SAMSUNG M470T5669AZ0

SODIMM
DDR2 SDRAM
DDR2 Unbuffered SODIMM
200pin Unbuffered SODIMM based on 1Gb A-die
64-bit Non-ECC
68FBGA & 84FBGA with Pb-Free
(RoHS compliant)
INFORMATION IN THIS DOCUMENT IS PROVIDED IN RELATION TO SAMSUNG PRODUCTS,
AND IS SUBJECT TO CHANGE WITHOUT NOTICE.
NOTHING IN THIS DOCUMENT SHALL BE CONSTRUED AS GRANTING ANY LICENSE,
EXPRESS OR IMPLIED, BY ESTOPPEL OR OTHERWISE,
TO ANY INTELLECTUAL PROPERTY RIGHTS IN SAMSUNG PRODUCTS OR TECHNOLOGY. ALL
INFORMATION IN THIS DOCUMENT IS PROVIDED
ON AS "AS IS" BASIS WITHOUT GUARANTEE OR WARRANTY OF ANY KIND.
1. For updates or additional information about Samsung products, contact your nearest Samsung office.
2. Samsung products are not intended for use in life support, critical care, medical, safety equipment, or similar
applications where Product failure couldresult in loss of life or personal or physical harm, or any military or
defense application, or any governmental procurement to which special terms or provisions may apply.
* Samsung Electronics reserves the right to change products or specification without notice.
1 of 20
Rev. 1.4 March 2007
SODIMM
DDR2 SDRAM
Table of Contents
1.0 DDR2 Unbuffered DIMM Ordering Information ......................................................................... 4
2.0 Features ........................................................................................................................................ 4
3.0 Address Configuration ................................................................................................................ 4
4.0 Pin Configurations (Front side/Back side) ................................................................................ 5
5.0 Pin Description ............................................................................................................................ 5
6.0 Input/Output Function Description ............................................................................................ 6
7.0 Functional Block Diagram : ........................................................................................................ 7
7.1 1GB, 128Mx64 Module - M470T2864AZ3 .......................................................................................... 7
7.2 512MB, 64Mx64 Module - M470T6464AZ3 ........................................................................................ 8
7.3 2GB, 256Mx64 Module - M470T5669AZ0 .......................................................................................... 9
8.0 Absolute Maximum DC Ratings ................................................................................................ 10
9.0 AC & DC Operating Conditions ................................................................................................ 10
..................................................................... 10
9.2 Operating Temperature Condition ................................................................................................ 11
9.3 Input DC Logic Level .................................................................................................................. 11
9.4 Input AC Logic Level .................................................................................................................. 11
9.5 AC Input Test Conditions ............................................................................................................ 11
10.0 IDD Specification Parameters Definition ............................................................................... 12
11.0 Operating Current Table ......................................................................................................... 13
11.1 M470T2864AZ3 : 128Mx64 1GB Module........................................................................................ 13
11.2 M470T6464AZ3: 64Mx64 512MB Module ..................................................................................... 13
11.3 M470T5669AZ0: 256Mx64 1GB Module ....................................................................................... 14
12.0 Input/Output Capacitance ....................................................................................................... 15
13.0 Electrical Characteristics & AC Timing for DDR2-667/533/400 ............................................ 15
13.1 Refresh Parameters by Device Density ...................................................................................... 15
13.2 Speed Bins and CL, tRCD, tRP, tRC and tRAS for Corresponding Bin ........................................... 15
13.3 Timing Parameters by Speed Grade .......................................................................................... 16
14.0 Physical Dimensions : ............................................................................................................. 18
14.1 64Mbx16 based 128Mx64 Module (2 Rank) - M470T2864AZ3 ......................................................... 18
14.2 64Mbx16 based 64Mx64 Module (1 Rank) - M470T6464AZ3 ........................................................... 19
14.3 st.256Mbx8 based 256Mx64 Module (2 Ranks) - M470T5669AZ0 .................................................... 20
9.1 Recommended DC Operating Conditions (SSTL - 1.8)
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Rev. 1.4 March 2007
SODIMM
DDR2 SDRAM
Revision History
Revision
Month
Year
History
1.0
July
2005
- Initial Release
1.1
August
2005
- Revised IDD Current Values
1.2
March
2006
- Revised Physical Dimensions for 2GB
1.3
September
2006
- Added the VddSPD values
1.4
March
2007
- Corrected the physical dimension
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Rev. 1.4 March 2007
SODIMM
DDR2 SDRAM
1.0 DDR2 Unbuffered DIMM Ordering Information
Part Number
Density
Organization
Component Composition
Number of Rank
Height
M470T6464AZ3-C(L)E6/D5/CC
M470T2864AZ3-C(L)E6/D5/CC
512MB
64Mx64
64Mx16 (K4T1G164QA-C(L)E6/D5/CC)*4
1
30mm
1GB
128Mx64
64Mx16 (K4T1G164QA-C(L)E6/D5/CC)*8
2
30mm
M470T5669AZ0-C(L)E6/D5/CC
2GB
256Mx64
st.256Mx8 (K4T2G074QA-C(L)E6/D5/CC)*8
2
30mm
Note :
1. “Z” of Part number(11th digit) stand for Lead-free products.
2. “3” of Part number(12th digit) stand for Dummy Pad PCB products.
2.0 Features
• Performance range
E6 (DDR2-667)
D5 (DDR2-533)
CC (DDR2-400)
Unit
Speed@CL3
400
400
400
Mbps
Speed@CL4
533
533
400
Mbps
Speed@CL5
667
533
-
Mbps
CL-tRCD-tRP
5-5-5
4-4-4
3-3-3
CK
• JEDEC standard 1.8V ± 0.1V Power Supply
• VDDQ = 1.8V ± 0.1V
• 200 MHz fCK for 400Mb/sec/pin, 267MHz fCK for 533Mb/sec/pin, 333MHz fCK for 667Mb/sec/pin
• 8 Banks
• Posted CAS
• Programmable CAS Latency: 3, 4, 5
• Programmable Additive Latency: 0, 1 , 2 , 3 and 4
• Write Latency(WL) = Read Latency(RL) -1
• Burst Length: 4 , 8(Interleave/nibble sequential)
• Programmable Sequential / Interleave Burst Mode
• Bi-directional Differential Data-Strobe (Single-ended data-strobe is an optional feature)
• Off-Chip Driver(OCD) Impedance Adjustment
• On Die Termination with selectable values(50/75/150 ohms or disable)
• PASR(Partial Array Self Refresh)
• Average Refresh Period 7.8us at lower than a TCASE 85°C, 3.9us at 85°C < TCASE < 95 °C
- support High Temperature Self-Refresh rate enable feature
• Package: 84ball FBGA - 64Mx16, 70ball FBGA - st.256Mx8
• All of Lead-free products are compliant for RoHS
Note : For detailed DDR2 SDRAM operation, please refer to Samsung’s Device operation & Timing diagram.
3.0 Address Configuration
Organization
Row Address
Column Address
Bank Address
Auto Precharge
128Mx8(1Gb) based Module
A0-A13
A0-A9
BA0-BA2
A10
64Mx16(1Gb) based Module
A0-A12
A0-A9
BA0-BA2
A10
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Rev. 1.4 March 2007
SODIMM
DDR2 SDRAM
4.0 Pin Configurations (Front side/Back side)
Pin
1
Front
VREF
Pin
2
Back
VSS
Pin
51
Front
DQS2
Pin
52
Back
DM2
Pin
101
Front
A1
Pin
102
Back
A0
Pin
151
Front
DQ42
Pin
152
Back
DQ46
DQ47
3
VSS
4
DQ4
53
VSS
54
VSS
103
VDD
104
VDD
153
DQ43
154
5
DQ0
6
DQ5
55
DQ18
56
DQ22
105
A10/AP
106
BA1
155
VSS
156
VSS
7
DQ1
8
VSS
57
DQ19
58
DQ23
107
BA0
108
RAS
157
DQ48
158
DQ52
DQ53
9
VSS
10
DM0
59
VSS
60
VSS
109
WE
110
S0
159
DQ49
160
11
DQS0
12
VSS
61
DQ24
62
DQ28
111
VDD
112
VDD
161
VSS
162
VSS
13
15
DQS0
VSS
14
16
DQ6
DQ7
63
65
DQ25
VSS
64
66
DQ29
VSS
113
115
CAS
NC/S1
114
116
ODT0
A13
163
165
NC, TEST
VSS
164
166
CK1
CK1
17
DQ2
18
VSS
67
DM3
68
DQS3
117
VDD
118
VDD
167
DQS6
168
VSS
19
21
DQ3
VSS
20
22
DQ12
DQ13
69
71
NC
VSS
70
72
DQS3
VSS
119
121
NC/ODT1
VSS
120
122
NC
VSS
169
171
DQS6
VSS
170
172
DM6
VSS
23
DQ8
24
VSS
73
DQ26
74
DQ30
123
DQ32
124
DQ36
173
DQ50
174
DQ54
25
27
DQ9
VSS
26
28
DM1
VSS
75
77
DQ27
VSS
76
78
DQ31
VSS
125
127
DQ33
VSS
126
128
DQ37
VSS
175
177
DQ51
VSS
176
178
DQ55
VSS
29
31
DQS1
DQS1
30
32
CK0
CK0
79
81
CKE0
VDD
80
82
NC/CKE1
VDD
129
131
DQS4
DQS4
130
132
DM4
VSS
179
181
DQ56
DQ57
180
182
DQ60
DQ61
33
VSS
34
VSS
83
NC
84
NC
133
VSS
134
DQ38
183
VSS
184
VSS
35
37
DQ10
DQ11
36
38
DQ14
DQ15
85
87
BA2
VDD
86
88
NC
VDD
135
137
DQ34
DQ35
136
138
DQ39
VSS
185
187
DM7
VSS
186
188
DQS7
DQS7
39
VSS
40
VSS
89
A12
90
A11
139
VSS
140
DQ44
189
DQ58
190
VSS
41
VSS
42
VSS
91
A9
92
A7
141
DQ40
142
DQ45
191
DQ59
192
DQ62
DQ63
43
DQ16
44
DQ20
93
A8
94
A6
143
DQ41
144
VSS
193
VSS
194
45
DQ17
46
DQ21
95
VDD
96
VDD
145
VSS
146
DQS5
195
SDA
196
VSS
47
VSS
48
VSS
97
A5
98
A4
147
DM5
148
DQS5
197
SCL
198
SA0
49
DQS2
50
NC
99
A3
100
A2
149
VSS
150
VSS
199
VDDSPD
200
SA1
Note : NC = No Connect; NC, TEST(pin 163)is for bus analysis tool and is not connected on normal memory modules.
5.0 Pin Description
Pin Name
CK0,CK1
Description
Pin Name
Description
Clock Inputs, positive line
SDA
SPD Data Input/Output
CK0,CK1
Clock Inputs, negative line
SA1,SA0
SPD address
CKE0,CKE1
Clock Enables
DQ0~DQ63
Data Input/Output
RAS
Row Address Strobe
DM0~DM7
Data Masks
CAS
Column Address Strobe
DQS0~DQS7
Data strobes
WE
Write Enable
DQS0~DQS7
Data strobes complement
S0,S1
Chip Selects
TEST
Logic Analyzer specific test pin
(No connect on So-DIMM)
A0~A9, A11~A13
Address Inputs
VDD
Core and I/O Power
A10/AP
Address Input/Autoprecharge
VSS
Ground
BA0~BA2
SDRAM Bank Address
VREF
Input/Output Reference
ODT0,ODT1
On-die termination control
VDDSPD
SPD Power
SCL
Serial Presence Detect(SPD) Clock Input
NC
Spare pins, No connect
CK0,CK1
Clock Inputs, positive line
SDA
SPD Data Input/Output
*The VDD and VDDQ pins are tied to the single power-plane on PCB.
5 of 20
Rev. 1.4 March 2007
SODIMM
DDR2 SDRAM
6.0 Input/Output Function Description
Symbol
Type
Description
CK0-CK1
CK0-CK1
Input
The system clock inputs. All address and command lines are sampled on the cross point of the rising edge
of CK and falling edge of CK . A Delay Locked Loop (DLL) circuit is driven from the clock input and output
timing for read operations is synchronized to the input clock.
CKE0-CKE1
Input
Activates the DDR2 SDRAM CK signal when high and deactivates the CK signal when low, By deactivating
the clocks, CKE low initiates the Power Down mode or the Self Refesh mode.
S0-S1
Input
Enables the associated DDR2 SDRAM command decoder when low and disables the command decoder
when high. When the command decoder is disabled, new commands are ignored but previous operations
continue. Rank 0 is selected by S0, Rank 1 is selected by S1. Ranks are also called “Physical banks”.
RAS, CAS, WE
Input
When sampled at the cross point of the rising edge of CK and falling edge of CK, CAS, RAS, and WE
define the operation to be executed by the SDRAM.
BA0~BA2
Input
Selects which DDR2 SDRAM internal bank is activated.
ODT0~ODT1
Input
Asserts on-die termination for DQ, DM, DQS, and DQS signals if enabled via the DDR2 SDRAM Extended
Mode Register Set (EMRS).
A0~A9,
A10/AP,
A11~A13
Input
During a Bank Activate command cycle, defines the row address when sampled at the cross point of the
rising edge of CK and falling edge of CK. During a Read or Write command cycle, defines the column
address when sampled at the cross point of the rising edge of CK and falling edge of CK. In addition to the
column address, AP is used to invoke autoprecharge operation at the end of the burst read or write cycle. If
AP is high, autoprecharge is selected and BA0-BAn defines the bank to be precharged. If AP is low, autoprecharge is disabled. During a Precharge command cycle, AP is used in conjunction with BA0-BAn to control which bank(s) to precharge. If AP is high, all banks will be pecharged regardiess of the state of BA0BAn inputs. If AP is low, then BA0-BAn are used to define which bank to precharge.
DQ0~DQ63
In/Out
Data Input/Output pins.
DM0~DM7
Input
The data write masks, associated with one data byte. In Write mode, DM operates as a byte
mask by allowing input data to be written if it is low but blocks the write operation if it is high. In
Read mode, DM lines have no effect.
DQS0~DQS7
DQS0~DQS7
In/Out
The data strobes, associated with one data byte, sourced with data transfers. In Write mode,
the data strobe is sourced by the controller and is centered in the data window. In Read mode,
the data strobe is sourced by the DDR2 SDRAMs and is sent at the leading edge of the data
window. DQS signals are complements, and timing is relative to the crosspoint of respective
DQS and DQS If the module is to be operated in single ended strobe mode, all DQS signals
must be tied on the system board to VSS and DDR2 SDRAM mode registers programmed appropriately.
VDD,VDD SPD,VSS
Supply
Power supplies for core, I/O, Serial Presence Detect, and ground for the module.
SDA
In/Out
This is a bidirectional pin used to transfer data into or out of the SPD EEPROM. A resistor must be connected to VDD to act as a pull up.
SCL
Input
This signal is used to clock data into and out of the SPD EEPROM. A resistor may be connected from SCL
to VDD to act as a pull up.
SA0~SA1
Input
Address pins used to select the Serial Presence Detect base address.
TEST
In/Out
The TEST pin is reserved for bus analysis tools and is not connected on normal memory modules(SODIMMs).
6 of 20
Rev. 1.4 March 2007
SODIMM
DDR2 SDRAM
7.0 Functional Block Diagram :
7.1 1GB, 128Mx64 Module - M470T2864AZ3
(Populated as 2 rank of x16 DDR2 SDRAMs)
3Ω + 5%
ODT1
ODT0
CKE1
CKE0
S1
S0
DQS0
DQS0
DM0
DQS1
DQS1
DM1
DQS2
DQS2
DM2
DQS3
DQS3
DM3
DQ0
DQ1
DQ2
DQ3
DQ4
DQ5
DQ6
DQ7
DQ8
DQ9
DQ10
DQ11
DQ12
DQ13
DQ14
DQ15
DQ16
DQ17
DQ18
DQ19
DQ20
DQ21
DQ22
DQ23
DQ24
DQ25
DQ26
DQ27
DQ28
DQ29
DQ30
DQ31
LDQS CS C
K
LDQS
E
LDM
I/O 0
I/O 1
D0
I/O 2
I/O 3
I/O 4
I/O 5
I/O 6
I/O 7
UDQS
UDQS
UDM
I/O 8
I/O 9
I/O 10
I/O 11
I/O 12
I/O 13
I/O 14
I/O 15
O
D
T
LDQS CS C
K
LDQS
E
LDM
I/O 0
I/O 1
D1
I/O 2
I/O 3
I/O 4
I/O 5
I/O 6
I/O 7
UDQS
UDQS
UDM
I/O 8
I/O 9
I/O 10
I/O 11
I/O 12
I/O 13
I/O 14
I/O 15
O
D
T
LDQS CS C
K
LDQS
E
LDM
I/O 0
I/O 1
D4
I/O 2
I/O 3
I/O 4
I/O 5
I/O 6
I/O 7
UDQS
UDQS
UDM
I/O 8
I/O 9
I/O 10
I/O 11
I/O 12
I/O 13
I/O 14
I/O 15
O
D
T
LDQS CS C
K
LDQS
E
LDM
I/O 0
I/O 1
D5
I/O 2
I/O 3
I/O 4
I/O 5
I/O 6
I/O 7
UDQS
UDQS
UDM
I/O 8
I/O 9
I/O 10
I/O 11
I/O 12
I/O 13
I/O 14
I/O 15
O
D
T
DQS4
DQS4
DM4
DQS5
DQS5
DM5
DQS6
DQS6
DM6
DQS7
DQS7
DM7
DQ32
DQ33
DQ34
DQ35
DQ36
DQ37
DQ38
DQ39
DQ40
DQ41
DQ42
DQ43
DQ44
DQ45
DQ46
DQ47
DQ48
DQ49
DQ50
DQ51
DQ52
DQ53
DQ54
DQ55
DQ56
DQ57
DQ58
DQ59
DQ60
DQ61
DQ62
DQ63
LDQS CS C
K
LDQS
E
LDM
I/O 0
I/O 1
D2
I/O 2
I/O 3
I/O 4
I/O 5
I/O 6
I/O 7
UDQS
UDQS
UDM
I/O 8
I/O 9
I/O 10
I/O 11
I/O 12
I/O 13
I/O 14
I/O 15
O
D
T
LDQS CS C
K
LDQS
E
LDM
I/O 0
I/O 1
D6
I/O 2
I/O 3
I/O 4
I/O 5
I/O 6
I/O 7
UDQS
UDQS
UDM
I/O 8
I/O 9
I/O 10
I/O 11
I/O 12
I/O 13
I/O 14
I/O 15
O
D
T
LDQS CS C
K
LDQS
E
LDM
I/O 0
I/O 1
D3
I/O 2
I/O 3
I/O 4
I/O 5
I/O 6
I/O 7
UDQS
UDQS
UDM
I/O 8
I/O 9
I/O 10
I/O 11
I/O 12
I/O 13
I/O 14
I/O 15
O
D
T
LDQS CS C
K
LDQS
E
LDM
I/O 0
I/O 1
D7
I/O 2
I/O 3
I/O 4
I/O 5
I/O 6
I/O 7
UDQS
UDQS
UDM
I/O 8
I/O 9
I/O 10
I/O 11
I/O 12
I/O 13
I/O 14
I/O 15
O
D
T
3Ω + 5%
BA0 - BA2
DDR2 SDRAMs D0 - D7
A0 - A13
DDR2 SDRAMs D0 - D7
RAS
DDR2 SDRAMs D0 - D7
CAS
DDR2 SDRAMs D0 - D7
WE
DDR2 SDRAMs D0 - D7
SCL
SA0
SA1
SCL
A0
A1
A2
SPD
SDA
WP
* Clock Wiring
VDDSPD
Serial PD
VREF
DDR2 SDRAMs D0 - D7
VDD
DDR2 SDRAMs D0 - D7, VDD and VDDQ
VSS
DDR2 SDRAMs D0 - D7, SPD
Clock Input
DDR2 SDRAMs
*CK0/CK0
*CK1/CK1
4 DDR2 SDRAMs
4 DDR2 SDRAMs
* Wire per Clock Loading
Table/Wiring Diagrams
Note :
1. DQ,DM, DQS/DQS resistors : 22 Ohms ± 5%.
2. BAx, Ax, RAS, CAS, WE resistors : 3.0 Ohms ± 5%.
7 of 20
Rev. 1.4 March 2007
SODIMM
DDR2 SDRAM
7.2 512MB, 64Mx64 Module - M470T6464AZ3
(Populated as 1 rank of x16 DDR2 SDRAMs)
3Ω + 5%
CKE0
ODT0
S0
DQS0
DQS0
DM0
DQS1
DQS1
DM1
DQS2
DQS2
DM2
DQS3
DQS3
DM3
DQ0
DQ1
DQ2
DQ3
DQ4
DQ5
DQ6
DQ7
DQ8
DQ9
DQ10
DQ11
DQ12
DQ13
DQ14
DQ15
DQ16
DQ17
DQ18
DQ19
DQ20
DQ21
DQ22
DQ23
DQ24
DQ25
DQ26
DQ27
DQ28
DQ29
DQ30
DQ31
LDQS CS O
D
LDQS
T
LDM
I/O 0
I/O 1
D0
I/O 2
I/O 3
I/O 4
I/O 5
I/O 6
I/O 7
UDQS
UDQS
UDM
I/O 8
I/O 9
I/O 10
I/O 11
I/O 12
I/O 13
I/O 14
I/O 15
C
K
E
LDQS CS O
D
LDQS
T
LDM
I/O 0
I/O 1
D1
I/O 2
I/O 3
I/O 4
I/O 5
I/O 6
I/O 7
UDQS
UDQS
UDM
I/O 8
I/O 9
I/O 10
I/O 11
I/O 12
I/O 13
I/O 14
I/O 15
C
K
E
3Ω + 5%
BA0 - BA2
DDR2 SDRAMs D0 - D3
A0 - A13
DDR2 SDRAMs D0 - D3
RAS
DDR2 SDRAMs D0 - D3
CAS
DDR2 SDRAMs D0 - D3
WE
DDR2 SDRAMs D0 - D3
DQS4
DQS4
DM4
DQ32
DQ33
DQ34
DQ35
DQ36
DQ37
DQ38
DQ39
DQS5
DQS5
DM5
DQ40
DQ41
DQ42
DQ43
DQ44
DQ45
DQ46
DQ47
DQS6
DQS6
DM6
DQ48
DQ49
DQ50
DQ51
DQ52
DQ53
DQ54
DQ55
DQS7
DQS7
DM7
SCL
SA0
SA1
DQ56
DQ57
DQ58
DQ59
DQ60
DQ61
DQ62
DQ63
SCL
A0
SPD
A1
A2
LDQS CS O
D
LDQS
T
LDM
I/O 0
I/O 1
D2
I/O 2
I/O 3
I/O 4
I/O 5
I/O 6
I/O 7
UDQS
UDQS
UDM
I/O 8
I/O 9
I/O 10
I/O 11
I/O 12
I/O 13
I/O 14
I/O 15
C
K
E
LDQS CS O
D
LDQS
T
LDM
I/O 0
I/O 1
D3
I/O 2
I/O 3
I/O 4
I/O 5
I/O 6
I/O 7
UDQS
UDQS
UDM
I/O 8
I/O 9
I/O 10
I/O 11
I/O 12
I/O 13
I/O 14
I/O 15
C
K
E
SDA
WP
* Clock Wiring
VDDSPD
Serial PD
Clock Input
DDR2 SDRAMs
VREF
DDR2 SDRAMs D0 - D3
VDD
DDR2 SDRAMs D0 - D3, VDD and VDDQ
*CK0/CK0
*CK1/CK1
2 DDR2 SDRAMs
2 DDR2 SDRAMs
VSS
DDR2 SDRAMs D0 - D3, SPD
* Wire per Clock Loading
Table/Wiring Diagrams
Note :
1. DQ,DM, DQS/DQS resistors : 22 Ohms ± 5%.
2. BAx, Ax, RAS, CAS, WE resistors : 3.0 Ohms ± 5%.
8 of 20
Rev. 1.4 March 2007
SODIMM
DDR2 SDRAM
7.3 2GB, 256Mx64 Module - M470T5669AZ0
(Populated as 2 ranks of x8 DDR2 SDRAMs)
3Ω + 5%
CKE1
ODT1
S1
CKE0
ODT0
S0
DQS0
DQS0
DM0
DQS1
DQS1
DM1
DQS2
DQS2
DM2
DQS3
DQS3
DM3
CS0 O
D
T
0
DQ0
DQ1
DQ2
DQ3
DQ4
DQ5
DQ6
DQ7
DQS
DQS
DM
I/O 0
I/O 1
I/O 2
I/O 3
I/O 4
I/O 5
I/O 6
I/O 7
DQ8
DQ9
DQ10
DQ11
DQ12
DQ13
DQ14
DQ15
CS0 O
DQS
DQS
D
DM
T
0
I/O 8
I/O 9
D1
I/O 10
I/O 11
I/O 12
I/O 13
I/O 14
I/O 15
C
K
E
0
DQ16
DQ17
DQ18
DQ19
DQ20
DQ21
DQ22
DQ23
DQS
DQS
DM
I/O 0
I/O 1
I/O 2
I/O 3
I/O 4
I/O 5
I/O 6
I/O 7
C
K
E
0
DQ24
DQ25
DQ26
DQ27
DQ28
DQ29
DQ30
DQ31
CS0 O
DQS
D
DQS
T
DM
0
I/O 8
I/O 9
D3
I/O 10
I/O 11
I/O 12
I/O 13
I/O 14
I/O 15
C
K
E
0
D0
CS0 O
D
T
0
D2
C
K
E
0
DQS
DQS
DM
I/O 0
I/O 1
I/O 2
I/O 3
I/O 4
I/O 5
I/O 6
I/O 7
CS1 O
D
T
1
D8
CS1 O
DQS
DQS
D
DM
T
1
I/O 8
I/O 9
D9
I/O 10
I/O 11
I/O 12
I/O 13
I/O 14
I/O 15
C
K
E
1
CS1 O
D
T
1
C
K
E
1
DQS
DQS
DM
I/O 0
I/O 1
I/O 2
I/O 3
I/O 4
I/O 5
I/O 6
I/O 7
DQS4
DQS4
DM4
C
K
E
1
DQS5
DQS5
DM5
DQS6
DQS6
DM6
D10
CS1 O
DQS
D
DQS
T
DM
1
I/O 8
I/O 9
D11
I/O 10
I/O 11
I/O 12
I/O 13
I/O 14
I/O 15
DQS7
DQS7
DM7
C
K
E
1
DQ32
DQ33
DQ34
DQ35
DQ36
DQ37
DQ38
DQ39
DQS
DQS
DM
I/O 0
I/O 1
I/O 2
I/O 3
I/O 4
I/O 5
I/O 6
I/O 7
CS0 O
D
T
0
DQ40
DQ41
DQ42
DQ43
DQ44
DQ45
DQ46
DQ47
DQS
DQS
DM
I/O 8
I/O 9
I/O 10
I/O 11
I/O 12
I/O 13
I/O 14
I/O 15
CS0 O
D
T
0
DQ48
DQ49
DQ50
DQ51
DQ52
DQ53
DQ54
DQ55
DQS
DQS
DM
I/O 0
I/O 1
I/O 2
I/O 3
I/O 4
I/O 5
I/O 6
I/O 7
CS0 O
D
T
0
DQ56
DQ57
DQ58
DQ59
DQ60
DQ61
DQ62
DQ63
DQS
DQS
DM
I/O 8
I/O 9
I/O 10
I/O 11
I/O 12
I/O 13
I/O 14
I/O 15
CS0 O
D
T
0
DDR2 SDRAMs D0 - D15
A0 - A13
DDR2 SDRAMs D0 - D15
RAS
DDR2 SDRAMs D0 - D15
CAS
DDR2 SDRAMs D0 - D15
WE
DDR2 SDRAMs D0 - D15
D4
C
K
E
0
D5
C
K
E
0
D6
C
K
E
0
D7
DQS
DQS
DM
I/O 0
I/O 1
I/O 2
I/O 3
I/O 4
I/O 5
I/O 6
I/O 7
CS1 O
D
T
1
DQS
DQS
DM
I/O 8
I/O 9
I/O 10
I/O 11
I/O 12
I/O 13
I/O 14
I/O 15
CS1 O
D
T
1
DQS
DQS
DM
I/O 0
I/O 1
I/O 2
I/O 3
I/O 4
I/O 5
I/O 6
I/O 7
CS1 O
D
T
1
DQS
DQS
DM
I/O 8
I/O 9
I/O 10
I/O 11
I/O 12
I/O 13
I/O 14
I/O 15
CS1 O
D
T
1
C
K
E
1
D12
C
K
E
1
D13
C
K
E
1
D14
C
K
E
1
D15
* Clock Wiring
10Ω + 5%
BA0 - BA2
C
K
E
0
SCL
SA0
SA1
VDDSPD
Serial PD
VREF
DDR2 SDRAMs D0 - D15
VDD
DDR2 SDRAMs D0 - D15, VDD and VDDQ
VSS
DDR2 SDRAMs D0 - D15, SPD
SCL
A0
SPD
A1
A2
WP
SDA
Clock Input
DDR2 SDRAMs
*CK0/CK0
*CK1/CK1
8 DDR2 SDRAMs
8 DDR2 SDRAMs
* Wire per Clock Loading
Table/Wiring Diagrams
Note :
1. DQ,DM, DQS/DQS resistors : 22 Ohms ± 5%.
2. BAx, Ax, RAS, CAS, WE resistors : 10.0 Ohms ± 5%.
9 of 20
Rev. 1.4 March 2007
SODIMM
DDR2 SDRAM
8.0 Absolute Maximum DC Ratings
Symbol
Rating
Units
Notes
Voltage on VDD pin relative to VSS
- 1.0 V ~ 2.3 V
V
1
VDDQ
Voltage on VDDQ pin relative to VSS
- 0.5 V ~ 2.3 V
V
1
VDDL
Voltage on VDDL pin relative to VSS
- 0.5 V ~ 2.3 V
V
1
Voltage on any pin relative to VSS
- 0.5 V ~ 2.3 V
V
1
-55 to +100
°C
1, 2
VDD
VIN, VOUT
TSTG
Parameter
Storage Temperature
Note :
1. Stresses greater than those listed under “Absolute Maximum Ratings” may cause permanent damage to the device. This is a stress rating only and
functional operation of the device at these or any other conditions above those indicated in the operational sections of this specification is not implied.
Exposure to absolute maximum rating conditions for extended periods may affect reliability.
2. Storage Temperature is the case surface temperature on the center/top side of the DRAM. For the measurement conditions, please refer to JESD51-2
standard.
9.0 AC & DC Operating Conditions
9.1 Recommended DC Operating Conditions (SSTL - 1.8)
Symbol
Parameter
Rating
Min.
Typ.
Max.
Units
Notes
VDD
Supply Voltage
1.7
1.8
1.9
V
VDDL
Supply Voltage for DLL
1.7
1.8
1.9
V
4
VDDQ
Supply Voltage for Output
1.7
1.8
1.9
V
4
VREF
Input Reference Voltage
0.49*VDDQ
0.50*VDDQ
0.51*VDDQ
mV
1,2
Termination Voltage
VREF-0.04
VREF
VREF+0.04
V
3
Units
Notes
V
5
VTT
Symbol
VDDSPD
Parameter
Core Supply Voltage
Rating
Min.
Max.
1.7
3.6
Note : There is no specific device VDD supply voltage requirement for SSTL-1.8 compliance. However under all conditions VDDQ must be less than or equal
to VDD.
1. The value of VREF may be selected by the user to provide optimum noise margin in the system. Typically the value of VREF is expected to be about 0.5
x VDDQ of the transmitting device and VREF is expected to track variations in VDDQ.
2. Peak to peak AC noise on VREF may not exceed +/-2% VREF(DC).
3. VTT of transmitting device must track VREF of receiving device.
4. AC parameters are measured with VDD, VDDQ and VDDL tied together.
5. SO-DIMMs that include an optional temperature sensor may require a restricted VDDSPD operating voltage range for proper operation of the temperature
sensor. Refer to the thermal sensor specification for details regarding the supported voltage range. All other functions of the SO-DIMM SPD are
supported across the full VDDSPD range.
10 of 20
Rev. 1.4 March 2007
SODIMM
DDR2 SDRAM
9.2 Operating Temperature Condition
Symbol
Parameter
Rating
Units
Notes
TOPER
Operating Temperature
0 to 95
°C
1, 2, 3
Note :
1. Operating Temperature is the case surface temperature on the center/top side of the DRAM. For the measurement conditions, please refer to
JESD51.2 standard.
2. At 85 - 95 °C operation temperature range, doubling refresh commands in frequency to a 32ms period ( tREFI=3.9 us ) is required, and to enter to self
refresh mode at this temperature range, an EMRS command is required to change internal refresh rate.
9.3 Input DC Logic Level
Symbol
Parameter
Min.
Max.
Units
VIH(DC)
DC input logic high
VREF + 0.125
VDDQ + 0.3
V
VIL(DC)
DC input logic low
- 0.3
VREF - 0.125
V
Notes
9.4 Input AC Logic Level
Symbol
Parameter
VIH(AC)
VIL(AC)
DDR2-400, DDR2-533
DDR2-667
Min.
Max.
Min.
AC input logic high
VREF + 0.250
-
VREF + 0.200
AC input logic low
-
VREF - 0.250
Max.
Units
V
VREF - 0.200
V
9.5 AC Input Test Conditions
Symbol
VREF
VSWING(MAX)
SLEW
Condition
Input reference voltage
Value
Units
Notes
0.5 * VDDQ
V
1
Input signal maximum peak to peak swing
1.0
V
1
Input signal minimum slew rate
1.0
V/ns
2, 3
Note :
1. Input waveform timing is referenced to the input signal crossing through the VIH/IL(AC) level applied to the device under test.
2. The input signal minimum slew rate is to be maintained over the range from VREF to VIH(AC) min for rising edges and the range from VREF to VIL(AC)
max for falling edges as shown in the below figure.
3. AC timings are referenced with input waveforms switching from VIL(AC) to VIH(AC) on the positive transitions and VIH(AC) to VIL(AC) on the negative
transitions.
VDDQ
VIH(AC) min
VIH(DC) min
VSWING(MAX)
VREF
VIL(DC) max
VIL(AC) max
delta TF
Falling Slew =
delta TR
VREF - VIL(AC) max
delta TF
Rising Slew =
VSS
VIH(AC) min - VREF
delta TR
< AC Input Test Signal Waveform >
11 of 20
Rev. 1.4 March 2007
SODIMM
DDR2 SDRAM
10.0 IDD Specification Parameters Definition
(IDD values are for full operating range of Voltage and Temperature)
Symbol
Proposed Conditions
Units
IDD0
Operating one bank active-precharge current;
tCK = tCK(IDD), tRC = tRC(IDD), tRAS = tRASmin(IDD); CKE is HIGH, CS\ is HIGH between valid commands;
Address bus inputs are SWITCHING; Data bus inputs are SWITCHING
mA
IDD1
Operating one bank active-read-precharge current;
IOUT = 0mA; BL = 4, CL = CL(IDD), AL = 0; tCK = tCK(IDD), tRC = tRC (IDD), tRAS = tRASmin(IDD), tRCD =
tRCD(IDD); CKE is HIGH, CS\ is HIGH between valid commands; Address bus inputs are SWITCHING; Data pattern
is same as IDD4W
mA
IDD2P
Precharge power-down current;
All banks idle; tCK = tCK(IDD); CKE is LOW; Other control and address bus inputs are STABLE; Data bus inputs are
FLOATING
mA
IDD2Q
Precharge quiet standby current;
All banks idle; tCK = tCK(IDD); CKE is HIGH, CS\ is HIGH; Other control and address bus inputs are STABLE; Data
bus inputs are FLOATING
mA
IDD2N
Precharge standby current;
All banks idle; tCK = tCK(IDD); CKE is HIGH, CS\ is HIGH; Other control and address bus inputs are SWITCHING;
Data bus inputs are SWITCHING
mA
IDD3P
Active power-down current;
All banks open; tCK = tCK(IDD); CKE is LOW; Other control and address
bus inputs are STABLE; Data bus inputs are FLOATING
IDD3N
Active standby current;
All banks open; tCK = tCK(IDD), tRAS = tRASmax(IDD), tRP = tRP(IDD); CKE is HIGH, CS\ is HIGH between valid
commands; Other control and address bus inputs are SWITCHING; Data bus inputs are SWITCHING
mA
IDD4W
Operating burst write current;
All banks open, Continuous burst writes; BL = 4, CL = CL(IDD), AL = 0; tCK = tCK(IDD), tRAS = tRASmax(IDD), tRP
= tRP(IDD); CKE is HIGH, CS\ is HIGH between valid commands; Address bus inputs are SWITCHING; Data bus
inputs are SWITCHING
mA
IDD4R
Operating burst read current;
All banks open, Continuous burst reads, IOUT = 0mA; BL = 4, CL = CL(IDD), AL = 0; tCK = tCK(IDD), tRAS = tRASmax(IDD), tRP = tRP(IDD); CKE is HIGH, CS\ is HIGH between valid commands; Address bus inputs are SWITCHING; Data pattern is same as IDD4W
mA
IDD5B
Burst auto refresh current;
tCK = tCK(IDD); Refresh command at every tRFC(IDD) interval; CKE is HIGH, CS\ is HIGH between valid commands;
Other control and address bus inputs are SWITCHING; Data bus inputs are SWITCHING
mA
Fast PDN Exit MRS(12) = 0mA
mA
Slow PDN Exit MRS(12) = 1mA
mA
Normal
mA
Low Power
mA
IDD6
Self refresh current;
CK and CK\ at 0V; CKE ≤ 0.2V; Other control and address bus inputs are
FLOATING; Data bus inputs are FLOATING
IDD7
Operating bank interleave read current;
All bank interleaving reads, IOUT = 0mA; BL = 4, CL = CL(IDD), AL = tRCD(IDD)-1*tCK(IDD); tCK = tCK(IDD), tRC =
tRC(IDD), tRRD = tRRD(IDD), tFAW = tFAW(IDD), tRCD = 1*tCK(IDD); CKE is HIGH, CS\ is HIGH between valid
commands; Address bus inputs are STABLE during DESELECTs; Data pattern is same as IDD4R; Refer to the following page for detailed timing conditions
12 of 20
Note
mA
Rev. 1.4 March 2007
SODIMM
DDR2 SDRAM
11.0 Operating Current Table :
11.1 M470T2864AZ3 : 128Mx64 1GB Module
Symbol
667@CL=5
CE6
IDD0
533@CL=4
LE6
CD5
660
IDD1
IDD2P
(TA=0oC, VDD= 1.9V)
LD5
CCC
620
740
120
400@CL=3
580
700
64
Unit
LCC
mA
660
120
64
120
mA
64
mA
IDD2Q
360
360
320
mA
IDD2N
360
360
320
mA
IDD3P-F
320
280
280
mA
IDD3P-S
144
144
144
mA
IDD3N
440
440
400
mA
IDD4W
960
860
740
mA
IDD4R
980
860
720
mA
IDD5
1,060
1,040
1,000
mA
IDD6
120
IDD7
48
120
1,580
48
120
1,540
Notes
48
mA
1,480
mA
* Module IDD was calculated on the basis of component IDD and can be differently measured according to DQ loading cap.
11.2 M470T6464AZ3: 64Mx64 512MB Module
Symbol
667@CL=5
CE6
IDD0
533@CL=4
LE6
CD5
480
IDD1
IDD2P
400@CL=3
LD5
CCC
440
560
60
(TA=0oC, VDD= 1.9V)
420
520
32
60
Unit
LCC
mA
500
32
60
mA
32
mA
IDD2Q
180
180
160
mA
IDD2N
180
180
160
mA
IDD3P-F
160
140
140
mA
IDD3P-S
72
72
72
mA
IDD3N
260
260
240
mA
IDD4W
780
680
580
mA
IDD4R
800
680
560
mA
IDD5
880
860
840
mA
IDD6
IDD7
60
24
1,400
60
24
1,360
60
Notes
24
mA
1,320
mA
* Module IDD was calculated on the basis of component IDD and can be differently measured according to DQ loading cap.
13 of 20
Rev. 1.4 March 2007
SODIMM
DDR2 SDRAM
11.3 M470T5669AZ0: 256Mx64 1GB Module
Symbol
667@CL=5
CE6
(TA=0oC, VDD= 1.9V)
533@CL=4
LE6
CD5
400@CL=3
LD5
CCC
Unit
LCC
IDD0
1,080
1,040
1,000
mA
IDD1
1,160
1,120
1,080
mA
IDD2P
240
128
240
128
240
128
mA
IDD2Q
720
720
640
mA
IDD2N
720
720
640
mA
IDD3P-F
640
560
560
mA
IDD3P-S
288
288
288
mA
IDD3N
840
840
760
mA
IDD4W
1,600
1,400
1,240
mA
IDD4R
1,600
1,400
1,240
mA
IDD5
IDD6
IDD7
2,120
240
2,080
96
2,760
240
2,000
96
2,600
240
Notes
mA
96
mA
2,400
mA
* Module IDD was calculated on the basis of component IDD and can be differently measured according to DQ loading cap.
14 of 20
Rev. 1.4 March 2007
SODIMM
DDR2 SDRAM
12.0 Input/Output Capacitance
(VDD=1.8V, VDDQ=1.8V, TA=25oC)
Parameter
Symbol
Non-ECC
Input capacitance, CK and CK
Max
Min
Max
Min
M470T6464AZ3
Max
Units
M470T5669AZ0
CCK
-
32
-
24
-
48
CI
-
34
-
34
-
42
CIO(400/533)
-
10
-
6
-
10
CIO(667)
-
9
-
5.5
-
9
Input capacitance, CKE , CS, Addr, RAS, CAS, WE
Input/output capacitance, DQ, DM, DQS, DQS
Min
M470T2864AZ3
pF
* DM is internally loaded to match DQ and DQS identically.
13.0 Electrical Characteristics & AC Timing for DDR2-667/533/400
(0 °C < TOPER < 95 °C; VDDQ = 1.8V + 0.1V; VDD = 1.8V + 0.1V)
13.1 Refresh Parameters by Device Density
Parameter
Symbol
Refresh to active/Refresh command time
tRFC
Average periodic refresh interval
tREFI
256Mb
512Mb
1Gb
2Gb
4Gb
Units
75
105
127.5
195
327.5
ns
0 °C ≤ TCASE ≤ 85°C
7.8
7.8
7.8
7.8
7.8
µs
85 °C < TCASE ≤ 95°C
3.9
3.9
3.9
3.9
3.9
µs
13.2 Speed Bins and CL, tRCD, tRP, tRC and tRAS for Corresponding Bin
Speed
DDR2-667(E6)
DDR2-533(D5)
DDR2-400(CC)
Bin(CL - tRCD - tRP)
5-5-5
4-4-4
3-3-3
Units
Parameter
min
max
min
max
min
max
tCK, CL=3
5
8
5
8
5
8
ns
tCK, CL=4
3.75
8
3.75
8
5
8
ns
tCK, CL=5
3
8
3.75
8
-
-
ns
tRCD
15
-
15
-
15
-
ns
tRP
15
-
15
-
15
-
ns
tRC
54
-
55
-
55
-
ns
tRAS
39
70000
40
70000
40
70000
ns
15 of 20
Rev. 1.4 March 2007
SODIMM
DDR2 SDRAM
13.3 Timing Parameters by Speed Grade
(Refer to notes for informations related to this table at the bottom)
Parameter
Symbol
DDR2-667
DDR2-533
DDR2-400
min
max
min
max
min
max
-500
+500
-600
+600
Units
DQ output access time from CK/CK
tAC
-450
+450
DQS output access time from CK/CK
tDQSCK
-400
+400
-450
+450
-500
+500
ps
CK high-level width
tCH
0.45
0.55
0.45
0.55
0.45
0.55
tCK
CK low-level width
tCL
0.45
0.55
0.45
0.55
0.45
0.55
tCK
CK half period
tHP
min(tCL,
tCH)
x
min(tCL,
tCH)
x
min(tCL,
tCH)
x
ps
Clock cycle time, CL=x
tCK
3000
8000
3750
8000
5000
8000
ps
DQ and DM input hold time
tDH(base)
175
x
225
x
275
x
ps
DQ and DM input setup time
tDS(base)
100
x
100
x
150
x
ps
Control & Address input pulse width for
each input
tIPW
0.6
x
0.6
x
0.6
x
tCK
0.35
x
0.35
x
0.35
x
tCK
x
tAC max
x
tAC max
x
tAC max
ps
DQ and DM input pulse width for each input tDIPW
Data-out high-impedance time from CK/CK tHZ
DQS low-impedance time from CK/CK
tLZ(DQS)
DQ low-impedance time from CK/CK
tLZ(DQ)
DQS-DQ skew for DQS and associated DQ
tDQSQ
signals
DQ hold skew factor
tQHS
DQ/DQS output hold time from DQS
tQH
First DQS latching transition to associated
clock edge
ps
tAC min
tAC max
tAC min
tAC max
tAC min
tAC max
ps
2*tACmin
tAC max
2* tACmin
tAC max
2* tACmin
tAC max
ps
x
240
x
300
x
350
ps
x
340
x
400
x
450
ps
tHP - tQHS
x
tHP - tQHS
x
tHP - tQHS
x
ps
tDQSS
-0.25
0.25
-0.25
0.25
-0.25
0.25
tCK
DQS input high pulse width
tDQSH
0.35
x
0.35
x
0.35
x
tCK
DQS input low pulse width
tDQSL
0.35
x
0.35
x
0.35
x
tCK
DQS falling edge to CK setup time
tDSS
0.2
x
0.2
x
0.2
x
tCK
DQS falling edge hold time from CK
tDSH
0.2
x
0.2
x
0.2
x
tCK
Mode register set command cycle time
tMRD
2
x
2
x
2
x
tCK
Write postamble
tWPST
0.4
0.6
0.4
0.6
0.4
0.6
tCK
Write preamble
tWPRE
0.35
x
0.35
x
0.35
x
tCK
Address and control input hold time
tIH(base)
275
x
375
x
475
x
ps
Address and control input setup time
tIS(base)
200
x
250
x
350
x
ps
Read preamble
tRPRE
0.9
1.1
0.9
1.1
0.9
1.1
tCK
Read postamble
tRPST
0.4
0.6
0.4
0.6
0.4
0.6
tCK
Active to active command period for 1KB
page size products
tRRD
7.5
x
7.5
x
7.5
x
ns
Active to active command period for 2KB
page size products
tRRD
10
x
10
x
10
x
ns
Four Activate Window for 1KB page size
products
tFAW
37.5
37.5
37.5
ns
Four Activate Window for 2KB page size
products
tFAW
50
50
50
ns
CAS to CAS command delay
tCCD
2
2
2
tCK
Write recovery time
tWR
15
x
15
x
15
x
ns
WR+tRP
x
WR+tRP
x
WR+tRP
x
tCK
7.5
x
7.5
x
10
x
ns
Auto precharge write recovery + precharge
tDAL
time
Internal write to read command delay
tWTR
Internal read to precharge command delay tRTP
7.5
7.5
7.5
ns
Exit self refresh to a non-read command
tXSNR
tRFC + 10
tRFC + 10
tRFC + 10
ns
Exit self refresh to a read command
tXSRD
200
200
200
tCK
Exit precharge power down to any nonread command
tXP
2
x
16 of 20
2
x
2
x
Note
tCK
Rev. 1.4 March 2007
SODIMM
Parameter
DDR2 SDRAM
Symbol
Exit active power down to read command
tXARD
Exit active power down to read command
(slow exit, lower power)
tXARDS
CKE minimum pulse width
(high and low pulse width)
DDR2-667
DDR2-533
DDR2-400
min
max
min
max
min
max
2
x
2
x
2
x
Units
tCK
7 - AL
6 - AL
6 - AL
tCK
t
CKE
3
3
3
tCK
ODT turn-on delay
t
2
2
2
2
2
2
tCK
ODT turn-on
t
tAC(min)
tAC(max)+
0.7
tAC(min)
tAC(max)+
1
tAC(min)
tAC(max)+1
ns
ODT turn-on(Power-Down mode)
t
tAC(min)+2
2tCK+tAC
(max)+1
ns
ODT turn-off delay
tAOFD
ODT turn-off
AOND
AON
AONPD
2tCK+tAC(
2tCK+tAC(
tAC(min)+2
tAC(min)+2
max)+1
max)+1
2.5
2.5
2.5
2.5
2.5
2.5
tCK
t
tAC(min)
tAC(max)+
0.6
tAC(min)
tAC(max)+
0.6
tAC(min)
tAC(max)+
0.6
ns
ODT turn-off (Power-Down mode)
t
tAC(min)+2
2.5tCK+
2.5tCK+
2.5tCK+tAC
tAC(min)+2 tAC(max)+ tAC(min)+2
tAC(max)+1
(max)+1
1
ns
ODT to power down entry latency
tANPD
3
ODT power down exit latency
tAXPD
8
OCD drive mode output delay
tOIT
0
Minimum time clocks remains ON after
CKE asynchronously drops LOW
tDelay
AOF
AOFPD
3
3
8
12
tIS+tCK
+tIH
0
tIS+tCK
+tIH
17 of 20
tCK
8
12
Note
tCK
0
12
tIS+tCK
+tIH
ns
ns
Rev. 1.4 March 2007
SODIMM
DDR2 SDRAM
14.0 Physical Dimensions :
14.1 64Mbx16 based 128Mx64 Module (2 Rank)
- M470T2864AZ3
Units : Millimeters
3.8 mm
max
67.60 mm
a
1
b
11.40
199
30.00
20.00
4.00 ± 0.10
6.00
2.00
1.1mm
max
47.40
16.25
63.00
2
200
30.00
SPD
a
67.60 mm
DETAIL a
BACK SIDE
FRONT SIDE
4.00 ± 0.10
1.0 ± 0.05
1.0 ± 0.05
2.55
1.50 ± 0.10
1.80 ± 0.10
4.00 ± 0.10
0.20 ± 0.15
4.20
2.70 ± 0.10
DETAIL b
2.40 ± 0.10
4.20
0.60
0.45 ± 0.03
The used device is 64M x16 DDR2 SDRAM, FBGA.
DDR2 SDRAM Part NO : K4T1G164QA
18 of 20
Rev. 1.4 March 2007
SODIMM
DDR2 SDRAM
14.2 64Mbx16 based 64Mx64 Module (1 Rank)
Units : Millimeters
- M470T6464AZ3
3.8 mm
max
67.60 mm
a
1
b
11.40
199
30.00
20.00
4.00 ± 0.10
6.00
SPD
2.00
1.1mm
max
47.40
16.25
63.00
2
200
30.00
a
67.60 mm
DETAIL a
BACK SIDE
FRONT SIDE
4.00 ± 0.10
1.0 ± 0.05
1.0 ± 0.05
2.55
1.50 ± 0.10
1.80 ± 0.10
4.00 ± 0.10
0.20 ± 0.15
4.20
2.70 ± 0.10
DETAIL b
2.40 ± 0.10
0.60
4.20
0.45 ± 0.03
The used device is 64M x16 DDR2 SDRAM, FBGA.
DDR2 SDRAM Part NO : K4T1G164QA
19 of 20
Rev. 1.4 March 2007
SODIMM
DDR2 SDRAM
14.3 st.256Mbx8 based 256Mx64 Module (2 Ranks)
Units : Millimeters
- M470T5669AZ0
3.8 mm
max
67.60 mm
199
1
11.40
a
30.00
20.00
4.00 ± 0.10
SPD
6.00
2.00
47.40 b
1.1mm
max
16.25
63.00
2
200
30.00
a
67.60 mm
DETAIL a
BACK SIDE
FRONT SIDE
4.00 ± 0.10
1.0 ± 0.05
1.0 ± 0.05
2.55
1.50 ± 0.10
1.80 ± 0.10
4.00 ± 0.10
0.20 ± 0.15
4.20
2.70 ± 0.10
DETAIL b
2.40 ± 0.10
0.60
4.20
0.45 ± 0.03
The used device is st.256M x8 DDR2 SDRAM, FBGA.
DDR2 SDRAM Part NO : K4T2G074QA
20 of 20
Rev. 1.4 March 2007