BB ADS1224IPWR

SBAS286A − JUNE 2003 − REVISED MARCH 2004
FEATURES
D 240SPS Data Rate with 4MHz Clock
D 20-Bit Effective Resolution
D Input Multiplexer with Four Differential
D
D
D
D
D
D
D
D
D
D
Channels
Pin-Selectable, High-Impedance Input Buffer
±5V Differential Input Range
0.0003% INL (typ), 0.0015% INL (max)
Self-Calibrating
Simple 2-Wire Serial Interface
On-Chip Temperature Sensor
Single Conversions with Standby Mode
Low Current Consumption: 300µA
Analog Supply: 2.7V to 5.5V
Digital Supply: 2.7V to 5.5V
APPLICATIONS
D Hand-Held Instrumentation
D Portable Medical Equipment
D Industrial Process Control
D Weigh Scales
DESCRIPTION
The ADS1224 is a 4-channel, 24-bit, delta-sigma analog-to-digital (A/D) converter. It offers excellent performance and low power in a TSSOP-20 package. The
ADS1224 is well-suited for demanding, high-resolution
measurements, especially in portable systems and other space-saving and power-constrained applications.
A delta-sigma modulator and digital filter form the basis
of the A/D converter. The analog modulator has a ±5V
differential input range. An input multiplexer (mux) is
used to select between four separate differential input
channels. A buffer can be selected to increase the input
impedance of the measurement.
A simple, 2-wire serial interface provides all the
necessary control. Data retrieval, self-calibration, and
Standby mode are handled with a few simple
waveforms. When only single conversions are needed,
the ADS1224 can be quickly shut down (Standby mode)
while idle between measurements to dramatically
reduce the overall power consumption. Multiple
ADS1224s can be connected together to create a
synchronously sampling multichannel measurement
system. The ADS1224 is designed to easily connect to
microcontrollers, such as the MSP430.
The ADS1224 supports 2.7V to 5.5V analog supplies
and 2.7V to 5.5V digital supplies. Power is typically less
than 1mW in 3V operation and less than 1µW during
Standby mode.
TEMPEN
AVDD
VREFP VREFN
DVDD
CLK
AINP1
AINN1
AINP2
AINN2
Mux
Buffer
AINP3
AINN3
∆Σ
Modulator
Digital Filter
and
Serial Interface
SCLK
DRDY/DOUT
AINP4
AINN4
MUX0
MUX1
BUFEN
GND
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas Instruments
semiconductor products and disclaimers thereto appears at the end of this data sheet.
All trademarks are the property of their respective owners.
Copyright  2003−2004, Texas Instruments Incorporated
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SBAS286A − JUNE 2003 − REVISED MARCH 2004
ORDERING INFORMATION
PRODUCT
PACKAGE−LEAD
PACKAGE
DESIGNATOR(1)
SPECIFIED
TEMPERATURE
RANGE
PACKAGE
MARKING
ADS1224
TSSOP-20
PW
−40°C to +85°C
ADS1224
ORDERING
NUMBER
TRANSPORT
MEDIA, QUANTITY
ADS1224IPWT
Tape and Reel, 250
ADS1224IPWR
Tape and Reel, 2500
(1) For the most current specification and package information, refer to our web site at www.ti.com.
ABSOLUTE MAXIMUM RATINGS
over operating free-air temperature range unless otherwise noted(1)
ADS1224
UNIT
AVDD to GND
−0.3 to +6
V
DVDD to GND
−0.3 to +6
V
100, momentary
mA
Input current
10, continuous
mA
Analog input voltage to GND
−0.3 to AVDD + 0.3
V
Digital input voltage to GND
−0.3 to DVDD + 0.3
V
+150
°C
Operating Temperature Range
−55 to +125
°C
Storage Temperature Range
−60 to +150
°C
Maximum Junction Temperature
Lead Temperature (soldering, 10s)
+300
°C
(1) Stresses above these ratings may cause permanent damage.
Exposure to absolute maximum conditions for extended periods
may degrade device reliability. These are stress ratings only, and
functional operation of the device at these or any other conditions
beyond those specified is not implied.
2
This integrated circuit can be damaged by ESD. Texas
Instruments recommends that all integrated circuits be
handled with appropriate precautions. Failure to observe
proper handling and installation procedures can cause damage.
ESD damage can range from subtle performance degradation to
complete device failure. Precision integrated circuits may be more
susceptible to damage because very small parametric changes could
cause the device not to meet its published specifications.
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SBAS286A − JUNE 2003 − REVISED MARCH 2004
ELECTRICAL CHARACTERISTICS
All specifications at TA = −40°C to +85°C, AVDD = +5V, DVDD = +5V, fCLK = 2MHz, and VREF = +2.5V, unless otherwise noted.
PARAMETER
TEST CONDITIONS
MIN
TYP
MAX
UNIT
Analog Input
Full-scale input voltage
Absolute input voltage
Differential input impedance
Common-mode input impedance
±2VREF
AINP − AINN
V
Buffer off; AINP, AINN with respect to GND
GND − 0.1
AVDD + 0.1
Buffer on; AINP, AINN with respect to GND
GND + 0.05
AVDD − 1.5
V
V
Buffer off; fCLK = 2MHz
2.7
MΩ
Buffer on; fCLK = 2MHz
1.2
GΩ
Buffer off; fCLK = 2MHz
5.4
MΩ
120 (fCLK/2MHz)
Bits
SPS(1)
% of FSR(2)
System Performance
Resolution
No missing codes
24
Data rate
Integral nonlinearity (INL)
Offset error
Offset error drift
Offset error match
Gain error
Gain error drift
Gain error match
Common-mode rejection
Analog power-supply rejection
Digital power-supply rejection
Buffer off, Differential input signal, end point fit
0.0003
Buffer on, Differential input signal, end point fit
0.0006
0.0015
% of FSR
100
µV
Buffer off
20
Buffer on
20
µV
Buffer off
0.2
µV/°C
Buffer on
0.2
µV/°C
20
100
µV
Buffer off
0.004
0.025
%
Buffer on
0.008
%
Buffer off
0.00003
% of FSR/°C
Buffer on
0.00006
% of FSR/°C
Between channels
0.0005
%
Between channels
Buffer off, at DC
90
110
dB
Buffer on, at DC
90
110
dB
Buffer off, at DC, ± 10% ∆ in AVDD
95
dB
Buffer on, at DC, ± 10% ∆ in AVDD
95
dB
Buffer off, at DC, DVDD = 2.7V to 5.5V
85
dB
Buffer on, at DC, DVDD = 2.7V to 5.5V
85
dB
0.8
ppm of FSR, rms
106
mV
360
µV/°C
Noise
Temperature Sensor
Temperature sensor voltage
TA = 25°C
Temperature sensor coefficient
Voltage Reference Input
AVDD(3)
V
GND − 0.1
VREFP − 0.5
V
Buffer off
VREFN + 0.5
AVDD + 0.1
V
Negative reference input
Buffer on
GND + 0.05
VREFP − 0.5
V
Positive reference input
Buffer on
VREFN + 0.5
AVDD − 1.5
Voltage reference impedance
fCLK = 2MHz
Reference input voltage
Negative reference input
VREF = VREFP − VREFN
Buffer off
Positive reference input
0.5
2.5
500
V
kΩ
(1) SPS = samples per second.
(2) FSR = full-scale range = 4VREF.
(3) It will not be possible to reach the digital output full-scale code when VREF > AVDD/2.
3
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SBAS286A − JUNE 2003 − REVISED MARCH 2004
ELECTRICAL CHARACTERISTICS (continued)
All specifications at TA = −40°C to +85°C, AVDD = +5V, DVDD = +5V, fCLK = 2MHz, and VREF = +2.5V, unless otherwise noted.
PARAMETER
TEST CONDITIONS
MIN
TYP
MAX
UNIT
0.8 DVDD
DVDD + 0.1
V
GND − 0.1
0.2 DVDD
V
Digital Input/Output
Logic
levels
VIH
VIL
VOH
VOL
IOH = 1mA
IOL = 1mA
0.8 DVDD
V
Input leakage
CLK frequency (fCLK)
0.2 DVDD
V
±10
µA
8
MHz
30
70
%
AVDD
2.7
5.5
V
DVDD
2.7
5.5
CLK duty cycle
Power Supply
AVDD current
DVDD current
Total power dissipation
V
Standby mode
<1
µA
AVDD = 5V, normal mode, buffer off
285
µA
AVDD = 5V, normal mode, buffer on
405
µA
AVDD = 3V, normal mode, buffer off
265
µA
AVDD = 3V, normal mode, buffer on
385
µA
Standby mode
<1
µA
DVDD = 5V, normal mode
20
µA
DVDD = 3V, normal mode
10
AVDD = DVDD = 5V, buffer off
1.5
AVDD = DVDD = 3V, buffer off
0.8
µA
2.25
mW
mW
Temperature Range
Specified
−40
+85
°C
Operating
−55
+125
°C
Storage
−60
+150
°C
(1) SPS = samples per second.
(2) FSR = full-scale range = 4VREF.
(3) It will not be possible to reach the digital output full-scale code when VREF > AVDD/2.
4
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SBAS286A − JUNE 2003 − REVISED MARCH 2004
PIN ASSIGNMENTS
PW PACKAGE
TSSOP
(TOP VIEW)
DVDD
1
20
AVDD
SCLK
2
19
VREFP
CLK
3
18
VREFN
DRDY/DOUT
4
17
GND
MUX0
5
16
AINN1
MUX1
6
15
AINP1
TEMPEN
7
14
AINN2
BUFEN
8
13
AINP2
AINP4
9
12
AINN3
AINN4
10
11
AINP3
ADS1224
Terminal Functions
TERMINAL
NAME
NO.
I/O
DVDD
1
Digital
DESCRIPTION
SCLK
2
Digital input
Serial clock input
CLK
3
Digital input
System clock input
DRDY/DOUT
4
Digital Ouput
MUX0
5
Digital input
Selects analog input of mux, bit 0
MUX1
6
Digital input
Selects analog input of mux, bit 1
TEMPEN
7
Digital input
Selects temperature sensor input from mux
BUFEN
8
Digital input
Enables input buffer
AINP4
9
Analog input
Analog channel 4 positive input
AINN4
10
Analog input
Analog channel 4 negative input
AINP3
11
Analog input
Analog channel 3 positive input
AINN3
12
Analog input
Analog channel 3 negative input
AINP2
13
Analog input
Analog channel 2 positive input
AINN2
14
Analog input
Analog channel 2 negative input
AINP1
15
Analog input
Analog channel 1 positive input
AINN1
16
Analog input
Analog channel 1 negative input
GND
17
Analog/Digital
Analog and digital ground
VREFN
18
Analog input
Negative reference input
VREFP
19
Analog input
Positive reference input
AVDD
20
Analog
Digital power supply
Dual-purpose output:
Data Ready: indicates valid data by going low.
Data Output: outputs data, MSB first, on the rising edge of SCLK.
Analog power supply
5
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SBAS286A − JUNE 2003 − REVISED MARCH 2004
TYPICAL CHARACTERISTICS
At TA = −40°C to +85°C, AVDD = +5V, DVDD = +5V, fCLK = 2MHz, and VREF = +2.5V, unless otherwise noted.
ANALOG CURRENT vs TEMPERATURE
ANALOG CURRENT vs TEMPERATURE
500
350
Buffer Off
Buffer On
fCLK = 4MHz, AVDD = 5V
325
300
Current (µA)
Current (µA)
fCLK = 2MHz, AVDD = 5V
450
fCLK = 2MHz, AVDD = 5V
275
fCLK = 2MHz, AVDD = 3V
250
fCLK = 4MHz, AVDD = 5V
fCLK = 4MHz, AVDD = 3V
400
f CLK = 2MHz, AVDD = 3V
f CLK = 4MHz, AVDD = 3V
350
225
300
200
−55
−25
5
35
65
95
−55
125
−25
5
Temperature (_C)
35
Figure 1
DIGITAL CURRENT vs TEMPERATURE
125
ANALOG CURRENT vs SUPPLY VOLTAGE
450
40
400
f CLK = 2MHz
fCLK = 4MHz, AVDD = 5V
Current (µA)
Current (µA)
95
Figure 2
50
30
65
Temperature (_C)
f CLK = 2MHz, AVDD = 5V
20
Buffer On
350
300
Buffer Off
fCLK = 4MHz, AVDD = 3V
250
10
fCLK = 2MHz, AVDD = 3V
0
−55
−25
5
200
35
65
95
2.5
125
3.0
3.5
Figure 3
DIGITAL CURRENT vs SUPPLY VOLTAGE
5.0
5.5
TEMPERATURE SENSOR VOLTAGE vs TEMPERATURE
Temperature Sensor Voltage (mV)
150
40
Current (µA)
4.5
Figure 4
50
30
fCLK = 4MHz
20
fCLK = 2MHz
10
0
140
130
120
110
100
90
80
70
2.5
3.0
3.5
4.0
4.5
Supply Voltage (V)
Figure 5
6
4.0
Supply Voltage (V)
Temperature (_ C)
5.0
5.5
−55
−25
5
35
65
Temperature (_C)
Figure 6
95
125
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SBAS286A − JUNE 2003 − REVISED MARCH 2004
TYPICAL CHARACTERISTICS (CONTINUED)
At TA = −40°C to +85°C, AVDD = +5V, DVDD = +5V, fCLK = 2MHz, and VREF = +2.5V, unless otherwise noted.
INTEGRAL NONLINEARITY vs INPUT VOLTAGE
INTEGRAL NONLINEARITY vs INPUT VOLTAGE
0.0010
0.0006
0.0004
fCLK = 2MHz
Buffer Off
−40_ C
0.0008
0.0006
+25_C
IN L (% o f FSR )
IN L (% o f F SR )
0.0002
0
−0.0002
+85_ C
−0.0004
−0.0006
0.0004
+25_C
0.0002
0
+85_C
−0.0002
−0.0004
−0.0006
−0.0008
−0.0010
f CLK = 2MHz
Buffer On
−40_C
−0.0008
−5
−4
−3
−2
−1
0
1
2
3
4
−0.0010
−3.5
5
−2.5
−1.5
Figure 7
INTEGRAL NONLINEARITY vs INPUT VOLTAGE
fCLK = 4MHz
Buffer Off
−40_ C
3.5
IN L (% of F SR )
+25_ C
0.0005
+25_ C
0
+85_ C
0.0005
+85_C
0
−0.0005
−0.0010
−0.0010
−5
−4
−3
−2
−1
0
1
2
3
4
5
−0.0015
−3.5
−2.5
Figure 9
Noise (ppm of FSR, rms)
Input Voltage, VIN (V)
Figure 11
3.5
3.0
2.5
2.0
1.5
1.0
0.5
0
−0.5
−1.0
−1.5
0
−2.0
2.5
3.5
fCLK = 2MHz
Buffer Off
0.5
−2.5
1.5
1.5
1.0
−3.0
0.5
NOISE vs INPUT VOLTAGE
fCLK = 2MHz
Buffer On
−3.5
−0.5
Figure 10
NOISE vs INPUT VOLTAGE
1.5
−1.5
Input Voltage, VIN (V)
Input Voltage, VIN (V)
Noise (ppm of FSR, rms)
2.5
f CLK = 4MHz
Buffer On
0.0010
−40_C
IN L (% of FS R )
1.5
INTEGRAL NONLINEARITY vs INPUT VOLTAGE
0.0015
0.0010
−0.0015
0.5
Figure 8
0.0015
−0.0005
−0.5
Input Voltage, VIN (V)
Input Voltage, VIN (V)
1.0
0.5
0
−5
−3
−1
1
3
5
Input Voltage, VIN (V)
Figure 12
7
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SBAS286A − JUNE 2003 − REVISED MARCH 2004
as shown in Table 1. The ADS1224 accepts differential
input signals, but can also measure unipolar signals.
When measuring unipolar (or single-ended signals)
with respect to ground, connect the negative input
(AINNx) to ground and connect the input signal to the
positive input (AINPx). Note that when the ADS1224 is
configured this way, only half of the converter full-scale
range is used since only positive digital output codes
are produced. An input buffer can be selected to
increase the input impedance of the A/D converter with
the BUFEN pin.
OVERVIEW
The ADS1224 is an A/D converter comprised of a
delta-sigma modulator followed by a digital filter. A mux
allows for one of four input channels to be selected. A
buffer can also be selected to increase the input
impedance. The modulator measures the differential
input signal VIN = (AINP – AINN) against the differential
reference VREF = (VREFP – VREFN). Figure 13 shows
a conceptual diagram of the device. The differential
reference is scaled internally so that the full-scale input
range is ±2VREF. The digital filter receives the modulator
signal and provides a low-noise digital output. A 2-wire
serial interface indicates conversion completion and
provides the user with the output data.
Table 1. Input Channel selection with MUX0 and
MUX1
DIGITAL PINS
ANALOG INPUTS (AINPx, AINNx)
The input signal to be measured is applied to the input
pins AINPx and AINNx. The positive internal input is
generalized as AINP, and the negative internal input is
generalized as AINN. The signal is selected though the
input mux, which is controlled by pins MUX0 and MUX1,
TEMPEN
MUX1
POSITIVE INPUT
NEGATIVE INPUT
0
0
AINP1
AINN1
0
1
AINP2
AINN2
1
0
AINP3
AINN3
1
1
AINP4
AINN4
VREFP VREFN
−
+
Σ
Temp
Sensor
AINP3
AINN3
CLK
VREF
AINP1
AINN1
AINP2
AINN2
SELECTED ANALOG INPUTS
MUX0
2
2VREF
AINP
Mux
Buffer
AINN
Σ
VIN
∆Σ
Modulator
Digital
Filter
and
Serial
Interface
AINP4
AINN4
MUX0 MUX1
BUFEN
Figure 13. Conceptual Diagram of the ADS1224
8
SCLK
DRDY/DOUT
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SBAS286A − JUNE 2003 − REVISED MARCH 2004
Analog Input Measurement without the Input Buffer
With the buffer disabled by setting the BUFEN pin low, the
ADS1224 measures the input signal using internal
capacitors that are continuously charged and discharged.
Figure 14 shows a simplified schematic of the ADS1224
input circuitry, with Figure 15 showing the on/off timings of
the switches. The S1 switches close during the input
sampling phase. With S1 closed, CA1 charges to AINP,
CA2 charges to AINN, and CB charges to (AINP – AINN).
For the discharge phase, S1 opens first and then S2
closes. CA1 and CA2 discharge to approximately AVDD/2
and CB discharges to 0V. This two-phase
sample/discharge cycle repeats with a frequency of
fCLK/32 (62.5kHz for fCLK = 2MHz).
ESD Protection
AVDD/2
AVDD
CA1
3pF
AINP S1
AINPx
S2
AINN S1
AINNx
S2
ZeffA = tSAMPLE/CA1 = 6MΩ
(1)
AINPx
ZeffB = tSAMPLE/CB = 3MΩ
(1)
AINNx
ZeffA = tSAMPLE/CA2 = 6MΩ
(1)
AVDD/2
NOTE: (1) fCLK = 2MHz.
Figure 16. Effective Analog Input Impedances
with the Buffer Off
ESD diodes protect the inputs. To keep these diodes
from turning on, make sure the voltages on the input
pins do not go below GND by more than 100mV, and
likewise do not exceed AVDD by 100mV:
GND – 100mV < (AINP, AINN) < AVDD + 100mV
CB
6pF
Mux
AVDD/2
CA2
3pF
AVDD
AVDD/2
Figure 14. Simplified Input Structure with the
Buffer Turned Off
Analog Input Measurement with the Input Buffer
When the buffer is enabled by setting the BUFEN pin
high, a low-drift, chopper-stabilized input buffer is used
to achieve very high input impedance. The buffer
charges the input sampling capacitors, thus removing
the load from the measurement. Because the input
buffer is chopper-stabilized, the charging of parasitic
capacitances causes the charge to be carried away, as
if by resistance. The input impedance can be modeled
by a single resistor, as shown in Figure 17. The
impedance scales inversely with fCLK frequency, as in
the nonbuffered case.
tSAMPLE = 32/fCLK
ON
S1
OFF
AINP
ON
S2
OFF
Figure 15. S1 and S2 Switch Timing for Figure 14
The constant charging of the input capacitors presents
a load on the inputs that can be represented by effective
impedances. Figure 16 shows the input circuitry with
the capacitors and switches of Figure 14 replaced by
their effective impedances. These impedances scale
inversely with fCLK frequency. For example, if fCLK
frequency is reduced by a factor of 2, the impedances
will double.
1.2GΩ
(1)
AINN
NOTE: (1) fCLK = 2MHz.
Figure 17. Effective Analog Input Impedances
with the Buffer On
Note that the analog inputs (listed in the Electrical
Characteristics table as Absolute Input Range) must
remain between GND + 0.05V to AVDD − 1.5V.
Exceeding this range degrades linearity and results in
performance outside the specified limits.
9
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SBAS286A − JUNE 2003 − REVISED MARCH 2004
TEMPERATURE SENSOR
On-chip diodes provide temperature-sensing capability. By setting the TEMPEN pin high, the selected analog
inputs are disconnected and the inputs to the A/D
converter are connected to the anodes of two diodes
scaled to 1x and 64x in current and size inside the mux,
as shown in Figure 18. By measuring the difference in
voltage of these diodes, temperature changes can be
inferred from a baseline temperature. Typically, the
difference in diode voltages is 106mV at 25°C, with a
temperature coefficient of 360µV/°C. A similar structure
is used in the MSC1210 for temperature measurement.
For more information, see TI application report
SBAA100, Using the MSC121x as a High-Precision
Intelligent Temperature Sensor, available for download
at www.ti.com.
VOLTAGE REFERENCE INPUTS
(VREFP, VREFN)
The voltage reference used by the modulator is
generated from the voltage difference between VREFP
and VREFN: VREF = VREFP – VREFN. The reference
inputs use a structure similar to that of the analog
inputs. A simplified diagram of the circuitry on the
reference inputs is shown in Figure 19. The switches
and capacitors can be modeled with an effective
impedance of:
ǒt 2 Ǔń16pF + 500kW
sample
where fCLK = 2MHz.
VREFP
VREFN
TEMPEN
AVDD
8I
AVDD
ESD
Protection
1I
Self Gain Cal
16pF
AINP
AINN
1X
AVDD
Zeff = 500kΩ(1)
AINP AINN
8X
(1) fCLK = 2MHz
AINP1
Figure 19. Simplified Reference input Circuitry
AINN1
AINP2
ESD diodes protect the reference inputs. To prevent
these diodes from turning on, make sure the voltages
on the reference pins do not go below GND by more
than 100mV, and likewise, do not exceed AVDD by
100mV:
AINN2
AINP3
AINN3
AINP4
AINN4
GND – 100mV < (VREFP, VREFN) < AVDD + 100mV
MUX0
MUX1
Figure 18. Measurement of the Temperature
Sensor in the Input Multiplexer
10
During self gain calibration, all the switches in the input
multiplexer are opened, VREFN is internally connected to
AINN, and VREFP is connected to AINP. The input buffer
may be disabled or enabled during calibration. When the
buffer is disabled, the reference pins will be driving the
circuitry shown in Figure 9 during self gain calibration,
resulting in increased loading. To prevent this additional
loading from introducing gain errors, make sure the
circuitry driving the reference pins has adequate drive
capability. When the buffer is enabled, the loading on the
reference pins will be much less, but the buffer will limit the
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SBAS286A − JUNE 2003 − REVISED MARCH 2004
For best performance, VREF should be AVDD/2, but it can
be raised as high as AVDD. When VREF exceeds
AVDD/2, it is not possible to reach the full-scale digital
output value corresponding to ±2VREF, since this requires
the analog inputs to exceed the power supplies. For
example, if VREF = AVDD = 5V, the positive full-scale
signal is 10V. The maximum positive input signal that can
be supplied before the ESD diodes turn on is when AINP
= 5.1V and AINN = –0.1V, resulting in VIN = 5.2V.
Therefore, it is not possible to reach the positive (or
negative) full-scale readings in this configuration. The
digital output codes are limited to approximately one half
of the entire range. For best performance, bypass the
voltage reference inputs with a 0.1µF capacitor between
VREFP and VREFN. Place the capacitor as close as
possible to the pins.
CLOCK INPUT (CLK)
This digital input supplies the system clock to the
ADS1224. The CLK frequency can be increased to
speed up the data rate. CLK must be left running during
normal operation. It may be turned off during Standby
mode to save power, but this is not required. The CLK
input may be driven with 5V logic, regardless of the
DVDD or AVDD voltage.
Minimize the overshoot and undershoot on CLK for the
best analog performance. A small resistor in series with
CLK (10Ω to 100Ω) can often help. CLK can be
generated from a number of sources including
standalone crystal oscillators and microcontrollers.
the pin can be forced high with an additional SCLK. It will
then stay high until new data is ready. This is useful
when polling on the status of DRDY/DOUT to determine
when to begin data retrieval.
SERIAL CLOCK INPUT (SCLK)
This digital input shifts serial data out with each rising
edge. As with CLK, this input may be driven with 5V
logic regardless of the DVDD or AVDD voltage. There
is hysteresis built into this input, but care should still be
taken to ensure a clean signal. Glitches or slow-rising
signals can cause unwanted additional shifting. For this
reason, it is best to make sure the rise-and-fall times of
SCLK are less than 50ns.
FREQUENCY RESPONSE
The ADS1224 frequency response for fCLK = 2MHz is
shown in Figure 20. The frequency response repeats at
multiples of the modulator sampling frequency of
62.5kHz. The overall response is that of a low-pass filter
with a −3db cutoff frequency of 31.5Hz. As shown, the
ADS1224 does a good job attenuating out to 60kHz. For
the best resolution, limit the input bandwidth to less than
this value to keep higher frequency noise from affecting
performance. Often, a simple RC filter on the ADS1224
analog inputs is all that is needed.
0
−20
Gain (dB)
allowable voltage range on VREFP and VREFN during
self or self gain calibration as the reference pins must
remain within the specified input range of the buffer in
order to establish proper gain calibration.
−40
−60
DATA READY/DATA OUTPUT (DRDY/DOUT)
This digital output pin serves two purposes. First, it
indicates when new data is ready by going LOW.
Afterwards, on the first rising edge of SCLK, the
DRDY/DOUT pin changes function and begins
outputting the conversion data, most significant bit
(MSB) first. Data is shifted out on each subsequent
SCLK rising edge. After all 24 bits have been retrieved,
−80
−100
0
31250
62500
Input Frequency (Hz)
Figure 20. Frequency Response
11
www.ti.com
SBAS286A − JUNE 2003 − REVISED MARCH 2004
To help see the response at lower frequencies,
Figure 21 illustrates the response out to 1kHz. Notice
that signals at multiples of 120Hz are rejected. The
ADS1224 data rate and frequency response scale
directly with CLK frequency. For example, if fCLK
increases from 2MHz to 4MHz, the data rate increases
from 120SPS to 240SPS, while the notches increase
from 120Hz to 240Hz.
0
Gain (dB)
−20
−40
−60
−80
0
−100
30
Gain (dB)
−20
40
50
60
70
−40
Figure 22. Frequency Response Near 50Hz and
60Hz with fCLK = 910kHz
−60
SETTLING TIME
−80
After changing the input multiplexer, selecting the input
buffer, or using temperature sensor, the first data is fully
settled. In the ADS1224, the digital filter is allowed to
settle after toggling any of the MUX0, MUX1, BUFEN,
or TEMPEN pins. Toggling of any of these digital pins
will cause the input to switch to the proper channel, start
conversions, and hold the DRDY/DOUT line high until
the digital filter is fully settled. For example, if MUX0
changes from low to high, selecting a different input
channel, DRDY/DOUT immediately goes high and the
conversion process restarts. DRDY/DOUT goes low
when fully settled data is ready for retrieval. There is no
need to discard any data. Figure 23 shows the timing of
the DRDY/DOUT line as the input multiplexer changes.
−100
0
100
200 300 400
500 600 700 800 900
1k
Input Frequency (Hz)
Figure 21. Frequency Response to 1kHz
Rejecting 50Hz or 60Hz noise is as simple as choosing
the clock frequency. If simultaneous rejection of 50Hz
and 60Hz noise is desired, fCLK = 910kHz can be
chosen. The data rate becomes 54.7sps and the
frequency response of the ADS1224 rejects the 50Hz
and 60Hz noise to below 60dB. The frequency
response of the ADS1224 near 50Hz and 60Hz with
fCLK = 910kHz is shown in Figure 22.
MUX0
Abrupt change in internal VIN due to status change (for example, switch channels, temp sensor, buffer enable)
VIN
t1
ADS1224 holds DRDY/DOUT
until digital filter settles
Fully settled
data ready
DRDY/DOUT
DRDY/DOUT suppressed after status change
SYMBOL
t1(1)
DESCRIPTION
MIN
MAX
UNITS
Settling time (DRDY/DOUT held high) after a change in any of the
MUX0, MUX1, BUFEN, or TEMPEN pins
25.9
26.4
ms
(1) Values given for fCLK = 2MHz. For different fCLK frequencies, scale proportional to CLK period.
Figure 23. Example of Settling Time After Changing the Input Multiplexer
12
80
Input Frequency (Hz)
www.ti.com
SBAS286A − JUNE 2003 − REVISED MARCH 2004
The ADS1224 uses a Sinc3 digital filter to improve noise
performance. Therefore, in certain instances, large
changes in input will require settling time. For example,
an external multiplexer in front of the ADS1224 can put
large changes in input voltage by simply switching input
channels. Abrupt changes in the input will require three
data cycles to settle. When continuously converting,
four readings may be necessary to settle the data. If the
change in input occurs in the middle of the first conversion, three more full conversions of the fully settled input
will be required to get fully settled data. Discard the first
three readings because they will contain only partially−
settled data. Figure 24 illustrates the settling time for
the ADS1224 in Continuous Conversion mode.
If the input is known to change abruptly, the mux can be
quickly switched to an alternate channel and quickly
switched back to the original channel. By toggling the
mux, the ADS1224 resets the digital filter and initiates a
new conversion. During this time, the DRDY/DOUT line
is held high until fully-settled data is available.
DATA FORMAT
The ADS1224 outputs 24 bits of data in binary two’s
complement format. The least significant bit (LSB) has
a weight of (2VREF)/(223 – 1). The positive full-scale
input produces an output code of 7FFFFFh and the
negative full-scale input produces an output code of
800000h. The output clips at these codes for signals
exceeding full-scale. Table 2 summarizes the ideal
output codes for different input signals.
Table 2. Ideal Output Code vs Input Signal
INPUT SIGNAL VIN
(AINP − AINN)
IDEAL OUTPUT CODE(1)
w +2V REF
7FFFFFh
+2V REF
000001h
2 23 * 1
0
000000h
−2V REF
FFFFFFh
2 23 * 1
ǒ2 2 * 1 Ǔ
v −2VREF
23
800000h
23
(1) Excludes effects of noise, INL, offset, and gain errors.
DATA RETRIEVAL
The ADS1224 continuously converts the analog input
signal. To retrieve data, wait until DRDY/DOUT goes
low, as shown in Figure 25. After this occurs, begin
shifting out the data by applying SCLKs. Data is shifted
out MSB first. It is not required to shift out all 24 bits of
data, but the data must be retrieved before the new data
is updated (see t2) or else it will be overwritten. Avoid
data retrieval during the update period. DRDY/DOUT
remain at the state of the last bit shifted out until it is
taken high (see t6), indicating that new data is being
updated. To avoid having DRDY/DOUT remain in the
state of the last bit, shift a 25th SCLK to force
DRDY/DOUT high (see Figure 26). This technique is
useful when a host controlling the ADS1224 is polling
DRDY/DOUT to determine when data is ready.
Abrupt change in external VIN
VIN
Start of
conversion
DRDY/DOUT
First Conversion;
includes
unsettled VIN
Second Conversion;
VIN settled, but
digital filter
unsettled
Third Conversion;
VIN settled, but
digital filter
unsettled
Fourth Conversion;
VIN and digital filter
both settled
Conversion
time
Figure 24. Settling Time in Continuous Conversion Mode
13
www.ti.com
SBAS286A − JUNE 2003 − REVISED MARCH 2004
Data
New Data Ready
Data Ready
MSB
DRDY/DOUT
23
LSB
22
21
0
t4
t5
t2
t3
t6
1
SCLK
24
t3
t7
SYMBOL DESCRIPTION
t2
t3
t4(1)
t5
t6(1)
t7(1)
MIN
DRDY/DOUT low to first SCLK rising edge
SCLK positive or negative pulse width
SCLK rising edge to new data bit valid: propogation delay
SCLK rising edge to old data bit valid: hold time
Data updating; no readback allowed
Conversion time (1/data rate)
MAX
0
100
50
0
48
8.32
8.32
UNITS
ns
ns
ns
ns
µs
ms
(1) Values given for fCLK = 2MHz. For different fCLK frequencies, scale proportional to CLK period.
Figure 25. Data Retrieval Timing
Data
Data Ready
New Data Ready
DRDY/DOUT
SCLK
23
1
22
21
0
24
25
25th SCLK to Force DRDY/DOUT High
Figure 26. Data Retrieval with DRDY/DOUT Forced High Afterwards
14
www.ti.com
SBAS286A − JUNE 2003 − REVISED MARCH 2004
SELF-CALIBRATION
STANDBY MODE
Self-calibration can be initiated at any time, although in
many applications the ADS1224 drift performance is so
good that the self-calibration performed automatically
at power-up is all that is needed. To initiate
self-calibration, apply at least two additional SCLKs
after retrieving 24 bits of data. Figure 27 shows the
timing pattern. The 25th SCLK will send DRDY/DOUT
high. The falling edge of the 26th SCLK will begin the
calibration cycle. Additional SCLK pulses may be sent
after the 26th SCLK; however, activity on SCLK should
be minimized during calibration for best results.
Standby
mode
dramatically
reduces
power
consumption (typically < 1µW with CLK stopped) by
shutting down all of the active circuitry. To enter Standby
mode, simply hold SCLK high after DRDY/DOUT goes
low, as shown in Figure 28. Standby mode can be
initiated at any time during readback; it is not necessary
to retrieve all 24 bits of data beforehand.
When t11 has passed with SCLK held high, Standby mode
will activate. DRDY/DOUT stays high when Standby
mode begins. SCLK must remain high to stay in Standby
mode. To exit Standby mode (wakeup), set SCLK low.
The first data after exiting Standby mode is valid. It is not
necessary to stop CLK during Standby mode, but doing
so will further reduce the digital supply current.
When the calibration is complete, DRDY/DOUT goes
low, indicating that new data is ready. There is no need
to alter the analog input signal applied to the ADS1224
during calibration; the input pins are disconnected
within the A/D converter and the appropriate signals are
applied internally and automatically. The first
conversion after a calibration is fully settled and valid for
use. The time required for a calibration depends on two
independent signals: the falling edge of SCLK and an
internal clock derived from CLK. Variations in the
internal calibration values will change the time required
for calibration (t8) within the range given by the min/max
specs. t11 and t12 described in the next section are
affected likewise.
Standby Mode With Self-Calibration
Self-calibration can be set to run immediately after
exiting Standby mode. This is useful when the
ADS1224 is put in Standby mode for long periods of
time and self-calibration is desired afterwards to
compensate for temperature or supply voltage
changes.
To force a self-calibration with Standby mode, shift 25
bits out before taking SCLK high to enter Standby
mode. Self-calibration then begins after wakeup.
Figure 29 shows the appropriate timing. Note the extra
time needed after wakeup for calibration before data is
ready. The first data after Standby mode with
self-calibration is fully settled and can be used.
Data Ready After Calibration
DRDY/DOUT
23
22
21
0
23
Calibration Begins
SCLK
1
24
25
26
t8
SYMBOL
DESCRIPTION
MIN
MAX
UNITS
t8(1)
First data ready after calibration
77.1
77.9
ms
(1) Values given for fCLK = 2MHz. For different fCLK frequencies, scale proportional to CLK period.
Figure 27. Self-Calibration Timing
15
www.ti.com
SBAS286A − JUNE 2003 − REVISED MARCH 2004
Data Ready
Standby Mode
DRDY/DOUT
23
22
21
0
23
Start Conversion
SCLK
1
24
t9
t10
t11
SYMBOL DESCRIPTION
t9(1)
t10(1)
t11(1)
MIN
SCLK high after DRDY/DOUT goes low to activate Standby mode
MAX
UNITS
0
8.272
ms
Standby mode activation time
8.272
8.304
ms
Data ready after exiting Standby mode
27.7
28.1
ms
(2) Values given for fCLK = 2MHz. For different fCLK frequencies, scale proportional to CLK period.
Figure 28. Standby Mode Timing (can be used for single conversions)
Data Ready After Calibration
Standby Mode
DRDY/DOUT
SCLK
23
22
21
0
1
24
23
Begin Calibration
25
t 12
t10
SYMBOL DESCRIPTION
MIN
MAX
UNITS
t12(1)
Data ready after exiting Standby mode and calibration
78.8
79.7
ms
(1) Values given for fCLK = 2MHz. For different fCLK frequencies, scale proportional to CLK period.
Figure 29. Standby Mode with Self-Calibration Timing (can be used for single conversions)
SINGLE CONVERSIONS
When only single conversions are needed, Standby
mode can be used to start and stop the ADS1224. To
make a single conversion, first enter the Standby mode
holding SCLK high. Now, when ready to start the
conversion, take SCLK low. The ADS1224 wakes up
and begins the conversion. Wait for DRDY/DOUT to go
low, and then retrieve the data. Afterwards, take SCLK
16
high to stop the ADS1224 from converting and re-enter
Standby mode. Continue to hold SCLK high until ready
to start the next conversion. Operating in this fashion
greatly reduces power consumption since the
ADS1224 is shut down while idle between conversions.
Self-calibrations can be performed prior to the start of
the single conversions by using the waveform shown in
Figure 29.
www.ti.com
SBAS286A − JUNE 2003 − REVISED MARCH 2004
APPLICATIONS INFORMATION
GENERAL RECOMMENDATIONS
The ADS1224 is a high-resolution A/D converter.
Achieving optimal device performance requires careful
attention to the support circuitry and printed circuit
board (PCB) design. Figure 30 shows the basic
connections for the ADS1224. As with any precision
circuit, be sure to use good supply bypassing capacitor
techniques. A smaller value ceramic capacitor in
parallel with a larger value tantulum capacitor works
well. Place the capacitors, in particular the ceramic
ones, close to the supply pins. Use a ground plane and
tie the ADS1224 GND pin and bypass capacitors
directly to it. Avoid ringing on the digital inputs. Small
resistors (≈100Ω) in series with the digital pins can help
by controlling the trace impedance. Place these
resistors at the source end.
Pay special attention to the reference and analog
inputs. These are the most critical circuits. Bypass the
voltage reference using similar techniques to the supply
voltages. The quality of the reference directly affects
the overall accuracy of the device. Make sure to use a
low noise and low drift reference such as the REF1004.
Often, only a simple RC filter is needed on the inputs.
This circuits limits the higher frequency noise. Avoid
low-grade dielectrics for the capacitors and place them
as close as possible to the input pins. Keep the traces
to the input pins short, and carefully watch how they are
routed on the PCB.
After the power supplies and reference voltage have
stabilized, issue a self-calibration command to
minimize offset and gain errors.
+5V
+5V
10µF
0.1µF
0.1µF
10µF
0.1µF
10µF
ADS1224
1
100Ω
2
100Ω
100Ω
3
4
100Ω
100Ω
5
6
100Ω
100Ω
7
8
9
220pF
301Ω
10
DVDD
AVDD
SCLK
VREFP
CLK
DRDY/DOUT
VREFN
GND
MUX0
AINN1
MUX1
AINP1
TEMPEN
AINN2
BUFEN
AINP2
AINP4
AINN3
AINN4
AINP3
20
19
+2.5V Reference
18
17
16
15
14
13
Same as shown for AINP4 and AINN4.
12
11
VINP
301Ω
0.1µF
VINN
220pF
Figure 30. Basic Connections
17
www.ti.com
SBAS286A − JUNE 2003 − REVISED MARCH 2004
MULTICHANNEL SYSTEMS
Multiple ADS1224s can be operated in parallel to
measure multiple input signals. Figure 31 shows an
example of an eight-channel system. For simplicity, the
supplies and reference circuitry are not shown. The
same CLK signal should be applied to all devices. To
synchronize the ADS1224s, connect the same SCLK
signal to all devices. Then place all the devices in
Standby mode. Afterwards, starting a conversion will
synchronize all the ADS1224s; that is, they will sample
the input signals simultaneously. The DRDY/DOUT
outputs will go low at approximately the same time after
synchronization. When reading data from the devices,
the data appears in parallel on DRDY/DOUT as a result
of the common SCLK connection.
The falling edges of DRDY/DOUT, indicating that new
data is ready, will vary with respect to each other no
more than time t13. This variation is due to possible
differences in the ADS1224 internal calibration settings.
To account for this, when using multiple devices, either
wait for t13 to pass after seeing one DRDY/DOUT go
low, or wait until all DRDY/DOUTs have gone low before
retrieving data.
Note that changing channels (using the MUX0 and
MUX1 pins), or using the input buffer (BUFEN) or the
temperature sensor (TEMPEN), may require more care
to settle the digital filter. For example, if the MUX0 pin
is toggled on one device and not the other, the
DRDY/DOUT line will be held high until the conversion
settles on the first device. The latter device will continue
conversions through this time. See the Settling Time
section of this datasheet for further details.
ADS1224
AINP1
CLK
AINN1
…
Inputs
SCLK
AINP4
AINN4
DRDY/DOUT
MUX Select
OUT1
MUX0
MUX1
OUT1
ADS1224
t13
AINP1
AINN1
OUT2
…
Inputs
CLK
AINP4
SCLK
AINN4
DRDY/DOUT
MUX Select
OUT2
MUX0
MUX1
CLK and SCLK
Sources
SYMBOL
t13(1)
DESCRIPTION
MIN
Difference between DRDY/DOUTs going low in multichannel
systems
(1) Values given for fCLK = 2MHz. For different fCLK frequencies, scale proportional to CLK period.
Figure 31. Example of Using Multiple ADS1224s in Parallel
18
MAX
UNITS
±0.8
ms
www.ti.com
SBAS286A − JUNE 2003 − REVISED MARCH 2004
VESSEL WEIGHING WITH FOUR LOAD
CELLS
In vessel weighing systems, four load cells are
frequently employed to measure the weight of the
vessel and its contents. The output of the load cells are
usually combined in an external summing junction box
that balances the load cells’ sensitivities for accuracy.
The four differential inputs of the ADS1224 allow for
direct measurement of the four load cells individually. In
this way, the mechanical adjustments performed inside
the summing junction box are eliminated and are
replaced by digital summing of the load cells in
software. Figure 32 shows an example of such a
system.
The reference voltage of the ADS1224 is derived by
dividing down the AVDD supply voltage to 2.5V, while
the load cell has a positive full-scale output of 10mV. In
the figure, a low drift, dual op amp (OPA2335) provides
a differential in/differential out amplifier with a gain of
499V/V (G = 1 + 2RF/RG). Gain on the load cell gives
the amplifier a full-scale output of 5V.
Each load cell input uses an external amplifier. The
outputs of the amplifiers connect to the analog inputs of
the ADS1224 through a low-pass filter. The cut-off
frequency is set to 360Hz, allowing full settling in a
single measurement cycle. A lower cut-off frequency
can be used to reduce noise from mechanical
vibrations, but at the expense of filter settling time.
The internal buffer of the ADS1224 is disabled, allowing
the VREFN pin to be grounded. Note that the loading
from the reference inputs will change the effective
reference voltage. The effective input impedance into
the VREFP and VREFN pins will lower the reference
voltage seen at these pins. At 2MHz, input impedance
is approximately 500kΩ. For the reference circuit shown
in Figure 32, this lowers the effective reference voltage
by approximately 0.1%.
5V
+3V
0.1 µ F
0.1 µ F
1µF
0.1 µ F
R FI
F ilter
1k Ω(1)
AVDD
DVDD
VREFP
0.1 µ F
350 Ω
Load Cell
DVCC
AVCC
BUF EN
1k Ω(1)
5V
Shielded
Cable
TEMPEN
VREFN
100 Ω
R FI
F ilter
G=1 +
R FI
F ilter
1/2
O PA2335 1k Ω
AD S1224
MSP430F41x
AINP1
2R F
RG
R G(1)
10 Ω
R F(1)
2.49k Ω
0.22 µ F
AINN 1
AINP2
R F(1)
2.49k Ω
NO TE: (1) Low−drift resistors.
100 Ω
R FI
F ilter
1k Ω
1/2
O PA2335
C LK
P1.1/TA0/M CLK
AINN2
SC LK
P1.2/TA1
AINP3
DRDY/DO UT
P1.0/TA0
AINN3
MU X0
P1.6/C A0
AINP4
MU X1
P1.7/C A1
AINN4
G ND
XIN
XO UT/TCLK
GND
Replicate for Channels 2, 3 and 4
Figure 32. Vessel Weighing System with Four Load Cells
19
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SBAS286A − JUNE 2003 − REVISED MARCH 2004
SUMMARY OF SERIAL INTERFACE WAVEFORMS
DRDY/DOUT
23
22
21
0
MSB
SCLK
LSB
1
24
(a) Data Retrieval
DRDY/DOUT
23
SCLK
22
21
0
1
24
25
(b) Data Retrieval with DRDY/DOUT Forced High Afterwards
Data Ready
After Calibration
DRDY/DOUT
23
SCLK
22
21
0
1
24
Begin Calibration
25
26
(c) Self−Calibration
Data Ready
Standby Mode
23
DRDY/DOUT
22
21
0
Start
Conversion
SCLK
1
24
(d) Standby Mode/Single Conversions
Data Ready
After Calibration
Standby Mode
DRDY/DOUT
23
22
21
0
Begin Calibration
SCLK
1
24
25
(e) Standby Mode/Single Conversions with Self−Calibration
Figure 33. Summary of Serial Interface Waveforms
20
PACKAGE OPTION ADDENDUM
www.ti.com
29-Mar-2004
PACKAGING INFORMATION
ORDERABLE DEVICE
STATUS(1)
PACKAGE TYPE
PACKAGE DRAWING
PINS
PACKAGE QTY
ADS1224IPWR
ACTIVE
TSSOP
PW
20
2500
ADS1224IPWT
ACTIVE
TSSOP
PW
20
250
(1) The marketing status values are defined as follows:
ACTIVE: Product device recommended for new designs.
LIFEBUY: TI has announced that the device will be discontinued, and a lifetime-buy period is in effect.
NRND: Not recommended for new designs. Device is in production to support existing customers, but TI does not recommend using this part in
a new design.
PREVIEW: Device has been announced but is not in production. Samples may or may not be available.
OBSOLETE: TI has discontinued the production of the device.
MECHANICAL DATA
MTSS001C – JANUARY 1995 – REVISED FEBRUARY 1999
PW (R-PDSO-G**)
PLASTIC SMALL-OUTLINE PACKAGE
14 PINS SHOWN
0,30
0,19
0,65
14
0,10 M
8
0,15 NOM
4,50
4,30
6,60
6,20
Gage Plane
0,25
1
7
0°– 8°
A
0,75
0,50
Seating Plane
0,15
0,05
1,20 MAX
PINS **
0,10
8
14
16
20
24
28
A MAX
3,10
5,10
5,10
6,60
7,90
9,80
A MIN
2,90
4,90
4,90
6,40
7,70
9,60
DIM
4040064/F 01/97
NOTES: A.
B.
C.
D.
All linear dimensions are in millimeters.
This drawing is subject to change without notice.
Body dimensions do not include mold flash or protrusion not to exceed 0,15.
Falls within JEDEC MO-153
POST OFFICE BOX 655303
• DALLAS, TEXAS 75265
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Following are URLs where you can obtain information on other Texas Instruments products and application
solutions:
Products
Applications
Amplifiers
amplifier.ti.com
Audio
www.ti.com/audio
Data Converters
dataconverter.ti.com
Automotive
www.ti.com/automotive
DSP
dsp.ti.com
Broadband
www.ti.com/broadband
Interface
interface.ti.com
Digital Control
www.ti.com/digitalcontrol
Logic
logic.ti.com
Military
www.ti.com/military
Power Mgmt
power.ti.com
Optical Networking
www.ti.com/opticalnetwork
Microcontrollers
microcontroller.ti.com
Security
www.ti.com/security
Telephony
www.ti.com/telephony
Video & Imaging
www.ti.com/video
Wireless
www.ti.com/wireless
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