INTEL PA28F400BL-T150

4-MBlT (256K x 16, 512K x 8)
LOW-POWER BOOT BLOCK
FLASH MEMORY FAMILY
28F400BL-T/B, 28F004BL-T/B
Y
Y
Y
Y
Low Voltage Operation for Very
Low-Power Portable Applications
Ð VCC e 3.0V – 3.6V Read
Ð VCC e 3.15V – 3.6V Program/Erase
Y
SRAM-Compatible Write Interface
Y
Automatic Power Savings Feature
Ð 0.8 mA typical ICC Active Current in
Static Operation
Expanded Temperature Range
Ð b 20§ C to a 70§ C
Y
x8/x16 Input/Output Architecture
Ð 28F400BL-T, 28F400BL-B
Ð For High Performance and High
Integration 16-bit and 32-bit CPUs
Very High-Performance Read
Ð 150 ns Maximum Access Time
Ð 65 ns Maximum Output Enable Time
Y
Low Power Consumption
Ð 15 mA Typical Active Read Current
Y
Reset/Deep Power-Down Input:
Ð 0.2 mA ICC Typical
Ð Acts as Reset for Boot Operations
Y
Write Protection for Boot Block
Y
Hardware Data Protection Feature
Ð Erase/Write Lockout During Power
Transitions
Y
Industry Standard Surface Mount
Packaging
Ð 28F400BL: JEDEC ROM
Compatible
44-Lead PSOP
56-Lead TSOP
Ð 28F004BL: 40-Lead TSOP
Y
12V Word/Byte Write and Block Erase
Ð VPP e 12V g 5% Standard
Y
ETOX TM III Flash Technology
Ð 3.3V Read
x8-only Input/Output Architecture
Ð 28F004BL-T, 28F004BL-B
Ð For Space Constrained 8-bit
Applications
Y
Upgradeable to Intel’s SmartVoltage
Products
Y
Optimized High Density Blocked
Architecture
Ð One 16-KB Protected Boot Block
Ð Two 8-KB Parameter Blocks
Ð One 96-KB Main Block
Ð Three 128-KB Main Blocks
Ð Top or Bottom Boot Locations
Y
Y
Extended Cycling Capability
Ð 10,000 Block Erase Cycles
Automated Word/Byte Write and Block
Erase
Ð Command User Interface
Ð Status Registers
Ð Erase Suspend Capability
*Other brands and names are the property of their respective owners.
Information in this document is provided in connection with Intel products. Intel assumes no liability whatsoever, including infringement of any patent or
copyright, for sale and use of Intel products except as provided in Intel’s Terms and Conditions of Sale for such products. Intel retains the right to make
changes to these specifications at any time, without notice. Microcomputer Products may have minor variations to this specification known as errata.
COPYRIGHT © INTEL CORPORATION, 1995
November 1995
Order Number: 290450-005
28F400BL-T/B, 28F004BL-T/B
Intel’s 4-Mbit Low Power Flash Memory Family is an extension of the Boot Block Architecture which includes
block-selective erasure, automated write and erase operations and standard microprocessor interface. The
4-Mbit Low Power Flash Memory Family enhances the Boot Block Architecture by adding more density and
blocks, x8/x16 input/output control, very low power, very high speed, an industry standard ROM compatible
pinout and surface mount packaging. The 4-Mbit low power flash family opens a new capability for 3V batteryoperated portable systems and is an easy upgrade to Intel’s 2-Mbit Low Power Boot Block Flash Memory
Family.
The Intel 28F400BL-T/B are 16-bit wide low power flash memory offerings. These high density flash memories
provide user selectable bus operation for either 8-bit or 16-bit applications. The 28F400BL-T and 28F400BL-B
are 4,194,304-bit non-volatile memories organized as either 524,288 bytes or 262,144 words of information.
They are offered in 44-Lead plastic SOP and 56-Lead TSOP packages. The x8/x16 pinout conforms to the
industry standard ROM/EPROM pinout. The Intel 28F004BL-T/B are 8-bit wide low power flash memories
with 4,194,304 bits organized as 524,288 bytes of information. They are offered in a 40-Lead TSOP package,
which is ideal for space-constrained portable systems.
These devices use an integrated Command User Interface (CUI) and Write State Machine (WSM) for simplified
word/byte write and block erasure. The 28F400BL-T/28F004BL-T provide block locations compatible with
Intel’s Low Voltage MCS-186 family, i386 TM , i486 TM microprocessors. The 28F400BL-B/28F004BL-B provide
compatibility with Intel’s 80960KX and 80960SX families as well as other low voltage embedded microprocessors.
The boot block includes a data protection feature to protect the boot code in critical applications. With a
maximum access time of 150 ns, these 4-Mbit low power flash devices are very high performance memories at
3.3V which interface to a wide range of low voltage microprocessors and microcontrollers. A deep powerdown mode lowers the total VCC power consumption to 0.66 mW which is critical in handheld battery powered
systems such as Handy Cellular Phones. For very high speed applications using a 5V supply, refer to the Intel
28F400BX-T/B, 28F004BX-T/B 4-Mbit Boot Block Flash Memory family datasheet.
Manufactured on Intel’s 0.8 micron ETOX III process, the 4-Mbit flash memory family provides world class
quality, reliability and cost-effectiveness at the 4 Mbit density level.
2
28F400BL-T/B, 28F004BL-T/B
1.0
PRODUCT FAMILY OVERVIEW
Throughout this datasheet 28F400BL refers to both
the 28F400BL-T and 28F400BL-B devices and
28F004BL refers to both the 28F004BL-T and
28F004BL-B devices. The 4-Mbit flash family refers
to both the 28F400BL and 28F004BL products. This
datasheet comprises the specifications for four separate products in the 4-Mbit flash family, Section 1
provides an overview of the 4-Mbit flash family including applications, pinouts and pin descriptions.
Sections 2 and 3 describe in detail the specific memory organizations for the 28F400BL and 28F004BL
products respectively, Section 4 combines a description of the family’s principles of operations. Finally section 5 describes the family’s operating
specifications.
1.2 Main Features
The 28F400BL/28F004BL boot block flash memory
family is a very high performance 4-Mbit (4,194,304
bit) memory family organized as either 256 KWords
(262,144 words) of 16 bits each or 512 Kbytes
(524,288 bytes) of 8 bits each.
Seven Separately Erasable Blocks including a
Hardware-Lockable boot block (16,384 Bytes),
two parameter blocks (8,192 Bytes each) and four
main blocks (1 block of 98,304 Bytes and 3 blocks
of 131,072 Bytes) are included on the 4-Mbit family.
An erase operation erases one of the main blocks in
typically 3.4 seconds and the boot or parameter
blocks in typically 2.0 seconds, independent of the
remaining blocks. Each block can be independently
erased and programmed 10,000 times.
Product Family
x8/x16 Products
x8-Only Products
28F400BL-T
28F004BL-T
28F400BL-B
28F004BL-B
1.1 Designing for Upgrade to
SmartVoltage Products
Today’s high volume boot block products are upgradeable to Intel’s SmartVoltage boot block products that provide program and erase operation at 5V
or 12V VPP and read operation at 3V or 5V VCC.
Intel’s SmartVoltage boot block products provide the
following enhancements to the boot block products
described in this datasheet:
1. DU pin is replaced by WPÝ to provide a means to
lock and unlock the boot block with logic signals.
2. 5V Program/Erase operation uses proven program and erase techniques with 5V g 10% applied to VPP.
3. Enhanced circuits optimize performance at 3.3V
VCC.
Refer to the 2, 4 or 8Mbit SmartVoltage Boot Block
Flash Memory datasheets for complete specifications.
When you design with 12V VPP boot block products
you should provide the capability in your board design to upgrade to SmartVoltage products.
Follow these guidelines to ensure compatibility:
1. Connect DU (WPÝ on SmartVoltage products) to
a control signal or to VCC or GND.
2. If adding a switch on VPP for write protection,
switch to GND for complete write protection.
3. Allow for connecting 5V to VPP and disconnect
12V from the VPP line, if desired.
The Boot Block is located at either the top (-T) or
the bottom (-B) of the address map in order to accommodate different microprocessor protocols for
boot code location. The hardware Iockable boot
block provides the most secure code storage. The
boot block is intended to store the kernel code required for booting-up a system. When the RPÝ pin is
between 11.4V and 12.6V the boot block is unlocked
and program and erase operations can be performed. When the RPÝ pin is at or below 4.1V the
boot block is locked and program and erase operations to the boot block are ignored.
The 28F400BL products are available in the
ROM/EPROM compatible pinout and housed in the
44-Lead PSOP (Plastic Small Outline) package and
the 56-Lead TSOP (Thin Small Outline, 1.2mm thick)
package as shown in Figures 3 and 4, The
28F004BL products are available in the 40-Lead
TSOP (1.2mm thick) package as shown in Figure 5.
The Command User Interface (CUI) serves as the
interface between the microprocessor or microcontroller and the internal operation of the 28F400BL
and 28F004BL flash memory products.
Program and Erase Automation allow program
and erase operations to be executed using a twowrite command sequence to the CUI. The internal
Write State Machine (WSM) automatically executes
the algorithms and timings necessary for program
and erase operations, including verifications, thereby unburdening the microprocessor or microcontroller. Writing of memory data is performed in word or
byte increments for the 28F400BL family and in byte
increments for the 28F004BL family typically within
11 ms.
3
28F400BL-T/B, 28F004BL-T/B
The Status Register (SR) indicates the status of the
WSM and whether the WSM successfully completed
the desired program or erase operation.
Maximum Access Time of 150 ns (tACC) is achieved
over the commercial temperature range (0§ C to
a 70§ C), VCC supply voltage range (3.0V to 3.6V,
4.5V to 5.5V) and 50 pF output load.
Ipp Program current is 40 mA for x16 operation
and 30 mA for x8 operation. IPP Erase current is
30 mA maximum. VPP erase and programming
voltage is 11.4V to 12.6V (VPP e 12V g 5%) under all operating conditions.
Typical ICC Active Current of 15 mA is achieved
for the x16 products and the x8 products.
The 4-Mbit flash family is also designed with an Automatic Power Savings (APS) feature to minimize
system battery current drain and allow for very low
power designs. Once the device is accessed to read
the array data, APS mode will immediately put the
memory in static mode of operation where ICC active
current is typically 0.8 mA until the next read is initiated.
When the CEÝ and RPÝ pins are at VCC and the
BYTEÝ pin (28F400BX-L-only) is at either VCC or
GND the CMOS Standby mode is enabled where
ICC is typically 45 mA.
A Deep Power-Down Mode is enabled when the
PWD pin is at ground minimizing power consumption
and providing write protection during power-up conditions. ICC current during deep power-down mode
is 0.20 mA typical. An initial maximum access time
or Reset Time of 600 ns is required from RPÝ
switching until outputs are valid. Equivalently, the
device has a maximum wake-up time of 1 ms until
writes to the Command User Interface are recognized. When RPÝ is at ground the WSM is reset, the
Status Register is cleared and the entire device is
protected from being written to. This feature prevents data corruption and protects the code stored
in the device during system reset. The system Reset
pin can be tied to RPÝ to reset the memory to normal read mode upon activation of the Reset pin.
When the CPU enters reset mode, it expects to read
the contents of a memory location. Furthermore,
with on-chip program/erase automation in the
4-Mbit family and the RPÝ functionality for data protection, when the CPU is reset and even if a program
or erase command is issued, the device will not recognize any operation until RPÝ returns to its normal
state.
4
For the 2SF400BL, Byte-wide or Word-wide Input/Output Control is possible by controlling the
BYTEÝ pin. When the BYTEÝ pin is at a logic low
the device is in the byte-wide mode (x8) and data is
read and written through DQ [0:7] . During the bytewide mode, DQ [8:14] are tri-stated and DQ15/A b 1
becomes the lowest order address pin. When the
BYTEÝ pin is at a logic high the device is in the
word-wide mode (x16) and data is read and written
through DQ [0:15] .
1.3 Applications
The 4-Mbit low power boot block flash memory family combines high density, very low power, high performance, cost-effective flash memories with blocking and hardware protection capabilities. Its flexibility
and versatility will reduce costs throughout the product life cycle. Flash memory is ideal for Just-In-Time
production flow, reducing system inventory and
costs, and eliminating component handling during
the production phase. During the product life cycle,
when code updates or feature enhancements become necessary, flash memory will reduce the update costs by allowing either a user-performed code
change via floppy disk or a remote code change via
a serial link. The 4-Mbit flash family provides full
function, blocked flash memories suitable for a wide
range of applications. These applications include
Extended PC BIOS and ROM-able applications
storage, Handy Digital Cellular Phone program
and data storage and various other low power embedded applications where both program and data
storage are required.
Portable systems such as Notebook/Palmtop computers, are ideal applications for the 4-Mbit low power flash products. Portable and handheld personal
computer applications are becoming more complex
with the addition of power management software to
take advantage of the latest microprocessor technology, the availability of ROM-based application
software, pen tablet code for electronic hand writing,
and diagnostic code. Figure 1 shows an example of
a 28F400BL-T application.
This increase in software sophistication augments
the probability that a code update will be required
after the Notebook is shipped. The 4-Mbit flash
products provide an inexpensive update solution for
the notebook and handheld personal computers
while extending their product lifetime. Furthermore,
the 4-Mbit flash products’ deep power-down mode
provides added flexibility for these battery-operated
portable designs which require operation at very low
power levels.
28F400BL-T/B, 28F004BL-T/B
The 4-Mbit low power flash products also provide
excellent design solutions for Handy Digital Cellular
Phone applications requiring low voltage supply,
high performance, high density storage capability
coupled with modular software designs, and a small
form factor package (x8-only bus). The 4-Mbit’s
blocking scheme allows for an easy segmentation of
the embedded code with; 16-Kbytes of HardwareProtected Boot code, 4 Main Blocks of program
code and 2 Parameter Blocks of 8-Kbytes each for
frequently updatable data storage and diagnostic
messages (e.g., phone numbers, authorization
codes). Figure 2 is an example of such an application with the 28F004BL-T.
These are a few actual examples of the wide range
of applications for the 4-Mbit low power Boot Block
flash memory family which enable system designers
achieve the best possible product design. Only your
imagination limits the applicability of such a versatile
low power product family.
290450 – 7
Figure 1. 28F400BL Interface to Intel386 TM EX Embedded Processor
290450 – 23
Figure 2. 28F004BL Interface to INTEL 80L188EB Low Voltage 8-bit Embedded Processor
5
28F400BL-T/B, 28F004BL-T/B
1.4 Pinouts
pinout shown in Figure 4 provides density upgrades
to future higher density boot block memories.
The 28F400BL 44-Lead PSOP pinout follows the
industry standard ROM/EPROM pinout as shown
in Figure 3 and provides an upgrade for the
28F200BL Low Power Boot Block flash memory
family. Furthermore, the 28F400BL 56-Lead TSOP
The 28F004BL 40-Lead TSOP pinout shown in Figure 5 is 100% compatible and provides a density
upgrade for the 28F002BL 2-Mbit Low Power Boot
Block flash memory family.
290450 – 24
Figure 3. PSOP Lead Configuration for x8/x16 28F400BL
6
28F400BL-T/B, 28F004BL-T/B
290450 – 6
Figure 4. TSOP Lead Configuration for x8 28F400BL
290450 – 5
Figure 5. TSOP Lead Configuration for x8 28F004BL
7
28F400BL-T/B, 28F004BL-T/B
1.5 Pin Descriptions for x8/x16 28F400BL
Symbol
8
Type
Name and Function
A0 –A17
I
ADDRESS INPUTS for memory addresses. Addresses are internally latched
during a write cycle.
A9
I
ADDRESS INPUT: When A9 is at 12V the signature mode is accessed. During this
mode A0 decodes between the manufacturer and device ID’s. When BYTEÝ is at
a logic low only the lower byte of the signatures are read. DQ15/Ab1 is a don’t
care in the signature mode when BYTEÝ is low.
DQ0 –DQ7
I/O
DATA INPUTS/OUTPUTS: Inputs array data on the second CEÝ and WEÝ cycle
during a program command. Inputs commands to the command user interface
when CEÝ and WEÝ are active. Data is internally latched during the write and
program cycles. Outputs array, Intelligent Identifier and status register data. The
data pins float to tri-state when the chip is deselected or the outputs are disabled.
DQ8 –DQ15
I/O
DATA INPUT/OUTPUTS: Inputs array data on the second CEÝ and WEÝ cycle
during a program command. Data is internally latched during the write and program
cycles. The data pins float to tri-state when the chip is deselected or the outputs
are disabled as in the byte-wide mode (BYTEÝ e ‘‘0’’). In the byte-wide mode
DQ15/Ab1 becomes the lowest order address for data output on DQ0 –DQ7.
CEÝ
I
CHIP ENABLE: Activates the device’s control logic, input buffers, decoders and
sense amplifiers. CEÝ is active low; CEÝ high deselects the memory device and
reduces power consumption to standby levels. If CEÝ and RPÝ are high, but not
at a CMOS high level, the standby current will increase due to current flow through
the CEÝ and RPÝ input stages.
RPÝ
I
RESET/DEEP POWER-DOWN: Provides Three-State control. Puts the device in
deep power-down mode. Locks the boot block from program/erase.
When RPÝ is at logic high level and equals 4.1V maximum the boot block is
locked and cannot be programmed or erased.
When RPÝ e 11.4V minimum the boot block is unlocked and can be programmed
or erased.
When RPÝ is at a logic low level the boot block is locked, the deep power-down
mode is enabled and the WSM is reset preventing any blocks from being
programmed or erased, therefore providing data protection during power
transitions. When RPÝ transitions from logic low to logic high, the flash memory
enters the read-array mode.
OEÝ
I
OUTPUT ENABLE: Gates the device’s outputs through the data buffers during a
read cycle. OEÝ is active low.
WEÝ
I
WRITE ENABLE: Controls writes to the Command Register and array blocks.
WEÝ is active low. Addresses and data are latched on the rising edge of the WEÝ
pulse.
28F400BL-T/B, 28F004BL-T/B
1.5 Pin Descriptions for x8/x16 28F400BL (Continued)
Symbol
Type
Name and Function
BYTEÝ
I
BYTEÝ ENABLE: Controls whether the device operates in the byte-wide mode (x8) or
the word-wide mode (x16). BYTEÝ e ‘‘0’’ enables the byte-wide mode, where data is
read and programmed on DQ0 –DQ7 and DQ15/Ab1 becomes the lowest order
address that decodes between the upper and lower byte. DQ8 –DQ14 are tri-stated
during the byte-wide mode. BYTEÝ e ‘‘1’’ enables the word-wide mode where data is
read and programmed on DQ0 –DQ15.
VPP
PROGRAM/ERASE POWER SUPPLY: For erasing memory array blocks or
programming data in each block.
Note: VPP k VPPLMAX memory contents cannot be altered.
VCC
DEVICE POWER SUPPLY (3.3V g 0.3, 5V g 10%)
GND
GROUND: For all internal circuitry.
NC
NO CONNECT: Pin may be driven or left floating.
DU
DON’T USE PIN: Pin should not be connected to anything.
9
28F400BL-T/B, 28F004BL-T/B
1.6 Pin Descriptions for x8 28F004BL
Symbol
Type
Name and Function
A0 –A18
I
ADDRESS INPUTS for memory addresses. Addresses are internally latched during
a write cycle.
A9
I
ADDRESS INPUT: When A9 is at 12V the signature mode is accessed. During this
mode A0 decodes between the manufacturer and device ID’s.
I/O
DATA INPUTS/OUTPUTS: Inputs array data on the second CEÝ and WEÝ cycle
during a program command. Inputs commands to the command user interface
when CEÝ and WEÝ are active. Data is internally latched during the write and
program cycles. Outputs array, Intelligent Identifier and status register data. The
data pins float to tri-state when the chip is deselected or the outputs are disabled.
CEÝ
I
CHIP ENABLE: Activates the device’s control logic, input buffers, decoders and
sense amplifiers. CEÝ is active low; CEÝ high deselects the memory device and
reduces power consumption to standby levels.
RPÝ
I
RESET/DEEP POWER-DOWN: Provides Three-State control. Puts the device in
deep power-down mode. Locks the Boot Block from program/erase.
DQ0 –DQ7
When RPÝ is at logic high level and equals 4.1V maximum the Boot Block is locked
and cannot be programmed or erased.
When RPÝ e 11.4V minimum the Boot Block is unlocked and can be programmed
or erased.
When RPÝ is at a logic low level the Boot Block is locked, the deep power-down
mode is enabled and the WSM is reset preventing any blocks from being
programmed or erased, therefore providing data protection during power
transitions. When RPÝ transitions from logic low to logic high, the flash memory
enters the read-array mode.
OEÝ
I
OUTPUT ENABLE: Gates the device’s outputs through the data buffers during a
read cycle. OEÝ is active low.
WEÝ
I
WRITE ENABLE: Controls writes to the Command Register and array blocks. WEÝ
is active low. Addresses and data are latched on the rising edge of the WEÝ pulse.
VPP
PROGRAM/ERASE POWER SUPPLY: For erasing memory array blocks or
programming data in each block.
Note: VPP k VPPLMAX memory contents cannot be altered.
VCC
DEVICE POWER SUPPLY (3.3V g 0.3V, 5V g 10%)
GND
GROUND: For all internal circuitry.
NC
NO CONNECT: Pin may be driven or left floating.
DU
DON’T USE PIN: Pin should not be connected to anything.
10
28F400BL-T/B, 28F004BL-T/B
28F400BL PRODUCTS DESCRIPTION
290450– 1
2.0
Figure 6. 28F400BL Word/Byte-Wide Block Diagram
11
28F400BL-T/B, 28F004BL-T/B
2.1 28F400BL Memory Organization
2.1.1 BLOCKING
The 28F400BL uses a blocked array architecture to
provide independent erasure of memory blocks. A
block is erased independently of other blocks in the
array when an address is given within the block address range and the Erase Setup and Erase Confirm
commands are written to the CUI. The 28F400BL is
a random read/write memory, only erasure is performed by block.
2.1.1.1 Boot Block Operation and Data
Protection
The 16-Kbyte boot block provides a lock feature for
secure code storage. The intent of the boot block is
to provide a secure storage area for the kernel code
that is required to boot a system in the event of power failure or other disruption during code update.
This lock feature ensures absolute data integrity by
preventing the boot block from being written or
erased when RPÝ is not at 12V. The boot block can
be erased and written when RPÝ is held at 12V for
the duration of the erase or program operation. This
allows customers to change the boot code when
necessary while providing security when needed.
See the Block Memory Map section for address locations of the boot block for the 28F400BL-T and
28F400BL-B.
2.1.2 BLOCK MEMORY MAP
Two versions of the 28F400BL product exist to support two different memory maps of the array blocks
in order to accommodate different microprocessor
protocols for boot code location. The 28F400BL-T
memory map is inverted from the 28F400BL-B memory map.
2.1.2.1 28F400BL-B Memory Map
The 28F400BL-B device has the 16-Kbyte boot
block located from 00000H to 01FFFH to accommodate those microprocessors that boot from the bottom of the address map at 00000H. In the
28F400BL-B the first 8-Kbyte parameter block resides in memory space from 02000H to 02FFFH.
The second 8-Kbyte parameter block resides in
memory space from 03000H to 03FFFH. The
96-Kbyte main block resides in memory space from
04000H to 0FFFFH. The three 128-Kbyte main
block resides in memory space from 10000H to
1FFFFH, 20000H to 2FFFFH and 30000H to
3FFFFH (word locations). See Figure 7.
(Word Addresses)
3FFFFH
128-Kbyte MAIN BLOCK
30000H
2FFFFH
2.1.1.2 Parameter Block Operation
128-Kbyte MAIN BLOCK
The 28F400BL has 2 parameter blocks (8 Kbytes
each). The parameter blocks are intended to provide
storage for frequently updated system parameters
and configuration or diagnostic information. The parameter blocks can also be used to store additional
boot or main code. The parameter blocks however,
do not have the hardware write protection feature
that the boot block has. The parameter blocks provide for more efficient memory utilization when dealing with parameter changes versus regularly blocked
devices. See the Block Memory Map section for address locations of the parameter blocks for the
28F400BL-T and 28F400BL-B.
2.1.1.3 Main Block Operation
Four main blocks of memory exist on the 28F400BL
(3 x 128-Kbyte blocks and 1 x 96-Kbyte blocks). See
the following section on Block Memory Map for the
address location of these blocks for the 28F400BL-T
and 28F400BL-B products.
12
20000H
1FFFFH
128-Kbyte MAIN BLOCK
10000H
0FFFFH
96-Kbyte MAIN BLOCK
04000H
03FFFH
03000H
02FFFH
02000H
01FFFH
8-Kbyte PARAMETER BLOCK
8-Kbyte PARAMETER BLOCK
16-Kbyte BOOT BLOCK
00000H
Figure 7. 28F400BL-B Memory Map
28F400BL-T/B, 28F004BL-T/B
2.1.2.2 28F400BL-T Memory Map
The 28F400BL-T device has the 16-Kbyte boot
block located from 3E000H to 3FFFFH to accommodate those microprocessors that boot from the top
of the address map. In the 28F400BX-T the first
8-Kbyte parameter block resides in memory space
from 3D000H to 3DFFFH. The second 8-Kbyte parameter block resides in memory space from
3C000H to 3CFFFH. The 96-Kbyte main block resides in memory space from 30000H to 3BFFFH.
The three 128-Kbyte main blocks reside in memory
space from 20000H to 2FFFFH, 10000H to 1FFFFH
and 00000H to 0FFFFH as shown in Figure 8.
(Word Addresses)
3FFFFH
16-Kbyte BOOT BLOCK
3E000H
3DFFFH
3D000H
3CFFFH
3C000H
3BFFFH
8-Kbyte PARAMETER BLOCK
8-Kbyte PARAMETER BLOCK
96-Kbyte MAIN BLOCK
30000H
2FFFFH
128-Kbyte MAIN BLOCK
20000H
1FFFFH
128-Kbyte MAIN BLOCK
10000H
0FFFFH
128-Kbyte MAIN BLOCK
00000H
Figure 8. 28F400BL-T Memory Map
13
28F400BL-T/B, 28F004BL-T/B
28F004BL PRODUCTS DESCRIPTION
290450– 3
3.0
Figure 9. 28F004BL and Byte-Wide Block Diagram
14
28F400BL-T/B, 28F004BL-T/B
3.1 28F004BL Memory Organization
3.1.1 BLOCKING
The 28F004BL uses a blocked array architecture to
provide independent erasure of memory blocks. A
block is erased independently of other blocks in the
array when an address is given within the block address range and the Erase Setup and Erase Confirm
commands are written to the CUl. The 28F004BL is
a random read/write memory, only erasure is performed by block.
3.1.1.1 Boot Block Operation and Data
Protection
The 16-Kbyte boot block provides a lock feature for
secure code storage. The intent of the boot block is
to provide a secure storage area for the kernel code
that is required to boot a system in the event of power failure or other disruption during code update.
This lock feature ensures absolute data integrity by
preventing the boot block from being programmed
or erased when RPÝ is not at 12V. The boot block
can be erased and programmed when RPÝ is held
at 12V for the duration of the erase or program operation. This allows customers to change the boot
code when necessary while still providing security
when needed. See the Block Memory Map section
for address locations of the boot block for the
28F004BL-T and 28F004BL-B.
3.1.2 BLOCK MEMORY MAP
Two versions of the 28F004BL product exist to support two different memory maps of the array blocks
in order to accommodate different microprocessor
protocols for boot code location. The 28F004BL-T
memory map is inverted from the 28F004BL-B memory map.
3.1.2.1 28F004BL-B Memory Map
The 28F004BL-B device has the 16-Kbyte boot
block located from 00000H to 03FFFH to accommodate those microprocessors that boot from the bottom of the address map at 00000H. In the
28F004BL-B the first 8-Kbyte parameter block resides in memory from 04000H to 05FFFH. The second 8-Kbyte parameter block resides in memory
space from 06000H to 07FFFH. The 96-Kbyte main
block resides in memory space from 08000H to
1FFFFH. The three 128-Kbyte main blocks reside in
memory space from 20000H to 3FFFFH, 40000H to
5FFFFH and 60000H to 7FFFH. See Figure 10.
7FFFFH
128-Kbyte MAIN BLOCK
60000H
5FFFFH
128-Kbyte MAIN BLOCK
3.1.1.2 Parameter Block Operation
The 28F004BL has 2 parameter blocks (8 Kbytes
each). The parameter blocks are intended to provide
storage for frequently updated system parameters
and configuration or diagnostic information. The parameter blocks can also be used to store additional
boot or main code. The parameter blocks however,
do not have the hardware write protection feature
that the boot block has. Parameter blocks provide
for more efficient memory utilization when dealing
with small parameter changes versus regularly
blocked devices. See the Block Memory Map section for address locations of the parameter blocks
for the 28F004BL-T and 28F004BL-B.
40000H
3FFFFH
128-Kbyte MAIN BLOCK
20000H
1FFFFH
96-Kbyte MAIN BLOCK
08000H
07FFFH
06000H
05FFFH
04000H
03FFFH
8-Kbyte PARAMETER BLOCK
8-Kbyte PARAMETER BLOCK
16-Kbyte BOOT BLOCK
3.1.1.3 Main Block Operation
00000H
Two main blocks of memory exist on the 28F004BL
(3 x 128-Kbyte blocks and 1 x 96-Kbyte blocks). See
the following section on Block Memory Map for the
address location of these blocks for the 28F004BL-T
and 28F004BL-B.
Figure 10. 28F004BL-B Memory Map
15
28F400BL-T/B, 28F004BL-T/B
3.1.2.2 28F004BL-T Memory Map
The 28F004BL-T device has the 16-Kbyte boot
block located from 7C000H to 7FFFFH to accommodate those microprocessors that boot from the
top of the address map. In the 28F004BL-T the first
8-Kbyte parameter block resides in memory space
from 7A000H to 7BFFFH. The second 8-Kbyte parameter block resides in memory space from
78000H to 79FFFH. The 96-Kbyte main block resides in memory space from 60000H to 77FFFH.
The three 128-Kbyte main blocks reside in memory
space from 40000H to 5FFFFH, 20000H to 3FFFFH
and 00000H to 1FFFFH.
7FFFFH
16-Kbyte BOOT BLOCK
7C000H
7BFFFH
7A000H
79FFFH
78000H
77FFFH
8-Kbyte PARAMETER BLOCK
8-Kbyte PARAMETER BLOCK
96-Kbyte MAIN BLOCK
60000H
5FFFFH
128-Kbyte MAIN BLOCK
40000H
3FFFFH
128-Kbyte MAIN BLOCK
20000H
1FFFFH
128-Kbyte MAIN BLOCK
00000H
4.0
PRODUCT FAMILY PRINCIPLES
OF OPERATION
Flash memory augments EPROM functionality with
in-circuit electrical write and erase. The 4-Mbit flash
memory family utilizes a Command User Interface
(CUI) and internally generated and timed algorithms
to simplify write and erase operations.
The CUI allows for fixed power supplies during erasure and programming, and maximum EPROM compatibility.
In the absence of high voltage on the VPP pin, the
4-Mbit flash family will only successfully execute the
following commands: Read Array, Read Status Register, Clear Status Register and Intelligent Identifier
mode. The device provides standard EPROM read,
standby and output disable operations. Manufacturer Identification and Device Identification data can
be accessed through the CUI or through the standard EPROM A9 high voltage access (VID) (for
PROM programmer equipment).
The same EPROM read, standby and output disable
functions are available when high voltage is applied
to the VPP pin. In addition, high voltage on VPP allows write and erase of the device. All functions associated with altering memory contents: write and
erase, Intelligent Identifier read and Read Status are
accessed via the CUI.
The purpose of the Write State Machine (WSM) is to
completely automate the write and erasure of the
device. The WSM will begin operation upon receipt
of a signal from the CUI and will report status back
through a Status Register. The CUI will handle the
WEÝ interface to the data and address latches, as
well as system software requests for status while the
WSM is in operation.
4.1 28F400BL Bus Operations
Figure 11. 28F004BL-T Memory Map
Flash memory reads, erases and writes in-system
via the local CPU. All bus cycles to or from the flash
memory conform to standard microprocessor bus
cycles.
16
28F400BL-T/B, 28F004BL-T/B
Table 1. Bus Operations for WORD-WIDE Mode (BYTEÝ e VIH)
Mode
Read
Notes
RPÝ
CEÝ
OEÝ
WEÝ
A9
A0
VPP
DQ0-15
1, 2
VIH
VIL
VIL
VIH
X
X
X
DOUT
Output Disable
VIH
VIL
VIH
VIH
X
X
X
High Z
Standby
VIH
VIH
X
X
X
X
X
High Z
Deep Power-Down
Intelligent Identifier (Mfr)
Intelligent Identifier (Device)
Write
9
VIL
X
X
X
X
X
X
High Z
3, 4
VIH
VIL
VIL
VIH
VID
VIL
X
0089H
3, 4, 5, 10
VIH
VIL
VIL
VIH
VID
VIH
X
4470H
4471H
6, 7, 8
VIH
VIL
VIH
VIL
X
X
X
DIN
Table 2. Bus Operations for BYTE-WIDE Mode (BYTEÝ e VIL)
Mode
Read
Notes
RPÝ
CEÝ
OEÝ
WEÝ
A9
A0
A-1
VPP
DQ0-7
DQ8–14
1, 2
VIH
VIL
VIL
VIH
X
X
X
X
DOUT
High Z
Output Disable
VIH
VIL
VIH
VIH
X
X
X
X
High Z
High Z
Standby
VIH
VIH
X
X
X
X
X
X
High Z
High Z
Deep Power-Down
VIL
X
X
X
X
X
X
X
High Z
High Z
Intelligent Identifier
(Mfr)
3, 4
VIH
VIL
VIL
VIH
VID
VIL
X
X
89H
High Z
Intelligent Identifier
(Device)
3, 4, 5, 10
VIH
VIL
VIL
VIH
VID
VIH
X
X
70H
71H
High Z
6, 7, 8
VIH
VIL
VIH
VIL
X
X
X
X
DIN
High Z
Write
NOTES:
1. Refer to DC Characteristics.
2. X can be VIL or VIH for control pins and addresses, VPPL or VPPH for VPP.
3. See DC Characteristics for VPPL, VPPH, VHH, VID voltages.
4. Manufacturer and Device codes may also be accessed via a CUI write sequence. A1 –A17 e VIL.
5. Device ID e 4470H for 28F400BL-T and 4471H for 28F400BL-B.
6. Refer to Table 4 for valid DIN during a write operation.
7. Command writes for Block Erase or Word/Byte Write are only executed when VPP e VPPH.
8. To write or erase the boot block, hold RPÝ at VHH.
9. RPÝ must be at GND g 0.2V to meet the 1.2 mA maximum deep power-down current.
10. The device ID codes are identical to those of the 28F400BX 5V version and SmartVoltage equivalent.
17
28F400BL-T/B, 28F004BL-T/B
4.2 28F004BL Bus Operations
Table 3. Bus Operations
Mode
Notes
RPÝ
CEÝ
Read
1, 2
VIH
VIH
Output Disable
Standby
Deep Power-Down
Intelligent Identifier (Mfr)
Intelligent Identifier (Device)
Write
OEÝ
WEÝ
A9
A0
VPP
DQ0-7
VIL
VIL
VIH
X
X
X
DOUT
VIL
VIH
VIH
X
X
X
High Z
VIH
VIH
X
X
X
X
X
High Z
9
VIL
X
X
X
X
X
X
High Z
3, 4
VIH
VIL
VIL
VIH
VID
VIL
X
89H
3, 4, 5, 10
VIH
VIL
VIL
VIH
VID
VIH
X
78H
79H
6, 7, 8
VIH
VIL
VIH
VIL
X
X
X
DIN
NOTES:
1. Refer to DC Characteristics.
2. X can be VIL or VIH for control pins and addresses, VPPL or VPPH for VPP.
3. See DC Characteristics for VPPL, VPPH, VHH, VID voltages.
4. Manufacturer and Device codes may also be accessed via a CUI write sequence. A1 –A8, A10 –A18 e VIL.
5. Device ID e 78H for 28F004BL-T and 79H for 28F004BL-B.
6. Refer to Table 4 for valid DIN during a write operation.
7. Command writes for Block erase or byte program are only executed when VPP e VPPH.
8. Program or erase the Boot block by holding RPÝ at VHH.
9. RPÝ must be at GND g 0.2V to meet the 1.2 mA maximum deep power-down current.
10. The device ID codes are identical to those of the 28F004BX 5V version and SmartVoltage equivalent.
4.3 Read Operations
4.3.1.2 Input Control
The 4-Mbit flash family has three user read modes;
Array, Intelligent Identifier, and Status Register.
Status Register read mode will be discussed in detail
in the ‘‘Write Operations’’ section.
With WEÝ at logic-high level (VIH), input to the device is disabled. Data Input/Output pins (DQ [0:15]
or DQ [0:7]) are controlled by OEÝ.
During power-up conditions (VCC supply ramping), it
takes a maximum of 600 ns from VCC at 3.0V minimum to obtain valid data on the outputs.
4.3.2 INTELLIGENT IDENTlFlERS
4.3.1 READ ARRAY
If the memory is not in the Read Array mode, it is
necessary to write the appropriate read mode command to the CUI. The 4-Mbit flash family has three
control functions, all of which must be logically active, to obtain data at the outputs. Chip-Enable CEÝ
is the device selection control. Power-Down RPÝ is
the device power control. Output-Enable OEÝ is the
DATA INPUT/OUTPUT (DQ [0:15] or DQ [0:7] ) direction control and when active is used to drive data
from the selected memory onto the I/O bus.
4.3.1.1 Output Control
With OEÝ at logic-high level (VIH), the output from
the device is disabled and data input/output pins
(DQ [0:15] or DQ [0:7] are tri-stated. Data input is
then controlled by WEÝ.
18
28F400BL PRODUCTS
The manufacturer and device codes are read via the
CUI or by taking the A9 pin to 12V. Writing 90H to
the CUI places the device into Intelligent Identifier
read mode. A read of location 00000H outputs the
manufacturer’s identification code, 0089H, and location 00001H outputs the device code; 4470H for
28F400BL-T, 4471H for 28F4001BL-B. When
BYTEÝ is at a logic low only the lower byte of the
above signatures is read and DQ15/Ab1 is a ‘‘don’t
care’’ during Intelligent Identifier mode. A read array
command must be written to the CUI to return to the
read array mode.
28F400BL-T/B, 28F004BL-T/B
28F004BL PRODUCTS
4.4.1 BOOT BLOCK WRITE OPERATIONS
The manufacturer and device codes are also read
via the CUI or by taking the A9 pin to 12V. Writing
90H to the CUI places the device into Intelligent
Identifier read mode. A read of location 00000H outputs the manufacturer’s identification code, 89H,
and location 00001H outputs the device code; 78H
for 28F004BL-T, 79H for 28F004BL-B.
In the case of Boot Block modifications (write and
erase), RPÝ is set to VHH e 12V typically, in addition to VPP at high voltage.
4.4 Write Operations
Commands are written to the CUI using standard microprocessor write timings. The CUI serves as the
interface between the microprocessor and the internal chip operation. The CUI can decipher Read Array, Read Intelligent Identifier, Read Status Register,
Clear Status Register, Erase and Program commands. In the event of a read command, the CUI
simply points the read path at either the array, the
Intelligent Identifier, or the status register depending
on the specific read command given. For a program
or erase cycle, the CUI informs the write state machine that a write or erase has been requested. During a program cycle, the Write State Machine will
control the program sequences and the CUI will only
respond to status reads. During an erase cycle, the
CUI will respond to status reads and erase suspend.
After the Write State Machine has completed its
task, it will allow the CUI to respond to its full command set. The CUI will stay in the current command
state until the microprocessor issues another command.
The CUI will successfully initiate an erase or write
operation only when VPP is within its voltage range.
Depending upon the application, the system designer may choose to make the VPP power supply
switchable, available only when memory updates
are desired. The system designer can also choose
to ‘‘hard-wire’’ VPP to 12V. The 4-Mbit flash memory
family is designed to accommodate either design
practice. It is recommended that RPÝ be tied to logical Reset for data protection during unstable CPU
reset function as described in the ‘‘Product Family
Overview’’ section.
However, if RPÝ is not at VHH when a program or
erase operation of the boot block is attempted, the
corresponding status register bit (Bit 4 for Program
and Bit 5 for Erase, refer to Table 5 for Status Register Definitions) is set to indicate the failure to complete the operation.
4.4.2 COMMAND USER INTERFACE (CUI)
The Command User Interface (CUI) serves as the
interface to the microprocessor. The CUI points the
read/write path to the appropriate circuit block as
described in the previous section. After the WSM
has completed its task, it will set the WSM Status bit
to a ‘‘1’’, which will also allow the CUI to respond to
its full command set. Note that after the WSM has
returned control to the CUI, the CUI will remain in its
current state.
4.4.2.1 Command Set
Command
Codes
Device Mode
00
10
20
40
50
70
90
B0
D0
FF
Invalid/Reserved
Alternate Program Setup
Erase Setup
Program Setup
Clear Status Register
Read Status Register
Intelligent Identifier
Erase Suspend
Erase Resume/Erase Confirm
Read Array
4.4.2.2 Command Function Descriptions
Device operations are selected by writing specific
commands into the CUI. Table 4 below defines the
4-Mbit flash memory family commands.
19
28F400BL-T/B, 28F004BL-T/B
Table 4. Command Definitions
Command
Bus Notes
First Bus Cycle
Second Bus Cycle
Cycles
Req’d
8
Operation Address Data Operation Address Data
Read Array
1
1
Write
X
FFH
Intelligent Identifier
3
2, 4
Write
X
90H
Read
IA
IID
Read Status Register
2
3
Write
X
70H
Read
X
SRD
Clear Status Register
1
Write
X
50H
Erase Setup/Erase Confirm
2
5
Write
BA
20H
Write
BA
D0H
Word/Byte Write
Setup/Write
2
6, 7
Write
WA
40H
Write
WA
WD
Erase Suspend/Erase Resume
2
Write
X
B0H
Write
X
D0H
Alternate Word/Byte Write
Setup/Write
2
WD
2, 3, 7
Write
WA
10H
Write
WA
NOTES:
1. Bus operations are defined in Tables 1, 2, 3.
2. IA e Identifier Address: 00H for manufacturer code, 01H for device code.
3. SRD e Data read from Status Register.
4. IID e Intelligent Identifier Data.
Following the Intelligent Identifier command, two read operations access manufacturer and device codes.
5. BA e Address within the block being erased.
6. WA e Address to be written.
WD e Data to be written at location WA.
7. Either 40H or 10H commands is valid.
8. When writing commands to the device the upper data bus [DQ8 –DQ15] e X (28F400BL-only) which is either VCC or VSS
to avoid burning additional current.
Invalid/Reserved
Read Status Register (70H)
These are unassigned commands. It is not recommended that the customer use any command other
than the valid commands specified above. Intel reserves the right to redefine these codes for future
functions.
This is one of the two commands that is executable
while the state machine is operating. After this command is written, a read of the device will output the
contents of the status register, regardless of the address presented to the device.
Read Array (FFH)
The device automatically enters this mode after program or erase has completed.
This single write command points the read path at
the array. If the host CPU performs a CEÝ/OEÝ
controlled read immediately following a two-write sequence that started the WSM, then the device will
output status register contents. If the Read Array
command is given after Erase Setup the device is
reset to read the array. A two Read Array command
sequence (FFH) is required to reset to Read Array
after Program Setup.
Intelligent Identifier (90H)
After this command is executed, the CUI points the
output path to the Intelligent Identifier circuits. Only
Intelligent Identifier values at addresses 0 and 1 can
be read (only address A0 is used in this mode, alI
other address inputs are ignored).
20
Clear Status Register (50H)
The WSM can only set the Program Status and
Erase Status bits in the status register, it can not
clear them. Two reasons exist for operating the
status register in this fashion. The first is a synchronization. The WSM does not know when the host
CPU has read the status register, therefore it would
not know when to clear the status bits. Secondly, if
the CPU is programming a string of bytes, it may be
more efficient to query the status register after programming the string. Thus, if any errors exist while
programming the string, the status register wiII return the accumulated error status.
28F400BL-T/B, 28F004BL-T/B
Program Setup (40H or 10H)
This command simply sets the CUI into a state such
that the next write will load the address and data
registers. Either 40H or 10H can be used for Program Setup. Both commands are included to accommodate efforts to achieve an industry standard
command code set.
Program
The second write after the program setup command,
will latch addresses and data. Also, the CUI initiates
the WSM to begin execution of the program algorithm. While the WSM finishes the algorithm, the device will output Status Register contents. Note that
the WSM cannot be suspended during programming.
Erase Setup (20H)
Prepares the CUI for the Erase Confirm command.
No other action is taken. If the next command is not
an Erase Confirm command then the CUI will set
both the Program Status and Erase Status bits of the
Status Register to a ‘‘1’’, place the device into the
Read Status Register state, and wait for another
command.
Erase Confirm (D0H)
If the previous command was an Erase Setup command, then the CUI will enable the WSM to erase, at
the same time closing the address and data latches,
and respond only to the Read Status Register and
Erase Suspend commands. While the WSM is executing, the device will output Status Register data
when OEÝ is toggled low. Status Register data can
only be updated by toggling either OEÝ or CEÝ low.
Erase Suspend (B0H)
This command only has meaning while the WSM is
executing an Erase operation, and therefore will only
be responded to during an erase operation. After
this command has been executed, the CUI will initiate the WSM to suspend Erase operations, and then
return to responding to only Read Status Register or
to the Erase Resume commands. Once the WSM
has reached the Suspend state, it will set an output
into the CUI which allows the CUI to respond to the
Read Array, Read Status Register, and Erase Resume commands. In this mode, the CUI will not respond to any other commands. The WSM will also
set the WSM Status bit to a ‘‘1’’. The WSM will con-
tinue to run, idling in the SUSPEND state, regardless
of the state of alI input control pins, with the exclusion of RPÝ. RPÝ low will immediately shut down
the WSM and the remainder of the chip.
Erase Resume (D0H)
This command will cause the CUI to clear the Suspend state and set the WSM Status bit to a ‘‘0’’, but
only if an Erase Suspend command was previously
issued. Erase Resume will not have any effect in all
other conditions.
4.4.3 STATUS REGISTER
The 4 Mbit flash family contains a status register
which may be read to determine when a program or
erase operation is complete, and whether that operation completed successfully. The status register
may be read at any time by writing the Read Status
command to the CUI. After writing this command, all
subsequent Read operations output data from the
status register until another command is written to
the CUI. A Read Array command must be written to
the CUl to return to the Read Array mode.
The status register bits are output on DQ [0:7]
whether the device is in the byte-wide (x8) or wordwide (x16) mode for the 28F400BL. In the word-wide
mode the upper byte, DQ [8:15] is set to 00H during
a Read Status command. In the byte-wide mode,
DO [8:14] is tri-stated and DQ15/Ab1 retains the low
order address function.
It should be noted that the contents of the status
register are latched on the falling edge of OEÝ or
CEÝ whichever occurs last in the read cycle. This
prevents possible bus errors which might occur if the
contents of the status register change while reading
the status register. CEÝ or OEÝ must be toggled
with each subsequent status read, or the completion
of a program or erase operation will not be evident.
The Status Register is the interface between the microprocessor and the Write State Machine (WSM).
When the WSM is active, this register will indicate
the status of the WSM, and will also hold the bits
indicating whether or not the WSM was successful in
performing the desired operation. The WSM sets
status bits ‘‘Three’’ through ‘‘Seven’’ and clears bits
‘‘Six’’ and ‘‘Seven’’, but cannot clear status bits
‘‘Three’’ through ‘‘Five’’. These bits can only be
cleared by the controlling CPU through the use of
the Clear Status Register command.
21
28F400BL-T/B, 28F004BL-T/B
4.4.3.1 Status Register Bit Definition
Table 5. Status Register Definitions
WSMS
ESS
ES
PS
7
6
5
4
VPPS
R
R
R
3
2
1
0
NOTES:
SR.7 e WRITE STATE MACHINE STATUS
1 e Ready
0 e Busy
SR.6 e ERASE SUSPEND STATUS
1 e Erase Suspended
0 e Erase in Progress/Completed
SR.5 e ERASE STATUS
1 e Error in Block Erasure
0 e Successful Block Erase
SR.4
1
0
SR.3
1
0
e
e
e
e
e
e
PROGRAM STATUS
Error in Byte/Word Program
Successful Byte/Word Program
VPP STATUS
VPP Low Detect; Operation Abort
VPP OK
Write State Machine Status bit must first be checked to
determine byte/word program or block erase completion,
before the Program or Erase Status bits are checked for
success.
When Erase Suspend is issued, WSM halts execution
and sets both WSMS and ESS bits to ‘‘1’’. ESS bit remains set to ‘‘1’’ until an Erase Resume command is issued.
When this bit is set to ‘‘1’’. WSM has applied the maximum number of erase pulses to the block and is still unable to successfully perform an erase verify.
When this bit is set to ‘‘1’’, WSM has attempted but failed
to Program a byte or word.
The VPP Status bit unlike an A/D converter, does not
provide continuous indication of VPP level. The WSM interrogates the VPP level only after the byte write or block
erase command sequences have been entered and informs the system if VPP has not been switched on. The
VPP Status bit is not guaranteed to report accurate feedback between VPPL and VPPH.
SR.2 – SR.0 e RESERVED FOR FUTURE ENHANCEMENTS
These bits are reserved for future use and should be masked out when polling the Status Register.
4.4.3.2 Clearing the Status Register
4.4.4 PROGRAM MODE
Certain bits in the status register are set by the write
state machine, and can only be reset by the system
software. These bits can indicate various failure conditions. By allowing the system software to control
the resetting of these bits, several operations may
be performed (such as cumulatively programming
several bytes or erasing multiple blocks in sequence). The status register may then be read to
determine if an error occurred during that programming or erasure series. This adds flexibility to the
way the device may be programmed or erased. To
clear the status register, the Clear Status Register
command is written to the CUI. Then, any other
command may be issued to the CUI. Note again that
before a read cycle can be initiated, a Read command must be written to the CUI to specify whether
the read data is to come from the array, status register, or Intelligent Identifier.
Program is executed by a two-write sequence. The
Program Setup command is written to the CUI followed by a second write which specifies the address
and data to be programmed. The write state machine will execute a sequence of internally timed
events to:
1. program the desired bits of the addressed memory word (byte), and
2. verify that the desired bits are sufficiently programmed.
22
Programming of the memory results in specific bits
within a byte or word being changed to a ‘‘0’’.
If the user attempts to program ‘‘1’’s, there will be no
change of the memory cell content and no error occurs.
28F400BL-T/B, 28F004BL-T/B
Similar to erasure, the status register indicates
whether programming is complete. While the program sequence is executing, bit 7 of the status register is a ‘‘0’’. The status register can be polled by
toggling either CEÝ or OEÝ to determine when the
program sequence is complete. Only the Read
Status Register command is valid while programming is active.
When programming is complete, the status bits,
which indicate whether the program operation was
successful, should be checked. If the programming
operation was unsuccessful, Bit 4 of the status register is set to a ‘‘1’’ to indicate a Program Failure. If
Bit 3 is set then VPP was not within acceptable limits,
and the WSM will not execute the programming sequence.
The status register should be cleared before attempting the next operation. Any CUI instruction can
follow after programming is completed; however, it
must be recognized that reads from the memory,
status register, or Intelligent Identifier cannot be accomplished until the CUI is given the appropriate
command. A Read Array command must first be given before memory contents can be read.
Figure 12 shows a system software flowchart for device byte programming operation. Figure 13 shows a
similar flowchart for device word programming operation (28F400BL-only).
4.4.5 ERASE MODE
Erasure of a single block is initiated by writing the
Erase Setup and Erase Confirm commands to the
CUI, along with the addresses, A [12:17] for the
28F400BL or A [12:18] for the 28F004BL, identifying
the block to be erased. These addresses are latched
internally when the Erase Confirm command is issued. Block erasure results in all bits within the block
being set to ‘‘1’’.
The WSM will execute a sequence of internally
timed events to:
1. program all bits within the block
2. verify that all bits within the block are sufficiently
programmed
3. erase all bits within the block and
4. verify that all bits within the block are sufficiently
erased
While the erase sequence is executing, Bit 7 of the
status register is a ‘‘0’’.
When the status register indicates that erasure is
complete, the status bits, which indicate whether the
erase operation was successful, should be checked.
If the erasure operation was unsuccessful, Bit 5 of
the status register is set to a ‘‘1’’ to indicate an
Erase Failure. If VPP was not within acceptable limits
after the Erase Confirm command is issued, the
WSM will not execute an erase sequence; instead,
Bit 5 of the status register is set to a ‘‘1’’ to indicate
an Erase Failure, and Bit 3 is set to a ‘‘1’’ to identify
that VPP supply voltage was not within acceptable
limits.
The status register should be cleared before attempting the next operation. Any CUI instruction can
follow after erasure is completed; however, it must
be recognized that reads from the memory array,
status register, or Intelligent Identifier can not be accomplished until the CUI is given the appropriate
command. A Read Array command must first be given before memory contents can be read.
Figure 13 shows a system software flowchart for
Block Erase operation.
4.4.5.1 Suspending and Resuming Erase
Since an erase operation typically requires 2 seconds to 5 seconds to complete, an Erase Suspend
command is provided. This allows erase-sequence
interruption in order to read data from another block
of the memory. Once the erase sequence is started,
writing the Erase Suspend command to the CUI requests that the Write State Machine (WSM) pause
the erase sequence at a predetermined point in the
erase algorithm. The status register must be read to
determine when the erase operation has been suspended.
At this point, a Read Array command can be written
to the CUI in order to read data from blocks other
than that which is being suspended. The only other
valid command at this time is the Erase Resume
command or Read Status Register operation.
Figure 14 shows a system software flowchart detailing the operation.
During Erase Suspend mode, the chip can go into a
pseudo-standby mode by taking CEÝ to VIH and the
active current is now a maximum of 6 mA. If the chip
is enabled while in this mode by taking CEÝ to VIL,
the Erase Resume command can be issued to resume the erase operation.
23
28F400BL-T/B, 28F004BL-T/B
Upon completion of reads from any block other than
the block being erased, the Erase Resume command must be issued. When the Erase Resume
command is given, the WSM will continue with the
erase sequence and complete erasing the block. As
with the end of erase, the status register must be
read, cleared, and the next instruction issued in order to continue.
24
4.4.6 EXTENDED CYCLING
Intel has designed extended cycling capability into
its ETOX III flash memory technology. The 4-Mbit
low voltage flash memory family is designed for
10,000 program/erase cycles on each of the seven
blocks. The combination of low electric fields, clean
oxide processing and minimized oxide area per
memory cell subjected to the tunneling electric field,
results in very high cycling capability.
28F400BL-T/B, 28F004BL-T/B
Bus
Operation
Command
Comments
Write
Setup
Program
Data e 40H
Address e Byte to be
programmed
Write
Program
Data to be programmed
Address e Byte to be
programmed
Read
Status Register Data.
Toggle OEÝ or CEÝ to update
Status Register
Standby
Check SR.7
1 e Ready, 0 e Busy
Repeat for subsequent bytes.
Full status check can be done after each byte or after a
sequence of bytes.
Write FFH after the last byte programming operation to
reset the device to Read Array Mode.
290450 – 9
Full Status Check Procedure
Bus
Operation
Command
Comments
Standby
Check SR.3
1 e VPP Low Detect
Standby
Check SR.4
1 e Byte Program Error
SR.3 MUST be cleared, if set during a program attempt,
before further attempts are allowed by the Write State
Machine.
290450 – 10
SR.4 is only cleared by the Clear Status Register
Command, in cases where multiple bytes are programmed
before full status is checked.
If error is detected, clear the Status Register before
attempting retry or other error recovery.
Figure 12. Automated Byte Programming Flowchart
25
28F400BL-T/B, 28F004BL-T/B
Bus
Operation
Command
Comments
Write
Setup
Program
Data e 40H
Address e Word to be
programmed
Write
Program
Data to be programmed
Address e Word to be
programmed
Read
Status Register Data.
Toggle OEÝ or CEÝ to update
Status Register
Standby
Check SR.7
1 e Ready, 0 e Busy
Repeat for subsequent words.
Full status check can be done after each word or after a
sequence of words.
290450 – 11
Write FFH after the last word programming operation to
reset the device to Read Array Mode.
Full Status Check Procedure
Bus
Operation
Command
Comments
Standby
Check SR.3
1 e VPP Low Detect
Standby
Check SR.4
1 e Byte Program Error
SR.3 MUST be cleared, if set during a program attempt,
before further attempts are allowed by the Write State
Machine.
290450 – 12
SR.4 is only cleared by the Clear Status Register
Command, in cases where multiple words are programmed
before full status is checked.
If error is detected, clear the Status Register before
attempting retry or other error recovery.
Figure 13. Automated Word Programming Flowchart
26
28F400BL-T/B, 28F004BL-T/B
Bus
Operation
Command
Comments
Write
Setup
Erase
Data e 20H
Address e Within block to be
erased
Write
Erase
Data e D0H
Address e Within block to be
erased
Read
Status Register Data.
Toggle OEÝ or CEÝ to update
Status Register
Standby
Check SR.7
1 e Ready, 0 e Busy
Repeat for subsequent blocks.
Full status check can be done after each block or after a
sequence of blocks.
290450 – 13
Write FFH after the last block erase operation to reset the
device to Read Array Mode.
Full Status Check Procedure
Bus
Operation
Command
Comments
Standby
Check SR.3
1 e VPP Low Detect
Standby
Check SR.4,5
Both 1 e Command Sequence
Error
Standby
Check SR.5
1 e Block Erase Error
SR.3 MUST be cleared, if set during an erase attempt,
before further attempts are allowed by the Write State
Machine.
290450 – 14
SR.5 is only cleared by the Clear Status Register
Command, in cases where multiple blocks are erased
before full status is checked.
If error is detected, clear the Status Register before
attempting retry or other error recovery.
Figure 14. Automated Block Erase Flowchart
27
28F400BL-T/B, 28F004BL-T/B
Bus
Operation
Write
Command
Erase
Suspend
Comments
Data e B0H
Read
Status Register Data.
Toggle OEÝ or CEÝ to
update Status Register
Standby
Check SR.7
1 e Ready
Standby
Check SR.6
1 e Suspended
Write
Read Array
Read
Write
Data e FFH
Read array data from block
other than that being
erased.
Erase Resume
Data e D0H
290450 – 15
Figure 15. Erase Suspend/Resume Flowchart
4.5 Power Consumption
4.5.1 ACTIVE POWER
With CEÝ at a logic-low level and RPÝ at a logichigh level, the device is placed in the active mode.
The device ICC current is a maximum of 22 mA at
5 MHz.
4.5.2 AUTOMATIC POWER SAVINGS
Automatic Power Savings (APS) is a low power feature during active mode of operation. The 4-Mbit
family of products incorporate Power Reduction
Control (PRC) circuitry which basically allows the device to put itself into a low current state when it is
not being accessed. After data is read from the
memory array, PRC logic controls the device’s power consumption by entering the APS mode where
28
typical ICC current is 0.8 mA and maximum ICC current is 2 mA. The device stays in this static state with
outputs valid until a new memory location is read.
4.5.3 STANDBY POWER
With CEÝ at a logic-high level (VIH), and the CUI
read mode, the memory is placed in standby mode
where the maximum ICC standby current is 120 mA
with CMOS input signals. The standby operation disables much of the device’s circuitry and substantially
reduces device power consumption. The outputs
(DQ [0:15] or DQ [0:7] are placed in a high-impedance state independent of the status of the OEÝ
signal. When the 4-Mbit flash family is deselected
during erase or program functions, the devices will
continue to perform the erase or program function
and consume program or erase active power until
program or erase is completed.
28F400BL-T/B, 28F004BL-T/B
4.5.4 RESET/DEEP POWER-DOWN
The 4-Mbit flash family supports a typical ICC of
0.2 mA in deep power-down mode. One of the target
markets for these devices is in portable equipment
where the power consumption of the machine is of
prime importance. The 4-Mbit flash family has a
RPÝ pin which places the device in the deep powerdown mode. When RPÝ is at a logic-low (GND
g 0.2V), all circuits are turned off and the device typically draws 0.2 mA of VCC current.
During read modes, the RPÝ pin going low deselects the memory and places the output drivers in a
high impedance state. Recovery from the deep power-down state, requires a maximum of 600 ns to access valid data (tPHQV).
During erase or program modes, RPÝ low will abort
either erase or program operation. The contents of
the memory are no longer valid as the data has been
corrupted by the RPÝ function. As in the read mode
above, all internal circuitry is turned off to achieve
the 0.2 mA current level.
RPÝ transitions to VIL or turning power off to the
device will clear the status register.
This use of RPÝ during system reset is important
with automated write/erase devices. When the system comes out of reset it expects to read from the
flash memory. Automated flash memories provide
status information when accessed during write/
erase modes. If a CPU reset occurs with no flash
memory reset, proper CPU initialization would not
occur because the flash memory would be providing
the status information instead of array data. Intel’s
Flash Memories allow proper CPU initialization following a system reset through the use of the RPÝ
input. In this application RPÝ is controlled by the
same RESETÝ signal that resets the system CPU.
4.6 Power-up Operation
The 4-Mbit flash memory family is designed to offer
protection against accidental block erasure or programming during power transitions. Upon power-up
the 4-Mbit flash memory family is indifferent as to
which power supply, VPP or VCC, powers-up first.
Power supply sequencing is not required.
The 4-Mbit flash memory family ensures the CUI is
reset to the read mode on power-up.
In addition, on power-up the user must either drop
CEÝ low or present a new address to ensure valid
data at the outputs.
A system designer must guard against spurious
writes for VCC voltages above VLKO when VPP is
active. Since both WEÝ and CEÝ must be low for a
command write, driving either signal to VIH will inhibit
writes to the device. The CUl architecture provides
an added level of protection since alteration of memory contents can only occur after successful completion of the two-step command sequences. Finally
the device is disabled until RPÝ is brought to VIH,
regardless of the state of its control inputs. This feature provides yet another level of memory protection.
4.7 Power Supply Decoupling
Flash memory’s power switching characteristics require careful device decoupling methods. System
designers are interested in 3 supply current issues:
# Standby current levels (ICCS)
# Active current levels (ICCR)
# Transient peaks produced by falling and rising
edges of CEÝ.
Transient current magnitudes depend on the device
outputs’ capacitive and inductive loading. Two-line
control and proper decoupling capacitor selection
will suppress these transient voltage peaks. Each
flash device should have a 0.1 mF ceramic capacitor
connected between each VCC and GND, and between its VPP and GND. These high frequency, lowinherent inductance capacitors should be placed as
close as possible to the package leads.
4.7.1 VPP TRACE ON PRINTED CIRCUIT
BOARDS
Writing to flash memories while they reside in the
target system, requires special consideration of the
VPP power supply trace by the printed circuit board
designer. The VPP pin supplies the flash memory
cell’s current for programming and erasing. One
should use similar trace widths and layout considerations given to the VCC power supply trace. Adequate VPP supply traces and decoupling will decrease spikes and overshoots.
4.7.2 VCC, VPP AND RPÝ TRANSITIONS
The CUI latches commands as issued by system
software and is not altered by VPP or CEÝ transitions or WSM actions. Its state upon power-up, after exit from deep power-down mode or after VCC
transitions below VLKO (Lockout voltage), is Read
Array mode.
After any word/byte write or block erase operation is
complete and even after VPP transitions down to
VPPL, the CUI must be reset to Read Array mode via
the Read Array command when accesses to the
flash memory are desired.
29
28F400BL-T/B, 28F004BL-T/B
5.0 OPERATING SPECIFICATIONS
NOTICE: This is a production data sheet. The specifications are subject to change without notice.
*WARNING: Stressing the device beyond the ‘‘Absolute
Maximum Ratings’’ may cause permanent damage.
These are stress ratings only. Operation beyond the
‘‘Operating Conditions’’ is not recommended and extended exposure beyond the ‘‘Operating Conditions’’
may affect device reliability.
ABSOLUTE MAXIMUM RATINGS
Operating Temperature
During Read ÀÀÀÀÀÀÀÀÀÀÀÀÀÀÀ b 20§ C to a 70§ C(1)
During Block Erase/Byte Write ÀÀÀÀ0§ C to a 70§ C
Temperature Under Bias ÀÀÀÀÀÀÀÀÀ b 20§ C to a 80§ C
Storage Temperature ÀÀÀÀÀÀÀÀÀÀ b 65§ C to a 125§ C
Voltage on any Pin
(except VCC, VPP, A9 and RPÝ)
with Respect to GND ÀÀÀÀÀÀÀÀ b 2.0V to a 7.0V(2)
Voltage on Pin RPÝ or Pin A9
with Respect to GND ÀÀÀÀÀ b 2.0V to a 13.5V(2, 3)
VCC Program Voltage with
Respect to GND
during Block Erase and
Word/Byte Write ÀÀÀÀÀÀÀÀÀ b 2.0V to a 14.0V(2, 3)
VCC Supply Voltage
with Respect to GND ÀÀÀÀÀÀÀÀ b 2.0V to a 7.0V(2)
Output Short Circuit CurrentÀÀÀÀÀÀÀÀÀÀÀÀÀ100 mA(4)
OPERATING CONDITIONS
Symbol
Parameter
Notes
TA
Operating Temperature
VCC
VCC Supply Voltage
VCC
Min
Max
Unit
b 20
70
§C
Program/Erase
3.15
3.60
V
Read
3.00
3.60
V
4.50
5.50
V
VCC Supply Voltage
5
NOTES:
1. Operating temperature is for commercial product defined by this specification.
2. Minimum DC voltage is b0.5V on input/output pins. During transitions, this level may undershoot to b2.0V for periods
k 20 ns. Maximum DC voltage on input/output pins is VCC a 0.5V which during transitions may overshoot to VCC a
2.0V for periods k 20 ns.
3. Maximum DC voltage on VPP may overshoot to a 14.0V for periods k20 ns. Maximum DC voltage on RPÝ or A9 may
overshoot to 13.5V for periods k 20 ns.
4. Output shorted for no more than one second. No more than one output shorted at a time.
5. AC specifications are valid at both voltage ranges. See DC Characteristics tables for voltage range-specific specifications.
DC CHARACTERISTICS
VCC e 3.3V g 0.3V Read, 3.15V–3.6V Program/Erase
Max
Unit
Test Conditions
ILI
Symbol
Input Load Current
1
g 1.0
mA
VCC e VCC Max
VIN e VCC or GND
ILO
Output Leakage Current
1
g 10
mA
VCC e VCC Max
VOUT e VCC or GND
30
Parameter
Notes
Min
Typ
28F400BL-T/B, 28F004BL-T/B
DC CHARACTERISTICS (Continued)
VCC e 3.3V g 0.3V Read, 3.15V–3.6V Program/Erase
Symbol
ICCS
Parameter
VCC Standby Current
ICCD
VCC Deep Power-Down Current
ICCR
VCC Read Current for
28F400BX-L Word-Wide and
Byte-Wide Mode and
28F004BX-L Byte-Wide Mode
Notes Min Typ
1, 3
Max
Unit
Test Conditions
45
120
mA VCC e VCC Max
CEÝ e RPÝ e VIH
45
120
mA VCC e VCC Max
CEÝ e RPÝ e VCC g 0.2V
28F400BX:
BYTEÝ e VCC g 0.2V
or GND
1
0.20
1.2
mA RPÝ e GND g 0.2V
1
5, 6
15
25
mA VCC e VCC Max, CEÝ e GND
f e 5 MHz, IOUT e 0 mA
CMOS Inputs
15
25
mA VCC e VCC Max, CEÝ e VIL
f e 5 MHz, IOUT e 0 mA
TTL Inputs
ICCW
VCC Word Write Current
1
30
mA Word Write in Progress
ICCW
VCC Byte Write Current
1
30
mA Byte Write in Progress
ICCE
VCC Block Erase Current
20
mA Block Erase in Progress
ICCES
VCC Erase Suspend Current
6
mA CEÝ e VIH
Block Erase Suspended
IPPS
VPP Standby Current
1
g 15
IPPD
VPP Deep Power-Down Current
1
5.0
mA RPÝ e GND g 0.2V
IPPR
VPP Read Current
1, 4
200
mA VPP l VCC
IPPW
VPP Word Write Current
1, 4
40
mA VPP e VPPH
Word Write in Progress
IPPW
VPP Byte Write Current
1, 4
30
mA VPP e VPPH
Byte Write in Progress
IPPE
VPP Block Erase Current
1, 4
30
mA VPP e VPPH
Block Erase in Progress
IPPES
VPP Erase Suspend Current
1
200
mA VPP e VPPH
Block Erase Suspended
IRPÝ
RPÝ Boot Block Unlock Current
1, 4
500
mA RPÝ e VHH
IID
A9 Intelligent Identifier Current
1, 4
500
mA A9 e VID
VID
A9 Intelligent Identifier Voltage
11.4 12.0
VIL
Input Low Voltage
VIH
Input High Voltage
VOL
Output Low Voltage
1
1, 2
3
mA VPP s VCC
13.0
V
b 0.5
0.6
V
2.0
VCC a 0.5
V
0.4
V
VCC e VCC Min
IOL e 2 mA
31
28F400BL-T/B, 28F004BL-T/B
DC CHARACTERISTICS (Continued)
VCC e 3.3V g 0.3V Read, 3.15V–3.6V Program/Erase
Symbol
Parameter
VOH1
Output High Voltage (TTL)
VOH2
Output High Voltage
(CMOS)
Notes
Min
Typ Max Unit
Test Conditions
2.4
V
VCC e VCC Min
IOH e b 2 mA
0.85 VCC
V
VCC e VCC Min
IOH e b 2.5 mA
VCC b 0.4
VPPL
VPP during Normal Operations
VPPH
VPP during Erase/Write Operations
3
VLKO
VCC Erase/Write Lock Voltage
2.0
VHH
RPÝ Unlock Voltage
11.4
VCC e VCC Min
IOH e b 100 mA
0.0
4.1
V
11.4
12.0 12.6
V
12.0 13.0
V
V
Boot Block Write/Erase
NOTES:
1. All currents are in RMS unless otherwise noted. Typical values at VCC e 3.3V, VPP e 12.0V, T e 25§ C. These currents
are valid for all product versions (packages and speeds).
2. ICCES is specified with the device deselected. If the device is read while in Erase Suspend Mode, current draw is the sum
of ICCES and ICCR.
3. Block Erase and Word/Byte Writes are inhibited when VPP e VPPL and not guaranteed in the range between VPPH and
VPPL.
4. Sampled, not 100% tested.
5. Automatic Power Savings (APS) reduces ICCR to less than 1 mA in static operation.
6. CMOS Inputs are either VCC g 0.2V or GND g 0.2V. TTL Inputs are either VIL or VIH.
CAPACITANCE(1)
TA e 25§ C, f e 1 MHz
Symbol
Parameter
Max
Unit
Condition
CIN
Input Capacitance
6
8
pF
VIN e 0V
COUT
Output Capacitance
10
12
pF
VOUT e 0V
NOTE:
1. Sampled, not 100% tested.
32
Typ
28F400BL-T/B, 28F004BL-T/B
DC CHARACTERISTICS(4)
VCC e 5.0V g 10%
Symbol
Parameter
Notes Min
Typ
Max
Unit
Test Conditions
ILI
Input Load Current
1
g 1.0
mA
VCC e VCC Max
VIN e VCC or GND
ILO
Output Leakage Current
1
g 10
mA
VCC e VCC Max
VOUT e VCC or GND
ICCS
VCC Standby Current
1
1.5
mA
VCC e VCC Max
CEÝ e RPÝ e VIH
100
mA
VCC e VCC Max
CEÝ e RPÝ e VCC g 0.2V
1
1.2
mA
1
40
mA
VCC e VCC Max, CEÝ e GND
f e 5 MHz, IOUT e 0 mA
CMOS Inputs
40
mA
VCC e VCC Max, CEÝ e VIL
f e 5 MHz, IOUT e 0 mA
TTL Inputs
ICCD
VCC Deep Power-Down Current
ICCR
VCC Read Current for
28F400BX-L Word-Wide Mode
and Byte Wide Mode
and 28F004BX-L
RPÝ e GND g 0.2V
IOUT e 0 mA
ICCW
VCC Word Byte Write Current
1, 4
70
mA
Word Write in Progress
ICCE
VCC Block Erase Current
1, 4
30
mA
Block Erase in Progress
ICCES
VCC Erase Suspend Current
1, 2
10
mA
Block Erase Suspended,
CEÝ e VIH
IPPS
VPP Standby Current
1
g 10
mA
VPP s VCC
IPPD
VPP Deep Power-Down Current
1
5.0
mA
RPÝ e GND g 0.2V
IPPR
VPP Read Current
1
200
mA
VPP l VCC
IPPW
VPP Word Write Current
1, 4
40
mA
VPP e VPPH
Word Write in Progress
IPPW
VPP Byte Write Current
1, 4
30
mA
VPP e VPPH
Byte Write in Progress
IPPE
VPP Block Erase Current
1, 4
30
mA
VPP e VPPH
Block Erase in Progress
IPPES
VPP Erase Suspend Current
1
200
mA
VPP e VPPH
Block Erase Suspended
IRPÝ
RPÝ Boot Block
Unlock Current
1, 4
500
mA
RPÝ e VHH
IID
A9 Intelligent
Identifier Current
1, 4
500
mA
A9 e VID
VID
A9 Intelligent
Identifier Voltage
13.0
V
11.4 12.0
33
28F400BL-T/B, 28F004BL-T/B
DC CHARACTERISTICS(4) (Continued)
VCC e 5.0V g 10%
Symbol
Parameter
Notes
Min
Typ
Max
Unit
Test Condition
VIL
Input Low Voltage
b 0.5
0.8
V
VIH
Input High Voltage
2.0
VCC a 0.5
V
VOL
Output Low Voltage
0.45
V
VCC e VCC Min
IOL e 5.8 mA
VOH1
Output High Voltage (TTL)
2.4
V
VCC e VCC Min
IOH e b 2.5 mA
VOH2
Output High Voltage
(CMOS)
0.85 VCC
V
VCC e VCC Min
IOL e b 2.5 mA
VCC b 0.4
VPPL
VPP during Normal Operations
VPPH
VPP during Erase/Write Operations
3
VLKO
VCC Erase/Write Lock Voltage
2.2
VHH
RPÝ Unlock Voltage
11.4
VCC e VCC Min
IOL e b 100 mA
0.0
11.4
6.5
V
12.0
12.6
V
12.0
13.0
V
V
Boot Block Write/Erase
NOTES:
1. All currents are in RMS unless otherwise noted. Typical values at VCC e 5.0V, VPP e 12.0V, T e 25§ C. These currents
are valid for all product versions (packages and speeds).
2. ICCES is specified with the device deselected. If the device is read while in Erase Suspend Mode, current draw is the sum
of ICCES and ICCR.
3. Block Erases and Word/Byte Writes are inhibited when VPP e VPPL and not guaranteed in the range between VPPH and
VPPL.
4. All parameters are sampled, not 100% tested.
AC INPUT/OUTPUT REFERENCE WAVEFORM
AC TESTING LOAD CIRCUIT
290450 – 16
AC test inputs are driven at 3.0V for a Logic ‘‘1’’ and 0.0 for a Logic ‘‘0’’.
Input timing begins, and output timing ends at 1.5V. Input rise and fall times
(10% to 90%) k 10 ns.
290450 – 17
CL e 50 pF
CL Includes Jig Capacitance
RL e 3.3 KX
34
28F400BL-T/B, 28F004BL-T/B
AC CHARACTERISTICS-Read-Only Operations(1)
VCC e 3.3V g 0.3V, 5.0V g 10%
28F400BL-150
28F004BL-150
Versions
Symbol
Parameter
Notes
Min
Unit
Max
tAVAV
tRC
Read Cycle Time
tAVQV
tACC
Address to Output Delay
tELQV
tCE
CEÝ to Output Delay
tPHQV
tPWH
RPÝ High to Output Delay
tGLQV
tOE
OEÝ to Output Delay
2
tELQX
tLZ
CEÝ to Output Low Z
3
tEHOZ
tHZ
CEÝ High to Output High Z
3
tGLQX
tOLZ
OEÝ to Output Low Z
3
tGHQZ
tDF
OEÝ High to Output High Z
3
tOH
Output Hold from Addresses, CEÝ or OEÝ
Change, Whichever is First
3
tIR
Input Rise Time
10
ns
tIF
Input Fall Time
10
ns
3
5
ns
3, 4
150
ns
3
45
ns
tELFL
tELFH
CEÝ to BYTEÝ Switching Low or High
tFHQV
BYTEÝ Switching High to Valid Output Delay
tFLQZ
BYTEÝ Switching Low to Output High Z
150
2
ns
150
ns
150
ns
600
ns
65
0
ns
ns
55
0
ns
ns
45
0
ns
ns
NOTES:
1. See AC Input/Output Reference Waveform for timing measurements.
2. OEÝ may be delayed up to tCE-tOE after the falling edge of CEÝ without impact on tCE.
3. Sampled, not 100% tested.
4. tFLQV, BYTEÝ switching low to valid output delay will be equal to tAVQV, measured from the time DQ15/A-1 becomes
valid.
35
290450– 18
28F400BL-T/B, 28F004BL-T/B
Figure 16. AC Waveforms for Read Operations
36
28F400BL-T/B, 28F004BL-T/B
290450 – 25
Figure 17. BYTEÝ Timing Diagram for Both Read and Write Operations
37
28F400BL-T/B, 28F004BL-T/B
AC CHARACTERISTICS FOR WEÝ-CONTROLLED WRITE OPERATIONS(1)
VCC e 3.15V–3.6V, 5.0V g 10%
28F400BL-150
28F004BL-150
Versions(4)
Symbol
Parameter
Notes
Min
Unit
Max
tAVAV
tWC
Write Cycle Time
150
ns
tPHWL
tPS
RPÝ High Recovery
to WEÝ Going Low
1.0
ms
tELWL
tCS
CEÝ Setup to WEÝ
Going Low
0
ns
tPHHWH
tPHS
RPÝ VHH Setup to WEÝ
Going High
6, 8
200
ns
tVPWH
tVPS
VPP Setup to WEÝ Going High
5, 8
200
ns
tAVWH
tAS
Address Setup to WEÝ
Going High
3
95
ns
tDVWH
tDS
Data Setup to WEÝ Going High
4
tWLWH
tWP
WEÝ Pulse Width
tWHDX
tDH
Data Hold from WEÝ High
WEÝ High
4
tWHAX
tAH
Address Hold from WEÝ High
3
tWHEH
tCH
CEÝ Hold from WEÝ High
tWHWL
tWPH
WEÝ Pulse Width High
100
ns
100
ns
0
ns
10
ns
10
ns
50
ns
tWHQV1
Duration of Word/Byte
Programming Operation
2, 5, 6
6
ms
tWHQV2
Duration of Erase
Operation (Boot)
2, 5, 6
0.3
s
tWHQV3
Duration of Erase
Operation (Parameter)
2, 5, 6
0.3
s
tWHQV4
Duration of Erase
Operation (Main)
2, 5, 6
0.6
s
ns
tQVVL
tQVPH
tVPH
VPP Hold from Valid SRD
5, 8
0
tPHH
RPÝ VHH Hold from Valid SRD
6, 8
0
Boot-Block Relock Delay
7, 8
tPHBR
ns
200
ns
tIR
Input Rise Time
10
ns
tIF
Input Fall Time
10
ns
NOTES:
1. Read timing characteristics during write and erase operations are the same as during read-only operations. Refer to AC
Characteristics during Read Mode.
2. The on-chip WSM completely automates program/erase operations; program/erase algorithms are now controlled internally which includes verify and margining operations.
3. Refer to command definition table for valid AIN.
4. Refer to command definition table for valid DIN.
5. Program/Erase durations are measured to valid SRD data (successful operation, SR.7 e 1).
6. For Boot Block Program/Erase, PWDÝ should be held at VHH until operation completes successfully.
7. Time tPHBR is required for successful relocking of the Boot Block.
8. Sampled but not 100% tested.
38
28F400BL-T/B, 28F004BL-T/B
BLOCK ERASE AND BYTE/WORD WRITE PERFORMANCE
VCC e 3.15V–3.6V, 5.0V g 10%
Parameter
28F400BL-150
28F004BL-150
Notes
Min
Typ(1)
Unit
Max
Boot/Parameter Block Erase Time
2
2.0
8.6
s
Main Block Erase Time
2
3.4
17.0
s
Main Block Byte Program Time
2
1.4
5.3
s
Main Block Word Program Time
2
0.7
2.7
s
NOTES:
1. 25§ C, 12.0V VPP.
2. Excludes System-Level Overhead.
39
290450– 19
28F400BL-T/B, 28F004BL-T/B
Figure 18. AC Waveforms for Write and Erase Operations (WEÝ-Controlled Writes)
40
28F400BL-T/B, 28F004BL-T/B
AC CHARACTERISTICS FOR CEÝ-CONTROLLED WRITE OPERATIONS
VCC e 3.15V–3.6V, 5.0V g 10%
28F400BL-150
28F004BL-150
Versions
Symbol
Parameter
Notes
Min
Unit
Max
tAVAV
tWC
Write Cycle Time
150
ns
tPHEL
tPS
RPÝ High Recovery to
CEÝ Going Low
1.0
ms
tWLEL
tWS
WEÝ Setup to CEÝ Going Low
0
ns
tPHHEH
tPHS
RPÝ VHH Setup to CEÝ Going High
6, 8
200
ns
tVPEH
tVPS
VPP Setup to CEÝ Going High
5, 8
200
ns
tAVEH
tAS
Address Setup to CEÝ Going High
3
95
ns
tDVEH
tDS
Data Setup to CEÝ Going High
4
100
ns
tELEH
tCP
CEÝ Pulse Width
100
ns
tEHDX
tDH
Data Hold from CEÝ High
4
0
ns
tEHAX
tAH
Address Hold from CEÝ High
3
tEHWH
tWH
WEÝ Hold from CEÝ High
tEHEL
tCPH
CEÝ Pulse Width High
10
ns
10
ns
50
ns
tEHQV1
Duration of Programming
Operation Word/Byte
2, 5, 6
6
ms
tEHQV2
Duration of Erase Operation (Boot)
2, 5, 6
0.3
s
tEHQV3
Duration of Erase
Operation (Parameter)
2, 5, 6
0.3
s
Duration of Erase Operation (Main)
2, 5, 6
0.6
s
5, 8
0
ns
0
tEHQV4
tQVVL
tVPH
VPP Hold from Valid SRD
tQVPH
tPPH
RPÝ VHH Hold from Valid SRD
6, 8
Boot-Block Relock Delay
7, 8
tPHBR
ns
200
ns
tIR
Input Rise Time
10
ns
tIF
Input Fall Time
10
ns
NOTES:
1. Chip-Enable Controlled Writes: Write operations are driven by the valid combination of CEÝ and WEÝ in systems where
CEÝ defines the write pulse-width (within a longer WEÝ timing waveform), all set-up, hold and inactive WEÝ times
should be measured relative to the CEÝ waveform.
2, 3, 4, 5, 6, 7, 8. Refer to AC Characteristics for WEÝ-Controlled Write operations.
9. Read timing characteristics during write and erase operations are the same as during read-only operations. Refer to AC
Characteristics during Read Mode.
41
290450– 20
28F400BL-T/B, 28F004BL-T/B
Figure 19. Alternate AC Waveforms for Write and Erase Operations (CEÝ-Controlled Writes)
42
28F400BL-T/B, 28F004BL-T/B
ORDERING INFORMATION
290450 – 21
VALID COMBINATIONS:
E28F400BL-T150
PA28F400BL-T150
E28F400BL-B150
PA28F400BL-B150
290450 – 22
VALID COMBINATIONS:
E28F004BL-T150
E28F004BL-B150
ADDITIONAL INFORMATION
References
Order
Number
Document
290448
28F002/200-T/B Mbit Boot Block Flash Memory Datasheet
290449
28F002/200BL-T/B 2 Mbit Low Power Boot Block Flash Memory Datasheet
290451
28F004/400BX-T/B 4-Mbit Boot Block Flash Memory Datasheet
290531
2-Mbit SmartVoltage Boot Block Flash Memory Family Datasheet
290530
4-Mbit SmartVoltage Boot Block Flash Memory Family Datasheet
290539
8-Mbit SmartVoltage Boot Block Flash Memory Family Datasheet
292098
AP-363 ‘‘Extended Flash BIOS Concepts for Portable Computers’’
292148
AP-604 ‘‘Using Intel’s Boot Block Flash Memory Parameter Blocks to Replace EEPROM’’
292178
AP-623 ‘‘Multisite Layout Planning Using Intel’s Boot Block Flash Memory’’
292130
AB-57 ‘‘Boot Block Architecture for Safe Firmware Updates’’
292154
AB-60 ‘‘2/4/8-Mbit SmartVoltage Boot Block Flash Memory Family’’
43
28F400BL-T/B, 28F004BL-T/B
Revision History
Number
Description
-001
Original Version
-002
Modified BYTEÝ Timing Waveforms
Modified tDVWH parameter for AC Characteristics for Write Operations
-003
PWD renamed to RPÝ for JEDEC standarization compatibility.
Combined VCC Read Current for 28F400BX-L Word-Wide and Byte-Wide Mode
and 28F004BX-L Byte Wide Mode in DC Characteristics tables.
Changed IPPS current spec from g 10 mA to g 15 mA in DC Characteristics table.
Added Boot Block Unlock current spec in DC Characteristics tables.
Improved tPWH spec to 600 ns (was 700 ns).
Changed ICCR maximum spec from 20 mA to 25 mA, and added 15 mA typical spec
in DC Characteristics Table.
-004
Added IOH CMOS specification.
Expanded temperature operating range
from 0§ C–70§ C to b 20§ C–70§ C
Product naming changed:
28F400BX-TL/BL changed to 28F400BL-T/B
28F004BX-TL/BL changed to 28F004BL-T/B
Typographical errors corrected.
Added 28F400BX interface to Intel386 TM EX
Embedded Processor block diagram.
Added upgrade considerations for
SmartVoltage Boot Block products.
Previously specified VCC tolerance of 3.0V to 3.6V for Read,
Program and Erase has been changed to 3.15V to 3.6V for
Program and Erase while Read remains 3.0V to 3.6V
-005
44
Added references to input rise/fall times.