Agilent N7788B/BD Optical Component Analyzer Data Sheet Figure 1. N7788BD bench-top mainframe with built-in PC Figure 2. N7788B bench-top mainframe Introduction Key Benefits Agilent Technologies pushes the limits of component measurements with the N7788B component analyzer. Its proprietary technology is comparable with the wellknown Jones-Matrix-Eigenanalysis (JME) which is the standard method for measuring polarization mode dispersion (PMD) or differential group delay (DGD) of optical devices. ● Highest accuracy in a single sweep: no averaging over multiple sweeps required ● High measurement speed: Complete measurement across C/L-band in less than 10 seconds (no need to wait for many averages) ● Robustness against fiber movement/ vibration and drift: Fixing fibers with sticky tape on the table or even operation on isolated optical table is not required! ● No limitation on optical path length of component ● The internal referencing scheme guarantees reliable and accurate measurements. Compared to the JME, Agilent’s new single scan technology offers a range of advantages: A complete set of parameters: ● ● ● ● ● DGD/PMD PDL Power/loss TE/TM-loss Jones matrices ● Mueller matrices ● 2nd-order PMD (depolarization + PCD) ● Principal states of polarization (PSPs) Applications The instrument setup is shown in the Figure 3. A LiNbO3 polarization controller determines the input polarization to the DUT. While the tunable laser source is sweeping over the desired wavelength range, a polarimeter analyzes the output state of polarization while input polarization is being modified. The result will be a highly accurate device characterization with respect to DGD/PDL/loss, etc. Furthermore, the internal optical switch provides continuous self calibration for excellent repeatability. ● Fiber characterization: SMF, PMF, DCF ● Passive component testing: filters, isolators, circulators ● Dynamic component / module testing: OADM / ROADM ● Active component testing: EDFAs, SOAs, VOAs ● Link test: in-channel measurements across amplifiers Resolving TE/TM insertion loss The TE/TM-function allows accurate determination of the minimum and maximum loss of the DUT at each wavelength. Designed for the manufacturing floor Due to birefringence, optical filters tend to show different transmission functions depending on the polarization state. As shown in Figure 4, these functions are typically shifted in wavelength depending on the amount of birefringence. High throughput A complete analysis across the C and the L band is performed in less than 10 seconds! Software drivers A range of software drivers is available for external control of the system. This allows easy integration in common ERP systems. 0 Remote control Control of the instrument through LAN or via the Internet is supported. This supports automation as well as trouble shooting. TE/TM loss [dB] -10 Report generation Generating PDF reports is supported. The content including layout is configurable by the user. Real time power readout High throughput measurement of non-connectorized components is supported by providing a real time power readout which enables fiber coupling of the new device The capability of performing quick PMD-measurements makes this measurement system well-suited for collecting long-term PMD data. The PC software allows to continuously collect the spectral PMD data and store it on the hard disc. The data can then be visualized as pseudo-color plot (see Figure 5). Polarimeter Trigger in Trigger out Microcontroller board GPIB 1561 Figure 4. Polarization-dependent wavelength shift (PD-λ) of a filter. DUT Power In 1560 Wavelength [nm] Laser in SMF -40 1559 Agilent N7788B Instrument Setup and Application Examples LiNbO3 polarization controller -30 -50 Barcode scanner Barcode scanning is supported for quick transfer of the DUT serial number PMF -20 USB Figure 3. Instrument setup 2 Time DGD DGD pdf Wavelength Wavelength DGD Figure 5. Long term DGD measurements. Due to the excellent spectral resolution, the Agilent N7788B is best suited for intra-channel DGD/PDL characterization. Particularly for characterizing optical filters, the high dynamic range of the N7788B allows accurate resolution of the filter’s side lobes. The all-parameter-JME algorithm allows flexible adjustments of the wavelength resolution without the need to repeat the measurement. This allows the user to easily find the optimum trade-off between PDL/DGD accuracy and wavelength resolution. The internal reference path allows measurement of insertion loss spectra with excellent accuracy, minimizing the influence of the power characteristics of the tunable laser source. 0 Insertion loss [dB] Insertion loss [dB] 0 -20 -40 -60 1545 1546 1547 1548 Wavelength [nm] -10 -20 -30 1521.2 1549 1521.3 1521.4 Wavelength [nm] Figure 7. Loss curve of a DPSK demodulator. Figure 6. Side lobes of an optical filter. 3 1521.5 Table 1: Specifications1) N7788B/BD Optical Component Analyzer Wavelength Specification wavelength range 1270 nm ... 1375 nm (Opt 300, O-Band) 1270 nm ... 1375 nm, 1460 nm ... 1620 nm (Opt 400, O/C/L-Band) 1460 nm ... 1620 nm (Opt 500, C/L-Band) Operating wavelength range2) 1260 nm ... 1640 nm Differential Delay DGD uncertainty Resolution 2,0 nm: Resolution 0,1 nm: DGD measurement range3) 4) PMD uncertainty ± (30 fs + 0.3% · DGD) ± (30 fs + 3.0% · DGD) 0 ... 1000 ps ±(30 fs + 2.0% · DGD) PMD repeatability (typical) ±3 fs PMD measurement range4) 0 ... 300 ps Loss PDL uncertainty (typical)5) C/L-Band: O-Band: ± (0.05 dB + 4% · PDL) ± (0.05 dB + 4% · PDL) PDL repeatability (typical) ±5 mdB Insertion loss uncertainty (typical)3) C/L-Band: O-Band: Insertion loss dynamic range (typical)3) > 41 dB (for higher TLS power levels, increase value accordingly) ± 0.03 dB ± 0.07 dB Polarization Analysis See N7781B 1) Ambient temperature change max ± 0.5°C since normalization. Valid for 81600B Tunable Laser Source Family. TLS power set to -6 dBm. Sweep over specification wavelength range. Specification does not include instability in test device. Specified loss ranges include loss of test device and any additional switches or connections in the optical path. Specification valid on day of calibration. 2) SOP/DOP measurements are only possible outside the specification wavelength range if the user performs a manual calibration. 3) DUT properties: Insertion loss < 30 dB, PDL < 1 dB, DGD < 150 ps. Specification is typical for DGD > 150 ps. 4) DUT properties: Insertion loss < 41 dB, PDL < 3 dB, PMD < 50 ps. Applies for highly mode-coupled devices such as single mode fibers. Specification applies for PMD being averaged DGD over a wavelength span of 100 nm. Specification is typical for PMD < 50 ps. 5) DUT properties: Insertion loss < 25 dB, PDL < 6 dB. Note: DUT connectors are considered as being part of the DUT. 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