A63L73321 128K X 32 Bit Synchronous High Speed SRAM with Burst Counter and Flow-through Data Output Preliminary Document Title 128K X 32 Bit Synchronous High Speed SRAM with Burst Counter and Flowthrough Data Output Revision History Rev. No. History Issue Date Remark 0.0 Initial issue December 14, 1998 Preliminary 0.1 Change fast access times from 8.5/9.5/10 ns to 9.5/10/12 ns June 9, 1999 Change ICC1 from 300mA to 350mA(max.) 0.2 Add description for 100/91/83 MHz December 19, 1999 0.3 Add description for 2E1D at page 1 June 20, 2000 Modify waveform at page 11 0.4 Delete -9.5 & -10 part number August 29, 2001 Change -12 cycle time from 12ns to 15ns PRELIMINARY (August, 2000, Version 0.4) AMIC Technology, Inc. A63L73321 Preliminary 128K X 32 Bit Synchronous High Speed SRAM with Burst Counter and Flow-through Data Output Features n n n n n n Three separate chip enables allow wide range of options for CE control, address pipelining n Selectable BURST mode n SLEEP mode (ZZ pin) provided n Available in 100-pin LQFP package Fast access times: 12ns at 66MHz Single +3.3V+10% or +3.3V-5% power supply Synchronous burst function Individual Byte Write control and Global Write Double-cycle enable, single-cycle deselect General Description Burst operations can be initiated with either the address status processor ( ADSP ) or address status controller ( ADSC ) input pin. Subsequent burst sequence burst addresses can be internally generated by the A63L73321 and controlled by the burst advance ( ADV ) pin. Write cycles are internally self-timed and synchronous with the rising edge of the clock (CLK). This feature simplifies the write interface. Individual Byte enables allow individual bytes to be written. BW1 controls I/O1 - I/O8, BW2 controls I/O9 - I/O16, BW3 controls I/O17 - I/O24, and BW4 controls I/O25 - I/O32, all on the condition that BWE is LOW. GW LOW causes all bytes to be written. The A63L73321 is a high-speed, low-power SRAM containing 4,194,304 bits of bit synchronous memory, organized as 131,072 words by 32 bits. The A63L73321 combines advanced synchronous peripheral circuitry, 2-bit burst control, input registers, output buffer and a 128K X 32 SRAM core to provide a wide range of data RAM applications. The positive edge triggered single clock input (CLK) controls all synchronous inputs passing through the registers. Synchronous inputs include all addresses (A0 A16), all data inputs (I/O1 - I/O32), active LOW chip enable ( CE ), two additional chip enables (CE2, CE2 ), burst control inputs ( ADSC , ADSP , ADV ), byte write enables ( BWE , BW1 , BW2 , BW3 , BW4 ) and Global Write ( GW ). Asynchronous inputs include output enable ( OE ), clock (CLK), BURST mode (MODE) and SLEEP mode (ZZ). PRELIMINARY (August, 2000, Version 0.4) 1 AMIC Technology, Inc. A63L73321 A6 A7 CE CE2 BW4 BW3 BW2 BW1 CE2 VCC GND CLK GW BWE OE ADSC ADSP ADV A8 A9 100 99 98 97 96 95 94 93 92 91 90 89 88 87 86 85 84 83 82 81 Pin Configuration NC 1 80 NC I/O17 2 79 I/O16 I/O18 3 78 I/O15 VCCQ 4 77 VCCQ GNDQ 5 76 GNDQ I/O19 6 75 I/O14 I/O20 7 74 I/O13 I/O21 8 73 I/O12 I/O22 9 72 I/O11 GNDQ 10 71 GNDQ VCCQ 11 70 VCCQ I/O23 12 69 I/O10 I/O24 13 68 I/O9 NC 14 67 GND VCC 15 66 NC NC 16 65 VCC ZZ A63L73321E 51 NC 50 30 A16 I/O1 NC 49 52 A15 29 48 I/O2 I/O32 A14 53 47 28 A13 VCCQ I/O31 46 54 A12 27 45 GNDQ VCCQ A11 55 44 26 A10 I/O3 GNDQ 43 56 NC 25 42 I/O4 I/O30 NC 57 41 24 40 I/O5 I/O29 VCC 58 GND 23 39 I/O6 I/O28 NC 59 38 22 NC GNDQ I/O27 37 60 A0 21 36 VCCQ GNDQ A1 61 35 20 A2 I/O7 VCCQ 34 62 A3 19 33 I/O8 I/O26 A4 63 32 18 31 I/O25 A5 17 64 MODE GND x PRELIMINARY (August, 2000, Version 0.4) 2 AMIC Technology, Inc. A63L73321 Block Diagram ZZ MODE LOGIC MODE ADV CLK CLK LOGIC BURST LOGIC ADDRESS COUNTER CLR ADSC ADSP A0-A16 ADDRESS REGISTERS 17 8 8 GW BWE BW1 BW2 BYTE WRITE ENABLE LOGIC BW3 8 BYTE2 WRITE DRIVER 8 128KX8X4 32 OUTPUT MEMORY 8 8 BW4 BYTE1 WRITE DRIVER BYTE3 WRITE DRIVER 8 BYTE4 WRITE DRIVER 8 BUFFER ARRAY 32 4 DATA-IN REGISTERS 4 CE CE2 CE2 CHIP ENABLE LOGIC OUTPUT ENABLE LOGIC OE I/O1 - I/O32 PRELIMINARY (August, 2000, Version 0.4) 3 AMIC Technology, Inc. A63L73321 Pin Description Pin No. Symbol 32 - 37, 44 - 50, 81, 82, 99, 100 A0 - A16 89 CLK 87, 93 - 96 BWE , BW1 - BW4 88 GW Global Write 86 OE Output Enable 92, 97, 98 CE2 ,CE2, CE Chip Enables 83 ADV 84 ADSP Processor Address Status 85 ADSC Controller Address Status 31 MODE Burst Mode: HIGH or NC (Interleaved burst) LOW (Linear burst) 64 ZZ 2, 3, 6 - 9, 12, 13, 18, 19, 22 - 25, 28, 29, 52, 53, 56 - 59, 62, 63, 68, 69, 72 - 75, 78, 79 I/O1- I/O32 1, 14, 16, 30, 38, 39, 42, 43, 51, 66, 80 NC No Connection 15, 41, 65, 91 VCC Power Supply 17, 40, 67, 90 GND Ground 4, 11, 20, 27, 54, 61, 70, 77 VCCQ Isolated Output Buffer Supply 5, 10, 21, 26, 55, 60, 71, 76 GNDQ Isolated Output Buffer Ground PRELIMINARY (August, 2000, Version 0.4) Description Address Inputs Clock Byte Write Enables Burst Address Advance Asynchronous Power-Down (Snooze): HIGH (Sleep) LOW or NC (Wake up) Data Inputs/Outputs 4 AMIC Technology, Inc. A63L73321 Synchronous Truth Table (See Notes 1 Through 5) Operation Deselected Cycle, Power-down Deselected Cycle, Power-down Deselected Cycle, Power-down Deselected Cycle, Power-down Deselected Cycle, Power-down READ Cycle, Begin Burst READ Cycle, Begin Burst WRITE Cycle, Begin Burst READ Cycle, Begin Burst READ Cycle, Begin Burst READ Cycle, Continue Burst READ Cycle, Continue Burst READ Cycle, Continue Burst READ Cycle, Continue Burst WRITE Cycle, Continue Burst WRITE Cycle, Continue Burst READ Cycle, Suspend Burst READ Cycle, Suspend Burst READ Cycle, Suspend Burst READ Cycle, Suspend Burst WRITE Cycle, Suspend Burst WRITE Cycle, Suspend Burst PRELIMINARY Address Used NONE CE CE2 CE2 ADSP ADSC ADV WRITE OE H X X X L X X X L-H I/O Operation High-Z NONE L X L L X X X X L-H High-Z NONE L H X L X X X X L-H High-Z NONE L X L H L X X X L-H High-Z NONE L H X H L X X X L-H High-Z External L L H L X X X L L-H Dout External L L H L X X X H L-H High-Z External L L H H L X L X L-H Din External L L H H L X H L L-H Dout External L L H H L X H H L-H High-Z Next X X X H H L H L L-H Dout Next X X X H H L H H L-H High-Z Next H X X X H L H L L-H Dout Next H X X X H L H H L-H High-Z Next X X X H H L L X L-H Din Next H X X X H L L X L-H Din Current X X X H H H H L L-H Dout Current X X X H H H H H L-H High-Z Current H X X X H H H L L-H Dout Current H X X X H H H H L-H High-Z Current X X X H H H L X L-H Din Current H X X X H H L X L-H Din (August, 2000, Version 0.4) 5 CLK AMIC Technology, Inc. A63L73321 Notes: 1. X = "Disregard", H = Logic High, L = Logic Low. 2. WRITE = L means: 1) Any BWx ( BW1, BW2 , BW3 , or BW4 ) and BWE are low or 2) GW is low. 3. All inputs except OE must be synchronized with setup and hold times around the rising edge (L-H) of CLK. 4. For write cycles that follow read cycles, OE must be HIGH before the input data request setup time and held HIGH throughout the input data hold time. 5. ADSP LOW always initiates an internal Read at the L-H edge of CLK. A Write is performed by setting one or more byte write enable signals and BWE LOW or GW LOW for the subsequent L-H edge of CLK. Refer to the Write timing diagram for clarification. Write Truth Table Operation GW BWE BW1 BW2 BW3 BW4 READ H H X X X X READ H L H H H H WRITE Byte 1 H L L H H H WRITE all bytes H L L L L L WRITE all bytes L X X X X X PRELIMINARY (August, 2000, Version 0.4) 6 AMIC Technology, Inc. A63L73321 Linear Burst Address Table (MODE = LOW) First Address (External) Second Address (Internal) Third Address (Internal) Fourth Address (Internal) X . . . X00 X . . . X01 X . . . X10 X . . . X11 X . . . X01 X . . . X10 X . . . X11 X . . . X00 X . . . X10 X . . . X11 X . . . X00 X . . . X01 X . . . X11 X . . . X00 X . . . X01 X . . . X10 Interleaved Burst Address Table (MODE = HIGH or NC) First Address (External) Second Address (Internal) Third Address (Internal) Fourth Address (Internal) X . . . X00 X . . . X01 X . . . X10 X . . . X11 X . . . X01 X . . . X00 X . . . X11 X . . . X10 X . . . X10 X . . . X11 X . . . X00 X . . . X01 X . . . X11 X . . . X10 X . . . X01 X . . . X00 Absolute Maximum Ratings* *Comments Power Supply Voltage (VCC) . . . . . . . . . . -0.5V to +4.6V Voltage Relative to GND for any Pin Except VCC (Vin, Vout) . . . . . . . . . . . . . . . . . . . . . . . . . -0.5V to VCC +0.5V Power Dissipation (PD) . . . . . . . . . . . . . . . . . . . . . . . . 2W Operating Temperature (Topr) . . . . . . . . . . . 0°C to 70°C Storage Temperature (Tbias) . . . . . . . . . . -10°C to 85 °C Storage Temperature (Tstg) . . . . . . . . . . . -55°C to 125°C Stresses above those listed under "Absolute Maximum Ratings" may cause permanent damage to this device. These are stress ratings only. Functional operation of this device at these or any other conditions above those indicated in the operational sections of this specification is not implied or intended. Exposure to the absolute maximum rating conditions for extended periods may affect device reliability. Recommended DC Operating Conditions (0°C ≤ TA ≤ 70°C, VCC, VCCQ = 3.3V+10% or 3.3V-5%, unless otherwise noted) Symbol Min. Typ. Max. Unit Supply Voltage (Operating Voltage Range) 3.135 3.3 3.6 V Isolated Input Buffer Supply 3.135 3.3 VCC V Supply Voltage to GND 0.0 - 0.0 V VIH Input High Voltage 2.0 - VCC+0.3 V VIHQ Input High Voltage (I/O Pins) 2.0 - VCC+0.3 V VIL Input Low Voltage -0.3 - 0.8 V VCC VCCQ GND PRELIMINARY Parameter (August, 2000, Version 0.4) 7 Note 1, 2 1, 2 AMIC Technology, Inc. A63L73321 DC Electrical Characteristics (0°C ≤ TA ≤ 70°C, VCC, VCCQ = 3.3V+10% or 3.3V-5%, unless otherwise noted) Symbol Parameter Min. Max. Unit Test Conditions Note ILI Input Leakage Current - ±2.0 µA All inputs VIN = GND to VCC ILO Output Leakage Current - ±2.0 µA OE = VIH, Vout = GND to VCC Supply Current - 350 mA Device selected; VCC = max. Iout = 0mA, all inputs = VIH or VIL Cycle time = tKC min. 3, 11 11 ICC1 ISB1 Standby Current ISB2 - 25 mA Device deselected; VCC = max. All inputs are fixed. All inputs ≥ VCC - 0.2V or ≤ GND + 0.2V Cycle time = tKC min. - 10 mA ZZ ≥ VCC - 0.2V VOL Output Low Voltage - 0.4 V IOL = 8 mA VOH Output High Voltage 2.4 - V IOH = -4 mA Capacitance Symbol Parameter Typ. Max. Unit CIN Input Capacitance 3 4 pF CI/O Input/Output Capacitance 4 5 pF Conditions TA = 25 C; f = 1MHz VCC = 3.3V * These parameters are sampled and not 100% tested. PRELIMINARY (August, 2000, Version 0.4) 8 AMIC Technology, Inc. A63L73321 AC Characteristics (0°C ≤ TA ≤ 70°C, VCC = 3.3V+10% or 3.3V-5%) Symbol -12 Parameter Unit Min. Max. Note tKC Clock Cycle Time 15 - ns tKH Clock High Time 4.0 - ns tKL Clock Low Time 4.0 - ns tKQ Clock to Output Valid - 12 ns tKQX Clock to Output Invalid 3.0 - ns tKQLZ Clock to Output in Low-Z 4.0 - ns 5, 6 tKQHZ Clock to Output in High-Z - 5.0 ns 5, 6 tOEQ OE to Output Valid - 5.0 ns 8 tOELZ OE to Output in Low-Z 0 - ns 5, 6 tOEHZ OE to Output in High-Z - 5.0 ns 5, 6 Address 2.5 - ns 7, 9 tADSS Address Status ( ADSC , ADSP ) 2.5 - ns 7, 9 tADVS Address Advance ( ADV ) 2.5 - ns 7, 9 Write Signals 2.5 - ns 7, 9 Setup Times tAS tWS ( BW1, BW2 , BW3 , BW4 , BWE , GW ) tDS Data-in 2.5 - ns 7, 9 tCES Chip Enable ( CE , CE2, CE2 ) 2.5 - ns 7, 9 PRELIMINARY (August, 2000, Version 0.4) 9 AMIC Technology, Inc. A63L73321 AC Characteristics (continued) Symbol -12 Parameter Unit Note Min. Max. Address 0.5 - ns 7, 9 tADSH Address Status ( ADSC , ADSP ) 0.5 - ns 7, 9 tAAH Address Advance ( ADV ) 0.5 - ns 7, 9 tWH Write Signal 0.5 - ns 7, 9 Hold Times tAH ( BW1, BW2 , BW3 , BW4 , BWE , GW ) tDH Data-in 0.5 - ns 7, 9 tCEH Chip Enable ( CE , CE2, CE2 ) 0.5 - ns 7, 9 Notes: 1. All voltages refer to GND. 2. Overshoot: VIH ≤ +4.6V for t ≤ tKC/2. Undershoot: VIL ≥ -0.7V for t ≤ tKC/2. Power-up: VIH ≤ +3.6 and VCC ≤ 3.1V for t ≤ 200ms 3. ICC1 is given with no output current. ICC1 increases with greater output loading and faster cycle times. 4. Test conditions assume the output loading shown in Figure 1, unless otherwise specified. 5. For output loading, CL = 5pF, as shown in Figure 2. Transition is measured ±150mV from steady state voltage. 6. At any given temperature and voltage condition, tKQHZ is less than tKQLZ and tOEHZ is less than tQELZ. 7. A WRITE cycle is defined by at least one Byte Write enable LOW and ADSP HIGH for the required setup and hold times. A READ cycle is defined by all byte write enables HIGH and ( ADSC or ADV LOW) or ADSP LOW for the required setup and hold times. 8. OE has no effect when a Byte Write enable is sampled LOW. 9. This is a synchronous device. All addresses must meet the specified setup and hold times for all rising edges of CLK when either ADSP or ADSC is LOW and the chip is enabled. All other synchronous inputs must meet the setup and hold times with stable logic levels for all rising edges of clock (CLK) when the chip is enabled. Chip enable must be valid at each rising edge of CLK when either ADSP or ADSC is LOW to remain enabled. 10. The load used for VOH, VOL testing is shown in Figure 2. AC load current is higher than the given DC values. AC I/O curves are available upon request. 11. "Device Deselected" means device is in POWER-DOWN mode, as defined in the truth table. "Device Selected" means device is active (not in POWER-DOWN mode). 12. MODE pin has an internal pulled-up, and ZZ pin has an internal pulled-down. All of then exhibit an input leakage current of 10µA. 13. Snooze (ZZ) input is recommended that users plan for four clock cycles to go into SLEEP mode and four clocks to emerge from SLEEP mode to ensure no data is lost. PRELIMINARY (August, 2000, Version 0.4) 10 AMIC Technology, Inc. A63L73321 Timing Waveforms tKC CLK tKH tKL tADSS tADSH ADSP tADSS Deselect cycle tADSH ADSC tAS tAH A1 ADDRESS A2 tWS A3 tWH GW,BWE BW1-BW4 tCES Deselect with CE tCEH CE (NOTE 2) tADVS tADVH ADV ADV suspends burst (NOTE 3) OE tOEQ tOELZ tOEHZ tKQLZ DOUT High-Z Q(A1) tKQ tKQ tKQHZ tKQX Q(A2) tKQX Q(A2+1) Q(A2+2) Q(A2+3) Q(A3) (NOTE *1) Single READ BURST READ Don't Care Undefined Read Timing Notes: 1. QA(2) refers to output from address A2. Q(A2+1) refers to output from the next internal burst address following A2. 2. CE and CE2 have timing identical to CE . On this diagram, when CE is LOW, CE2 is LOW and CE2 is HIGH. When CE is HIGH, CE2 is HIGH and CE2 is LOW. 3. Timing is shown assuming that the device was not enabled before entering into this sequence. OE does not cause Q to be driven until after the following clock rising edge. PRELIMINARY (August, 2000, Version 0.4) 11 AMIC Technology, Inc. A63L73321 Timing Waveforms (continued) tKC CLK tKH tKL tADSS tADSH ADSP tADSS ADSC extends burst tADSS tADSH tADSH ADSC tAS tAH A1 ADDRESS A2 A3 BYTE WRITE signals are ignored for first cycle when ADSP initiates burst tWS tWH BWE,BW1-BW4 (NOTE 5) tWS tWH GW tCES tCEH CE (NOTE 2) tADVS tADVH ADV (NOTE 4) OE (NOTE 3) tDS DIN ADV suspends burst High-Z tDH D(A1) tOEHZ D(A2) D(A2+1) D(A2+1) D(A2+2) D(A2+3) D(A3) D(A3+1) D(A3+2) (NOTE 1) DOUT BURST READ Single WRITE Extended BURST WRITE Don't Care Undefined Write Timing Notes: 1. D(A2) refers to output from address A2. D(A2+1) refers to output from the internal burst address immediately following A2. 2. Timing for CE2 and CE2 is identical to that for CE . As shown in the above diagram, when CE is LOW, CE2 is LOW and CE2 is HIGH. When CE is HIGH, CE2 is HIGH and CE2 is LOW. 3. OE must be HIGH before the input data setup, and held HIGH throughout the data hold period. This prevents input/output data contention for the period prior to the time Byte Write enable inputs are sampled. 4. ADV must be HIGH to permit a Write to the loaded address. 5. Byte Write enables are decided by means of a Write truth table. PRELIMINARY (August, 2000, Version 0.4) 12 AMIC Technology, Inc. A63L73321 Timing Waveforms (continued) tKC CLK tKH tKL tADSS tADSH ADSP ADSC tAS tAH ADDRESS A2 A1 A4 A3 tWS tWH tDS tDH A5 A6 GW,BWE, BW1-BW4 (NOTE 3) tCES tCEH CE (NOTE 2) ADV OE tKQ DIN High-Z tOELZ D(A3) D(A5) D(A6) tOEHZ tKQ DOUT Q(A1) Q(A2) Back-to-Back READs Q(A4) Single WRITE (NOTE 1) Q(A4+1) Q(A4+2) BURST READ Q(A4+3) Back-to-Back WRITEs Don't Care Undefined Read/Write Timing Notes: 1. Q(A4) refers to output from address A4. Q(A4+1) refers to output from the next internal burst address following A4. 2. CE2 and CE2 have timing identical to CE . On this diagram, when CE is LOW, CE is LOW and CE2 is HIGH, When CE is HIGH, CE2 is HIGH and CE2 is LOW. 3. The data bus (Q) remains in High-Z following a WRITE cycle unless an ADSP , ADSC , or ADV cycle is performed. 4. Byte Write enables are decided by means of a Write truth table. 5. Back-to-back READs may be controlled by either ADSP or ADSC PRELIMINARY (August, 2000, Version 0.4) 13 AMIC Technology, Inc. A63L73321 AC Test Conditions Input Pulse Levels Q RL=50Ω ZO=50Ω GND to 3V VT=1.5V Input Rise and Fall Times 1.5ns Input Timing Reference Levels 1.5V Output Reference Levels 1.5V Figure 1. Output Load Equivalent +3.3V 320Ω Output Load See Figures 1 and 2 Q 350Ω 5pF Figure 2. Output Load Equivalent PRELIMINARY (August, 2000, Version 0.4) 14 AMIC Technology, Inc. A63L73321 Ordering Information Part No. Access Times (ns) Frequency (MHz) A63L73321E-12 12 66 PRELIMINARY (August, 2000, Version 0.4) 15 Package 100L LQFP AMIC Technology, Inc. A63L73321 Package Information LQFP 100L Outline Dimensions unit: inches/mm HE A2 A1 D E 80 51 50 100 31 1 L1 L HD D 81 y 30 e b c θ Symbol Dimensions in inches Dimensions in mm Min. Nom. Max. Min. Nom. Max. 0.002 - - 0.05 - - A2 0.053 0.055 0.057 1.35 1.40 1.45 b 0.011 0.013 0.015 0.27 0.32 0.37 A1 c 0.005 - 0.008 0.12 - 0.20 HE 0.860 0.866 0.872 21.85 22.00 22.15 E 0.783 0.787 0.791 19.90 20.00 20.10 HD 0.624 0.630 0.636 15.85 16.00 16.15 D 0.547 0.551 0.555 13.90 14.00 14.10 e L 0.026 BSC 0.018 L1 0.024 0.65 BSC 0.030 0.45 0.039 REF 0.60 0.75 1.00 REF y - - 0.004 - - 0.1 θ 0° 3.5° 7° 0° 3.5° 7° Notes: 1. Dimensions D and E do not include mold protrusion. 2. Dimensions b does not include dambar protrusion. Total in excess of the b dimension at maximum material condition. Dambar cannot be located on the lower radius of the foot. PRELIMINARY (August, 2000, Version 0.4) 16 AMIC Technology, Inc.