SPECIFICATION • Supplier : Samsung electro-mechanics • Samsung P/N: RC2012F***CS • Product : Thick - Film chip RESISTOR • Description : 2012, ±1%, (1Ω~1㏁), 1/8W A. Samsung Part Number RC 2012 F *** CS ① ③ ④ ⑤ ② ① Code designation Samsung Thick - Film Chip Resistor ② Dimension 2012 (mm code) ③ Resistancs tolerance L: 2.0 ± 0.2 W : 1.25 ± 0.15 T : 0.5 ± 0.1 mm mm mm ±1 % ④ Nominal resistance value ※3digits -Left 2 digits : Resistance value, Right 1 digits : Exponential number of 10. ex) 101 : 10×101 = 10×10 = 100Ω ※4digits -Left 3 digits : Resistance value, Right 1 digits : Exponential number of 10. ex) 4222 : 422×102 = 422×100 = 42.2㏀ Read alphabet "R" as decimal point "000" : Jumper(0Ω) ex) 3R7 : 3.7 = 3.7Ω / 88R7 : 88.7 = 88.7Ω ⑤ Packing code 7" Reel packaging B. Samsung Reliablility Test and Judgement condition Judgement Resistor Direct Current Within the regulated resistance Resistance tolerance. Short-time Less than ±(1%+0.1Ω)of the initial value Overload No evidence of mechanical damage Intermittent Less than ±(3%+0.1Ω)of the initial value Overload Dielectric Resistor Jumper 50mΩ Max Voltage apply Within 5 sec 50mΩ Max Apply 2.5 times rated voltage for 5sec Max Surge Current 2.5 times of rated voltage. Max Surge No evidence of mechanical damage 1 sec On, 25 sec Off / 10,000cycles Current No evidence of mechanical damage Apply Voltage for 1minute Withstanding Voltage Insulation Test condition Jumper 50mΩ Max 0603:50v Over 1,000MΩ Resistance 1005,1608:100v Other: 500v ■ J-Grade Test Temperature(℃) 20℃→-55℃/20℃→125℃ Temperature 1Ω≤R<10Ω:+300/-200ppm/℃ T.C.R(ppm/℃) Characteristic 10Ω≤R≤1MΩ:±100ppm/℃(0603±250ppm) = R − R0 1 × × 106 R0 T − T0 1MΩ<R≤10MΩ:±300ppm/℃ ■ F-Grade 10Ω≤R≤1MΩ:±100ppm/℃(0603±250ppm) Solderability Coverage: 95%≤ each termination. T0 : 20 ± 2℃, R0 : Resistance at T0 (Ω) T : Test temperature , R : Resistance at T (Ω) Solder Temp : 245℃ Dipping time : 3 sec Judgement Bending test Adhesive strength Test condition Less than ±(0.5%+0.05Ω)of the initial value 50mΩ Max 3mm of bending shall be applied No evidence of mechanical damage for 5sec. No mechanical damage or sign of disconnection Test strengh : 5N of termination Test time: Applying pressure for 10seconds Resistance to Less than ±(1%+0.05Ω)of the initial value soldering heat No evidence of mechanical damage Anti-Vibration Less than ±(1%+0.05Ω)of the initial value test No evidence of mechanical damage Temperature Less than ±(1%+0.1Ω)of the initial value cycle No evidence of mechanical damage Load life Less than ±(3%+0.1Ω)of the initial value 50mΩ Max 260±5℃ , 10 sec 50mΩ Max Test amplitude : 1.5mm Frequency 10㎐-55㎐-10㎐ / 2hr in x,y,z direction. 50mΩ Max 50mΩ Max No evidence of mechanical damage Low Temp. Less than ±(3%+0.1Ω)of the initial value Exposure No evidence of mechanical damage High Temp Less than ±(3%+0.1Ω)of the initial value Exposure No evidence of mechanical damage Moisture Less than ±(3%+0.1Ω)of the initial value Resistance No evidence of mechanical damage 100cycles, -55℃/30min ↔125℃/30min sweep time:5min Test voltage: rated voltage / 70±2℃ 1,000hours(90min:On , 30min:Off) 50mΩ Max Dwell in -55℃ chamber without loading for 1,000hours 50mΩ Max Dwel in 125℃ or 155℃ chamber without loading for 1,000hours 50mΩ Max Test voltage: rated voltage / 40±2℃ 1,000hours(90min:On,30min:Off) / 90~95% RH C. Recommended Soldering method : Reflow ( Reflow Peak Temperature : 260+0/-5℃, 10sec. Max ) * For the more detail Specification, Please refer to the samsung chip RESISTOR catalogue.