INTEGRAL IZ74LV04

IN74LV04
HEX INVERTER
The IN74LV04 is a low-voltage Si-gate CMOS device that is pin
and function compatible with 74HC/HCT04A.
The IN74LV04 provides six inverting buffers.
•
•
•
•
Wide Operating Voltage: 1.0÷5.5 V
Optimized for Low Voltage applications: 1.0÷3.6 V
Accepts TTL input levels between VCC =2.7 V and VCC =3.6 V
Low Input Current
ORDERING INFORMATION
IN74LV04N
Plastic
IN74LV04D
SOIC
IZ74LV04
Chip
TA = -40° ÷ 125° C for all
packages
LOGIC DIAGRAM
PIN ASSIGNMENT
FUNCTION TABLE
Input
Output
A
Y
L
H
H
L
PIN 14 =VCC
PIN 7 = GND
1
IN74LV04
*
MAXIMUM RATINGS
Symbol
Parameter
Value
Unit
VCC
DC supply voltage (Referenced to GND)
V
-0.5 ÷ +7.0
1
IIK*
DC input diode current
mA
±20
IOK*2
DC output diode current
mA
±50
3
Io*
DC
output
source
or
sink
current
mA
±25
-bus driver outputs
IGND
DC
GND
current
for
types
with
mA
±50
- bus driver outputs
ICC
DC
VCC
current
for
types
with
mA
±50
- bus driver outputs
750
mW
PD
Power dissipation per package, plastic DIP+
500
SOIC
package+
Tstg
Storage temperature
-65 ÷ +150
°C
260
TL
Lead temperature, 1.5 mm from Case for 10
°C
seconds
(Plastic DIP ), 0.3 mm (SOIC Package)
*
Maximum Ratings are those values beyond which damage to the device may occur.
Functional operation should be restricted to the Recommended Operating Conditions.
+Derating - Plastic DIP: - 12 mW/°C from 70° to 125°C
SOIC Package: : - 8 mW/°C from 70° to 125°C
*1: VI < -0.5V or VI > VCC+0.5V
*2: Vo < -0.5V or Vo > VCC+0.5V
*3: -0.5V < Vo < VCC+0.5V
RECOMMENDED OPERATING CONDITIONS
Symbol
Parameter
Min
Max
Unit
VCC
DC Supply Voltage (Referenced to GND)
1.0
5.5
V
VIN, VOUT DC Input Voltage, Output Voltage (Referenced to
0
VCC
V
GND)
TA
Operating Temperature, All Package Types
-40
+125
°C
ns
1000
t r, tf
Input Rise and Fall Time
VCC
=1.2
V
0
700
VCC
0
=2.0
V
500
0
VCC
=3.0
V
400
0
VCC =3.6 V
This device contains protection circuitry to guard against damage due to high static
voltages or electric fields. However, precautions must be taken to avoid applications of any voltage
higher than maximum rated voltages to this high-impedance circuit. For proper operation, VIN and
VOUT should be constrained to the range GND≤(VIN or VOUT)≤VCC.
Unused inputs must always be tied to an appropriate logic voltage level (e.g., either GND or
VCC). Unused outputs must be left open.
2
IN74LV04
DC ELECTRICAL CHARACTERISTICS (Voltages Referenced to GND)
Guaranteed Limit
Test
VCC,
25°C
-40°C ÷
-40°C ÷
Symbol Parameter
Conditions
V
85°C
125°C
min max min max min max
0.9
0.9
VIH
High-Level Input
1.2 0.9
1.4
1.4
Voltage
2.0 1.4
2.1
2.1
3.0 2.1
2.5
2.5
3.6 2.5
0.3
0.3
0.3
VIL
Low-Level Input
1.2
0.6
0.6
0.6
Voltage
2.0
0.9
0.9
0.9
3.0
1.1
1.1
1.1
3.6
1.0
1.0
1.2 1.1
VOH
High-Level Output VI = VIL
1.9
1.9
1.92
2.0
Voltage
IO = -50 µA
2.9
2.9
* 2.92 VI = VIL
* 2.48 - 2.34 - 2.20 IO = -6.0 µA
0.1
0.1
- 0.09 VOL
Low-Level Output VI = VIH
1.2
0.1
0.1
- 0.09 Voltage
2.0
IO = 50 µA
0.1
0.1
- 0.09 - 0.33 0.4
0.5
VI = VIH or VIL 3.0
IO = 6.0 mА
IIL
Low-Level Input
Leakage Current
IIН
High-Level Input
Leakage Current
IСС
Quiescent Supply
Current
(per Package)
* : VCC= (3.3±0.3) V
Unit
V
V
V
V
V
V
-
-0.1
-
-1.0
-
-1.0
µA
VI = VCC
*
-
0.1
-
1.0
-
1.0
µA
VI = 0 В or
VCC
IO = 0 µA
*
-
2.0
-
20
-
40
µA
3
IN74LV04
AC ELECTRICAL CHARACTERISTICS (CL=50 pF, tLH = tHL = 6.0 ns, VIL=0V, VIH=VCC, RL=1 kΩ)
VCC
Guaranteed Limit
V
25°C
-40°C ÷ 85°C
-40°C ÷
Unit
Symbol
Parameter
125°C
min max min max min max
ns
100
85
70
tTHL, (tTLH) Output Transition 1.2
24
20
16
Time, Any Output 2.0
15
13
10
*
(Figure 1)
150
120
90
1.2
tPHL, (tPLH) Propagation
34
28
23
Delay, Input A to 2.0
21
18
14
Output Y (Figure *
1)
CI
Input Capacitance 3.0
3.5
3.5
pF
CPD
Power Dissipation Capacitance (Per
Inverter)
ТА=25°С, VI=0V÷VCC
42
Used
to
determine
the
no-load
dynamic
power
PD = CPDVCC2fI+ ∑(CLVCC2fo), fI - input frequency, fo - output frequency (MHz)
∑(CLVCC2fo) – sum of the outputs
tHL
0.9
V1
0.1
consumption:
tLH
0.9
Input А
pF
VCC
V1
0.1
tPHL
0.9
0.9
Output Y
VCC
V1
V1
0.1
V1 = 0.5 VCC
GND
tPLH
0.1
tTHL
GND
tTLH
Figure 1. Switching Waveforms
VCC
VI
PULSE
GENERATOR
VO
RT
Termination resistance RT –
should be equal to ZOUT of pulse
generators
DEVICE
UNDER
TEST
CL
Figure 2. Test Circuit
4
RL
IN74LV04
CHIP PAD DIAGRAM IZ74LV04
12
10
11
09
13
08
14
07
1.20 ±0.03
Chip marking
25LV04
(x=0.127; y=0.580)
06
01
02
04
03
05
1.35 ±0.03
Pad size 0.108 x 0.108 mm (Pad size is given as per metallization layer)
Thickness of chip 0.46 ± 0,02 mm
PAD LOCATION
Pad No
01
02
03
04
05
06
07
08
09
10
11
12
13
14
Symbol
А1
Y1
A2
Y2
A3
Y3
GND
Y4
A4
Y5
A5
Y6
A6
Vcc
X
0.111
0.333
0.600
0.770
1.006
1.138
1.138
1.138
1.006
0.771
0.600
0.332
0.111
0.111
5
Y
0.228
0.111
0.111
0.111
0.111
0.293
0.477
0.786
0.970
0.970
0.970
0.970
0.855
0.619