WINBOND W981616BH

W981616BH
512K × 2 BANKS × 16 BITS SDRAM
GENERAL DESCRIPTION
W981616BH is a high-speed synchronous dynamic random access memory (SDRAM), organized as
512K words × 2 banks × 16 bits. Using pipelined architecture and 0.175 µm process technology,
W981616BH delivers a data bandwidth of up to 332M bytes per second (-5). For different applications
the W981616BH is sorted into the following speed grades: -5, -6, and –7(L).
Accesses to the SDRAM are burst oriented. Consecutive memory location in one page can be
accessed at a burst length of 1, 2, 4, 8 or full page when a bank and row is selected by an ACTIVE
command. Column addresses are automatically generated by the SDRAM internal counter in burst
operation. Random column read is also possible by providing its address at each clock cycle. The
multiple bank nature enables interleaving among internal banks to hide the precharging time.
By having a programmable Mode Register, the system can change burst length, latency cycle,
interleave or sequential burst to maximize its performance. W981616BH is ideal for main memory in
high performance applications.
FEATURES
•
•
•
•
•
•
3.3V ±0.3V power supply
Up to 166 MHz clock frequency
524,288 words x 2 banks x 16 bits organization
Auto Refresh and Self Refresh
CAS latency: 2 and 3
Burst Length: 1, 2, 4, 8, and full page
•
•
•
•
•
•
Burst read, Single Write Mode
Byte data controlled by UDQM and LDQM
Auto-precharge and controlled precharge
4K refresh cycles/64 mS
Interface: LVTTL
Packaged in 50-pin, 400 mil TSOP II
PIN CONFIGURATION
VCC
1
50
VSS
DQ0
2
49
DQ15
DQ1
3
48
DQ14
VSS Q
4
47
VSS Q
DQ2
5
46
DQ13
DQ3
6
45
DQ12
VCCQ
7
44
VCC Q
DQ4
8
43
DQ11
DQ5
9
42
DQ10
VSS Q
10
41
VSS Q
DQ6
11
40
DQ9
DQ7
12
39
DQ8
VCCQ
13
38
VCC Q
LDQM
14
37
NC
WE
15
36
UDQM
CAS
16
35
CLK
RAS
17
34
CKE
CS
18
33
NC
BA
19
32
A9
A10
20
31
A8
A0
21
30
A7
A1
22
29
A6
A2
23
28
A5
A3
24
27
A4
VCC
25
26
VSS
-1-
Publication Release Date: February 2000
Revision A2
W981616BH
PIN DESCRIPTION
PIN NUMBER
20−24,
27−32
19
PIN NAME
FUNCTION
DESCRIPTION
A0−A10
Address
BA
Bank Select
Multiplexed pins for row and column address.
Row address: A0−A10. Column address: A0−A7.
Select bank to activate during row address latch time,
or bank to read/write during column address latch
time.
2, 3, 5, 6, 8, 9, DQ0−DQ15
11, 12, 39, 40,
42, 43, 45, 46,
48, 49
Data Input/
Output
Multiplexed pins for data input and output.
18
CS
Chip Select
Disable or enable the command decoder. When
command decoder is disabled, new command is
ignored and previous operation continues.
17
RAS
Row Address
Strobe
16
CAS
15
WE
Write Enable
Referred to RAS
UDQM/
LDQM
Input/Output
Mask
The output buffer is placed at Hi-Z (with latency of 2)
when DQM is sampled high in read cycle. In write
cycle, sampling DQM high will block the write
operation with zero latency.
35
CLK
Clock Inputs
System clock used to sample inputs on the rising
edge of clock.
34
CKE
Clock Enable CKE controls the clock activation and deactivation.
W hen CKE is low, Power Down mode, Suspend
mode, or Self Refresh mode is entered.
1, 25
VCC
Power (+3.3V) Power for input buffers and logic circuit inside DRAM.
26, 50
VSS
36, 14
Command input. When sampled at the rising edge of
the clock, RAS , CAS and WE define the operation
to be executed.
Column
Referred to RAS
Address Strobe
Ground
Ground for input buffers and logic circuit inside
DRAM.
7, 13, 38, 44,
VCCQ
Power (+3.3V) Separated power from VCC, used for output buffers to
for I/O buffer improve noise immunity.
4, 10, 41, 47
VSSQ
Ground for I/O Separated ground from VSS, used for output buffers
buffer
to improve noise immunity.
33, 37
NC
No Connection No connection
-2-
W981616BH
BLOCK DIAGRAM
CLK
CLOCK
BUFFER
CKE
CS
CONTROL
SIGNAL
RAS
CAS
GENERATOR
COMMAND
DECODER
COLUMN DECODER
R
O
W
CELL ARRAY
D
E
C
O
D
E
R
WE
BANK #0
SENSE AMPLIFIER
A10
MODE
REGISTER
A0
A9
BA
ADDRESS
BUFFER
DQ
BUFFER
DATA CONTROL
CIRCUIT
DQ0
DQ15
LDQM
UDQM
REFRESH
COUNTER
COLUMN
COUNTER
COLUMN DECODER
R
O
W
D
E
C
O
D
E
R
CELL ARRAY
BANK #1
SENSE AMPLIFIER
Note: The cell array configuration is 2048 * 256 * 16
-3-
Publication Release Date: February 2000
Revision A2
W981616BH
FUNCTIONAL DESCRIPTION
Power Up and Initialization
The default power up state of the mode register is unspecified. The following power up and
initialization sequence need to be followed to guarantee the device being preconditioned to each user
specific needs during power up, all VCC and VCCQ pins must be ramp up simultaneously to the
specified voltage when the input signals are held in the "NOP" state. The power up voltage must not
exceed VCC +0.3V on any of the input pins or VCC supplies. After power up, an initial pause of 200 µS
is required followed by a precharge of all banks using the precharge command. To prevent data
contention on the DQ bus during power up, it is required that the DQM and CKE pins be held high
during the initial pause period. Once all banks have been precharged, the Mode Register Set
Command must be issued to initialize the Mode Register. An additional eight Auto Refresh cycles
(CBR) are also required before or after programming the Mode Register to ensure proper subsequent
operation.
Programming Mode Register
After initial power up, the Mode Register Set Command must be issued for proper device operation.
All banks must be in a precharged state and CKE must be high at least one cycle before the Mode
Register Set Command can be issued. The Mode Register Set Command is activated by the low
signals of RAS , CAS , CS and WE at the positive edge of the clock. The address input data during
this cycle defines the parameters to be set as shown in the Mode Register Operation table. A new
command may be issued following the mode register set command once a delay equal to tRSC has
elapsed. Please refer to the next page for Mode Register Set Cycle and Operation Table.
Bank Activate Command
The Bank Activate command must be applied before any Read or Write operation can be executed.
The operation is similar to RAS activate in EDO DRAM. The delay from when the Bank Activate
command is applied to when the first read or write operation can begin must not be less than the RAS
to CAS delay time (tRCD). Once a bank has been activated it must be precharged before another Bank
Activate command can be issued to the same bank. The minimum time interval between successive
Bank Activate commands to the same bank is determined by the RAS cycle time of the device (tRC).
The minimum time interval between interleaved Bank Activate commands (Bank A to Bank B and
vice versa) is the Bank-to-Bank delay time (tRRD). The maximum time that each bank can be held
active is specified as tRAS(max.).
Read and Write Access Modes
After a bank has been activated, a read or write cycle can be followed. This is accomplished by
setting RAS high and CAS low at the clock rising edge after minimum of tRCD delay. WE pin
voltage level defines whether the access cycle is a read operation ( WE high), or a write operation
( WE low). The address inputs determine the starting column address. Reading or writing to a
different row within an activated bank requires the bank be precharged and a new Bank Activate
command be issued. When more than one bank is activated, interleaved bank Read or Write
operations are possible. By using the programmed burst length and alternating the access and
precharge operations between multiple banks, seamless data access operation among many different
pages can be realized. Read or Write Commands can also be issued to the same bank or between
active banks on every clock cycle.
-4-
W981616BH
Burst Read Command
The Burst Read command is initiated by applying logic low level to CS and CAS while holding
RAS and WE high at the rising edge of the clock. The address inputs determine the starting column
address for the burst. The Mode Register sets type of burst (sequential or interleave) and the burst
length (1, 2, 4, 8, full page) during the Mode Register Set Up cycle. Table 2 and 3 in the next page
explain the address sequence of interleave mode and sequence mode.
Burst Write Command
The Burst Write command is initiated by applying logic low level to CS , CAS and WE while
holding RAS high at the rising edge of the clock. The address inputs determine the starting column
address. Data for the first burst write cycle must be applied on the DQ pins on the same clock cycle
that the Write Command is issued. The remaining data inputs must be supplied on each subsequent
rising clock edge until the burst length is completed. Data supplied to the DQ pins after burst finishes
will be ignored.
Read Interrupted by a Read
A Burst Read may be interrupted by another Read Command. When the previous burst is interrupted,
the remaining addresses are overridden by the new read address with the full burst length. The data
from the first Read Command continues to appear on the outputs until the CAS latency from the
interrupting Read Command the is satisfied.
Read Interrupted by a Write
To interrupt a burst read with a Write Command, DQM may be needed to place the DQs (output
drivers) in a high impedance state to avoid data contention on the DQ bus. If a Read Command will
issue data on the first and second clocks cycles of the write operation, DQM is needed to insure the
DQs are tri-stated. After that point the Write Command will have control of the DQ bus and DQM
masking is no longer needed.
Write Interrupted by a Write
A burst write may be interrupted before completion of the burst by another Write Command. When
the previous burst is interrupted, the remaining addresses are overridden by the new address and
data will be written into the device until the programmed burst length is satisfied.
Write Interrupted by a Read
A Read Command will interrupt a burst write operation on the same clock cycle that the Read
Command is activated. The DQs must be in the high impedance state at least one cycle before the
new read data appears on the outputs to avoid data contention. When the Read Command is
activated, any residual data from the burst write cycle will be ignored.
Burst Stop Command
A Burst Stop Command may be used to terminate the existing burst operation but leave the bank
open for future Read or Write Commands to the same page of the active bank, if the burst length is
full page. Use of the Burst Stop Command during other burst length operations is illegal. The Burst
-5-
Publication Release Date: February 2000
Revision A2
W981616BH
Stop Command is defined by having RAS and CAS high with CS and WE low at the rising edge
of the clock. The data DQs go to a high impedance state after a delay, which is equal to the CAS
Latency in a burst read cycle, interrupted by Burst Stop. If a Burst Stop Command is issued during a
full page burst write operation, then any residual data from the burst write cycle will be ignored.
Addressing Sequence of Sequential Mode
A column access is performed by increasing the address from the column address, which is input to
the device. The disturb address is varied by the Burst Length as shown in Table 2.
Table 2 Address Sequence of Sequential Mode
DATA
Access Address
Burst Length
Data 0
n
BL = 2 (disturb address is A0)
Data 1
n+1
No address carry from A0 to A1
Data 2
n+2
BL = 4 (disturb addresses are A0 and A1)
Data 3
n+3
No address carry from A1 to A2
Data 4
n+4
Data 5
n+5
BL = 8 (disturb addresses are A0, A1 and A2)
Data 6
n+6
No address carry from A2 to A3
Data 7
n+7
Addressing Sequence of Interleave Mode
A column access is started in the input column address and is performed by inverting the address bit
in the sequence shown in Table 3.
Table 3 Address Sequence of Interleave Mode
DATA
Access Address
Bust Length
Data 0
A8 A7 A6 A5 A4 A3 A2 A1 A0
BL = 2
Data 1
A8 A7 A6 A5 A4 A3 A2 A1 A0
Data 2
A8 A7 A6 A5 A4 A3 A2 A1 A0
Data 3
A8 A7 A6 A5 A4 A3 A2 A1 A0
Data 4
A8 A7 A6 A5 A4 A3 A2 A1 A0
Data 5
A8 A7 A6 A5 A4 A3 A2 A1 A0
Data 6
A8 A7 A6 A5 A4 A3 A2 A1 A0
Data 7
A8 A7 A6 A5 A4 A3 A2 A1 A0
-6-
BL = 4
BL = 8
W981616BH
Auto-precharge Command
If A10 is set to high when the Read or Write Command is issued, then the auto-precharge function is
entered. During auto-precharge, a Read Command will execute as normal with the exception that the
active bank will begin to precharge automatically before all burst read cycles have been completed.
Regardless of burst length, it will begin a certain number of clocks prior to the end of the scheduled
burst cycle. The number of clocks is determined by CAS latency.
A Read or Write Command with auto-precharge can not be interrupted before the entire burst
operation is completed. Therefore, use of a Read, Write, or Precharge Command is prohibited during
a read or write cycle with auto-precharge. Once the precharge operation has started, the bank cannot
be reactivated until the Precharge time (tRP) has been satisfied. Issue of Auto-Precharge command is
illegal if the burst is set to full page length. If A10 is high when a Write Command is issued, the Write
with Auto-Precharge function is initiated. The SDRAM automatically enters the precharge operation
one clock delay from the last burst write cycle. This delay is referred to as Write tDPL. The bank
undergoing auto-precharge can not be reactivated until tDPL and tRP are satisfied. This is referred to as
tDAL, Data-in to Active delay (tDAL = tDPL + tRP). When using the Auto-precharge Command, the interval
between the Bank Activate Command and the beginning of the internal precharge operation must
satisfy tRAS(min).
Precharge Command
The Precharge Command is used to precharge or close a bank that has been activated. The
Precharge Command is entered when CS , RAS and WE are low and CAS is high at the rising
edge of the clock. The Precharge Command can be used to precharge each bank separately or all
banks simultaneously. Three address bits, A10, and BA, are used to define which bank(s) is to be
precharged when the command is issued. After the Precharge Command is issued, the precharged
bank must be reactivated before a new read or write access can be executed. The delay between the
Precharge Command and the Activate Command must be greater than or equal to the Precharge
time (tRP).
Self Refresh Command
The Self-Refresh Command is defined by having CS , RAS , CAS and CKE held low with WE high
at the rising edge of the clock. All banks must be idle prior to issuing the Self-Refresh Command.
Once the command is registered, CKE must be held low to keep the device in Self-Refresh mode.
When the SDRAM has entered Self Refresh mode all of the external control signals, except CKE, are
disabled. The clock is internally disabled during Self-Refresh Operation to save power. The device
will exit Self-Refresh operation after CKE is returned high. Any subsequent commands can be issued
after tRC from the end of Self Refresh command.
If, during normal operation, Auto-Refresh cycles are issued in bursts (as opposed to being evenly
distributed), a burst of 4,096 Auto-Refresh cycles should be completed just prior to entering and just
after exiting the Self-Refresh mode.
Power Down Mode
The Power Down mode is initiated by holding CKE low. All of the receiver circuits except CKE are
gated off to reduce the power. The Power Down mode does not perform any refresh operations;
therefore the device can not remain in Power Down mode longer than the Refresh period (tREF) of the
device.
-7-
Publication Release Date: February 2000
Revision A2
W981616BH
The Power Down mode is exited by bringing CKE high. When CKE goes high, a No Operation
Command is required on the next rising clock edge, depending on tCK. The input buffers need to be
enabled with CKE held high for a period equal to tCES(min) + tCK(min).
No Operation Command
The No Operation Command should be used in cases when the SDRAM is in an idle or a wait state to
prevent the SDRAM from registering any unwanted commands between operations. A No Operation
Command is registered when CS is low with RAS , CAS , and WE held high at the rising edge of
the clock. A No Operation Command will not terminate a previous operation that is still executing,
such as a burst read or write cycle.
Deselect Command
The Deselect Command performs the same function as a No Operation Command. Deselect
Command occurs when CS is brought high, the RAS , CAS , and WE signals become don't cares.
Clock Suspend Mode
During normal access mode, CKE must be held high enabling the clock. When CKE is registered low
while at least one of the banks is active, Clock Suspend Mode is entered. The Clock Suspend mode
deactivates the internal clock and suspends any clocked operation that was currently being executed.
There is a one-clock delay between the registration of CKE low and the time at which the SDRAM
operation suspends. While in Clock Suspend mode, the SDRAM ignores any new commands that are
issued. The Clock Suspend mode is exited by bringing CKE high. There is a one-clock cycle delay
from when CKE returns high to when Clock Suspend mode is exited.
-8-
W981616BH
TABLE OF OPERATING MODES
Fully synchronous operations are performed to latch the commands at the positive edges of CLK.
Table 1 shows the truth table for the operation commands.
TABLE 1 TRUTH TABLE (NOTE 1, 2)
Command
Device
State
CKEn-1
CKEn
DQM
BA
A10
A9-0
CS
RAS
CAS
WE
Bank Active
Idle
H
X
X
V
V
V
L
L
H
H
Bank Precharge
Any
H
X
X
V
L
X
L
L
H
L
Precharge All
Any
H
X
X
X
H
X
L
L
H
L
Write
Active (3)
H
X
X
V
L
V
L
H
L
L
Write with
Autoprecharge
Active (3)
H
X
X
V
H
V
L
H
L
L
Read
Active (3)
H
X
X
V
L
V
L
H
L
H
Read with
Autoprecharge
Active (3)
H
X
X
V
H
V
L
H
L
H
Idle
H
X
X
V
V
V
L
L
L
L
Any
H
X
X
X
X
X
L
H
H
H
Active (4)
H
X
X
X
X
X
L
H
H
L
Mode Register Set
No-Operation
Burst Stop
Device Deselect
Any
H
X
X
X
X
X
H
X
X
X
Auto-Refresh
Idle
H
H
X
X
X
X
L
L
L
H
Self-Refresh Entry
Idle
H
L
X
X
X
X
L
L
L
H
Self-Refresh Exit
Idle
(S.R)
L
L
H
H
X
X
X
X
X
X
X
X
H
L
X
H
X
H
X
X
Clock Suspend Mode
Entry
Active
H
L
X
X
X
X
X
X
X
X
Idle
Active (5)
H
H
L
L
X
X
X
X
X
X
X
X
H
L
X
H
X
H
X
X
Clock Suspend Mode
Exit
Active
L
H
X
X
X
X
X
X
X
X
Power Down Mode Exit
Any
(Power
down)
L
L
H
H
X
X
X
X
X
X
X
X
H
X
X
X
L
H
H
X
Data Write/Output
Enable
Active
H
X
L
X
X
X
X
X
X
X
Data Write/Output
Disable
Active
X
H
X
X
X
X
X
X
X
Power Down Mode
Entry
H
Notes:
(1) V = Valid, X = Don't care, L = Low Level, H = High Level
(2) CKEn signal is input level when commands are provided.
(3) These are state of bank designated by BA signals.
(4) Device state is full page burst operation.
(5) Power Down Mode can not be entered in the burst cycle.
When this command asserts in the burst cycle, device state is clock suspend mode.
-9-
Publication Release Date: February 2000
Revision A2
W981616BH
ABSOLUTE MAXIMUM RATINGS
PARAMETER
Input, Output Voltage
SYMBOL
VIN, VOUT
-0.3 − 4.6
UNIT
V
NOTES
1
Power Supply Voltage
VCC, VCCQ
-0.3 − 4.6
V
1
Operating Temperature
TOPR
0 − 70
°C
1
Storage Temperature
TSTG
-55 − 150
260
°C
1
°C
1
1
50
W
mA
1
1
Soldering Temperature (10s)
TSOLDER
Power Dissipation
Short Circuit Output Current
PD
RATING
IOUT
Note: Exposure to conditions beyond those listed under Absolute Maximum Ratings may adversely affect the life and reliability
of the device.
RECOMMENDED DC OPERATING CONDITIONS
(TA = 0 to 70°C)
PARAMETER
SYM.
MIN.
TYP.
MAX.
UNIT
NOTES
VCC
3.0
3.3
3.6
V
2
VCCQ
3.0
3.3
3.6
V
2
Input High Voltage
VIH
2.0
-
VCC +0.3
V
2
Input Low Voltage
VIL
-0.3
-
0.8
V
2
Power Supply Voltage
Power Supply Voltage (for I/O
Buffer)
Note: VIH (max.) = VCC/VCCQ +1.2V for pulse width < 5 nS
VIL (min.) = VSS/VSSQ -1.2V for pulse width < 5 nS
CAPACITANCE
(VCC = 3.3V, TA = 25 °C, f = 1MHz)
PARAMETER
Input Capacitance (A0 to A10, BA, CS , RAS , CAS , WE ,
UDQM, LDQM, CKE)
SYM.
MIN.
MAX.
UNIT
CI
-
4
pf
-
4
pf
-
6.5
pf
Input Capacitance (CLK)
Input/Output capacitance (DQ0 to DQ15)
CIO
Note: These parameters are periodically sampled and not 100% tested
- 10 -
W981616BH
DC CHARACTERISTICS
(VCC = 3.3V ±0.3V, TA = 0°~70°C)
PARAMETER
Operating Current
tCK = min., t RC = min.
Active precharge command
cycling without burst
operation
Standby Current
1 bank operation
SYM
.
ICC1
-5
MAX.
100
-6
MAX.
90
-7
MAX.
80
-7L
MAX.
80
UNIT NOTES
CKE = VIH
ICC2
45
35
30
30
3
CKE = VIL
ICC2P
1
1
1
1
3
CKE = VIH
ICC2S
8
8
8
8
CKE = VIL
ICC2P
1
1
1
1
3
tCK = min., CS = VIH
VIH /L = VIH (min.) /VIL
(max.)
Bank: inactive state
(Power down mode)
Standby Current
CLK = VIL, CS = VIH
VIH/L = VIH (min.) /VIL (max.)
Bank: inactive state
(Power down mode)
No Operating Current
mA
S
CKE = VIH
ICC3
55
50
45
45
CKE = VIL
ICC3P
3
3
3
3
(t CK = min.)
ICC4
190
165
145
145
3, 4
(t CK = min.)
ICC5
125
120
110
110
3
(CKE = 0.2V)
ICC6
1
1
1
0.45
tCK = min., CS = VIH (min.)
Bank: active state (2 banks)
(Power Down mode)
Burst Operating Current
Read/ Write command cycling
Auto Refresh Current
Auto refresh command cycling
Self Refresh Current
Self refresh mode
PARAMETER
SYM.
MIN.
MAX.
UNIT
Input Leakage Current
(0V ≤ VIN ≤ VCC, all other pins not under test = 0V)
II(L)
-5
5
µA
Output Leakage Current
(Output disable , 0V ≤ VOUT ≤ VCCQ )
IO(L)
-5
5
µA
LVTTL OutputT ″H″ Level Voltage
(IOUT = -2 mA)
VOH
2.4
-
V
LVTTL Output ″L″ Level Voltage
(IOUT = 2 mA)
VOL
-
0.4
V
- 11 -
NOTES
Publication Release Date: February 2000
Revision A2
W981616BH
AC CHARACTERISTICS
(VCC = 3.3V ±0.3V, VSS = 0V, TA = 0 to 70 °C, Notes: 5, 6, 7, 8)
PARAMETER
-5
SYM.
MIN.
-6
MAX.
MIN.
-7(L)
MAX.
MAX.
Ref/Active to Ref/Active Command Period
tRC
54
Active to Precharge Command Period
tRAS
40
Active to Read/Write Command Delay
Time
tRCD
14
20
20
Read/Write(a) to Read/Write(b)Command
Period
tCCD
1
1
1
Cycle
Precharge to Active(b) Command Period
tRP
14
20
20
nS
Active(a) to Active(b) Command Period
tRPD
10
14
16
Write Recovery Time
tWR
7
8
10
5
6
7
CL* = 2
CL* = 3
CLK Cycle Time
CL* = 2
tCK
CL* = 3
70
MIN.
UNIT
100000
48
72
100000
48
1000
8
1000
10
1000
5
1000
6
1000
7
1000
tCH
2
2
2
CLK Low Level Width
tCL
2
2
2
CL* = 2
100000
7
CLK High Level Width
Access Time from CLK
nS
tAC
CL* = 3
4.5
5.5
5.5
4.5
5
5
Output Data Hold Time
tOH
2.75
2.75
Output Data High Impedance Time
tHZ
2.75
Output Data Low Impedance Time
tLZ
0
Power Down Mode Entry Time
tSB
0
5
0
6
0
7
Transition Time of CLK (Rise and Fall)
tT
0.5
10
0.5
10
0.5
10
Data-in-Set-up Time
tDS
1.5
1.5
1.5
Data-in Hold Time
tDH
1
1
1
Address Set-up Time
tAS
1.5
1.5
1.5
Address Hold Time
tAH
1
1
1
CKE Set-up Time
tCKS
1.5
1.5
1.5
CKE Hold Time
tCKH
1
1
1
Command Set-up Time
tCMS
1.5
1.5
1.5
Command Hold Time
tCMH
1
1
1
Refresh Time
tREF
Mode Register Set Cycle Time
tRSC
5
2.75
(L):For low power
- 12 -
6
0
64
10
3
3
0
64
12
7
64
14
mS
nS
W981616BH
Notes:
1. Operation exceeds "ABSOLUTE MAXIMUM RATING" may cause permanent damage to the
devices.
2. All voltages are referenced to VSS
3. These parameters depend on the cycle rate and listed values are measured at a cycle rate with the
minimum values of tCK and tRC.
4. These parameters depend on the output loading conditions. Specified values are obtained with
output open.
5. Power up sequence is further described in the "Functional Description" section.
6. AC test conditions.
PARAMETER
CONDITIONS
Output Reference Level
1.4V/1.4V
Output Load
See diagram below
Input Signal Levels
2.4V/0.4V
Transition Time (Rise and Fall) of Input Signal
2 nS
Input Reference Level
1.4V
1.4 V
50 ohms
output
Z = 50 ohms
30pF
AC TEST LOAD
7. Transition times are measured between VIH and VIL.
8. tHZ defines the time at which the outputs achieve the open circuit condition and is not referenced
to output level.
- 13 -
Publication Release Date: February 2000
Revision A2
W981616BH
TIMING WAVEFORMS
Command Input Timing
tCL
tCK
tCH
VIH
CLK
VIL
tT
tCMS
tCMH
tCMS
tCMH
tCMS
tCMH
tCMS
tCMH
tAS
tAH
tCMH
CS
RAS
CAS
WE
A0-A10
BA
tCKS
tCKH
tCKS
tCKH
tCKS
CKE
- 14 -
tCKH
tT
tCMS
W981616BH
Read Timing
Read CAS Latency
CLK
CS
RAS
CAS
WE
A0-A10
BA
t AC
tAC
t LZ
tHZ
tOH
tOH
Valid
Data-Out
Valid
Data-Out
DQ
Read Command
Burst Length
- 15 -
Publication Release Date: February 2000
Revision A2
W981616BH
Control Timing of Input/Output Data
Input Data
(Word Mask)
CLK
tCMS
tCMH
tCMH
tCMS
DQM
tDS
tDH
tDS
Valid
Data-in
DQ0 -15
tDH
tDS
Valid
Data-in
tDH
tDS
Valid
Data-in
tDH
Valid
Data-in
(Clock Mask)
CLK
tCKH
tCKS
tDH
tDS
tCKH
tCKS
CKE
tDS
DQ0 -15
Valid
Data-in
tDH
tDS
Valid
Data-in
tDH
tDS
Valid
Data-in
tDH
Valid
Data-in
Output Data
(Output Enable)
CLK
tCMS
tCMH
tCMH
tCMS
DQM
tAC
tOH
tOH
tHZ
tAC
tOH
Valid
Data-Out
DQ0 -15
Valid
Data-Out
tAC
tLZ
tAC
tOH
Valid
Data-Out
OPEN
(Clock Mask)
CLK
tCKH
tCKS
tCKH
tCKS
CKE
tAC
tOH
DQ0 -15
tAC
tAC
tOH
tOH
Valid
Data-Out
Valid
Data-Out
- 16 -
tAC
tOH
Valid
Data-Out
W981616BH
Mode Reqister Set Cycle
tRSC
CLK
t CMS
tCMH
t CMS
t CMH
t CMS
t CMH
tCMS
t CMH
CS
RAS
CAS
WE
tAS
A0-A10
BA
tAH
Register
set data
A0
A1
Burst Length
A2
A3
Addressing Mode
A4
A5
CAS Latency
A2
0
0
0
0
1
1
1
1
A6
A7
A0
"0"
A8
"0"
Reserved
A10
"0"
BA
"0"
Reserved
A0
A0
0
1
0
1
0
1
0
1
A3
A0
0
A0
1
(Test Mode)
WriteA0
Mode
A9
A0
A1
A0
0
A0
0
A0
1
A0
1
A0
0
A0
0
A0
1
A0
1
A6
0
0
0
0
1
A5
A0 A4
A0
0
0
0
1
1
0
1
1
0
0
A9
0
1
- 17 -
next
command
Burst Length
A0
A0
Sequential
Interleave
1
1
2
2
4
4
A0
8
8
Reserved
Reserved
FullA0
Page
Addressing Mode
Sequential
Interleave
CAS Latency
Reserved
A0
Reserved
2
3
Reserved
Single Write Mode
Burst read and Burst write
Burst read and single write
Publication Release Date: February 2000
Revision A2
W981616BH
Interleaved Bank Read
(Burst Length = 4, CAS Latency = 3)
(CLK = 100 MHz)
0
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
22
23
CLK
CS
tRC
tRC
t RC
t RC
RAS
tRAS
tRP
t RAS
t RAS
tRP
t RP
t RAS
CAS
WE
BA
tRCD
A10
RAa
A0-A9
RAa
tRCD
tRCD
RBb
CBx
RBb
CAw
tRCD
RAc
RBd
RAc
CAy
RAe
RBd
CBz
RAe
DQM
CKE
aw0
t RRD
Bank #0 Active
Bank #1
t AC
tAC
t AC
DQ
aw1
aw2
aw3
bx0
Precharge
Active
bx2
bx3
Active
- 18 -
cy1
cy2
cy3
tRRD
Precharge
Read
Precharge
Read
t AC
cy0
tRRD
tRRD
Read
bx1
Active
Read
Active
W981616BH
Interleaved Bank Read
(Burst Length = 4, CAS Latency = 3, Autoprecharge)
(CLK = 100 MHz)
0
1
2
3
4
5
6
7
8
9
11
10
12
13
14
15
16
17
18
19
20
21
22
23
CLK
CS
tRC
tRC
tRC
tRC
RAS
tRAS
tRP
tRAS
tRAS
tRP
tRP
tRAS
CAS
WE
BA
tRCD
A10
RAa
A0-A9
RAa
tRCD
tRCD
RBb
CAw
tRCD
CBx
RBb
RAe
RBd
RAc
CAy
RAc
CBz
RBd
RAe
DQM
CKE
tAC
DQ
aw0
tRRD
Bank #0
Bank #1
Active
aw1
aw2
aw3
bx0
AP*
Active
bx1
bx2
bx3
tAC
cy0
cy1
tRRD
tRRD
Read
tAC
tAC
Active
cy3
dz0
tRRD
Read
AP*
Read
cy2
AP*
Active
Active
Read
* AP is the internal precharge start timing
- 19 -
Publication Release Date: February 2000
Revision A2
W981616BH
Interleaved Bank Read
(Burst Length = 8, CAS Latency = 3)
(CLK = 100 MHz)
0
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
CLK
CS
t RC
tRC
tRC
RAS
tRAS
tRP
tRAS
tRP
tRAS
tRP
CAS
WE
BA
t RCD
A10
A0-A9
tRCD
RAa
RAa
t RCD
RAc
RBb
CAx
RBb
CBy
RAc
CAz
DQM
CKE
tAC
DQ
tAC
ax0
ax1
t RRD
Bank #0
Bank #1
Active
ax2
ax3
ax4
ax6
by0
by1
by4
by5
by6
by7
tRRD
Read
Precharge
ax5
tAC
Precharge
Active
Read
- 20 -
Active
Read
Precharge
CZ0
22
23
W981616BH
Interleaved Bank Read
(Burst Length = 8, CAS Latency = 3, Autoprecharge)
(CLK = 100 MHz)
0
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
22
23
CLK
tRC
CS
t RC
RAS
t RAS
t RP
t RAS
t RAS
tRP
CAS
WE
BA
tRCD
A10
RAa
A0-A9
RAa
tRCD
tRCD
RAc
RBb
CAx
RBb
RAc
CBy
CAz
DQM
CKE
tCAC
tCAC
DQ
ax0
ax1
ax2
tRRD
Bank #0
Bank #1
Active
ax3
ax4
ax5
ax6
ax7
by0
by1
tCAC
by4
by5
by6
CZ0
t RRD
AP*
Read
Active
Active
Read
Read
AP*
* AP is the internal precharge start timing
- 21 -
Publication Release Date: February 2000
Revision A2
W981616BH
Interleaved Bank Write
(Burst Length = 8)
(CLK = 100 MHz)
0
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
22
23
CLK
CS
tRC
RAS
tRAS
tRAS
tRP
tRP
tRAS
CAS
tRCD
tRCD
tRCD
WE
BA
A10
A0-A9
RBb
RAa
RAa
CAx
RAc
RBb
CBy
RAc
CAz
DQM
CKE
DQ
ax0
ax1
ax4
ax5
ax6
ax7
by0
tRRD
Bank #0
Bank #1
Active
by1
by2
by3
by4
by5
by6
by7
CZ0
CZ1
CZ2
tRRD
Precharge
Write
Active
Write
- 22 -
Active
Write
Precharge
W981616BH
Interleaved Bank Write
(Burst Length = 8, Autoprecharge)
(CLK = 100 MHz)
0
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
22
23
CLK
CS
tRC
RAS
tRP
tRAS
tRAS
CAS
WE
BA
tRCD
A10
RAa
A0-A9
RAa
tRCD
tRCD
RBb
CAx
RAb
CBy
RBb
CAz
RAb
DQM
CKE
DQ
ax0
ax1
ax4
ax5
ax6
ax7
by0
by1
tRRD
Bank #0 Active
Bank #1
by2
by3
by4
by5
by6
by7
CZ0
CZ1
CZ2
tRRD
AP*
Write
Active
Active
Write
AP*
Write
* AP is the internal precharge start timing
- 23 -
Publication Release Date: February 2000
Revision A2
W981616BH
Page Mode Read
(Burst Length = 4, CAS Latency = 3)
(CLK = 100 MHz)
0
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
22
CLK
tCCD
tCCD
tCCD
CS
tRAS
tRP
tRAS
tRP
RAS
CAS
WE
BA
tRCD
A10
RAa
A0-A9
RAa
tRCD
RBb
CAI
RBb
CBx
CAm
CAy
CBz
DQM
CKE
tAC
DQ
tAC
tAC
a0
a1
a2
a3
bx0
bx1
Ay0
tAC
Ay1
Ay2
tAC
am0
am1
am2
bz0
bz1
tRRD
Bank #0
Bank #1
Active
Read
Active
Read
Read
Read
Precharge
Read
* AP is the internal precharge start timing
- 24 -
AP*
bz2
bz3
23
W981616BH
Page Mode Read/Write
(Burst Length = 4, CAS Latency = 3)
(CLK = 100 MHz)
0
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
22
23
CLK
CS
t RAS
t RP
RAS
CAS
WE
BA
t RCD
A10
A0-A9
RAa
RAa
CAx
CAy
DQM
CKE
tAC
DQ
t WR
ax0
Q Q
Bank #0
Active
ax1
ax3
ax2
Q
Q
ax5
ax4
Q
Q
Read
ay1
ay0
D
D
Write
ay2
D
ay4
ay3
D
D
Precharge
Bank #1
- 25 -
Publication Release Date: February 2000
Revision A2
W981616BH
AutoPrecharge Read
(Burst Length = 4, CAS Latency = 3)
(CLK = 100 MHz)
CLK
0
1
2
3
4
6
5
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
22
23
CS
tRC
tRC
RAS
tRAS
tRP
tRAS
tRP
CAS
WE
BA
tRCD
A10
RAa
A0-A9
RAa
tRCD
RAb
CAw
RAb
CAx
DQM
CKE
tAC
DQ
Bank #0
tAC
aw0
Active
Read
aw1
AP*
aw2
aw3
bx0
Active
Read
Bank #1
* AP is the internal precharge start timing
- 26 -
bx1
AP*
bx2
bx3
W981616BH
AutoPrecharge Write
(Burst Length = 4)
(CLK = 100 MHz)
0
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
22
23
CLK
CS
tRC
tRC
RAS
tRAS
tRP
tRAS
t RP
CAS
WE
BS0
BS1
tRCD
A10
RAa
A0-A9,
A11
RAa
tRCD
RAb
CAw
RAb
RAc
CAx
RAc
DQM
CKE
DQ
Bank #0
aw0
Active
aw1
Write
aw2
bx0
aw3
AP*
Active
bx1
Write
bx2
bx3
AP*
Active
Bank #1
Bank #2
Idle
Bank #3
* AP is the internal precharge start timing
- 27 -
Publication Release Date: February 2000
Revision A2
W981616BH
AutoRefresh Cycle
(CLK = 100 MHz)
0
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
CLK
t RP
t RC
t RC
CS
RAS
CAS
WE
BA
A10
A0-A9
DQM
CKE
DQ
All Banks
Prechage
Auto
Refresh
Auto Refresh (Arbitrary Cycle)
- 28 -
21
22
23
W981616BH
SelfRefresh Cycle
(CLK = 100 MHz)
0
1
2
3
4
6
5
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
22
23
CLK
CS
tRP
RAS
CAS
WE
BA
A10
A0-A9
DQM
tCKS
tCKS
tSB
CKE
tCKS
DQ
tRC
Self Refresh Cycle
All Banks
Precharge
No Operation Cycle
Self Refresh
Entry
Arbitrary Cycle
- 29 -
Publication Release Date: February 2000
Revision A2
W981616BH
Bust Read and Single Write
(Burst Lenght = 4, CAS Latency = 3)
(CLK = 100 MHz)
0
1
2
3
4
6
5
7
8
9
11
10
12
13
14
15
16
17
18
19
21
20
CLK
CS
RAS
CAS
tRCD
WE
BA
A10
RBa
A0-A9
RBa
CBv
CBw
CBx
CBy
CBz
DQM
CKE
tAC
DQ
Bank #0 Active
Bank #1
t AC
av0
av1
av2
av3
aw0
ax0
ay0
az0
az1
az2
az3
Q
Q
Q
Q
D
D
D
Q
Q
Q
Q
Read
Single Write
- 30 -
Read
22
23
W981616BH
PowerDown Mode
(CLK = 100 MHz)
0
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
22
23
CLK
CS
RAS
CAS
WE
BA
A10
RAa
A0-A9
RAa
RAa
CAa
RAa
CAx
DQM
t SB
tSB
CKE
tCKS
tCKS
DQ
ax0
Active
t CKS
tCKS
ax1
ax2
NOP
Read
ax3
Precharge
NOPActive
Precharge Standby
Power Down mode
Active Standby
Power Down mode
Note: The PowerDown Mode is entered by asserting CKE "low".
All Input/Output buffers (except CKE buffers) are turned off in the PowerDown mode.
When CKE goes high, command input must be No operation at next CLK rising edge.
- 31 -
Publication Release Date: February 2000
Revision A2
W981616BH
Autoprecharge Timing
(Read Cycle)
0
1
Read
AP
2
3
4
5
6
7
8
9
10
11
(1) CAS Latency=2
( a ) burst length = 1
Command
DQ
Act
tRP
Q0
( b ) burst length = 2
Command
Read
AP
Act
tRP
DQ
Q0
Q1
( c ) burst length = 4
Command
Read
AP
Act
tRP
DQ
Q0
Q1
Q2
Q3
( d ) burst length = 8
Command
AP
Read
Q0
DQ
Q1
Q2
Q3
Q4
Q5
Q6
Act
tRP
Q7
(2) CAS Latency=3
( a ) burst length = 1
Command
Read
AP
Act
tRP
Q0
DQ
( b ) burst length = 2
Command
Read
AP
Q0
DQ
Act
tRP
Q1
( c ) burst length = 4
Command
Read
AP
Act
tRP
Q0
DQ
Q1
Q2
Q3
( d ) burst length = 8
Command
Read
AP
DQ
Q0
Q1
Q2
Q3
Q4
Q5
Act
tRP
Q6
Q7
Note:
Read
represents the Read with Auto precharge command.
AP
represents the start of internal precharging.
Act
represents the Bank Activate command.
When the Auto precharge command is asserted, the period from Bank Activate command to
the start of internal precgarging must be at least tRAS(min).
- 32 -
W981616BH
Autoprecharge Timing
(Write Cycle)
0
1
2
3
4
5
6
7
8
9
10
11
(1) CAS Latency = 2
( a ) burst length = 1
Command
Write
AP
Act
tWR
DQ
tRP
D0
( b ) burst length = 2
Command
AP
Write
Act
tWR
DQ
D0
tRP
D1
( c ) burst length = 4
Command
AP
Write
tWR
DQ
D0
D1
D2
Act
tRP
D3
( d ) burst length = 8
Command
Write
AP
tWR
DQ
D0
D1
D2
D3
D4
D5
D6
Act
tRP
D7
(2) CAS Latency = 3
( a ) burst length = 1
Command
Write
AP
Act
tWR
DQ
( b ) burst length = 2
Command
tRP
D0
Write
Act
AP
tWR
DQ
D0
tRP
D1
( c ) burst length = 4
Command
Write
Act
AP
tWR
DQ
D0
D1
D2
tRP
D3
( d ) burst length = 8
Command
AP
Write
tWR
DQ
D0
D1
D2
D3
D4
D5
D6
Act
tRP
D7
Note:
Write
represents the Write with Auto precharge command.
AP
represents the start of internal precharging.
Act
represents the Bank Activate command.
When the Auto precharge command is asserted, the period from Bank Activate
command to the start of internal precgarging must be at least tRAS(min) .
- 33 -
Publication Release Date: February 2000
Revision A2
W981616BH
Timing Chart of Write-to-Read Cycle
In the case of Burst Length = 4
0
1
2
Write
Read
3
4
5
6
7
8
9
Q0
Q1
Q2
Q3
Q0
Q1
Q2
Q3
Q0
Q1
Q2
Q3
Q0
Q1
Q2
6
7
8
10
11
(1) CAS Latency = 2
( a ) Command
DQM
D0
DQ
( b ) Command
Read
Write
DQM
DQ
D0
D1
Write
Read
(2) CAS Latency = 3
( a ) Command
DQM
D0
DQ
Write
( b ) Command
Read
DQM
D0
DQ
D1
Q3
Timing Chart of Burst Stop Cycle
(Burst Stop Command)
0
1
2
3
4
5
(3) Read cycle
( a ) CAS latency =2
Command
Read
BST
DQ
( b ) CAS latency = 3
Command
Q0
Q1
Q2
Q3
Q4
BST
Read
Q0
DQ
Q1
Q2
Q3
(2) Write cycle
Command
DQ
BST
Write
D0
Note:
D1
BST
D2
D3
D4
represents the Burst stop command
- 34 -
Q4
9
10
11
W981616BH
Timing Chart of Burst Stop Cycle (Prechare Command)
(In the case of Burst Length = 8)
0
1
2
3
4
5
6
7
8
9
10
11
(1) Read cycle
( a ) CAS latency = 2
Commad
Read
PRCG
Q0
DQ
Q1
Q3
Q2
Q4
( b ) CAS latency = 3
Commad
PRCG
Read
Q0
DQ
Q2
Q1
Q3
Q4
(2) Write cycle
( a ) CAS latency = 2
Commad
PRCG
tWR
Write
DQM
DQ
D0
D1
D2
D3
D4
( b ) CAS latency = 3
Commad
PRCG
tWR
Write
DQM
DQ
D0
Note:
D1
PRCG
D2
D3
D4
represents the Precharge command
- 35 -
Publication Release Date: February 2000
Revision A2
W981616BH
CKE/DQM Input Timing
(Write Cycle)
CLK cycle No.
1
2
3
D1
D2
D3
4
5
6
7
External
CLK
Internal
CKE
DQM
DQ
D5
DQM MASK
D6
CKE MASK
(1)
CLK cycle No.
1
2
3
D1
D2
D3
4
5
6
7
External
CLK
Internal
CKE
DQM
DQ
DQM MASK
D5
D6
5
6
7
D4
D5
D6
CKE MASK
(2)
CLK cycle No.
1
2
3
D1
D2
D3
4
External
CLK
Internal
CKE
DQM
DQ
CKE MASK
(3)
- 36 -
W981616BH
CKE/DQM Input Timing
(Read Cycle)
CLK cycle No.
1
2
3
4
Q1
Q2
Q3
Q4
5
6
7
External
CLK
Internal
CKE
DQ
M
DQ
Q6
Open
Open
(1)
CLK cycle No.
1
2
3
Q1
Q2
Q3
4
5
6
7
External
CLK
Internal
CKE
DQM
DQ
Q6
Q4
Open
(2)
CLK cycle No.
1
2
Q1
Q2
3
4
5
6
7
Q4
Q5
Q6
External
CLK
Internal
CKE
DQ
M
DQ
Q3
(3)
- 37 -
Publication Release Date: February 2000
Revision A2
W981616BH
Self Refresh/Power Down Mode Exit Timing
Asynchronous Control
Input Buffer turn on time ( Power down mode exit time ) is specified by C
t KS (min) + tCK (min)
A ) tCK < tCKS(min)+tCK(min)
t CK
CLK
CKE
tCKS(min)+tCK(min)
NOP
Command
Command
Input Buffer Enable
B) tCK >= tCKS(min) + tCK (min)
tCK
CLK
tCKS(min)+tCK(min)
CKE
Command
Command
Input Buffer Enable
Note:
All Input Buffer(Include CLK Buffer) are turned off in the Power Down mode
and Self Refresh mode
NOP
Command
Represents the No-Operation command
Represents one command
- 38 -
W981616BH
PACKAGE DIMENSIONS
50L-TSOP (II) 400 mill
50
26
E
1
HE
25
e
b
C
D
q
L
A2 A
L1
A1
ZD
SEATING PLANE
Y
Controlling Dimension: Millimeters
DIMENSION(MM)
SYM.
MIN.
NOM.
MAX.
DIMENSION(INCH)
MIN.
NOM.
MAX.
A1
0.05
0.10
1.20
0.15
0.002
0.004
0.047
0.006
A2
b
0.90
1.00
1.10
0.035
0.039
0.043
c
0.30
0.10
0.15
0.45
0.20
0.012
0.004
0.006
0.018
0.008
D
20.82
20.95
21.08
0.820
0.825
0.830
E
HE
10.03
10.16
10.29
0.395
0.400
0.405
11.56
11.76
11.96
0.455
0.463
0.471
A
0.80
e
L
0.40
0.50
L1
0.80
Y
ZD
0.88
θ
0.031
0.60
0.016
0.020
0.10
0o
0.024
0.031
0.004
0.031
o
10
0o
- 39 -
10 o
Publication Release Date: February 2000
Revision A2
W981616BH
Headquarters
Winbond Electronics (H.K.) Ltd.
Rm. 803, World Trade Square, Tower II,
No. 4, Creation Rd. III,
123 Hoi Bun Rd., Kwun Tong,
Science-Based Industrial Park,
Kowloon, Hong Kong
Hsinchu, Taiwan
TEL: 852-27513100
TEL: 886-3-5770066
FAX: 852-27552064
FAX: 886-3-5796096
http://www.winbond.com.tw/
Voice & Fax-on-demand: 886-2-27197006
Taipei Office
11F, No. 115, Sec. 3, Min-Sheng East Rd.,
Taipei, Taiwan
TEL: 886-2-27190505
FAX: 886-2-27197502
Note: All data and specifications are subject to change without notice.
- 40 -
Winbond Electronics North America Corp.
Winbond Memory Lab.
Winbond Microelectronics Corp.
Winbond Systems Lab.
2727 N. First Street, San Jose,
CA 95134, U.S.A.
TEL: 408-9436666
FAX: 408-5441798