ICX423AL Diagonal 11mm (Type 2/3) CCD Image Sensor for CCIR B/W Video Cameras Description The ICX423AL is an interline CCD solid-state image sensor suitable for CCIR B/W video cameras with a diagonal 11mm (Type 2/3) system. Compared with the current product ICX083AL, basic characteristics such as sensitivity and smear are improved drastically and high saturation characteristics are realized. This chip features a field period readout system and an electronic shutter with variable charge-storage time. This chip is compatible with the pins of the ICX083AL and has the same drive conditions. 20 pin DIP (Ceramic) Pin 1 2 Features • High sensitivity (+3.0dB compared with the ICX083AL) • Low smear (–10.0dB compared with the ICX083AL) • High saturation signal (+2.0dB compared with the ICX083AL) • High resolution and Low dark current • Excellent antiblooming characteristics • Continuous variable-speed shutter V 12 3 Pin 11 H 40 Optical black position Device Structure (Top View) • Interline CCD image sensor • Optical size: Diagonal 11mm (Type 2/3) • Number of effective pixels: 752 (H) × 582 (V) approx. 440K pixels • Total number of pixels: 795 (H) × 596 (V) approx. 470K pixels • Chip size: 10.25mm (H) × 8.5mm (V) • Unit cell size: 11.6µm (H) × 11.2µm (V) • Optical black: Horizontal (H) direction: Front 3 pixels, rear 40 pixels Vertical (V) direction: Front 12 pixels, rear 2 pixels • Number of dummy bits: Horizontal 22 Vertical 1 (even fields only) • Substrate material: Silicon Sony reserves the right to change products and specifications without prior notice. This information does not convey any license by any implication or otherwise under any patents or other right. Application circuits shown, if any, are typical examples illustrating the operation of the devices. Sony cannot assume responsibility for any problems arising out of the use of these circuits. –1– E01X23-PS ICX423AL VL 7 GND 9 Output Unit VDD 10 Vertical Register Block Diagram and Pin Configuration (Top view) VOUT 11 VGG 12 Note) 1 Vφ4 2 Vφ3 3 Vφ2 4 SUB 5 GND 6 Vφ1 VSS 13 Horizontal Register GND 14 15 16 17 18 19 20 RD RG VL Hφ1 Hφ2 HIS Note) : Photo sensor Pin Description Pin No. Symbol Description Pin No. Symbol Description 1 Vφ4 Vertical register transfer clock 11 VOUT Signal output 2 Vφ3 Vertical register transfer clock 12 VGG Output amplifier gate bias 3 Vφ2 Vertical register transfer clock 13 VSS Output amplifier source 4 SUB Substrate (overflow drain) 14 GND GND 5 GND GND 15 RD Reset drain 6 Vφ1 Vertical register transfer clock 16 RG Reset gate clock 7 VL Protective transistor bias 17 VL Protective transistor bias 8 NC 18 Hφ1 Horizontal register transfer clock 9 GND GND 19 Hφ2 Horizontal register transfer clock 10 VDD Output amplifier drain power 20 HIS Horizontal register input source bias –2– ICX423AL Absolute Maximum Ratings Item Ratings Unit –0.3 to +55 V HIS, VDD, RD, VOUT, VSS – GND –0.3 to +20 V HIS, VDD, RD, VOUT, VSS – SUB –55 to +10 V Vertical clock input pins – GND –15 to +20 V Substrate voltage SUB – GND Supply voltage Vertical clock input voltage to +10 V Voltage difference between vertical clock input pins to +15 V Voltage difference between horizontal clock input pins to +17 V Hφ1, Hφ2 – Vφ4 –17 to +17 V Hφ1, Hφ2, RG, VGG – GND –10 to +15 V Hφ1, Hφ2, RG, VGG – SUB –55 to +10 V VL – SUB –65 to +0.3 V Vφ1, Vφ3, HIS, VDD, RD, VOUT – VL –0.3 to +30 V RG – VL –0.3 to +24 V Vφ2, Vφ4, VGG, VSS, Hφ1, Hφ2 – VL –0.3 to +20 V Storage temperature –30 to +80 °C Operating temperature –10 to +60 °C Vertical clock input pins – SUB Remarks ∗1 ∗1 27V (Max.) when clock width < 10µs, clock duty factor < 0.1%. Bias Conditions Item Symbol Min. Typ. Max. Unit Remarks Output amplifier drain voltage VDD 14.7 15.0 15.3 V Reset drain voltage VRD 14.7 15.0 15.3 V Output amplifier gate voltage VGG 3.8 4.2 4.6 V Output amplifier source VSS Substrate voltage adjustment range VSUB 9 19 V Substrate voltage adjustment precision ∆VSUB –3 +3 % Reset gate clock voltage adjustment range VRGL 0 3.0 V Reset gate clock voltage adjustment precision ∆VRGL –3 +3 % Protective transistor bias VL –11 –10.5 –10 V ∗3 Horizontal register input source bias VHIS 14.7 15.0 15.3 V VHIS = VDD –3– Ground with 750Ω resistor VRD = VDD ±5% ∗2 ∗2 ICX423AL DC Characteristics Symbol Item Min. Typ. Max. Unit 6 Remarks mA Output amplifier drain current IDD Input current IIN1 1 µA ∗4 Input current IIN2 10 µA ∗5 ∗2 Indications of substrate voltage (VSUB) and reset gate clock voltage (VRGL) setting value The setting value of the substrate voltage and reset gate clock voltage are indicated on the back of the image sensor by a special code. Adjust the substrate voltage (VSUB) and reset gate clock voltage (VRGL) to the indicated voltage. The adjustment precision is ±3%. VSUB code — one character indication VRGL code — one character indication ↑ ↑ V RGL code VSUB code "Code" and optimal setting correspond to each other as follows. VRGL code 1 Optimal setting 0 VSUB code D 2 3 4 5 6 7 0.5 1.0 1.5 2.0 2.5 3.0 E f G h J K L m N P Q R S T U V W X Y Z Optimal setting 9.0 9.5 10.0 10.5 11.0 11.5 12.0 12.5 13.0 13.5 14.0 14.5 15.0 15.5 16.0 16.5 17.0 17.5 18.0 18.5 19.0 <Example> "5K" → VRGL = 2.0V VSUB = 12.0V ∗3 This must no exceed the VVL voltage of the vertical clock waveform. ∗4 1) Current to each pin when 20V is applied to VDD, RD, VOUT, VSS, HIS and SUB pins, while pins that are not tested are grounded. 2) Current to each pin when 20V is applied sequentially to Vφ1, Vφ2, Vφ3 and Vφ4 pins, while pins that are not tested are grounded. However, 20V is applied to SUB pin. 3) Current to each pin when 15V is applied sequentially to Hφ1, Hφ2, RG and VGG pins, while pins that are not tested are grounded. However, 15V is applied to SUB pin. 4) Current to VL pin when 30V is applied to Vφ1, Vφ3, HIS, VDD, RD and VOUT pins or when, 24V is applied to RG pin or when, 20V is applied to Vφ2, Vφ4, VGG, VSS, Hφ1 and Hφ2 pins, while VL pin is grounded. However, GND and SUB pins are left open. ∗5 Current to SUB pin when 55V is applied to SUB pin, while pins that are not tested are grounded. –4– ICX423AL Clock Voltage Conditions Item Readout clock voltage Min. Typ. Max. Unit Waveform diagram VVT 14.5 15.0 15.5 V 1 VVH1, VVH2, VVH3, VVH4 –0.6 0 V 2 VVH = (VVH1 + VVH2)/2 V 2 VVL = (VVL3 + VVL4)/2 V 2 VφV = VVHn – VVLn (n = 1 to 4) 0.2 V 2 Symbol VVL1, VVL2, VVL3, VVL4 VφV Vertical transfer clock voltage –9.6 8.9 | VVH1 – VVH2 | Remarks VVH3 – VVH –0.5 0 V 2 VVH4 – VVH –0.5 0 V 2 VVHH 0.8 V 2 High-level coupling VVHL 1.0 V 2 High-level coupling VVLH 0.8 V 2 Low-level coupling VVLL 0.8 V 2 Low-level coupling Horizontal transfer clock voltage VφH 6.0 8.0 V 3 VHL –3.5 –3.0 V 3 Reset gata clock voltage VφRG 6.0 13.0 V 3 VRGL 0 3.0 V 3 27.0 32.0 V 4 Substrate clock voltage VφSUB ∗1 ∗1 The reset gate clock voltage need not be adjusted when the reset gate clock is driven when the specifications are as given below. In this case, the reset gate clock voltage setting indicated on the back of the image sensor has not significance. Item Reset gate clock voltage Min. Typ. Max. Unit Waveform diagram VRGL –0.2 0 0.2 V 3 VφRG 8.5 9.0 9.5 V 3 Symbol –5– Remarks ICX423AL Clock Equivalent Circuit Constant Symbol Item Typ. Min. Max. Unit CφV1, CφV3 2700 pF CφV2, CφV4 2700 pF CφV12, CφV34 2600 pF CφV23, CφV41 950 pF CφV13 1000 pF CφV24 500 pF Capacitance between horizontal transfer clock and GND CφH1, CφH2 47 pF Capacitance between horizontal transfer clocks CφHH 58 pF Capacitance between reset gate clock and GND CφRG 7 pF Capacitance between substrate clock and GND CφSUB 800 pF Vertical transfer clock series resistor R1, R2, R3, R4 22 Ω Vertical transfer clock ground resistor RGND 3 Ω 10 Ω Capacitance between vertical transfer clock and GND Capacitance between vertical transfer clocks Horizontal transfer clock series resistor RφH Vφ2 Vφ1 CφV12 R1 R2 RφH CφV1 Hφ2 CφHH CφV23 CφH1 CφH2 CφV13 CφV24 CφV4 Vφ4 RφH Hφ1 CφV2 CφV41 R4 Remarks RGND CφV34 CφV3 R3 Vφ3 Vertical transfer clock equivalent circuit Horizontal transfer clock equivalent circuit –6– ICX423AL Drive Clock Waveform Conditions (1) Readout clock waveform 100% 90% φM VVT φM 2 10% 0% tr twh 0V tf (2) Vertical transfer clock waveform Vφ1 Vφ3 VVH1 VVHH VVH VVHH VVHL VVHL VVHL VVL1 VVHH VVHH VVH3 VVH VVHL VVL3 VVLH VVLH VVLL VVLL VVL VVL Vφ2 Vφ4 VVHH VVHH VVH VVH VVHH VVHH VVHL VVHL VVH2 VVHL VVH4 VVLH VVL2VVLH VVLL VVLL VVL4 VVL VVH = (VVH1 + VVH2)/2 VVL = (VVL3 + VVL4)/2 VφV = VVHn – VVLn (n = 1 to 4) VVHL –7– VVL ICX423AL (3) Horizontal transfer clock waveform · Reset gate clock waveform tr twh tf 90% VφH, VφRG twl 10% VHL, VRGL (4) Substrate clock waveform 100% 90% φM VφSUB φM 2 10% VSUB 0% tr twh tf Clock Switching Characteristics Item Symbol twh tr tf Min. Typ. Max. Min. Typ. Max. Min. Typ. Max. Min. Typ. Max. Readout clock VT Vertical transfer clock Vφ1, Vφ2 62.6 Vφ3, Vφ4 Horizontal transfer clock twl 2.3 2.5 Unit Remarks During readout 0.5 0.5 µs 0.74 0.1 0.1 µs 1.3 62.1 0.1 0.1 µs Hφ 20 20 15 Hφ1 5.38 Hφ2 Reset gate clock φRG 11 Substrate clock φSUB 1.5 1.8 13 19 15 19 ns 0.01 0.01 µs 5.38 0.01 0.01 µs 51 2.0 2.0 ns 0.5 –8– 0.5 µs During imaging During imaging During parallel-serial conversion During drain charge ICX423AL Image Sensor Characteristics Item (Ta = 25°C) Symbol Min. Typ. Sensitivity S 700 1000 Saturation signal Vsat 1000 Smear Sm Video signal shading Max. Unit Measurement method Remarks mV 1 mV 2 –120 dB 3 SH 25 % 4 Dark signal Vdt 2 mV 5 Ta = 60°C Dark signal shading ∆Vdt 1 mV 6 Ta = 60°C Flicker F 5 % 7 Lag Lag 0.5 % 8 –130 Ta = 60°C Image Sensor Characteristics Measurement Method Measurement conditions 1) In the following measurements, the substrate voltage and the reset gate clock voltage are set to the values indicated on the device, and the device drive conditions are at the typical values of the bias and clock voltage conditions. 2) In the following measurements, spot blemishes are excluded and, unless otherwise specified, the optical black (OB) level is used as the reference for the signal output, and the value measured at point [∗A] in the drive circuit example is used. Definition of standard imaging conditions 1) Standard imaging condition I: Use a pattern box (luminance 706cd/m2, color temperature of 3200K halogen source) as a subject. (Pattern for evaluation is not applicable.) Use a testing standard lens with CM500S (t = 1.00mm) as an IR cut filter and image at F8. The luminous intensity to the sensor receiving surface at this point is defined as the standard sensitivity luminous intensity. 2) Standard imaging condition II : Image a light source (color temperature of 3200K) with a uniformity of brightness within 2% at all angles. Use a testing standard lens with CM500S (t = 1.00mm) as an IR cut filter. The luminous intensity is adjusted to the value indicated in each testing item by the lens diaphragm. 1. Sensitivity Set to standard imaging condition I. After selecting the electronic shutter mode with a shutter speed of 1/250s, measure the signal output (Vs) at the center of the screen and substitute the value into the following formula. S = Vs × 250 50 [mV] 2. Saturation signal Set to standard imaging condition II. After adjusting the luminous intensity to 10 times the intensity with average value of signal output, 350mV, measure the minimum value of the signal output. –9– ICX423AL 3. Smear Set to standard imaging condition II. With the lens diaphragm at F5.6 to F8, adjust the luminous intensity to 500 times the intensity with average value of the signal output, 350mV. When the readout clock is stopped and the charge drain is executed by the electronic shutter at the respective H blankings, measure the maximum value (VSm [mV]) of the signal output and substitute the value into the following formula. Sm = 20 × log VSm × 1 × 1 500 10 350 × 100 [dB] (1/10V method conversion value) 4. Video signal shading Set to standard imaging condition II. With the lens diaphragm at F5.6 to F8, adjust the luminous intensity so that the average value of the signal output is 350mV. Then measure the maximum (Vmax [mV]) and minimum (Vmin [mV]) values of the signal output and substitute the values into the following formula. SH = (Vmax – Vmin)/350 × 100 [%] 5. Dark signal Measure the average value of the signal output (Vdt [mV]) with the device ambient temperature 60°C and the device in the light-obstructed state, using the horizontal idle transfer level as a reference. 6. Dark signal shading After measuring 5, measure the maximum (Vdmax [mV]) and minimum (Vdmin [mV]) values of the dark signal output and substitute the values into the following formula. ∆Vdt = Vdmax – Vdmin [mV] 7. Flicker Set to standard imaging condition II. Adjust the luminous intensity so that the average value of the signal output is 350mV, and then measure the difference in the signal level between fields (∆Vf [mV]). Then substitute the value into the following formula. F = (∆Vf/350) × 100 [%] 8. Lag Adjust the signal output value generated by strobe light to 350mV. After setting the strobe light so that it strobes with the following timing, measure the residual signal (Vlag). Substitute the value into the following formula. Lag = (Vlag/350) × 100 [%] FLD V1 Light Strobe light timing Signal output 350mV Output – 10 – Vlag (lag) 6V RG H1 H2 –11V XV3 XSG2 XV4 XV2 XSG1 XV1 2.2/16V 0.1 12 11 13 8 74AC04 9 10 6 5 0.1 0.1 15 16 CXD1268M 0.1 14 7 0.1 18 3 1/16V 3.3/25V 17 4 19 2 33k 100k 91k 20 1 100k 0.01 10 10 27k 47k 0.1 3.3/ 16V 10k 39k 19 20 ICX423AL (BOTTOM VIEW) 10 9 8 7 6 5 4 3 3.3/35V 2 1M 15 1 2200P 22k 1000P 33k Vφ4 HIS 22/20V 15 Vφ3 Hφ2 17 100k 10/10V 18 Hφ1 5V 0.01 10k Vφ2 47k 15k 3.3/35V SUB VL –9V 15k GND 16 RG 270k Vφ1 15 RD 56k VL 13 3.3k 100 3.3/16V 100k 750 14 GND XSUB NC 11 39k 3.3/ 16V 12 VSS 15V GND VGG 30V VDD – 11 – VOUT Drive Circuit 0.01 [∗A] CCD OUT 3.3/16V 3.3/25V ICX423AL ICX423AL Spectral Sensitivity Characteristics (includes lens characteristics, excludes light source characteristics) 1.0 0.9 0.8 Relative Response 0.7 0.6 0.5 0.4 0.3 0.2 0.1 0 400 500 600 700 800 900 1000 Wave Length [nm] Sensor Readout Clock Timing Chart V1 2.5 V2 Odd Field V3 V4 33.6 1.5 2.6 2.5 2.5 0.2 V1 V2 Even Field V3 V4 Unit: µs – 12 – – 13 – CCD OUT V4 V3 V2 V1 HD BLK VD FLD 581 582 625 1 2 3 4 5 620 Drive Timing Chart (Vertical Sync) 15 2 4 6 1 3 5 2 4 6 1 3 5 315 582 581 330 1 3 5 2 4 6 335 1 3 5 2 4 6 ICX423AL 340 325 320 310 25 20 10 – 14 – SUB V4 V3 V2 V1 RG H2 H1 BLK HD 20 10 3 5 750 752 1 745 Drive Timing Chart (Horizontal Sync) ICX423AL 20 10 20 22 1 2 3 1 2 3 10 1 2 3 5 40 30 ICX423AL Notes on Handling 1) Static charge prevention CCD image sensors are easily damaged by static discharge. Before handling be sure to take the following protective measures. a) Either handle bare handed or use non-chargeable gloves, clothes or material. Also use conductive shoes. b) When handling directly use an earth band. c) Install a conductive mat on the floor or working table to prevent the generation of static electricity. d) Ionized air is recommended for discharge when handling CCD image sensor. e) For the shipment of mounted substrates, use boxes treated for the prevention of static charges. 2) Soldering a) Make sure the package temperature does not exceed 80°C. b) Solder dipping in a mounting furnace causes damage to the glass and other defects. Use a 30W soldering iron with a ground wire and solder each pin in less than 2 seconds. For repairs and remount, cool sufficiently. c) To dismount an image sensor, do not use a solder suction equipment. When using an electric desoldering tool, use a thermal controller of the zero cross On/Off type and connect it to ground. 3) Dust and dirt protection Image sensors are packed and delivered by taking care of protecting its glass plates from harmful dust and dirt. Clean glass plates with the following operation as required, and use them. a) Operate in clean environments (around class 1000 is appropriate). b) Do not either touch glass plates by hand or have any object come in contact with glass surfaces. Should dirt stick to a glass surface, blow it off with an air blower. (For dirt stuck through static electricity ionized air is recommended.) c) Clean with a cotton bud and ethyl alcohol if the grease stained. Be careful not to scratch the glass. d) Keep in a case to protect from dust and dirt. To prevent dew condensation, preheat or precool when moving to a room with great temperature differences. e) When a protective tape is applied before shipping, just before use remove the tape applied for electrostatic protection. Do not reuse the tape. 4) Do not expose to strong light (sun rays) for long periods. For continuous using under cruel condition exceeding the normal using condition, consult our company. 5) Exposure to high temperature or humidity will affect the characteristics. Accordingly avoid storage or usage in such conditions. 6) CCD image sensors are precise optical equipment that should not be subject to too much mechanical shocks. – 15 – – 16 – + 0.25 0.35 1 20 42 ALLOY 5.90g LEAD MATERIAL PACKAGE MASS AS-A11(E) GOLD PLATING LEAD TREATMENT DRAWING NUMBER Ceramic 11 10 0.5 1.27 0.46 A PACKAGE MATERIAL 0.3 M 26.0 ± 0.25 13.15 PACKAGE STRUCTURE 2.54 1Pin Index B + 0.15 φ2.00 – 0 (Reference Hole) 5.0 2-φ2.50 – 0 31.0 ± 0.4 27.0 ± 0.3 + 0.15 20 pin DIP (800mil) ~ D 2- 26.0 ~ 9. The thickness of the cover glass is 0.75mm and the refractive index is 1.5. 8. The tilt of the effective image area relative to the bottom “D” is less than 60µm. 7. The height from the bottom “D” to the effective image area is 1.46 ± 0.15mm. 6. The angle of rotation relative to the reference line “B” is less than ± 1˚ 5. The center of the effective image area specified relative to the reference hole is (H, V) = (13.15, 5.0) ± 0.15mm. 4. The bottom “D” is the height reference.(Two points are specified.) 3. The straight line “C” which passes through the center of the reference hole at right angle to vertical reference line “B” is the reference axis of horizontal direction (H). 2. The straight line “B” which passes through the center of the reference hole and the elongated hole is the reference axis of vertical direction (V). 1. "A" is the center of the effective image area. ×2.5 2.00 – 0 (Elongated Hole) 20.2 ± 0.3 1.0 0˚ to 9˚ 0.25 C 20.32 (AT STAND OFF) Unit: mm 3.2 ± 0.3 5.5 ± 0.2 0 3. R Package Outline ICX423AL Sony Corporation