FAIRCHILD MOC212-M

SMALL OUTLINE OPTOCOUPLERS
TRANSISTOR OUTPUT
MOC211-M
MOC212-M
MOC213-M
DESCRIPTION
These devices consist of a gallium arsenide infrared emitting diode optically coupled to a
monolithic silicon phototransistor detector, in a surface mountable, small outline, plastic
package. They are ideally suited for high density applications, and eliminate the need for
through-the-board mounting.
FEATURES
• UL Recognized (File #E90700, volume 2)
• VDE Recognized (File #136616) (add option ‘V’ for VDE approval, e.g., MOC211V-M)
• Convenient Plastic SOIC-8 Surface Mountable Package Style
• Standard SOIC-8 Footprint, with 0.050" Lead Spacing
• Compatible with Dual Wave, Vapor Phase and IR Reflow Soldering
• High Input-Output Isolation of 2500 VAC(rms) Guaranteed
ANODE 1
8 N/C
• Minimum BVCEO of 30V guaranteed
CATHODE 2
7 BASE
APPLICATIONS
• General Purpose Switching Circuits
• Interfacing and coupling systems of different potentials and impedances
• Regulation Feedback Circuits
• Monitor and Detection Circuits
© 2002 Fairchild Semiconductor Corporation
Page 1 of 9
N/C 3
6 COLLECTOR
N/C 4
5 EMITTER
4/10/03
SMALL OUTLINE OPTOCOUPLERS
TRANSISTOR OUTPUT
MOC211-M
MOC212-M
MOC213-M
ABSOLUTE MAXIMUM RATINGS (TA = 25°C Unless otherwise specified)
Rating
Symbol
Value
Unit
IF
60
mA
IF (pk)
1.0
A
Reverse Voltage
VR
6.0
V
LED Power Dissipation @ TA = 25°C
Derate above 25°C
PD
90
0.8
mW
mW/°C
Collector-Emitter Voltage
VCEO
30
V
Emitter-Collector Voltage
VECO
7.0
V
Collector-Base Voltage
VCBO
70
V
Collector Current-Continuous
IC
150
mA
Detector Power Dissipation @ TA = 25°C
Derate above 25°C
PD
150
1.76
mW
mW/°C
VISO
2500
Vac(rms)
Total Device Power Dissipation @ TA = 25°C
Derate above 25°C
PD
250
2.94
mW
mW/°C
Ambient Operating Temperature Range
TA
-40 to +100
°C
Tstg
-40 to +150
°C
EMITTER
Forward Current – Continuous
Forward Current – Peak (PW = 100 µs, 120 pps)
DETECTOR
TOTAL DEVICE
Input-Output Isolation Voltage (1,2,3)
(f = 60 Hz, t = 1 min.)
Storage Temperature Range
© 2002 Fairchild Semiconductor Corporation
Page 2 of 9
4/10/03
SMALL OUTLINE OPTOCOUPLERS
TRANSISTOR OUTPUT
MOC211-M
MOC212-M
MOC213-M
ELECTRICAL CHARACTERISTICS (TA = 25°C Unless otherwise specified)
Parameter
Test Conditions
Symbol
Min
Typ**
Max
Unit
EMITTER
Input Forward Voltage
(IF = 10 mA)
VF
—
1.15
1.5
V
Reverse Leakage Current
(VR = 6.0 V)
IR
—
0.001
100
µA
CIN
—
18
—
pF
ICEO1
ICEO2
—
—
1.0
1.0
50
—
nA
µA
Input Capacitance
DETECTOR
(VCE = 10 V, TA = 25°C)
(VCE = 10 V, TA = 100°C)
Collector-Emitter Dark Current
Collector-Emitter Breakdown Voltage
(IC = 100 µA)
BVCEO
30
90
—
V
Emitter-Collector Breakdown Voltage
(IE = 100 µA)
BVECO
7.0
7.8
—
V
(f = 1.0 MHz, VCE = 0)
CCE
—
7.0
—
pF
(IF = 10 mA, VCE = 10 V)
CTR
20
50
100
65
90
140
—
—
—
%
(60 Hz AC Peak, 1 min.)
VISO
2500
—
—
Vac(rms)
(V = 500 V)
RISO
1011
—
—
Ω
VCE (sat)
—
0.15
0.4
V
CISO
—
0.2
—
pF
Collector-Emitter Capacitance
COUPLED
Collector-Output Current(4)
Isolation Surge Voltage(1,2,3)
Isolation Resistance(2)
Collector-Emitter Saturation Voltage
Isolation Capacitance(2)
MOC211-M
MOC212-M
MOC213-M
(IC = 2.0 mA, IF = 10 mA)
(V = 0 V, f = 1 MHz)
Turn-On Time
(IC = 2.0 mA, VCC = 10 V, RL = 100 Ω)
(Fig. 6)
ton
—
7.5
—
µs
Turn-Off Time
(IC = 2.0 mA, VCC = 10 V, RL = 100 Ω)
(Fig. 6)
toff
—
5.7
—
µs
Rise Time
(IC = 2.0 mA, VCC = 10 V, RL = 100 Ω)
(Fig. 6)
tr
—
3.2
—
µs
Fall Time
(IC = 2.0 mA, VCC = 10 V, RL = 100 Ω)
(Fig. 6)
tf
—
4.7
—
µs
** Typical values at TA = 25°C
1. Isolation Surge Voltage, VISO, is an internal device dielectric breakdown rating.
2. For this test, Pins 1 and 2 are common and Pins 5, 6 and 7 are common.
3. VISO rating of 2500 VAC(rms) for t = 1 min. is equivalent to a rating of 3,000 VAC(rms) for t = 1 sec.
4. Current Transfer Ratio (CTR) = IC/IF x 100%.
© 2002 Fairchild Semiconductor Corporation
Page 3 of 9
4/10/03
SMALL OUTLINE OPTOCOUPLERS
TRANSISTOR OUTPUT
MOC211-M
MOC212-M
MOC213-M
Fig. 2 Output Curent vs. Input Current
Fig. 1 LED Forward Voltage vs. Forward Current
1.8
I C - OUTPUT COLLECTOR CURRENT (NORMALIZED)
10
VF - FORWARD VOLTAGE (V)
1.7
1.6
1.5
1.4
TA = –55°C
1.3
1.2
TA = 25°C
1.1
TA = 100°C
1.0
1
10
100
VCE = 5V
NORMALIZED TO IF = 10mA
1
0.1
IF - LED FORWARD CURRENT (mA)
0.01
0.1
1
Fig. 3 Output Current vs. Ambient Temperature
10
100
IF - LED INPUT CURRENT (mA)
10
I C - OUTPUT COLLECTOR CURRENT (NORMALIZED)
I C - OUTPUT COLLECTOR CURRENT (NORMALIZED)
Fig. 4 Output Current vs. Collector - Emitter Voltage
1.6
1
NORMALIZED TO TA = 25°C
0.1
-80
-60
-40
-20
0
20
40
60
80
100
1.4
1.2
1.0
0.8
0.6
0.4
0.2
I F = 10mA
NORMALIZED TO VCE = 5V
0.0
0
120
1
2
3
4
5
6
7
8
9
10
VCE - COLLECTOR -EMITTER VOLTAGE (V)
TA - AMBIENT TEMPERATURE (°C)
Fig. 5 Dark Current vs. Ambient Temperature
I CEO - COLLECTOR -EMITTER DARK CURRENT (nA)
10000
VCE=10V
1000
100
10
1
0.1
0
20
40
60
80
100
TA - AMBIENT TEMPERATURE (°C)
© 2002 Fairchild Semiconductor Corporation
Page 4 of 9
4/10/03
SMALL OUTLINE OPTOCOUPLERS
TRANSISTOR OUTPUT
MOC211-M
MOC212-M
MOC213-M
TEST CIRCUIT
WAVE FORMS
VCC = 10V
INPUT PULSE
IC
IF
INPUT
RL
10%
OUTPUT
OUTPUT PULSE
90%
RBE
tr
ton
tf
toff
Adjust IF to produce IC = 2 mA
Figure 6. Switching Time Test Circuit and Waveforms
© 2002 Fairchild Semiconductor Corporation
Page 5 of 9
4/10/03
SMALL OUTLINE OPTOCOUPLERS
TRANSISTOR OUTPUT
MOC211-M
MOC212-M
Package Dimensions (Surface Mount)
MOC213-M
8-Pin Small Outline
PIN 1
ID.
0.024 (0.61)
SEATING PLANE
0.164 (4.16)
0.144 (3.66)
0.060 (1.52)
0.202 (5.13)
0.182 (4.63)
0.275 (6.99)
0.155 (3.94)
0.010 (0.25)
0.006 (0.16)
0.143 (3.63)
0.123 (3.13)
0.021 (0.53)
0.011 (0.28)
0.008 (0.20)
0.003 (0.08)
0.244 (6.19)
0.224 (5.69)
0.050 (1.27)
0.050 (1.27)
TYP
Lead Coplanarity : 0.004 (0.10) MAX
© 2002 Fairchild Semiconductor Corporation
Page 6 of 9
4/10/03
SMALL OUTLINE OPTOCOUPLERS
TRANSISTOR OUTPUT
MOC211-M
MOC212-M
MOC213-M
ORDERING INFORMATION
Option
Order Entry Identifier
V
V
R1
R1
R1V
R1V
R2
R2
R2V
R2V
Description
VDE 0884
Tape and reel (500 units per reel)
VDE 0884, Tape and reel (500 units per reel)
Tape and reel (2500 units per reel)
VDE 0884, Tape and reel (2500 units per reel)
MARKING INFORMATION
1
211
V
X YY S
3
4
2
6
5
Definitions
1
Fairchild logo
2
Device number
3
VDE mark (Note: Only appears on parts ordered with VDE
option – See order entry table)
4
One digit year code, e.g., ‘3’
5
Two digit work week ranging from ‘01’ to ‘53’
6
Assembly package code
© 2002 Fairchild Semiconductor Corporation
Page 7 of 9
4/10/03
SMALL OUTLINE OPTOCOUPLERS
TRANSISTOR OUTPUT
MOC211-M
MOC212-M
MOC213-M
Carrier Tape Specifications
8.0 ± 0.10
3.50 ± 0.20
2.0 ± 0.05
Ø1.5 MIN
4.0 ± 0.10
0.30 MAX
1.75 ± 0.10
5.5 ± 0.05
12.0 ± 0.3
8.3 ± 0.10
5.20 ± 0.20
6.40 ± 0.20
0.1 MAX
Ø1.5 ± 0.1/-0
User Direction of Feed
Reflow Profile
Temperature (°C)
300
230°C, 10–30 s
250
245°C peak
200
150
Time above 183°C, 120–180 sec
100
Ramp up = 2–10°C/sec
50
• Peak reflow temperature: 245°C (package surface temperature)
• Time of temperature higher than 183°C for 120–180 seconds
• One time soldering reflow is recommended
0
0
0.5
1
1.5
2
2.5
3
3.5
4
4.5
Time (Minute)
© 2002 Fairchild Semiconductor Corporation
Page 8 of 9
4/10/03
SMALL OUTLINE OPTOCOUPLERS
TRANSISTOR OUTPUT
MOC211-M
MOC212-M
MOC213-M
DISCLAIMER
FAIRCHILD SEMICONDUCTOR RESERVES THE RIGHT TO MAKE CHANGES WITHOUT FURTHER NOTICE TO
ANY PRODUCTS HEREIN TO IMPROVE RELIABILITY, FUNCTION OR DESIGN. FAIRCHILD DOES NOT ASSUME
ANY LIABILITY ARISING OUT OF THE APPLICATION OR USE OF ANY PRODUCT OR CIRCUIT DESCRIBED HEREIN;
NEITHER DOES IT CONVEY ANY LICENSE UNDER ITS PATENT RIGHTS, NOR THE RIGHTS OF OTHERS.
LIFE SUPPORT POLICY
FAIRCHILD’S PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT DEVICES
OR SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROVAL OF THE PRESIDENT OF FAIRCHILD SEMICONDUCTOR
CORPORATION. As used herein:
1. Life support devices or systems are devices or systems
which, (a) are intended for surgical implant into the body, or
(b) support or sustain life, and (c) whose failure to perform
when properly used in accordance with instructions for use
provided in the labeling, can be reasonably expected to
result in a significant injury of the user.
© 2002 Fairchild Semiconductor Corporation
2. A critical component in any component of a life support
device or system whose failure to perform can be
reasonably expected to cause the failure of the life support
device or system, or to affect its safety or effectiveness.
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4/10/03