TI CD74HCT354E

[ /Title
(CD74
HC354
,
CD74
HCT35
4)
/Subject
(High
Speed
CMOS
Logic
8-Input
Multip
lexer/
Regis-
CD54HC354, CD74HC354,
CD74HCT354
Semiconductor
8-Line to 1-Line Data Selector/Multiplexer/Register
With 3-State Outputs
SCHS277D - November 1997 - Revised May 2003
Features
Description
• HC/HCT354
- Transparent Data and Select Latches
• Buffered Inputs
• Three-State Complementary Outputs
• Bus Line Driving Capability
• Typical Propagation Delay: VCC = 5V, CL = 15pF,
TA = 25oC
- Data to Output = 18ns
• Fanout (Over Temperature Range)
- Standard Outputs . . . . . . . . . . . . . . . 10 LSTTL Loads
- Bus Driver Outputs . . . . . . . . . . . . . 15 LSTTL Loads
• Wide Operating Temperature Range . . . -55oC to 125oC
• Balanced Propagation Delay and Transition Times
• Significant Power Reduction Compared to LSTTL
Logic ICs
• HC Types
- 2V to 6V Operation
- High Noise Immunity: NIL = 30%, NIH = 30% of VCC
at VCC = 5V
• HCT Types
- 4.5V to 5.5V Operation
- Direct LSTTL Input Logic Compatibility,
VIL= 0.8V (Max), VIH = 2V (Min)
- CMOS Input Compatibility, Il ≤ 1µA at VOL, VOH
The CD54HC354, CD74HC354, and CD74HCT354 are data
selectors/multiplexers that select one of eight sources. In both
types, the data select bits S0, S1 and S2 are stored in
transparent latches that are enabled by a low latch enable
input, LE.
In the HC/HCT354 the data enable input, E, controls
transparent latches that pass data to the outputs when E is
high and latches in new data when E is low.
In both types the three-state outputs are controlled by three
output-enable inputs OE1, OE2, and OE3.
Ordering Information
PART NUMBER
TEMP. RANGE
(oC)
CD54HC354F3A
-55 TO 125
20 Ld CERDIP
CD74HC354E
-55 to 125
20 Ld PDIP
CD74HCT354E
-55 to 125
20 Ld PDIP
Pinout
CD54HC354
(CERDIP)
CD74HC354, CD74HCT354
(PDIP)
TOP VIEW
D7 1
20 VCC
D6 2
19 Y
D5 3
18 Y
D4 4
17 OE3
D3 5
16 OE2
D2 6
15 OE1
D1 7
14 S0
D0 8
13 S1
E 9
12 S2
GND 10
11 LE
CAUTION: These devices are sensitive to electrostatic discharge. Users should follow proper IC Handling Procedures.
Copyright
© 2003, Texas Instruments Incorporated
1
PACKAGE
CD54HC354, CD74HC354, CD74HCT354
Functional Diagram
S0
14
S1
13
S2
12
D0
D1
D2
D3
D4
D5
D6
D7
8
19
7
Y
6
5
4
3
18
2
Y
1
11
LE
15
OE1
16
OE2
17
OE3
9
E
TRUTH TABLE
INPUTS
ENABLE
DATA
SELECT (NOTE 1 )
OUTPUT ENABLES
OUTPUTS
S2
S1
S0
E
OE1
OE2
OE3
Y
Y
X
X
X
X
H
X
X
Z
Z
X
X
X
X
X
H
X
Z
Z
X
X
X
X
X
X
L
Z
Z
L
L
L
L
L
L
H
D0
D0
L
L
L
H
L
L
H
D0n
D0n
L
L
H
L
L
L
H
D1
D1
L
L
H
H
L
L
H
D1n
D1n
L
H
L
L
L
L
H
D2
D2
L
H
L
H
L
L
H
D2n
D2n
L
H
H
L
L
L
H
D3
D3
L
H
H
H
L
L
H
D3n
D3n
H
L
L
L
L
L
H
D4
D4
H
L
L
H
L
L
H
D4n
D4n
H
L
H
L
L
L
H
D5
D5
H
L
H
H
L
L
H
D5n
D5n
H
H
L
L
L
L
H
D6
D6
H
H
L
H
L
L
H
D6n
D6n
2
CD54HC354, CD74HC354, CD74HCT354
TRUTH TABLE (Continued)
INPUTS
ENABLE
DATA
SELECT (NOTE 1 )
OUTPUT ENABLES
OUTPUTS
S2
S1
S0
E
OE1
OE2
OE3
Y
Y
H
H
H
L
L
L
H
D7
D7
H
H
H
H
L
L
H
D7n
D7n
H = High Voltage Level (Steady State); L = Low Voltage Level (Steady State); X = Don’t Care; Z = High Impedance State (Off
State); D0n...D7n = the level of steady-state inputs D0 through D7, respectively, before the most recent low-to-high transition of
data control.
NOTE:
1. This column shows the input address setup with LE low.
Block Diagram
15
OE1
ENABLE LOGIC
16
OE2
17
OE3
E
9
8
D0
7
D1
D
A
T
A
O
F
R
E
G
I
S
T
E
R
S
S
E
L
E
C
T
O
R
6
D2
5
D3
4
D4
3
D5
2
1
D6
1
D7
11
LE
14
S0
13
S1
12
S2
A
D
D
R
E
S
S
18
8
R
E
G
I
S
T
E
R
ADDRESS
DECODE
3
Y
19
Y
BUFFERS
CD54HC354, CD74HC354, CD74HCT354
Logic Diagram
15
OE1
16
OE2
OE3
1 OF 8 LATCHES
VCC
17
P
E
8 (7, 6, 5, 4, 3, 2, 1)
E
D0
P
N
18
Y
N
P
N
GND
E
P
N
E
E
E
VCC
P
19
Y
N
9
TO 7 OTHER
LATCHES
E
OTHER 7
LATCH OUTPUTS
CONNECT HERE
SEL0
GND
TO OTHER 7 LATCHES
SEL0
SEL1
SEL2
SEL3
20
VCC
10
GND
LE
P
N
LE
14
S0
13
S1
12
S2
P
N
LE
LE
LE
LE
P
N
SL0
SL0
P
N
LE
LE
LE
LE
P
N
SL1
SL1
LE
P
N
SL2
SL2
LE
11
LE
LE
LE
FIGURE 1. HC/HCT354 LOGIC DIAGRAM
4
SEL4
SEL5
SEL6
SEL7
CD54HC354, CD74HC354, CD74HCT354
Absolute Maximum Ratings
Thermal Information
DC Supply Voltage, VCC . . . . . . . . . . . . . . . . . . . . . . . . -0.5V to 7V
DC Input Diode Current, IIK
For VI < -0.5V or VI > VCC + 0.5V . . . . . . . . . . . . . . . . . . . . . .±20mA
DC Output Diode Current, IOK
For VO < -0.5V or VO > VCC + 0.5V . . . . . . . . . . . . . . . . . . . .±20mA
DC Drain Current, per Output, IO
For -0.5V < VO < VCC + 0.5V. . . . . . . . . . . . . . . . . . . . . . . . . .±35mA
DC Output Source or Sink Current per Output Pin, IO
For VO > -0.5V or VO < VCC + 0.5V . . . . . . . . . . . . . . . . . . . .±25mA
DC VCC or Ground Current, ICC . . . . . . . . . . . . . . . . . . . . . . . . .±50mA
Thermal Resistance (Typical, Note 2)
θJA (oC/W)
E (PDIP) Package . . . . . . . . . . . . . . . . . . . . . . . . . .
69
Maximum Junction Temperature . . . . . . . . . . . . . . . . . . . . . . . 150oC
Maximum Storage Temperature Range . . . . . . . . . .-65oC to 150oC
Maximum Lead Temperature (Soldering 10s) . . . . . . . . . . . . . 300oC
(SOIC - Lead Tips Only)
Operating Conditions
Temperature Range, TA . . . . . . . . . . . . . . . . . . . . . . -55oC to 125oC
Supply Voltage Range, VCC
HC Types . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .2V to 6V
HCT Types . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .4.5V to 5.5V
DC Input or Output Voltage, VI, VO . . . . . . . . . . . . . . . . . 0V to VCC
Input Rise and Fall Time
2V . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1000ns (Max)
4.5V. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 500ns (Max)
6V . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 400ns (Max)
CAUTION: Stresses above those listed in “Absolute Maximum Ratings” may cause permanent damage to the device. This is a stress only rating and operation
of the device at these or any other conditions above those indicated in the operational sections of this specification is not implied.
NOTE:
2. The package thermal impedance is calculated in accordance with JESD 51-7.
DC Electrical Specifications
TEST
CONDITIONS
PARAMETER
SYMBOL
VI (V)
VIH
-
25oC
IO (mA) VCC (V)
-40oC TO 85oC
-55oC TO 125oC
MIN
TYP
MAX
MIN
MAX
MIN
MAX
UNITS
2
1.5
-
-
1.5
-
1.5
-
V
4.5
3.15
-
-
3.15
-
3.15
-
V
6
4.2
-
-
4.2
-
4.2
-
V
HC TYPES
High Level Input
Voltage
Low Level Input
Voltage
High Level Output
Voltage
CMOS Loads
VIL
VOH
-
VIH or
VIL
High Level Output
Voltage
TTL Loads
(Bus Driver)
Low Level Output
Voltage
CMOS Loads
VOL
VIH or
VIL
Low Level Output
Voltage
TTL Loads
(Bus Driver)
Input Leakage
Current
II
VCC or
GND
-
-
2
-
-
0.5
-
0.5
-
0.5
V
4.5
-
-
1.35
-
1.35
-
1.35
V
6
-
-
1.8
-
1.8
-
1.8
V
-0.02
2
1.9
-
-
1.9
-
1.9
-
V
-0.02
4.5
4.4
-
-
4.4
-
4.4
-
V
-0.02
6
5.9
-
-
5.9
-
5.9
-
V
-6
4.5
3.98
-
-
3.84
-
3.7
-
V
-7.8
6
5.48
-
-
5.34
-
5.2
-
V
0.02
2
-
-
0.1
-
0.1
-
0.1
V
0.02
4.5
-
-
0.1
-
0.1
-
0.1
V
0.02
6
-
-
0.1
-
0.1
-
0.1
V
6
4.5
-
-
0.26
-
0.33
-
0.4
V
7.8
6
-
-
0.26
-
0.33
-
0.4
V
-
6
-
-
±0.1
-
±1
-
±1
µA
5
CD54HC354, CD74HC354, CD74HCT354
DC Electrical Specifications
(Continued)
TEST
CONDITIONS
SYMBOL
VI (V)
Quiescent Device
Current
ICC
VCC or
GND
0
Three-State Leakage
Current
IOZ
VIL or
VIH
High Level Input
Voltage
VIH
Low Level Input
Voltage
High Level Output
Voltage
CMOS Loads
PARAMETER
25oC
IO (mA) VCC (V)
-40oC TO 85oC
-55oC TO 125oC
MIN
TYP
MAX
MIN
MAX
MIN
MAX
UNITS
6
-
-
8
-
80
-
160
µA
VO =
VCC or
GND
6
-
-
±0.5
-
±5.0
-
±10
µA
-
-
4.5 to
5.5
2
-
-
2
-
2
-
V
VIL
-
-
4.5 to
5.5
-
-
0.8
-
0.8
-
0.8
V
VOH
VIH or
VIL
-0.02
4.5
4.4
-
-
4.4
-
4.4
-
V
-4
4.5
3.98
-
-
3.84
-
3.7
-
V
0.02
4.5
-
-
0.1
-
0.1
-
0.1
V
4
4.5
-
-
0.26
-
0.33
-
0.4
V
HCT TYPES
High Level Output
Voltage
TTL Loads
Low Level Output
Voltage
CMOS Loads
VOL
VIH or
VIL
Low Level Output
Voltage
TTL Loads
II
VCC to
GND
-
5.5
-
-
±0.1
-
±1
-
±1
µA
ICC
VCC or
GND
0
5.5
-
-
8
-
80
-
160
µA
Additional Quiescent
Device Current Per
Input Pin: 1 Unit Load
∆ICC
(Note 3)
VCC
-2.1
-
4.5 to
5.5
-
100
360
-
450
-
490
µA
Three-State Leakage
Current
IOZ
VIL or
VIH
VO =
VCC or
GND
5.5
-
-
±0.5
-
±5.0
-
±10
µA
Input Leakage
Current
Quiescent Device
Current
NOTE:
3. For dual-supply systems theoretical worst case (VI = 2.4V, VCC = 5.5V) specification is 1.8mA.
HCT Input Loading Table
INPUT
UNIT LOADS
D0-D7
0.50
S0, S1, S3
0.70
OE1, OE2
0.80
OE3
0.25
LE
0.25
E
0.60
NOTE: Unit Load is ∆ICC limit specified in DC Electrical
Specifications table, e.g., 360µA max at 25oC.
6
CD54HC354, CD74HC354, CD74HCT354
Prerequisite For Switching Specifications
PARAMETER
25oC
-40oC TO 85oC -55oC TO 125oC
SYMBOL
TEST
CONDITIONS
VCC
(V)
MIN
TYP
MAX
MIN
MAX
MIN
MAX
UNITS
tPLH, tPHL
-
2
80
-
-
100
-
120
-
ns
4.5
16
-
-
20
-
24
-
ns
6
14
-
-
17
-
20
-
ns
2
80
-
-
100
-
120
-
ns
4.5
16
-
-
20
-
24
-
ns
6
14
-
-
17
-
20
-
ns
2
50
-
-
65
-
75
-
ns
4.5
10
-
-
13
-
15
-
ns
6
9
-
-
11
-
13
-
ns
2
50
-
-
65
-
75
-
ns
4.5
10
-
-
13
-
15
-
ns
6
9
-
-
11
-
13
-
ns
2
45
-
-
55
-
70
-
ns
4.5
9
-
-
11
-
14
-
ns
6
8
-
-
9
-
12
-
ns
2
45
-
-
55
-
70
-
ns
4.5
9
-
-
11
-
14
-
ns
6
8
-
-
9
-
12
-
ns
HC TYPES
E Pulse Width
LE Pulse Width
tPLH, tPHL
Set-up Times Dn → E
tSU
Set-up Times Sn → LE
-
tSU
Hold Times Dn → E
-
tH
Hold Times Sn → LE
-
-
tH
-
HCT TYPES
E Pulse Width
tPLH, tPHL
-
4.5
16
-
-
20
-
24
-
ns
LE Pulse Width
tPLH, tPHL
-
4.5
16
-
-
20
-
24
-
ns
Set-up Times Dn → E
tSU
-
4.5
10
-
-
13
-
15
-
ns
Set-up Times Sn → LE
tSU
-
4.5
10
-
-
13
-
15
-
ns
Hold Times Dn → E
tH
-
4.5
9
-
-
11
-
14
-
ns
Hold Times Sn → LE
tH
-
4.5
9
-
-
11
-
14
-
ns
Switching Specifications
PARAMETER
Input tr, tf = 6ns
SYMBOL
TEST
CONDITIONS
tPLH, tPHL
CL = 50pF
25oC
-40oC TO 85oC
-55oC TO
125oC
VCC (V)
TYP
MAX
MAX
MAX
UNITS
2
-
210
265
315
ns
4.5
-
42
53
63
ns
6
-
36
45
54
ns
CL = 15pF
5
18
-
-
-
ns
CL = 50pF
2
-
250
315
375
ns
4.5
-
50
63
75
ns
6
-
43
54
64
ns
5
21
-
-
-
ns
HC TYPES
Propagation Delay,
Dn → Y, Y
Propagation Delay,
E → Y, Y
tPLH, tPHL
CL = 15pF
7
CD54HC354, CD74HC354, CD74HCT354
Switching Specifications
PARAMETER
Propagation Delay,
Sn → Y, Y
Propagation Delay,
LE → Y, Y
Output Disabling Time,
OEn to Y, Y
Output Disabling Time,
OE3 to Y, Y
Output Enabling Time,
OEn to Y, Y
Output Enabling Time,
OE3 to Y, Y
Output Transition Time
Input tr, tf = 6ns (Continued)
SYMBOL
TEST
CONDITIONS
tPLH, tPHL
CL = 50pF
tPLH, tPHL
tPLZ, tPHZ
tPLZ, tPHZ
tPZL, tPZH
tPZL, tPZH
tTLH, tTHL
25oC
-40oC TO 85oC
-55oC TO
125oC
VCC (V)
TYP
MAX
MAX
MAX
UNITS
2
-
260
325
390
ns
4.5
-
52
65
78
ns
6
-
44
55
66
ns
CL = 15pF
5
22
-
-
-
ns
CL = 50pF
2
-
290
365
435
ns
4.5
-
58
73
87
ns
6
-
49
62
74
ns
CL = 15pF
5
24
-
-
-
ns
CL = 50pF
2
-
155
195
235
ns
4.5
-
31
39
47
ns
6
-
26
33
40
ns
CL = 15pF
5
13
-
-
-
ns
CL = 50pF
2
-
155
195
235
ns
4.5
-
31
39
47
ns
6
-
26
33
40
ns
CL = 15pF
5
13
-
-
-
ns
CL = 50pF
2
-
150
190
225
ns
4.5
-
30
38
45
ns
6
-
26
33
38
ns
CL = 15pF
5
12, 13
-
-
-
ns
CL = 50pF
2
-
160
200
240
ns
4.5
-
32
40
48
ns
6
-
27
34
41
ns
CL = 15pF
5
12, 13
-
-
-
ns
CL = 50pF
2
-
60
75
90
ns
4.5
-
12
15
18
ns
6
-
10
13
15
ns
Input Capacitance
CI
-
-
-
10
10
10
pF
Three-State Capacitance
CO
-
-
-
20
20
20
pF
Power Dissipation
Capacitance
(Notes 4, 5)
CPD
-
5
90
-
-
-
pF
CL = 50pF
4.5
-
47
59
71
ns
CL = 15pF
5
20
-
-
-
ns
CL = 50pF
4.5
-
54
68
81
ns
CL = 15pF
5
23
-
-
-
ns
HCT TYPES
Propagation Delay,
Dn → Y, Y
tPLH, tPHL
Propagation Delay,
E → Y, Y
tPLH, tPHL
8
CD54HC354, CD74HC354, CD74HCT354
Switching Specifications
Input tr, tf = 6ns (Continued)
SYMBOL
TEST
CONDITIONS
Propagation Delay,
Sn → Y, Y
tPLH, tPHL
Propagation Delay,
LE → Y, Y
tPLH, tPHL
Output Disabling Time,
OEn to Y, Y
tPLZ, tPHZ
Output Disabling Time,
OE3 to Y, Y
tPLZ, tPHZ
Output Enabling Time,
OEn to Y, Y
tPZL, tPZH
Output Enabling Time,
OE3 to Y, Y
tPZL, tPZH
Output Transition Time
tTLH, tTHL
PARAMETER
25oC
-40oC TO 85oC
-55oC TO
125oC
VCC (V)
TYP
MAX
MAX
MAX
UNITS
CL = 50pF
4.5
-
59
74
89
ns
CL = 15pF
5
25
-
-
-
ns
CL = 50pF
4.5
-
63
79
94
ns
CL = 15pF
5
25
-
-
-
ns
CL = 50pF
4.5
-
33
41
50
ns
CL = 15pF
5
13, 16
-
-
-
ns
CL = 50pF
4.5
-
39
49
59
ns
CL = 15pF
5
13, 16
-
-
-
ns
CL = 50pF
4.5
-
34
43
51
ns
CL = 15pF
5
14
-
-
-
ns
CL = 50pF
4.5
-
34
43
51
ns
CL = 15pF
5
14
-
-
-
ns
CL = 50pF
4.5
-
12
15
18
ns
Input Capacitance
CIN
-
-
-
10
10
10
pF
Three-State Capacitance
CO
-
-
-
20
20
20
pF
Power Dissipation
Capacitance
(Notes 4, 5)
CPD
-
5
92
-
-
-
pF
NOTES:
4. CPD is used to determine the dynamic power consumption, per device.
5. PD = VCC2 (CPD + CL) where fi = Input Frequency, CL = Output Load Capacitance, VCC = Supply Voltage.
Test Circuits and Waveforms
tfCL
trCL
CLOCK
90%
10%
tWL + tWH =
I
fCL
tWL
50%
tfCL = 6ns
I
fCL
3V
VCC
50%
10%
tWL + tWH =
trCL = 6ns
CLOCK
50%
2.7V
0.3V
GND
1.3V
0.3V
tWL
tWH
NOTE: Outputs should be switching from 10% VCC to 90% VCC in
accordance with device truth table. For fMAX, input duty cycle = 50%.
1.3V
1.3V
GND
tWH
NOTE: Outputs should be switching from 10% VCC to 90% VCC in
accordance with device truth table. For fMAX, input duty cycle = 50%.
FIGURE 2. HC CLOCK PULSE RISE AND FALL TIMES AND
PULSE WIDTH
FIGURE 3. HCT CLOCK PULSE RISE AND FALL TIMES AND
PULSE WIDTH
9
CD54HC354, CD74HC354, CD74HCT354
Test Circuits and Waveforms
tr = 6ns
(Continued)
tf = 6ns
90%
50%
10%
INPUT
GND
tTLH
90%
INVERTING
OUTPUT
tPHL
FIGURE 4. HC AND HCT TRANSITION TIMES AND PROPAGATION DELAY TIMES, COMBINATION LOGIC
trCL
VCC
90%
GND
tH(H)
3V
2.7V
1.3V
0.3V
GND
tH(H)
tH(L)
VCC
DATA
INPUT
DATA
INPUT
50%
tH(L)
3V
1.3V
1.3V
1.3V
GND
tSU(H)
tSU(H)
tSU(L)
tTLH
90%
OUTPUT
tTHL
90%
50%
10%
tTLH
90%
1.3V
OUTPUT
tREM
3V
SET, RESET
OR PRESET
GND
tTHL
1.3V
10%
FIGURE 6. HC SETUP TIMES, HOLD TIMES, REMOVAL TIME,
AND PROPAGATION DELAY TIMES FOR EDGE
TRIGGERED SEQUENTIAL LOGIC CIRCUITS
tPHL
1.3V
GND
IC
CL
50pF
GND
90%
tPLH
50%
IC
tSU(L)
tPHL
tPLH
tREM
VCC
SET, RESET
OR PRESET
tfCL
CLOCK
INPUT
50%
10%
tPLH
FIGURE 5. HCT TRANSITION TIMES AND PROPAGATION
DELAY TIMES, COMBINATION LOGIC
tfCL
trCL
tTLH
1.3V
10%
tPLH
tPHL
GND
tTHL
90%
50%
10%
INVERTING
OUTPUT
3V
2.7V
1.3V
0.3V
INPUT
tTHL
CLOCK
INPUT
tf = 6ns
tr = 6ns
VCC
CL
50pF
FIGURE 7. HCT SETUP TIMES, HOLD TIMES, REMOVAL TIME,
AND PROPAGATION DELAY TIMES FOR EDGE
TRIGGERED SEQUENTIAL LOGIC CIRCUITS
10
CD54HC354, CD74HC354, CD74HCT354
Test Circuits and Waveforms
6ns
(Continued)
6ns
OUTPUT
DISABLE
tr
VCC
90%
50%
10%
OUTPUTS
ENABLED
OUTPUT HIGH
TO OFF
50%
OUTPUTS
DISABLED
FIGURE 8. HC THREE-STATE PROPAGATION DELAY
WAVEFORM
OTHER
INPUTS
TIED HIGH
OR LOW
OUTPUT
DISABLE
IC WITH
THREESTATE
OUTPUT
GND
1.3V
tPZH
90%
OUTPUTS
ENABLED
OUTPUTS
ENABLED
0.3
10%
tPHZ
tPZH
90%
3V
tPZL
tPLZ
OUTPUT LOW
TO OFF
50%
OUTPUT HIGH
TO OFF
6ns
GND
10%
tPHZ
tf
2.7
1.3
tPZL
tPLZ
OUTPUT LOW
TO OFF
6ns
OUTPUT
DISABLE
1.3V
OUTPUTS
DISABLED
OUTPUTS
ENABLED
FIGURE 9. HCT THREE-STATE PROPAGATION DELAY
WAVEFORM
OUTPUT
RL = 1kΩ
CL
50pF
VCC FOR tPLZ AND tPZL
GND FOR tPHZ AND tPZH
NOTE: Open drain waveforms tPLZ and tPZL are the same as those for three-state shown on the left. The test circuit is Output RL = 1kΩ to
VCC, CL = 50pF.
FIGURE 10. HC AND HCT THREE-STATE PROPAGATION DELAY TEST CIRCUIT
11
PACKAGE OPTION ADDENDUM
www.ti.com
9-Oct-2007
PACKAGING INFORMATION
Orderable Device
Status (1)
Package
Type
CD54HC354F3A
ACTIVE
CDIP
J
20
1
TBD
A42 SNPB
N / A for Pkg Type
CD74HC354E
ACTIVE
PDIP
N
20
20
Pb-Free
(RoHS)
CU NIPDAU
N / A for Pkg Type
CD74HC354EE4
ACTIVE
PDIP
N
20
20
Pb-Free
(RoHS)
CU NIPDAU
N / A for Pkg Type
CD74HCT354E
ACTIVE
PDIP
N
20
20
Pb-Free
(RoHS)
CU NIPDAU
N / A for Pkg Type
CD74HCT354EE4
ACTIVE
PDIP
N
20
20
Pb-Free
(RoHS)
CU NIPDAU
N / A for Pkg Type
Package
Drawing
Pins Package Eco Plan (2)
Qty
Lead/Ball Finish
MSL Peak Temp (3)
(1)
The marketing status values are defined as follows:
ACTIVE: Product device recommended for new designs.
LIFEBUY: TI has announced that the device will be discontinued, and a lifetime-buy period is in effect.
NRND: Not recommended for new designs. Device is in production to support existing customers, but TI does not recommend using this part in
a new design.
PREVIEW: Device has been announced but is not in production. Samples may or may not be available.
OBSOLETE: TI has discontinued the production of the device.
(2)
Eco Plan - The planned eco-friendly classification: Pb-Free (RoHS), Pb-Free (RoHS Exempt), or Green (RoHS & no Sb/Br) - please check
http://www.ti.com/productcontent for the latest availability information and additional product content details.
TBD: The Pb-Free/Green conversion plan has not been defined.
Pb-Free (RoHS): TI's terms "Lead-Free" or "Pb-Free" mean semiconductor products that are compatible with the current RoHS requirements
for all 6 substances, including the requirement that lead not exceed 0.1% by weight in homogeneous materials. Where designed to be soldered
at high temperatures, TI Pb-Free products are suitable for use in specified lead-free processes.
Pb-Free (RoHS Exempt): This component has a RoHS exemption for either 1) lead-based flip-chip solder bumps used between the die and
package, or 2) lead-based die adhesive used between the die and leadframe. The component is otherwise considered Pb-Free (RoHS
compatible) as defined above.
Green (RoHS & no Sb/Br): TI defines "Green" to mean Pb-Free (RoHS compatible), and free of Bromine (Br) and Antimony (Sb) based flame
retardants (Br or Sb do not exceed 0.1% by weight in homogeneous material)
(3)
MSL, Peak Temp. -- The Moisture Sensitivity Level rating according to the JEDEC industry standard classifications, and peak solder
temperature.
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Addendum-Page 1
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