® SP486E and SP487E Enhanced Quad RS-485/RS-422 Line Drivers ■ ■ ■ ■ ■ ■ ■ ■ RS-485 or RS-422 Applications Quad Differential Line Drivers Driver Output Disable –7V to +12V Common Mode Output Range 100µA Supply Current Single +5V Supply Operation Superior Drop-in Replacement for SN75172, SN75174, LTC486, and LTC487 Improved ESD Specifications: +15kV Human Body Model +15kV IEC1000-4-2 Air Discharge +8kV IEC1000-4-2 Contact Discharge DESCRIPTION… The SP486E and SP487E are low-power quad differential line drivers that meet the specifications of RS-485 and RS-422 serial protocols with enhanced ESD performance. The ESD tolerance has been improved on these devices to over +15kV for both Human Body Model and IEC1000-4-2 Air Discharge Method. These devices are superior drop-in replacements to Sipex's SP486 and SP487 devices as well as popular industry standards. As with the original versions, the SP486E features a common driver enable control and the SP487E provides independent driver enable controls for each pair of drivers. Both feature wide common-mode input ranges. Both are available in 16-pin plastic DIP and SOIC packages. DI1 1 SP486E 16 VCC DI1 1 1 DO1A SP487E 16 VCC 15 DI4 1 2 15 DI4 DO1A 2 4 4 DO1B 3 14 DO4A DO1B 3 14 DO4A EN 4 13 DO4B EN1/EN2 4 13 DO4B DO2B 5 12 EN DO2B 5 12 EN3/EN4 DO2A 6 11 DO3B DO2A 6 11 DO3B 10 DO3A 9 DI3 2 DI2 2 7 10 DO3A DI2 3 GND 8 SP486E/487EDS/06 7 3 9 DI3 GND 8 SP486E/487E Enhanced Quad RS-485/RS-422 Line Drivers 1 © Copyright 2000 Sipex Corporation ABSOLUTE MAXIMUM RATINGS These are stress ratings only and functional operation of the device at these or any other above those indicated in the operation sections of the specifications below is not implied. Exposure to absolute maximum rating conditions for extended periods of time may affect reliability. VCC .................................................................. +7V Input Voltages Logic .................................... –0.5V to (VCC +0.5V) Drivers ................................. –0.5V to (V CC +0.5V) Driver Output Voltage ................................... +14V Input Currents Logic ........................................................ +25mA Driver ....................................................... +25mA Storage Temperature ................. –65°C to +150°C Power Dissipation Plastic DIP .............................................. 375mW (derate 7mW/°C above +70°C) Small Outline .......................................... 375mW (derate 7mW/°C above +70°C) Lead Temperature (soldering, 10 sec) ......... 300°C SPECIFICATIONS VCC = 5V±5%; typicals at 25°C; TMIN ≤ TA ≤ TMAX unless otherwise noted. PARAMETER DC CHARACTERISTICS Digital Inputs Voltage VIL VIH Input Current DRIVER OUTPUTS Differential Voltage MIN. TYP. MAX. UNIT DI, EN, EN, EN1/EN2, EN3/EN4 0.8 Volts Volts µA VIN = 0V to VCC VCC 0.2 Volts Volts Volts Volts IO = 0; unloaded RL = 50Ω(RS-422) RL = 27Ω (RS-485); Fig. 1 RL = 27Ω or 50Ω ; Fig. 1 3 0.2 Volts Volts RL = 27Ω or 50Ω; Fig. 1 RL = 27Ω or 50Ω; Fig. 1 2.0 +2 VCC 2 1.5 2 Change in Output Magnitude for Complementary Output State Common Mode Output Voltage 2.3 Change in Common Mode Output Magnitude for Complementary Output State Maximum Data Rate 10 Short–circuit Current VOH VOL High Impedance Output Current POWER REQUIREMENTS Supply Voltage 4.75 Supply Current Mbps +2 +250 +250 +200 mA mA µA 5.00 0.5 0.5 5.25 10 10 Volts mA µA ENVIRONMENTAL AND MECHANICAL Operating Temperature –C 0 +70 –E –40 +85 Storage Temperature –65 +150 Package –_P 16–pin Plastic DIP –_T 16–pin SOIC SP486E/487EDS/06 CONDITIONS SP486E/487E Enhanced Quad RS-485/RS-422 Line Drivers 2 RL = 50Ω (RS-422) RL = 27Ω (RS-485) –7V ≤VO ≤ +12V –7V ≤VO ≤ +12V VO = –7V to +12V No load, output enabled No load, output disabled °C °C °C © Copyright 2000 Sipex Corporation PINOUT — SP486E DI1 1 SP486E 16 VCC 15 DI4 S1 1 DO1A 2 OUTPUT UNDER TEST 4 DO1B 3 14 DO4A EN 4 13 DO4B DO2B 5 12 EN DO2A 6 11 DO3B 10 DO3A 9 DI3 VCC 500 ohms CL S2 2 DI2 7 Figure 3. Driver Timing Test Load 3 GND 8 Pin 8 — GND — Digital Ground. Pin 9 — DI3 — Driver 3 Input — If Driver 3 output is enabled, logic 0 on DI3 forces driver output DO3A low and DO3B high. A logic 1 on DI3 with Driver 3 output enabled forces driver DO3A high and DO3B low. SP486E PINOUT Pin 1 — DI1 — Driver 1 Input — If Driver 1 output is enabled, logic 0 on DI1 forces driver output DO1A low and DO1B high. A logic 1 on DI1 with Driver 1 output enabled forces driver DO1A high and DO1B low. Pin 10 — DO3A — Driver 3 output A. Pin 2 — DO1A — Driver 1 output A. Pin 11 — DO3B — Driver 3 output B. Pin 3 — DO1B — Driver 1 output B. Pin 12 — EN — Driver Output Disable. Please refer to SP486E Truth Table (1). Pin 4 — EN — Driver Output Enable. Please refer to SP486E Truth Table (1). Pin 13 — DO4B — Driver 4 output B. Pin 5 — DO2B — Driver 2 output B. Pin 14 — DO4A — Driver 4 output A. Pin 6 — DO2A — Driver 2 output A. Pin 15 — DI4 — Driver 4 Input — If Driver 4 output is enabled, logic 0 on DI4 forces driver output DO4A low and DO4B high. A logic 1 on DI4 with Driver 3 output enabled forces driver DO4A high and DO4B low. Pin 7 — DI2 — Driver 2 Input — If Driver 2 output is enabled, logic 0 on DI2 forces driver output DO2A low and DO2B high. A logic 1 on DI2 with Driver 2 output enabled forces driver DO2A high and DO2B low. Pin 16 — Supply Voltage VCC — 4.75V ≤ VCC ≤ 5.25V. A EN CL1 R A VDO DI R RDIFF VOC B B CL2 EN Figure 2. Driver Timing Test Figure 1. Driver DC Test Load SP486E/487EDS/06 DRIVER SP486E/487E Enhanced Quad RS-485/RS-422 Line Drivers 3 © Copyright 2000 Sipex Corporation PINOUT — SP487E INPUT ENABLES OUTPUTS DI EN EN OUTA OUTB 16 VCC H H X H L 15 DI4 L H X L H 3 14 DO4A H X L H L EN1/EN2 4 13 DO4B L X L L H DO2B 5 12 EN3/EN4 X L H Hi–Z Hi–Z DO2A 6 11 DO3B DI2 7 10 DO3A GND 8 9 DI3 DI1 1 DO1A 2 DO1B SP487E 1 4 Table 1. SP486E Truth Table 2 3 Pin 11 — DO3B — Driver 3 output B. Pin 12 — EN3/EN4 — Driver 3 and 4 Output Enable. Please refer to SP487E Truth Table (2). SP487E PINOUT Pin 1 — DI1 — Driver 1 Input — If Driver 1 output is enabled, logic 0 on DI1 forces driver output DO1A low and DO1B high. A logic 1 on DI1 with Driver 1 output enabled forces driver DO1A high and DO1B low. Pin 13 — DO4B — Driver 4 output B. Pin 14 — DO4A — Driver 4 output A. Pin 15 — DI4 — Driver 4 Input — If Driver 4 output is enabled, logic 0 on DI4 forces driver output DO4A low and DO4B high. A logic 1 on DI4 with Driver 3 output enabled forces driver DO4A high and DO4B low. Pin 2 — DO1A — Driver 1 output A. Pin 3 — DO1B — Driver 1 output B. Pin 4 — EN1/EN2 — Driver 1 and 2 Output Enable. Please refer to SP487E Truth Table (2). Pin 16 — Supply Voltage VCC — 4.75V ≤ VCC ≤ 5.25V. Pin 5 — DO2B — Driver 2 output B. FEATURES… The SP486E and SP487E are low–power quad differential line drivers meeting RS-485 and RS-422 standards. The SP486E features active high and active low common driver enable controls; the SP487E provides independent, active high driver enable controls for each pair of drivers. The driver outputs are short–circuit limited to 200mA. Data rates up to 10Mbps are supported. Both are available in 16–pin plastic DIP and SOIC packages. Pin 6 — DO2A — Driver 2 output A. Pin 7 — DI2 — Driver 2 Input — If Driver 2 output is enabled, logic 0 on DI2 forces driver output DO2A low and DO2B high. A logic 1 on DI2 with Driver 2 output enabled forces driver DO2A high and DO2B low. Pin 8 — GND — Digital Ground. Pin 9 — DI3 — Driver 3 Input — If Driver 3 output is enabled, logic 0 on DI3 forces driver output DO3A low and DO3B high. A logic 1 on DI3 with Driver 3 output enabled forces driver DO3A high and DO3B low. INPUT Pin 10 — DO3A — Driver 3 output A. ENABLES OUTPUTS DI EN1/EN2 or EN3/EN4 OUTA OUTB H H H L L H L H X L Hi–Z Hi–Z Table 2. SP487E Truth Table SP486E/487EDS/06 SP486E/487E Enhanced Quad RS-485/RS-422 Line Drivers 4 © Copyright 2000 Sipex Corporation F = 1MHZ: tr < 10ns: tf < 10ns 3V DI 0V 1.5V 1.5V tPHL tPLH B A VO 1 2VO 1 2VO VDIFF = V(A) – V(B) VO –VO 90% 10% 90% 10% tr tf Figure 4. Driver Propagation Delays AC PARAMETERS VCC = 5V±5%; typicals at 25°C; TAMB = 25°C unless otherwise noted. PARAMETER PROPAGATION DELAY Driver Input to Output Low to High (tPLH) High to Low (tPHL) Differential Skew (tSKEW) Driver Rise Time (tR) SP486E SP487E Driver Fall Time (tF) SP486E SP487E DRIVER ENABLE To Output High MIN. TYP. MAX. UNIT RDIFF = 54 Ohms, CL1= CL2= 100pF; Figure 2 20 20 40 40 5 60 60 15 ns ns ns 20 20 ns ns 20 20 ns ns 110 ns 60 115 ns DRIVER DISABLE From Output Low 60 130 ns From Output High 60 130 ns SP486E/487EDS/06 tSKEW = tPLH - tPHL 10% to 90% 90% to 10% 60 To Output Low CONDITIONS SP486E/487E Enhanced Quad RS-485/RS-422 Line Drivers 5 CL = 100pF; Figures 3 and 5 (S2 closed) CL = 100pF; Figures 3 and 5 (S1 closed) CL = 15pF; Figures 3 and 5 (S1 closed) CL = 15pF; Figures 3 and 5 (S2 closed) © Copyright 2000 Sipex Corporation EN F = 1MHZ: tr < 10ns: tf < 10ns 3V 0V 1.5V 1.5V tLZ tZL A, B V5V CC VO VOL VOH 0V 2.3V Output normally low 0.5V Output normally high 2.3V 0.5V tZH tHZ Figure 5. Driver Enable/Disable Timing R RS S R RC C SW2 SW2 SW1 SW1 Device Under Test C CS S DC Power Source Figure 6. ESD Test Circuit for Human Body Model Contact-Discharge Module R RSS RC C RV SW2 SW2 SW1 SW1 Device Under Test C CSS DC Power Source RS and RV add up to 330Ω 330Ω ffor or IEC1000-4-2. Figure 7. ESD Test Circuit for IEC1000-4-2 SP486E/487EDS/06 SP486E/487E Enhanced Quad RS-485/RS-422 Line Drivers 6 © Copyright 2000 Sipex Corporation i➙ ESD TOLERANCE The SP486E and SP487E devices incorporate ruggedized ESD cells on all driver output and receiver input pins. The ESD structure is improved over our previous family for more rugged applications and environments sensitive to electro-static discharges and associated transients. The improved ESD tolerance is at least +15kV without damage nor latch-up. 30A 15A There are different methods of ESD testing applied: 0A a) MIL-STD-883, Method 3015.7 b) IEC1000-4-2 Air-Discharge c) IEC1000-4-2 Direct Contact t=0ns Figure 8. ESD Test Waveform for IEC1000-4-2 The Human Body Model has been the generally accepted ESD testing method for semiconductors. This method is also specified in MIL-STD-883, Method 3015.7 for ESD testing. The premise of this ESD test is to simulate the human body’s potential to store electro-static energy and discharge it to an integrated circuit. The simulation is performed by using a test model as shown in Figure 6. This method will test the IC’s capability to withstand an ESD transient during normal handling such as in manufacturing areas where the ICs tend to be handled frequently. With the Air Discharge Method, an ESD voltage is applied to the equipment under test (EUT) through air. This simulates an electrically charged person ready to connect a cable onto the rear of the system only to find an unpleasant zap just before the person touches the back panel. The high energy potential on the person discharges through an arcing path to the rear panel of the system before he or she even touches the system. This energy, whether discharged directly or through air, is predominantly a function of the discharge current rather than the discharge voltage. Variables with an air discharge such as approach speed of the object carrying the ESD potential to the system and humidity will tend to change the discharge current. For example, the rise time of the discharge current varies with the approach speed. The IEC-1000-4-2, formerly IEC801-2, is generally used for testing ESD on equipment and systems. For system manufacturers, they must guarantee a certain amount of ESD protection since the system itself is exposed to the outside environment and human presence. The premise with IEC1000-4-2 is that the system is required to withstand an amount of static electricity when ESD is applied to points and surfaces of the equipment that are accessible to personnel during normal usage. The transceiver IC receives most of the ESD current when the ESD source is applied to the connector pins. The test circuit for IEC1000-4-2 is shown on Figure 7. There are two methods within IEC1000-4-2, the Air Discharge method and the Contact Discharge method. SP486E/487EDS/06 t=30ns t➙ The Contact Discharge Method applies the ESD current directly to the EUT. This method was devised to reduce the unpredictability of the ESD arc. The discharge current rise time is constant since the energy is directly transferred without the air-gap arc. In situations such as hand held systems, the ESD charge can be directly discharged to the equipment from a person already holding the equipment. The current is transferred on to the keypad or the serial port of the equipment directly and then travels through the PCB and finally to the IC. SP486E/487E Enhanced Quad RS-485/RS-422 Line Drivers 7 © Copyright 2000 Sipex Corporation The circuit model in Figures 6 and 7 represent the typical ESD testing circuit used for all three methods. The CS is initially charged with the DC power supply when the first switch (SW1) is on. Now that the capacitor is charged, the second switch (SW2) is on while SW1 switches off. The voltage stored in the capacitor is then applied through RS, the current limiting resistor, onto the device under test (DUT). In ESD tests, the SW2 switch is pulsed so that the device under test receives a duration of voltage. The higher CS value and lower RS value in the IEC1000-4-2 model are more stringent than the Human Body Model. The larger storage capacitor injects a higher voltage to the test point when SW2 is switched on. The lower current limiting resistor increases the current charge onto the test point. For the Human Body Model, the current limiting resistor (RS) and the source capacitor (CS) are 1.5kW an 100pF, respectively. For IEC-1000-4-2, the current limiting resistor (RS) and the source capacitor (CS) are 330W an 150pF, respectively. DEVICE PIN TESTED Driver Outputs Receiver Inputs HUMAN BODY MODEL +15kV +15kV Air Discharge IEC1000-4-2 Direct Contact +15kV +15kV +8kV +8kV Level 4 4 Table 3. Transceiver ESD Tolerance Levels SP486E/487EDS/06 SP486E/487E Enhanced Quad RS-485/RS-422 Line Drivers 8 © Copyright 2000 Sipex Corporation PACKAGE: PLASTIC DUAL–IN–LINE (NARROW) E1 E D1 = 0.005" min. (0.127 min.) A1 = 0.015" min. (0.381min.) D A = 0.210" max. (5.334 max). C A2 e = 0.100 BSC (2.540 BSC) B1 B Ø L eA = 0.300 BSC (7.620 BSC) ALTERNATE END PINS (BOTH ENDS) DIMENSIONS (Inches) Minimum/Maximum (mm) SP486E/487EDS/06 16–PIN A2 0.115/0.195 (2.921/4.953) B 0.014/0.022 (0.356/0.559) B1 0.045/0.070 (1.143/1.778) C 0.008/0.014 (0.203/0.356) D 0.780/0.800 (19.812/20.320) E 0.300/0.325 (7.620/8.255) E1 0.240/0.280 (6.096/7.112) L 0.115/0.150 (2.921/3.810) Ø 0°/ 15° (0°/15°) SP486E/487E Enhanced Quad RS-485/RS-422 Line Drivers 9 © Copyright 2000 Sipex Corporation PACKAGE: PLASTIC SMALL OUTLINE (SOIC) (WIDE) E H D A Ø e B A1 L DIMENSIONS (Inches) Minimum/Maximum (mm) SP486E/487EDS/06 16–PIN A 0.093/0.104 (2.352/2.649) A1 0.004/0.012 (0.102/0.300) B 0.013/0.020 (0.330/0.508) D 0.398/0.413 (10.10/10.49) E 0.291/0.299 (7.402/7.600) e 0.050 BSC (1.270 BSC) H 0.394/0.419 (10.00/10.64) L 0.016/0.050 (0.406/1.270) Ø 0°/8° (0°/8°) SP486E/487E Enhanced Quad RS-485/RS-422 Line Drivers 10 © Copyright 2000 Sipex Corporation ORDERING INFORMATION Quad RS485 Drivers: Model .................................. Enable/Disable ........................ Temperature Range ......................... Package SP486ECP ....... Common; active Low and Active High ............ 0°C to +70°C .................. 16–pin Plastic DIP SP486ECT ........ Common; active Low and Active High ............ 0°C to +70°C ........................... 16–pin SOIC SP486EEP ........ Common; active Low and Active High .......... –40°C to +85°C ................ 16–pin Plastic DIP SP486EET ........ Common; active Low and Active High .......... –40°C to +85°C ......................... 16–pin SOIC SP487ECP ............ One per driver pair; active High ................. 0°C to +70°C .................. 16–pin Plastic DIP SP487ECT ............. One per driver pair; active High ................. 0°C to +70°C ........................... 16–pin SOIC SP487EEP ............. One per driver pair; active High ............... –40°C to +85°C ................ 16–pin Plastic DIP SP487EET ............. One per driver pair; active High ............... –40°C to +85°C ......................... 16–pin SOIC Please consult the factory for pricing and availability on a Tape-On-Reel option. Corporation SIGNAL PROCESSING EXCELLENCE Sipex Corporation Headquarters and Sales Office 22 Linnell Circle Billerica, MA 01821 TEL: (978) 667-8700 FAX: (978) 670-9001 e-mail: [email protected] Sales Office 233 South Hillview Drive Milpitas, CA 95035 TEL: (408) 934-7500 FAX: (408) 935-7600 Sipex Corporation reserves the right to make changes to any products described herein. Sipex does not assume any liability arising out of the application or use of any product or circuit described hereing; neither does it convey any license under its patent rights nor the rights of others. SP486E/487EDS/06 SP486E/487E Enhanced Quad RS-485/RS-422 Line Drivers 11 © Copyright 2000 Sipex Corporation