VISHAY SIHF9Z22-E3

IRF9Z22, SiHF9Z22
Vishay Siliconix
Power MOSFET
FEATURES
PRODUCT SUMMARY
VDS (V)
- 50
RDS(on) (Ω)
VGS = - 10 V
0.33
Qg (Max.) (nC)
26
Qgs (nC)
6.2
Qgd (nC)
8.6
Configuration
Single
S
P-Channel Versatility
Compact Plastic Package
Fast Switching
Low Drive Current
Ease of Paralleling
Excellent Temperature Stability
Lead (Pb)-free Available
Available
RoHS*
COMPLIANT
DESCRIPTION
TO-220
G
S
G
•
•
•
•
•
•
•
D
D
P-Channel MOSFET
The Power MOSFET technology is the key to Vishay’s
advanced line of Power MOSFET transistors. The efficient
geometry and unique processing of the Power MOSFET
design achieve very low on-state resistance combined with
high transconductance and extreme device ruggedness.
The P-Channel Power MOSFET’s are designed for
application which require the convenience of reverse polarity
operation. They retain all of the features of the more common
N-Channel Power MOSFET’s such as voltage control, very
fast switching, ease of paralleling, and excellent temperature
stability.
P-Channel Power MOSFETs are intended for use in power
stages where complementary symmetry with N-Channel
devices offers circuit simplification. They are also very useful
in drive stages because of the circuit versatility offered by the
reverse polarity connection. Applications include motor
control, audio amplifiers, switched mode converters, control
circuits and pulse amplifiers.
ORDERING INFORMATION
Package
TO-220
IRF9Z22PbF
SiHF9Z22-E3
IRF9Z22
SiHF9Z22
Lead (Pb)-free
SnPb
ABSOLUTE MAXIMUM RATINGS TC = 25 °C, unless otherwise noted
PARAMETER
Drain-Source Voltage
Gate-Source Voltage
Drain-Gate Voltage (RGS = 20 KΩ)
Continuous Drain Current
SYMBOL
VDS
VGS
VGDR
VGS at - 10 V
TC = 25 °C
TC = 100 °C
ID
IDM
Pulsed Drain Currenta
Linear Derating Factor
Inductive Current, Clamped
L = 100 µH
ILM
Unclamped Inductive Current (Avalanche Current)
IL
PD
Maximum Power Dissipation
TC = 25 °C
Operating Junction and Storage Temperature Range
TJ, Tstg
Soldering Recommendations (Peak Temperature)
for 10 s
Notes
a. Repetitive rating; pulse width limited by maximum junction temperature (see fig. 11).
b. VDD = - 25 V, starting TJ = 25 °C, L =100 µH, RG = 25 Ω
c. ISD ≤ - 6.7 A, dI/dt ≤ 90 A/µs, VDD ≤ VDS, TJ ≤ 175 °C.
d. 0.063" (1.6 mm) from case.
* Pb containing terminations are not RoHS compliant, exemptions may apply
Document Number: 91350
S-Pending-Rev. A, 10-Jun-08
WORK-IN-PROGRESS
LIMIT
- 50
± 20
- 50
- 8.9
- 5.6
- 36
0.32
- 36
- 2.2
40
- 55 to + 150
300d
UNIT
V
A
W/°C
A
A
W
°C
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IRF9Z22, SiHF9Z22
Vishay Siliconix
THERMAL RESISTANCE RATINGS
PARAMETER
SYMBOL
TYP.
MAX.
Maximum Junction-to-Ambient
RthJA
-
80
Case-to-Sink, Flat, Greased Surface
RthCS
1.0
-
Maximum Junction-to-Case (Drain)
RthJC
-
3.1
UNIT
°C/W
SPECIFICATIONS TJ = 25 °C, unless otherwise noted
PARAMETER
SYMBOL
TEST CONDITIONS
MIN.
TYP.
MAX.
UNIT
Static
Drain-Source Breakdown Voltage
Gate-Source Threshold Voltage
Gate-Source Leakage
Zero Gate Voltage Drain Current
Drain-Source On-State Resistance
Forward Transconductance
VDS
VGS = 0 V, ID = - 250 µA
- 50
-
-
V
VGS(th)
VDS = VGS, ID = - 250 µA
- 2.0
-
- 4.0
V
nA
VGS = ± 20 V
-
-
± 500
VDS = max. rating, VGS = 0 V
-
-
- 250
VDS = max. rating x 0,8, VGS = 0 V, TJ =125°C
-
-
- 1000
-
0.28
0.33
Ω
2.3
3.5
-
S
IGSS
IDSS
RDS(on)
gfs
ID = - 5.6 Ab
VGS = - 10 V
VDS = 2 x VGS, IDS = - 5.6
Ab
µA
Dynamic
Input Capacitance
Ciss
Output Capacitance
Coss
Reverse Transfer Capacitance
Crss
Total Gate Charge
Qg
Gate-Source Charge
Qgs
VGS = 0 V,
VDS = - 25 V,
f = 1.0 MHz, see fig. 9
VGS = - 10 V
ID = - 9.7 A, VDS = - 0.8
max. rating. see fig. 17
-
480
-
-
320
-
-
58
-
-
17
26
-
4.1
6.2
pF
nC
Gate-Drain Charge
Qgd
-
5.7
8.6
Turn-On Delay Time
td(on)
-
8.2
12
-
57
86
-
12
18
-
25
38
-
4.5
-
-
7.5
-
-
-
- 9.7
-
-
- 39
-
-
- 6.3
V
56
110
280
ns
0.17
0.34
0.85
µC
Rise Time
Turn-Off Delay Time
Fall Time
tr
td(off)
tf
Internal Drain Inductance
LD
Internal Source Inductance
LS
VDD = - 25 V, ID = - 9.7 A,
RG = 18 Ω, RD = 2.4 Ω, see fig. 16
(MOSFET switching times are
essentially independent of operating
temperature)
Between lead,
6 mm (0.25") from
package and center
of die contact
D
ns
nH
G
S
Drain-Source Body Diode Characteristics
Continuous Source-Drain Diode Current
IS
Pulsed Diode Forward Currenta
ISM
Body Diode Voltage
VSD
Body Diode Reverse Recovery Time
trr
Body Diode Reverse Recovery Charge
Qrr
Forward Turn-On Time
ton
MOSFET symbol
showing the
integral reverse
p - n junction diode
D
A
G
S
TJ = 25 °C, IS = - 9.7 A, VGS = 0 Vb
TJ = 25 °C, IF = - 9.7 A, dI/dt = 100 A/µsb
Intrinsic turn-on time is negligible (turn-on is dominated by LS and LD)
Notes
a. Repetitive rating; pulse width limited by maximum junction temperature (see fig. 11).
b. Pulse width ≤ 300 µs; duty cycle ≤ 2 %.
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Document Number: 91350
S-Pending-Rev. A, 10-Jun-08
IRF9Z22, SiHF9Z22
Vishay Siliconix
TYPICAL CHARACTERISTICS 25 °C, unless otherwise noted
Fig. 1 - Typical Output Characteristics
Fig. 2 - Typical Transfer Characteristics
Document Number: 91350
S-Pending-Rev. A, 10-Jun-08
Fig. 3 - Typical Saturation Characteristics
Fig. 4 - Maximum Safe Operating Area
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IRF9Z22, SiHF9Z22
Vishay Siliconix
Fig. 5 - Typical Transconductance vs. Drain Current
Fig. 6 - Breakdown Voltage vs. Temperature
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Fig. 7 - Typical Source-Drain Diode Forward Voltage
Fig. 8 - Normalized On-Resistance vs. Temperature
Document Number: 91350
S-Pending-Rev. A, 10-Jun-08
IRF9Z22, SiHF9Z22
Vishay Siliconix
Fig. 9 - Typical Capacitance vs. Drain-to-Source Voltage
Fig. 11 - Typical Gate Charge vs. Gate-to-Source Voltage
Fig. 10 - Typical Gate Charge vs. Gate-to-Source Voltage
Fig. 12 - Maximum Drain Current vs. Case Temperature
Document Number: 91350
S-Pending-Rev. A, 10-Jun-08
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IRF9Z22, SiHF9Z22
Vishay Siliconix
Fig. 13a - Clamped Inductive Test Circuit
Fig. 13b - Clamped Inductive Waveforms
Fig. 14 - Maximum Effective Transient Thermal Impedance, Junction-to-Case vs. Pulse Duration
Fig. 15a - Unclamped Inductive Test Circuit
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Fig. 15b - Unclamped Inductive Load Test Waveforms
Document Number: 91350
S-Pending-Rev. A, 10-Jun-08
IRF9Z22, SiHF9Z22
Vishay Siliconix
Fig. 16 - Switching Time Test Circuit
Fig. 18 - Typical Time to Accumulated 1 % Gate Failure
Document Number: 91350
S-Pending-Rev. A, 10-Jun-08
Fig. 17 - Gate Charge Test Circuit
Fig. 19 - Typical High Temperature Reverse Bias (HTRB)
Failure Rate
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IRF9Z22, SiHF9Z22
Vishay Siliconix
Peak Diode Recovery dV/dt Test Circuit
D.U.T.
+
Circuit layout considerations
• Low stray inductance
• Ground plane
• Low leakage inductance
current transformer
+
-
-
RG
+
• dV/dt controlled by RG
• ISD controlled by duty factor "D"
• D.U.T. - device under test
+
- VDD
Compliment N-Channel of D.U.T. for driver
Driver gate drive
P.W.
Period
D=
P.W.
Period
VGS = - 10 V*
D.U.T. ISD waveform
Reverse
recovery
current
Body diode forward
current
dI/dt
D.U.T. VDS waveform
Diode recovery
dV/dt
Re-applied
voltage
VDD
Body diode forward drop
Inductor current
Ripple ≤ 5 %
*
ISD
VGS = - 5 V for logic level and - 3 V drive devices
Fig. 20 - For P-Channel
Vishay Siliconix maintains worldwide manufacturing capability. Products may be manufactured at one of several qualified locations. Reliability data for Silicon
Technology and Package Reliability represent a composite of all qualified locations. For related documents such as package/tape drawings, part marking, and
reliability data, see http://www.vishay.com/ppg?91350.
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Document Number: 91350
S-Pending-Rev. A, 10-Jun-08
Legal Disclaimer Notice
Vishay
Disclaimer
All product specifications and data are subject to change without notice.
Vishay Intertechnology, Inc., its affiliates, agents, and employees, and all persons acting on its or their behalf
(collectively, “Vishay”), disclaim any and all liability for any errors, inaccuracies or incompleteness contained herein
or in any other disclosure relating to any product.
Vishay disclaims any and all liability arising out of the use or application of any product described herein or of any
information provided herein to the maximum extent permitted by law. The product specifications do not expand or
otherwise modify Vishay’s terms and conditions of purchase, including but not limited to the warranty expressed
therein, which apply to these products.
No license, express or implied, by estoppel or otherwise, to any intellectual property rights is granted by this
document or by any conduct of Vishay.
The products shown herein are not designed for use in medical, life-saving, or life-sustaining applications unless
otherwise expressly indicated. Customers using or selling Vishay products not expressly indicated for use in such
applications do so entirely at their own risk and agree to fully indemnify Vishay for any damages arising or resulting
from such use or sale. Please contact authorized Vishay personnel to obtain written terms and conditions regarding
products designed for such applications.
Product names and markings noted herein may be trademarks of their respective owners.
Document Number: 91000
Revision: 18-Jul-08
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