MICRON MT28C3212P2FL

2 MEG x 16 PAGE FLASH
128K x 16 SRAM COMBO MEMORY
FLASH AND SRAM
COMBO MEMORY
MT28C3212P2FL
MT28C3212P2NFL
Low Voltage, Extended Temperature
FEATURES
BALL ASSIGNMENT
66-Ball FBGA (Top View)
• Flexible dual-bank architecture
• Support for true concurrent operations with no
latency:
Read bank b during program bank a and vice versa
Read bank b during erase bank a and vice versa
• Organization: 2,048K x 16 (Flash)
128K x 16 (SRAM)
• Basic configuration:
Flash
Bank a (4Mb Flash for data storage)
– Eight 4K-word parameter blocks
– Seven 32K-word blocks
Bank b (28Mb Flash for program storage)
– Fifty-six 32K-word main blocks
SRAM
2Mb SRAM for data storage
– 128K-words
• F_VCC, VCCQ, F_VPP, S_VCC voltages1
1.65V (MIN)/1.95V (MAX) F_VCC read voltage or
1.80V (MIN)/2.20V (MAX) F_VCC read voltage
1.65V (MIN)/1.95V (MAX) S_VCC read voltage or
1.80V (MIN)/2.20V (MAX) S_VCC read voltage
1.65V (MIN)/1.95V (MAX) VCCQ or
1.80V (MIN)/2.20V (MAX) VCCQ
1.80V (TYP) F_VPP (in-system PROGRAM/ERASE)
0.0V (MIN)/2.20V (MAX) F_VPP (in-system
PROGRAM/ERASE) 2
12V ±5% (HV) F_VPP (production programming
compatibility)
• Asynchronous access time1
Flash access time: 100ns or 110ns @ 1.65V F_VCC
SRAM access time: 100ns @ 1.65V S_VCC
• Page Mode read access1
Interpage read access: 100ns/110ns @ 1.65V F_VCC
Intrapage read access: 35ns/45ns @ 1.65V F_VCC
• Low power consumption
• Enhanced suspend options
ERASE-SUSPEND-to-READ within same bank
PROGRAM-SUSPEND-to-READ within same bank
ERASE-SUSPEND-to-PROGRAM within same bank
• Read/Write SRAM during program/erase of Flash
• Dual 64-bit chip protection registers for security
purposes
• PROGRAM/ERASE cycles
100,000 WRITE/ERASE cycles per block
1
2
3
4
5
6
7
8
9
10
11
12
NC
NC
A20
A11
A15
A14
A13
A12
F_VSS
VccQ
NC
NC
B
A16
A8
A10
A9
DQ15
S_WE#
DQ14
DQ7
C
F_WE#
NC
DQ13
DQ6
DQ4
DQ5
D
S_VSS
F_RP#
DQ12
S_CE2
S_VCC
F_VCC
E
F_WP#
F_VPP
A19
DQ10
DQ2
DQ3
F
S_LB#
S_UB#
S_OE#
DQ9
DQ8
DQ0
DQ1
G
A18
A17
A7
A6
A3
A2
A1
S_CE1#
F_VCC
A5
A4
A0
F_CE#
F_VSS
F_OE#
NC
NC
NC
A
H
NC
NC
DQ11
Top View
(Ball Down)
• Cross-compatible command set support
Extended command set
Common Flash interface (CFI) compliant
NOTE: 1. These specifications are guaranteed for operation
within either one of two voltage ranges, 1.65V–1.95V
or 1.80V–2.20V. Use only one of the two voltage
ranges for PROGRAM and ERASE operations.
2. MT28C3212P2NFL only.
OPTIONS
MARKING
• Timing
100ns
-10
110ns
-11
• Boot Block
Top
T
Bottom
B
• VPP1 Range
0.9V–2.2V
None
0.0V–2.2V
N
• Operating Temperature Range
Commercial Temperature (0oC to +70oC) None
Extended Temperature (-40oC to +85oC) ET
• Package
66-ball FBGA (8 x 8 grid)
FL
Part Number Example:
MT28C3212P2FL-10 TET
2 Meg x 16 Page Flash 128K x 16 SRAM Combo Memory
MT28C3212P2FL_2.p65 – Rev. 2, Pub. 4/02
1
©2002, Micron Technology, Inc.
PRODUCTS AND SPECIFICATIONS DISCUSSED HEREIN ARE SUBJECT TO CHANGE BY MICRON WITHOUT NOTICE.
2 MEG x 16 PAGE FLASH
128K x 16 SRAM COMBO MEMORY
GENERAL DESCRIPTION
The MT28C3212P2FL and MT28C3212P2NFL combination Flash and SRAM memory devices provide a
compact, low-power solution for systems where PCB
real estate is at a premium. The dual-bank Flash is a
high-performance, high-density, nonvolatile memory
device with a revolutionary architecture that can significantly improve system performance.
This new architecture features:
• A two-memory-bank configuration supporting
dual-bank burst operation;
• A high-performance bus interface providing a fast
page data transfer; and
• A conventional asynchronous bus interface.
The device also provides soft protection for blocks
by configuring soft protection registers with dedicated
command sequences. For security purposes, dual 64bit chip protection registers are provided.
The embedded WORD WRITE and BLOCK ERASE
functions are fully automated by an on-chip write state
machine (WSM). The WSM simplifies these operations
and relieves the system processor of secondary tasks.
An on-chip status register, one for each bank, can be
used to monitor the WSM status to determine the
progress of a PROGRAM/ERASE command.
The erase/program suspend functionality allows
compatibility with existing EEPROM emulation software packages.
The device takes advantage of a dedicated power
source for the Flash device (F_VCC) and a dedicated
power source for the SRAM device (S_VCC), both at
1.65V–1.95V or 1.80V–2.20V for optimized power consumption and improved noise immunity. The
MT28C3212P2FL and MT28C3212P2NFL devices sup-
port two VPP voltage ranges, VPP1 and VPP2. VPP1 is an incircuit voltage of 0.9V–2.2V (MT28C3212P2FL) or 0.0V–
2.2V (MT28C3212P2NFL). VPP2 is the production compatibility voltage of 12V ±5%. The 12V ±5% VPP2 is supported for a maximum of 100 cycles and 10 cumulative
hours. See Table 1.
The MT28C3212P2FL and MT28C3212P2NFL devices contain an asynchronous 2Mb SRAM organized
as 128K-words by 16 bits. These devices are fabricated
using an advanced CMOS process and high-speed/
ultra-low-power circuit technology.
The MT28C3212P2FL and MT28C3212P2NFL devices are packaged in a 66-ball FBGA package with
0.80mm pitch.
DEVICE MARKING
Due to the size of the package, Micron’s standard
part number is not printed on the top of each device.
Instead, an abbreviated device mark comprised of a
five-digit alphanumeric code is used. The abbreviated
device marks are cross referenced to Micron part numbers in Table 2.
Table 1
VPP Voltage Ranges
VOLTAGE RANGE
V PP 1
V PP 2
0.9V–2.2V 11.4V–12.6V
0.0V–2.2V 11.4V–12.6V
DEVICE
MT28C3212P2FL
MT28C3212P2NFL
Table 2
Cross Reference for Abbreviated Device Marks
PART NUMBER
MT28C3212P2FL-10 BET
MT28C3212P2FL-10 TET
MT28C3212P2FL-11 BET
MT28C3212P2FL-11 TET
MT28C3212P2NFL-11 TET
2 Meg x 16 Page Flash 128K x 16 SRAM Combo Memory
MT28C3212P2FL_2.p65 – Rev. 2, Pub. 4/02
PRODUCT
MARKING
SAMPLE
MARKING
MECHANICAL
SAMPLE MARKING
FW443
FW442
FW444
FW433
FW445
FX443
FX442
FX444
FX433
FX445
FY443
FY442
FY444
FY433
FY445
2
Micron Technology, Inc., reserves the right to change products or specifications without notice.
©2002, Micron Technology, Inc.
2 MEG x 16 PAGE FLASH
128K x 16 SRAM COMBO MEMORY
PART NUMBERING INFORMATION
Micron’s low-power devices are available with several different combinations of features (see Figure 1).
Valid combinations of features and their corresponding part numbers are listed in Table 3.
Figure 1
Part Number Chart
MT 28C 321 2 P 2 N FL-11 T ET
Micron Technology
Operating Temperature Range
None = Commercial (0ºC to +70ºC)
ET = Extended (-40ºC to +85ºC)
Flash Family
28C = Dual-Supply Flash/SRAM Combo
Boot Block Starting Address
B = Bottom boot
T = Top boot
Density/Organization/Banks
321 = 32Mb (2,048K x 16)
bank a = 1/8; bank b = 7/8
Access Time
-10 = 100ns
-11 = 110ns
SRAM Density
2 = 2Mb SRAM (128K x 16)
Package Code
FL = 66-ball FBGA (8 x 8 grid)
Read Mode Operation
P = Asynchronous/Page Read
VPP1 Range
None = 0.9V–2.2V
N = 0.0V–2.2V
Operating Voltage Range
2 = 1.65V–1.95V or 1.80V–2.20V
Table 3
Valid Part Number Combinations
PART NUMBER
MT28C3212P2FL-10 BET
MT28C3212P2FL-10 TET
MT28C3212P2FL-11 BET
MT28C3212P2FL-11 TET
MT28C3212P2NFL-11 TET
2 Meg x 16 Page Flash 128K x 16 SRAM Combo Memory
MT28C3212P2FL_2.p65 – Rev. 2, Pub. 4/02
V PP 1
RANGE
ACCESS
TIME (ns)
BOOT BLOCK
STARTING
ADDRESS
OPERATING
TEMPERATURE
RANGE
0.9V–2.2V
0.9V–2.2V
0.9V–2.2V
0.9V–2.2V
0.0V–2.2V
100
100
110
110
110
Bottom
Top
Bottom
Top
Top
-40oC to +85oC
-40oC to +85oC
-40oC to +85oC
-40oC to +85oC
-40oC to +85oC
3
Micron Technology, Inc., reserves the right to change products or specifications without notice.
©2002, Micron Technology, Inc.
2 MEG x 16 PAGE FLASH
128K x 16 SRAM COMBO MEMORY
BLOCK DIAGRAM
F_VCC
F_WE#
F_OE#
F_CE#
F_RP#
FLASH
F_VPP
Bank a
F_WP#
F_VSS
2,048K x 16
A17–A20
Bank b
VCCQ
DQ0–DQ15
A0–A16
S_CE1#
S_CE2
S_OE#
S_WE#
SRAM
128K x 16
S_VSS
S_UB#
S_LB#
S_VCC
FLASH FUNCTIONAL BLOCK DIAGRAM
PR Lock
PR Lock
Query
Query/OTP
OTP
DQ0-DQ15
Manufacturer’s ID
Data Input
Buffer
X DEC
Bank 1 Blocks
Y/Z DEC
Y/Z Gating/Sensing
Device ID
Block Lock
RCR
Data
Register
ID Reg.
F_RST#
F_CE#
F_WE#
Status
Reg.
CSM
F_OE#
WSM
Program/
Erase
Pump Voltage
Generators
DQ0–DQ15
Output
Multiplexer
I/O Logic
A0–A20
Output
Buffer
Address
Input
Buffer
Address
CNT/WSM
Address Latch
2 Meg x 16 Page Flash 128K x 16 SRAM Combo Memory
MT28C3212P2FL_2.p65 – Rev. 2, Pub. 4/02
Address
Multiplexer
4
Y/Z DEC
Y/Z Gating/Sensing
X DEC
Bank 2 Blocks
Micron Technology, Inc., reserves the right to change products or specifications without notice.
©2002, Micron Technology, Inc.
2 MEG x 16 PAGE FLASH
128K x 16 SRAM COMBO MEMORY
BALL DESCRIPTIONS
66-BALL FBGA
NUMBERS
SYMBOL
TYPE
A3, A4, A5, A6,
A7, A8, B3, B4,
B5, B6, E5, G3,
G4, G5, G6, G7,
G8, G9, H4, H5,
H6
A0–A20
Input
Address Inputs: Inputs for the addresses during READ and WRITE
operations. Addresses are internally latched during READ and WRITE
cycles. Flash: A0–A20; SRAM: A0–A16.
H7
F_CE#
Input
Flash Chip Enable: Activates the device when LOW. When CE# is HIGH,
the device is disabled and goes into standby power mode.
H9
F_OE#
Input
Flash Output Enable: Enables Flash output buffers when LOW. When
F_OE# is HIGH, the output buffers are disabled.
C3
F_WE#
Input
Flash Write Enable: Determines if a given cycle is a Flash WRITE cycle.
F_WE# is active LOW.
D4
F_RP#
Input
Reset. When F_RP# is a logic LOW, the device is in reset, which drives
the outputs to High-Z and resets the WSM. When F_RP# is a logic HIGH,
the device is in standard operation. When F_RP# transitions from logic
LOW to logic HIGH, the device resets all blocks to locked and defaults to
the read array mode.
E3
F_WP#
Input
Flash Write Protect. Controls the lock down function of the flexible
locking feature.
G10
S_CE1#
Input
SRAM Chip Enable1: Activates the SRAM when it is LOW. HIGH level
deselects the SRAM and reduces the power consumption to standby
levels.
D8
S_CE2
Input
SRAM Chip Enable2: Activates the SRAM when it is HIGH. LOW level
deselects the SRAM and reduces the power consumption to standby
levels.
F5
S_OE#
Input
SRAM Output Enable: Enables SRAM output buffers when LOW. When
S_OE# is HIGH, the output buffers are disabled.
B8
S_WE#
Input
SRAM Write Enable: Determines if a given cycle is an SRAM WRITE cycle.
S_WE# is active LOW.
F3
S_LB#
Input
SRAM Lower Byte: When LOW, it selects the SRAM address lower byte
(DQ0–DQ7).
F4
S_UB#
Input
SRAM Upper Byte: When LOW, it selects the SRAM address upper byte
(DQ8–DQ15).
B7, B9, B10, DQ0–DQ15 Input/
C7, C8, C9,
Output
C10, D7, E6,
E8, E9, E10,
F7, F8, F9, F10
DESCRIPTION
Data Inputs/Outputs: Input array data on the second CE# and WE#
cycle during PROGRAM command. Input commands to the command
user interface when CE# and WE# are active. Output data when CE#
and OE# are active.
(continued on next page)
2 Meg x 16 Page Flash 128K x 16 SRAM Combo Memory
MT28C3212P2FL_2.p65 – Rev. 2, Pub. 4/02
5
Micron Technology, Inc., reserves the right to change products or specifications without notice.
©2002, Micron Technology, Inc.
2 MEG x 16 PAGE FLASH
128K x 16 SRAM COMBO MEMORY
BALL DESCRIPTIONS (continued)
66-BALL FBGA
NUMBERS
SYMBOL
TYPE
DESCRIPTION
E4
F_VPP
Input/
Supply
Flash Program/Erase Power Supply: [0.9V–2.2V or 11.4V–12.6V].
Operates as input at logic levels to control complete device protection.
Provides backward compatibility for factory programming when driven
to 11.4V–12.6V. A lower F_VPP voltage range (0.0V–2.2V) is available on
the MT28C3212P2NFL device.
D10, H3
F_VCC
Supply
Flash Power Supply: [1.65V–1.95V or 1.80V–2.20V]. Supplies power for
device operation.
A9, H8
F_V SS
Supply
Flash Specific Ground: Do not float any ground pin.
D9
S_VCC
Supply
SRAM Power Supply: [1.65V–1.95V or 1.80V–2.20V]. Supplies power for
device operation.
D3
S_V SS
Supply
SRAM Specific Ground: Do not float any ground pin.
A10
VCCQ
Supply
I/O Power Supply: [1.65–1.95V or 1.80V–2.20V]. This input should be tied
directly to VCC.
A1, A2, A11,
A12, C4, H1,
H2, H10, H11,
H12
NC
–
2 Meg x 16 Page Flash 128K x 16 SRAM Combo Memory
MT28C3212P2FL_2.p65 – Rev. 2, Pub. 4/02
No Connect: Lead is not internally connected; it may be driven or
floated.
6
Micron Technology, Inc., reserves the right to change products or specifications without notice.
©2002, Micron Technology, Inc.
2 MEG x 16 PAGE FLASH
128K x 16 SRAM COMBO MEMORY
TRUTH TABLE – FLASH
FLASH SIGNALS
SRAM SIGNALS
F_RP# F_CE# F_OE# F_WE# S_CE1# S_CE2 S_OE# S_WE# S_UB# S_LB#
MODES
Read
Write
Standby
Output Disable
Reset
H
H
H
H
L
L
L
H
L
X
L
H
X
H
X
H
L
X
H
X
SRAM must be High-Z
MEMORY OUPUT
MEMORY
DQ0–DQ15
BUS CONTROL
Flash
Flash
Other
Other
Other
SRAM any mode allowable
DOUT
DIN
High-Z
High-Z
High-Z
NOTES
1, 2, 3
1
4
4, 5
4, 6
TRUTH TABLE – SRAM
FLASH SIGNALS
SRAM SIGNALS
F_RP# F_CE# F_OE# F_WE# S_CE1# S_CE2 S_OE# S_WE# S_UB# S_LB#
MODES
Read
DQ0–DQ15
DQ0–DQ7
DQ8–DQ15
Write
DQ0–DQ15
DQ0–DQ7
DQ8–DQ15
Standby
Flash must be High-Z
Flash any mode allowable
Output Disable
NOTE: 1.
2.
3.
4.
5.
6.
7.
8.
9.
10.
MEMORY OUPUT
MEMORY
DQ0–DQ15
BUS CONTROL
NOTES
L
L
L
H
H
H
L
L
L
H
H
H
L
H
L
L
L
H
SRAM
SRAM
SRAM
DOUT
DOUT LB
DOUT UB
1, 3
7
8
L
L
L
H
X
L
H
H
H
X
L
H
H
H
H
X
X
X
L
L
L
X
X
X
L
H
L
X
X
X
L
L
H
X
X
X
SRAM
SRAM
SRAM
Other
Other
Other
DIN
DIN LB
DIN UB
High-Z
High-Z
High-Z
1, 3
9
10
4
4
4
Two devices may not drive the memory bus at the same time.
Allowable flash read modes include read array, read query, read configuration, and read status.
Outputs are dependent on a separate device controlling bus outputs.
Modes of the Flash and SRAM can be interleaved so that while one is disabled, the other controls outputs.
SRAM is enabled and/or disabled with the logical function: S_CE1# or S_CE2.
Simultaneous operations can exist, as long as the operations are interleaved such that only one device attempts to
control the bus outputs at a time.
Data output on lower byte only; upper byte High-Z.
Data output on upper byte only; lower byte High-Z.
Data input on lower byte only.
Data input on upper byte only.
2 Meg x 16 Page Flash 128K x 16 SRAM Combo Memory
MT28C3212P2FL_2.p65 – Rev. 2, Pub. 4/02
7
Micron Technology, Inc., reserves the right to change products or specifications without notice.
©2002, Micron Technology, Inc.
ARCHITECTURE AND MEMORY
ORGANIZATION
The Flash memory device contains two separate
memory banks (bank a and bank b) for simultaneous
READ and WRITE operations. Bank a is 2Mb deep and
contains 8 x 4K-word parameter blocks and seven 32K-
2 Meg x 16 Page Flash 128K x 16 SRAM Combo Memory
MT28C3212P2FL_2.p65 – Rev. 2, Pub. 4/02
word blocks. Bank b is 28Mb deep, is equally sectored,
and contains fifty-six 32K-word blocks.
Figures 2 and 3 show the top and bottom memory
organizations.
8
Micron Technology, Inc., reserves the right to change products or specifications without notice.
©2002, Micron Technology, Inc.
FLASH
2 MEG x 16 PAGE FLASH
128K x 16 SRAM COMBO MEMORY
2 MEG x 16 PAGE FLASH
128K x 16 SRAM COMBO MEMORY
Block
70
69
68
67
66
65
64
63
62
61
60
59
58
57
56
55
54
53
52
51
50
49
48
47
46
45
44
43
42
41
40
39
38
37
36
35
34
33
32
31
30
29
28
27
26
25
24
23
22
21
20
19
18
17
16
15
Bank b = 28Mb
Block Size
(K-bytes/K-words)
64/32
64/32
64/32
64/32
64/32
64/32
64/32
64/32
64/32
64/32
64/32
64/32
64/32
64/32
64/32
64/32
64/32
64/32
64/32
64/32
64/32
64/32
64/32
64/32
64/32
64/32
64/32
64/32
64/32
64/32
64/32
64/32
64/32
64/32
64/32
64/32
64/32
64/32
64/32
64/32
64/32
64/32
64/32
64/32
64/32
64/32
64/32
64/32
64/32
64/32
64/32
64/32
64/32
64/32
64/32
64/32
2 Meg x 16 Page Flash 128K x 16 SRAM Combo Memory
MT28C3212P2FL_2.p65 – Rev. 2, Pub. 4/02
Address Range
(x16)
1F8000h-1FFFFFh
1F0000h-1F7FFFh
1E8000h-1EFFFFh
1E0000h-1E7FFFh
1D8000h-1DFFFFh
1D0000h-1D7FFFh
1C8000h-1CFFFFh
1C0000h-1C7FFFh
1B8000h-1BFFFFh
1B0000h-1B7FFFh
1A8000h-1AFFFFh
1A0000h-1A7FFFh
198000h-19FFFFh
190000h-197FFFh
188000h-18FFFFh
180000h-187FFFh
178000h-17FFFFh
170000h-177FFFh
168000h-16FFFFh
160000h-167FFFh
158000h-15FFFFh
150000h-157FFFh
148000h-14FFFFh
140000h-147FFFh
138000h-13FFFFh
130000h-137FFFh
128000h-12FFFFh
120000h-127FFFh
118000h-11FFFFh
110000h-117FFFh
108000h-10FFFFh
100000h-107FFFh
0F8000h-0FFFFFh
0F0000h-0F7FFFh
0E8000h-0EFFFFh
0E0000h-0E7FFFh
0D800h-0DFFFFh
0D0000h-0D7FFFh
0C8000h-0CFFFFh
0C0000h-0C7FFFh
0B8000h-0BFFFFh
0B0000h-0B7FFFh
0A8000h-0AFFFFh
0A0000h-0A7FFFh
098000h-097FFFh
090000h-097FFFh
088000h-087FFFh
080000h-087FFFh
078000h-07FFFFh
070000h-077FFFh
068000h-067FFFh
060000h-067FFFh
058000h-05FFFFh
050000h-057FFFh
048000h-04FFFFh
040000h-047FFFh
Block
14
13
12
11
10
9
8
7
6
5
4
3
2
1
0
9
Bank a = 4Mb
Block Size
(K-bytes/K-words)
64/32
64/32
64/32
64/32
64/32
64/32
64/32
8/4
8/4
8/4
8/4
8/4
8/4
8/4
8/4
FLASH
Figure 2
Bottom Boot Block Device
Address Range
(x16)
038000h-03FFFFh
030000h-037FFFh
028000h-02FFFFh
020000h-027FFFh
018000h-01FFFFh
010000h-017FFFh
008000h-00FFFFh
007000h-007FFFh
006000h-006FFFh
005000h-005FFFh
004000h-004FFFh
003000h-003FFFh
002000h-002FFFh
001000h-001FFFh
000000h-000FFFh
Micron Technology, Inc., reserves the right to change products or specifications without notice.
©2002, Micron Technology, Inc.
2 MEG x 16 PAGE FLASH
128K x 16 SRAM COMBO MEMORY
Block
70
69
68
67
66
65
64
63
62
61
60
59
58
57
56
Bank a = 4Mb
Block Size
(K-bytes/K-words)
8/4
8/4
8/4
8/4
8/4
8/4
8/4
8/4
64/32
64/32
64/32
64/32
64/32
64/32
64/32
2 Meg x 16 Page Flash 128K x 16 SRAM Combo Memory
MT28C3212P2FL_2.p65 – Rev. 2, Pub. 4/02
Address Range
(x16)
1FF000h-1FFFFFh
1FE000h-1FEFFFh
1FD000h-1FDFFFh
1FC000h-1FCFFFh
1FB000h-1FBFFFh
1FA000h-1FAFFFh
1F9000h-1F9FFFh
1F8000h-1F8FFFh
1F0000h-1F7FFFh
1E8000h-1EFFFFh
1E0000h-1E7FFFh
1D8000h-1DFFFFh
1D0000h-1D7FFFh
1C8000h-1CFFFFh
1C0000h-1C7FFFh
Block
55
54
53
52
51
50
49
48
47
46
45
44
43
42
41
40
39
38
37
36
35
34
33
32
31
30
29
28
27
26
25
24
23
22
21
20
19
18
17
16
15
14
13
12
11
10
9
8
7
6
5
4
3
2
1
0
10
Bank b = 28Mb
Block Size
(K-bytes/K-words)
64/32
64/32
64/32
64/32
64/32
64/32
64/32
64/32
64/32
64/32
64/32
64/32
64/32
64/32
64/32
64/32
64/32
64/32
64/32
64/32
64/32
64/32
64/32
64/32
64/32
64/32
64/32
64/32
64/32
64/32
64/32
64/32
64/32
64/32
64/32
64/32
64/32
64/32
64/32
64/32
64/32
64/32
64/32
64/32
64/32
64/32
64/32
64/32
64/32
64/32
64/32
64/32
64/32
64/32
64/32
64/32
FLASH
Figure 3
Top Boot Block Device
Address Range
(x16)
1B8000h-1BFFFFh
1B0000h-1B7FFFh
1A8000h-1AFFFFh
1A0000h-1A7FFFh
198000h-19FFFFh
190000h-197FFFh
188000h-18FFFFh
180000h-187FFFh
178000h-17FFFFh
170000h-177FFFh
168000h-16FFFFh
160000h-167FFFh
158000h-15FFFFh
150000h-157FFFh
148000h-14FFFFh
140000h-147FFFh
138000h-13FFFFh
130000h-137FFFh
128000h-12FFFFh
120000h-127FFFh
118000h-11FFFFh
110000h-117FFFh
108000h-10FFFFh
100000h-107FFFh
0F8000h-0FFFFFh
0F0000h-0F7FFFh
0E8000h-0EFFFFh
0E0000h-0E7FFFh
0D8000h-0DFFFFh
0D0000h-0D7FFFh
0C8000h-0CFFFFh
0C0000h-0C7FFFh
0B8000h-0BFFFFh
0B0000h-0B7FFFh
0A8000h-0AFFFFh
0A0000h-0A7FFFh
098000h-09FFFFh
090000h-097FFFh
088000h-08FFFFh
080000h-087FFFh
078000h-07FFFFh
070000h-077FFFh
068000h-06FFFFh
060000h-067FFFh
058000h-05FFFFh
050000h-057FFFh
048000h-04FFFFh
040000h-047FFFh
038000h-03FFFFh
030000h-037FFFh
028000h-02FFFFh
020000h-027FFFh
018000h-01FFFFh
010000h-017FFFh
008000h-00FFFFh
000000h-007FFFh
Micron Technology, Inc., reserves the right to change products or specifications without notice.
©2002, Micron Technology, Inc.
2 MEG x 16 PAGE FLASH
128K x 16 SRAM COMBO MEMORY
COMMAND STATE MACHINE
Commands are issued to the command state machine (CSM) using standard microprocessor write timings. The CSM acts as an interface between external
microprocessors and the internal write state machine
(WSM). The available commands are listed in Table 4,
their definitions are given in Table 5 and their descriptions in Table 6. Program and erase algorithms are automated by the on-chip WSM. Table 7 shows the CSM
transition states. Once a valid PROGRAM/ERASE command is entered, the WSM executes the appropriate
algorithm, which generates the necessary timing signals to control the device internally. A command is
valid only if the exact sequence of WRITEs is completed.
After the WSM completes its task, the write state machine status (WSMS) bit (SR7) (see Table 9) is set to a
logic HIGH level (VIH), allowing the CSM to respond to
the full command set again.
Table 8 illustrates the bus operations for all the
modes: write, read, reset, standby, and output disable.
When the device is powered up, internal reset circuitry initializes the chip to a read array mode of operation. Changing the mode of operation requires that a
command code be entered into the CSM. For each one
of the two flash memory partitions, an on-chip status
register is available. These two registers allow the monitoring of the progress of various operations that can
take place on a memory bank. One of the two status
registers is interrogated by entering a READ STATUS
REGISTER command onto the CSM (cycle 1), specifying an address within the memory partition boundary,
and reading the register data on I/O pins DQ0–DQ7
(cycle 2). Status register bits SR0-SR7 correspond to
DQ0–DQ7 (see Table 9).
COMMAND DEFINITION
Once a specific command code has been entered,
the WSM executes an internal algorithm, generating
the necessary timing signals to program, erase, and
verify data. See Table 5 for the CSM command definitions and data for each of the bus cycles.
OPERATIONS
Device operations are selected by entering a standard JEDEC 8-bit command code with conventional
microprocessor timings into an on-chip CSM through
I/O pins DQ0–DQ7. The number of bus cycles required
to activate a command is typically one or two. The first
operation is always a WRITE. Control pins F_CE# and
F_WE# must be at a logic LOW level (VIL), and F_OE#
and F_RP# must be at logic HIGH (VIH). The second
operation, when needed, can be a WRITE or a READ
depending upon the command. During a READ operation, control pins F_CE# and F_OE# must be at a logic
LOW level (VIL), and F_WE# and F_RP# must be at logic
HIGH (VIH).
STATUS REGISTER
The status register allows the user to determine
whether the state of a PROGRAM/ERASE operation is
pending or complete. The status register is monitored
by toggling F_OE# and F_CE# and reading the resulting status code on I/O pins DQ0–DQ7. The high-order
I/Os (DQ8–DQ15) are set to 00h internally, so only the
Table 4
Command State Machine Codes For Device Mode Selection
COMMAND DQ0–DQ7
10h/40h
20h
50h
CODE ON DEVICE MODE
Program setup/alternate program setup
Block erase setup
Clear status register
60h
70h
90h
Protection configuration setup
Read status register
Read protection configuration register
98h
B0h
C0h
D0h
FFh
Read query
Program/erase suspend
Protection register program/lock
Program/erase resume - erase confirm
Read array
2 Meg x 16 Page Flash 128K x 16 SRAM Combo Memory
MT28C3212P2FL_2.p65 – Rev. 2, Pub. 4/02
11
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©2002, Micron Technology, Inc.
FLASH
FLASH MEMORY OPERATING MODES
COMMAND STATE MACHINE OPERATIONS
The CSM decodes instructions for the commands
listed in Table 4. The 8-bit command code is input to
the device on DQ0–DQ7 (see Table 5 for command
definitions). During a PROGRAM or ERASE cycle, the
CSM informs the WSM that a PROGRAM or ERASE cycle
has been requested.
During a PROGRAM cycle, the WSM controls the
program sequences and the CSM responds to a PROGRAM SUSPEND command only.
During an ERASE cycle, the CSM responds to an
ERASE SUSPEND command only. When the WSM has
completed its task, the WSMS bit (SR7) is set to a logic
HIGH level and the CSM responds to the full command
set. The CSM stays in the current command state until
the microprocessor issues another command.
The WSM successfully initiates an ERASE or PROGRAM operation only when VPP is within its correct voltage range.
low-order I/O pins (DQ0–DQ7) need to be interpreted.
Address lines select the status register pertinent to the
selected memory partition.
Register data is updated and latched on the rising
edge of F_OE# or F_CE#, whichever occurs first. The
latest falling edge of either of these two signals updates the latch within a given READ cycle. Latching the
data prevents errors from occurring if the register input
changes during a status register read.
The status register provides the internal state of the
WSM to the external microprocessor. During periods
when the WSM is active, the status register can be polled
to determine the WSM status. Table 9 defines the status register bits.
After monitoring the status register during a
PROGRAM/ERASE operation, the data appearing on
DQ0–DQ7 remains as status register data until a new
command is issued to the CSM. To return the device to
other modes of operation, a new command must be
issued to the CSM.
Table 5
Command Definitions
FIRST BUS CYCLE
COMMAND
OPERATION ADDRESS
SECOND BUS CYCLE
DATA
READ ARRAY
WRITE
READ PROTECTION CONFIGURATION REGISTER
READ STATUS REGISTER
CLEAR STATUS REGISTER
WRITE
BA
50h
READ QUERY
WRITE
QA
BLOCK ERASE SETUP
WRITE
PROGRAM SETUP/ALTERNATE PROGRAM SETUP
PROGRAM/ERASE SUSPEND
OPERATION ADDRESS
DATA
WA
FFh
WRITE
IA
90h
READ
IA
ID
WRITE
BA
70h
READ
BA
SRD
98h
READ
QA
QD
BA
20h
WRITE
BA
D0h
WRITE
WA
40h/10h
WRITE
WA
WD
WRITE
BA
B0h
PROGRAM/ERASE RESUME - ERASE CONFIRM
WRITE
BA
D0h
LOCK BLOCK
WRITE
BA
60h
WRITE
BA
01h
UNLOCK BLOCK
WRITE
BA
60h
WRITE
BA
D0h
LOCK DOWN BLOCK
WRITE
BA
60h
WRITE
BA
2Fh
PROTECTION REGISTER PROGRAM
WRITE
PA
C0h
WRITE
PA
PD
PROTECTION REGISTER LOCK
WRITE
LPA
C0h
WRITE
LPA
FFFDh
NOTE: 1.
2.
3.
4.
5.
6.
7.
8.
9.
10.
11.
WA: Word address of memory location to be written, or read
IA: Identification code address
BA: Address within the block
ID: Identification code data
SRD: Data read from the status register
QA: Query code address
QD: Query code data
WD: Data to be written at the location WA
PA: Protection register address
LPA: Lock protection register address
PD: Protection register data
2 Meg x 16 Page Flash 128K x 16 SRAM Combo Memory
MT28C3212P2FL_2.p65 – Rev. 2, Pub. 4/02
12
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©2002, Micron Technology, Inc.
FLASH
2 MEG x 16 PAGE FLASH
128K x 16 SRAM COMBO MEMORY
Table 6
Command Descriptions
CODE DEVICE MODE
BUS CYCLE
DESCRIPTION
10h
Alt. Program Setup
First
Operates the same as a PROGRAM SETUP command.
20h
Erase Setup
First
Prepares the CSM for an ERASE CONFIRM command. If the next
command is not ERASE CONFIRM, the CSM sets both SR4 and SR5 of
the status register to a “1,” places the device into read status register
mode, and waits for another command.
40h
Program Setup
First
A two-cycle command: The first cycle prepares for a PROGRAM
operation, the second cycle latches addresses and data and initiates
the WSM to execute the program algorithm. The Flash outputs status
register data on the falling edge of F_OE# or F_CE#, whichever
occurs first.
50h
Clear Status
Register
First
The WSM can set the program status (SR4), and erase status (SR5) bits
in the status register to “1,” but it cannot clear them to “0.” Issuing
this command clears those bits to “0.”
60h
Protection
Configuration
Setup
First
Prepares the CSM for changes to the block locking status. If the next
command is not BLOCK UNLOCK, BLOCK LOCK or BLOCK LOCK
DOWN, then the CSM sets both the program and erase status register
bits to indicate a command sequence error.
70h
Read Status
Register
First
Places the device into read status register mode. Reading the device
outputs the contents of the status register, regardless of the address
presented to the device. The device automatically enters this mode
after a PROGRAM or ERASE operation has been initiated.
90h
Read Protection
Configuration
First
Puts the device into the read protection configuration mode so that
reading the device outputs the manufacturer/device codes or block
lock status.
98h
Read Query
First
Puts the device into the read query mode so that reading the device
outputs common Flash interface information.
B0h
Program Suspend
First
Erase Suspend
First
Suspends the currently executing PROGRAM/ERASE operation. The
status register indicates when the operation has been successfully
suspended by setting either the program suspend (SR2) or erase
suspend (SR6) and the WSMS bit (SR7) to a “1” (ready). The WSM
continues to idle in the suspend state, regardless of the state of all
input control pins except F_RP#, which immediately shuts down the
WSM and the remainder of the chip if F_RP# is driven to VIL.
Program Device
Protection Register
First
Writes a specific code into the device protection register.
Lock Device
Protection register
First
Locks the device protection register; data can no longer be changed.
C0h
(continued on the next page)
2 Meg x 16 Page Flash 128K x 16 SRAM Combo Memory
MT28C3212P2FL_2.p65 – Rev. 2, Pub. 4/02
13
Micron Technology, Inc., reserves the right to change products or specifications without notice.
©2002, Micron Technology, Inc.
FLASH
2 MEG x 16 PAGE FLASH
128K x 16 SRAM COMBO MEMORY
Table 6
Command Descriptions (continued)
CODE DEVICE MODE
BUS CYCLE
DESCRIPTION
Erase Confirm
First
If the previous command was an ERASE SETUP command, then the
CSM closes the address and data latches, and it begins erasing the
block indicated on the address pins. During programming/erase, the
device responds only to the READ STATUS REGISTER, PROGRAM
SUSPEND, or ERASE SUSPEND commands and outputs status register
data on the falling edge of F_OE# or F_CE#, whichever occurs last.
Program/Erase
Resume
First
If a PROGRAM or ERASE operation was previously suspended, this
command resumes the operation.
FFh
Read Array
First
During the array mode, array data is output on the data bus.
01h
Lock Block
Second
If the previous command was PROTECTION CONFIGURATION SETUP,
the CSM latches the address and locks the block indicated on the
address bus.
2Fh
Lock Down
Second
If the previous command was PROTECTION CONFIGURATION SETUP,
the CSM latches the address and locks down the block indicated on
the address bus.
D0h
Unlock Block
Second
If the previous command was PROTECTION CONFIGURATION SETUP,
the CSM latches the address and unlocks the block indicated on the
address bus. If the block had been previously set to lock down, this
operation has no effect.
00h
Invalid/Reserved
D0h
2 Meg x 16 Page Flash 128K x 16 SRAM Combo Memory
MT28C3212P2FL_2.p65 – Rev. 2, Pub. 4/02
Unassigned command that should not be used.
14
Micron Technology, Inc., reserves the right to change products or specifications without notice.
©2002, Micron Technology, Inc.
FLASH
2 MEG x 16 PAGE FLASH
128K x 16 SRAM COMBO MEMORY
CLEAR STATUS REGISTER
The internal circuitry can set, but not clear, the block
lock status bit (SR1), the VPP status bit (SR3), the program status bit (SR4), and the erase status bit (SR5) of
the status register. The CLEAR STATUS REGISTER command (50h) allows the external microprocessor to clear
these status bits and synchronize to the internal operations. When the status bits are cleared, the device
returns to the read array mode.
and the identification code address on the address
lines. Control pins F_CE# and F_OE# must be at a logic
LOW level (VIL), and F_WE# and F_RP# must be at a
logic HIGH level (VIH) to read data from the protection
configuration register. Data is available on DQ0–DQ15.
After data is read from the protection configuration
register, the READ ARRAY command, FFh, must be issued to the bank containing address 00h prior to issuing other commands. See Table 11 for further details.
READ OPERATIONS
READ ARRAY
The array is read by entering the command code
FFh on DQ0–DQ7. Control pins F_CE# and F_OE# must
be at a logic LOW level (VIL), and F_WE# and F_RP#
must be at a logic HIGH level (VIH) to read data from the
array. Data is available on DQ0–DQ15. Any valid address within any of the blocks selects that address and
allows data to be read from that address. Upon initial
power-up, the device defaults to the read array mode.
READ QUERY
The read query mode outputs common Flash interface (CFI) data when the device is read (see Table 15).
Two bus cycles are required for this operation. It is
possible to access the query by writing the read query
command code 98h on DQ0–DQ7. Control pins F_CE#
and F_OE# must be at a logic LOW level (VIL), and F_WE#
and F_RP# must be at a logic HIGH level (V IH) to read
data from the query. The CFI data structure contains
information such as block size, density, command set,
and electrical specifications. To return to read array
mode, write the read array command code FFh on DQ0–
DQ7.
READ CHIP PROTECTION IDENTIFICATION DATA
The chip identification mode outputs three types
of information: the manufacturer/device identifier, the
block locking status, and the protection register. Two
bus cycles are required for this operation: the chip identification data is read by entering the command code
90h on DQ0–DQ7 to the bank containing address 00h
READ STATUS REGISTER
The status register is read by entering the command
code 70h on DQ0–DQ7. Two bus cycles are required for
this operation: one to enter the command code and a
second to read the status register. In a READ cycle, the
address is latched and register data is updated on the
falling edge of F_OE# or F_CE#, whichever occurs last.
The following READ operations are available: READ
ARRAY, READ PROTECTION CONFIGURATION REGISTER, READ QUERY and READ STATUS REGISTER.
2 Meg x 16 Page Flash 128K x 16 SRAM Combo Memory
MT28C3212P2FL_2.p65 – Rev. 2, Pub. 4/02
15
Micron Technology, Inc., reserves the right to change products or specifications without notice.
©2002, Micron Technology, Inc.
FLASH
2 MEG x 16 PAGE FLASH
128K x 16 SRAM COMBO MEMORY
2 MEG x 16 PAGE FLASH
128K x 16 SRAM COMBO MEMORY
Present state of the present
partition
Command input to the present partition (and next state of the present partition)
2Fh
01h
Lock
Lock
down
confirm
confirm
C0h
60h
OTP Lock/Unlock
setup /Lock down
98h
Read
query
90h
Read
device
ID
50h
70h
Clear
Read
status
status
register
B0h
Program
/Erase
suspend
D0h
BE confirm,
P/E resume,
ULB confirm
Read array
Read array
FLASH
Table 7
Command State Machine Transition Table
20h
10h/40h FFh
Erase Program Read
setup setup
array
SR7
Data
when
read
State
Mode
Present state
of the other
partition
1
Setup
2
Busy
Read array
OTP
setup
Lock
Read
query
Read
ID
Read
array
Read
status
Read array
Read array
Erase
setup Program Read
setup
array
1
Array
Array
3
Idle
4
Erase
suspend
5
Prog.
suspend
6
Setup
7
Busy
Read array
Read array
Read array
Read array
Read array
OTP
setup
Lock
Read
query
Read
ID
Read
array
Read
status
Read array
Read array
Erase
setup Program Read
setup
array
1
CFI
Query
8
Idle
9
Erase
suspend
10
Prog.
suspend
11
Setup
12
Busy
Read array
Read array
Read
Read array
Read array
Read array
OT P
setup
Lock
Read
query
Read
ID
Read
array
Read
status
Read array
Read array
Erase
setup Program Read
setup
array
1
ID
Device
ID
13
Idle
14
Erase
suspend
15
Prog.
suspend
16
Setup
17
Busy
Read array
Read array
Read array
Read array
Read array
OT P
setup
Lock
Read
query
Read
ID
Read
array
Read
status
Read array
Read array
Erase
setup Program Read
setup
array
1
Status
Status
18
Idle
19
Erase
suspend
20
Prog.
suspend
21
Idle
22
Idle
23
Setup
24
Busy
25
Idle
26
Erase
suspend
27
Prog.
suspend
Read array
Read array
Read array
Read array
Lock
Read
query
Protection register busy
1
Status
Setup
Protection register busy
0
Status
Busy
1
Status
Done
Read
ID
Read
array
Read
status
OTP
setup
Read array
Erase
setup
Read array
Lock
Read
query
Read
ID
Read
array
Read
status
Program Read
setup
array
1
Read array
Read array
Read array
Status
Done
P
r
o
t
e
c
t
i
o
n
r
e
g
i
s
t
e
r
(continued on next page)
2 Meg x 16 Page Flash 128K x 16 SRAM Combo Memory
MT28C3212P2FL_2.p65 – Rev. 2, Pub. 4/02
16
Micron Technology, Inc., reserves the right to change products or specifications without notice.
©2002, Micron Technology, Inc.
2 MEG x 16 PAGE FLASH
128K x 16 SRAM COMBO MEMORY
Present state of the present
partition
Command input to the present partition (and next state of the present partition)
2Fh
01h
Lock
Lock
down
confirm
confirm
C0H 60h
OTP Lock/Unlock
setup /Lock down
98h
Read
query
LB/ULB
90h
50h
Read
Clear
device ID status
register
70h
Read
status
Lock
B0h
Program
/Erase
suspend
L
D0h
BE confirm,
P/E resume,
ULB confirm
20h
10h/40h FFh
Erase Program Read
setup setup
array
LB/ULB
Lock
SR7
Data
when
read
State
1
Status
Setup
Mode
Present state of
the other
partition
28
Any
state
29
Setup
30
Busy
31
Idle
32
Erase
suspend
33
Prog.
suspend
34
Setup
35
Busy
36
Idle
37
Erase
suspend
38
Prog.
suspend
Read array
Read array
Read array
FLASH
Table 7
Command State Machine Transition Table (continued)
OTP
setup
Read
query
Lock
Read ID
Read
array
Read
status
Read array
Read array
Erase
setup Program Read
setup
array
1
Status
Error
Read array
Read array
Read array
Read array
Lock
Read array
O TP
setup
Read
query
Lock
Read ID
Read
array
Read
status
Read array
Read array
Erase
setup Program Read
setup
array
1
Status
Lock/
Unlock
Read array
Read array
Program Busy
Program Busy
PS read
Program busy
Read array
1
Status
Setup
39
Any
state
0
Status
Busy
40
Idle
41
Setup
42
Busy
Read array
Program
Read array
OTP
setup
Read
query
Lock
Read ID
Read
array
Read
status
Read array
Read array
Erase
setup Program Read
setup
array
1
Status
Done
43
Idle
44
Erase
suspend
45
Prog.
suspend
46
Setup
47
Idle
48
Erase
suspend
Read array
Read array
Program suspend read
array
Lock
Program
suspend
read
query
Program
suspend
read ID
Program
suspend
read
array
Program Program
suspend suspend
Program suspend read
Program busy
read
read
array
status
array
1
Status
Read
status
Program
suspend
(continued on next page)
2 Meg x 16 Page Flash 128K x 16 SRAM Combo Memory
MT28C3212P2FL_2.p65 – Rev. 2, Pub. 4/02
17
Micron Technology, Inc., reserves the right to change products or specifications without notice.
©2002, Micron Technology, Inc.
2 MEG x 16 PAGE FLASH
128K x 16 SRAM COMBO MEMORY
Present state of the present
partition
Command input to the present partition (and next state of the present partition)
2Fh
01h
Lock
Lock
down
confirm
confirm
C0h
60h
OTP Lock/Unlock
setup /Lock down
Program suspend read
array
Program suspend read
array
Program suspend read
array
Lock
Lock
Lock
98h
Read
query
90h
50h
Read
Clear
device ID status
register
Program
suspend
read
query
Program
suspend
read ID
Program
suspend
read
query
Program
suspend
read ID
Program
suspend
read
query
LB/ULB
Program
suspend
read ID
70h
Read
status
B0h
Program
/Erase
suspend
D0h
BE confirm,
P/E resume,
ULB confirm
Program Program
suspend suspend
Program suspend read
Program busy
read
read
array
status
array
Program
suspend
read
array
Program Program
suspend suspend
Program suspend read
Program busy
read
read
array
status
array
Program Program
suspend suspend
Program suspend read
Program busy
read
read
array
status
array
Erase
error
Erase error
Erase busy
Read array
Read array
20h
10h/40h FFh
Erase Program Read
setup setup
array
Program
suspend
read
array
Program
suspend
read
array
FLASH
Table 7
Command State Machine Transition Table (continued)
Erase error
SR7
1
1
1
1
Data
when
read
State
Array
Read
array
ID
CFI
Status
Read ID
Mode
Program
suspend
Read
Query
Setup
Present state
of the other
partition
49
Setup
50
Idle
51
Erase
suspend
52
Setup
53
Idle
54
Erase
suspend
55
Setup
56
Idle
57
Erase
suspend
58
Idle
59
Setup
60
Busy
61
Idle
62
Erase
suspend
63
Prog.
suspend
64
Setup
65
Busy
Read array
OTP
setup
Lock
Read
query
Read ID
Read
array
Read
status
Read array
Read array
Erase
setup Program Read
setup
array
1
Status
Error
Read array
Read array
Erase
Read array
Read array
Read array
OTP
setup
Lock
Read
query
Read ID
Read
array
Read
status
Read array
Erase
Read array
Program Read
setup
array
1
Status
Done
66
Idle
67
Erase
suspend
68
Prog.
suspend
69
Idle
Read array
Read array
Block erase busy
ES read
status
Erase busy
0
Status
Busy
(continued on next page)
2 Meg x 16 Page Flash 128K x 16 SRAM Combo Memory
MT28C3212P2FL_2.p65 – Rev. 2, Pub. 4/02
18
Micron Technology, Inc., reserves the right to change products or specifications without notice.
©2002, Micron Technology, Inc.
2 MEG x 16 PAGE FLASH
128K x 16 SRAM COMBO MEMORY
Present state of the present
partition
Command input to the present partition (and next state of the present partition)
2Fh
01h
Lock
Lock
down
confirm
confirm
C0h
60h
OTP Lock/Unlock
setup /Lock down
Erase suspend read array
Lock
98h
Read
query
Erase
suspend
read
query
90h
50h
Read
Clear
device ID status
register
Erase
suspend
read ID
Erase
suspend
read
array
70h
Read
status
Erase
suspend
read
status
B0h
Program
/Erase
suspend
D0h
BE confirm,
P/E resume,
ULB confirm
ES read
array
Erase busy
20h
10h/40h FFh
Erase Program Read
setup setup
array
SR7
Data
when
read
State
Mode
Erase suspend read
array
Erase suspend read array
ES read
array
Erase busy
ES
read
array
Prog.
setup
ES
read
array
1
Status
Erase suspend read array
Lock
Erase
suspend
read
query
Erase
suspend
read ID
Erase
suspend
read
array
Erase
suspend
read
status
Erase busy
status
Erase suspend read
array
Erase suspend read array
ES read
array
Erase busy
ES
read
array
Prog.
setup
ES
read
array
1
Array
Read
array
Erase suspend read array
ES read
array
Erase suspend read array
Lock
Erase
suspend
read
query
Erase
suspend
read ID
E rase
suspend
read
array
Erase
suspend
read
status
Erase busy
Erase
suspend
Erase suspend read
array
Erase suspend read array
ES read
array
Erase busy
ES
read
array
Prog.
setup
ES
read
array
1
ID
Read
ID
Erase suspend read array
ES read
array
Erase suspend read array
Lock
Erase
suspend
read
query
Erase
suspend
read ID
Erase
suspend
read
array
Erase
suspend
read
status
Erase busy
Erase suspend read
array
Erase suspend read array
ES read
array
Erase busy
ES
read
array
Prog.
setup
Erase suspend read array
2 Meg x 16 Page Flash 128K x 16 SRAM Combo Memory
MT28C3212P2FL_2.p65 – Rev. 2, Pub. 4/02
19
ES
read
array
1
CFI
Present state
of the other
partition
70
Setup
71
Busy
72
Idle
73
Prog.
suspend
74
Setup
75
Busy
76
Idle
77
Prog.
suspend
78
Setup
79
Busy
80
Idle
81
Prog.
suspend
82
Setup
83
Busy
84
Idle
85
Prog.
suspend
Read
Erase suspend read array
ES read
array
FLASH
Table 7
Command State Machine Transition Table
Read
query
Micron Technology, Inc., reserves the right to change products or specifications without notice.
©2002, Micron Technology, Inc.
PROGRAMMING OPERATIONS
plished only by blocks; data at single address locations
within the array cannot be erased individually. The
block to be erased is selected by using any valid address within that block. Block erasure is initiated by a
command sequence to the CSM: BLOCK ERASE setup
(20h) followed by BLOCK ERASE CONFIRM (D0h) (see
Table 5). A two-command erase sequence protects
against accidental erasure of memory contents.
When the BLOCK ERASE CONFIRM command is
complete, the WSM automatically executes a sequence
of events to complete the block erasure. During this
sequence, the block is programmed with logic 0s, data
is verified, all bits in the block are erased, and finally
verification is performed to ensure that all bits are correctly erased. Monitoring of the ERASE operation is
possible through the status register (see the Status
Register section).
During the execution of an ERASE operation, the
ERASE SUSPEND command (B0h) can be entered to
direct the WSM to suspend the ERASE operation. Once
the WSM has reached the suspend state, it allows the
CSM to respond only to the READ ARRAY, READ STATUS REGISTER, READ QUERY, READ CHIP PROTECTION CONFIGURATION, PROGRAM SETUP, PROGRAM RESUME, ERASE RESUME and LOCK SETUP
(see the Block Locking section). During the ERASE SUSPEND operation, array data must be read from a block
other than the one being erased. To resume the ERASE
operation, an ERASE RESUME command (D0h) must
be issued to cause the CSM to clear the suspend state
previously set (see Figure 7). It is also possible that an
ERASE in any bank can be suspended and a WRITE to
another block in the same bank can be initiated. After
the completion of a WRITE, an ERASE can be resumed
by writing an ERASE RESUME command.
There are two CSM commands for programming:
PROGRAM SETUP and ALTERNATE PROGRAM SETUP
(see Table 4).
After the desired command code is entered (10h or
40h command code on DQ0–DQ7), the WSM takes over
and correctly sequences the device to complete the
PROGRAM operation. The WRITE operation may be
monitored through the status register (see the Status
Register section). During this time, the CSM only responds to a PROGRAM SUSPEND command until the
PROGRAM operation has been completed, after which
time all commands to the CSM become valid again.
The PROGRAM operation can be suspended by issuing
a PROGRAM SUSPEND command (B0h). Once the WSM
reaches the suspend state, it allows the CSM to respond only to READ ARRAY, READ STATUS REGISTER,
READ PROTECTION CONFIGURATION, READ QUERY,
PROGRAM SETUP, or PROGRAM RESUME. During the
PROGRAM SUSPEND operation, array data should be
read from an address other than the one being programmed. To resume the PROGRAM operation, a PROGRAM RESUME command (D0h) must be issued to
cause the CSM to clear the suspend state previously
set (see Figure 4 for programming operation and Figure
5 for program suspend and program resume).
Taking F_RP# to VIL during programming aborts the
PROGRAM operation.
ERASE OPERATIONS
An ERASE operation must be used to initialize all
bits in an array block to “1s.” After BLOCK ERASE confirm is issued, the CSM responds only to an ERASE
SUSPEND command until the WSM completes its task.
Block erasure inside the memory array sets all bits
within the address block to logic 1s. Erase is accom-
Table 8
Bus Operations
MODE
F_RP#
F_CE#
F_OE#
F_WE#
VIH
VIL
VIL
VIH
X
DOUT
Standby
VIH
VIH
X
X
X
High-Z
Output Disable
VIH
VIH
X
X
X
High-Z
Reset
VIL
X
X
X
X
High-Z
Write
VIH
VIL
VIH
VIL
X
DIN
Read (array, status registers,
device identification register, or
query)
2 Meg x 16 Page Flash 128K x 16 SRAM Combo Memory
MT28C3212P2FL_2.p65 – Rev. 2, Pub. 4/02
20
ADDRESS DQ0–DQ15
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FLASH
2 MEG x 16 PAGE FLASH
128K x 16 SRAM COMBO MEMORY
Table 9
Status Register Bit Definition
WSMS
ESS
ES
PS
VPPS
PSS
BLS
R
7
6
5
4
3
2
1
0
STATUS
BIT # STATUS REGISTER BIT
DESCRIPTION
SR7
WRITE STATE MACHINE STATUS (WSMS) Check write state machine bit first to determine word
1 = Ready
program or block erase completion, before checking
0 = Busy
program or erase status bits.
SR6
ERASE SUSPEND STATUS (ESS)
1 = BLOCK ERASE Suspended
0 = BLOCK ERASE in
Progress/Completed
When ERASE SUSPEND is issued, WSM halts execution and
sets both WSMS and ESS bits to “1.” ESS bit remains set to
“1” until an ERASE RESUME command is issued.
SR5
ERASE STATUS (ES)
1 = Error in Block Erasure
0 = Successful BLOCK ERASE
When this bit is set to “1,” WSM has applied the maximum
number of erase pulses to the block and is still unable to
verify successful block erasure.
SR4
PROGRAM STATUS (PS)
1 = Error in PROGRAM
0 = Successful PROGRAM
When this bit is set to “1,” WSM has attempted but failed to
program a word.
SR3
VPP STATUS (VPPS)
1 = VPP Low Detect, Operation Abort
0 = VPP = OK
The VPP status bit does not provide continuous indication
of the VPP level. The WSM interrogates the VPP level only
after the program or erase command sequences have been
entered and informs the system if VPP has not been switched
on. The VPP level is also checked before the PROGRAM/ERASE
operation is verified by the WSM. The MT28C3212P2NFL
device allows PROGRAM or ERASE at 0V, in which case SR3 is
held at “0.”
SR2
PROGRAM SUSPEND STATUS (PSS)
1 = PROGRAM Suspended
0 = PROGRAM in Progress/Completed
When PROGRAM SUSPEND is issued, WSM halts execution
and sets both WSM and PSS bits to “1.” PSS bit remains set to
“1” until a PROGRAM RESUME command is issued.
SR1
BLOCK LOCK STATUS (BLS)
1 = PROGRAM/ERASE Attempted on a
Locked Block; Operation Aborted
0 = No Operation to Locked Blocks
If a PROGRAM or ERASE operation is attempted to one of
the locked blocks, this is set by the WSM. The operation
specified is aborted, and the device is returned to read status
mode.
SR0
RESERVED FOR FUTURE
ENHANCEMENT
This bit is reserved for future.
2 Meg x 16 Page Flash 128K x 16 SRAM Combo Memory
MT28C3212P2FL_2.p65 – Rev. 2, Pub. 4/02
21
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FLASH
2 MEG x 16 PAGE FLASH
128K x 16 SRAM COMBO MEMORY
Figure 4
Automated Word Programming
Flowchart
BUS
OPERATION COMMAND COMMENTS
WRITE
WRITE
PROGRAM
SETUP
Data =
Addr =
40h or 10h
Address of word to be
programmed
WRITE
WRITE
DATA
Data =
Word to be
programmed
Address of word to be
programmed
Start
Issue PROGRAM SETUP
Command and
Word Address
Addr =
READ
Status register data;
toggle OE# or CE# to update
status register.
Standby
Check SR7
1 = Ready, 0 = Busy
Issue Word Address
and Word Data
PROGRAM
SUSPEND Loop
Read Status Register
Bits
Repeat for subsequent words.
Write FFh after the last word programming operation
to reset the device to read array mode.
NO
NO
PROGRAM
SUSPEND?
SR7 = 1?
YES
YES
Full Status Register
Check (optional)1
Word Program
Completed
BUS
OPERATION COMMAND COMMENTS
FULL STATUS REGISTER CHECK FLOW
Read Status Register
Bits
SR1 = 0?
NO PROGRAM Attempted
on a Locked Block
YES
NO
SR3 = 0?
Standby
Check SR1
1 = Detect locked block
Standby
Check SR32
1 = Detect VPP low
Standby
Check SR43
1 = Word program error
VPP Range Error
YES
NO
SR4 = 0?
Word Program Failed
YES
Word Program Passed
NOTE: 1. Full status register check can be done after each word or after a sequence of words.
2. SR3 must be cleared before attempting additional PROGRAM/ERASE operations.
3. SR4 is cleared only by the CLEAR STATUS REGISTER command, but it does not prevent additional program operation
attempts.
2 Meg x 16 Page Flash 128K x 16 SRAM Combo Memory
MT28C3212P2FL_2.p65 – Rev. 2, Pub. 4/02
22
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FLASH
2 MEG x 16 PAGE FLASH
128K x 16 SRAM COMBO MEMORY
Figure 5
PROGRAM SUSPEND/
PROGRAM RESUME Flowchart
BUS
OPERATION COMMAND COMMENTS
WRITE
Start
Issue PROGRAM
SUSPEND Command
Status register data;
toggle OE# or CE# to update
status register.
Standby
Check SR7
1 = Ready
Standby
Check SR2
1 = Suspended
READ
MEMORY
READ
WRITE
NO
SR7 = 1?
Data = B0h
READ
WRITE
Read Status Register
Bits
PROGRAM
SUSPEND
Data = FFh
Read data from block other
than that being programmed.
PROGRAM
RESUME
Data = D0h
YES
NO
SR2 = 1?
PROGRAM
Complete
YES
Issue READ ARRAY
Command
Finished
Reading
?
NO
YES
Issue PROGRAM
RESUME Command
PROGRAM Resumed
2 Meg x 16 Page Flash 128K x 16 SRAM Combo Memory
MT28C3212P2FL_2.p65 – Rev. 2, Pub. 4/02
23
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FLASH
2 MEG x 16 PAGE FLASH
128K x 16 SRAM COMBO MEMORY
Figure 6
BLOCK ERASE Flowchart
BUS
OPERATION COMMAND COMMENTS
WRITE
WRITE
ERASE
SETUP
Data = 20h
Block Addr = Address
within block to be erased
WRITE
ERASE
Data = D0h
Block Addr = Address
within block to be erased
Start
Issue ERASE SETUP
Command and
Block Address
Issue BLOCK ERASE
CONFIRM Command
and Block Address
ERASE
SUSPEND Loop
Read Status Register
Bits
READ
Status register data;
toggle OE# or CE# to
update status register.
Standby
Check SR7
1 = Ready, 0 = Busy
Repeat for subsequent blocks.
Write FFh after the last BLOCK ERASE operation to
reset the device to read array mode.
NO
NO
ERASE
SUSPEND?
SR 7 = 1?
YES
YES
Full Status Register
Check (optional)1
BLOCK ERASE
Completed
BUS
OPERATION COMMAND COMMENTS
FULL STATUS REGISTER CHECK FLOW
Read Status Register
Bits
NO
SR1 = 0?
NO
Check SR1
1 = Detect locked block
Standby
Check SR32
1 = Detect VPP block
Standby
Check SR4 and SR5
1 = BLOCK ERASE
command error
Standby
Check SR53
1 = BLOCK ERASE error
ERASE Attempted
on a Locked Block
YES
SR3 = 0?
Standby
VPP Range Error
YES
NO
SR5 = 0?
BLOCK ERASE Failed
YES
BLOCK ERASE Passed
NOTE: 1. Full status register check can be done after each block or after a sequence of blocks.
2. SR3 must be cleared before attempting additional PROGRAM/ERASE operations.
3. SR5 is cleared only by the CLEAR STATUS REGISTER command in cases where multiple blocks are erased before full
status is checked.
2 Meg x 16 Page Flash 128K x 16 SRAM Combo Memory
MT28C3212P2FL_2.p65 – Rev. 2, Pub. 4/02
24
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FLASH
2 MEG x 16 PAGE FLASH
128K x 16 SRAM COMBO MEMORY
Figure 7
ERASE SUSPEND/ERASE RESUME
Flowchart
BUS
OPERATION COMMAND COMMENTS
WRITE
Start
Issue ERASE
SUSPEND Command
Read Status Register
Bits
ERASE
SUSPEND
Data = B0h
READ
Status register data;
toggle OE# or CE# to
update status register.
Standby
Check SR7
1 = Ready
Standby
Check SR6
1 = Suspended
WRITE
READ
MEMORY
READ
Data = FFh
Read data from block
other than that being
erased.
NO
SR7 = 1?
WRITE
ERASE
RESUME
YES
Data = D0h
NO
SR6 = 1?
YES
READ or
PROGRAM?
ERASE
Complete
PROGRAM
READ
Issue READ ARRAY
Command
PROGRAM
Loop
(Note 1)
NO
READ or
PROGRAM
Complete?
YES
Issue ERASE
RESUME Command
ERASE Continued2
NOTE: 1. See BLOCK ERASE Flowchart for complete erasure procedure.
2. See Word Programming Flowchart for complete programming procedure.
2 Meg x 16 Page Flash 128K x 16 SRAM Combo Memory
MT28C3212P2FL_2.p65 – Rev. 2, Pub. 4/02
25
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©2002, Micron Technology, Inc.
FLASH
2 MEG x 16 PAGE FLASH
128K x 16 SRAM COMBO MEMORY
2 MEG x 16 PAGE FLASH
128K x 16 SRAM COMBO MEMORY
BLOCK LOCKING
The Flash memory of the MT28C3212P2FL or
MT28C3212P2NFL device provides a flexible locking
scheme which allows each block to be individually
locked or unlocked with no latency.
The device offers two-level protection for the blocks.
The first level allows software-only control of block locking (for data which needs to be changed frequently),
while the second level requires hardware interaction
before locking can be changed (code which does not
require frequent updates).
Control pins F_WP#, DQ0, and DQ1 define the state
of a block; for example, state [001] means F_WP# = 0,
DQ0 = 0 and DQ1 = 1.
Table 10 defines all of the possible locking states.
It is possible for the device to read from one bank
while erasing/writing to another bank. Once a bank
enters the WRITE/ERASE operation, the other bank
automatically enters read array mode. For example,
during a READ CONCURRENCY operation, if a PROGRAM/ERASE command is issued in bank a, then bank
a changes to the read status mode and bank b defaults
to the read array mode. The device reads from bank b if
the latched address resides in bank b (see Figure 8).
Similarly, if a PROGRAM/ERASE command is issued in
bank b, then bank b changes to read status mode and
bank a defaults to read array mode. When returning to
bank a, the device reads program/erase status if the
latched address resides in bank a. A correct bank address must be specified to read status register after
returning from concurrent read in the other bank.
When reading the CFI area, or the chip protection
register, the possible concurrent operations are reported in Figures 9a and 9b.
NOTE: All blocks are software-locked upon completion of the power-up sequence.
LOCKED STATE
After a power-up sequence completion, or after a
reset sequence, all blocks are locked (states [001] or
[101]). This means full protection from alteration. Any
PROGRAM or ERASE operations attempted on a locked
block will return an error on bit SR1 of the status register. The status of a locked block can be changed to
unlocked or lock down using the appropriate software
commands. Writing the lock command sequence, 60h
followed by 01h, can lock an unlocked block.
Figure 8
READ-While-WRITE Concurrency
Bank a
1 - Erasing/writing to bank a
2 - Erasing in bank a can be
suspended, and a WRITE to
another block in bank a
can be initiated.
3 - After the WRITE in that block
is complete, an ERASE can
be resumed by writing an
ERASE RESUME command.
Bank b
1 - Reading bank a
1 - Erasing/writing to bank b
2 - Erasing in bank b can be
suspended, and a WRITE to
another block in bank b
can be initiated.
3 - After the WRITE in that block
is complete, an ERASE can
be resumed by writing an
ERASE RESUME command.
UNLOCKED STATE
Unlocked blocks (states [000], [100], [110]) can be
programmed or erased. All unlocked blocks return to
the locked state when the device is reset or powered
down. An unlocked block can be locked or locked down
using the appropriate software command sequence,
60h followed by D0h. (See Table 5.)
1 - Reading from bank b
LOCKED DOWN STATE
Blocks locked down (state [011]) are protected from
PROGRAM and ERASE operations, but their protection
status cannot be changed using software commands
Figure 9a
Top Boot Block Device
Reading the
CFI or Chip
Protection
Register
Figure 9b
Bottom Boot Block Device
BANK a
BANK b
READ
Not
Supported
Not
Supported
WRITE
ERASE
Not
Supported
Not
Supported
2 Meg x 16 Page Flash 128K x 16 SRAM Combo Memory
MT28C3212P2FL_2.p65 – Rev. 2, Pub. 4/02
Reading the
CFI or Chip
Protection
Register
26
BANK a
BANK b
READ
Not
Supported
Supported
WRITE
ERASE
Not
Supported
Supported
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©2002, Micron Technology, Inc.
FLASH
READ-WHILE-WRITE/ERASE
CONCURRENCY
Table 10
Block Locking State Transition
F_WP#
DQ1
DQ0
NAME
ERASE/PROGRAM
ALLOWED
LOCK
UNLOCK
LOCK
DOWN
0
0
0
Unlocked
Yes
To [001]
–
To [011]
0
0
1
Locked (Default)
No
–
To [000]
To [011]
0
1
1
Lock Down
No
–
–
–
1
0
0
Unlocked
Yes
To [101]
–
To [111]
1
0
1
Locked
No
–
To [100]
To [111]
1
1
0
Lock Down
Disabled
Yes
To [111]
–
To [111]
1
1
1
Lock Down
Disabled
No
–
To [110]
–
alone. A locked or unlocked block can be locked down
by writing the lock down command sequence, 60h followed by 2Fh. Locked down blocks revert to the locked
state when the device is reset or powered down.
The LOCK DOWN function is dependent on the
F_WP# input pin. When F_WP# = 0, blocks in lock down
[011] are protected from program, erase, and lock status changes. When F_WP# = 1, the LOCK DOWN function is disabled ([111]) and locked down blocks can be
individually unlocked by a software command to the
[110] state, where they can be erased and programmed.
These blocks can then be relocked [111] and unlocked
[110], as desired, as long as F_WP# remains HIGH.
When F_WP# goes LOW, blocks that were previously
locked down return to the lock down state [011] regard-
less of any changes made while F_WP# was HIGH. Device reset or power-down resets all locks, including
those in lock down, to the locked state (see Table 10).
READING A BLOCK’S LOCK STATUS
The lock status of every block can be read in the
read device identification mode. To enter this mode,
write 90h to the bank containing address 00h. Subsequent READs at block address +00002 will output the
lock status of that block. The lowest two output pins,
DQ0 and DQ1, represent the lock status. DQ0 indicates
the block lock/unlock status and is set by the LOCK
command and cleared by the UNLOCK command. It is
also automatically set when entering lock down. DQ1
indicates lock down status and is set by the LOCK
Table 11
Chip Protection Configuration Addressing1
ITEM
ADDRESS
DATA
Manufacturer Code (x16)
00000h
002Ch
Device Code
Top boot configuration
Bottom boot configuration
00001h
·
·
Block Lock Configuration
is unlocked
· Block
Block
is
· Block is locked
locked down
·
2
44A2h
44A3h
XX002h
Lock
DQ0 = 0
DQ0 = 1
DQ1 = 1
Chip Protection Register Lock
80h
PR Lock
Chip Protection Register 1
81h–84h
Factory Data
Chip Protection Register 2
85h–88h
User Data
NOTE: 1. Other locations within the configuration address space are reserved by
Micron for future use.
2. “XX” specifies the block address of lock configuration.
2 Meg x 16 Page Flash 128K x 16 SRAM Combo Memory
MT28C3212P2FL_2.p65 – Rev. 2, Pub. 4/02
27
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FLASH
2 MEG x 16 PAGE FLASH
128K x 16 SRAM COMBO MEMORY
DOWN command. It can only be cleared by reset or
power-down, not by software. Table 10 shows the block
locking state transition scheme. The READ ARRAY command, FFh, must be issued to the bank containing address 00h prior to issuing other commands.
The 128-bit security area is divided into two 64-bit
segments. The first 64 bits are programmed at the
manufacturing site with a unique 64-bit number. The
other segment is left blank for customers to program as
desired. (See Figure 10).
LOCKING OPERATIONS DURING ERASE
SUSPEND
Changes to block lock status can be performed during an ERASE SUSPEND by using the standard locking
command sequences to unlock, lock, or lock down. This
is useful in the case when another block needs to be
updated while an ERASE operation is in progress.
To change block locking during an ERASE operation, first write the ERASE SUSPEND command (B0h),
then check the status register until it indicates that the
ERASE operation has been suspended. Next, write the
desired lock command sequence to block lock, and the
lock status will be changed. After completing any desired LOCK, READ, or PROGRAM operations, resume
the ERASE operation with the ERASE RESUME command (D0h).
If a block is locked or locked down during an ERASE
SUSPEND on the same block, the locking status bits
are changed immediately. When the ERASE is resumed,
the ERASE operation completes.
A locking operation cannot be performed during a
PROGRAM SUSPEND.
READING THE CHIP PROTECTION REGISTER
The chip protection register is read in the device
identification mode. To enter this mode, load the 90h
command to the bank containing address 00h. Once in
this mode, READ cycles from addresses shown in Table
11 retrieve the specified information. To return to the
read array mode, write the READ ARRAY command
(FFh). The read array command, FFh, must be issued to
the bank containing address 00h prior to issuing other
commands.
PAGE READ MODE
The initial portion of the page mode cycle is the
same as the asynchronous access cycle. Holding CE#
LOW and toggling addresses A0–A1 allows random access of other words in the page.
The page size can be customized at the factory to
four or eight words as required; but if no specification is
made, the normal size is four words.
ASYNCHRONOUS READ CYCLE
When accessing addresses in a random order or
when switching between pages, the access time is given
by tAA.
When F_CE# and F_OE# are LOW, the data is placed
on the data bus and the processor can read the data.
STATUS REGISTER ERROR CHECKING
Using nested locking or program command sequences during ERASE SUSPEND can introduce ambiguity into status register results.
Following protection configuration setup (60h), an
invalid command produces a lock command error (SR4
and SR5 are set to “1”) in the status register. If a lock
command error occurs during an ERASE SUSPEND,
SR4 and SR5 are set to “1” and remain at “1” after the
ERASE SUSPEND command is issued. When the ERASE
is complete, any possible error during the ERASE cannot be detected via the status register because of the
previous locking command error.
A similar situation happens if an error occurs during
a program operation error nested within an ERASE
SUSPEND.
Figure 10
Protection Register Memory Map
88h
85h
84h
4 Words
Factory-Programmed
CHIP PROTECTION REGISTER
81h
A 128-bit protection register can be used to fullfill
the security considerations in the system (preventing
device substitution).
2 Meg x 16 Page Flash 128K x 16 SRAM Combo Memory
MT28C3212P2FL_2.p65 – Rev. 2, Pub. 4/02
4 Words
User-Programmed
80h
28
PR Lock
0
Micron Technology, Inc., reserves the right to change products or specifications without notice.
©2002, Micron Technology, Inc.
FLASH
2 MEG x 16 PAGE FLASH
128K x 16 SRAM COMBO MEMORY
2 MEG x 16 PAGE FLASH
128K x 16 SRAM COMBO MEMORY
Icc supply current is reduced by applying a logic
HIGH level on F_CE# and F_RP# to enter the standby
mode. In the standby mode, the outputs are placed in
High-Z. Applying a CMOS logic HIGH level on F_CE#
and F_RP# reduces the current to ICC2 (MAX). If the
device is deselected during an ERASE operation or during programming, the device continues to draw current until the operation is complete.
During WRITE and ERASE operations, the WSM
monitors the VPP voltage level. WRITE/ERASE operations are allowed only when VPP is within the ranges
specified in Table 12.
When VCC is below VLKO or VPP is below VPPLK, any
WRITE/ERASE operation is prevented.
DEVICE RESET
To correctly reset the device, the RST# signal must
be asserted (RST# = VIL) for a minimum of tRP. After
reset, the device can be accessed for a READ operation
with a delayed access time of tRWH from the rising edge
of RST#. The circuitry used for generating the RST#
signal needs to be common with the rest of the system
reset to ensure that correct system initialization occurs.
Please refer to the timing diagram for further details.
AUTOMATIC POWER SAVE MODE (APS)
Substantial power savings are realized during periods when the Flash array is not being read and the
device is in the active mode. During this time the device switches to the automatic power save (APS) mode.
When the device switches to this mode, ICC is reduced
to ICC2. The low level of power is maintained until another operation is initiated. In this mode, the I/O pins
retain the data from the last memory address read until a new address is read. This mode is entered automatically if no address or control pins toggle.
POWER-UP SEQUENCE
The following power-up sequence must be observed
to properly initialize the device:
• RST# must be at VIL.
• Power on VCC/VCCQ (VCC ž VCCQ at all times).
• Wait 2µS after VCC reaches VCC (MIN).
• Take RST# from VIL to VIH.
• The RST# transition from VIL to VIH must be less
than 10µS.
VPP/VCC PROGRAM AND ERASE
VOLTAGES
The MT28C3212P2FL Flash memory provides insystem programming and erase with VPP in the 0.9V–
2.2V range (VPP1). In addition to the flexible block locking, the VPP programming voltage can be held LOW for
absolute hardware write protection of all blocks in the
Flash device. When VPP is below VPPLK, any PROGRAM or
ERASE operation results in an error, prompting the corresponding status register bit (SR3) to be set.
The MT28C3212P2NFL Flash memory provides insystem programming and erase with VPP in the 0.0V–
2.2V range (VPP1).
VPP at 12V ±5% (VPP2) is supported for a maximum
of 100 cycles and 10 cumulative hours. The device
can withstand 100,000 WRITE/ERASE operations when
VPP = VCC.
2 Meg x 16 Page Flash 128K x 16 SRAM Combo Memory
MT28C3212P2FL_2.p65 – Rev. 2, Pub. 4/02
Table 12
VPP Ranges (V)
DEVICE
MT28C3212P2FL
MT28C3212P2NFL
29
IN-SYSTEM
MIN MAX
0.9
2.2
0.0
2.2
IN-FACTORY
MIN MAX
11.4
12.6
11.4
12.6
Micron Technology, Inc., reserves the right to change products or specifications without notice.
©2002, Micron Technology, Inc.
FLASH
STANDBY MODE
2 MEG x 16 PAGE FLASH
128K x 16 SRAM COMBO MEMORY
*Stresses greater than those listed under “Absolute
Maximum Ratings” may cause permanent damage to
the device. This is a stress rating only and functional
operation of the device at these or any other conditions
above those indicated in the operational sections of
this specification is not implied. Exposure to absolute
maximum rating conditions for extended periods may
affect reliability.
**Maximum DC voltage on VPP may overshoot to +13.5V
for periods <20ns.
ABSOLUTE MAXIMUM RATINGS*
Voltage to Any Pin Except VCC and VPP
with Respect to VSS ............................ -0.5V to +2.45V
VPP Voltage (for BLOCK ERASE and PROGRAM
with Respect to VSS) ....................... -0.5V to +13.5V**
VCC and VCCQ Supply Voltage
with Respect to VSS ............................ -0.3V to +2.45V
Output Short Circuit Current ............................... 100mA
Operating Temperature Range .............. -40oC to +85oC
Storage Temperature Range ................. -55oC to +125oC
Soldering Cycle ........................................... 260 oC for 10s
RECOMMENDED OPERATING CONDITIONS
PARAMETER
SYMBOL
MIN
MAX
UNITS
tA
-40
+85
oC
F_VCC, S_VCC
1.65
2.2
V
I/O supply voltage (VCC = 1.65V–1.95V)
VCCQ
1.65
1.95
V
1
I/O supply voltage (VCC = 1.80V–2.20V)
VCCQ
1.80
2.20
V
1
VPP voltage
(MT28C3212P2FL only)
VPP1
0.9
2.2
V
VPP voltage
(MT28C3212P2NFL only)
VPP1
0.0
2.2
V
VPP in-factory programming voltage
VPP2
11.4
12.6
V
S_VDR
1.0
–
V
–
100,000
Cycles
Operating temperature
VCC supply voltage
Data retention supply voltage
Block erase cycling
NOTES
2
NOTE: 1. Use only one of the two I/O supply voltage ranges, 1.65V–1.95V or 1.80V–2.20V.
2. 12V VPP is supported for a maximum of 100 cycles and may be connected for up to 10 cumulative hours.
Figure 11
Output Load Circuit
VCC
14.5K
I/O
14.5K
30pF
VSS
2 Meg x 16 Page Flash 128K x 16 SRAM Combo Memory
MT28C3212P2FL_2.p65 – Rev. 2, Pub. 4/02
30
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©2002, Micron Technology, Inc.
FLASH
FLASH ELECTRICAL SPECIFICATIONS
2 MEG x 16 PAGE FLASH
128K x 16 SRAM COMBO MEMORY
FLASH
COMBINED DC CHARACTERISTICS1
VCC = 1.65V–1.95V or
1.80V–2.20V
VCCQ = 1.65V–1.95V or
1.80V–2.20V
DESCRIPTION
CONDITIONS
SYMBOL
MIN
TYP
MAX
UNITS NOTES
Input low voltage
VIL
-0.4
–
0.4
V
Input high voltage
VIH
VCCQ 0.4V
–
VCCQ +
0.3V
V
Output low voltage
IOL = 100µA
VOL
–
–
0.10
V
Output high voltage
IOH = 100µA
VOH
VCCQ 0.1V
–
–
V
VPP lock out voltage
VPPLK
–
–
0.4
V
VPP during PROGRAM/ERASE
VPP1
0.9
–
2.2
V
operations (MT28C3212P2FL only)
VPP2
11.4
–
12.6
V
VPP during PROGRAM/ERASE
VPP1
0.0
–
2.2
V
operations (MT28C3212P2NFL only)
VPP2
11.4
–
12.6
V
VCC PROGRAM/ERASE lock voltage
VLKO
1.0
–
–
V
Input leakage current
IL
–
–
1
mA
Output leakage current
IOZ
–
–
1
mA
F_VCC asynchronous
read current at 95ns
ICC1
–
–
15
mA
F_VCC page mode
read current at 35ns
ICC2
–
–
5
mA
F_VCC plus S_VCC standby current
ICC3
–
25
60
mA
F_VCC program current
ICC4+IPP3
–
–
55
mA
F_VCC erase current
ICC5+IPP4
–
–
65
mA
F_VCC/S_VCC erase suspend current
ICC6
–
–
60
mA
F_VCC/S_VCC program suspend
current
ICC7
–
–
60
mA
Read-while-write current
ICC8
–
–
80
mA
ICC9
–
12
25
mA
S_VCC read/write operating
supply current – page access
mode
VIN = VIH or VIL
chip enabled, IOL = 0
2
2
3
NOTE: 1. All currents are in RMS unless otherwise noted.
2. 12V VPP is supported for a maximum of 100 cycles and may be connected for up to 10 cumulative hours.
3. Operating current is a linear function of operating frequency and voltage. Operating current can be calculated using
the formula shown with operating frequency (f) expressed in MHz and operating voltage (V) in volts.
Example: When operating at 2 MHz at 2V, the device will draw a typical active current of 0.8*2* = 3.2mA in the page
access mode. This parameter is specified with the outputs disabled to avoid external loading effects. The user must
add current required to drive output capacitance expected in the actual system.
(continued on the next page)
2 Meg x 16 Page Flash 128K x 16 SRAM Combo Memory
MT28C3212P2FL_2.p65 – Rev. 2, Pub. 4/02
31
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©2002, Micron Technology, Inc.
2 MEG x 16 PAGE FLASH
128K x 16 SRAM COMBO MEMORY
FLASH
COMBINED DC CHARACTERISTICS1 (continued)
VCC = 1.65V–1.95V or
1.80V–2.20V
VCCQ = 1.65V–1.95V or
1.80V–2.20V
DESCRIPTION
S_VCC read/write operating
supply current – word access
mode
VPP read current
CONDITIONS
SYMBOL
MIN
TYP
MAX
VIN = VIH or VIL
chip enabled, IOL = 0
ICC10
–
3
8
mA
VPP ≤ VCC
IPP1
–
–
1
mA
–
–
200
mA
–
–
1
mA
–
–
200
mA
–
–
1
mA
–
–
200
mA
–
–
1
mA
–
–
200
mA
VPP ³ VCC
VPP standby current
VPP ≤ VCC
VPP erase suspend current
VPP = VPP1
IPP2
VPP ³ VCC
IPP5
VPP = VPP2
VPP program suspend current
VPP = VPP1
IPP6
VPP = VPP2
UNITS NOTES
3
NOTE: 1. All currents are in RMS unless otherwise noted.
2. 12V VPP is supported for a maximum of 100 cycles and may be connected for up to 10 cumulative hours.
3. Operating current is a linear function of operating frequency and voltage. Operating current can be calculated using
the formula shown with operating frequency (f) expressed in MHz and operating voltage (V) in volts.
Example: When operating at 2 MHz at 2V, the device will draw a typical active current of 0.8*2* = 3.2mA in the page
access mode. This parameter is specified with the outputs disabled to avoid external loading effects. The user must
add current required to drive output capacitance expected in the actual system.
2 Meg x 16 Page Flash 128K x 16 SRAM Combo Memory
MT28C3212P2FL_2.p65 – Rev. 2, Pub. 4/02
32
Micron Technology, Inc., reserves the right to change products or specifications without notice.
©2002, Micron Technology, Inc.
2 MEG x 16 PAGE FLASH
128K x 16 SRAM COMBO MEMORY
FLASH
FLASH READ CYCLE TIMING REQUIREMENT
VCC = 1.65V–1.95V
PARAMETER
Address to output delay
CE# LOW to output delay
Page address access
OE# LOW to output delay
F_RP# HIGH to output delay
F_RP# LOW pulse width
CE# or OE# HIGH to output High-Z
Output hold from address, CE# or OE# change
READ cycle time
SYMBOL
tAA
tACE
tAPA
tAOE
tRWH
tRP
tOD
tOH
tRC
-10
VCC = 1.65V–1.95V
MIN
MAX
100
100
35
30
200
125
25
0
100
-11
VCC = 1.65V–1.95V
MIN
MAX
110
110
45
30
200
125
25
0
110
UNITS
ns
ns
ns
ns
ns
ns
ns
ns
ns
-10
VCC = 1.80V–2.20V
MIN
MAX
95
95
35
30
150
100
25
0
95
-11
VCC = 1.80V–2.20V
MIN
MAX
100
100
45
30
150
100
25
0
100
UNITS
ns
ns
ns
ns
ns
ns
ns
ns
ns
FLASH READ CYCLE TIMING REQUIREMENT
VCC = 1.80V–2.20V
PARAMETER
Address to output delay
CE# LOW to output delay
Page address access
OE# LOW to output delay
F_RP# HIGH to output delay
F_RP# LOW pulse width
CE# or OE# HIGH to output High-Z
Output hold from address, CE# or OE# change
READ cycle time
2 Meg x 16 Page Flash 128K x 16 SRAM Combo Memory
MT28C3212P2FL_2.p65 – Rev. 2, Pub. 4/02
SYMBOL
tAA
tACE
tAPA
tAOE
tRWH
tRP
tOD
tOH
tRC
33
Micron Technology, Inc., reserves the right to change products or specifications without notice.
©2002, Micron Technology, Inc.
2 MEG x 16 PAGE FLASH
128K x 16 SRAM COMBO MEMORY
FLASH
FLASH WRITE CYCLE TIMING REQUIREMENTS
-10/-11
VCC = 1.65V–1.95V or
1.80V–2.20V
PARAMETER
Reset HIGH recovery to WE# going LOW
CE# setup to WE# going LOW
Write pulse width
Data setup to WE# going HIGH
Address setup to WE# going HIGH
CE# hold from WE# HIGH
Data hold from WE# HIGH
Address hold from WE# HIGH
Write pulse width HIGH
WP# setup to WE# going HIGH
VPP setup to WE# going HIGH
Write recovery before READ
WP# hold from valid SRD
VPP hold from valid SRD
WE# HIGH to data valid
SYMBOL
tRS
tCS
tWP
tDS
tAS
tCH
tDH
tAH
tWPH
tRHS
tVPS
tWOS
tRHH
tVPH
tWB
MIN
150
0
50
50
50
0
0
9
30
200
200
50
0
0
MAX
tAA+50
UNITS
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
FLASH ERASE AND PROGRAM CYCLE TIMING REQUIREMENTS
-10/-11
VCC = 1.65V–1.95V or
1.80V–2.20V
PARAMETER
4KW parameter block program time
32KW parameter block program time
Word program time
4KW parameter block erase time
32KW parameter block erase time
Program suspend latency
Erase suspend latency
2 Meg x 16 Page Flash 128K x 16 SRAM Combo Memory
MT28C3212P2FL_2.p65 – Rev. 2, Pub. 4/02
TYP
0.1
0.8
8
1
1.5
5
5
34
MAX
0.3
2.4
185
4
5
10
20
UNITS
s
s
µs
s
s
µs
µs
Micron Technology, Inc., reserves the right to change products or specifications without notice.
©2002, Micron Technology, Inc.
2 MEG x 16 PAGE FLASH
128K x 16 SRAM COMBO MEMORY
A0–A20
FLASH
TWO-CYCLE PROGRAMMING/ERASE OPERATION
VIH
VALID ADDRESS
VALID ADDRESS
VIL
tAS
VALID ADDRESS
tAH
VIH
CE#
VIL
tCS
tWOS
tCH
VIH
OE#
VIL
tWPH
VIH
WE#
VIL
VOH
DQ0–DQ15
High-Z
VOL
CMD/
DATA
CMD
tRS
STATUS
tDS
tDH
VIH
RP#
tWB
tWP
VIL
tRHS
tRHH
tVPS
tVPPH
VIH
WP#
VIL
VIPPH
VIPPLK
VPP
VIL
UNDEFINED
WRITE TIMING PARAMETERS
-10/-11
VCC = 1.65V–1.95V or
1.80V–2.20V
SYMBOL
tRS
MIN
150
MAX
-10/-11
VCC = 1.65V–1.95V or
1.80V–2.20V
SYMBOL
tAH
UNITS
ns
0
50
50
ns
ns
ns
tRHS
ns
ns
tRHH
tCH
50
0
tDH
0
ns
tWB
tCS
tWP
tDS
tAS
tVPS
tWOS
tVPH
9
MIN
MAX
UNITS
ns
200
200
ns
ns
50
0
0
ns
ns
ns
tAA+50
ns
NOTE: 1. The WRITE cycles for the WORD PROGRAMMING command are followed by a READ ARRAY DATA cycle.
2 Meg x 16 Page Flash 128K x 16 SRAM Combo Memory
MT28C3212P2FL_2.p65 – Rev. 2, Pub. 4/02
35
Micron Technology, Inc., reserves the right to change products or specifications without notice.
©2002, Micron Technology, Inc.
2 MEG x 16 PAGE FLASH
128K x 16 SRAM COMBO MEMORY
A0–A20
FLASH
SINGLE ASYNCHRONOUS READ OPERATION
VIH
VALID ADDRESS
VIL
tRC
tAA
tOD
VIH
CE#
VIL
tACE
VIH
OE#
VIL
tOH
VIH
WE#
VIL
tAOE
VOH
DQ0–DQ15
RP#
High-Z
VALID OUTPUT
VOL
tRWH
VIH
VIL
UNDEFINED
READ TIMING PARAMETERS
(VCC = 1.65V–1.95V)
READ TIMING PARAMETERS
(VCC = 1.80V–2.20V)
-10
-11
VCC = 1.65V–1.95V VCC = 1.65V–1.95V
SYMBOL
tAA
MIN
tACE
tAOE
tRWH
MAX
100
MAX
110
UNITS
ns
100
30
200
110
30
200
ns
ns
ns
tACE
25
25
ns
ns
tOD
ns
tRC
tOD
tOH
tRC
0
MIN
-10
-11
VCC = 1.80V–2.20V VCC = 1.80V–2.20V
0
100
2 Meg x 16 Page Flash 128K x 16 SRAM Combo Memory
MT28C3212P2FL_2.p65 – Rev. 2, Pub. 4/02
110
SYMBOL
tAA
MIN
tRWH
36
MIN
95
30
150
tAOE
tOH
MAX
95
25
0
MAX
100
UNITS
ns
100
30
150
ns
ns
ns
25
ns
ns
100
ns
0
95
Micron Technology, Inc., reserves the right to change products or specifications without notice.
©2002, Micron Technology, Inc.
2 MEG x 16 PAGE FLASH
128K x 16 SRAM COMBO MEMORY
FLASH
ASYNCHRONOUS PAGE MODE READ OPERATION
VIH
A2–A20
VALID ADDRESS
VIL
VIH
A0–A1
VALID
ADDRESS
VALID ADDRESS
VIL
VALID
ADDRESS
VALID
ADDRESS
tAA
tOD
VIH
F_CE#
VIL
tACE
VIH
F_OE#
VIL
VIH
F_WE#
VIL
tAOE
VOH
DQ0–DQ15
tAPA
VALID
OUTPUT
High-Z
VOL
VALID
OUTPUT
tOH
VALID
OUTPUT
VALID
OUTPUT
tRMH
VIH
F_RP#
VIL
UNDEFINED
READ TIMING PARAMETERS
(VCC = 1.65V–1.95V)
READ TIMING PARAMETERS
(VCC = 1.80V–2.20V)
-10
SYMBOL
tAA
tACE
tAPA
tAOE
tRWH
tOD
tOH
-11
-10
VCC = 1.65V–1.95V VCC = 1.65V–1.95V
MIN
MAX
MIN
MAX
UNITS
100
110
ns
SYMBOL
tAA
100
35
110
45
ns
ns
tACE
30
200
25
30
200
25
ns
ns
ns
tAOE
ns
tOH
0
2 Meg x 16 Page Flash 128K x 16 SRAM Combo Memory
MT28C3212P2FL_2.p65 – Rev. 2, Pub. 4/02
0
tAPA
tRWH
tOD
37
-11
VCC = 1.80V–2.20V VCC = 1.80V–2.20V
MIN
MAX
MIN
MAX
UNITS
95
100
ns
0
95
35
100
45
ns
ns
30
150
25
30
150
25
ns
ns
ns
0
ns
Micron Technology, Inc., reserves the right to change products or specifications without notice.
©2002, Micron Technology, Inc.
2 MEG x 16 PAGE FLASH
128K x 16 SRAM COMBO MEMORY
F_CE#
FLASH
RESET OPERATION
VIH
VIL
F_RST#
VIH
VIL
tRP
F_OE#
VIH
VIL
DQ0–DQ15
VOH
VOL
tRWH
READ TIMING PARAMETERS
(VCC = 1.65V–1.95V)
SYMBOL
tRWH
tRP
READ TIMING PARAMETERS
(VCC = 1.80V–2.20V)
-10
-11
VCC = 1.65V–1.95V VCC = 1.65V–1.95V
MIN
MAX
MIN
MAX
UNITS
200
200
ns
125
125
ns
2 Meg x 16 Page Flash 128K x 16 SRAM Combo Memory
MT28C3212P2FL_2.p65 – Rev. 2, Pub. 4/02
SYMBOL
tRWH
tRP
38
-10
-11
VCC = 1.80V–2.20V VCC = 1.80V–2.20V
MIN
MAX
MIN
MAX
UNITS
150
150
ns
100
100
ns
Micron Technology, Inc., reserves the right to change products or specifications without notice.
©2002, Micron Technology, Inc.
Table 15
CFI
OFFSET
DATA
DESCRIPTION
00
2Ch
Manufacturer Code
01
A2h
Top Boot Block Device Code
A3h
Bottom Boot Block Device Code
02–0F
reserved
10, 11
0051,0052
12
0059
13, 14
0003, 0000
Primary OEM Command Set
15, 16
0039, 0000
Address for Primary Extended Table
17, 18
0000, 0000
Alternate OEM Command Set
19, 1A
0000, 0000
Address for OEM Extended Table
1B
0017
Reserved
“QR”
“Y”
VCC MIN for Erase/Write; Bit7–Bit4 Volts in BCD; Bit3–Bit0 100mV in BCD
1C
0022
VCC MAX for Erase/Write; Bit7–Bit4 Volts in BCD; Bit3–Bit0 100mV in BCD
1D
00B4
VPP MIN for Erase/Write; Bit7–Bit4 Volts in Hex; Bit3–Bit0 100mV in BCD
1E
00C6
VPP MAX for Erase/Write; Bit7–Bit4 Volts in Hex; Bit3–Bit0 100mV in BCD
1F
0003
Typical timeout for single byte/word program, 2n µs, 0000 = not supported
20
0000
Typical timeout for maximum size multiple byte/word program, 2n µs, 0000 = not
supported
21
0009
Typical timeout for individual block erase, 2n ms, 0000 = not supported
22
0000
Typical timeout for full chip erase, 2n ms, 0000 = not supported
23
000C
Maximum timeout for single byte/word program, 2n µs, 0000 = not supported
24
0000
Maximum timeout for maximum size multiple byte/word program, 2n µs, 0000 = not
supported
25
0003
Maximum timeout for individual block erase, 2n ms, 0000 = not supported
26
0000
Maximum timeout for full chip erase, 2n ms, 0000 = not supported
27
0016
Device size, 2n bytes
28
0001
Bus Interface x8 = 0, x16 = 1, x8/x16 = 2
29
0000
Flash device interface description 0000 = async
2A, 2B
0000, 0000
2C
0003
2D, 2E
0037, 0000
Top boot block device erase block region information 1, 8 blocks …
0007, 0000
Bottom boot block device erase block region information 1, 8 blocks …
0000, 0001
Top boot block device ...of 8KB
0020, 0000
Bottom boot block device ...of 8KB
31, 32
0006, 0000
7 blocks of …
33, 34
0000, 0001
……64KB
2F, 30
35, 36
Maximum number of bytes in multi-byte program or page, 2n
Number of erase block regions within device (4K words and 32K words)
0007, 0000
Top boot block device 56 blocks of
0037, 0000
Bottom boot block device 56 blocks of
(continued on the next page)
2 Meg x 16 Page Flash 128K x 16 SRAM Combo Memory
MT28C3212P2FL_2.p65 – Rev. 2, Pub. 4/02
39
Micron Technology, Inc., reserves the right to change products or specifications without notice.
©2002, Micron Technology, Inc.
FLASH
2 MEG x 16 PAGE FLASH
128K x 16 SRAM COMBO MEMORY
Table 15
CFI (continued)
OFFSET
DATA
DESCRIPTION
37, 38
0020, 0000
Top boot block device……64KB
0000, 0001
Bottom boot block device……64KB
39, 3A
0050, 0052
“PR”
3B
0049
“I”
3C
0030
Major version number, ASCII
3D
0031
Minor Version Number, ASCII
3E
3F
40
41
00E6
0002
0000
0000
Optional Feature and Command Support
Bit 0 Chip erase supported no = 0
Bit 1 Suspend erase supported = yes = 1
Bit 2 Suspend program supported = yes = 1
Bit 3 Chip lock/unlock supported = no = 0
Bit 4 Queued erase supported = no = 0
Bit 5 Instant individual block locking supported = yes = 1
Bit 6 Protection bits supported = yes = 1
Bit 7 Page mode read supported = yes = 1
Bit 8 Synchronous read supported = yes = 1
Bit 9 Simultaneous operation supported = yes = 1
42
0001
Program supported after erase suspend = yes
43, 44
0003, 0000
45
0018
46
00C0
VPP supply optimum; Bit7–Bit4 Volts in Hex; Bit3–Bit0 100mV in BCD
47
0001
Number of protection register fields in JEDEC ID space
48, 49
0080, 0000
Lock bytes LOW address, lock bytes HIGH address
4A, 4B
0003, 0003
2n factory programmed bytes, 2n user programmable bytes
4C
0002
Background Operation
0000 = Not used
0001 = 4% block split
0002 = 12% block split
0003 = 25% block split
0004 = 50% block split
4D
0000
Burst
0000
00x1
00x2
00x3
001x
002x
004x
Mode Type
= No burst mode
= 4 words max
= 8 words max
= 16 words max
= Linear burst, and/or
= Interleaved burst, and/or
= Continuous burst
4E
0002
Page
0000
0001
0002
0003
0004
Mode Type
= No page mode
= 4-word page
= 8-word page
= 16-word page
= 32-word page
4F
0002
SRAM density, 2Mb (128K x 16)
Bit 0 Block Lock Status active = yes; Bit 1 Block Lock Down active = yes
VCC supply optimum; Bit7–Bit4 Volts in BCD; Bit3–Bit0 100mV in BCD
2 Meg x 16 Page Flash 128K x 16 SRAM Combo Memory
MT28C3212P2FL_2.p65 – Rev. 2, Pub. 4/02
40
Micron Technology, Inc., reserves the right to change products or specifications without notice.
©2002, Micron Technology, Inc.
FLASH
2 MEG x 16 PAGE FLASH
128K x 16 SRAM COMBO MEMORY
2 MEG x 16 PAGE FLASH
128K x 16 SRAM COMBO MEMORY
SRAM OPERATING MODES
SRAM READ ARRAY
The operational state of the SRAM is determined by
S_CE1#, S_CE2, S_WE#, S_OE#, S_UB#, and S_LB#, as
indicated in the Truth Table. To perform an SRAM
READ operation, S_CE1#, and S_OE#, must be at VIL,
and S_CE2 and S_WE# must be at VIH. When in this
state, S_UB# and S_LB# control whether the lower byte
is read (S_UB# VIH, S_LB# VIL), the upper byte is read
(S_UB# VIL, S_LB# VIH), both upper and lower bytes are
read (S_UB# VIL, S_LB# VIL), or neither are read (S_UB#
VIH, S_LB# VIH) and the device is in a standby state.
While performing an SRAM READ operation, current consumption may be reduced by reading within a
16-word page. This is done by holding S_CE1# and
SRAM WRITE ARRAY
In order to perform an SRAM WRITE operation,
S_CE1# and S_WE# must be at VIL, and S_CE2 and
S_OE# must be at VIH. When in this state, S_UB# and
S_LB# control whether the lower byte is written (S_UB#
VIH, S_LB# VIL), the upper byte is written (S_UB# VIL,
S_LB# VIH), both upper and lower bytes are written
(S_UB# VIL, S_LB# VIL), or neither are written (S_UB#
VIH, S_LB# VIH) and the device is in a standby state.
SRAM FUNCTIONAL BLOCK DIAGRAM
A0–A3
WORD
ADDRESS
DECODE
LOGIC
A4–A16
PAGE
ADDRESS
DECODE
LOGIC
S_CE1#
S_CE2
S_WE#
S_OE#
S_UB#
S_LB#
2 Meg x 16 Page Flash 128K x 16 SRAM Combo Memory
MT28C3212P2FL_2.p65 – Rev. 2, Pub. 4/02
8K-PAGE
x16 WORD
x16 BIT
RAM ARRAY
WORD
MUX
INPUT/
OUTPUT
MUX
AND
BUFFERS
DQ0–DQ7
DQ8–DQ15
CONTROL
LOGIC
41
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©2002, Micron Technology, Inc.
SRAM
S_OE# at VIL, S_WE# and S_CE2 at VIH, and toggling
addresses A0-A3. S_UB# and S_LB# control the data
width as described above.
2 MEG x 16 PAGE FLASH
128K x 16 SRAM COMBO MEMORY
TIMING TEST CONDITIONS
Input pulse levels .................... 0.1V VCC to 0.9V VCC
Input rise and fall times .................................... 5ns
Input timing reference levels ......................... 0.5V
Output timing reference levels ..................... 0.5V
SRAM
Operating Temperature ............... -40oC to +85oC
SRAM READ CYCLE TIMING
DESCRIPTION
Read cycle time
Address access time
Chip enable to valid output
Output enable to valid output
Byte select to valid output
Chip enable to Low-Z output
Output enable to Low-Z output
Byte select to Low-Z output
Chip enable to High-Z output
Output disable to High-Z output
Byte select disable to High-Z output
Output hold from address change
-10/-11
VCC = 1.65V–1.95V VCC = 1.80V–2.20V
SYMBOL
MIN
MAX
MIN
MAX
t RC
100
85
t AA
100
85
t CO
100
85
t OE
35
35
tLB, tUB
100
85
t LZ
0
0
t OLZ
0
0
tLBZ, tUBZ
0
0
t HZ
0
15
0
15
t OHZ
0
15
0
15
tLBHZ, tUBHZ
0
15
0
15
t OH
5
5
UNITS
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
-10/-11
VCC = 1.65V–1.95V VCC = 1.80V–2.20V
MIN
MAX
MIN
MAX
100
85
100
85
100
85
100
85
0
0
50
50
0
0
0
15
0
15
50
50
0
0
0
0
UNITS
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
SRAM WRITE CYCLE TIMING
DESCRIPTION
Write cycle time
Chip enable to end of write
Address valid to end of write
Byte select to end of write
Address setup time
Write pulse width
Write recovery time
Write to High-Z output
Data to write time overlap
Data hold from write time
End write to Low-Z output
2 Meg x 16 Page Flash 128K x 16 SRAM Combo Memory
MT28C3212P2FL_2.p65 – Rev. 2, Pub. 4/02
SYMBOL
t WC
t CW
t AW
tLBW, tUBW
t AS
t WP
t WR
t WHZ
t DW
t DH
t OW
42
Micron Technology, Inc., reserves the right to change products or specifications without notice.
©2002, Micron Technology, Inc.
2 MEG x 16 PAGE FLASH
128K x 16 SRAM COMBO MEMORY
READ CYCLE 1
(S_CE1# = S_OE# = VIL; S_CE2, S_WE# = VIH)
tRC
ADDRESS
SRAM
tAA
tOH
DATA-OUT
PREVIOUS
DATA VALID
DATA VALID
READ CYCLE 2
(S_WE# = VIH)
tRC
ADDRESS
tAA
tHZ (1, 2)
S_CE1#
tCO
S_CE2
tLZ(2)
tOE
tOHZ (1)
S_OE#
tOLZ
tLB, tUB
S_LB#, S_UB#
tLBHZ, tUBHZ
tLBLZ, tUBLZ
DATA-OUT
DATA VALID
High-Z
DON’T CARE
READ TIMING PARAMETERS
-10/-11
VCC = 1.65V–1.95V VCC = 1.80V–2.20V
SYMBOL
tRC
MIN
tAA
tCO
tOE
tLB, tUB
tLZ
MAX
100
MAX
85
UNITS
ns
100
100
85
85
ns
ns
tHZ
35
100
35
85
ns
ns
ns
tLBHZ, tUBHZ
0
2 Meg x 16 Page Flash 128K x 16 SRAM Combo Memory
MT28C3212P2FL_2.p65 – Rev. 2, Pub. 4/02
MIN
-10/-11
VCC = 1.65V–1.95V VCC = 1.80V–2.20V
0
SYMBOL
tOLZ
tOHZ
tOH
43
MIN
0
MAX
MIN
0
MAX
UNITS
ns
0
0
15
15
0
0
15
15
ns
ns
0
5
15
0
5
15
ns
ns
Micron Technology, Inc., reserves the right to change products or specifications without notice.
©2002, Micron Technology, Inc.
2 MEG x 16 PAGE FLASH
128K x 16 SRAM COMBO MEMORY
WRITE CYCLE
(S_WE# CONTROL)
tWC
ADDRESS
tWR
SRAM
tAW
S_CE1#
tCW
S_CE2
tLBW, tUBW
S_LB#, S_UB#
tAS
tWP
S_WE#
tDW
DATA-IN
tDH
DATA VALID
High-Z
tWHZ
DATA-OUT
tOW
High-Z
DON’T CARE
WRITE TIMING PARAMETERS
SYMBOL
tWC
-10/-11
VCC = 1.65V–1.95V VCC = 1.80V–2.20V
MIN
MAX
MIN
MAX
100
85
tCW
100
100
tAW
tLBW, tUBW
tAS
tWP
100
0
50
2 Meg x 16 Page Flash 128K x 16 SRAM Combo Memory
MT28C3212P2FL_2.p65 – Rev. 2, Pub. 4/02
0
50
UNITS
ns
SYMBOL
tWR
85
85
ns
ns
tWHZ
85
ns
ns
ns
tDH
tDW
tOW
44
-10/-11
VCC = 1.65V–1.95V VCC = 1.80V–2.20V
MIN
MAX
MIN
MAX
0
0
0
50
0
0
15
0
50
0
0
15
UNITS
ns
ns
ns
ns
ns
Micron Technology, Inc., reserves the right to change products or specifications without notice.
©2002, Micron Technology, Inc.
2 MEG x 16 PAGE FLASH
128K x 16 SRAM COMBO MEMORY
WRITE CYCLE 2
(S_CE1# CONTROL)
tWC
ADDRESS
tWR
SRAM
tAW
tCW
S_CE1#
tAS
tLBW, tUBW
S_LB#, S_UB#
tWP
S_WE#
tDW
DATA-IN
tDH
DATA VALID
tLZ
tWHZ
DATA-OUT
High-Z
DON’T CARE
WRITE TIMING PARAMETERS
SYMBOL
tWC
-10/-11
VCC = 1.65V–1.95V VCC = 1.80V–2.20V
MIN
MAX
MIN
MAX
100
85
tCW
100
100
tAW
tLBW, tUBW
tAS
tWP
100
0
50
2 Meg x 16 Page Flash 128K x 16 SRAM Combo Memory
MT28C3212P2FL_2.p65 – Rev. 2, Pub. 4/02
0
50
UNITS
ns
SYMBOL
tWR
85
85
ns
ns
tWHZ
85
ns
ns
ns
tDH
tDW
tOW
45
-10/-11
VCC = 1.65V–1.95V VCC = 1.80V–2.20V
MIN
MAX
MIN
MAX
0
0
0
50
0
0
15
0
50
0
0
15
UNITS
ns
ns
ns
ns
ns
Micron Technology, Inc., reserves the right to change products or specifications without notice.
©2002, Micron Technology, Inc.
2 MEG x 16 PAGE FLASH
128K x 16 SRAM COMBO MEMORY
66-BALL FBGA
1.05 ±0.075
SEATING PLANE
C
0.10 C
SOLDER BALL MATERIAL: EUTECTIC 63% Sn, 37% Pb or
62% Sn, 36% Pb, 2%Ag
SOLDER BALL PAD: Ø .27mm
8.80
0.80
(TYP)
66X Ø 0.35
SUBSTRATE: PLASTIC LAMINATE
MOLD COMPOUND: EPOXY NOVOLAC
BALL A12
SOLDER BALL DIAMETER
REFERS TO POST REFLOW
CONDITION. THE PREREFLOW DIAMETER IS Ø 0.33
BALL A1
BALL A1
BALL #1 ID
0.80
(TYP)
2.80 ±0.05
8.00 ±0.10
CL
5.60
4.00 ±0.05
CL
4.40 ±0.05
6.00 ±0.05
1.40 MAX
12.00 ±0.10
NOTE: 1. All dimensions in millimeters MAX or typical where noted.
MIN
2. Package width and length do not include mold protrusion; allowable mold protrusion is 0.27mm per side.
DATA SHEET DESIGNATION
This data sheet contains minimum and maximum limits specified over the complete power supply and
temperature range for production devices. Although considered final, these specifications are subject to change,
as further product development and data characterization sometimes occur.
8000 S. Federal Way, P.O. Box 6, Boise, ID 83707-0006, Tel: 208-368-3900
E-mail: [email protected], Internet: http://www.micron.com, Customer Comment Line: 800-932-4992
Micron is a registered trademark and the Micron logo and M logo are trademarks of Micron Technology, Inc.
2 Meg x 16 Page Flash 128K x 16 SRAM Combo Memory
MT28C3212P2FL_2.p65 – Rev. 2, Pub. 4/02
46
Micron Technology, Inc., reserves the right to change products or specifications without notice.
©2002, Micron Technology, Inc.
2 MEG x 16 PAGE FLASH
128K x 16 SRAM COMBO MEMORY
REVISION HISTORY
Rev. 2, Pub. 4/02 ................................................................................................................................................................ 4/02
• Updated the chip protection mode and register information.
• Updated the block locking information.
• Removed the tCBPH parameter.
Rev. 2, Pub. 6/01 ................................................................................................................................................................ 6/01
• Data sheet designation change (removed “Advance”)
Initial published release, Rev. 1, Advance ................................................................................................................... 5/01
2 Meg x 16 Page Flash 128K x 16 SRAM Combo Memory
MT28C3212P2FL_2.p65 – Rev. 2, Pub. 4/02
47
Micron Technology, Inc., reserves the right to change products or specifications without notice.
©2002, Micron Technology, Inc.