temperature
compensation, calibration and signal conditioning circuitry
onto a single monolithic chip.
Figure 3 illustrates the Differential or Gauge configuration
in the basic chip carrier (Case 482). A fluorosilicone gel
isolates the die surface and wire bonds from the environment,
while allowing the pressure signal to be transmitted to the
sensor diaphragm.
The MPxx5010G series pressure sensor operating
characteristics, and internal reliability and qualification tests
are based on use of dry air as the pressure media. Media,
Fluoro Silicone
Gel Die Coat
other than dry air, may have adverse effects on sensor
performance and long-term reliability. Contact the factory for
information regarding media compatibility in your application.
Figure 4 shows the recommended decoupling circuit for
interfacing the integrated sensor to the A/D input of a
microprocessor or microcontroller. Proper decoupling of the
power supply is recommended.
Figure 5 shows the sensor output signal relative to
pressure input. Typical, minimum, and maximum output
curves are shown for operation over a temperature range of
0° to 85°C using the decoupling circuit shown in Figure 4. The
output will saturate outside of the specified pressure range.
Stainless
Steel Cap
Die
+5 V
P1
Thermoplastic
Case
Wire Bond
Vout
OUTPUT
Vs
Lead
Frame
IPS
1.0 μF
P2
GND
0.01 μF
470 pF
Die Bond
Differential Sensing
Element
Figure 2. Cross-Sectional Diagram SOP
(not to scale)
5.0
Figure 3. Recommended Power Supply Decoupling
and Output Filtering
(For additional output filtering, please refer to
Application Note AN1646.)
Transfer Function (kPa):
Vout = VS × (0.09 × P + 0.04) ± 5.0% VFSS
VS = 5.0 Vdc
TEMP = 0 to 85°C
4.0
Output (V)
3.0
TYPICAL
MAX
2.0
MIN
1.0
0
0
2.0
4.0
6.0
8.0
10
Differential Pressure (kPa)
Figure 4. Output vs. Pressure Differential
MPX5010
Sensors
Freescale Semiconductor
5
Pressure
Transfer Function
Nominal Transfer Value: Vout = VS x (0.09 x P + 0.04)
± (Pressure Error x Temp. Factor x 0.09 x VS)
VS = 5.0 V ± 0.25 Vdc
Temperature Error Band
4.0
3.0
Temperature
Error
Factor
2.0
Temp
Multiplier
–40
0 to 85
+125
3
1
3
1.0
0.0
–40
–20
0
20
40
80
60
100
120
140
Temperature in °C
NOTE: The Temperature Multiplier is a linear response from 0° to –40°C and from 85° to 125°C.
Pressure Error Band
0.5
0.4
0.3
Pressure
Error
(kPa)
0.2
0.1
0
–0.1
Pressure (kPa)
0
1
2
3
4
5
6
7
8
9
10
–0.2
–0.3
–0.4
–0.5
Pressure
0 to 10 (kPa)
Error (Max)
±0.5 (kPa)
MPX5010
6
Sensors
Freescale Semiconductor
Pressure
PRESSURE (P1)/VACUUM (P2) SIDE IDENTIFICATION TABLE
Freescale designates the two sides of the pressure sensor
as the Pressure (P1) side and the Vacuum (P2) side. The
Pressure (P1) side is the side containing fluorosilicone gel
which protects the die from harsh media. The MPX pressure
Part Number
sensor is designed to operate with positive differential
pressure applied, P1 > P2.
The Pressure (P1) side may be identified by using the
table below:
Pressure (P1)
Side Identifier
Case Type
MPX5010DP
867C
Side with Part Marking
MPX5010GP
867B
Side with Port Attached
MPX5010GS
867E
Side with Port Attached
MPX5010GSX
867F
Side with Port Attached
MPXV5010G6U
482
Stainless Steel Cap
MPXV5010GC6U/6T1
482A
Side with Port Attached
MPXV5010GC7U
482C
Side with Port Attached
MPXV5010GP
1369
Side with Port Attached
MPXV5010DP
1351
Side with Part Marking
MPVZ5010G6U/6T1
482
Stainless Steel Cap
MPVZ5010G7U
482B
Stainless Steel Cap
MPVZ5010GW6U
1735
Vertical Port Attached
MPVZ5010GW7U
1560
Vertical Port Attached
MINIMUM RECOMMENDED FOOTPRINT FOR SURFACE MOUNTED APPLICATIONS
Surface mount board layout is a critical portion of the total
design. The footprint for the surface mount packages must be
the correct size to ensure proper solder connection interface
between the board and the package. With the correct
footprint, the packages will self align when subjected to a
solder reflow process. It is always recommended to design
boards with a solder mask layer to avoid bridging and
shorting between solder pads.
0.100 TYP 8X
2.54
0.660
16.76
0.060 TYP 8X
1.52
0.300
7.62
0.100 TYP 8X
2.54
inch
mm
SCALE 2:1
Figure 5. SOP Footprint (Case 482)
MPX5010
Sensors
Freescale Semiconductor
7
Pressure
PACKAGE DIMENSIONS
-A-
D 8 PL
0.25 (0.010)
4
5
M
T B
S
A
S
NOTES:
1. DIMENSIONING AND TOLERANCING PER ANSI
Y14.5M, 1982.
2. CONTROLLING DIMENSION: INCH.
3. DIMENSION A AND B DO NOT INCLUDE MOLD
PROTRUSION.
4. MAXIMUM MOLD PROTRUSION 0.15 (0.006).
5. ALL VERTICAL SURFACES 5˚ TYPICAL DRAFT.
-BG
8
1
S
DIM
A
B
C
D
G
H
J
K
M
N
S
N
H
C
J
-TSEATING
PLANE
PIN 1 IDENTIFIER
K
M
INCHES
MIN
MAX
0.415 0.425
0.415 0.425
0.212 0.230
0.038 0.042
0.100 BSC
0.002 0.010
0.009 0.011
0.061 0.071
0˚
7˚
0.405 0.415
0.709 0.725
MILLIMETERS
MIN
MAX
10.54
10.79
10.54
10.79
5.38
5.84
0.96
1.07
2.54 BSC
0.05
0.25
0.23
0.28
1.55
1.80
0˚
7˚
10.29
10.54
18.01
18.41
CASE 482-01
ISSUE O
SMALL OUTLINE PACKAGE
–A–
D 8 PL
4
0.25 (0.010)
5
M
T B
S
A
NOTES:
1. DIMENSIONING AND TOLERANCING PER ANSI
Y14.5M, 1982.
2. CONTROLLING DIMENSION: INCH.
3. DIMENSION A AND B DO NOT INCLUDE MOLD
PROTRUSION.
4. MAXIMUM MOLD PROTRUSION 0.15 (0.006).
5. ALL VERTICAL SURFACES 5_ TYPICAL DRAFT.
S
N –B–
G
8
1
S
DIM
A
B
C
D
G
H
J
K
M
N
S
V
W
W
V
C
H
J
INCHES
MIN
MAX
0.415
0.425
0.415
0.425
0.500
0.520
0.038
0.042
0.100 BSC
0.002
0.010
0.009
0.011
0.061
0.071
0_
7_
0.444
0.448
0.709
0.725
0.245
0.255
0.115
0.125
MILLIMETERS
MIN
MAX
10.54
10.79
10.54
10.79
12.70
13.21
0.96
1.07
2.54 BSC
0.05
0.25
0.23
0.28
1.55
1.80
0_
7_
11.28
11.38
18.01
18.41
6.22
6.48
2.92
3.17
–T–
K
M
PIN 1 IDENTIFIER
SEATING
PLANE
CASE 482A-0
ISSUE A
SMALL OUTLINE PACKAGE
MPX5010
8
Sensors
Freescale Semiconductor
Pressure
PACKAGE DIMENSIONS
-ANOTES:
1. DIMENSIONING AND TOLERANCING PER
ANSI Y14.5M, 1982.
2. CONTROLLING DIMENSION: INCH.
3. DIMENSION A AND B DO NOT INCLUDE
MOLD PROTRUSION.
4. MAXIMUM MOLD PROTRUSION 0.15 (0.006).
5. ALL VERTICAL SURFACES 5˚ TYPICAL DRAFT.
6. DIMENSION S TO CENTER OF LEAD WHEN
FORMED PARALLEL.
4
5
-BG
8
1
0.25 (0.010)
M
T B
D 8 PL
S
A
S
DETAIL X
S
PIN 1 IDENTIFIER
N
C
SEATING
PLANE
-T-
DIM
A
B
C
D
G
J
K
M
N
S
INCHES
MILLIMETERS
MIN
MAX MIN
MAX
0.415
0.425 10.54
10.79
0.415
0.425 10.54
10.79
0.210
0.220
5.33
5.59
0.026
0.034
0.66
0.864
0.100 BSC
2.54 BSC
0.009
0.011
0.23
0.28
0.100
0.120
2.54
3.05
0˚
15˚
0˚
15˚
0.405
0.415 10.29
10.54
0.540
0.560 13.72
14.22
K
M
J
DETAIL X
CASE 482B-03
ISSUE B
SMALL OUTLINE PACKAGE
NOTES:
1. DIMENSIONING AND TOLERANCING PER ANSI
Y14.5M, 1982.
2. CONTROLLING DIMENSION: INCH.
3. DIMENSION A AND B DO NOT INCLUDE MOLD
PROTRUSION.
4. MAXIMUM MOLD PROTRUSION 0.15 (0.006).
5. ALL VERTICAL SURFACES 5_ TYPICAL DRAFT.
6. DIMENSION S TO CENTER OF LEAD WHEN
FORMED PARALLEL.
–A–
4
5
N –B–
G
0.25 (0.010)
8
1
M
T B
D 8 PL
S A
S
DIM
A
B
C
D
G
J
K
M
N
S
V
W
DETAIL X
S
W
V
PIN 1
IDENTIFIER
C
–T–
INCHES
MIN
MAX
0.415
0.425
0.415
0.425
0.500
0.520
0.026
0.034
0.100 BSC
0.009
0.011
0.100
0.120
0_
15 _
0.444
0.448
0.540
0.560
0.245
0.255
0.115
0.125
MILLIMETERS
MIN
MAX
10.54
10.79
10.54
10.79
12.70
13.21
0.66
0.864
2.54 BSC
0.23
0.28
2.54
3.05
0_
15 _
11.28
11.38
13.72
14.22
6.22
6.48
2.92
3.17
SEATING
PLANE
K
M
J
DETAIL X
CASE 482C-03
ISSUE B
SMALL OUTLINE PACKAGE
MPX5010
Sensors
Freescale Semiconductor
9
Pressure
PACKAGE DIMENSIONS
C
R
M
B
NOTES:
1. DIMENSIONING AND TOLERANCING PER ANSI
Y14.5M, 1982.
2. CONTROLLING DIMENSION: INCH.
3. DIMENSION –A– IS INCLUSIVE OF THE MOLD
STOP RING. MOLD STOP RING NOT TO EXCEED
16.00 (0.630).
POSITIVE PRESSURE
(P1)
–A–
N
PIN 1
SEATING
PLANE
1
2
3
4
5
DIM
A
B
C
D
F
G
J
L
M
N
R
S
L
6
–T–
G
J
S
F
D 6 PL
0.136 (0.005)
STYLE 1:
PIN 1.
2.
3.
4.
5.
6.
STYLE 2:
PIN 1.
2.
3.
4.
5.
6.
VOUT
GROUND
VCC
V1
V2
VEX
M
T A
M
STYLE 3:
PIN 1.
2.
3.
4.
5.
6.
OPEN
GROUND
–VOUT
VSUPPLY
+VOUT
OPEN
INCHES
MIN
MAX
0.595
0.630
0.514
0.534
0.200
0.220
0.027
0.033
0.048
0.064
0.100 BSC
0.014
0.016
0.695
0.725
30 _NOM
0.475
0.495
0.430
0.450
0.090
0.105
MILLIMETERS
MIN
MAX
15.11
16.00
13.06
13.56
5.08
5.59
0.68
0.84
1.22
1.63
2.54 BSC
0.36
0.40
17.65
18.42
30 _NOM
12.07
12.57
10.92
11.43
2.29
2.66
OPEN
GROUND
+VOUT
+VSUPPLY
–VOUT
OPEN
CASE 867-08
ISSUE N
UNIBODY PACKAGE
-TC
A
E
-Q-
U
N
V
B
R
PIN 1
PORT #1
POSITIVE
PRESSURE
(P1)
-P0.25 (0.010)
M
T Q
6
M
5
4
3
2
1
S
K
J
0.13 (0.005)
M
T P
S
D 6 PL
Q S
G
F
NOTES:
1. DIMENSIONING AND TOLERANCING PER
ANSI Y14.5M, 1982.
2. CONTROLLING DIMENSION: INCH.
DIM
A
B
C
D
E
F
G
J
K
N
P
Q
R
S
U
V
INCHES
MILLIMETERS
MAX
MIN
MIN MAX
28.45
27.43
1.080 1.120
19.30
18.80
0.740 0.760
16.51
16.00
0.630 0.650
0.84
0.68
0.027 0.033
4.57
4.06
0.160 0.180
1.63
1.22
0.048 0.064
0.100 BSC
2.54 BSC
0.41
0.36
0.014 0.016
6.10
5.59
0.220 0.240
2.03
1.78
0.070 0.080
4.06
3.81
0.150 0.160
4.06
3.81
0.150 0.160
11.68
11.18
0.440 0.460
18.42
17.65
0.695 0.725
21.84
21.34
0.840 0.860
4.93
4.62
0.182 0.194
STYLE 1:
PIN 1.
2.
3.
4.
5.
6.
VOUT
GROUND
VCC
V1
V2
VEX
CASE 867F-03
ISSUE D
UNIBODY PACKAGE
MPX5010
10
Sensors
Freescale Semiconductor
Pressure
PACKAGE DIMENSIONS
PAGE 1 OF 2
CASE 867B-04
ISSUE G
UNIBODY PACKAGE
MPX5010
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PACKAGE DIMENSIONS
PAGE 2 OF 2
CASE 867B-04
ISSUE G
UNIBODY PACKAGE
MPX5010
12
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Freescale Semiconductor
Pressure
PACKAGE DIMENSIONS
PAGE 1 OF 2
CASE 1351-01
ISSUE A
SMALL OUTLINE PACKAGE
MPX5010
Sensors
Freescale Semiconductor
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PACKAGE DIMENSIONS
PAGE 2 OF 2
CASE 1351-01
ISSUE A
SMALL OUTLINE PACKAGE
MPX5010
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Freescale Semiconductor
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PACKAGE DIMENSIONS
PAGE 1 OF 2
CASE 1369-01
ISSUE B
SMALL OUTLINE PACKAGE
MPX5010
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PACKAGE DIMENSIONS
PAGE 2 OF 2
CASE 1369-01
ISSUE B
SMALL OUTLINE PACKAGE
MPX5010
16
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Freescale Semiconductor
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PACKAGE DIMENSIONS
PAGE 1 OF 3
1560-03
ISSUE C
SMALL OUTLINE PACKAGE
MPX5010
Sensors
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PACKAGE DIMENSIONS
PAGE 2 OF 3
CASE 1560-03
ISSUE D
SMALL OUTLINE PACKAGE
MPX5010
18
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Freescale Semiconductor
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PACKAGE DIMENSIONS
PAGE 3 OF 3
CASE 1560-03
ISSUE D
SMALL OUTLINE PACKAGE
MPX5010
Sensors
Freescale Semiconductor
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PACKAGE DIMENSIONS
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MPX5010
Rev. 12
09/2009
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