HM62W16255HI Series 4M High Speed SRAM (256-kword × 16-bit) ADE-203-1038B (Z) Rev. 2.0 Jan. 20, 2000 Description The HM62W16255HI is a 4-Mbit high speed static RAM organized 256-kword × 16-bit. It has realized high speed access time by employing CMOS process (4-transistor + 2-poly resistor memory cell)and high speed circuit designing technology. It is most appropriate for the application which requires high speed, high density memory and wide bit width configuration, such as cache and buffer memory in system. It is packaged in 400-mil 44-pin SOJ and 400-mil 44-pin plastic TSOPII. Features • Single 3.3 V supply: 3.3 V ± 0.3V • Access time: 15 ns (max) • Completely static memory No clock or timing strobe required • Equal access and cycle times • Directly TTL compatible All inputs and outputs • Operating current: 160 mA (max) • TTL standby current: 50 mA (max) • CMOS standby current: 5 mA (max) • Center VCC and VSS type pinout • Temperature range: –40 to 85°C HM62W16255HI Series Ordering Information Type No. Access time Package HM62W16255HJPI-15 15 ns 400-mil 44-pin plastic SOJ (CP-44D) HM62W16255HTTI-15 15 ns 400-mil 44-pin plastic TSOPII (TTP-44DE) Pin Arrangement HM62W16255HJPI Series A0 A1 A2 A3 A4 CS I/O1 I/O2 I/O3 I/O4 VCC VSS I/O5 I/O6 I/O7 I/O8 WE A5 A6 A7 A8 A9 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 44 43 42 41 40 39 38 37 36 35 34 33 32 31 30 29 28 27 26 25 24 23 (Top View) 2 A17 A16 A15 OE UB LB I/O16 I/O15 I/O14 I/O13 VSS VCC I/O12 I/O11 I/O10 I/O9 NC A14 A13 A12 A11 A10 HM62W16255HTTI Series A0 A1 A2 A3 A4 CS I/O1 I/O2 I/O3 I/O4 VCC VSS I/O5 I/O6 I/O7 I/O8 WE A5 A6 A7 A8 A9 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 (Top View) 44 43 42 41 40 39 38 37 36 35 34 33 32 31 30 29 28 27 26 25 24 23 A17 A16 A15 OE UB LB I/O16 I/O15 I/O14 I/O13 VSS VCC I/O12 I/O11 I/O10 I/O9 NC A14 A13 A12 A11 A10 HM62W16255HI Series Pin Description Pin name Function A0 to A17 Address input I/O1 to I/O16 Data input/output CS Chip select OE Output enable WE Write enable UB Upper byte select LB Lower byte select VCC Power supply VSS Ground NC No connection Block Diagram (LSB) A1 A17 A7 A11 A16 A2 A6 A5 (MSB) VCC Row decoder Memory matrix 256 rows × 8 columns × 128 blocks × 16 bit (4,194,304 bits) VSS CS I/O1 .. . I/O8 Column I/O Input data control I/O9 .. . I/O16 WE CS LB Column decoder CS A10 A8 A9 A12 A13 A14 A0 A15 A3 A4 UB OE CS 3 HM62W16255HI Series Operation Table CS OE WE LB UB Mode VCC current I/O1–I/O8 I/O9–I/O16 Ref. cycle H × × × × Standby I SB , I SB1 High-Z High-Z — L H H × × Output disable I CC High-Z High-Z — L L H L L Read I CC Output Output Read cycle L L H L H Lower byte read I CC Output High-Z Read cycle L L H H L Upper byte read I CC High-Z Output Read cycle L L H H H — I CC High-Z High-Z — L × L L L Write I CC Input Input Write cycle L × L L H Lower byte write I CC Input High-Z Write cycle L × L H L Upper byte write I CC High-Z Input Write cycle L × L H H — High-Z High-Z — Note: I CC ×: H or L Absolute Maximum Ratings Parameter Symbol Value Supply voltage relative to VSS VCC –0.5 to +4.6 1 Unit V 2 Voltage on any pin relative to V SS VT –0.5* to V CC + 0.5* V Power dissipation PT 1.0 W Operating temperature Topr –40 to +85 °C Storage temperature Tstg –55 to +125 °C Storage temperature under bias Tbias –40 to +85 °C Notes: 1. VT (min) = –2.0 V for pulse width (under shoot) ≤ 8 ns 2. VT (max) = VCC + 2.0 V for pulse width (over shoot) ≤ 8 ns 4 HM62W16255HI Series Recommended DC Operating Conditions (Ta = –40 to +85°C) Parameter Symbol Supply voltage Input voltage Min Typ Max Unit VCC* 3 3.0 3.3 3.6 V VSS * 4 0 0 0 VIH 2.2 1 VIL Notes: 1. 2. 3. 4. –0.5* V 2 — VCC + 0.5* V — 0.8 V VIL (min) = –2.0 V for pulse width (under shoot) ≤ 8 ns VIH (max) = VCC + 2.0 V for pulse width (over shoot) ≤ 8 ns The supply voltage with all VCC pins must be on the same level. The supply voltage with all VSS pins must be on the same level. DC Characteristics (Ta = –40 to +85°C, VCC = 3.3 V ± 0.3 V, VSS = 0 V) Parameter Symbol Min Typ*1 Max Unit Test conditions Input leakage current |ILI| — — 2 µA Vin = VSS to V CC Output leakage current* 1 |ILO | — — 2 µA Vin = VSS to V CC Operating power supply current 15 ns cycle I CC — — 160 mA Min cycle CS = VIL, Iout = 0 mA Other inputs = VIH/VIL Standby power supply current 15 ns cycle I SB — — 50 mA Min cycle, CS = VIH, Other inputs = VIH/VIL I SB1 — 0.05 5 mA f = 0 MHz VCC ≥ CS ≥ VCC – 0.2 V, (1) 0 V ≤ Vin ≤ 0.2 V or (2) VCC ≥ Vin ≥ VCC – 0.2 V VOL — — 0.4 V I OL = 8 mA VOH 2.4 — — V I OH = –4 mA Output voltage Note: 1. Typical values are at VCC = 3.3 V, Ta = +25°C and not guaranteed. Capacitance (Ta = +25°C, f = 1.0 MHz) Parameter 1 Input capacitance* Input/output capacitance* Note: 1 Symbol Min Typ Max Unit Test conditions Cin — — 6 pF Vin = 0 V CI/O — — 8 pF VI/O = 0 V 1. This parameter is sampled and not 100% tested. 5 HM62W16255HI Series AC Characteristics (Ta = –40 to +85°C, VCC = 3.3 V ± 0.3 V, unless otherwise noted.) Test Conditions • • • • Input pulse levels: 3.0 V/0.0 V Input rise and fall time: 3 ns Input and output timing reference levels: 1.5 V Output load: See figures (Including scope and jig) 3.3 V 1.5 V 319Ω Dout RL=50 Ω 353Ω Dout Zo=50 Ω Output load (A) 5 pF Output load (B) (for tCLZ, tOLZ, tLBLZ, tUBLZ, tCHZ, tOHZ, tLBHZ, tUBHZ, tWHZ, and tOW) Read Cycle HM62W16255HI -15 Parameter Symbol Min Max Unit Read cycle time t RC 15 — ns Address access time t AA — 15 ns Chip select access time t ACS — 15 ns Output enable to output valid t OE — 7 ns Byte select to output valid t LB, t UB — 7 ns Output hold from address change t OH 3 — ns Chip select to output in low-Z t CLZ 3 — ns 1 Output enable to output in low-Z t OLZ 0 — ns 1 Byte select to output in low-Z t LBLZ, t UBLZ 0 — ns 1 Chip deselect to output in high-Z t CHZ — 7 ns 1 Output disable to output in high-Z t OHZ — 7 ns 1 Byte deselect to output in high-Z t LBHZ, t UBHZ — 7 ns 1 6 Notes HM62W16255HI Series Write Cycle HM62W16255HI -15 Parameter Symbol Min Max Unit Notes Write cycle time t WC 15 — ns Address valid to end of write t AW 10 — ns Chip select to end of write t CW 10 — ns 8 Write pulse width t WP 10 — ns 7 Byte select to end of write t LBW, t UBW 10 — ns 9, 10 Address setup time t AS 0 — ns 5 Write recovery time t WR 0 — ns 6 Data to write time overlap t DW 7 — ns Data hold from write time t DH 0 — ns Write disable to output in low-Z t OW 3 — ns 1 Output disable to output in high-Z t OHZ — 7 ns 1 Write enable to output in high-Z t WHZ — 7 ns 1 Notes: 1. Transition is measured ±200 mV from steady voltage with Load (B). This parameter is sampled and not 100% tested. 2. If the CS or LB or UB low transition occurs simultaneously with the WE low transition or after the WE transition, output remains a high impedance state. 3. WE and/or CS must be high during address transition time. 4. If CS, OE, LB and UB are low during this period, I/O pins are in the output state. Then the data input signals of opposite phase to the outputs must not be applied to them. 5. t AS is measured from the latest address transition to the latest of CS, WE, LB or UB going low. 6. t WR is measured from the earliest of CS, WE, LB or UB going high to the first address transition. 7. A write occurs during the overlap of low CS, low WE and low LB or low UB. 8. t CW is measured from the later of CS going low to the end of write. 9. t LBW is measured from the later of LB going low to the end of write. 10. t UBW is measured from the later of UB going low to the end of write. 7 HM62W16255HI Series Timing Waveforms Read Timing Waveform (1) (WE = VIH) t RC Address Valid address tAA tACS CS tCHZ *1 tOE OE tOHZ *1 tLB LB tLBHZ*1 tUB UB tUBHZ*1 tLBLZ *1 Dout (Lower byte) High Impedance *4 *4 Valid data tUBLZ *1 tOH tOLZ *1 tCLZ *1 Dout (Upper byte) 8 High Impedance *4 Valid data *4 HM62W16255HI Series Read Timing Waveform (2) (WE = VIH, LB = VIL , UB, = VIL) tRC Address Valid address tOH tAA tACS tCHZ*1 CS tOE tOHZ*1 OE tOLZ*1 tCLZ *1 Dout (Lower/Upper byte) High Impedance *4 Valid data *4 9 HM62W16255HI Series Write Timing Waveform (1) (LB, UB Controlled) tWC Valid address Address tAW tWR tAS tWP WE*3 tCW CS*3 OE tLBW LB tUBW UB tOLZ tWHZ tOHZ tOW Dout (Lower byte) High impedance Dout (Upper byte) High impedance tDW Din (Lower byte) Valid data tDW Din (Upper byte) 10 tDH tDH Valid data HM62W16255HI Series Write Timing Waveform (2) (WE Controlled) tWC Valid address Address tWR tAW tAS tWP WE*3 tCW CS*3 OE tLBW tUBW LB, UB tOLZ tWHZ tOW tOHZ Dout (Lower/Upper byte) Din (Lower/Upper byte) High impedance *2 tDW tDH Valid data 11 HM62W16255HI Series Write Timing Waveform (3) (CS Controlled) tWC Valid address Address tWR tAW tAS tWP WE *3 tCW CS *3 OE tLBW tUBW LB, UB tOLZ tWHZ tOW tOHZ Dout (Lower/Upper byte) Din (Lower/Upper byte) 12 4 High impedance * *2 tDW tDH Valid data HM62W16255HI Series Package Dimensions HM62W16255HJPI Series (CP-44D) Unit: mm 28.33 28.90 Max *0.43 ± 0.10 0.41 ± 0.08 1.27 0.10 *Dimension including the plating thickness Base material dimension 2.65 ± 0.12 1.30 Max 0.80 +0.25 –0.17 22 0.74 3.50 ± 0.26 1 11.18 ± 0.13 23 10.16 ± 0.13 44 9.40 ± 0.25 Hitachi Code JEDEC EIAJ Weight (reference value) CP-44D Conforms — 1.8 g 13 HM62W16255HI Series HM62W16255HTTI Series (TTP-44DE) Unit: mm 18.41 18.81 Max 23 10.16 44 0.80 *0.27 ± 0.07 0.25 ± 0.05 22 0.80 0.13 M 11.76 ± 0.20 1.005 Max *Dimension including the plating thickness Base material dimension 14 0.13 ± 0.05 0.10 *0.145 ± 0.05 0.125 ± 0.04 1.20 Max 0° – 5° 0.50 ± 0.10 Hitachi Code JEDEC EIAJ Weight (reference value) TTP-44DE — — 0.43 g 0.68 1 HM62W16255HI Series Cautions 1. Hitachi neither warrants nor grants licenses of any rights of Hitachi’s or any third party’s patent, copyright, trademark, or other intellectual property rights for information contained in this document. Hitachi bears no responsibility for problems that may arise with third party’s rights, including intellectual property rights, in connection with use of the information contained in this document. 2. Products and product specifications may be subject to change without notice. Confirm that you have received the latest product standards or specifications before final design, purchase or use. 3. Hitachi makes every attempt to ensure that its products are of high quality and reliability. However, contact Hitachi’s sales office before using the product in an application that demands especially high quality and reliability or where its failure or malfunction may directly threaten human life or cause risk of bodily injury, such as aerospace, aeronautics, nuclear power, combustion control, transportation, traffic, safety equipment or medical equipment for life support. 4. Design your application so that the product is used within the ranges guaranteed by Hitachi particularly for maximum rating, operating supply voltage range, heat radiation characteristics, installation conditions and other characteristics. Hitachi bears no responsibility for failure or damage when used beyond the guaranteed ranges. Even within the guaranteed ranges, consider normally foreseeable failure rates or failure modes in semiconductor devices and employ systemic measures such as fail-safes, so that the equipment incorporating Hitachi product does not cause bodily injury, fire or other consequential damage due to operation of the Hitachi product. 5. This product is not designed to be radiation resistant. 6. No one is permitted to reproduce or duplicate, in any form, the whole or part of this document without written approval from Hitachi. 7. Contact Hitachi’s sales office for any questions regarding this document or Hitachi semiconductor products. Hitachi, Ltd. Semiconductor & Integrated Circuits. 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Ltd. 16 Collyer Quay #20-00 Hitachi Tower Singapore 049318 Tel: 535-2100 Fax: 535-1533 Hitachi Asia Ltd. Taipei Branch Office 3F, Hung Kuo Building. No.167, Tun-Hwa North Road, Taipei (105) Tel: <886> (2) 2718-3666 Fax: <886> (2) 2718-8180 Hitachi Asia (Hong Kong) Ltd. Group III (Electronic Components) 7/F., North Tower, World Finance Centre, Harbour City, Canton Road, Tsim Sha Tsui, Kowloon, Hong Kong Tel: <852> (2) 735 9218 Fax: <852> (2) 730 0281 Telex: 40815 HITEC HX Copyright © Hitachi, Ltd., 1998. All rights reserved. Printed in Japan. 15 HM62W16255HI Series Revision Record Rev. Date Contents of Modification Drawn by 1.0 Apr. 15, 1999 Initial issue T. Fukazawa K. Makuta 2.0 Jan. 20, 2000 Ordering information: Correct error 16 Approved by