AMICC A64S06161AG-70UF

A64S06161A
Preliminary
Document Title
16M(1M x 16bit) Normal mode & Page mode Static Random Access Memory
Revision history
Rev. No.
0.0
(March, 2005, Version 0.0)
History
Issue Date
Remark
Initial issue
March 28, 2005
Preliminary
1
AMIC Technology, Corp.
A64S06161A
Preliminary
MEMORY
16M(1M x 16bit) Normal mode & Page mode Static Random
Access Memory
DESCRIPTION
The A64S06161A is a 16Mb high speed, low power Static Random Access Memory(SRAM)
organized as 1,048,576 words by 16 bits and supports Page Mode.
The A64S06161A is a Pseudo SRAM based on successfully proven DRAM CELL SRAM which
was specifically developed for cost sensitive, low power computing and communication
applications such as mobile cellular phone handsets, personal digital assistants and other
battery-operated consumer products.
FEATURES
• Standard Asynchronous SRAM Interface and Page Mode
• Organization
: 1M x 16Bit
• Power Supply Voltage
: 2.7 ~ 3.3 V
• Page Size
: 4 words
• Page Mode Access (tPAA)
: 35ns
• Data Retention Voltage
: 2.4V
• Tri-state Output and TTL Compatible
PRODUCT FAMILY
Product Family
Operating
Temperature
Voltage
Speed
ISB1
(Max)
IccDR
(Max)
ICC1
(Max)
Mode
A64S06161A
-40 ~ 85 ℃
2.7 ~ 3.3 V
70
100uA
100uA
2.0mA
Page
3
4
5
6
A
/LB
/OE
A0
A1
A2
/PD
B
IO8
/UB
A3
A4
/CS
IO0
C
IO9
IO10
A5
A6
IO1
IO2
D
VSS
IO11
A17
A7
IO3
VCC
FUNCTIONAL BLOCK DIAGRAM
VCC
IO12
VSS
A16
IO4
VSS
F
IO14
IO13
A14
A15
IO5
IO6
G
IO15
A19
A12
A13
/WE
IO7
H
A18
A8
A9
A10
A11
NC
Column
Address
Row Decoder
Add. Input Buffer
E
Row
Address
Add. Input Buffer
Ref. Cont.
DC Generator Circuit
Memory Array
8192 rows
128 x 16 columns
IO0
Data I/O Buffer
2
Sense Amp.
1
Write Driver
PIN DESCRIPTION
IO7
IO8
IO15
Column Decoder
Control Logic
/CS /OE /WE /UB
/LB
Note : E3 pin ( VSS) can be remain as a NC
Name
/CS
/OE
/WE
A0∼A19
IO0∼IO15
(March, 2005, Version 0.0)
Function
Chip Select Input
Output Enable Input
Write Enable Input
Address Input
Data Input / Output
2
Name
VCC
VSS
/UB
/LB
Function
Power
Ground
Upper Byte (IO8∼15)
Lower Byte (IO0∼7)
AMIC Technology, Corp.
A64S06161A
Preliminary
PRODUCT LIST
Part Name
Function
A64S06161A-70U
16M, 48-FBGA , 70 ns, 3.0V, -40℃∼85℃
ABSOLUTE MAXIMUM RATING
Item
Symbol
Ratings
Unit
VIN, VOUT
-0.2 to VCC+0.3 V
V
Voltage on Vcc supply relative to Vss
VCC
-0.2 to 3.6
V
Power Dissipation
PD
1.0
W
TSTG
-55 to 150
℃
TA
-40 ~ 85
℃
Voltage on any pin relative to Vss
Storage temperature
Operating Temperature (Extended)
Note :
Stresses greater than those listed under “ABSOLUTE MAXIMUM RATINGS” may cause permanent
damage to the device. This is stress rating only and the functional operation of the device under these or
any other conditions above those indicated in the operation of this specification is not implied.
Exposure to the absolute maximum rating conditions for extended period may affect reliability.
TRUTH TABLE
/CS
/PD
/OE
/WE
/LB
/UB
I/O 0~7
I/O 8~15
MODE
Power
H
H
X
X
X
X
High-Z
High-Z
Deselected
Standby
X
H
X
X
H
H
High-Z
High-Z
Deselected
Standby
L
H
H
H
L
X
High-Z
High-Z
Output Disabled
Active
L
H
H
H
X
L
High-Z
High-Z
Output Disabled
Active
L
H
L
H
L
H
Data Out
High-Z
Lower Byte Read
Active
L
H
L
H
H
L
High-Z
Data Out
Upper Byte Read
Active
L
H
L
H
L
L
Data Out
Data Out
Word Read
Active
L
H
X
L
L
H
Data In
High-Z
Lower Byte Write
Active
L
H
X
L
H
L
High-Z
Data In
Upper Byte Write
Active
L
H
X
L
L
L
Data In
Data In
Word Write
Active
(March, 2005, Version 0.0)
3
AMIC Technology, Corp.
A64S06161A
Preliminary
RECOMMENDED DC OPERATING CONDITIONS
1)
Parameter
Symbol
Min
Typ
Max
Unit
Supply Voltage (5)
Vcc
2.7
3.0
3.3
V
Ground
Vss
0
0
0
V
Input High Voltage
VIH
0.8*Vcc
-
Vcc+0.2 2)
V
Input Low Voltage
VIL
-0.2 3)
-
0.4
V
Note :
1.TA = -40℃ to 85℃, otherwise specified.
2. Overshoot : Vcc + 1.0V in case of pulse width ≤ 20 ns.
3. Undershoot : -1.0V in case of pulse width ≤ 20 ns.
4. Overshoot and undershoot are sampled, not 100% tested.
5. Stable power supply required 100 us before device operation.
CAPACITANCE (TA = 25 ℃, f = 1.0MHz)
Symbol
Parameter
Condition
Max.
Unit
CIN
Input Capacitance
VIN =0V
8
pF
COUT
Output Capacitance
VIO =0V
10
pF
Note : This parameter is sampled and not 100% tested
DC AND OPERATING CHARACTERISTICS
Parameter
Symbol
Test Condition
Min
Typ
Max
Unit
Input Leakage Current
ILI
VIN = Vss to Vcc
-1
1
uA
Output Leakage Current
ILO
/CS = VIH, /UB=/LB= VIH or /OE=VIH or
/WE=VIL, VIO=Vss to Vcc
-1
1
uA
Icc1
Cycle Time = 1 us, 100%duty, IIO=0mA,
/CS ≤ 0.2V, VIN ≤ 0.2V or
VIN ≥ Vcc-0.2V
2.0
mA
Icc2
Cycle time=Min, IIO=0mA, 100% duty
/CS = VIL,VIN=VIL or VIH
20
mA
Iccp
/CS1 = VIL, CS2=VIH,Tpwc = min Page
address cycling
10
mA
Output Low Voltage
VOL
IOL = 2 mA
0.4
V
Output High Voltage
VOH
IOH = -1 mA
Standby Current(TTL)
ISB
/CS=VIH, /UB=/LB= VIH, Other inputs = VIH or
VIL
0.3
mA
Standby Current(CMOS)
ISB1
/CS ≥ Vcc-0.2V, /UB=/LB ≥ Vcc-0.2V
(/UB,/LB Controlled) Other inputs = 0 or Vcc
100
uA
(March, 2005, Version 0.0)
2.2
4
V
AMIC Technology, Corp.
A64S06161A
Preliminary
Data Retention Electric Characteristic
TA = -40℃ to 85℃ (Normal), unless otherwise specified
Item
Symbol
Test Condition
Voltage for Data
Retention
VDR
/CS=/PD=VIH>Vcc-0.2V or
/UB,/LB≥Vcc-0.2V,
VIN≥VCC-0.2V or
VIN≤VSS + 0.2V
Data Retention
Current
IccDR
Vcc=2.4V,
/CS=/PD=VIH>Vcc-0.2V or
/UB,/LB≥Vcc-0.2V,
VIN≥VCC-0.2V or
VIN≤VSS + 0.2V
Chip Deselect to Data
Retention Time
tCDR
Operating Recovery
Time
tR
Refer to data retention wave
form
Min
Typ.
(1)
2.4
Max
Unit
3.3
V
100
uA
0
-
-
ns
tRC
-
-
ns
(1) Vcc = 2.4V, TA = 25℃
Data Retention Wave Form
Data Retention Mode
VCC
2.7V
tCDR
tR
VIH
VDR
/CS ≥ Vcc-0.2V
/CS
VSS
(March, 2005, Version 0.0)
5
AMIC Technology, Corp.
A64S06161A
Preliminary
AC TEST CONDITIONS
TA = -40℃ to 85℃ (Normal), unless otherwise specified
PARAMETER
Value
Input Pulse Level
0.4V to 2.2V
Input Rise and Fall Time
5ns
Input and Output Timing Reference Level
1.5V
Output Load
CL = 30pF + 1TTL Load
AC TEST LOADS
TTL
CL(1)
Note : (1) Including jig and scope capacitance
POWER UP TIME
At starting, maintain stable power for a minimum 100us with /CS = /PD = high.
(March, 2005, Version 0.0)
6
AMIC Technology, Corp.
A64S06161A
Preliminary
AC CHARACTERISTICS (Vcc = 2.7 ~ 3.3V, TA = -40 to 85℃)
70ns
Parameter List
Symbol
Unit
Min
R
E
A
D
Read Cycle Time
tRC
70
ns
Address Set-up Time
tAS
0
ns
Address Access Time
tAA
70
ns
Chip Select to Output
tCO
70
ns
Output Enable to Valid Output
tOE
35
ns
/UB,/LB Access Time
tBA
70
ns
Chip select to Low-Z Output
tLZ
10
ns
/UB, /LB Enable to Low-Z Output
tBLZ
10
ns
Output Enable to Low-Z Output
tOLZ
5
ns
Chip Disable to High-Z Output
tHZ
0
25
ns
/UB, /LB Disable to High-Z Output
tBHZ
0
25
ns
Output Disable to High-Z Output
tOHZ
0
25
ns
tOH
10
ns
tP
10
ns
Page Read Cycle Time
tPRC
35
ns
Page Read Address Access Time
tPAA
Write Cycle Time
tWC
70
ns
Chip Select to End of Write
tCW
60
ns
Address Valid to End of Write
tAW
60
ns
/UB, /LB Valid to End of Write
tBW
60
ns
Write Pulse Width
tWP
50
ns
Write Recovery Time
tWR
0
ns
tWHZ
0
Output Hold from Address Change
Page Read Precharge Time
W
R
I
Max
Write to Output High-Z
35
20
ns
ns
T
Data to Write Time Overlap
tDW
40
ns
E
Data Hold from Write Time
tDH
0
ns
End of Write to Output Low-Z
tOW
5
ns
Page Write Precharge Time
tP
10
ns
Page Write Cycle Time
tPWC
35
ns
Page Write Data to Write Time overlap
tPDW
20
ns
Page Write Data Hold from Write Time
tPDH
0
ns
(March, 2005, Version 0.0)
7
AMIC Technology, Corp.
A64S06161A
Preliminary
TIMING DIAGRAMS
READ CYCLE (/PD = /WE = VIH)
tRC
Address(A2 – A19)
Page Address(A0 – A1)
tAA
tCO
/CS
tAS
/UB,/LB
tP
tLZ(2)
tBA
tOE
/OE
tHZ(1,2)
tOHZ(1)
DATA OUT
Note (READ CYCLE) :
1. tHZ and tOHZ are defined as the time at which the outputs achieve the open circuit conditions and are
not referenced to output voltage levels
2. At any given temperature and voltage condition, tHZ(max.) is less than tLZ(min.) both for a given
device and from device to device.
3. /WE is high for the read cycle.
4. Do not access device with cycle timing shorter than tRC for continuous periods > 16us.
(March, 2005, Version 0.0)
8
AMIC Technology, Corp.
A64S06161A
Preliminary
PAGE READ CYCLE (/PD = /WE = VIH)
tRC
Address (A2-A19)
tPRC
Page Corresponding (A0-A1)
Addresses
tAA
tP(5)
tPAA
tCO
/CS
tAS
/UB,/LB
/OE
tLZ(2)
tBA
tOE
tHZ(1,2)
tOHZ(1)
DATA OUT
Note (PAGE MODE READ CYCLE) :
1. tHZ and tOHZ are defined as the time at which the outputs achieve the open circuit conditions and are
not referenced to output voltage levels
2. At any given temperature and voltage condition, tHZ(max.) is less than tLZ(min.) both for a given
device and from device to device.
3. /WE is high for the read cycle.
4. Do not access device with cycle timing shorter than tRC for continuous periods > 16us.
5. tP (precharge time) should be guaranteed for new Address.
6. After initial page access is accomplished, the page mode operation provides fast read access speed of
random locations within that page
(March, 2005, Version 0.0)
9
AMIC Technology, Corp.
A64S06161A
Preliminary
WRITE CYCLE 1 (/CS Controlled, /PD = VIH)
tWC
ADDR
tAS
tWR
tCW
/CS
tAW
tP
tBW
/UB,/LB
tWP
/WE
tDW
Data In
High-Z
tDH
High-Z
Data Valid
High-Z
Data
Out
WRITE CYCLE 2 (/UB /LB Controlled, /PD = VIH)
tWC
ADDR
tWR(4)
tCW(2)
/CS
tP
tAW
tBW
/UB,/LB
tAS(3)
tWP
/WE
tDW
Data In
Data
Out
tDH
Data Valid
High-Z
Notes (WRITE CYCLE) :
1. A write occurs during the overlap of a low /CS and low /WE. A write begins at the latest
transition among /CS going low and /WE going low: A write end at the earliest
transition among /CS going high and /WE going high. tWP is measured from the
beginning of write to the end of write.
2. tCW is measured from the later of /CS going low to the end of write.
3. tAS is measured from the address valid to the beginning of write.
4. tWR is measured from the end of write to the address change. tWR is applied in case a write ends
as /CS.
5. Do not access device with cycle timing shorter than tRC for continuous periods > 16us.
(March, 2005, Version 0.0)
10
AMIC Technology, Corp.
A64S06161A
Preliminary
PAGE MODE WRITE CYCLE (/PD = VIH)
tWC
Address(A2 – A19)
tPWC
Page Address(A0 – A1)
tP
/CS
tCW(3)
tAS(1)
/UB,/LB
tBW
tWP(1)
/WE
tDW
tDH
tPDW tPDH
tPDW tPDH
DATA IN
DATA OUT
High-Z
Notes (PAGE MODE WRITE CYCLE) :
1. A write occurs during the overlap of a low /CS and low /WE.
A write begins at the latest transition among /CS going low in initial page mode .
A write end at the earliest transition among /CS going high and Page Address transition.
tWP is measured from the beginning of write to the end of write in initial page access.
2. tPWC is measured from Page Address trasition (After initial page access)
to Page Address transition or /CS going high.
2. tCW is measured from the later of /CS going low to the end of write in initial page access.
3. tAS is measured from the address valid to the beginning of write.
4. Do not access device with cycle timing shorter than tRC for continuous periods > 16us.
5. tP (precharge time) should be guaranteed for new Page Address.
6. After initial page access is accomplished, the page mode operation provides fast read access speed of
random locations within that page
(March, 2005, Version 0.0)
11
AMIC Technology, Corp.
A64S06161A
Preliminary
Ordering Information
Part No.
Access Time (ns)
Operating Current
Max. (mA)
Package
A64S06161AG-70
70
20
48B Mini BGA
A64S06161AG-70F
70
20
48B Pb-Free Mini BGA
A64S06161AG-70U
70
20
48B Mini BGA
A64S06161AG-70UF
70
20
48B Pb-Free Mini BGA
•Note : -U is for -40c ~ 85c temperature grade
(March, 2005, Version 0.0)
12
AMIC Technology, Corp.
A64S06161A
Preliminary
PACKAGE DIMENSION FOR BGA TYPE
Unit: millimeters
48 BALL FINE PITCH 6mm x 8mm BGA(0.75mm ball pitch)
Bottom View
Top View
B
B
A1 INDEX MARK
B1
5
4
3
2
1
B
A
6
C
H
G
F
C1 / 2
E
C
C1
D
C
#A1
B/2
Side View
E2
D
0.25/Typ.
E1
E
A
Y
Min
Typical
Max
A
-
0.75
-
B
5.90
6.00
6.10
B1
-
3.75
-
C
7.90
8.00
8.10
C1
-
5.25
-
D
0.30
0.35
0.40
E
-
-
1.20
E1
-
-
0.90
E2
0.20
0.25
0.30
Y
-
-
0.10
(March, 2005, Version 0.0)
0.90/Typ.
C
13
AMIC Technology, Corp.