XICOR X20C05J-35

APPLICATION NOTE
A V A I L A B L E
AN56
X20C05
X20C05
4K
512 x 8
High Speed AUTOSTORE™ NOVRAM
FEATURES
DESCRIPTION
•
•
The Xicor X20C05 is a 512 x 8 NOVRAM featuring a
high-speed static RAM overlaid bit-for-bit with a nonvolatile electrically erasable PROM (E2PROM). The
X20C05 is fabricated with advanced CMOS floating
gate technology to achieve high speed with low power
and wide power-supply margin. The X20C05 features
the JEDEC approved pinout for byte-wide memories,
compatible with industry standard RAMs, ROMs,
EPROMs, and E2PROMs.
•
•
•
•
•
•
Fast Access Time: 35ns, 45ns, 55ns
High Reliability
—Endurance: 1,000,000 Nonvolatile Store
Operations
—Retention: 100 Years Minimum
Power-on Recall
—E2PROM Data Automatically Recalled Into
SRAM Upon Power-up
AUTOSTORE™ NOVRAM
—User Enabled Option
—Automatically Stores SRAM Data Into the
E2PROM Array When VCC Low Threshold is
Detected
—Open Drain AUTOSTORE Status Output Pin
Software Data Protection
—Locks Out Inadvertent Store Operations
Low Power CMOS
—Standby: 250µA
Infinite E2PROM Array Recall, and RAM Read
and Write Cycles
Upward compatible with X20C16 (16K)
The NOVRAM design allows data to be easily transferred from RAM to E2PROM (store) and E2PROM to
RAM (recall). The store operation is completed in 5ms or
less and the recall operation is completed in 5µs or less.
Xicor NOVRAMS are designed for unlimited write
operations to RAM, either from the host or recalls from
E2PROM, and a minimum 1,000,000 store operations to
the E2PROM. Data retention is specified to be greater
than 100 years.
PIN CONFIGURATION
PLASTIC
CERDIP
NE
NC
4
3
2
1 32 31 30
AS
NC
WE
A7
VCC
LCC
PLCC
1
28
2
27
VCC
WE
3
26
AS
7
A6
4
25
A6
5
29
A8
5
24
A8
NC
A5
6
28
NC
A5
A4
6
23
NC
A4
7
27
NC
7
22
OE
8
26
NC
8
X20C05 21
A3
A3
A2
NC
A2
9
25
OE
9
20
CE
A1
10
24
NC
A1
A0
10
19
A0
NC
23
CE
18
I/O7
I/O6
11
11
12
22
I/O7
I/O0
12
17
I/O6
I/O1
13
16
13
21
14 15 16 17 18 19 20
I/O2
14
15
3827 FHD F02
I/O4
I/O3
V
NC
I/O1
I/O3
VSS
I/O0
I/O2
I/O5
I/O4
X20C05
(TOP VIEW)
I/O5
NE
NC
3827 FHD F03
AUTOSTORE™ NOVRAM is a trademark of Xicor, Inc.
©Xicor, Inc. 1991 - 1997 Patents Pending
3827-2.7 7/31/97 T4/C0/D0 SH
1
Characteristics subject to change without notice
X20C05
PIN DESCRIPTIONS
Nonvolatile Enable (NE)
The Nonvolatile Enable input controls the recall function
to the E2PROM array.
Addresses (A0–A8)
The Address inputs select an 8-bit memory location
during a read or write operation.
AUTOSTORE Output (AS)
AS is an open drain output which, when asserted indicates VCC has fallen below the AUTOSTORE threshold
(VASTH). AS may be wire-ORed with multiple open drain
outputs and used as an interrupt input to a microcontroller.
Chip Enable (CE)
The Chip Enable input must be LOW to enable all read/
write operations. When CE is HIGH, power consumption
is reduced.
PIN NAMES
Output Enable (OE)
The Output Enable input controls the data output buffers
and is used to initiate read and recall operations. Output
Enable LOW disables a store operation regardless of
the state of CE, WE, or NE.
Symbol
A0–A8
I/O0–I/O7
WE
CE
OE
NE
AS
VCC
VSS
NC
Data In/Data Out (I/O0–I/O7)
Data is written to or read from the X20C05 through the
I/O pins. The I/O pins are placed in the high impedance
state when either CE or OE is HIGH or when NE is LOW.
Write Enable (WE)
The Write Enable input controls the writing of data to the
RAM.
Description
Address Inputs
Data Input/Output
Write Enable
Chip Enable
Output Enable
Nonvolatile Enable
AUTOSTORE Output
+5V
Ground
No Connect
3827 PGM T01
FUNCTIONAL DIAGRAM
VCC SENSE
AS
E
R
HIGH SPEED
512 x 8
SRAM
ARRAY
ST
O
ROW
SELECT
A3–A6
R
EC
AL
L
EEPROM ARRAY
CE
OE
WE
CONTROL
LOGIC
NE
COLUMN
SELECT
&
I/OS
A0–A2
A7–A8
I/O0–I/O7
2
3827 FHD F01
X20C05
DEVICE OPERATION
The CE, OE, WE and NE inputs control the X20C05
operation. The X20C05 byte-wide NOVRAM uses a
2-line control architecture to eliminate bus contention in
a system environment. The I/O bus will be in a high
impedance state when either OE or CE is HIGH, or
when NE is LOW.
operation: the first address/data combination is
155[H]/AA[H]; the second combination is 0AA[H]/55[H];
and the final command combination is 155[H]/33[H].
This sequence of pseudo write operations will immediately initiate a store operation. Refer to the software
command timing diagrams for details on set and hold
times for the various signals.
RAM Operations
The second method of storing data is through the
AUTOSTORE command. When enabled, data is automatically stored from the RAM into the E2PROM array
whenever VCC falls below the preset AUTOSTORE
threshold. This feature is enabled by performing the first
two steps for the software store with the command
combination being 155[H]/CC[H].
RAM read and write operations are performed as they
would be with any static RAM. A read operation requires
CE and OE to be LOW with WE and NE HIGH. A write
operation requires CE and WE to be LOW with NE
HIGH. There is no limit to the number of read or write
operations performed to the RAM portion of the X20C05.
MEMORY TRANSFER OPERATIONS
There are two memory transfer operations: a recall
operation whereby the data stored in the E2PROM array
is transferred to the RAM array; and a store operation
which causes the entire contents of the RAM array to be
stored in the E2PROM array.
The AUTOSTORE feature is disabled by issuing the
three step command sequence with the command combination being 155[H]/CD[H]. The AUTOSTORE feature
will also be reset if VCC falls below the power-up reset
threshold (approximately 3.5V) and is then raised back
into the operating range.
Recall operations are performed automatically upon
power-up and under host system control when NE, OE
and CE are LOW and WE is HIGH. The recall operation
takes a maximum of 5µs.
DATA PROTECTION
The X20C05 supports two methods of protecting the
nonvolatile data.
There are two methods of initiating a store operation.
The first is the software store command. This command
takes the place of the hardware store employed on the
X20C04. This command is issued by entering into the
special command mode: NE, CE, and WE strobe LOW
while at the same time a specific address and data
combination is sent to the device. This is a three step
—If after power-up the AUTOSTORE feature is not
enabled, no AUTOSTORE can occur.
—If after power-up no RAM write operations have occurred no store operation can be initiated. The software
store and AUTOSTORE commands will be ignored.
SYMBOL TABLE
WAVEFORM
INPUTS
OUTPUTS
Must be
steady
Will be
steady
May change
from LOW
to HIGH
Will change
from LOW
to HIGH
May change
from HIGH
to LOW
Will change
from HIGH
to LOW
Don’t Care:
Changes
Allowed
Changing:
State Not
Known
Center Line
is High
Impedance
N/A
3
X20C05
ABSOLUTE MAXIMUM RATINGS*
Temperature under Bias .................. –65°C to +135°C
Storage Temperature ....................... –65°C to +150°C
Voltage on any Pin with
Respect to VSS ....................................... –1V to +7V
D.C. Output Current ........................................... 10mA
Lead Temperature (Soldering, 10 seconds)...... 300°C
*COMMENT
Stresses above those listed under “Absolute Maximum
Ratings” may cause permanent damage to the device.
This is a stress rating only and the functional operation of
the device at these or any other conditions above those
indicated in the operational sections of this specification is
not implied. Exposure to absolute maximum rating conditions for extended periods may affect device reliability.
RECOMMENDED OPERATING CONDITIONS
Temperature
Min.
Commercial
Industrial
Military
0°C
–40°C
–55°C
Max.
+70°C
+85°C
+125°C
Supply Voltage
Limits
X20C05
5V ±10%
3827 PGM T02.1
3827 PGM T03.1
D.C. OPERATING CHARACTERISTICS (Over recommended operating conditions unless otherwise specified.)
Limits
Symbol
Parameter
Min.
Max.
Units
lCC1
VCC Current (Active)
100
mA
ICC2
ICC3
VCC Current During Store
VCC Current During
AUTOSTORE
VCC Standby Current
(TTL Input)
VCC Standby Current
(CMOS Input)
Input Leakage Current
Output Leakage Current
Input LOW Voltage
Input HIGH Voltage
Output LOW Voltage
AUTOSTORE Output
Output HIGH Voltage
5
2.5
mA
mA
10
mA
250
µA
10
10
0.8
VCC + 0.5
0.4
0.4
µA
µA
V
V
V
V
V
ISB1
ISB2
ILI
ILO
VIL(1)
VIH(1)
VOL
VOLAS
VOH
–1
2
2.4
Test Conditions
NE = WE = VIH, CE = OE = VIL
Address Inputs = 0.4V/2.4V Levels @
f = 20MHz. All I/Os = Open
All Inputs = VIH
All I/Os = Open
CE = VIH
All Other Inputs = VIH, All I/Os = Open
All Inputs = VCC – 0.3V
All I/Os = Open
VIN = VSS to VCC
VOUT = VSS to VCC, CE = VIH
IOL = 4mA
IOLAS = 1mA
IOH = –4mA
3827 PGM T04.3
POWER-UP TIMING
Symbol
tPUR(2)
tPUW(2)
Parameter
Power-Up to RAM Operation
Power-Up to Nonvolatile Operation
Max.
Units
100
5
µs
ms
3827 PGM T05
CAPACITANCE TA = +25°C, f = 1MHz, VCC = 5V.
Symbol
Test
Max.
Units
Conditions
CI/O(2)
CIN(2)
Input/Output Capacitance
Input Capacitance
10
6
pF
pF
VI/O = 0V
VIN = 0V
3827 PGM T06.2
Notes: (1) VIL min. and VIH max. are for reference only and are not tested.
(2) This parameter is periodically sampled and not 100% tested.
4
X20C05
ENDURANCE AND DATA RETENTION
Parameter
Min.
Units
Endurance
Store Cycles
Data Retention
100,000
1,000,000
100
Data Changes Per Bit
Store Cycles
Years
3827 PGM T07.1
MODE SELECTION
CE
WE
NE
OE
H
L
L
L
L
L
L
L
L
X
H
L
L
H
L
H
L
H
X
H
H
H
L
L
H
L
L
X
L
H
H
L
H
H
L
H
Mode
Not Selected
Read RAM
Write “1” RAM
Write “0” RAM
Array Recall
Software Command
Output Disabled
Not Allowed
No Operation
I/O
Power
Output High Z
Output Data
Input Data High
Input Data Low
Output High Z
Input Data
Output High Z
Output High Z
Output High Z
Standby
Active
Active
Active
Active
Active
Active
Active
Active
3827 PGM T09
EQUIVALENT A.C. LOAD CIRCUIT
A.C. CONDITIONS OF TEST
Input Pulse Levels
Input Rise and
Fall Times
Input and Output
Timing Levels
5V
735Ω
OUTPUT
0V to 3V
5ns
1.5V
3827 PGM T08.2
318Ω
30pF
3827 FHD F04
5
X20C05
A.C. CHARACTERISTICS (Over the recommended operating conditions unless otherwise specified)
Read Cycle Limits
X20C05-35
Symbol
Parameter
Min.
tRC
tCE
tAA
tOE
tLZ(3)
tOLZ(3)
tHZ(3)
tOHZ(3)
tOH
Read Cycle Time
Chip Enable Access Time
Address Access Time
Output Enable Access Time
Chip Enable to Output in Low Z
Output Enable to Output in Low Z
Chip Disable to Output in High Z
Output Disable to Output in High Z
Output Hold From Address Change
35
Max.
X20C05-45
Min.
45
35
35
20
0
0
Min.
Max.
55
45
45
25
0
0
15
15
0
Max.
X20C05-55
55
55
30
0
0
20
20
0
25
25
0
Units
ns
ns
ns
ns
ns
ns
ns
ns
ns
3827 PGM T10
Read Cycle
tRC
ADDRESS
tCE
CE
tOE
OE
VIH
WE
tOLZ
tOHZ
tLZ
DATA I/O
tOH
DATA VALID
tHZ
DATA VALID
tAA
3827 FHD F05
Note:
(3) tLZ min., tHZ, tOLZ min., and tOHZ are periodically sampled and not 100% tested. tHZ and tOHZ are measured, with CL = 5pF,
from the point when CE or OE return HIGH (whichever occurs first) to the time when the outptus are no longer driven.
6
X20C05
Write Cycle Limits
X20C05-25 X20C05-35 X20C05-45 X20C05-55
Symbol
tWC
tCW
tAS
tWP
tWR
tDW
tDH
Parameter
Min.
Write Cycle Time
Chip Enable to End of Write Input
Address Setup Time
Write Pulse Width
Write Recovery Time
Data Setup to End of Write
Data Hold Time
Write Enable to Output in High Z
Output Active from End of Write
Output Enable to Output in High Z
tWZ(4)
tOW(4)
tOZ(4)
Max. Min. Max. Min. Max. Min. Max. Units
25
25
0
30
0
15
0
35
30
0
30
0
15
0
45
35
0
35
0
20
3
15
5
5
55
40
0
40
0
25
3
20
5
25
5
15
20
25
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
3827 PGM T11
WE Controlled Write Cycle
tWC
ADDRESS
OE
tCW
CE
tAS
tWP
tWR
WE
tOZ
tOW
DATA OUT
tDW
DATA IN
tDH
DATA VALID
3827 FHD F06
Note:
(4) tWZ, tOW and tOZ are periodically sampled and not 100% tested.
7
X20C05
CE Controlled Write Cycle
tWC
ADDRESS
OE
VIH
tCW
CE
tAS
tWP
tWR
WE
tWZ
tOW
DATA OUT
tDW
DATA IN
tDH
DATA VALID
3827 FHD F07.1
8
X20C05
Array Recall Cycle Limits
X20C05-35
Symbol
Parameter
tRCC
tRCP(5)
Array Recall Cycle Time
Recall Pulse Width to
Initiate Recall
WE Setup Time to NE
tRWE
X20C05-45
X20C05-55
Min.
Max.
Min.
Max.
Min.
Max.
Units
30
5
1000
40
5
1000
50
5
1000
µs
ns
0
0
0
ns
3827 PGM T13.1
Array Recall Cycle
tRCC
ADDRESS
tRCP
NE
OE
tRWE
WE
CE
DATA I/O
3827 FHD F10
Note:
(5) The Recall Pulse Width (tRCP) is a minimum time that NE, OE and CE must be LOW simultaneously to insure data integrity,
NE and CE.
9
X20C05
Software Command Timing Limits
X20C05-35
Symbol
tSTO
tSP(6)
tSPH
tWC
tAS
tAH
tDS
tDH
tSOE(7)
tOEST(7)
tNHZ(7)
tNES
tNEH
Parameter
Min.
Store Cycle Time
Store Pulse Width
Store Pulse Hold Time
Write Cycle Time
Address Setup Time
Address Hold time
Data Setup Time
Data Hold Time
OE Disable to Store Function
Output Enable from End of Store
Nonvolatile Enable to Output in
High Z
NE Setup Time
NE Hold Time
Max.
X20C05-45
Min.
5
30
35
35
0
0
15
0
20
10
Max.
Min.
Max.
Units
5
ms
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
5
40
45
45
0
0
20
3
20
10
15
5
5
X20C05-55
50
55
55
0
0
25
3
20
10
20
5
5
25
5
5
ns
ns
3827 PGM T12.1
CE Controlled Software Command Sequence
tWC
ADDRESS
tSTO
155
155
0AA
OE
tAS
tSP
tSPH
tOEST
CE
tAH
WE
tNEH
tNES
NE
tSOE
tNHZ
DATA OUT
tDS
DATA IN
tDH
AA
55
CMD
3827 FHD F08.2
Notes: (6) The Store Pulse Width (tSP) is a minimum time that NE, WE and CE must be LOW simultaneously.
(7) tSOE, tOEST and tNHZ are periodically sampled and not 100% tested.
10
X20C05
WE Controlled Software Command Sequence
tWC
ADDRESS
tSTO
155
155
0AA
OE
tOEST
CE
tAS
tSP
tSPH
WE
tAH
tNES
tNEH
NE
tSOE
tNHZ
DATA OUT
tDS
DATA IN
tDH
AA
55
CMD
3827 FHD F09.2
11
X20C05
AUTOSTORE Feature
The AUTOSTORE feature automatically saves the contents of the X20C05’s RAM to the on-board bit-for-bit
shadow E2PROM at power-down. This circuitry insures
that no data is lost during accidental power-downs or
general system crashes, and is ideal for microprocessor
caching systems, embedded software systems, and
general system back-up memory.
to automatically perform a store operation whenever VCC
falls below the AUTOSTORE threshold (VASTH). VCC
must remain above the AUTOSTORE Cycle End Voltage (VASEND) for the duration of the store cycle (tASTO).
The detailed timing for this feature is illustrated in the
AUTOSTORE timing diagram, below. Once the
AUTOSTORE cycle is initiated, all other device functions
are inhibited.
The AUTOSTORE instruction (EAS) to the SDP register
sets the AUTOSTORE enable latch, allowing the X20C05
AUTOSTORE CYCLE Timing Diagrams
VCC
VOLTS (V)
5
V
AUTOSTORE CYCLE IN PROGRESS ASTH
VASEND
4
3
2
1
tASTO
STORE TIME
TIME (ms)
VCC
VASTH
0V
tPUR
tASTO
tPUR
AS
3827 FHD F14
AUTOSTORE CYCLE LIMITS
X20C05
Symbol
Parameter
Min.
tASTO
VASTH
VASEND
AUTOSTORE Cycle Time
AUTOSTORE Threshold Voltage
AUTOSTORE Cycle End Voltage
4.0
3.5
Max.
Units
2.5
4.3
ms
V
V
3827 PGM T15
12
X20C05
SDP (Software Data Protection)
Store State Diagram
POWER UP
POWER UP
NO STORE
RAM Write or Recall
Power
Down
S0
ADDR 155,
DATA AA
ADDR 155,
DATA AA
Software
Store
Enabled
SS
S1
NO STORE
RAS
ADDR 0AA,
DATA 55
ADDR 155,
DATA AA
WRITE: ADDR 555,
DATA=COMMAND
EAS
SS
STORE ON SS
OR
ENABLE / RESET
AUTOSTORE
3827 FHD F13.1
3827 FHD F12.1
SOFTWARE DATA PROTECTION COMMANDS
Command
Enable AUTOSTORE
Reset AUTOSTORE
Software Store
EAS
Software
Store &
AUTOSTORE Power Down
Enabled
(AUTOSTORE)
S2
NO STORE
EAS
RAS
SS
Power On
Recall
Data
CC[H]
CD[H]
33[H]
3827 PGM T14.1
13
X20C05
NOTES
14
X20C05
PACKAGING INFORMATION
28-LEAD HERMETIC DUAL IN-LINE PACKAGE TYPE D
1.490 (37.85)
1.435 (36.45)
0.610 (15.49)
0.500 (12.70)
PIN 1
0.100 (2.54)
0.035 (0.89)
1.30 (33.02)
REF.
0.225 (5.72)
0.140 (3.56)
SEATING
PLANE
0.060 (1.52)
0.015 (0.38)
0.200 (5.08)
0.125 (3.18)
0.110 (2.79)
0.090 (2.29)
TYP. 0.100 (2.54)
0.070 (1.78)
0.030 (0.76)
TYP. 0.055 (1.40)
0.026 (0.66)
0.014 (0.36)
TYP. 0.018 (0.46)
0.620 (15.75)
0.590 (14.99)
TYP. 0.614 (15.60)
0°
15°
TYP. 0.010 (0.25)
NOTE: ALL DIMENSIONS IN INCHES (IN PARENTHESES IN MILLIMETERS)
15
X20C05
PACKAGING INFORMATION
28-LEAD PLASTIC DUAL IN-LINE PACKAGE TYPE P
1.460 (37.08)
1.400 (35.56)
0.550 (13.97)
0.510 (12.95)
PIN 1 INDEX
PIN 1
0.085 (2.16)
0.040 (1.02)
1.300 (33.02)
REF.
0.160 (4.06)
0.125 (3.17)
SEATING
PLANE
0.030 (0.76)
0.015 (0.38)
0.150 (3.81)
0.125 (3.17)
0.110 (2.79)
0.090 (2.29)
0.062 (1.57)
0.050 (1.27)
0.020 (0.51)
0.016 (0.41)
0.610 (15.49)
0.590 (14.99)
0°
15°
TYP. 0.010 (0.25)
NOTE: ALL DIMENSIONS IN INCHES (IN PARENTHESES IN MILLIMETERS)
16
X20C05
PACKAGING INFORMATION
32-PAD CERAMIC LEADLESS CHIP CARRIER PACKAGE TYPE E
0.150 (3.81) BSC
0.015 (0.38)
0.003 (0.08)
0.020 (0.51) x 45° REF.
0.095 (2.41)
0.075 (1.91)
PIN 1
0.022 (0.56)
0.006 (0.15)
0.055 (1.39)
0.045 (1.14)
TYP. (4) PLCS.
0.200 (5.08)
BSC
0.028 (0.71)
0.022 (0.56)
(32) PLCS.
0.050 (1.27) BSC
0.040 (1.02) x 45° REF.
TYP. (3) PLCS.
0.458 (11.63)
0.442 (11.22)
0.458 (11.63)
––
0.300 (7.62)
BSC
0.120 (3.05)
0.060 (1.52)
0.560 (14.22)
0.540 (13.71)
0.400 (10.16)
BSC
32 1
0.558 (14.17)
––
PIN 1 INDEX CORDER
NOTE:
1. ALL DIMENSIONS IN INCHES (IN PARENTHESES IN MILLIMETERS)
2. TOLERANCE: ±1% NTL ±0.005 (0.127)
17
0.088 (2.24)
0.050 (1.27)
X20C05
PACKAGING INFORMATION
32-LEAD PLASTIC LEADED CHIP CARRIER PACKAGE TYPE J
0.420 (10.67)
0.050 (1.27) TYP.
0.045 (1.14) x 45°
0.021 (0.53)
0.013 (0.33)
TYP. 0.017 (0.43)
0.495 (12.57)
0.485 (12.32)
TYP. 0.490 (12.45)
SEATING PLANE
±0.004 LEAD
CO – PLANARITY
—
0.015 (0.38)
0.095 (2.41)
0.060 (1.52)
0.140 (3.56)
0.100 (2.45)
TYP. 0.136 (3.45)
0.453 (11.51)
0.447 (11.35)
TYP. 0.450 (11.43)
0.048 (1.22)
0.042 (1.07)
0.300 (7.62)
REF.
PIN 1
0.595 (15.11)
0.585 (14.86)
TYP. 0.590 (14.99)
0.553 (14.05)
0.547 (13.89)
TYP. 0.550 (13.97)
0.400
(10.16)REF.
3° TYP.
NOTES:
1. ALL DIMENSIONS IN INCHES (IN PARENTHESES IN MILLIMETERS)
2. DIMENSIONS WITH NO TOLERANCE FOR REFERENCE ONLY
18
X20C05
ORDERING INFORMATION
X20C05
X
X
-X
Access Time
–35 = 35ns
–45 = 45ns
–55 = 55ns
Device
Temperature Range
Blank = Commercial = 0°C to +70°C
I = Industrial = –40°C to +85°C
M = Military = –55°C to +125°C
Package
D = 28-Lead Cerdip
P = 28 Lead Plastic DIP
E = 32-Pad Ceramic LCC
J = 32-Lead PLCC
LIMITED WARRANTY
Devices sold by Xicor, Inc. are covered by the warranty and patent indemnification provisions appearing in its Terms of Sale only. Xicor, Inc. makes
no warranty, express, statutory, implied, or by description regarding the information set forth herein or regarding the freedom of the described
devices from patent infringement. Xicor, Inc. makes no warranty of merchantability or fitness tor any purpose. Xicor, Inc. reserves the right to
discontinue production and change specifications and prices at any time and without notice.
Xicor, Inc. assumes no responsibility for the use of any circuitry other than circuitry embodied in a Xicor, Inc. product. No other circuits, patents,
licenses are implied.
US. PATENTS
Xicor products are covered by one or more of the following U.S. Patents: 4,263,664; 4,274,012; 4,300,212; 4,314,265; 4,326,134; 4,393,481;
4,404,475; 4,450,402; 4,486,769; 4,488,060; 4,520,461; 4,533,846; 4,599,706; 4,617,652; 4,668,932; 4,752,912; 4,829,482; 4,874,967;
4,883,976. Foreign patents and additional patents pending.
LIFE RELATED POLICY
In situations where semiconductor component failure may endanger life, system designers using this product should design the system with
appropriate error detection and correction, redundancy and back-up features to prevent such an occurrence.
Xicor’s products are not authorized for use as critical components in life support devices or systems.
1. Life support devices or systems are devices or systems which, (a) are intended for surgical implant into the body, or (b) support or sustain life,
and whose failure to perform, when properly used in accordance with instructions for use provided in the labeling, can be reasonably expected
to result in a significant injury to the user.
2. A critical component is any component of a life support device or system whose failure to perform can be reasonably expected to cause the failure
of the life support device or system, or to affect its satety or effectiveness.
19