4N35, 4N36, 4N37 OPTOCOUPLERS SOES021C – NOVEMBER 1981 – REVISED APRIL 1998 COMPATIBLE WITH STANDARD TTL INTEGRATED CIRCUITS D D D D D D Gallium-Arsenide-Diode Infrared Source Optically Coupled to a Silicon npn Phototransistor High Direct-Current Transfer Ratio High-Voltage Electrical Isolation 1.5-kV, 2.5-kV, or 3.55-kV Rating High-Speed Switching tr = 7 µs, tf = 7 µs Typical Typical Applications Include Remote Terminal Isolation, SCR and Triac Triggers, Mechanical Relays and Pulse Transformers Safety Regulatory Approval UL/CUL, File No. E65085 DCJ† OR 6-TERMINAL DUAL-IN-LINE PACKAGE (TOP VIEW) ANODE CATHODE NC 1 6 2 5 3 4 BASE COLLECTOR EMITTER †4N35 only NC – No internal connection schematic ANODE BASE COLLECTOR CATHODE NC EMITTER absolute maximum ratings at 25°C free-air temperature (unless otherwise noted)† Input-to-output peak voltage (8-ms half sine wave): 4N35 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 3.55 kV 4N36 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2.5 kV 4N37 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1.5 kV Input-to-output root-mean-square voltage (8-ms half sine wave): 4N35 . . . . . . . . . . . . . . . . . . . . . . . . . 2.5 kV 4N36 . . . . . . . . . . . . . . . . . . . . . . . . 1.75 kV 4N37 . . . . . . . . . . . . . . . . . . . . . . . . 1.05 kV Collector-base voltage . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 70 V Collector-emitter voltage (see Note 1) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 30 V Emitter-base voltage . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7 V Input-diode reverse voltage . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 6 V Input-diode forward current: Continuous . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 60 mA Peak (1 µs, 300 pps) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 3 A Phototransistor continuous collector current . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 100 mA Continuous total power dissipation at (or below) 25°C free-air temperature: Infrared-emitting diode (see Note 2) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 100 mW Phototransistor (see Note 3) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 300 mW Continuous power dissipation at (or below) 25°C lead temperature: Infrared-emitting diode (see Note 4) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 100 mW Phototransistor (see Note 5) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 500 mW Operating temperature range, TA . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . – 55°C to 100°C Storage temperature range, Tstg . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . – 55°C to 150°C Lead temperature 1,6 mm (1/16 inch) from case for 10 seconds . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 260°C † Stresses beyond those listed under “absolute maximum ratings” may cause permanent damage to the device. These are stress ratings only, and functional operation of the device at these conditions is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability. NOTES: 1. This value applies when the base-emitter diode is open-circulated. 2. Derate linearly to 100°C free-air temperature at the rate of 1.33 mW/°C. 3. Derate linearly to 100°C free-air temperature at the rate of 4 mW/°C. 4. Derate linearly to 100°C lead temperature at the rate of 1.33 mW/°C. Lead temperature is measured on the collector lead 0.8 mm (1/32 inch) from the case. 5. Derate linearly to 100°C lead temperature at the rate of 6.7 mW/°C. Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet. Copyright 1998, Texas Instruments Incorporated PRODUCTION DATA information is current as of publication date. Products conform to specifications per the terms of Texas Instruments standard warranty. Production processing does not necessarily include testing of all parameters. POST OFFICE BOX 655303 • DALLAS, TEXAS 75265 1 4N35, 4N36, 4N37 OPTOCOUPLERS SOES021C – NOVEMBER 1981 – REVISED APRIL 1998 electrical characteristics at 25°C free-air temperature (unless otherwise noted) PARAMETER TEST CONDITIONS V(BR)CBO V(BR)CEO Collector-base breakdown voltage V(BR)EBO IR Emitter-base breakdown voltage IIO Input-to-output current IC(on) ( ) Collector-emitter breakdown voltage Input diode static reverse current On-state collector current Off-state collector current hFE Transistor static forward current transfer ratio VCE(sat) rIO IE = 0, IB = 0, IF = 0 IF = 0 IE = 100 µA, VR = 6 V IC = 0, IF = 0 VIO = rated peak value, VCE = 10 V, IF = 10 mA, IC(off) VF IC = 100 µA, IC = 10 mA, Input diode static forward voltage Collector-emitter saturation voltage Input-to-output internal resistance MIN 70† TYP VCE = 10 V, TA = – 55°C IF = 10 mA, VCE = 10 V, TA = 100°C IF = 10 mA, IB = 0, VCE = 10 V, VCE = 30 V, TA = 100°C IF = 0 IF = 0, IB = 0 IB = 0, VCE = 5 V, IF = 10 mA IC = 10 mA, IF = 0 IF = 10 mA, IF = 10 mA, TA = – 55°C TA = 100°C IC = 0.5 mA, VIO = 500 V, IF = 10 mA, See Note 6 UNIT V 30† 7† V V t = 8 ms IB = 0 IB = 0, MAX 10† µA 100 mA 10† 4† mA 4† 1 50 nA 500† µA 0.8† 0.9† 1.5† 1.7† V 0.7† 1.4† 0.3† 500 IB = 0 mA V Ω 1011† Cio Input-to-output capacitance VIO = 0, f = 1 MHz, See Note 6 1 2.5† pF † JEDEC registered data NOTE 6: These parameters are measured between both input-diode leads shorted together and all the phototransistor leads shorted together. switching characteristics at 25°C free-air temperature† PARAMETER ton toff Time-on time Turn-off time TEST CONDITIONS VCC = 10 V, RL = 100 Ω, IC(on) = 2 mA, See Figure 1 † JEDEC registered data 2 POST OFFICE BOX 655303 • DALLAS, TEXAS 75265 MIN TYP MAX 7 10 7 10 UNIT µs 4N35, 4N36, 4N37 OPTOCOUPLERS SOES021C – NOVEMBER 1981 – REVISED APRIL 1998 PARAMETER MEASUREMENT INFORMATION 47 Ω Input Input Output (see Note B) + – VCC = 10 V 0V ton toff Output 90% RL = 100 Ω 10% VOLTAGE WAVEFORMS TEST CIRCUIT NOTES: A. The input waveform is supplied by a generator with the following characteristics: ZO = 50 Ω, tr ≤ 15 ns, duty cycle 1%, tw = 100 µs. B. The output waveform is monitored on an oscilloscope with the following characteristics: tr ≤ 12 ns, Rin ≥ 1 MΩ, Cin ≤ 20 pF. Figure 1. Switching Times OFF-STATE COLLECTOR CURRENT vs FREE-AIR TEMPERATURE I C(off) – Off-State Collector Current – nA 10,000 VCE = 10 V IB = 0 IF = 0 4,000 1,000 400 100 40 10 4 1 0.4 0.1 0 10 20 30 40 50 60 70 80 TA – Free-Air Temperature – °C 90 100 Transistor Static Forward Current Transfer Ratio (Normalized) TYPICAL CHARACTERISTICS TRANSISTOR STATIC FORWARD CURRENT TRANSFER RATIO (NORMALIZED) vs ON-STATE COLLECTOR CURRENT 1.6 1.4 VCE = 5 V IF = 0 TA = 25°C 1.2 1 0.8 0.6 0.4 0.2 0 0.1 Normalized to 1 V at IC = 1 mA 0.2 0.4 1 2 4 10 20 40 100 IC(on) – On-State Collector Current – mA Figure 2 Figure 3 POST OFFICE BOX 655303 • DALLAS, TEXAS 75265 3 4N35, 4N36, 4N37 OPTOCOUPLERS SOES021C – NOVEMBER 1981 – REVISED APRIL 1998 TYPICAL CHARACTERISTICS COLLECTOR CURRENT vs MODULATION FREQUENCY INPUT-DIODE FORWARD CONDUCTION CHARACTERISTICS 160 10 VCC = 10 V IB = 0 TA = 25°C 140 TA = 25°C RL = 100 Ω 2 I F – Forward Current – mA I C – Collector Current – mA 4 1 RL = 1 Ω 0.4 0.2 0.1 RL = 475 Ω 120 100 TA = 70°C 80 60 40 0.04 0.02 20 0.01 0 TA = 25°C 1 4 10 40 100 400 1000 0 0.2 0.4 0.6 Figure 4 1.6 1.8 2 IB = 0 TA = 25°C See Note A 50 I C – Collector Current – mA I C – Collector Current – mA 1.4 60 VCE = 10 V IB = 0 TA = 25°C 10 4 1 0.4 0.1 40 Max Continuous Power Dissipation 30 IF = 20 mA 20 IF = 15 mA IF = 10 mA 10 0.04 IF = 5 mA 0 0.4 1 4 10 40 IF – Input-Diode Forward Current – mA 100 0 2 4 6 8 10 Figure 7 POST OFFICE BOX 655303 12 14 16 18 20 VCE – Collector-Emitter Voltage – V NOTE A. Pulse operation of input diode is required for operation beyond limits shown by dotted lines. Figure 6 4 1.2 COLLECTOR CURRENT vs COLLECTOR-EMITTER VOLTAGE 100 0.01 0.1 1 Figure 5 COLLECTOR CURRENT vs INPUT-DIODE FORWARD CURRENT 40 0.8 VF – Forward Voltage – V fmod – Modulation Frequency – kHz • DALLAS, TEXAS 75265 4N35, 4N36, 4N37 OPTOCOUPLERS SOES021C – NOVEMBER 1981 – REVISED APRIL 1998 TYPICAL CHARACTERISTICS ON-STATE COLLECTOR CURRENT (RELATIVE TO VALUE AT 25°C) vs FREE-AIR TEMPERATURE 1.6 On-State Collector Current (Relative to Value at TA = 25 °C) 1.4 1.2 VCE = 10 V IB = 0 IF = 10 mA See Note A 1 0.8 0.6 0.4 0.2 0 – 75 – 50 – 25 0 25 50 75 100 125 TA – Free-Air Temperature – °C NOTE A. These parameters were measured using pulse techniques, tw = 1 ms, duty cycle ≤ 2 %. Figure 8 POST OFFICE BOX 655303 • DALLAS, TEXAS 75265 5 4N35, 4N36, 4N37 OPTOCOUPLERS SOES021C – NOVEMBER 1981 – REVISED APRIL 1998 APPLICATION INFORMATION The devices consist of a gallium-arsenide infrared-emitting diode and an npn silicon phototransistor. Each device is available in a 6-terminal plastic dual-in-line package, shown in Figure 9, or in a DCJ plastic dual surface-mount optocoupler package (see Mechanical Data). 0.370 (9,40) 0.330 (8,38) 6 5 1 2 4 Index Dot (see Note B) 3 (see Note C) C L 0.215 (5,46) 0.115 (2,92) 0.070 (1,78) 0.020 (0,51) C L 0.300 (7,62) T.P. (see Note A) 0.260 (6,61) 0.240 (6,09) 0.070 (1,78) MAX 6 Places Seating Plane 105° 90° 0.040 (1,01) MIN 0.090 (2,29) 0.050 (1,27) 4 Places 0.021 (0,534) 0.015 (0,381) 6 Places 0.150 (3,81) 0.125 (3,17) 0.012 (0,305) 0.008 (0,203) 0.100 (2,54) T.P. (see Note A) NOTES: A. B. C. D. Terminals are within 0.005 (0,13) radius of true position (T.P.) with maximum material condition and unit installed. Terminal 1 identified by index dot. The dimensions given fall within JEDEC MO-001 AM dimensions. All linear dimensions are in inches (millimeters). Figure 9. Plastic Dual-in-Line Package 6 POST OFFICE BOX 655303 • DALLAS, TEXAS 75265 4N35, 4N36, 4N37 OPTOCOUPLERS SOES021C – NOVEMBER 1981 – REVISED APRIL 1998 MECHANICAL DATA DCJ (R-PDSO-G6) PLASTIC DUAL SMALL-OUTLINE OPTOCOUPLER 0.090 (2,29) 0.050 (1,27) 0.100 (2,54) 0.070 (1,78) 0.045 (1,14) 6 4 0.405 (10,29) 0.385 (9,78) 0.008 (0,20) NOM 0.260 (6,60) 0.240 (6,10) 1 Gage Plane 3 0.370 (9,40) 0.330 (8,38) 0°– 5° 0.010 (0,25) 0.030 (0,76) MIN 0.150 (3,81) MAX Seating Plane 0.020 (0,51) MAX 0.004 (0,10) 4073328/A 10/96 NOTES: A. All linear dimensions are in inches (millimeters) B. This drawing is subject to change without notice. C. Terminal 1 identified by index dot. POST OFFICE BOX 655303 • DALLAS, TEXAS 75265 7 IMPORTANT NOTICE Texas Instruments (TI) reserves the right to make changes to its products or to discontinue any semiconductor product or service without notice, and advises its customers to obtain the latest version of relevant information to verify, before placing orders, that the information being relied on is current and complete. TI warrants performance of its semiconductor products and related software to the specifications applicable at the time of sale in accordance with TI’s standard warranty. Testing and other quality control techniques are utilized to the extent TI deems necessary to support this warranty. Specific testing of all parameters of each device is not necessarily performed, except those mandated by government requirements. Certain applications using semiconductor products may involve potential risks of death, personal injury, or severe property or environmental damage (“Critical Applications”). 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Nor does TI warrant or represent that any license, either express or implied, is granted under any patent right, copyright, mask work right, or other intellectual property right of TI covering or relating to any combination, machine, or process in which such semiconductor products or services might be or are used. Copyright 1998, Texas Instruments Incorporated