SPANSION S25FL032P0XMFI01

S25FL-A to S25FL-P Migration Guide
Application Note
Author: Doug Kearns
1. Introduction
The S25FL-A Serial Peripheral Interface (SPI) NOR Flash family made on the Spansion® 200 nm MirrorBit®
process is obsolete. The S25FL-P Serial Peripheral Interface (SPI) NOR Flash family made on the Spansion
90 nm MirrorBit process is a suitable replacement. This application note discusses the specification
differences that must be considered when migrating from a S25FL-A to a S25FL-P flash device on an existing
design.
2. Feature Comparison
The S25FL-P is a feature enhanced SPI family that supports all legacy features of the S25FL-A SPI family.
Table 2.1 details the feature similarities and differences between the S25FL-A and S25FL-P families. The
most significant new feature in the S25FL-P family is the ability to support single, dual, or quad mode reads
within the same device. Note that use and enabling of this and of all the additional features supported by the
S25FL-P are strictly optional. A S25FL-P device will behave as a single I/O, uniform sector SPI flash device,
equivalent to the S25FL-A, unless the additional features are enabled by system software or hardware.
Table 2.1 Feature Comparison
Feature
MirrorBit NOR process technology
Supply Voltage VCC Range
Operating Temperature Range
Density Options
IO Quantity
S25FL-A
S25FL-P
200 nm
90 nm
2.7 – 3.6 V
2.7 – 3.6 V
–40 to +85°C
–40 to +85°C
4, 8, 16, 32, 64 Mbit
32, 64, 128 Mbit
x1
x1, x2, x4
Clock Speed (Standard Read, Single IO)
33 MHz
40 MHz
Clock Speed (Fast Read, Single IO)
50 Mhz
104 MHz
4, 12, 16 KB (1)
4 KB (2)(3)
Uniform Sector Size
Boot Parameter Sector Size
64 KB
64, 256 KB (4)
Program Page (max)
256 B
256 B
Accelerated Programming
No
Yes (5)
Quad-Page Programming
No
Yes
Erase and Program Status SR Bits
No
Yes
Configuration Register
No
Yes
JEDEC standard two-byte Signature
Yes
Yes
RES single byte legacy Signature
Yes
Yes
Extended RDID Cycles
No
Yes
Common Flash Interface (CFI)
No
Yes
Top-down Fractional Array Protection
Yes
Yes
Bottom-up Fractional Array Protection
No
Yes
Full Array Program/Erase Lock Capability
No
Yes (6)
One Time Programmable (OTP Region)
No
506 B
Publication Number S25FL-A_to_S25FL-P_Migration
Revision 01
Issue Date July 27, 2009
A pplication
Note
Notes
1. Boot Sectors only available on S25FL040A models “01” & “02”.
2. Boot Parameter Sectors currently only available on S25FL032P and S25FL064P.
3. Up to thirty two (32) 4 KB parameter sectors.
4. 256 KB Uniform sectors only available on S25FL128P model “01”.
5. Accelerated Programming via application of 9 V to W#/ACC pin on S25FL-P only.
6. Full Array Lock currently only available on S25FL032P and S25FL064P “S” models.
3. Sector Architecture Comparison
The S25FL-A SPI flash was available with several sector (erase block) architectures. The S25FL040A was
available with either a uniform 64 KB sector architecture or boot sector architecture where either the top or
bottom 64 KB of the array is made up of six smaller sectors (two 16 KB, two 4 KB, and two 12 KB boot
sectors). The S25FL008A, S25FL016A, S25FL032A and S25FL064A were only available with uniform 64 KB
sectors.
In comparison, the S25FL032P and S25FL064P devices suitable for S25FL-A replacement support uniform
sector architecture emulation as well as a user configurable top or bottom small boot parameter sector
partition architecture where the user determines, via a configuration bit (TBPARM), whether the top or bottom
128 KB of the array is subdivided into thirty-two 4 KB parameter sectors. Table 3.1 details the sector
architectural differences.
Table 3.1 Comparative Bank and Sector Orientation
Model
Erase Block Quantity
Uniform or
Boot Parameter Architecture
Erase Block Architecture
S25FL040A-00
8
Uniform
16x64 KB
S25FL040A-01
13
Top Boot
7x64 KB + 2x12 KB + 4x4 KB + 2x16 KB
S25FL040A-02
13
Bottom Boot
2x16 KB + 4x4 KB + 2x12 KB + 7x64 KB
S25FL008A
16
Uniform
16 x 64 KB
S25FL016A
32
Uniform
32 x 64 KB
S25FL032A
64
Uniform
64 x 64 KB
S25FL064A
128
Uniform
128 x 64 KB
S25FL032P
64 or
94 or
94
Uniform or
Bottom Boot or
Top Boot
64x64 KB or
32x4 KB + 62x64 KB or
62x64 KB + 32x4 KB
S25FL064P
128 or
158 or
158
Uniform or
Bottom Boot or
Top Boot
128x64 KB or
32x4 KB + 126x64 KB or
126x64 KB + 32x4 KB
In order to facilitate migration from the uniform sector S25FL-A devices to the S25FL-P device family without
system software modification, Spansion has restricted the legacy sector erase command, SE (D8h), to
erasing only 64 KB aligned erase blocks on the S25FL-P. Spansion has added support for two additional boot
parameter sector erase commands, P4E (20h) for erasing individual 4 KB boot parameter sectors, and P8E
(40h) for erasing two adjacent 4 KB boot parameter sectors (8 KB address aligned boot partition group). In
this way, the S25FL-P flash family when operated with legacy software will operate as a uniform 64 KB sector
architecture device family.
In applications where the S25FL-P is to be used as a uniform 64 KB sector device, for example, as a
replacement for a uniform sector S25FL-A device, the TBPARM configuration bit would not be programmed
to set boot parameter sector location and the new P4E and P8E commands would not be used.
4. Command and Register Comparison
The S25FL-P family was designed to support migration from S25FL-A with minimal software changes. All
commands supported by the S25FL-A are supported by the S25FL-P. Several additional commands are
supported by the S25FL-P to enable new features. Table 4.1 provides a support matrix of SPI commands.
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Table 4.1 Software Commands
Code
S25FL-A
S25FL-P
READ
Command
Read Data Bytes
Description
03h
√
√
FAST_READ
High Speed Read Data Bytes
0Bh
√
√
RDID
Read Identification
9Fh
√
√
WREN
Write Enable
06h
√
√
WRDI
Write Disable
04h
√
√
SE
Sector Erase
D8h
√
√ (1)
Bulk Erase
C7h
√
√
Bulk Erase
60h
PP
Page Program
02h
√
√
RDSR
Read from Status Register
05h
√
√
BE
√
WRSR
Write to Status Register
01h
√
√
DP
Deep Power-Down (DPD)
B9h
√
√
RES
Release from DPD
ABh
√
√
DOR
Dual Output Read
3Bh
√
DIOR
Dual I/O High Performance Fast_Read
BBh
√
QOR
Quad Output Read
6Bh
√
QIOR
Quad I/O High Performance Fast_Read
EBh
READ_ID
Read Mfg and Device ID
90h
P4E
4 KB Parameter Sector Erase
20h
√ (1)
P8E
8 KB (2x4 KB) Parameter Sector Erase
40h
√ (1)
QPP
Quad Page Programming
32h
√
RCR
Read Configuration Register
35h
√
√
√ (2)
√
CLSR
Reset Erase and Program Flag
30h
√
OTPP
Program one byte in OTP area
42h
√
OTPR
Read data in OTP area
4Bh
√
Notes
1. In S25FL-P, the SE command only erases 64 KB or 256 KB sectors and the P4E and P8E commands enable erasure of 4 KB boot
parameter sectors.
2. READ_ID command only supported for Top and Bottom boot sector S25FL040A models. Use of JEDEC standard RDID (9Fh) command
is recommended.
When migrating from a uniform sector S25FL-A to a S25FL-P, the only software modifications that may be
required relate to device identification. Table 4.2 provides a RDID (9Fh) returned value matrix for all S25FL-A
and S25FL-P devices, which also includes the Electronic Signature Byte returned with the RES (ABh
command). If migrating between S25FL-A and S25FL-P devices of the same density, no software
modifications to the system software device identification routines are required. When migrating from a
smaller density S25FL-A to a S25FL032P, if the application uses the Device ID or Electronic Signature
values, system software will require modification if the S25FL032A identification values are not supported in
the existing system software.
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Note
Table 4.2 RDID Command (JEDEC 9Fh) Device Identification
Manufacturer ID
Byte 0
Device ID
Byte 1
Device ID
Byte 2
Extended ID
Byte 3
Extended ID
Byte 4
S25FL040A-00 (Uniform)
01h
02h
12h
N/A
N/A
S25FL040A-01 (Top)
01h
02h
25h
N/A
N/A
S25FL040A (Bottom)
01h
02h
26h
N/A
N/A
S25FL008A
01h
02h
13h
N/A
N/A
S25FL016A
01h
02h
14h
N/A
N/A
S25FL032A
01h
02h
15h
N/A
N/A
S25FL064A
01h
02h
16h
N/A
N/A
S25FL032P
01h
02h
15h
4Dh
Reserved
S25FL064P
01h
02h
16h
4Dh
Reserved
S25FL128P (64 KB sectors)
01h
20h
18h
03h
01h
S25FL128P (256 KB sectors)
01h
20h
18h
03h
00h
Device
Note:
Electronic Signature (RES command ABh) outputs Device ID Byte 2. For S25FL040A, 12h is output for all models.
5. DC and AC Specification Comparison
The S25FL-P family was designed to have DC and AC specifications very similar to the S25FL-A to facilitate
migration without modification to system hardware, software, or firmware, e.g. host SPI interface controller
timing. Table 5.1 and Table 5.2 provide side-by-side comparisons of DC and AC parameter differences,
respectively, for single IO applications of the S25FL-A and S25FL-P. Included are comments that indicate the
potential for a given S25FL-P specification difference to impact a migration from a S25FL-A device in an
existing application. It is advised that customers evaluate the potential impact of any parameter specification
difference that has a migration issue severity not equal to “None”.
Table 5.1 DC Parameter Specification Differences
Feature
Output High Voltage VOH (min)
S25FL-A
S25FL-P
Migration Issue Severity
VCC – 0.2 V
VCC – 0.6 V
None
Page Program Current ICC2 (max)
28 mA
26 mA
None
Erase Current ICC4,5 (max)
24 mA
26 mA
None
I/O Leakage Current (max)
± 1 µA
± 2 µA
None
Standby Current ISB (typ / max)
20 / 50 µA
80 / 200 µA
Low
Deep Power-Down Current IPD (typ / max)
1.5 / 5 µA
3 / 10 µA
Low
The higher Standby Current consumption (ISB) and Deep Power-Down Current consumption (IPD) of the
S25FL-P could cause issues when migrating to the S25FL-P from the S25FL-A. If an application requires
minimal idle power consumption, the application software should place the SPI flash in Deep Power-Down
mode using the Deep Power-Down (DP) command to minimize idle power consumption.
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Table 5.2 AC Parameter Specification Differences
Feature
READ Command Clock (max)
Fast Read / other command Clock Frequency (max)
S25FL-A
S25FL-P
Migration Issue Severity
33 MHz (1)
40 MHz
None
50 Mhz
104 MHz
None
Clock Low Period tWH (min)
9 ns
4.5 ns
None
Clock Low Period tWL (min)
9 ns
4.5 ns
None
CS# Setup to SCK tCSS (min)
5 ns
3 ns
None
None
CS# Hold from to SCK tCSH (min)
5 ns
3 ns
CS# High Time tCS (Read Instruction) (min)
100 ns
10 ns
None
CS# High Time tCS (Program/Erase) (min)
100 ns
50 ns
None
5 ns
3 ns
None
DATA Setup to SCK tSU:DAT (min)
DATA Hold from to SCK tHD:DAT (min)
5 ns
2 ns
None
SCK Low to Output Valid tV (single output) (max)
10 ns
8 ns
None
HOLD# Setup to SCK tHLCH (min)
5 ns
3 ns
None
HOLD# Hold from to SCK tHLHH (min)
5 ns
3 ns
None
HOLD# enable to Output Invalid tHZ (max)
10 ns
8 ns
None
HOLD# disable to Output Valid tLZ (max)
10 ns
8 ns
None
CS# disable to Deep Power Down tDP (max)
3 µs
10 µs
Low
Write Protect Set Up Time tWPS (min)
15 ns
20 ns
Low
Write Protect Hold Time tWPH (min)
15 ns
100 ns
Medium
Write Status Register Time tW (max)
150 ns
50 ns
None
1.5 / 3 ms
1.5 / 3 ms
None
n/a
1.2 / 2.4 ms
None
Page Program Time tPP (typ / max)
Accelerated Page Program Time tEP (typ / max)
Sector Erase Time tSE (64 KB sector) (typ / max)
Bulk Erase Time tSE (32 Mbit (2)) (typ / max)
VCC Power Up to Device Ready tPU (min)
0.5 / 3 s
0.5 / 2 s
None
25 / 192 s
32 / 64 s
None
10 ms
300 µs
None
Notes
1. 25 MHz max for S25FL064A.
2. Comparison between identical density S25FL032A and S25FL032P.
The longer transition to Deep Power-Down mode (tDP) from CS# negation of the S25FL-P will not cause
migration issues from the S25FL-A. This specification difference will only have a system level impact on those
battery powered applications with extreme energy storage constraints that frequently re-enter Deep PowerDown mode. The specification difference ramification is a slightly higher overall power consumption
(0.68 mW maximum) for the 7 µs maximum longer transition into Deep Power-Down mode of the S25FL-P
versus the S25FL-A.
The longer Write Protect Set Up time (tWPS) of the S25FL-P is unlikely to cause migration issues from the
S25FL-A. The longer Write Protect Hold time (tWPH) of the S25FL-P may cause migration issues from the
S25FL-A, depending on host SPI and/or GPIO controller timing. Figure 5.1 depicts the relative W# and CS#
inputs edge timing requirements when performing a Write Registers command in the specific case where the
device was in and is returning to the Hardware Protected mode (HPM). HPM is entered by setting the Status
Register Write Disable bit (SRWD = 1) and asserting W# < Vil. The implication of these specification
differences are the W# input must be disabled at least 20 ns prior to CS# assertion initiating a WRR
command entry (a 5 ns increase over the S25FL-A) and the W# input must not be asserted for 100 ns
following CS# negation concluding a WRR command entry (a 85 ns increase over the S25FL-A). If an
application uses the W# and SRWD write protection mode feature, these timing requirements must be
verified to avoid issues when migrating to the S25FL-P from the S25FL-A.
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Note
Figure 5.1 Write Protect Setup and Hold Timing During WRR When SRWD = 1
6. Package Options and Recommended Migration Part Numbers
The S25FL-A and S25FL-P devices are made available in a variety of package options. Table 6.1 provides
details of the different package options by SPI flash family and density. Footprint compatible S25FL-P
migrations options exist for the majority of S25FL-A devices. Table 6.2 details the recommended S25FL-P
ordering part number (OPN) migration path from all S25FL-A OPNs. All packages are supported in Pb-free
plating only.
Table 6.1 SPI Package Options
Device
SO-8 (150 mil)
SO-8 (208 mil)
USON-8
S25FL040A
√
√
√
S25FL008A
√
√
S25FL016A
√
WSON-8
SO-16
√
√
√
S25FL032A
√
S25FL064A
√
√
S25FL064P
√
√
S25FL128P
√
√
S25FL032P
6
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Table 6.2 Recommended Model to Model Migrations
S25FL-A Ordering Part Number
Package
Recommended S25FL-P
Ordering Part Number
Footprint Compatible
S25FL040A0LM(A,F)I00(0,1,3)
SO-8 (208 mil)
S25FL032P0XMFI01(0,1,3)
Yes
S25FL040A0LM(A,F)I01(0,1,3)
SO-8 (208 mil)
S25FL032P0XMFI01(0,1,3)
Yes
S25FL040A0LM(A,F)I02(0,1,3)
SO-8 (208 mil)
S25FL032P0XMFI01(0,1,3)
Yes
S25FL040A0LN(A,F)I00(0,1,3)
USON-8
S25FL032P0XNFI01(0,1,3)
Yes
S25FL040A0LN(A,F)I01(0,1,3)
USON-8
S25FL032P0XNFI01(0,1,3)
Yes
S25FL040A0LN(A,F)I02(0,1,3)
USON-8
S25FL032P0XNFI01(0,1,3)
Yes
S25FL040A0LV(A,F)I00(0,1,3)
SO-8 (150 mil)
S25FL032P0XMFI01(0,1,3)
No
S25FL040A0LV(A,F)I01(0,1,3)
SO-8 (150 mil)
S25FL032P0XMFI01(0,1,3)
No
S25FL040A0LV(A,F)I02(0,1,3)
SO-8 (150 mil)
S25FL032P0XMFI01(0,1,3)
No
S25FL008A0LM(A,F)I00(0,1,3)
SO-8 (208 mil)
S25FL032P0XMFI01(0,1,3)
Yes
S25FL008A0LN(A,F)I00(0,1,3)
USON-8
S25FL032P0XNFI01(0,1,3)
Yes
S25FL016A0LM(A,F)I00(0,1,3)
SO-16
S25FL032P0XMFI00(0,1,3)
Yes
S25FL016A0LM(A,F)I01(0,1,3)
SO-8 (208 mil)
S25FL032P0XMFI01(0,1,3)
Yes
S25FL016A0LN(A,F)I00(0,1,3)
WSON-8
S25FL032P0XNFI00(0,1,3)
Yes
S25FL032A0LM(A,F)I00(0,1,3)
SO-16
S25FL032P0XMFI00(0,1,3)
Yes
S25FL064A0LM(A,F)I00(0,1,3)
SO-16
S25FL064P0XMFI00(0,1,3)
Yes
7. Conclusion
The S25FL-A can be replaced with the S25FL-P in most applications without any hardware or software
modifications. A small number of parameter specification differences exist between these two SPI flash
families and it is important that careful examination of the impact of these specification differences be
reviewed for each design.
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8. Revision History
Section
Description
Revision 01 (July 27, 2009)
Initial release
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Colophon
The products described in this document are designed, developed and manufactured as contemplated for general use, including without
limitation, ordinary industrial use, general office use, personal use, and household use, but are not designed, developed and manufactured as
contemplated (1) for any use that includes fatal risks or dangers that, unless extremely high safety is secured, could have a serious effect to the
public, and could lead directly to death, personal injury, severe physical damage or other loss (i.e., nuclear reaction control in nuclear facility,
aircraft flight control, air traffic control, mass transport control, medical life support system, missile launch control in weapon system), or (2) for
any use where chance of failure is intolerable (i.e., submersible repeater and artificial satellite). Please note that Spansion will not be liable to
you and/or any third party for any claims or damages arising in connection with above-mentioned uses of the products. Any semiconductor
devices have an inherent chance of failure. You must protect against injury, damage or loss from such failures by incorporating safety design
measures into your facility and equipment such as redundancy, fire protection, and prevention of over-current levels and other abnormal
operating conditions. If any products described in this document represent goods or technologies subject to certain restrictions on export under
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The contents of this document are subject to change without notice. This document may contain information on a Spansion product under
development by Spansion. Spansion reserves the right to change or discontinue work on any product without notice. The information in this
document is provided as is without warranty or guarantee of any kind as to its accuracy, completeness, operability, fitness for particular purpose,
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damages of any kind arising out of the use of the information in this document.
Copyright © 2009 Spansion Inc. All rights reserved. Spansion®, the Spansion Logo, MirrorBit®, MirrorBit® Eclipse™, ORNAND™, EcoRAM™ and
combinations thereof, are trademarks and registered trademarks of Spansion LLC in the United States and other countries. Other names used
are for informational purposes only and may be trademarks of their respective owners.
July 27, 2009
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